JP4262413B2 - Lighting device for inspection - Google Patents

Lighting device for inspection Download PDF

Info

Publication number
JP4262413B2
JP4262413B2 JP2001019723A JP2001019723A JP4262413B2 JP 4262413 B2 JP4262413 B2 JP 4262413B2 JP 2001019723 A JP2001019723 A JP 2001019723A JP 2001019723 A JP2001019723 A JP 2001019723A JP 4262413 B2 JP4262413 B2 JP 4262413B2
Authority
JP
Japan
Prior art keywords
optical fiber
unit
inspection
optical
condensing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2001019723A
Other languages
Japanese (ja)
Other versions
JP2002221491A (en
Inventor
昇 長谷川
学 國永
英夫 香取
敏一 猪股
喜恵子 蓼沼
菊喜 星
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sumita Optical Glass Manufacturing Co Ltd
Nippon Steel Corp
Original Assignee
Sumita Optical Glass Manufacturing Co Ltd
Nippon Steel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sumita Optical Glass Manufacturing Co Ltd, Nippon Steel Corp filed Critical Sumita Optical Glass Manufacturing Co Ltd
Priority to JP2001019723A priority Critical patent/JP4262413B2/en
Publication of JP2002221491A publication Critical patent/JP2002221491A/en
Application granted granted Critical
Publication of JP4262413B2 publication Critical patent/JP4262413B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Images

