JP4237070B2 - Multi-angle reflected light measuring device - Google Patents

Description

  The present invention relates to a multi-angle reflected light measurement apparatus, and more particularly to a multi-angle reflected light measurement apparatus that efficiently measures multi-angle reflected light from a measurement target.

  Methods for quantifying the surface state of the measurement target include, for example, a method of measuring physical surface roughness, a method of using an optical technique, and the like, particularly when using an optical measurement, This is useful because the measurement can be completed in a shorter time without touching the measurement object.

  As a method of quantifying the surface state of the measurement target using such an optical technique, there is a method of measuring the reflectance of light by irradiating the measurement target with light. For example, the surface condition of the skin has a large visual individual difference. To quantify this, there is a method of measuring the reflectance by irradiating the skin surface with light. A method for quantifying the surface condition of the skin is proposed. (For example, refer to Patent Document 1).

There has also been proposed a method for quantifying the state of coating of a measurement target by measuring the reflectance of the surface of the measurement target. (For example, refer to Patent Document 2).
Japanese Unexamined Patent Publication No. 7-75629 JP-A-6-201471

  However, for example, when measuring the surface condition of the skin, the reflectance may vary depending on the angle of the reflected light, and there may be variations in characteristics at a specific angle. It was difficult to quantify accurately.

  Further, Patent Document 2 discloses an apparatus for measuring the reflectance of reflected light of a measurement object having a plurality of angles, but the interval between the angles of the reflected light that can be measured is coarse, and the reflection angle of the measured reflection angle is also disclosed. It is difficult to reduce the interval, and it is difficult to quantify the surface state of the measurement target when the characteristics are different due to, for example, a fine difference in reflection angle such as the surface state of the skin.

  Accordingly, an object of the present invention is to provide a new and useful multi-angle reflected light measuring apparatus that solves the above-described problems.

  A specific problem of the present invention is to provide a multi-angle reflected light measuring apparatus that enables quantification of a surface state of a measurement target by measuring fine multi-angle reflected light of the measurement target.

In the present invention, the above-described problems are solved by a light source that irradiates light to a measurement target, a measurement unit that performs measurement processing of incident light reflected by the measurement target, and the reflected light is applied to the measurement unit. A multi-angle reflected light measuring device having a reflecting portion that changes the optical path of the light source, wherein a plurality of the reflecting portions are arranged in an arch shape on the measurement target, and the shape of the reflecting portion is set to the first end side. The rectangular first reflecting portion formed on the second end portion and the trapezoidal second reflecting portion formed on the second end side are combined with each other, and with respect to the first end portion The second end portion is shaped to be small, and the two adjacent reflection portions are installed such that the installation direction from the first end portion to the second end portion is reversed, and the plurality Of the reflected light in a plurality of directions reflected by the measurement object to the measuring means. Only in the multi-angle reflected light measuring apparatus characterized by being configured to reflect a time, resolve.

According to the present invention, it is possible to measure fine multi-angle reflected light of a measurement target, and therefore, it is possible to quantify the surface state of the measurement target. Moreover, it becomes possible to measure fine multi-angle reflected light.

  In addition, when a plurality of the reflection parts are formed so as to cover the measurement point of the measurement object that is irradiated with the light, the reflection part reflects the multi-angle of the measurement point of the measurement object. It is possible to reflect light, which is preferable.

Further, it is preferable that a plurality of the reflection parts are installed on a circle centered on the measurement point, so that the distance from the measurement point to be measured to the reflection part can be made substantially the same.

  In addition, when the pitch of the installation angles of the two adjacent reflection parts with the measurement point as the center is 10 ° or less, it becomes possible to measure the fine multi-angle reflected light to be measured, which is preferable. It is.

  A light polarizing filter that polarizes the light; and a light polarizing filter that moves the light polarizing filter in a state where the light gland passes through the light polarizing filter or in a state where the light does not pass through the light polarizing filter. If the movable means is further provided, the light irradiated onto the measurement object can be either polarized light or unpolarized light, which is preferable.

