JP4300783B2 - Processing position teaching method of semiconductor laser device - Google Patents

Processing position teaching method of semiconductor laser device Download PDF

Info

Publication number
JP4300783B2
JP4300783B2 JP2002296201A JP2002296201A JP4300783B2 JP 4300783 B2 JP4300783 B2 JP 4300783B2 JP 2002296201 A JP2002296201 A JP 2002296201A JP 2002296201 A JP2002296201 A JP 2002296201A JP 4300783 B2 JP4300783 B2 JP 4300783B2
Authority
JP
Japan
Prior art keywords
semiconductor laser
contact
welding torch
robot
laser welding
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2002296201A
Other languages
Japanese (ja)
Other versions
JP2004130334A (en
Inventor
伸典 倉橋
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Corp
Panasonic Holdings Corp
Original Assignee
Panasonic Corp
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Panasonic Corp, Matsushita Electric Industrial Co Ltd filed Critical Panasonic Corp
Priority to JP2002296201A priority Critical patent/JP4300783B2/en
Publication of JP2004130334A publication Critical patent/JP2004130334A/en
Application granted granted Critical
Publication of JP4300783B2 publication Critical patent/JP4300783B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Images

Description

【0001】
【発明の属する技術分野】
本発明は、例えば、板金の溶接等の加熱源として利用される半導体レーザ装置に関するものである。
【0002】
【従来の技術】
板金の溶接において溶接品質の向上が図られているが、その一つにロボットによる自動溶接がある。溶接用ロボットに対象物の溶接ポイントを教示することで、溶接位置が安定し、溶接品質のバラツキを少なくすることができる。
【0003】
従来の教示方法の一つに、教示部をカメラで観察し、映像上においてレーザ光ガイドスポット位置と溶接部の位置関係を求め、ロボットへの位置補正データを割りだして教示する方法がある。(例えば特許文献1参照。)
図2は上記従来のレーザ溶接の教示方法を示しており、12はレーザ溶接トーチ、13はテレビカメラ、14スポット光源、15はスポット点、16はモニタテレビ、17は制御装置、18及び19は被溶接物、20は溶接突合せ部を表す。
【0004】
以上のように構成されたレーザ溶接の教示方法について、その動作を説明する。被溶接物18と19の溶接突合せ部20の近傍に、スポット光源14からのスポット点15が照射される。テレビカメラ13にて溶接突合せ部20及びスポット点15の映像が取り込まれ、モニタテレビ16に映し出される。モニタテレビ上の溶接突合せ部20及びスポット点15の位置関係を制御装置17を介して求め、その座標データをレーザ溶接トーチ12を保持しているロボットに取り込み、突合せ部20の位置を教示する。
【0005】
【特許文献1】
特許第2669147号公報(第2−4頁、第1図)
【0006】
【発明が解決しようとする課題】
しかし上記の従来の教示方法では、モニタテレビ上での映像情報による位置データであり、2次元データでの計算になるので、レーザ溶接トーチと突合せ部との距離データは算出できない課題がある。
【0007】
レーザ溶接では集光ビームの焦点位置が突合せ部に正確に合っていないと集光ビーム径が大きくなり、エネルギ密度が低下し、溶接品質の劣化を招く。
【0008】
本発明は、上記課題を解決する半導体レーザ装置の構成を提供することを目的とする。
【0009】
【課題を解決するための手段】
本発明の半導体レーザ装置の加工位置教示方法は、上記課題を解決するために、電源部からエネルギーが供給されてレーザ光を出力する半導体レーザ手段と前記レーザ光を被加工物へ集光する集光手段とを有した半導体レーザ溶接トーチをロボットで保持し、先端が加工焦点距離の長さに調整した加工位置教示手段として接触式変位計を前記半導体レーザ溶接トーチの先端部に装着可能とし、映像焦点を前記接触式変位計の先端にあわせたカメラを前記半導体レーザ溶接トーチに取付けた半導体レーザ装置を用い、前記半導体レーザ溶接トーチに前記接触式変位計を装着してレーザ光を照射しない状態で、前記半導体レーザ溶接トーチをロボットで前記被加工物の溶接部近傍に移動し、前記カメラの映像により前記接触式変位計の先端が溶接部に接触するようにロボットを移動し、接触した変位量を差し引いた分の値でロボットの教示データを決定するものである。この方法により、実際の教示位置をレーザ照射なしに教示できる
【0011】
【発明の実施の形態】
(実施の形態)
図1において、1は半導体レーザ溶接トーチ、2は半導体レーザモジュール、3は集光レンズ、4は接触式変位計、5は加工焦点距離、6は制御装置、7はカメラ、8はモニタ、9及び10は被溶接物、 11は溶接突合せ部を示す。
【0012】
以上のように構成された半導体レーザ装置について、その動作を説明する。
【0013】
レーザ光を出力する半導体レーザ手段である半導体レーザモジュール2は半導体レーザ溶接トーチ1に内蔵されている。さらに半導体レーザ溶接トーチ1は、半導体レーザモジュール2から出たレーザ光を被加工物へ集光する手段である集光レンズ3を有している。
【0014】
半導体レーザ溶接トーチ1は、この先端部に加工焦点距離5の長さに調整された加工位置教示手段、例えば接触式変位計4を先端部に装着できる構造となっている。
【0015】
溶接位置を教示するときは、半導体レーザ溶接トーチ1の先端部に、接触式変位計4を変位0の状態で加工焦点距離5に等しい長さとなるように装着する。また半導体レーザ溶接トーチ1には、ブラケットを介してカメラ7を取付け、カメラ7の映像焦点は接触式変位計4の先端部となるように調整しておく。
【0016】
この状態の半導体レーザ溶接トーチ1をロボットに保持させ、被溶接物9及び10の溶接突合せ部11近傍に持ってくる。近傍に持ってくるときは、カメラ7の映像をモニタ8で確認しながら、ゆっくりとロボットを移動させる。
【0017】
そしてカメラ7の映像を見ながら、突合せ部11に、接触式変位計4の先端が、少し接触するところまで、ロボットを移動させる。
【0018】
このとき接触した変位量は、制御装置6に戻される。制御装置6は変位量を差し引いた分の値でロボットの教示データを決定する。
【0019】
この計算により、接触式変位計4の変位量に関わらず、ロボットの教示位置は、常に正確に加工焦点距離5とすることが可能となる。
【0020】
たとえば被溶接物9及び10が反っており、溶接突合せ部11が位置により上下方向に変化していても、接触式変位計4の変位量の変化に応じて、ロボットの教示位置は、常に正確に加工焦点距離5とすることが可能となる。
【0021】
その効果として、集光ビームの焦点位置が突合せ部の位置に関わらず常に正確に合うため、エネルギ密度の変動を抑えて溶接品質を安定させることができる。
【0022】
さらに、加工位置教示手段によってレーザ光を照射しないで半導体レーザ装置の加工位置を教示するため、ワークをロスすることなく、正確な教示が可能で、容易に教示位置の変更,修正,追加ができ、資源の無駄使いがなくなり、しいては環境に配慮した教示ができるものである。
【0023】
【発明の効果】
以上のように、本発明は、集光手段からの焦点距離に相当する装着可能な加工位置教示手段を備えたため、正確な教示が可能となり、実際にレーザ照射した際、レーザビームのエネルギ密度が安定し、良好な溶接品質を得ることができる。
【図面の簡単な説明】
【図1】本発明の実施の形態における全体構成を示す図
【図2】従来におけるレーザ溶接における教示方法を示す図
【符号の説明】
1 半導体レーザ溶接トーチ
2 半導体レーザモジュール
3 集光レンズ
4 接触式変位計
5 加工焦点距離
6 制御装置
7 カメラ
8 モニタ
9,10 被溶接物