Description

【0001】
【発明の属する技術分野】
この発明は疵検査用照明装置、特に帯状または板状の被検査材の表面を照明して疵を光学的に検査する疵検査用照明装置に関する。
【0002】
【従来の技術】
帯状または板材の疵検査装置の一つとして、光学式疵検査装置がある。光学式疵検査装置は、被検査材の表面に線状の照明パターンを形成する照明装置を備えている。例えば、鋼板を長手方向に送りながら鋼板表面に線状の照明パターンを形成して、検査作業者が鋼板表面を直接目視して、またはモニタ画面上で疵を検査する。
【0003】
従来、蛍光灯を代表とする照明装置の棒状光源は、光量、集光性においてきわめて不十分であった。その上、被検査材との距離が取れないばかりか、温度変化に弱く、指向性がなく、長尺(例えば2m)の棒状光源を構成することは困難であり、高速ラインへの適用や、撮像分解能を上げることができなかった。このような問題を解決する照明装置として、光ファイバ照明が期待され、様々な光ファイバ照明装置が開発されている。
【0004】
光ファイバ照明装置は、光源と、多数の光ファイバ整列するシート状の光ファイバ束と、帯状または板状の被検査材の表面に線状の照射パターンを形成する集光レンズとからなっている。従来の光ファイバ照明装置は、市販の光ファイバ束と集光レンズ(円柱レンズ)とを組み合わせたものであるが、次のような問題があった。
【0005】
被検査材の幅に合わせて幅方向(光ファイバ光軸に垂直方向)に長く整列する光ファイバ束を必要とするため、幅500mm程度の光ファイバ束24の数個を幅方向に接合していた。光ファイバ束では光ファイバが複数段積み重ねられているが、図6および図7に示すように光ファイバユニット21保持する上板55および下板56が撓むため100μm程度のオーダーで光ファイバ束22の中央部が凹んだり、膨れ上がったりする。これら凹みや膨れのために、照明光の光線が不揃いとなる。集光レンズ40と被検査材との距離は数m程度になると、図8に示すように被検査材では数mm程度のオーダーで不揃いとなる。この結果、被検査材表面での照度が不均一となり、疵検出能が低下していた。
【0006】
なお、棒状光源を用いた照明装置として、例えば特開2000−65755号公報で開示された表面検査装置がある。光ファイバ束と集光レンズとを備えた照明装置として、例えば特開2000−149607号公報で開示された照明装置がある。
【0007】
【発明が解決しようとする課題】
この発明の課題は、照明光の光線が不揃いとなることなく被検査材表面を照射し、高い疵検出能により疵を検出することができる疵検査用照明装置を提供することである。
【0008】
【課題を解決するための手段】
本発明の疵検査用照明装置は、帯状または板状の被検査材の表面に線状の照射パターンを形成する疵検査用照明装置において、多数の光ファイバが光ファイバの光軸に対して垂直方向に整列する複数の光ファイバ束からなり、光ファイバ束が前記整列方向に沿って並ぶように接合された光ファイバユニットと、円柱レンズからなる複数の集光レンズが前記光ファイバの整列方向に沿って並ぶように接合された集光ユニットとを備えている。
【0009】
また、本発明において、前記光ファイバユニットの撓みに合わせて前記集光ユニットを撓ませるようにしてもよい。集光レンズの撓みを調整することにより、光ファイバ束からの不揃いの光線を平行に整列することができる。
【0010】
【発明の実施の形態】
図1、図2および図3は、本発明の照明装置を模式的に示している。照明装置は、主として光源、ライトガイド部、および集光部からなっている。
【0011】
光源10は、高輝度点光源12と凹面鏡14とを備えている。高輝度点光源12として例えばメタルハライドランプ、ハロゲンランプ、キセノンランプなどが用いられる。凹面鏡14として楕円面鏡、または放物面鏡が適している。
【0012】
ライトガイド部20は、光源10から光ファイバユニット21まで延びる光ファイバケーブル29を備えている。光ファイバケーブル29は、多数の光ファイバ26が束ねられ、プラスチックシースで被覆されている。光ファイバユニット21の内部において、光ファイバ26は光ファイバケーブル29の先端部から分岐整列して光ファイバ束22(図3に示す)を構成する。光ファイバ束22は多数の光ファイバ26を光軸に対し垂直方向(横方向)に整列し、複数段積み重ねられて構成されている。横方向に隣り合う光ファイバ束22どうしは、側端部が被検査材1の幅に合わせて接着剤でつなぎ合わされ、横方向に延びる帯状となっている。光ファイバユニット21は、上板31と下板32との間に挟まれて光ファイバ保持フレーム30に保持されている。
【0013】
集光部40は、複数の集光レンズ42からなる集光ユニット41を備えている。集光レンズ42として円柱レンズが用いられる。横方向に隣り合う集光レンズ42どうしは、側端部が光ファイバ束22と同様に接着剤でつなぎ合わされて横方向に細長となっている。集光レンズ42の接合部43は、光ファイバ束22の接合部23に対し横方向にずれるように位置している。このずれは、各光ファイバの中間部にレンズの接合部が位置するようにする。したがって、光ファイバ束22の接合部23と集光レンズ42の接合部43との重なりによる照度低下は生じない。
【0014】
上記のように構成された装置において、高輝度点光源12からの照明光は凹面鏡14で光ファイバケーブル29の入射端に集光される。照明光は、光ファイバケーブル29を介して光ファイバユニット21に導かれる。光ファイバユニット21を通って出射した照明光は、集光レンズ42で集光されて被検査体表面1に線状の照明パターン5を形成する。被検査体1はこれの長手方向Sに移動しており、疵Fはリニアアレイカメラ60で撮像される。疵Fはモニタ(図示しない)の画面で目視により、または映像信号を画像処理して検出される。光ファイバ束22の接合部23と集光レンズ42の接合部43との重なりによる照度低下は生じない。このために、被検査材表面を均一に照射し、高い疵検出能により疵を検出することができる
【0015】
図4は、本発明の照明装置の実施の形態を示している。図4(a)に示すように、集光ユニット49はレンズ保持フレーム50に保持されている。レンズ保持フレーム50に取り付けられたナット51に調節ねじ52がはめ合っている。調節ねじ52の先端部は集光レンズ49に押し当てられており、調節ねじ52により集光レンズ49の撓みを光ファイバ束の撓みに合わせる。集光レンズの撓みを調整することにより、光ファイバ束からの不揃いの光線を平行に整列することができる。図4(b)は被検査材表面上の照明パターンを示しており、集光レンズ49の撓みを調節することにより湾曲した光線軌跡8を規範直線7に修正することができる。
【0016】
【発明の効果】
本発明の疵検査用照明装置では、集光ユニットはレンズ保持フレームに保持されており、調節ねじにより集光レンズの撓みを光ファイバ束の撓みに合わせることができる。このように集光レンズの撓みを調整することにより、光ファイバ束からの不揃いの光線を平行に整列することができ、湾曲した光線軌跡を規範直線に修正することができる。その結果、照明光の光線が不揃いとなることなく被検査材表面が照射され、高い疵検出能により疵を検出することができる。
【図面の簡単な説明】
【図1】 本発明の実施の形態である疵検査用照明装置を模式的に示す斜視図である。
【図2】 図1に示す照明装置の光学系を模式的に示す側面図である。
【図3】 図3(a)は図1に示す装置の正面図であり、(b)は平面図である。
【図4】 本発明の照明装置の実施の形態を示しており、(a)は正面図であり、(b)は照明パターンの模式図である。
【図5】 光ファイバ束の側端部における光ファイバの不揃いを模式的に示す平面図である。
【図6】 従来の疵検査用照明装置の1例を模式的に示す正面図である。
【図7】 図6に示す光ファイバ束の拡大図である。
【図8】 照明の光線の不揃いを説明する図面である。
【符号の説明】
1 被検査材
5 照明パターン
7 規範直線
8 光線軌跡
10 光源
12 高輝度点光源
14 凹面鏡
20 ライトガイド部
21 光ファイバユニット
22 光ファイバ束
23 接合部
26 光ファイバ
30 光ファイバ保持フレーム
31 上板
32 下板
40 集光部
41 集光ユニット
42 集光レンズ
43 接合部
49 集光レンズ
50 集光レンズ保持フレーム
51 ナット
52 調節ねじ
56 上板
F 疵
[0001]
BACKGROUND OF THE INVENTION
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a wrinkle inspection illumination device, and more particularly to a wrinkle inspection illumination device that optically inspects wrinkles by illuminating the surface of a strip-shaped or plate-shaped inspection object.
[0002]
[Prior art]
As one of the band-shaped or plate-shaped wrinkle inspection apparatuses, there is an optical wrinkle inspection apparatus. The optical wrinkle inspection device includes an illumination device that forms a linear illumination pattern on the surface of a material to be inspected. For example, a linear illumination pattern is formed on the surface of the steel sheet while feeding the steel sheet in the longitudinal direction, and the inspection operator directly looks at the surface of the steel sheet or inspects the wrinkles on the monitor screen.
[0003]
