JP4282208B2 - Heat treatment apparatus, boat, heat treatment method, and semiconductor manufacturing method - Google Patents

Heat treatment apparatus, boat, heat treatment method, and semiconductor manufacturing method Download PDF

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Publication number
JP4282208B2
JP4282208B2 JP2000174675A JP2000174675A JP4282208B2 JP 4282208 B2 JP4282208 B2 JP 4282208B2 JP 2000174675 A JP2000174675 A JP 2000174675A JP 2000174675 A JP2000174675 A JP 2000174675A JP 4282208 B2 JP4282208 B2 JP 4282208B2
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Prior art keywords
boat
substrate
child
holding
substrates
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JP2000174675A
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JP2001358085A5 (en
JP2001358085A (en
Inventor
光孝 萱沼
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Hitachi Kokusai Electric Inc
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Hitachi Kokusai Electric Inc
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Priority to JP2000174675A priority Critical patent/JP4282208B2/en
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Publication of JP2001358085A5 publication Critical patent/JP2001358085A5/ja
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Description

【0001】
【発明の属する技術分野】
本発明は、縦型拡散装置や縦型CVD装置等の縦型反応炉を備えた半導体製造装置に係り、特に、多数の基板を搭載して縦型反応炉内に出し入れされる縦型ボートを備えた半導体製造装置に関する。
【0002】
【従来の技術】
この種の半導体製造装置では、縦型の反応炉に対しウェハを出し入れする手段として縦型ボートを使用しており、従来では、縦型ボートに多数のウェハを水平姿勢で上下方向に多段に搭載して処理を行っている。
【0003】
図5は従来の半導体製造装置の一例を示している。
図において、1は縦型反応炉、2は該縦型反応炉1の上端部に設けられたガス吹出口、3はガス吹出口2に処理ガスを送り込むガス供給路、4は縦型反応炉1の下部に設けられたガス排出路、5は縦型反応炉1の下端開口を塞ぐボートキャップ、10はキャップ5上に載せられた縦型ボートである。
【0004】
ウェハ(基板)Wは、縦型ボート10に水平姿勢で搭載された形で、反応炉1の内部に装入される。縦型ボート10には、上下方向に図6に示すような多数のウェハ支持部11が設けられており、ウェハWの周縁部の複数箇所がウェハ支持部11の上に載せられることで、ウェハWが水平姿勢で保持されるようになっている。
【0005】
ウェハWは、例えば処理ガスを、ガス供給路3→ガス吹出口→反応炉1内→ガス排出路4の順路で流しながら高温雰囲気下で処理される。
【0006】
【発明が解決しようとする課題】
上述のように、従来の縦型反応炉1を備えた半導体製造装置では、縦型ボート10に水平な姿勢で多数のウェハWを搭載した状態で所定の処理を施すようになっているが、高温熱処理の際に、図6に示すように、ウェハW自身の荷重Pによって、ウェハWに熱による撓みが発生するため、ウェハ支持部11において、ウェハWにスリップが発生するという問題があった。
【0007】
本発明は、上記事情を考慮し、高温熱処理時における自重によるウェハの撓みを防止して、スリップの解消を図れるようにした縦型ボートを備えた半導体製造装置を提供することを目的とする。
【0008】
【課題を解決するための手段】
請求項1の発明は、多数の基板を搭載して縦型反応炉内に出し入れされる縦型ボートを備えた半導体製造装置において、前記縦型ボートを、少数の基板を各々略垂直に立てた姿勢で水平方向に並べて保持する子ボートと、複数の前記子ボートを上下方向に多段に保持する親ボートとで構成したことを特徴とする。
【0009】
