JP4175210B2 - Optical measurement method - Google Patents

Optical measurement method Download PDF

Info

Publication number
JP4175210B2
JP4175210B2 JP2003272282A JP2003272282A JP4175210B2 JP 4175210 B2 JP4175210 B2 JP 4175210B2 JP 2003272282 A JP2003272282 A JP 2003272282A JP 2003272282 A JP2003272282 A JP 2003272282A JP 4175210 B2 JP4175210 B2 JP 4175210B2
Authority
JP
Japan
Prior art keywords
reflected light
test paper
holding table
measured
point
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2003272282A
Other languages
Japanese (ja)
Other versions
JP2005030984A (en
Inventor
昌弘 阿河
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Corp
Panasonic Holdings Corp
Original Assignee
Panasonic Corp
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Panasonic Corp, Matsushita Electric Industrial Co Ltd filed Critical Panasonic Corp
Priority to JP2003272282A priority Critical patent/JP4175210B2/en
Publication of JP2005030984A publication Critical patent/JP2005030984A/en
Application granted granted Critical
Publication of JP4175210B2 publication Critical patent/JP4175210B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Images

Landscapes

  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Or Analysing Materials By The Use Of Chemical Reactions (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Description

本発明は、被測定物に対して光を走査しながら照射し、その反射光を受光して被測定物の特性を測定する光学測定方法に関するものである。 The present invention relates to an optical measurement method for irradiating an object to be measured while scanning the light, receiving the reflected light, and measuring the characteristics of the object to be measured.

従来、試験紙に尿、血液、唾液などの検体を浸すことによって、試験紙の一部に設けられたテストラインの呈色状態を検出し、検体内に存在する特定物質の陽性、陰性等を自動的に判定する測定装置がある。この装置は、被測定物である試験紙に対して光を照射し、照射光と試験紙との位置関係を変化させながら、テストラインにおける反射光量等の光学特性を検出するものである(例えば、特許文献1参照)。   Conventionally, by immersing a specimen such as urine, blood, or saliva in a test paper, the color state of the test line provided on a part of the test paper is detected, and positive or negative of a specific substance present in the specimen is detected. There are measuring devices that automatically determine. This apparatus detects optical characteristics such as the amount of reflected light on a test line while irradiating a test paper, which is a measurement object, with light and changing the positional relationship between the irradiated light and the test paper (for example, , See Patent Document 1).

図4に、試験紙を用いた光学測定装置の概略構成を示す模式図を示す。図4(a)ではテストチップZについてはその要部を側面図で表しており、(b)はその上面図を表している。   In FIG. 4, the schematic diagram which shows schematic structure of the optical measuring apparatus using a test paper is shown. In FIG. 4A, the main part of the test chip Z is represented by a side view, and FIG. 4B is a top view thereof.

試験紙23をホルダー21で囲んで一体化したテストチップZに対して、光源1からの光をレンズ2で成形して照射し、テストチップZからの反射光を受光素子5で検出する。またホルダー21の一部には試験紙露出窓22を設けてあり、試験紙23の表面が露出している。   The light from the light source 1 is formed by the lens 2 and irradiated to the test chip Z in which the test paper 23 is surrounded by the holder 21 and integrated, and the light reflected from the test chip Z is detected by the light receiving element 5. A test paper exposure window 22 is provided in a part of the holder 21 so that the surface of the test paper 23 is exposed.

この時、検体内に存在する特定物質が陽性であれば、試験紙23上のテストライン24において呈色反応が発生している。従って、照射光ビーム25をP1からP6の位置まで移動させると、受光素子5で検出される反射光量信号26は、図4(c)に示すような変化を示す。点Q,R,Sにおいて、反射光量が減少して信号の谷部が発生しているが、これはそれぞれ試験紙露出窓の端部22a、テストライン24、試験紙露出窓の別の端部22bに相当している。   At this time, if the specific substance present in the specimen is positive, a color reaction has occurred in the test line 24 on the test paper 23. Therefore, when the irradiation light beam 25 is moved from the position P1 to the position P6, the reflected light amount signal 26 detected by the light receiving element 5 shows a change as shown in FIG. At points Q, R, and S, the amount of reflected light is reduced and signal valleys are generated, which are the test paper exposure window end 22a, the test line 24, and another end of the test paper exposure window, respectively. 22b.