Conventionally, a rod-shaped light source of an illuminating device typified by a fluorescent lamp has been extremely insufficient in light quantity and light collecting property. In addition, the distance to the material to be inspected cannot be taken, the temperature change is weak, there is no directivity, and it is difficult to construct a long (for example, 2 m) rod-shaped light source. The imaging resolution could not be increased. Optical fiber illumination is expected as an illumination device that solves such problems, and various optical fiber illumination devices have been developed.
[0004]
The optical fiber illuminating device includes a light source, a sheet-shaped optical fiber bundle in which a large number of optical fibers are aligned, and a condensing lens that forms a linear irradiation pattern on the surface of a strip-shaped or plate-shaped inspection material. . The conventional optical fiber lighting device is a combination of a commercially available optical fiber bundle and a condensing lens (cylindrical lens), but has the following problems.
[0005]
In order to require an optical fiber bundle that is aligned long in the width direction (perpendicular to the optical axis of the optical fiber) according to the width of the material to be inspected, several optical fiber bundles 24 having a width of about 500 mm are joined in the width direction. It was. In the optical fiber bundle, the optical fibers are stacked in a plurality of stages. However, as shown in FIGS. The center of the dent is recessed or swollen. Due to these dents and bulges, the illumination light rays are uneven. When the distance between the condensing lens 40 and the material to be inspected is about several meters, the materials to be inspected are uneven on the order of several mm as shown in FIG. As a result, the illuminance on the surface of the material to be inspected became non-uniform and the wrinkle detection ability was reduced.
[0006]
As an illumination device using a rod-shaped light source, for example, there is a surface inspection device disclosed in Japanese Patent Application Laid-Open No. 2000-65555. As an illuminating device including an optical fiber bundle and a condensing lens, for example, there is an illuminating device disclosed in Japanese Unexamined Patent Publication No. 2000-149607.
[0007]
[Problems to be solved by the invention]
The subject of this invention is providing the illuminating device for a wrinkle inspection which can irradiate the surface of a to-be-inspected material, and can detect wrinkles with high wrinkle detection ability, without the rays of illumination light becoming uneven.
[0008]
[Means for Solving the Problems]
The illuminating device for wrinkle inspection of the present invention is a illuminating device for wrinkle inspection in which a linear irradiation pattern is formed on the surface of a strip-shaped or plate-shaped material to be inspected. A plurality of optical fiber bundles aligned in a direction, an optical fiber unit joined so that the optical fiber bundles are aligned along the alignment direction, and a plurality of condensing lenses including cylindrical lenses in the alignment direction of the optical fibers. And a light collecting unit joined so as to line up.
[0009]
Moreover, in this invention, you may make it bend the said condensing unit according to the bending of the said optical fiber unit. By adjusting the deflection of the condenser lens, irregular light rays from the optical fiber bundle can be aligned in parallel.
[0010]
DETAILED DESCRIPTION OF THE INVENTION
1, 2 and 3 schematically show the illumination device of the present invention. The illuminating device mainly includes a light source, a light guide part, and a light collecting part.
[0011]
The light source 10 includes a high brightness point light source 12 and a concave mirror 14. As the high brightness point light source 12, for example, a metal halide lamp, a halogen lamp, a xenon lamp or the like is used. An elliptical mirror or a parabolic mirror is suitable as the concave mirror 14.
[0012]
The light guide unit 20 includes an optical fiber cable 29 extending from the light source 10 to the optical fiber unit 21. In the optical fiber cable 29, a large number of optical fibers 26 are bundled and covered with a plastic sheath. Inside the optical fiber unit 21, the optical fiber 26 is branched and aligned from the tip of the optical fiber cable 29 to form an optical fiber bundle 22 (shown in FIG. 3). The optical fiber bundle 22 is configured by aligning a number of optical fibers 26 in a direction perpendicular to the optical axis (lateral direction) and stacking a plurality of stages. The optical fiber bundles 22 adjacent to each other in the lateral direction are band-shaped with side ends joined together with an adhesive in accordance with the width of the material to be inspected 1 and extending in the lateral direction. The optical fiber unit 21 is held between the upper plate 31 and the lower plate 32 and held by the optical fiber holding frame 30.