この発明では、子ボートに基板を垂直に立てた姿勢で搭載し、その子ボートを親ボートに多段に搭載することにより、多数の基板を垂直な姿勢で保持することができる。このように基板を略垂直な姿勢で保持することにより、高温熱処理時における基板の自重の方向が基板の面に沿った方向となり、熱による撓みが生じにくくなって、基板と該基板を支持する部分との間に生じるスリップを解消することができる。
【0010】
【発明の実施の形態】
以下、本発明の実施形態を図面に基づいて説明する。
図1は実施形態の半導体製造装置(例えば縦型CVD装置)の構成を示す概略側面図である。図において、1は縦型反応炉、2はその上端部に設けられたガス吹出口、3はガス吹出口2に処理ガスを送るガス供給路、4は反応炉1内のガスを排出するガス排出路、5はボートキャップ、20は新たな形式の縦型ボートである。
【0011】
この縦型ボート20は、ボートキャップ5上に載せられて、縦型反応炉1の下端開口から反応炉1内に出し入れされる。従来のボートと異なる点は、この縦型ボート20が、親ボート21と複数の子ボート30とから構成されており、子ボート30上に、プロセスウェハ(基板)Waが垂直に立てた姿勢で搭載されるようになっている点である。
【0012】
以下に詳しく説明する。
この縦型ボート20は、高さ方向の中央の主領域22が、プロセスウェハWaを搭載する領域22、その中央の主領域22の上側と下側の小さい領域23、24が、ダミーウェハWbを搭載する領域になっている。
【0013】
親ボート21は、図3に示すように、複数段の棚25を設けることで、中央の主領域22に子ボート30を載置するスペースを確保している。また、主領域22の上側の領域23と下側の領域24にウェハ支持部26を設けることで、それらウェハ支持部26上にダミーウェハWbを水平姿勢で搭載できるようになっている。
【0014】
子ボート30は、親ボート21の各棚25の上に載せられるもので、図4に示すように、複数枚のウェハWaをそれぞれ垂直に立てた姿勢で水平方向に並べて保持できるようになっている。子ボート30の構造は特に限定されるものではないが、図4に示す子ボート30は、側枠31と底枠32と背面枠35とを有する側面視三角形状をなし、底枠32や背面枠35にウェハWaを保持するための一定ピッチの保持溝33を形成した構造となっている。
【0015】
なお、子ボート30と親ボート21は、例えばSiCで製作されており、ガスの通りが良くなるように、支柱や枠のみで開口や窓が十分に確保されている。
【0016】
次に作用を説明する。
この縦型ボート20を使用する場合には、まず、図4に示すように、子ボート30の上に所定枚数のプロセスウェハWaを垂直に立てた姿勢で並べる。次に、所定枚数のプロセスウェハWaを搭載した子ボート30を、図3に示す親ボート21の各棚25の上に搭載する。また、親ボート21の上下の領域23、24にあるウェハ支持部26の上にダミーウェハWbを水平姿勢で搭載する。
【0017】
そして、図1に示すように、ウェハWa、Wbを搭載した縦型ボート20を、反応炉1内に従来と同じように装入して処理を行う。
【0018】
この場合、プロセスウェハWaは、垂直に立てた姿勢で保持されているので、図2に示すように、高温熱処理時におけるプロセスウェハWaの自重Pの方向がウェハWaの板面に沿った方向となり、熱による撓みが生じにくくなり、結果的にウェハWaと該ウェハWaを支持する部分との間に生じるスリップを解消することができる。また、プロセスウェハWaは垂直姿勢で保持するものの、ダミーウェハWbについては、従来と同じ水平姿勢で保持することができる。
【0019】
反応炉1内にて処理した後は、縦型ボート20を反応炉1内から抜き出す。そして、親ボート21の各棚25から子ボート30を順次取り出し、次いで各子ボート30からウェハWaを取り出す。
【0020】
以上のウェハWa、Wbの装填作業や取り出し作業は、手作業で行ってもよいし、自動装置があれば自動装置を用いて行ってもよい。
【0021】
【発明の効果】
以上説明したように、本発明によれば、子ボートに基板を垂直に立てた姿勢で搭載し、その子ボートを親ボートに多段に搭載するようにしたので、多数の基板を垂直な姿勢で保持することができる。従って、高温処理時に基板に自重による撓みが発生しなくなり、従来の基板スリップの問題を解消することができる。また、親ボートに出し入れ可能な子ボートに対して、基板を垂直姿勢で搭載するようにしたので、基板の装填・取り出しが容易に行える。また、親ボートに子ボートを多段に搭載する構造にしていることにより、従来の縦型ボートとの外形的な差違を少なくすることができ、子ボートに対する基板の装填・取り出し、及び、子ボートの親ボートに対する装填・取り出しという工程を除けば、それ以外は、従来とほとんど同じように処理を進めることができ、実現が容易である。
【図面の簡単な説明】
【図1】本発明の実施形態の半導体製造装置の概略構成を示す側面図である。
【図2】同半導体製造装置において、処理するウェハに作用する自重の向きを説明するための図である。
【図3】同半導体製造装置において、多数枚のウェハを保持する縦型ボートの構成要素である親ボートの構成を示す図で、(a)は平面図、(b)は側面図である。
【図4】図3の親ボートに搭載される子ボートの構成を示す図で、(a)は平面図、(b)は側面図、(c)は正面図である。
【図5】従来の半導体製造装置の概略構成を示す側面図である。
【図6】同従来の半導体製造装置において、処理するウェハに作用する自重の向きを説明するための図である。
【符号の説明】
Wa プロセスウェハ(基板)
1 縦型反応炉
20 縦型ボート
21 親ボート
30 子ボート