ここで、試験紙露出窓の端部22aを基準にしてテストライン24の現れる位置を予測すれば、予測位置にテストラインが現れなかった場合に陰性判定をすることができる。また、テストラインでない位置で発生したノイズ信号すなわち、同様に発生する谷部をテストラインと誤検出することを防止することもできる。正確な測定のためには、テストライン24の位置を予測するための基準点、ここでは試験紙露出窓の端部22aの正しい検出が必要であり、非常に重要である。   Here, if the position at which the test line 24 appears is predicted based on the end 22a of the test paper exposure window, a negative determination can be made when the test line does not appear at the predicted position. Further, it is possible to prevent a noise signal generated at a position other than the test line, that is, a similarly generated valley portion from being erroneously detected as a test line. For accurate measurement, a correct detection of the reference point for predicting the position of the test line 24, here, the end 22a of the test paper exposure window is necessary, which is very important.

端部22aの検出方法は、照射光ビーム25の移動開始後から最初に現れる谷部Qと、それに続く山部との信号強度の差Vqを求め、それが規定のしきい値を越えれば試験紙露出窓の端部22aと認識している。ここでしきい値と比較するのは、ノイズ信号により現れる小さな谷部を排除するためである。従って、この基準点から既知の距離yだけ離れた位置を、テストライン24の現れる位置と予測している。以上のようにして、規定位置のテストライン24を認識し、テストラインの呈色状態から、検体内に存在する特定物質の判定を行っている。
特開2001−289846号公報
The end 22a is detected by obtaining a signal intensity difference Vq between a trough Q that first appears after the irradiation light beam 25 starts to move and a subsequent peak, and if this exceeds a specified threshold value, the test is performed. It is recognized as the end 22a of the paper exposure window. The reason for comparing with the threshold value is to eliminate a small valley that appears due to a noise signal. Therefore, a position that is separated from the reference point by a known distance y is predicted as a position where the test line 24 appears. As described above, the test line 24 at the specified position is recognized, and the specific substance existing in the specimen is determined from the coloration state of the test line.
JP 2001-289846 A

上記従来の構成では、試験紙とホルダーが一体化しており、1回の測定の度にテストチップごと使い捨てにするため、1回の測定におけるコストが高くなる問題がある。これを解決するために、このようなホルダーを用いず、図5に示すように、何度も再利用可能な保持台上に試験紙を載置した状態で測定することで、試験紙のみを交換することが考えられる。なお保持台3に試験紙を載せることで、試験紙の取り扱いを容易にするとともに、測定装置本体が検体などで汚染することを防止している。   In the above-described conventional configuration, the test paper and the holder are integrated, and the test chip is made disposable for each measurement, and thus there is a problem that the cost for each measurement increases. In order to solve this, without using such a holder, as shown in FIG. 5, by measuring with the test paper placed on a holder that can be reused many times, only the test paper can be measured. It is possible to exchange. In addition, by placing the test paper on the holding table 3, the test paper can be easily handled and the main body of the measuring apparatus is prevented from being contaminated with the specimen.

図5(a)は保持台の側面から表した図、(b)は保持台の上面から表した図、(c)は得られる反射光量の信号を表しており、この場合の位置基準点は、試験紙8の端部8aとし、山部と谷部の信号の差Vtがしきい値を超えるかどうかで検出することができる。そして端部8aを基準として、そこから所定の位置におけるテストラインの特性を測定する。   FIG. 5A is a diagram showing the side of the holding table, FIG. 5B is a diagram showing the top surface of the holding table, and FIG. 5C shows a signal of the amount of reflected light obtained. In this case, the position reference point is The edge 8a of the test paper 8 can be used to detect whether the difference Vt between the peak and valley signals exceeds the threshold value. Then, using the end 8a as a reference, the characteristics of the test line at a predetermined position are measured therefrom.

