JP4448483B2 - Particle size gauge - Google Patents

Description

  In the present invention, a sample is disposed in a concave groove formed on a flat upper surface of a measurement substrate, and the presence or position or the position or position of a sample grain or line pattern when the sample is spread into the concave groove by a scraper is measured or measured. This relates to a particle size gauge for measuring the particle size of this sample.

  The particle size gauge is generally used conventionally as a measuring device for measuring the particle size of a sample in which small particles such as paint and pigment are scattered.

  As described in, for example, JISK5600 “General Test Method for Abrasive Grains”, this particle size gauge forms a groove on the flat top surface of the measurement substrate, and the bottom surface of the groove is inclined in the length direction of the groove. The groove depth of the groove is gradually changed from one end to the other end in the length direction of the groove (for example, the groove depth at one end is 0 and the groove depth at the other end is formed). The measurement base is flat so that the sample to be measured is placed on one end of the deeper groove, and the sample extends over the groove to extend the sample. A scraper in the form of a blade plate with the edge pressed against the upper surface is moved along the length direction of the concave groove toward the other end of the shallow groove at a predetermined speed (for example, from 1 to the other end When the sample is spread in the groove by moving it (over 2 seconds), the position of the groove corresponding to the particle size of the sample Since the grain and line pattern are displayed at the groove depth position, the particle size of this sample is measured by visually observing the traces of this sample (the presence or absence or position of the grain or line pattern) in the groove. Measuring device to obtain.

  By the way, in this type of particle size gauge, the measurement base is generally composed of a hard metal member such as a hard special alloy or hardened steel, and the flat upper surface and the bottom surface in the groove are very It has a smooth surface. That is, the flat upper surface is set to be a smooth surface so that the scraper with the edge pressed against the flat upper surface can be satisfactorily slid, and the sample spread by this scraper can be well spread on the bottom surface of the groove. The bottom surface is set to be a smooth surface.

  Therefore, during the measurement work, when the grain of the sample or the presence or position of the line pattern extending in the groove is visually confirmed, the bottom surface of the groove reflects the light and flickers. The line pattern is very difficult to see. Therefore, not only does the work efficiency decrease which is a concern in this measurement work, but also the work of visually checking the grain or line pattern of this sample, the grain or line pattern changes accordingly. It has a problem that it causes a measurement error.

  In particular, this particle size gauge is one of the important measuring devices in the manufacture and development of cosmetics such as foundations and emulsions composed of fine particles, but light skin color or light-colored particles close to white are scattered like cosmetics. At the time of measuring a sample to be measured, it is still more difficult to visually recognize the grain and line pattern. Therefore, flickering of the bottom surface of the groove and high visibility of light (difficult to measure) are important problems.

  As a measure for suppressing flickering of the bottom surface of the groove and high reflection of light, for example, the bottom surface of the groove is set to be slightly rougher than the flat top surface of the substrate, thereby making the bottom surface of the groove There is a method to suppress flickering and high reflection of light by setting the light reflectance low and metallic luster less than the flat top surface, but if the surface roughness of the bottom surface of the groove is set rough, it will measure itself. Since this causes an error and causes a problem in measurement accuracy, eventually, the method of setting the surface roughness of the bottom surface of the concave groove cannot satisfactorily suppress flickering of the bottom surface and high light reflection.

JIS K5600 "Abrasive Grain General Test Method"

  The present invention has been completed in view of the above problems, and the light reflectivity is simply compared with the flat top surface of the measuring instrument body without setting the surface roughness of the bottom surface of the groove to be rough. By setting it to a low color such as black or a dark color close to black, it is possible to reliably suppress the difficulty of viewing (difficulty of measurement) due to flickering of the bottom surface of the groove and high reflection of light during measurement work. This makes it easy to visually recognize the presence or position or position of the grain or line pattern of the sample, and this allows the grain or line pattern of this sample to change ( It is possible to reliably prevent problems such as failure to obtain accurate measurement values, and it is not necessary to set the surface roughness of the bottom surface of the groove to be rough. The problem of measurement accuracy Te, the measuring operation is simplified, yet it is an object to provide an accurate breakthrough size gauge measurements were soo very practical obtained.