[0001]
BACKGROUND OF THE INVENTION
The present invention relates to a semiconductor manufacturing apparatus equipped with a vertical reaction furnace such as a vertical diffusion apparatus and a vertical CVD apparatus, and more particularly, to a vertical boat on which a large number of substrates are mounted and taken in and out of the vertical reaction furnace. The present invention relates to a provided semiconductor manufacturing apparatus.
[0002]
[Prior art]
In this type of semiconductor manufacturing equipment, a vertical boat is used as a means for loading and unloading wafers into and from a vertical reactor. Conventionally, a large number of wafers are mounted on a vertical boat in multiple stages in the vertical direction in a horizontal position. Process.
[0003]
FIG. 5 shows an example of a conventional semiconductor manufacturing apparatus.
In the figure, 1 is a vertical reactor, 2 is a gas outlet provided at the upper end of the vertical reactor 1, 3 is a gas supply passage for supplying a processing gas to the gas outlet 2, and 4 is a vertical reactor A gas discharge path 5 provided at the lower portion of 1 is a boat cap that closes the lower end opening of the vertical reactor 1, and 10 is a vertical boat mounted on the cap 5.
[0004]
The wafer (substrate) W is loaded into the reaction furnace 1 while being mounted on the vertical boat 10 in a horizontal posture. The vertical boat 10 is provided with a large number of wafer support portions 11 as shown in FIG. 6 in the vertical direction, and a plurality of peripheral portions of the wafer W are placed on the wafer support portion 11, so that the wafers W is held in a horizontal posture.
[0005]
The wafer W is processed in a high-temperature atmosphere, for example, while a processing gas flows through the gas supply path 3 → the gas outlet → the reaction furnace 1 → the gas discharge path 4.
[0006]
[Problems to be solved by the invention]
As described above, in the semiconductor manufacturing apparatus equipped with the conventional vertical reactor 1, a predetermined process is performed in a state where a large number of wafers W are mounted on the vertical boat 10 in a horizontal posture. During the high temperature heat treatment, as shown in FIG. 6, due to the load P of the wafer W itself, the wafer W is bent due to heat, so that there is a problem that the wafer W is slipped in the wafer support portion 11. .