しかしながらこのようなコストを抑えた構成においては新たな課題がある。照射光ビーム4をP1からP6まで移動した場合に、保持台3の表面上に汚れ28が存在したときには、反射光量の信号は27の様になる。すなわち点T,Uにおいて、反射光量が減少して信号の谷部が発生しており、それぞれ試験紙端部8a、汚れ28に相当している。谷部Tとそれに続く山部との信号強度の差をVt、谷部Uとそれに続く山部との信号の差をVuとする。ここでVuが規定のしきい値を越えた場合、しきい値を超える位置が2箇所発生し、基準点の検出が困難になる。また、試験紙8を保持台3上に取り付け忘れた場合であっても、Vuが存在するために基準点と誤認識し、試験紙が無いにも関わらず測定動作をしてしまうという課題がある。   However, there is a new problem in the configuration in which such cost is suppressed. When the irradiation light beam 4 is moved from P1 to P6 and the dirt 28 is present on the surface of the holding table 3, the reflected light amount signal becomes 27. That is, at points T and U, the amount of reflected light is reduced and signal valleys are generated, which correspond to the test paper edge 8a and the stain 28, respectively. Let Vt be the signal intensity difference between the valley T and the following peak, and Vu be the signal difference between the valley U and the following peak. Here, when Vu exceeds a prescribed threshold value, two positions exceeding the threshold value occur, and it becomes difficult to detect the reference point. Further, even when the test paper 8 is forgotten to be mounted on the holding table 3, there is a problem that the measurement operation is performed even though the test paper is not recognized because Vu exists and is erroneously recognized as a reference point. is there.

そこで本発明は、上記課題を解決するために、何度も再利用可能な保持台上に試験紙を固定する構成において、保持台の一部に反射光が検出されない穴を設けることにより、保持台に汚れが付着していた場合でも被測定物である試験紙の端部を正確に検知するとともに、試験紙付け忘れも検知できるようにする光学測定方法を提供することを目的とする。 Therefore, in order to solve the above-described problem, the present invention has a configuration in which a test paper is fixed on a holding table that can be reused many times, and a holding hole is provided in a part of the holding table so that reflected light is not detected. An object of the present invention is to provide an optical measurement method capable of accurately detecting an end portion of a test paper which is an object to be measured and detecting forgetting to attach a test paper even when dirt is attached to a table.

上記課題を解決するために、本発明の光学測定方法は、保持台の一部に穴を形成し、前記穴の一部に被測定物の端部が位置するよう被測定物を保持台上に配置し、光源から出射した光を、前記保持台及び被測定物に対して、それらとの相対的な位置関係を変化させながら照射し、受光した反射光量の所定の変化をもとに前記被測定物の端部の位置を認識し、この位置から所定の距離を隔てた位置における被測定物の特性を測定するようにした光学測定方法において、光源からの光を走査した時の反射光量が一定レベル以下となる期間が、保持台の穴だけを走査した時に反射光量が一定レベル以下となる期間よりも短いことを以て、保持台上の被測定物の存在を判断するようにしたことを特徴とするものである。 In order to solve the above-described problems, the optical measurement method of the present invention is configured such that a hole is formed in a part of a holding table, and the object to be measured is placed on the holding table so that an end of the object to be measured is located in a part of the hole. The light emitted from the light source is irradiated to the holding table and the object to be measured while changing the relative positional relationship between them, and based on a predetermined change in the amount of reflected light received. In the optical measurement method that recognizes the position of the end of the object to be measured and measures the characteristics of the object to be measured at a position separated from this position, the amount of reflected light when scanning light from the light source The presence of the object to be measured on the holding table is judged by the fact that the period during which the value is below a certain level is shorter than the period when the amount of reflected light is below a certain level when only the holes in the holding table are scanned. It is a feature.

以上のように本発明によれば、安価な構成でもって、被測定物の端部の位置を正確に認識し、この位置を基準として、後に続く測定動作を正しく行う光学測定装置を実現することができる。また被測定物の装着の有無を検出でき、装着されていないと判断した場合には、警告などによって誤測定を回避することが可能となる。さらに測定途中における、被測定物の位置ずれを検出できる構成であるので、誤測定を回避することが可能となる。   As described above, according to the present invention, an optical measurement apparatus that accurately recognizes the position of the end of the object to be measured and correctly performs the subsequent measurement operation with the position as a reference can be realized with an inexpensive configuration. Can do. Further, whether or not the object to be measured is attached can be detected, and if it is determined that the object is not attached, erroneous measurement can be avoided by a warning or the like. Furthermore, since it is a structure which can detect the position shift of a to-be-measured object in the middle of a measurement, it becomes possible to avoid an erroneous measurement.

