JP4377709B2 - 精米の糠量判定方法 - Google Patents
精米の糠量判定方法 Download PDFInfo
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- JP4377709B2 JP4377709B2 JP2004026195A JP2004026195A JP4377709B2 JP 4377709 B2 JP4377709 B2 JP 4377709B2 JP 2004026195 A JP2004026195 A JP 2004026195A JP 2004026195 A JP2004026195 A JP 2004026195A JP 4377709 B2 JP4377709 B2 JP 4377709B2
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- Prior art keywords
- rice
- determination
- amount
- polished rice
- residual
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- Investigating Or Analyzing Materials Using Thermal Means (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Investigating Or Analysing Materials By The Use Of Chemical Reactions (AREA)
- Adjustment And Processing Of Grains (AREA)
Description
本発明は、精米表面を150℃〜200℃で5分間〜20分間加熱して精米表面の糠を変色させる加熱変色工程と、該加熱変色工程で得られた精米を撮像する撮像工程と、該撮像工程で得られた精米の撮像データに基づいて、各画素データの光量と予め設定した変色部識別用のしきい値とを比較して精米表面において変色した部分を特定して残留糠量を判定する判定工程とを有する、という技術的手段を講じた。これによると、被判定米粒(精米)の前記加熱により、被判定米粒(精米)の表面において、胚乳部よりも脂質を多く含む糠成分が変色する。次いで、この加熱した精米を撮像し、該撮像データを基にして前記変色部分を特定して残留糠部分と判定するというものである。
2 凹部
3 加熱装置
4 撮像手段
5 判定手段
6 画像処理部
7 残留糠量判定回路
8 中央演算部(CPU)
9 入出力回路(I/O)
10 読み出し専用記憶部(ROM)
11 読み出し・書き込み用記憶部(RAM)
12 表示手段(ディスプレイ)
G 画素
G1 精米の外形を示す画素
G2 精米の変色部を示す画素
S 精米
Z 残留糠
Z1 変色後の残留糠(変色部)
Claims (1)
- 精米表面を150℃〜200℃で5分間〜20分間加熱して精米表面の糠を変色させる加熱変色工程と、該加熱変色工程で得られた精米を撮像する撮像工程と、該撮像工程で得られた精米の撮像データに基づいて、各画素データの光量と予め設定した変色部識別用のしきい値とを比較して精米表面において変色した部分を特定して残留糠量を判定する判定工程とを有することを特徴とする精米の糠量判定方法。
Priority Applications (1)
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JP2004026195A JP4377709B2 (ja) | 2004-02-03 | 2004-02-03 | 精米の糠量判定方法 |
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JP2004026195A JP4377709B2 (ja) | 2004-02-03 | 2004-02-03 | 精米の糠量判定方法 |
Publications (2)
Publication Number | Publication Date |
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JP2005221235A JP2005221235A (ja) | 2005-08-18 |
JP4377709B2 true JP4377709B2 (ja) | 2009-12-02 |
Family
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JP2004026195A Expired - Fee Related JP4377709B2 (ja) | 2004-02-03 | 2004-02-03 | 精米の糠量判定方法 |
Country Status (1)
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JP (1) | JP4377709B2 (ja) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5739712B2 (ja) * | 2011-03-31 | 2015-06-24 | 住友大阪セメント株式会社 | 光学顕微鏡観察用試料の製造方法及び観察方法 |
JP6765643B2 (ja) * | 2016-03-31 | 2020-10-07 | 株式会社サタケ | 穀類の搗精度評価方法及びその装置 |
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2004
- 2004-02-03 JP JP2004026195A patent/JP4377709B2/ja not_active Expired - Fee Related
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JP2005221235A (ja) | 2005-08-18 |
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