[0013]
The light collecting unit 40 includes a light collecting unit 41 including a plurality of light collecting lenses 42. A cylindrical lens is used as the condenser lens 42. The condensing lenses 42 adjacent in the horizontal direction are elongated in the horizontal direction by connecting side ends with an adhesive in the same manner as the optical fiber bundle 22. The joint 43 of the condenser lens 42 is positioned so as to be displaced laterally with respect to the joint 23 of the optical fiber bundle 22. This shift is such that the lens joint is located in the middle of each optical fiber. Accordingly, there is no reduction in illuminance due to the overlap between the joint 23 of the optical fiber bundle 22 and the joint 43 of the condenser lens 42.
[0014]
In the apparatus configured as described above, the illumination light from the high-intensity point light source 12 is condensed at the incident end of the optical fiber cable 29 by the concave mirror 14. The illumination light is guided to the optical fiber unit 21 via the optical fiber cable 29. The illumination light emitted through the optical fiber unit 21 is condensed by the condenser lens 42 to form a linear illumination pattern 5 on the surface 1 to be inspected. The inspection object 1 moves in the longitudinal direction S thereof, and the eyelid F is imaged by the linear array camera 60.疵 F is detected by visual observation on a monitor (not shown) or by image processing of a video signal. There is no reduction in illuminance due to the overlap between the joint 23 of the optical fiber bundle 22 and the joint 43 of the condenser lens 42. For this reason, it is possible to uniformly irradiate the surface of the material to be inspected and detect wrinkles with high wrinkle detection ability.
FIG. 4 shows an embodiment of the illumination device of the present invention. As shown in FIG. 4A, the light collecting unit 49 is held by the lens holding frame 50. An adjusting screw 52 is fitted to a nut 51 attached to the lens holding frame 50. The tip of the adjustment screw 52 is pressed against the condensing lens 49, and the adjustment screw 52 adjusts the bending of the condensing lens 49 to the bending of the optical fiber bundle. By adjusting the deflection of the condenser lens, irregular light rays from the optical fiber bundle can be aligned in parallel. FIG. 4B shows an illumination pattern on the surface of the material to be inspected, and the curved ray locus 8 can be corrected to the reference straight line 7 by adjusting the deflection of the condenser lens 49.
[0016]
【The invention's effect】
In the lighting device for eyelid inspection according to the present invention, the condensing unit is held by the lens holding frame, and the bending of the condensing lens can be matched with the bending of the optical fiber bundle by the adjusting screw. By adjusting the deflection of the condensing lens in this way, irregular light rays from the optical fiber bundle can be aligned in parallel, and the curved light ray trajectory can be corrected to a reference straight line. As a result, the surface of the material to be inspected is irradiated without unevenness of the illumination light beam, and soot can be detected with high soot detection ability.
[Brief description of the drawings]
FIG. 1 is a perspective view schematically showing a wrinkle inspection illumination device according to an embodiment of the present invention.
2 is a side view schematically showing an optical system of the illumination device shown in FIG. 1. FIG.
3A is a front view of the apparatus shown in FIG. 1, and FIG. 3B is a plan view.
FIGS. 4A and 4B show an embodiment of a lighting device of the present invention, where FIG. 4A is a front view, and FIG. 4B is a schematic diagram of an illumination pattern.
FIG. 5 is a plan view schematically showing optical fiber irregularities at the side ends of the optical fiber bundle.
FIG. 6 is a front view schematically showing an example of a conventional wrinkle inspection illumination device.
7 is an enlarged view of the optical fiber bundle shown in FIG. 6. FIG.
FIG. 8 is a diagram for explaining unevenness of illumination light rays;
[Explanation of symbols]
DESCRIPTION OF SYMBOLS 1 Test material 5 Illumination pattern 7 Reference line 8 Ray trace 10 Light source 12 High-intensity point light source 14 Concave mirror 20 Light guide part 21 Optical fiber unit 22 Optical fiber bundle 23 Joint part 26 Optical fiber 30 Optical fiber holding frame 31 Upper plate 32 Below Plate 40 Condensing part 41 Condensing unit 42 Condensing lens 43 Joint part 49 Condensing lens 50 Condensing lens holding frame 51 Nut 52 Adjustment screw 56 Upper plate F 疵