Further, the reflected light polarization filter that polarizes the reflected light, and the reflected light passes through the reflected light polarization filter between the measurement object and the reflection unit, or the reflected light is the reflected light polarized light. Further providing a reflected light polarization filter moving means for moving the reflected light polarization filter without passing through the filter, the reflected light can be either polarized light or unpolarized light. is there.
In addition, the above-described problems include a light source that irradiates a measurement target with light, a measurement unit that performs measurement processing of incident light reflected by the measurement target, and an optical path conversion of the reflected light toward the measurement unit. A multi-angle reflected light measuring device having a plurality of reflecting portions arranged in an arch shape on the measurement target, and a surface formed by reflected light from the measurement target to the reflecting portion. On the other hand, the problem can be solved by a multi-angle reflected light measuring device characterized in that the measuring means is arranged in a vertical direction.

  According to the multi-angle reflected light measuring apparatus according to the present invention, it is possible to measure the fine multi-angle reflected light of the measurement target, and therefore it is possible to quantify the surface state of the measurement target.

  Next, embodiments of the present invention will be described below with reference to the drawings.

  1 is a perspective view schematically showing a multi-angle reflected light measuring apparatus according to a first embodiment of the present invention, and FIG. 2 is a side view of the multi-angle reflected light measuring apparatus viewed from the direction A in FIG. The figure is shown schematically. In FIG. 2, a part of the configuration illustrated in FIG. 1 is omitted for easy understanding of the drawing.

  1 and 2, the outline of the multi-angle reflected light measurement apparatus 10 is as follows. The light source 11 irradiates the measurement point S0 with the light L1 and the reflection of the light L1 by the measurement target S. The reflected light L2 is reflected and the optical path direction of the reflected light L2 is changed to be reflected light L3, and the plurality of reflecting portions 14 and the reflected light L3 are incident, and the intensity of the reflected light, that is, the reflectance is measured. The measuring means 12 is composed of a CCD camera, for example.

  The reflection unit 14 is made of, for example, a mirror, and is attached to and held by a holding unit 13 that holds the reflection unit 14. In this embodiment, a plurality of the reflection portions 14 are arranged in an arch shape on the measurement target, and the plurality of reflection portions 14 reflect the reflected light L2 in a plurality of directions reflected by the measurement target S, as described above. It is configured to reflect at a time toward the measuring means 12. Therefore, it is possible to reflect the reflected light L2 having a fine multi-angle, which is a measurement object, at a time to be reflected light L3 and to be incident on the measuring unit 12. Therefore, it is possible to quickly measure the intensity or reflectivity of the reflected light from the minute multi-angle of the measurement object, and it is possible to quickly perform detailed quantification of the surface state of the measurement object over the fine multi-angle. It becomes.

  Further, when a plurality of the reflection parts 14 are formed so as to cover the measurement point S0 of the measurement object S to which the light L1 is irradiated, the reflection unit 14 reflects fine multi-angle reflected light from the measurement point S0. It becomes possible to do.

In this case, as an example of the installation method of the reflection part 14, as shown in FIG. 1, when a plurality of the reflection parts 14 are installed on a circle centering on the measurement point S 0, from the measurement point S 0 to the reflection part 14. Are substantially the same, which is preferable. Further, when the reflecting portion 14 is provided so that the circle substantially intersects the normal line of the measurement point S0, the structure for installing the reflecting portion 14 becomes simple. That is, it is easy to set the angle at which the reflection unit 14 is installed and to calculate the installation angle, which makes it easy to quantify the surface state from the reflectance. Further, details of the shape of the reflection portion 14 and details of installation will be described later with reference to FIGS. 3 (A) and 3 (B).

  Further, as shown below, the multi-angle reflected light measuring apparatus 10 is provided with a polarizing filter and movable means for operating the polarizing filter, and the polarized light is polarized with respect to the light L1 or the reflected light L2. It has a structure that can be in either a state where the filter is transmitted or a state where the filter is not transmitted.