以下、本発明の光学測定方法の実施の形態を図面とともに説明する。
(実施の形態1)
以下、本発明の第1の実施の形態について、図1及び図2を用いて説明する。図1は、保持台3の一部に、反射光が検出されない穴を設けた例を示している。図1(a)は保持台の側面から表した図、(b)は保持台の上面から表した図、(c)はこの保持台3を走査して得られる反射光量信号を表している。
Hereinafter, embodiments of the optical measurement method of the present invention will be described with reference to the drawings.
(Embodiment 1)
Hereinafter, a first embodiment of the present invention will be described with reference to FIGS. 1 and 2. FIG. 1 shows an example in which a hole in which reflected light is not detected is provided in a part of the holding table 3. FIG. 1A is a diagram showing the side surface of the holding table, FIG. 1B is a diagram showing the upper surface of the holding table, and FIG. 1C shows a reflected light amount signal obtained by scanning the holding table 3.

図1において、保持台3は矩形をした樹脂製部材からなり、上面には被測定物である試験紙を載置可能に構成している。光学測定方法は、この保持台3に対して、半導体レーザ(発光素子)1からの光をレンズ2で成形して照射し、保持台3からの反射光をフォトダイオード(受光素子)5で受光し反射光量信号として検出する構成である。 In FIG. 1, the holding table 3 is made of a resin member having a rectangular shape, and is configured such that a test paper as a measurement object can be placed on the upper surface. In the optical measuring method , the light from the semiconductor laser (light emitting element) 1 is shaped and irradiated to the holding table 3 by the lens 2, and the reflected light from the holding table 3 is received by the photodiode (light receiving element) 5. In this configuration, the reflected light amount signal is detected.

保持台3には、その中央部から若干ずれた位置に貫通する穴6を形成し、半導体レーザ1から光を照射しても、反射光がフォトダイオード5で検出されないようにしている。穴6の大きさは、保持台3の長辺方向をm、短辺方向をnとすると、照射光ビーム4の径lに対して、すくなくとも、m>2l、n>lの関係を満たすものである。   The holding base 3 is formed with a hole 6 penetrating at a position slightly deviated from the central portion thereof, so that reflected light is not detected by the photodiode 5 even when light is emitted from the semiconductor laser 1. The size of the hole 6 satisfies the relationship of at least m> 2l and n> l with respect to the diameter l of the irradiation light beam 4 where m is the long side direction of the holding table 3 and n is the short side direction. It is.

ここで、半導体レーザ1等の光学系と保持台3との相対的な位置を変化させ、照射光ビーム4をP1からP6の位置まで走査する。このとき受光素子5で検出される反射光量信号7は、図1(c)に示すような変化を示す。照射光ビーム4の移動開始点P1は、反射光量信号7の点A1に相当する。照射光ビーム4が穴6に差し掛かる点P2は、反射光量信号7の点B1に相当する。照射光ビーム4がP1からP2までの範囲では、反射光量はV1を示す。照射光ビーム4が穴6内に全て入る点P3は、反射光量信号7の点C1に相当し、照射光ビーム4がP2からP3までの範囲では、反射光量は徐々に減少する。照射光ビーム4が保持台3に差し掛かる点P4は、反射光量信号7の点D1に相当し、照射光ビーム4がP3からP4までの範囲では、反射光が無いために信号は基底状態の零を示す。照射光ビーム4が保持台3上に全て入った点P5は、反射光量信号7の点E1に相当し、照射光ビーム4がP4からP5までの範囲では、反射光量は徐々に増加する。照射光ビーム4の移動終止点P6は、反射光量信号7上の点F1に相当し、照射光ビーム4がP5からP6までの範囲では、反射光量はV1を示す。   Here, the relative position between the optical system such as the semiconductor laser 1 and the holding table 3 is changed, and the irradiation light beam 4 is scanned from the position P1 to the position P6. At this time, the reflected light amount signal 7 detected by the light receiving element 5 shows a change as shown in FIG. The movement start point P 1 of the irradiation light beam 4 corresponds to the point A 1 of the reflected light amount signal 7. A point P 2 where the irradiation light beam 4 reaches the hole 6 corresponds to a point B 1 of the reflected light amount signal 7. When the irradiation light beam 4 is in the range from P1 to P2, the amount of reflected light indicates V1. The point P3 where the irradiation light beam 4 completely enters the hole 6 corresponds to the point C1 of the reflected light amount signal 7, and the reflected light amount gradually decreases in the range from the irradiation light beam 4 to P3. The point P4 at which the irradiation light beam 4 reaches the holding table 3 corresponds to the point D1 of the reflected light amount signal 7. In the range from the irradiation light beam 4 to P4, the signal is in the ground state because there is no reflected light. Indicates zero. The point P5 at which the irradiation light beam 4 has entered all on the holding table 3 corresponds to the point E1 of the reflected light amount signal 7, and the reflected light amount gradually increases in the range from the irradiation light beam 4 to P5. The movement end point P6 of the irradiation light beam 4 corresponds to the point F1 on the reflected light amount signal 7, and the reflected light amount indicates V1 in the range from the irradiation light beam 4 to P5 to P6.