Claims (1)

帯状または板状の被検査材の表面に線状の照射パターンを形成する疵検査用照明装置において、
多数の光ファイバが光ファイバの光軸に対して垂直方向にかつ被検査材の幅方向に整列する複数の光ファイバ束からなり、光ファイバ束が前記整列方向に沿って並ぶように接合された光ファイバユニットと、
円柱レンズからなる複数の集光レンズが前記光ファイバの整列方向に沿って並ぶように接合された集光ユニットとを備え、
前記集光ユニットが前記光ファイバユニットの出射側に配置され、
前記光ファイバユニットの、光軸に対して垂直方向かつ光ファイバユニットの整列方向に対して垂直方向の撓みに合わせて前記集光ユニットを、前記光ファイバ束からの光線を平行に整列する様に撓わませていることを特徴とする疵検査用照明装置。
In the illumination device for wrinkle inspection that forms a linear irradiation pattern on the surface of a strip-shaped or plate-shaped inspection material,
A plurality of optical fibers are composed of a plurality of optical fiber bundles aligned in the direction perpendicular to the optical axis of the optical fiber and in the width direction of the material to be inspected, and the optical fiber bundles are joined so as to be aligned along the alignment direction. An optical fiber unit;
A plurality of condensing lenses composed of cylindrical lenses, and a condensing unit joined so as to be aligned along the alignment direction of the optical fiber,
The condensing unit is disposed on the exit side of the optical fiber unit;
Of the optical fiber unit, in accordance with the deflection of the direction perpendicular to the alignment direction of the vertically and the optical fiber unit to the optical axis, the light collecting unit, as to parallel alignment of the light beam from the optical fiber bundle A wrinkle inspection illumination device characterized by being bent.
JP2001019723A 2001-01-29 2001-01-29 Lighting device for inspection Expired - Fee Related JP4262413B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2001019723A JP4262413B2 (en) 2001-01-29 2001-01-29 Lighting device for inspection