  The light L1 emitted from the light source 11 to the measuring object S is non-polarized light, and the light L1 is two plane waves perpendicular to each other, a vertically polarized plane wave (hereinafter referred to as S-polarized light) and a horizontally polarized plane wave ( Hereinafter referred to as P-polarized light).

  First, a polarizing filter 15 and a polarizing filter 16 are provided as filters for polarizing the light L1. The polarizing filter 15 is a filter that removes P-polarized light and transmits only S-polarized light, and the filter 16 is a filter that removes S-polarized light and transmits only P-polarized light.

  The polarizing filter 15 is moved by a moving means 15A, and the light L1 irradiated to the measuring means S is transmitted through the polarizing filter 15 between the light source 11 and the measuring object S, or the It becomes possible for the light L1 not to transmit through the polarizing filter 15, that is, the light L1 to be either S-polarized light or light having no polarization property.

  Similarly, the polarization filter 16 is moved by the movable means 16A, and the light L1 irradiated to the measurement means S is transmitted through the polarization filter 16 between the light source 11 and the measurement object S. Alternatively, the light L1 is not transmitted through the polarizing filter 16, that is, the light L1 can be either P-polarized light or non-polarized light.

  Further, a polarizing filter 17 and a polarizing filter 18 are provided as filters for polarizing the reflected light L2. The polarizing filter 17 is a filter that transmits only S-polarized light as in the polarizing filter 15, and the filter 18 is a filter that transmits only P-polarized light as in the filter 16.

  The polarizing filter 17 is moved by a movable means 17A, and the reflected light L2 reaching the reflecting portion 14 between the measuring object S and the reflecting portion 14 is S-polarized light or light having no polarization property. It becomes possible to be either.

  Similarly, the polarization filter 18 is moved by a movable means 18A, and the reflected light L2 reaching the reflection unit 14 between the measurement object S and the reflection unit 14 is converted into P-polarized light or polarized light. It becomes possible to use either of the light which does not have.

  Thus, by using the polarizing filter, as described below, the surface state of the measurement target can be quantified in more detail.

  The reflected light L2 reflected by the measurement object S includes both reflected light by specular reflection that reflects while maintaining the polarization of incident light, and reflected light by diffuse reflection that is reflected by loss of polarization. Contains.

  For example, when quantifying the state of the skin surface, the above specular reflection and diffuse reflection are separated, and the reflectance of the specular reflection and diffuse reflection is measured. It is possible to quantify the state of the skin called the feeling.

  First, regarding the surface roughness of the skin called texture, when the texture is fine, the ratio of diffuse reflected light on the surface of the skin is considered to increase. When the amount is large, the refractive index decreases, the amount of light incident on the skin increases, the amount of light diffused inside the skin increases, and the amount of diffuse reflection from the inside of the skin increases.

  In addition, hemoglobin in the skin has the property of absorbing light, and the amount of diffuse reflection from the skin increases as the amount of hemoglobin decreases, and the amount of melanin in the skin diffuses as the amount decreases. The amount of reflection is thought to increase.

  As described above, in this embodiment, it is possible to easily quantify characteristics that are considered to have a correlation with the high transparency of the skin, which is conventionally captured by a visual expression of so-called transparency. It is possible to quantify the state of the affected skin.

  In addition, when the apparatus according to the present example is used, the surface roughness of the skin, the stratum corneum moisture content, the amount of hemoglobin and melanin, which has conventionally required time for measurement, can be easily measured in a short time by optical measurement. There is an effect that can be quantified.

  Further, when measuring the reflectivity of the specular reflection light and the diffuse reflection light in this way, it is necessary to measure the light L1 and the reflected light L2 respectively when the light is transmitted through a polarizing filter and when the light is not transmitted. However, in this embodiment, since the operating means 15A, 16A, 17A and 18A for operating the polarizing filters 15, 16, 17 and 18 are provided, the polarizing filters can be moved quickly. This makes it possible to achieve the effect of shortening the measurement time.