また、穴6の端部6aは、反射光量信号7上の点G1に相当し、反射光量は点B1と点C1のほぼ中間の値(V1/2)を示す。同様に穴6の別の端部6bは、反射光量信号7の点H1に相当し、反射光量は点D1と点E1のほぼ中間の値(V1/2)を示す。   Further, the end 6a of the hole 6 corresponds to the point G1 on the reflected light amount signal 7, and the reflected light amount shows a substantially intermediate value (V1 / 2) between the points B1 and C1. Similarly, the other end 6b of the hole 6 corresponds to the point H1 of the reflected light amount signal 7, and the reflected light amount shows a value (V1 / 2) that is substantially intermediate between the point D1 and the point E1.

図2は、保持台3の穴6上に、被測定物である試験紙8を載置した状態を示している。試験紙8は、穴6の領域内にその端部が重なるように配置している。図2(a)は保持台3の側面から表した図、(b)は保持台3の上面から表した図、(c)はこの構成における反射光量信号を表している。   FIG. 2 shows a state in which a test paper 8 as a measurement object is placed on the hole 6 of the holding table 3. The test paper 8 is arranged so that the end thereof overlaps the area of the hole 6. 2A is a diagram showing the side surface of the holding table 3, FIG. 2B is a diagram showing the upper surface of the holding table 3, and FIG. 2C shows a reflected light amount signal in this configuration.

照射光ビーム4の位置P1,P2’,P3’,P4,P5,P6は、それぞれ反射光量信号9上の点A2,B2,C2,D2,E2,F2に相当する。ここでP2’は、照射光ビーム4が試験紙8の面上から穴6に差し掛かる位置であり、P3’は穴6内に全て入る位置である。照射光ビーム4がP1からP2’までの範囲において、反射光量はV2を示し、P5からP6の範囲において、反射光量はV1を示す。 The positions P1, P2 ′, P3 ′, P4, P5, and P6 of the irradiation light beam 4 correspond to points A2, B2, C2, D2, E2, and F2 on the reflected light amount signal 9, respectively. Here, P 2 ′ is a position where the irradiation light beam 4 reaches the hole 6 from the surface of the test paper 8, and P 3 ′ is a position where all of the light beam 4 enters the hole 6. In the range where the irradiation light beam 4 is from P1 to P2 ′, the reflected light amount is V2, and in the range from P5 to P6, the reflected light amount is V1.

また、試験紙8の端部8bは、反射光量信号9上の点G2に相当し、反射光量は点B2と点C2のほぼ中間の値(V2/2)を示す。同様に穴6の端部6bは、反射光量信号9上の点H2に相当し、反射光量は点D2と点E2のほぼ中間の値(V1/2)を示す。   Further, the end 8b of the test paper 8 corresponds to the point G2 on the reflected light amount signal 9, and the reflected light amount shows a value (V2 / 2) approximately halfway between the points B2 and C2. Similarly, the end 6b of the hole 6 corresponds to the point H2 on the reflected light amount signal 9, and the reflected light amount shows a value (V1 / 2) that is substantially intermediate between the point D2 and the point E2.

図1及び図2の構成において非常に重要なことは、穴6を設けているために、反射光量信号7及び9に信号強度が零となる基底状態が存在することである。つまり、保持台3再利用しても、保持台3の穴6以外の表面部分には、試料等の汚れが付着することはあるが、この穴6のところには汚れが付着することはないので汚れの影響を受けず、必ず基底状態が検出されることになる。 What is very important in the configuration of FIGS. 1 and 2 is that the ground state in which the signal intensity is zero exists in the reflected light amount signals 7 and 9 because the hole 6 is provided. That is, even if the holder 3 is reused, dirt such as a sample may adhere to the surface portion other than the hole 6 of the holder 3, but dirt may adhere to the hole 6. Therefore, the ground state is always detected without being affected by dirt.