11 溶接突合せ部
[0001]
BACKGROUND OF THE INVENTION
The present invention relates to a semiconductor laser device used as a heat source for, for example, welding of sheet metal.
[0002]
[Prior art]
The welding quality is improved in the welding of sheet metal, and one of them is automatic welding by a robot. By teaching the welding point of the object to the welding robot, the welding position can be stabilized, and variations in welding quality can be reduced.
[0003]
As one of the conventional teaching methods, there is a method in which a teaching portion is observed with a camera, a positional relationship between a laser beam guide spot position and a welding portion is obtained on an image, and position correction data to a robot is divided and taught. (For example, refer to Patent Document 1.)
FIG. 2 shows the conventional laser welding teaching method, wherein 12 is a laser welding torch, 13 is a television camera, 14 spot light source, 15 is a spot point, 16 is a monitor television, 17 is a control device, 18 and 19 are An article to be welded, 20 represents a welding butt.
[0004]
The operation of the laser welding teaching method configured as described above will be described. A spot point 15 from the spot light source 14 is irradiated in the vicinity of the weld butt 20 of the workpieces 18 and 19. The television camera 13 captures images of the welding butt 20 and the spot point 15 and displays them on the monitor television 16. The positional relationship between the welding butt 20 on the monitor television and the spot point 15 is obtained via the control device 17, the coordinate data is taken into the robot holding the laser welding torch 12, and the position of the butt 20 is taught.
[0005]
[Patent Document 1]
Japanese Patent No. 2669147 (page 2-4, Fig. 1)
[0006]
[Problems to be solved by the invention]
However, the conventional teaching method described above is position data based on video information on a monitor television, and is calculated using two-dimensional data. Therefore, there is a problem that distance data between the laser welding torch and the butt portion cannot be calculated.
[0007]
In laser welding, if the focal position of the focused beam is not exactly aligned with the abutting portion, the focused beam diameter is increased, the energy density is lowered, and the welding quality is degraded.
[0008]
An object of the present invention is to provide a configuration of a semiconductor laser device that solves the above problems.
[0009]
[Means for Solving the Problems]
In order to solve the above-described problems, a semiconductor laser device processing position teaching method of the present invention includes a semiconductor laser means for outputting laser light when energy is supplied from a power supply unit, and a collector for condensing the laser light on a workpiece. A semiconductor laser welding torch having an optical means is held by a robot, and a contact displacement meter can be attached to the tip of the semiconductor laser welding torch as a processing position teaching means whose tip is adjusted to the length of the processing focal length. Using a semiconductor laser device in which a camera whose image focus is set to the tip of the contact-type displacement meter is attached to the semiconductor laser welding torch, and mounting the contact-type displacement meter on the semiconductor laser welding torch and not irradiating laser light Then, the semiconductor laser welding torch is moved to the vicinity of the welded portion of the workpiece by a robot, and the tip of the contact displacement meter is welded by the image of the camera. It is to determine the teaching data of the robot at the minute value to move the robot, by subtracting the displacement amount of contact to contact the. By this method, the actual teaching position can be taught without laser irradiation.
DETAILED DESCRIPTION OF THE INVENTION
(Embodiment)