  For example, for the polarization of the light L1 and the polarization of the reflected light L2, there are five types: unpolarized and unpolarized, S-polarized and non-polarized, P-polarized and non-polarized, unpolarized and P-polarized, unpolarized and S-polarized, respectively. It is possible to quickly measure the reflectance by the combination of the above, and to measure the detailed states such as diffuse reflection, specular reflection, and total reflection in detail in each case of P-polarized light and S-polarized light. It can be completed.

  Next, details of the shape of the reflecting portion 14 and details of installation will be described with reference to FIGS.

  FIG. 3A is a plan view of the reflecting portion 14, and FIG. 3B schematically shows a state where a plurality of the reflecting portions 14 are installed. In practice, the plurality of reflecting portions 14 are arranged in a curved shape, and the reflecting portions 14 are inclined with respect to the measurement target. However, in order to make the figure easy to understand, in FIG. This is schematically represented by a plan view, that is, a figure projected from the normal direction of each reflecting portion.

  First, referring to FIG. 3A, the reflection portion 14 has a shape in which the reflection surface becomes smaller from the first end A toward the second end B. Therefore, as shown in FIG. 3B, it is possible to efficiently install the reflecting portion 14 in a space-saving manner and reflect the reflected light from the measurement object at a plurality of fine angles. It becomes.

  In the case of the reflecting portion 14 shown in the figure, for example, a substantially rectangular first reflecting portion 14a formed on the first end A side and a substantially formed first reflecting portion 14a on the second end B side. The trapezoidal second reflecting portion 14b has a combined shape.

Next, referring to FIG. 3B, the reflection unit 14 is installed on a circle centered on the measurement point S0, for example. The direction from the end A to the second end B, that is, the installation direction installed in the holding unit 13 is reversed. Further, as shown in FIG. 3A, the reflection portion 14 has a shape in which the reflection surface becomes smaller from the first end A toward the second end B. Therefore, it is possible to efficiently install the reflecting portion 14 in a space-saving manner, and it is possible to reflect the reflected light from the measurement object at a plurality of fine angles.

  For this reason, it is possible to set the pitch of the installation angle of the two adjacent reflecting portions around the measurement point S0 to 10 ° or less, for example, 5 ° in the present embodiment. A plurality of reflected lights can be reflected at an angular pitch.

  For example, when the shape of the reflection part is simply reduced to reduce the pitch of the installation angle, the measurement area of the reflected light measured by the measurement means 12 becomes small, and therefore the measurement value due to the measurement position deviation There may be problems with stability. In addition, if the reflecting parts are square and arranged in, for example, two rows and the pitch of the installation angles is reduced, the reflected light measurement area can be widened, but the reflecting portion layout places the reflecting portions at the light receiving positions of the reflecting portions. There will be a difference.

  On the other hand, in this embodiment, the difference in the light receiving position of the reflecting part is small, the measurement area of the reflected light by the reflecting part can be made large, and the pitch of the installation angle of the reflecting part can be made small.

  In the present embodiment, for example, if the normal line of the measurement point S0 of the measurement object S is set to 0 °, the pitch of the installation angle is 5 °, and in increments of 5 ° from + 70 ° to −30 °. A total of 24 reflectors 14 are installed in increments of 5 ° from 60 ° to −70 °. Further, no reflection part is provided in the vicinity where the light L1 is incident (incident angle is −45 ° on a normal basis and + 45 ° from the surface to be measured).

  As described above, in this embodiment, it is possible to measure the surface state of the measurement target in detail by measuring the minute multi-angle reflected light of the measurement target. Conventionally, when trying to measure the reflected light of a minute multi-angle as described above, for example, it has been necessary to change the installation position of the measuring means and perform multiple measurements, which takes time. In the case of the present embodiment, the measurement can be completed promptly, for example, by one measurement.