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2001019723A JP4262413B2 (en) 2001-01-29 2001-01-29 Lighting device for inspection

Publications (2)

Publication Number Publication Date
JP2002221491A JP2002221491A (en) 2002-08-09
JP4262413B2 true JP4262413B2 (en) 2009-05-13

Family

ID=18885555

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2001019723A Expired - Fee Related JP4262413B2 (en) 2001-01-29 2001-01-29 Lighting device for inspection

Country Status (1)

Country Link
JP (1) JP4262413B2 (en)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1833163B (en) 2003-08-06 2010-07-07 Ccs株式会社 Linear light irradiation device
JP2007078385A (en) * 2005-09-12 2007-03-29 Nippon Steel Corp Lighting system for flaw inspection
JP2012189337A (en) * 2011-03-08 2012-10-04 Hipep Laboratories Fluorescence detection apparatus
JP5950004B2 (en) * 2015-07-21 2016-07-13 株式会社アイテックシステム Lighting device in an apparatus for inspecting the surface of a long object using a line sensor camera

Also Published As

Publication number Publication date
JP2002221491A (en) 2002-08-09

Similar Documents

Publication Publication Date Title
JP4511978B2 (en) Surface flaw inspection device
JP5006584B2 (en) Irradiation apparatus and irradiation system having the same
JPH05142159A (en) Optical inspecting device
JP4081414B2 (en) Strip shape inspection method and apparatus
JP2010112786A (en) Illumination apparatus and appearance inspection apparatus having the same
KR101466258B1 (en) Imaging apparatus
JP2010071721A (en) Device and method for detecting irregularity flaw of steel plate
JP2011209112A (en) Appearance inspection method of to-be-inspected object and appearance inspection apparatus of the same
JP3863221B2 (en) Bending rate measurement method of bent plate glass
JP4262413B2 (en) Lighting device for inspection
JP2007333563A (en) Inspection device and inspection method for light transmitting sheet
JPH02110356A (en) Defect detecting apparatus using linear light source
JP2015068670A (en) Device and method for inspecting defect of sheet-like matter
JPH07234187A (en) Method and device for detecting surface detect of glass substrate
JP2002214144A (en) Lighting system for flaw inspection
JP6845562B2 (en) Lighting system
JP7392470B2 (en) Lighting for inspecting defects in sheet-like objects and defect inspection device for sheet-like objects
JP3322606B2 (en) Plate width and meandering detection method and device
JP4105256B2 (en) Light irradiation device and surface inspection device
JP2011134687A (en) Lighting system
JP2002214146A (en) Lighting system for flaw inspection
JP5938981B2 (en) Projection system
KR20160110156A (en) Ultraviolet light flaw detection light unit, and ultraviolet light flaw detection apparatus
JP2002340738A (en) Optical member inspecting apparatus
JP2011203443A (en) Light source device

Legal Events

Date Code Title Description
A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20051024

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20080424

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20080513

A521 Written amendment

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20080708

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20081104

A521 Written amendment

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20081224

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20090203

A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20090209

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20120220

Year of fee payment: 3

R150 Certificate of patent or registration of utility model

Ref document number: 4262413

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150

Free format text: JAPANESE INTERMEDIATE CODE: R150

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20130220

Year of fee payment: 4

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20130220

Year of fee payment: 4

S531 Written request for registration of change of domicile

Free format text: JAPANESE INTERMEDIATE CODE: R313531

R350 Written notification of registration of transfer

Free format text: JAPANESE INTERMEDIATE CODE: R350

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20130220

Year of fee payment: 4

S533 Written request for registration of change of name

Free format text: JAPANESE INTERMEDIATE CODE: R313533

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20130220

Year of fee payment: 4

R350 Written notification of registration of transfer

Free format text: JAPANESE INTERMEDIATE CODE: R350

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20140220

Year of fee payment: 5

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

S533 Written request for registration of change of name

Free format text: JAPANESE INTERMEDIATE CODE: R313533

R350 Written notification of registration of transfer

Free format text: JAPANESE INTERMEDIATE CODE: R350

LAPS Cancellation because of no payment of annual fees