In FIG. 1, 1 is a semiconductor laser welding torch, 2 is a semiconductor laser module, 3 is a condenser lens, 4 is a contact displacement meter, 5 is a processing focal length, 6 is a control device, 7 is a camera, 8 is a monitor, 9 Reference numerals 10 and 10 denote workpieces to be welded, and 11 a weld butt.
[0012]
The operation of the semiconductor laser device configured as described above will be described.
[0013]
A semiconductor laser module 2, which is a semiconductor laser means for outputting laser light, is built in the semiconductor laser welding torch 1. Further, the semiconductor laser welding torch 1 has a condensing lens 3 that is a means for condensing the laser light emitted from the semiconductor laser module 2 onto a workpiece.
[0014]
The semiconductor laser welding torch 1 has a structure in which a processing position teaching means, for example, a contact-type displacement meter 4 adjusted to the length of the processing focal length 5 can be attached to the distal end portion.
[0015]
When teaching the welding position, the contact-type displacement meter 4 is attached to the tip of the semiconductor laser welding torch 1 so as to have a length equal to the processing focal length 5 in a state of zero displacement. A camera 7 is attached to the semiconductor laser welding torch 1 via a bracket, and the image focus of the camera 7 is adjusted so as to be the tip of the contact displacement meter 4.
[0016]
The semiconductor laser welding torch 1 in this state is held by the robot and brought near the welding butt 11 of the workpieces 9 and 10. When bringing it in the vicinity, the robot is slowly moved while checking the image of the camera 7 on the monitor 8.
[0017]
Then, while watching the image of the camera 7, the robot is moved to a position where the tip of the contact displacement meter 4 slightly contacts the butting portion 11.
[0018]
The amount of displacement contacted at this time is returned to the control device 6. The control device 6 determines the robot teaching data based on the value obtained by subtracting the displacement amount.
[0019]
By this calculation, the teaching position of the robot can always be accurately set to the processing focal length 5 regardless of the displacement amount of the contact displacement meter 4.
[0020]
For example, even if the workpieces 9 and 10 are warped and the welding butt portion 11 changes vertically depending on the position, the teaching position of the robot is always accurate according to the change in the displacement amount of the contact displacement meter 4. It is possible to set the processing focal length to 5.
[0021]
As an effect thereof, since the focal position of the focused beam is always accurately adjusted regardless of the position of the abutting portion, fluctuations in energy density can be suppressed and welding quality can be stabilized.
[0022]
Furthermore, since the machining position teaching means teaches the machining position of the semiconductor laser device without irradiating the laser beam, accurate teaching can be performed without losing the workpiece, and the teaching position can be easily changed, modified, or added. , It eliminates wasteful use of resources and enables teaching in consideration of the environment.
[0023]
【The invention's effect】
As described above, the present invention includes the mounting position teaching means that can be mounted corresponding to the focal length from the light collecting means, so that accurate teaching is possible, and when the laser is actually irradiated, the energy density of the laser beam is reduced. Stable and good welding quality can be obtained.
[Brief description of the drawings]
FIG. 1 is a diagram showing an overall configuration in an embodiment of the present invention. FIG. 2 is a diagram showing a teaching method in conventional laser welding.
DESCRIPTION OF SYMBOLS 1 Semiconductor laser welding torch 2 Semiconductor laser module 3 Condensing lens 4 Contact-type displacement meter 5 Processing focal distance 6 Control apparatus 7 Camera 8 Monitor 9, 10 To-be-welded object 11 Weld butt | matching part