ここで、穴6を利用した試験紙8の有無の検出方法について説明する。試験紙8が存在する場合、基底状態の相当幅、すなわち図2におけるX2は、試験紙8が存在しない場合の基底状態の相当幅、すなわち図1におけるX1よりも小さくなるので、このことを利用して、正しい試験紙8の装着状態を認識できる。   Here, a method for detecting the presence or absence of the test paper 8 using the holes 6 will be described. When the test paper 8 is present, the equivalent width of the ground state, that is, X2 in FIG. 2 is smaller than the equivalent width of the ground state when the test paper 8 is not present, that is, X1 in FIG. Thus, the correct mounting state of the test paper 8 can be recognized.

つまり、実際に測定した基底状態の相当幅が、予め定めたしきい値X3(X1>X3>X2)を越えて小さくなれば、試験紙8が装着されていると認識する。そうでない場合には、試験紙8が装着されていないと判断し、警告などによって誤測定を回避可能となる。   That is, if the equivalent width of the actually measured ground state becomes smaller than a predetermined threshold value X3 (X1> X3> X2), it is recognized that the test paper 8 is loaded. Otherwise, it is determined that the test paper 8 is not loaded, and erroneous measurement can be avoided by a warning or the like.

勿論基底状態の相当幅の検出は、図2の記号で説明すれば、点G2と点H2間の距離X2に限られるものでなく、点C2と点D2間の距離や、点B2と点E2間の距離や、点B2から点C2までの任意の規定点と点D2から点E2までの任意の規定点間距離で行っても、何ら問題はない。   Of course, the detection of the equivalent width of the ground state is not limited to the distance X2 between the point G2 and the point H2, as explained by the symbols in FIG. 2, but the distance between the point C2 and the point D2, or the point B2 and the point E2. There is no problem even if it is performed at a distance between them or an arbitrary specified point from point B2 to point C2 and an arbitrary specified point distance from point D2 to point E2.

また、試験紙8の端部8bの位置は、反射光量信号9上の点G2の検出によって、正確に認識可能となる。この位置を試験紙8の基準点とすることによって、後に続く測定動作、例えば図5におけるテストラインの測定を正しく行うことが可能になる。   Further, the position of the end 8b of the test paper 8 can be accurately recognized by detecting the point G2 on the reflected light amount signal 9. By using this position as the reference point of the test paper 8, it is possible to correctly perform the subsequent measurement operation, for example, the measurement of the test line in FIG.

またこのような構成によれば、照射光ビーム4の光量が減少した場合でも、基底状態の幅X2、反射光量信号9上の点G2の位置は変化しない。従って、照射光ビーム4の光量変化の影響を受けない、安定した試験紙8の有無判断や試験紙8の端部8bの位置検出が可能になる。   Further, according to such a configuration, even when the light amount of the irradiation light beam 4 is decreased, the position X2 of the ground state width X2 and the point G2 on the reflected light amount signal 9 does not change. Accordingly, it is possible to determine the presence or absence of the test paper 8 and to detect the position of the end portion 8b of the test paper 8 without being affected by the change in the light amount of the irradiation light beam 4.

(実施の形態2)
以下に、本発明の第2の実施の形態について、図3を用いて説明する。図3は、図2と同様に、保持台3に設けた穴6上に、試験紙が重なるようにした構成である。図3(a)において実線で示す8aは保持台3上に載置した初期の試験紙位置であり、破線で示す8bはその後に何らかの外的衝撃等を受けることによって、試験紙8が位置ずれをおこした状態を示している。
(Embodiment 2)
Below, the 2nd Embodiment of this invention is described using FIG. FIG. 3 shows a configuration in which the test paper is overlapped on the hole 6 provided in the holding table 3 as in FIG. In FIG. 3 (a), 8a indicated by a solid line is the initial position of the test paper placed on the holding table 3, and 8b indicated by the broken line is misaligned when the test paper 8 is subsequently subjected to some external impact or the like. It shows the state that has been performed.

試験紙位置が初期状態8aである場合、反射光量信号は10aとなり、実施の形態1で説明した基底状態の相当幅はX2になるが、試験紙位置がずれて8cとなった場合には、反射光量信号は10b,基底状態の幅の相当値はX2’の様に変化する。   When the test paper position is in the initial state 8a, the reflected light amount signal is 10a, and the equivalent width of the ground state described in the first embodiment is X2, but when the test paper position is shifted to 8c, The reflected light amount signal changes as 10b, and the equivalent value of the ground state width changes as X2 '.