[0007]
In view of the above circumstances, an object of the present invention is to provide a semiconductor manufacturing apparatus provided with a vertical boat that can prevent a wafer from being bent due to its own weight during a high-temperature heat treatment so that slip can be eliminated.
[0008]
[Means for Solving the Problems]
According to the first aspect of the present invention, in the semiconductor manufacturing apparatus provided with a vertical boat on which a large number of substrates are mounted and taken in and out of the vertical reaction furnace, the small number of substrates are each set up substantially vertically. It is characterized by comprising a child boat that holds the child boats arranged in the horizontal direction in a posture and a parent boat that holds the plurality of child boats in multiple stages in the vertical direction.
[0009]
In the present invention, a large number of substrates can be held in a vertical posture by mounting the substrates on the child boat in an upright posture and mounting the child boats in multiple stages on the parent boat. By holding the substrate in a substantially vertical posture in this way, the direction of the weight of the substrate during the high-temperature heat treatment becomes a direction along the surface of the substrate, and it is difficult for the substrate to be bent due to heat, thereby supporting the substrate and the substrate. It is possible to eliminate the slip generated between the parts.
[0010]
DETAILED DESCRIPTION OF THE INVENTION
Hereinafter, embodiments of the present invention will be described with reference to the drawings.
FIG. 1 is a schematic side view showing a configuration of a semiconductor manufacturing apparatus (for example, a vertical CVD apparatus) according to an embodiment. In the figure, 1 is a vertical reactor, 2 is a gas outlet provided at the upper end of the reactor, 3 is a gas supply passage for sending a processing gas to the gas outlet 2, and 4 is a gas for discharging the gas in the reactor 1 The discharge path, 5 is a boat cap, and 20 is a new type of vertical boat.
[0011]
The vertical boat 20 is placed on the boat cap 5 and is taken in and out of the reaction furnace 1 through the lower end opening of the vertical reaction furnace 1. The difference from the conventional boat is that the vertical boat 20 is composed of a parent boat 21 and a plurality of child boats 30, and a process wafer (substrate) Wa is placed vertically on the child boat 30. It is a point that comes to be installed.
[0012]
This will be described in detail below.
In the vertical boat 20, a central main region 22 in the height direction has a region 22 on which a process wafer Wa is mounted, and small regions 23 and 24 on the upper and lower sides of the central main region 22 have dummy wafers Wb mounted thereon. It is an area to do.
[0013]
As shown in FIG. 3, the parent boat 21 has a plurality of shelves 25 to secure a space for placing the child boat 30 in the central main region 22. Further, by providing the wafer support portions 26 in the upper region 23 and the lower region 24 of the main region 22, the dummy wafer Wb can be mounted on the wafer support portions 26 in a horizontal posture.
[0014]
The child boat 30 is placed on each shelf 25 of the parent boat 21, and as shown in FIG. 4, a plurality of wafers Wa can be held side by side in a vertically standing posture. Yes. Although the structure of the child boat 30 is not particularly limited, the child boat 30 shown in FIG. 4 has a triangular shape in a side view including a side frame 31, a bottom frame 32, and a back frame 35, and the bottom frame 32 and the back surface. A holding groove 33 having a constant pitch for holding the wafer Wa is formed in the frame 35.
[0015]
Note that the child boat 30 and the parent boat 21 are made of, for example, SiC, and an opening and a window are sufficiently secured only by a support column and a frame so that gas can be easily passed.
[0016]
Next, the operation will be described.
When this vertical boat 20 is used, first, as shown in FIG. 4, a predetermined number of process wafers Wa are arranged vertically on the child boat 30. Next, the child boat 30 on which a predetermined number of process wafers Wa are mounted is mounted on each shelf 25 of the parent boat 21 shown in FIG. Further, the dummy wafer Wb is mounted in a horizontal posture on the wafer support portions 26 in the upper and lower regions 23 and 24 of the parent boat 21.