  The gist of the present invention will be described with reference to the accompanying drawings.

A groove 2 is formed on the flat upper surface 1a of the measurement substrate 1, and the groove 2 is formed on an inclined surface whose bottom surface 2a is inclined in the length direction of the groove 2. The groove depth of the groove 2 is as follows. As a configuration in which the bottom surface 2a that gradually changes from one end to the other end in the length direction of the concave groove 2 is a concave groove 2, a sample a is disposed in the concave groove 2, and the sample a is spread. When the scraper 3 whose edge is pressed against the flat upper surface 1a of the measurement substrate 1 is moved in the length direction of the concave groove 2 so as to straddle the concave groove 2, the sample a expanded in the concave groove 2 is used. In a particle size gauge that measures the particle size of the sample a by visually checking or measuring the presence or absence or position of the grains or line patterns, the metal bottom surface 2a of the concave groove 2 of the metal measurement base 1 is subjected to oxidation treatment or By film forming means such as chrome plating, black or dark color close to black, In addition, by forming the smooth film 4 or the surface layer 4, the bottom surface 2 a of the groove 2 is made black or a dark color close to black, and the black or black-colored film 4 or surface layer 4 is changed to the black or black. After forming the flat top surface 1a of the measurement substrate 1 and the bottom surface 2a of the groove 2, the coating 4 or the surface layer 4 is removed from the other flat top surface 1a while leaving at least the bottom surface 2a of the groove 2. The flat top surface 1a is formed into a smooth flat surface by exposure or surface finishing, and the bottom surface 2a of the groove 2 of the measurement substrate 1 is set to black or a dark color close to black so as to have a dark color having a lower light reflectance than the flat top surface 1a. This relates to a particle size gauge characterized by the above.

In addition, the flat upper surface 1a of the measurement base 1 made of metal is formed with the black or dark black film 4 on the measurement base 1 as a smooth plane that has been surface-finished by surface polishing means such as lapping in advance. Thereafter, the smooth flat surface is exposed by removing this, or the black or nearly dark film 4 or surface layer 4 is formed on the measurement substrate 1 and then surface-finished by a surface polishing means such as lapping. performing processing by a smoothing plane, but according to particle size gauge of claim 1, wherein the set of the flat upper surface 1a to the smooth plane.

  Since the present invention is configured as described above, the bottom surface of the groove has a lower light reflectance than the flat top surface of the measurement substrate, for example, black or a dark color close to black. When visually recognizing the grain or line pattern of the spread sample, this bottom surface can be prevented from flickering or highly reflecting light, and it can be reliably prevented that the grain or line pattern of this sample is difficult to see. The measurement value can be obtained by visually recognizing the grain or line pattern of the sample.

In addition, since the light reflectance of the bottom surface is set low by setting the bottom surface of the groove to a dark color with low light reflectance, the surface roughness of the bottom surface of the groove is set to be rough as in the conventional example. Therefore, it is not necessary to set the light reflectivity to be low, and naturally, the problem of a decrease in measurement accuracy, which is a concern, can be caused by setting the surface roughness of the bottom surface of the groove to be rough . Since the surface is set to be flat and smooth, the moving operation can be performed with a conventional operation feeling by a scraper with the edge pressed against the flat upper surface. That is, since the sliding condition when the scraper is slid to the flat upper surface is the same as the conventional one, the scraper can be moved with a conventional operation feeling.

  Therefore, the present invention can advance the work of visually confirming the grain or line pattern of the sample that has been efficiently and satisfactorily suppressed by suppressing flickering of the bottom surface of the groove and high reflection of light. Measurement errors such as misreading due to difficulty in visual recognition due to high reflection of light, and changes in the grain or line pattern of the sample due to sluggish visual inspection work can be eliminated well. Setting the roughness coarsely does not cause the problem of degradation of measurement accuracy that is a concern, and it is extremely innovative and excellent in workability and practicality that can advance measurement work efficiently and accurately. It becomes a particle size gauge.