  In addition, for example, an expensive device such as an gonometer may be used to measure multi-angle reflected light. However, in this embodiment, the structure is cheaper and simpler than the ogniometer, and is further scanned by the ogniometer. The measurement can be completed in a shorter time than that.

  In addition, since the apparatus according to the present embodiment has a simple structure, it is possible to reduce the size and weight.

  The measurement target according to the present embodiment is not limited to the surface of the skin, and can be used for various measurement targets that require quantification of the surface state, such as a powder state. It is obvious that the same effects as those described in this embodiment can be obtained.

  Although the present invention has been described with reference to the preferred embodiments, the present invention is not limited to the specific embodiments described above, and various modifications and changes can be made within the scope described in the claims.

  According to the multi-angle reflected light measuring apparatus according to the present invention, it is possible to measure the fine multi-angle reflected light of the measurement target, and therefore it is possible to quantify the surface state of the measurement target.

It is the perspective view which showed typically the multi-angle reflected light measuring apparatus by Example 1. FIG. It is the side view which showed typically the multi-angle reflected light measuring apparatus of FIG. (A) is a top view of the reflective part used for the apparatus of FIG. 1, (B) is the figure which showed typically the state in which the several reflective part was installed.

Explanation of symbols

DESCRIPTION OF SYMBOLS 10 Multi-angle reflected light measuring device 11 Light source 12 Measuring means 13 Holding part 14 Reflecting part 14a First reflecting part 14b Second reflecting part 15, 16, 17, 18 Polarizing filter 15A, 16A, 17A, 17A Movable means S measurement Object S0 measurement point L1 light L2 reflected light L3 reflected light

Claims (7)

A light source that irradiates the object to be measured;
Measuring means for performing a measurement process of reflected light from the measurement target of the incident light,
A multi-angle reflected light measuring device having a reflection part for changing the optical path of the reflected light toward the measuring means,
A plurality of the reflection portions are arranged in an arch shape on the measurement target,
The shape of the reflecting portion is a shape in which a rectangular first reflecting portion formed on the first end side and a trapezoidal second reflecting portion formed on the second end side are combined. And a shape in which the second end is smaller than the first end,
The two adjacent reflection portions are installed such that the installation direction from the first end portion toward the second end portion is reversed,
In addition, the multi-angle reflected light measurement apparatus is configured such that the plurality of reflection units reflect the reflected light in a plurality of directions reflected by the measurement object at a time toward the measurement unit.   The multi-angle reflected light measurement apparatus according to claim 1, wherein a plurality of the reflection units are formed so as to cover a measurement point of the measurement target that is irradiated with the light. The multi-angle reflected light measurement apparatus according to claim 2, wherein a plurality of the reflection units are installed on a circle centered on the measurement point. Of two adjacent reflective portions, the pitch of the installation angle around the measurement point is, multi-angle reflected light measuring apparatus according to claim 3 Symbol mounting, characterized in that 10 ° or less. A light polarizing filter for polarizing the light;
The state condition wherein the light passes through the light polarizing filter or the light does not pass through the light polarizing filter, wherein, wherein further provided with it and the light polarizing filter moving means for moving the light polarizing filter, the Item 5. The multi-angle reflected light measurement device according to any one of Items 1 to 4 . A reflected light polarizing filter for polarizing the reflected light;
Further provided is a reflected light polarization filter moving means for moving the reflected light polarization filter in a state where the reflected light passes through the reflected light polarization filter, or in a state where the reflected light does not pass through the reflected light polarization filter. The multi-angle reflected light measuring apparatus according to claim 1, wherein:   A light source that irradiates the object to be measured;
  Measuring means for performing a measurement process of reflected light from the measurement target of the incident light,
  A multi-angle reflected light measuring device having a reflection part for changing the optical path of the reflected light toward the measuring means,
  A plurality of the reflection portions are arranged in an arch shape on the measurement target,
  A multi-angle reflected light measuring apparatus, wherein the measuring means is arranged in a direction perpendicular to a surface formed by reflected light from the measuring object to the reflecting portion.

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