[0017]
Then, as shown in FIG. 1, the vertical boat 20 on which the wafers Wa and Wb are mounted is loaded into the reaction furnace 1 in the same manner as in the prior art and processed.
[0018]
In this case, since the process wafer Wa is held in an upright posture, as shown in FIG. 2, the direction of the weight of the process wafer Wa during the high temperature heat treatment is a direction along the plate surface of the wafer Wa. As a result, bending due to heat is less likely to occur, and as a result, slip generated between the wafer Wa and the portion supporting the wafer Wa can be eliminated. Further, although the process wafer Wa is held in a vertical posture, the dummy wafer Wb can be held in the same horizontal posture as in the past.
[0019]
After the treatment in the reaction furnace 1, the vertical boat 20 is extracted from the reaction furnace 1. Then, the child boats 30 are sequentially taken out from the shelves 25 of the parent boat 21, and then the wafers Wa are taken out from the child boats 30.
[0020]
The above-described loading and unloading operations of the wafers Wa and Wb may be performed manually, or may be performed using an automatic device if there is an automatic device.
[0021]
【The invention's effect】
As described above, according to the present invention, the substrates are mounted in a vertical posture on the child boat, and the child boats are mounted in multiple stages on the parent boat, so a large number of substrates are held in a vertical posture. can do. Therefore, the substrate does not bend due to its own weight during high temperature processing, and the conventional substrate slip problem can be solved. In addition, since the board is mounted in a vertical posture with respect to the child boat that can be taken in and out of the parent boat, the board can be easily loaded and unloaded. In addition, by adopting a structure in which child boats are mounted in multiple stages on the parent boat, it is possible to reduce external differences from conventional vertical boats, loading and unloading substrates to and from the child boats, and child boats. Except for the loading / unloading process for the parent boat, the process can be carried out in almost the same manner as in the prior art and is easy to implement.
[Brief description of the drawings]
FIG. 1 is a side view showing a schematic configuration of a semiconductor manufacturing apparatus according to an embodiment of the present invention.
FIG. 2 is a view for explaining the direction of self-weight acting on a wafer to be processed in the semiconductor manufacturing apparatus.
FIGS. 3A and 3B are diagrams showing a configuration of a parent boat that is a component of a vertical boat that holds a large number of wafers in the semiconductor manufacturing apparatus, where FIG. 3A is a plan view and FIG. 3B is a side view;
4A and 4B are diagrams illustrating a configuration of a child boat mounted on the parent boat of FIG. 3, in which FIG. 4A is a plan view, FIG. 4B is a side view, and FIG.
FIG. 5 is a side view showing a schematic configuration of a conventional semiconductor manufacturing apparatus.
FIG. 6 is a view for explaining the direction of self-weight acting on a wafer to be processed in the conventional semiconductor manufacturing apparatus;
[Explanation of symbols]
Wa process wafer (substrate)
1 Vertical reactor 20 Vertical boat 21 Parent boat 30 Child boat

Claims (6)