従って、反射光量信号10a上の点G3を検出して、試験紙8aの端部を基準点として定め、次に例えば試験紙8上のテストライン測定等の動作を行った後、再度試験紙8の端部位置を求めることで、測定途中に試験紙が位置ずれを起こしたか否かを検出することができる。すなわち、再度求めた試験紙の端部位置が、当初求めた点G3と異なる場合には、試験紙8がずれたと判断し、警告などによって、テストライン測定等における誤測定を回避することが可能となる。   Accordingly, the point G3 on the reflected light amount signal 10a is detected, the end of the test paper 8a is determined as a reference point, and then an operation such as test line measurement on the test paper 8 is performed, and then the test paper 8 is again processed. By obtaining the position of the end portion of the paper, it is possible to detect whether or not the test paper has been misaligned during the measurement. That is, if the edge position of the test paper obtained again is different from the initially obtained point G3, it is determined that the test paper 8 has shifted, and erroneous measurement in test line measurement or the like can be avoided by a warning or the like. It becomes.

本発明にかかる光学測定方法は、何度も再利用可能な保持台上に被測定物を載置できるようにした安価な構成において、保持台に汚れが付着していた場合でも被測定物の端部を正確に検知したり、被測定物の付け忘れも検知できるものであり、被測定物として試験紙を用い、尿、血液、唾液などの検体の光学特性を検出するものなどに適用できる。 The optical measurement method according to the present invention is an inexpensive configuration in which a measurement object can be placed on a holding table that can be reused many times. It can detect the edge accurately or detect forgetting to attach the object to be measured, and can be applied to the one that uses the test paper as the object to be measured and detects the optical characteristics of samples such as urine, blood, saliva, etc. .

本発明の光学測定方法の実施の形態1における、試験紙が無い場合の保持台の構成図、及び反射光量信号を示す図FIG. 3 is a diagram showing a configuration of a holding table and a reflected light amount signal when there is no test paper in the first embodiment of the optical measurement method of the present invention. 同形態における、保持台上に試験紙を載置した場合の構成図、及び反射光量信号を示す図In the same form, a configuration diagram when a test paper is placed on a holding table, and a diagram showing a reflected light amount signal 本発明の実施の形態2における光学測定方法の構成図、及び反射光量信号を示す図The block diagram of the optical measuring method in Embodiment 2 of this invention, and the figure which shows a reflected light amount signal 従来の光学測定方法の構成図、及び反射光量信号を示す図Configuration diagram of conventional optical measurement method and diagram showing reflected light amount signal 従来の他の光学測定方法の構成図、及び反射光量信号を示す図Configuration diagram of another conventional optical measurement method and diagram showing reflected light amount signal

符号の説明Explanation of symbols

1 半導体レーザ
2 レンズ
3 保持台
4 照射光ビーム
5 フォトダイオード
6 穴
7,9,10,11 反射光量信号
8 試験紙
DESCRIPTION OF SYMBOLS 1 Semiconductor laser 2 Lens 3 Holding stand 4 Irradiation light beam 5 Photodiode 6 Hole 7, 9, 10, 11 Reflected light quantity signal 8 Test paper

Claims (1)

保持台の一部に穴を形成し、前記穴の一部に被測定物の端部が位置するよう被測定物を保持台上に配置し、光源から出射した光を、前記保持台及び被測定物に対して、それらとの相対的な位置関係を変化させながら照射し、受光した反射光量の所定の変化をもとに前記被測定物の端部の位置を認識し、この位置から所定の距離を隔てた位置における被測定物の特性を測定するようにした光学測定方法において、光源からの光を走査した時の反射光量が一定レベル以下となる期間が、保持台の穴だけを走査した時に反射光量が一定レベル以下となる期間よりも短いことを以て、保持台上の被測定物の存在を判断するようにしたことを特徴とする光学測定方法。 A hole is formed in a part of the holding table, the object to be measured is arranged on the holding table so that an end of the object to be measured is located in a part of the hole, and the light emitted from the light source is transmitted to the holding table and the object to be measured. Irradiate the measured object while changing its relative positional relationship, and recognize the position of the end of the object to be measured based on a predetermined change in the amount of reflected light received. In the optical measurement method that measures the characteristics of the object to be measured at positions separated by a distance, only the hole in the holder is scanned during the period when the amount of reflected light when scanning light from the light source is below a certain level. An optical measurement method characterized in that the presence of an object to be measured on a holding table is determined by the fact that the amount of reflected light is shorter than a period during which the amount of reflected light is below a certain level .
JP2003272282A 2003-07-09 2003-07-09 Optical measurement method Expired - Fee Related JP4175210B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2003272282A JP4175210B2 (en) 2003-07-09 2003-07-09 Optical measurement method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2003272282A JP4175210B2 (en) 2003-07-09 2003-07-09 Optical measurement method