Moreover, in the present invention , until now, the bottom surface of the groove has been set to have a rough surface roughness in order to set the light reflectivity low, which itself causes measurement errors. In the present invention, the light reflectance of the bottom surface of the groove is reduced by forming a dark film or surface layer having a low light reflectance on the bottom surface of the groove. Because it has been set, it is possible to reliably prevent the difficulty of visual recognition (difficulty of measurement) due to flickering of the bottom surface and high reflection of light when visually recognizing the grain or line pattern of the sample extending in the groove. As a matter of course, the surface roughness of the bottom surface of the concave groove is set to be rough, so that there is no problem of measurement accuracy which is a concern, and the practicality of making more reliable, efficient and accurate measurement is excellent. It becomes a particle size gauge.

Furthermore, in the present invention , not only the above-mentioned excellent operational effects can be surely exhibited, but also the productivity is excellent, and the mass production is facilitated and the cost is excellent and the practicality is further improved. It becomes a particle size gauge.

  Embodiments of the present invention that are considered suitable (how to carry out the invention) will be briefly described with reference to the drawings, illustrating the operation of the present invention.

  A sample a is disposed in the groove 2 formed in the flat upper surface 1a of the measurement substrate 1.

  The concave groove 2 has a bottom surface 2a formed on an inclined surface inclined in the length direction of the concave groove 2, and the groove depth of the concave groove 2 is directed from one end to the other end in the length direction of the concave groove 2. The gradually changing bottom surface 2a is an inclined groove 2.

  When the scraper 3 whose edge is pressed against the flat upper surface 1a of the measurement substrate 1 so as to straddle the groove 2 is moved in the length direction of the groove 2 and the sample a is spread in the groove 2, Depending on the particle size of the sample a, a grain or a line pattern is represented at a position of a predetermined groove depth of the concave groove 2, and the particle size of the sample a is determined by visually checking or measuring the presence or position of the grain or line pattern. Measure.

  Here, since the bottom surface 2a of the concave groove 2 is set to a dark color having a light reflectance lower than that of the flat upper surface 1a as black or a dark color close to black, the bottom surface 2a of the concave groove 2 reflects light accordingly. Therefore, the bottom surface 2a of the groove 2 reflects light and flickers when the particle a or the line pattern of the sample a extending in the groove 2 is visually confirmed or measured (hereinafter, visually recognized). Can be prevented from becoming difficult to see.

  Therefore, until now, it is difficult to visually recognize the bottom surface 2a of the groove 2 due to flickering or high reflection of light when the particle or line pattern of the sample a extending in the groove 2 is measured during measurement. In addition, in the present invention, the bottom surface of the groove 2 has the problem that the grain or line pattern of the sample a changes (disintegrates) and causes measurement errors during the visual check. Since the light 2a has a dark color such as black having a low light reflectance, flickering due to light reflection and difficulty in visual recognition due to high light reflection can be reliably suppressed.

  That is, since the bottom surface 2a of the groove 2 is a dark color with low light reflectivity, the bottom surface 2a flickers and the invisibleness due to high reflection of light is reliably suppressed, and the particles or lines of the sample a are clearly and accurately limited. Since the pattern can be visually recognized, the visual work can be progressed efficiently and accurately without misreading.

  In addition, as in the conventional example, the light reflectance is not set low by setting the surface roughness of the bottom surface 2a of the concave groove 2 but the bottom surface 2a is set to a dark color with low light reflectance. Therefore, it is not necessary to set the surface roughness of the bottom surface 2a of the groove 2 to be rough in order to set the light reflectivity of the bottom surface 2a of the groove 2 low as in the prior art.

  That is, for example, by forming the black or black-colored film 4 or surface layer 4 on the bottom surface 2a of the concave groove 2, the bottom surface 2a of the concave groove 2 is set to the dark color close to black or black. What is necessary is just to set to the dark color whose light reflectance is lower than the flat upper surface 1a.

  At this time, for example, black or a black-colored film 4 or a surface layer close to black is formed on the metal bottom surface 2a of the groove 2 of the metal measurement base 1 by an existing film forming means such as oxidation treatment or chrome plating. 4 can be easily formed, and since the film 4 or the surface layer 4 itself has a dark color with low light reflectance, the light reflection can be suppressed well even if the film 4 or the surface layer 4 is finished to a smooth surface. .