複数の基板を搭載して反応炉内に出し入れされるボートを備えた熱処理装置において、前記ボートを、基板を垂直に立てた姿勢で水平方向に並べて保持する子ボートと、前記子ボ−卜を上下方向に複数段保持するとともに基板を水平姿勢で保持する親ボートとで構成したことを特徴とする熱処理装置。In a heat treatment apparatus having a boat on which a plurality of substrates are mounted and taken in and out of a reaction furnace, the boat is held in a horizontal position in a posture in which the substrates are set up vertically, and the child boat rod is A heat treatment apparatus comprising a plurality of stages in the vertical direction and a parent boat that holds a substrate in a horizontal posture . 前記親ボートには前記子ボートを保持する領域より上下領域それぞれに基板を水平姿勢で保持する基板支持部が構成されたことを特徴とする請求項1の熱処理装置。The heat treatment apparatus according to claim 1, wherein the parent boat includes a substrate support portion that holds the substrate in a horizontal posture in each of the upper and lower regions than the region that holds the child boat. 前記子ボートでプロセス基板を保持し、前記親ボートでダミー基板を水平姿勢で保持するよう構成されたことを特徴とする請求項1又は請求項2に記載の熱処理装置。3. The heat treatment apparatus according to claim 1, wherein the process substrate is held by the child boat and the dummy substrate is held in a horizontal posture by the parent boat. 4. 複数の基板を搭載して反応炉内に出し入れされるボートにおいて、基板を垂直に立てた姿勢で水平方向に並べて保持する子ボートと、複数の前記子ボートを上下方向に複数段保持するとともに基板を水平姿勢で保持する親ボートとで構成したことを特徴とするボート。 And have your boat is out of the plurality of substrates into the mounting to the reactor, and the holding child boat side by side in a horizontal direction in a posture in which the substrate placed vertically perpendicular to a plurality of stages holds a plurality of child boat vertically And a parent boat that holds the substrate in a horizontal posture. 複数の基板を垂直に立てた姿勢で水平方向に並べて子ボートにより保持する工程と、複数の基板を保持した前記子ボートを親ボートにより上下方向に複数段保持する工程と、基板を水平姿勢で前記親ボートにより保持する工程と、前記子ボートと前記親ボートとで構成されるボートにより保持した複数の基板を反応炉内に装入する工程と、前記反応炉内に装入した複数の基板を垂直に立てた姿勢で前記子ボートにより保持するとともに基板を水平姿勢で前記親ボートにより保持しつつ熱処理する工程と、前記ボートにより保持した処理後の複数の基板を反応炉から抜き出す工程と、を有することを特徴とする熱処理方法。A step of arranging a plurality of substrates vertically in a horizontal position and holding them by a child boat, a step of holding the child boats holding a plurality of substrates in a plurality of stages in a vertical direction by a parent boat, and a substrate in a horizontal posture A step of holding by the parent boat, a step of charging a plurality of substrates held by a boat constituted by the child boat and the parent boat into a reaction furnace, and a plurality of substrates charged in the reaction furnace Holding the substrate in a vertically upright position and heat-treating the substrate in a horizontal posture while holding the substrate in a horizontal posture, and extracting a plurality of processed substrates held by the boat from the reaction furnace, The heat processing method characterized by having. 複数の基板を垂直に立てた姿勢で水平方向に並べて子ボートにより保持する工程と、複数の基板を保持した前記子ボートを前記親ボートにより上下方向に複数段保持する工程と、基板を水平姿勢で前記親ボートにより保持する工程と、前記子ボートと前記親ボートとで構成されるボートにより保持した複数の基板を反応炉内に装入する工程と、前記反応炉内に装入した複数の基板を垂直に立てた姿勢で前記子ボートにより保持するとともに基板を水平姿勢で前記親ボートにより保持しつつ熱処理する工程と、前記ボートにより保持した処理後の複数の基板を反応炉から抜き出す工程と、を有することを特徴とする半導体の製造方法。A step of arranging a plurality of substrates vertically in a horizontal direction and holding them by a child boat, a step of holding the child boats holding a plurality of substrates by a plurality of stages in the vertical direction by the parent boat, and a substrate in a horizontal posture A step of holding by the parent boat, a step of charging a plurality of substrates held by the boat constituted by the child boat and the parent boat into a reaction furnace, and a plurality of charges charged in the reaction furnace A step of heat-treating the substrate while holding the substrate in a vertical position while holding the substrate by the parent boat in a horizontal posture; and a step of extracting a plurality of processed substrates held by the boat from the reaction furnace; A method for manufacturing a semiconductor, comprising:
JP2000174675A 2000-06-12 2000-06-12 Heat treatment apparatus, boat, heat treatment method, and semiconductor manufacturing method Expired - Lifetime JP4282208B2 (en)

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