Publications (2)

Publication Number Publication Date
JP2005030984A JP2005030984A (en) 2005-02-03
JP4175210B2 true JP4175210B2 (en) 2008-11-05

Family

ID=34209889

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2003272282A Expired - Fee Related JP4175210B2 (en) 2003-07-09 2003-07-09 Optical measurement method

Country Status (1)

Country Link
JP (1) JP4175210B2 (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2009128205A1 (en) * 2008-04-18 2009-10-22 パナソニック株式会社 Liquid specimen analyzing method
CN109444447A (en) * 2018-12-27 2019-03-08 天津博硕科技有限公司 A kind of test strips transfer device
CN109870448B (en) * 2019-02-09 2023-12-29 智锐达仪器科技南通有限公司 Colloidal gold test paper card detection instrument and corresponding detection control method

Also Published As

Publication number Publication date
JP2005030984A (en) 2005-02-03

Similar Documents

Publication Publication Date Title
JP5213952B2 (en) Liquid sample analysis method
US4725722A (en) Automatic focusing method and apparatus utilizing contrasts of projected pattern
KR100914567B1 (en) Method and apparatus f0r inspecting a pattern
US8309882B2 (en) Mold removing method
KR100551756B1 (en) Method for mounting semiconductor package
US5446542A (en) Mark position determining apparatus for use in exposure system
US8194240B1 (en) Enhanced focusing capability on a sample using a spot matrix
JP4175210B2 (en) Optical measurement method
KR100258895B1 (en) Apparatus and method for identifying a wafer
KR101774886B1 (en) Autofocus immunochromatography sensitive detection system
JP2008139251A (en) Ion implantation pattern detecting technique
US6819437B2 (en) Apparatus for handling liquids and a process for operating the device
JP4892294B2 (en) Microhole depth measurement method
US6881587B2 (en) Liquid-containing substance analyzing device and liquid-containing substance analyzing method
US20030038951A1 (en) Apparatus for and method of measuring thickness of materials using the focal length of a lensed fiber
EP0019941B1 (en) Reduction projection aligner system
KR100499176B1 (en) Method for measurement of wafer contamination and apparatus for the same
JP3218726B2 (en) Foreign matter inspection device
KR102526946B1 (en) Detection appatratus, lithography apparatus, and article manufacturing method
US20040179185A1 (en) Optical fixed-distance sensing apparatus
JP2818597B2 (en) Pattern inspection method
KR20050067992A (en) Apparatus and method for detecting particles on a wafer
JPH02162205A (en) Pattern checking apparatus
KR100327038B1 (en) Wafer alignment apparatus
JPH09106945A (en) Alignment method of particle beam, irradiation method and device using the method

Legal Events

Date Code Title Description
A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20060627

RD01 Notification of change of attorney

Free format text: JAPANESE INTERMEDIATE CODE: A7421

Effective date: 20060712

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20071002

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20071023

A521 Written amendment

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20071212

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20080304

A521 Written amendment

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20080410

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20080729

A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20080811

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20110829

Year of fee payment: 3

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20110829

Year of fee payment: 3

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20120829

Year of fee payment: 4

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20130829

Year of fee payment: 5

S111 Request for change of ownership or part of ownership

Free format text: JAPANESE INTERMEDIATE CODE: R313113

S533 Written request for registration of change of name

Free format text: JAPANESE INTERMEDIATE CODE: R313533

R350 Written notification of registration of transfer

Free format text: JAPANESE INTERMEDIATE CODE: R350

S111 Request for change of ownership or part of ownership

Free format text: JAPANESE INTERMEDIATE CODE: R313113

R350 Written notification of registration of transfer

Free format text: JAPANESE INTERMEDIATE CODE: R350

S111 Request for change of ownership or part of ownership

Free format text: JAPANESE INTERMEDIATE CODE: R313113

R350 Written notification of registration of transfer

Free format text: JAPANESE INTERMEDIATE CODE: R350

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

LAPS Cancellation because of no payment of annual fees