  Therefore, since it is not necessary to set the surface roughness of the bottom surface 2a to be low in order to reduce the light reflectance of the bottom surface 2a of the groove 2 as before, by setting the surface roughness of the bottom surface 2a to be rough, The flickering of the bottom surface 2a can be suppressed satisfactorily and surely without causing a problem of feared deterioration of measurement accuracy.

  Further, only the bottom surface 2a of the groove 2 is set to a dark color having a light reflectance lower than that of the flat upper surface 1a, that is, the flat upper surface 1a needs to be set to a dark color having a low light reflectance. Therefore, the flat upper surface 1a is a flat surface 1a which is flat as usual and can smoothly slide the scraper 3, and the scraper 3 whose edges are pressed against the flat upper surface 1a is moved with a conventional operation feeling. (Sliding on the flat upper surface 1a) can be performed, and a person skilled in the measurement work can accurately perform the measurement with a conventional operation feeling.

Further, after the pre-Symbol form measuring body 1 of the dark film 4 or the surface layer 4 closer to the black or black on the bottom surface 2a of the flat upper surface 1a and the groove 2, other leaving at least bottom surface 2a of the groove 2 flat from top surface 1 a removing the film 4 or the surface layer 4, set in a dark low light reflectivity than the flat upper surface 1a of the bottom surface 2a of the groove 2 as a dark closer to the black or black because was the construction, for example, in the flat upper surface 1a by masking a flat upper surface 1a when forming the film 4 or the surface layer 4 on the bottom surface 2a of the groove 2 without forming the film 4 or the surface layer 4 Although it is difficult to form the coating 4 or the surface layer 4 accurately and cleanly only on the bottom surface 2a of the concave groove 2, it is difficult to form the bottom surface of the concave groove 2 on the flat upper surface 1a as in the present invention. 2a ( For example, when the coating 4 or the surface layer 4 is formed over substantially the entire top surface of the measurement substrate 1, the coating 4 or the surface layer 4 that is smooth and uniform can be easily formed, and then the bottom surface 2a of the groove 2 is formed. If the coating 4 or the surface layer 4 is removed from unnecessary portions to be removed, for example, the coating 4 or the surface layer 4 is not formed at all on the flat upper surface 1a, and the bottom surface 2a of the groove 2 is accurately and evenly uneven. A structure in which the coating 4 or the surface layer 4 is formed and can surely exhibit the excellent effects of the present invention can be easily realized, and the production is facilitated and the mass productivity is excellent.

  Further, for example, the flat upper surface 1a of the measurement base 1 made of metal is provided with the black or near dark black film 4 on the measurement base 1 as a smooth plane that has been surface-finished by surface polishing means such as lapping in advance. After the formation, the smooth flat surface is exposed by removing this, or the black or nearly dark color film 4 or surface layer 4 is formed on the measurement substrate 1 and then surface polishing means such as lapping. When the flat upper surface 1a is set to a smooth plane by performing a surface finishing process, the scraper 3 whose edge is pressed against the flat upper surface 1a, which is the same smooth plane as the conventional one, is moved. Since the friction between the scraper 3 and the flat upper surface 1a is equal to that of the conventional one, the scraper 3 is inevitably operated with a conventional operation feeling. Movement can operate (slide on the flat upper surface 1a), for example, those of skill in the measuring operation is to make accurate measurements by the operation feeling of the conventional.

  Further, in particular, when the surface of the measurement substrate 1 is formed with the black or the dark-colored film 4 or the surface layer 4 close to black and then surface-finished by surface polishing means such as lapping, the film is formed from the flat upper surface 1a. 4 or the polishing operation for removing the surface layer 4 and the surface finishing operation of the flat upper surface 1a can be performed at the same time, so that the mass productivity can be further improved.

  Specific embodiments of the present invention will be described with reference to the drawings.