Claims (1)

電源部からエネルギーが供給されてレーザ光を出力する半導体レーザ手段と前記レーザ光を被加工物へ集光する集光手段とを有した半導体レーザ溶接トーチをロボットで保持し、先端が加工焦点距離の長さに調整した加工位置教示手段として接触式変位計を前記半導体レーザ溶接トーチの先端部に装着可能とし、映像焦点を前記接触式変位計の先端にあわせたカメラを前記半導体レーザ溶接トーチに取付けた半導体レーザ装置を用い、前記半導体レーザ溶接トーチに前記接触式変位計を装着してレーザ光を照射しない状態で、前記半導体レーザ溶接トーチをロボットで前記被加工物の溶接部近傍に移動し、前記カメラの映像により前記接触式変位計の先端が溶接部に接触するようにロボットを移動し、接触した変位量を差し引いた分の値でロボットの教示データを決定する半導体レーザ装置の加工位置教示方法。A semiconductor laser welding torch having a semiconductor laser means for outputting laser light when energy is supplied from a power supply unit and a condensing means for condensing the laser light on a workpiece is held by a robot, and the tip is a processing focal length. As a processing position teaching means adjusted to the length of the contact laser, a contact displacement meter can be attached to the tip of the semiconductor laser welding torch, and a camera with a video focus set to the tip of the contact displacement meter is attached to the semiconductor laser welding torch. Using the attached semiconductor laser device, the semiconductor laser welding torch is moved to the vicinity of the welded portion of the workpiece by a robot with the contact-type displacement meter attached to the semiconductor laser welding torch and without irradiating laser light. , b min value to move the robot, by subtracting the displacement amount of contact so that the tip of the contact type displacement meter by the image of the camera is brought into contact with the weld Processing position teaching method of a semiconductor laser device for determining the Tsu bets teaching data.
JP2002296201A 2002-10-09 2002-10-09 Processing position teaching method of semiconductor laser device Expired - Fee Related JP4300783B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2002296201A JP4300783B2 (en) 2002-10-09 2002-10-09 Processing position teaching method of semiconductor laser device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2002296201A JP4300783B2 (en) 2002-10-09 2002-10-09 Processing position teaching method of semiconductor laser device