  In this embodiment, a concave groove 2 is formed on the flat upper surface 1 a of the measurement substrate 1, and the concave groove 2 is formed on an inclined surface whose bottom surface 2 a is inclined in the length direction of the concave groove 2. The sample a is arranged in the groove 2 as a configuration in which the bottom surface 2a in which the groove depth of the groove 2 gradually changes from one end to the other end of the groove 2 is inclined. When the scraper 3 whose edge is pressed against the flat upper surface 1a of the measurement substrate 1 is moved in the length direction of the groove 2 so as to extend over the groove 2 to spread the sample a, In a particle size gauge that measures the particle size of the sample a by visually observing or measuring the presence or position of the grain or line pattern of the spread sample a, the bottom surface 2a of the groove 2 of the measurement substrate 1 is black or close to black The dark color is set to a dark color having a light reflectance lower than that of the flat upper surface 1a. .

  The measurement substrate 1 is made of a hardened steel member, and is specifically formed in a rectangular block shape as shown in FIG. 1, as shown in FIG. The measurement substrate 1 may be a general member used for this type of particle size gauge such as a member made of hardened special alloy, in addition to a hardened steel member.

  The flat upper surface 1a of the measurement substrate 1 is satisfactorily slidable by the surface polishing means (existing lapping device in the present embodiment) described later so that the scraper 3 whose edge is pressed against the flat upper surface 1a can be satisfactorily slid. Set to a flat and smooth surface.

  In addition, the two concave grooves 2 are formed in a parallel arrangement from one end side to the other end in the length direction of the flat upper surface 1a of the measurement substrate 1.

  As shown in FIGS. 1 and 2, the two concave grooves 2 both have one end in the length direction (left side in FIG. 2) to the other end (right end in FIG. 2) of the flat upper surface 1 a of the measurement substrate 1. The bottom surface 2a is inclined downward toward the bottom.

The degree of inclination of the bottom surface 2a of each concave groove 2 is the same as that of this kind of general particle size gauge, for example, one end on the shallow side of the groove depth of the concave groove 2 is set to depth 0, and the groove depth is deep. The other end on the side is uniformly inclined with a depth of 15 μm to 100 μm. In this embodiment, one end on the shallow side of the groove depth of each concave groove 2 is set to 0, and the groove depth is deep. The degree of inclination of the bottom surface 2a of each groove 2 is set so that the other end of the groove has a depth of 50 μm. A scale is provided between the two concave grooves 2 on the flat upper surface 1a of the measurement substrate 1 at positions corresponding to the groove depths of the two concave grooves 2.

  Further, on the bottom surface 2a of each concave groove 2, a film 4 or a surface layer 4 of black or a dark color close to black (black in this embodiment) or a surface layer 4 is formed. Specifically, a smooth coating 4 having a black color or a dark color close to black is formed on the metal bottom surface 2a of the groove 2 of the measurement base 1 made of metal by a coating forming means such as oxidation treatment or chrome plating. Alternatively, by forming the surface layer 4, the bottom surface 2a of the concave groove 2 is set to a dark color having a light reflectance lower than that of the flat upper surface 1a as the black or dark color close to black.

  More specifically, in this embodiment, the black surface layer 4 is formed on the bottom surface 2a of the groove 2 by an existing black oxidation process. For example, the black film 4 may be formed on the bottom surface 2a of the concave groove 2 by an existing black chrome plating process (radient), and other examples include, for example, black paint. It is sufficient to adopt a configuration that exhibits the same operational effects as in this embodiment, such as a configuration in which a black paint layer is formed as the surface layer 4.

  Therefore, the bottom surface 2a of the concave groove 2 on which the surface layer 4 is formed has less gloss specific to metals and better light reflectance than a surface obtained by smooth surface polishing of a simply hardened steel surface. The configuration is lowered. Further, the surface layer 4 which is the bottom surface 2a is subjected to a smooth surface treatment so that the sample a can be spread satisfactorily. However, the surface layer 4 is slightly so as not to hinder measurement (the sample a cannot be spread smoothly). In this case, the light reflectance can be set lower.

  In this embodiment, as shown in FIG. 4, the black surface layer 4 (by black oxidation treatment) is formed on the flat upper surface 1 a of the measurement substrate 1 and the bottom surface 2 a of the groove 2. .

  Specifically, the black surface layer 4 is once formed on the entire upper surface of the measurement substrate 1 by black oxidation, and then the surface layer formed on the smooth upper surface 1a of the measurement substrate 1 by polishing (lapping) using a lapping apparatus. Only 4 is removed.

  Therefore, for example, when the black film 4 or the surface layer 4 is formed by a film forming means such as black oxidation treatment aiming only at the bottom surface 2a of the concave groove 2, for example, masking is performed on portions other than the bottom surface 2a of the concave groove 2 for example. In addition, a troublesome operation such as carefully performing the black oxidation treatment only on the bottom surface 2a of the concave groove 2 by the film forming means is required, and the surface layer 4 is eventually formed also in the masked extra portion. Since it is difficult to form the surface layer 4 cleanly and uniformly only at the target location (the bottom surface 2a of the groove 2), the work efficiency is very poor and the productivity is poor. As shown in the example, once the entire upper surface of the measurement substrate 1 is subjected to the black oxidation treatment, the surface layer 4 can be easily formed on the bottom surface 2a of the groove 2 with a clean and uniform surface.

  Further, after the black surface layer 4 is formed on the entire upper surface of the measurement substrate 1, surface finishing is performed by a surface polishing means (in this embodiment, a lapping device) to obtain a smooth flat surface.

  Therefore, in this embodiment, since the operation of removing the surface layer 4 formed on the flat upper surface 1a of the measurement substrate 1 and the operation of smoothing the surface of the flat upper surface 1a are performed simultaneously, the production can be performed very efficiently. . Note that the flat upper surface 1a of the measurement base 1 made of metal is formed with the black or dark black film 4 on the measurement base 1 as a smooth plane that has been surface-finished by surface polishing means such as lapping in advance. Thereafter, the flat upper surface 1a may be made a smooth plane by removing the flat surface to expose the smooth plane.

  The scraper 3 is made of a hardened steel member, and is formed in a blade plate shape with edges at the upper end and the other end as blade edges, as shown in FIG.

  Like the scraper 3 of this kind of particle size gauge, the scraper 3 is formed such that the edge of the scraper 3 is formed in a straight line, and the cutting edge has a rounded shape with a radius of 250 μm.

  The measurement method of the present embodiment configured as described above will be described.

  As shown in FIG. 3, first, the sample a to be measured is piled up at the end of each groove 2 formed on the measurement base 1 on the deeper side (the height of the sample a is determined according to each groove 2 A little more than the amount that just satisfies.)

  Next, the edge (blade edge) of the scraper 3 is pressed against the flat upper surface 1a of the measurement substrate 1 so as to cross the groove 2 substantially orthogonally, and the length direction of the groove 2 as shown in FIG. The scraper 3 at a predetermined speed (for example, a constant speed from one end to the other end of the concave groove 2 over one to two seconds) toward the shallow side of the concave groove 2 along The sample a is spread in the concave groove 2 by the scraper 3.

  Next, according to the particle size of the sample a, as shown in FIG. 5, the particles of the sample a represented on the bottom surface 2 a at a predetermined groove depth position of the concave groove 2 are visually recognized, and the presence or absence and position thereof are visually confirmed. By doing so, the particle size of the sample a is obtained.

  In addition, for example, the sample a extended in the concave groove 2 represents a line pattern instead of a grain, and there are some which are measured by visually confirming the presence / absence, number and position of the line pattern. Since it is the same as the conventional measuring method using a particle size gauge, detailed description is abbreviate | omitted.