Publications (2)

Publication Number Publication Date
JP2004130334A JP2004130334A (en) 2004-04-30
JP4300783B2 true JP4300783B2 (en) 2009-07-22

Family

ID=32286241

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2002296201A Expired - Fee Related JP4300783B2 (en) 2002-10-09 2002-10-09 Processing position teaching method of semiconductor laser device

Country Status (1)

Country Link
JP (1) JP4300783B2 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5135672B2 (en) 2005-09-30 2013-02-06 日産自動車株式会社 Laser irradiation state detection method and laser irradiation state detection system
CN102430859B (en) * 2011-10-28 2014-08-06 北京航天新风机械设备有限责任公司 Defocusing real time control method for laser welding

Also Published As

Publication number Publication date
JP2004130334A (en) 2004-04-30

Similar Documents

Publication Publication Date Title
US10092977B2 (en) Welding head and method for joining a workpiece
JP5266647B2 (en) Laser welding apparatus and adjustment method thereof
CN101856773B (en) Focusing positioning method based on initial laser processing position and laser processing device
JP2013036981A (en) Optical measuring device monitoring connection joint, and connection head and laser welding head provided with measuring device
JP2002192373A (en) Laser beam welding method and laser beam welding device
JP2008203434A (en) Scanning mechanism, method of machining material to be machined and machining apparatus
JP2011051006A (en) Integrated laser vision sensor for welding and welding control method
JP5495574B2 (en) Laser soldering method
JP2000042775A (en) Laser beam machining method and its device
JP4300783B2 (en) Processing position teaching method of semiconductor laser device
JP2001321971A (en) Control system for laser beam welding head and laser beam welding head equipped with the control system
JP5223537B2 (en) Laser welding quality inspection method and apparatus
JP5389613B2 (en) Method for managing consumption of cutting blade in cutting apparatus
KR20210031605A (en) Position adjusting method and apparatus thereof
JP2019155402A (en) Centering method for laser beam and lase processing device
JPS62192286A (en) Beam welding equipment
JP5238451B2 (en) Laser processing apparatus and position detection method thereof
US11852891B2 (en) Laser processing device and method for processing a workpiece
JP2004337874A (en) Optical machining apparatus
JPH04356389A (en) Method and device for correcting working point of laser beam machine
US20230364718A1 (en) Laser processing machine and method of correcting spot diameter of laser processing machine
JP2019118949A (en) Processing device
JP2822698B2 (en) Positioning device and laser processing device
JP3464902B2 (en) Groove copying machine
JP5231753B2 (en) Laser processing method

Legal Events

Date Code Title Description
A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20041203

RD01 Notification of change of attorney

Free format text: JAPANESE INTERMEDIATE CODE: A7421

Effective date: 20050707

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20070720

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20070724

A521 Written amendment

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20070921

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20080617

A521 Written amendment

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20080806

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20081216

A521 Written amendment

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20081219

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20090331

A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20120501

Year of fee payment: 3

R151 Written notification of patent or utility model registration

Ref document number: 4300783

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R151

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20090413

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20120501

Year of fee payment: 3

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20120501

Year of fee payment: 3

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20130501

Year of fee payment: 4

LAPS Cancellation because of no payment of annual fees