  Since the present embodiment is configured as described above, the bottom surface 2a of the groove 2 is a flat top surface when the presence or absence or position of the grains of the sample a expanded in the groove 2 is visually confirmed during measurement. Since the light reflectance is set to be lower than that of 1a (the black surface layer 4 is formed on the bottom surface 2a), conventionally, as shown in FIG. 2a flickers or highly reflects light, making it difficult to visually recognize the particles of sample a. This not only hinders the efficiency of measurement work, but also causes the position of the particles of sample a to be misread due to misreading of measured values or delays in visual work. In the present embodiment, it is difficult to visually recognize the flickering of the bottom surface 2a of the concave groove 2 or the high reflection of light. Therefore, the grains of the sample a that have spread in the concave groove 2 efficiently and well or Measurement errors such as the pattern visualizing work can be advanced, and as a result, reading errors due to the flickering of the bottom surface 2a and the difficulty of visual recognition due to high reflection of light, and the grain or line pattern of the sample a changes (disintegrates) due to the lightening of the visual work. The cause of this can be eliminated well.

  Further, unlike the conventional example, the surface roughness is not set to be rough in order to reduce the light reflectivity of the bottom surface 2a of the concave groove 2, but the black surface layer 4 is simply formed on the bottom surface 2a, and the bottom surface 2a. Since it is not necessary to set the surface roughness of the surface to be rough, there is no problem of measurement accuracy degradation which is a concern by setting the surface roughness of the bottom surface 2a to be rough. Therefore, it is extremely efficient and excellent in accuracy. In addition, the measurement work can be further advanced, and it is an extremely innovative and practical utility particle size gauge with excellent productivity and mass productivity.

  In particular, in the past, when the particles of the sample a were light skin color or white color such as cosmetics, the particles of the sample a were very difficult to see and the measurement was extremely troublesome. In the example, as shown in FIG. 5, even when the sample a is light-colored, the particles of the sample a can be visually recognized very well, which is extremely effective for measuring the particle size of light-colored samples such as cosmetics. The particle size gauge has excellent practicality.

  Note that the present invention is not limited to this embodiment, and the specific configuration of each component can be designed as appropriate.

It is an explanation perspective view of the particle size gauge concerning this example. It is a description front view of the particle size gauge which concerns on a present Example. It is use condition explanatory drawing of the particle size gauge which concerns on a present Example. It is a figure which shows the procedure which forms the membrane | film | coat 4 in the bottom face 2a of the ditch | groove 2 of the particle size gauge which concerns on a present Example. It is a figure which shows the measurement procedure of the particle size gauge which concerns on a present Example. It is a figure which shows a prior art example.

DESCRIPTION OF SYMBOLS 1 Measurement base | substrate 1a Flat upper surface 2 Groove | groove 3 Scraper 4 Film | membrane , surface layer a Sample

Claims (2)

A concave groove is formed on the flat upper surface of the measurement substrate. The concave groove is formed on an inclined surface whose bottom surface is inclined in the length direction of the concave groove, and the groove depth of the concave groove is the length direction of the concave groove. As a configuration with a concave groove whose bottom surface gradually changes from one end to the other, a sample is placed in the concave groove, and a flat upper surface of the measurement substrate is placed so as to straddle the concave groove so as to extend the sample. When moving the scraper with the edge pressed against the groove in the length direction of the groove, the particle size of the sample is visually confirmed or measured by checking the presence or position or the position of the grain or line pattern of the sample spread in the groove. In the particle size gauge for measuring the surface of the metal, the surface of the concave groove of the measurement base made of metal is black or a dark color close to black by a film forming means such as oxidation treatment or chrome plating, and a smooth film or surface. By forming a layer of this ditch The surface is made black or a dark color close to black, and the black or dark black film or surface layer is formed on the flat upper surface of the measurement substrate and the bottom surface of the groove, and at least the bottom surface of the groove is left. By removing the film or surface layer from the other flat upper surface, the flat upper surface is exposed or surface-finished to form a smooth flat surface, and the bottom surface of the groove of the measurement substrate is black or a dark color close to black. A particle size gauge characterized in that it is set to a dark color with a lower light reflectance than the flat upper surface. The flat upper surface of the measurement base made of metal is removed after forming the black or dark black film on the measurement base as a smooth flat surface that has been surface-finished by surface polishing means such as lapping in advance. The smooth flat surface is exposed, or the black or near dark film or surface layer is formed on the measurement substrate, and then the surface is processed by a surface polishing means such as lapping to obtain a smooth flat surface. in particle size gauge of claim 1, wherein the set of the flat upper surface smooth plane.

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