JP4148761B2 - Test tool detection mechanism and analyzer equipped with this detection mechanism - Google Patents

Description

[0001]
BACKGROUND OF THE INVENTION
The present invention relates to a detection mechanism for a test tool and an analysis apparatus including the detection mechanism.
[0002]
[Prior art]
As a method for analyzing a specific component in a sample, there is a method using an optical technique. As an example, there is one that uses a color reaction generated in a test tool. In such an analysis, the degree of coloration in the test tool may be confirmed visually, but an analyzer is used to quantify the concentration of a specific component. As an analyzer, for example, a specific component is automatically quantified by supplying a test tool to the analyzer. In this case, it is necessary for the analyzer to recognize that the test tool has been supplied to the analyzer. Although the user may recognize the test tool by operating the operation switch of the analyzer, it is usually automatically performed in the analyzer.
[0003]
The recognition (detection) of the test tool in the analyzer is generally performed using an optical sensor. As an example, there is one using scattered light from the test tool 9 as shown in FIG. In the illustrated example, when the light emitted from the light source unit 90 is emitted toward the target site where the test tool 9 is to be placed, and the scattered light traveling from the target site is received by the light receiving unit 91. It is detected that the test tool 9 is placed on the target site.
[0004]
[Problems to be solved by the invention]
However, the above-described detection method is not limited to the case where the test tool 9 is placed on the target site, but when the user's hand crosses the target site or the test tool 9 is positioned above the target site. Even in such a case, the reflected light may be received by the light receiving unit 91. In this case, the analyzer may erroneously detect that the test tool 9 is placed on the target site, and the analyzer may start an operation for performing analysis.
[0005]
The present invention has been conceived under such circumstances, and it is an object of the present invention to suppress false detection when a test tool is detected by an optical technique.
[0006]
DISCLOSURE OF THE INVENTION
In the present invention, in order to solve the above-described problems, the following technical means are taken.
[0007]
That is, the test tool detection mechanism provided by the first aspect of the present invention is a detection mechanism for detecting whether or not a test tool exists in a target area, and emits light toward the target area. In a detection mechanism including a light emitting unit for emitting and a light receiving unit for receiving reflected light from the test tool, the light emitting unit and the light receiving unit are configured to have an emission central axis of the light emitting unit. And the light receiving central axis of the light receiving portion are arranged in parallel with each other, and the traveling path of light from the light emitting portion to the target region and light from the target region to the light receiving portion is defined. The light guide means further includes a first incident surface for introducing light emitted from the light emitting portion into the inside of the light guide means at a base end side thereof. And after reflection on the test tool, A second emission surface for emitting the light introduced into the light means toward the light receiving portion, and introduced into the light guide means from the light emission portion on the tip side thereof A first light emitting surface for emitting light toward the test tool and reflected light from the test tool positioned with a space with respect to the first light emitting surface, the light guiding means via the space And at least one of the first exit surface and the second entrance surface is configured to refract light passing through the surface. And the light guiding means is recessed with a predetermined depth in parallel with the emission center axis or the light receiving center axis from the base end side thereof, and the first incident surface and the second emission surface. the slits located between, is divided into an emission region and the light-receiving region It is characterized by a Rukoto. Here, the “emission central axis” refers to an axis along the direction in which the amount of emitted light is greatest in the light amount distribution of light emitted from the light emitting unit. The “light receiving center axis” refers to an axis along the normal line of the portion with the largest received light amount in the light amount distribution of the light received by the light receiving unit.
[0009]
Light guiding means is preferably configured as a prism or a lens (e.g. cylindrical lens or a Fresnel lens).
[0010]
The light emitting part is preferably configured as a light emitting diode. In general, since the light emitted from the light emitting diode travels while spreading, in order to ensure a large amount of light irradiation to the test tool, the light from the light emitting diode is converted into parallel light and then incident on the first incident surface of the light guide means. It is preferable to do so. In order to make the light from the light emitting diode collimated and incident, for example, a lens or the like may be disposed between the light emitting diode and the first incident surface.
[0014]
In the second aspect of the present invention, an analyzer configured to analyze a sample using a test tool and having a detection mechanism for detecting whether the test tool exists in a target area. In addition, an analyzer is provided in which the detection mechanism according to the first aspect of the present invention described above is used as the detection mechanism.
[0015]
DETAILED DESCRIPTION OF THE INVENTION
Hereinafter, a preferred embodiment of the present invention will be specifically described with reference to FIGS.
[0016]
As shown in FIGS. 1 and 2, the analyzer 1 is configured such that a stage 3, a detection mechanism 4, a transport mechanism 5, and a photometric mechanism 6 are provided inside a housing 2. As clearly shown in FIG. 1, the casing 2 is provided with an introduction portion 22 for placing the test tool 7 on the stage 3 in addition to the plurality of operation buttons 20 and the display 21. The introduction portion 22 is formed as a notch that communicates with the inside of the housing 2 and faces part of the stage 3. As shown clearly in FIG. 2, the test tool 7 has a strip-shaped base material 70 on which a plurality of reagent pads 71 are attached so as to be aligned in the longitudinal direction of the base material 70. Is done. The reagent pad 71 contains a reagent that reacts with a specific component in the sample and develops color.
[0017]
The stage 3 has a guide portion 30 for guiding the movement of a slide block 50 of the transport mechanism 5 described later, and a recess 31 for exposing the back surface of the test tool 7 placed on the stage 3. Yes. A prism 42 of the detection mechanism 4 described later is embedded in the recess 31. On the stage 3, a placement area 32 and a photometry area 33 are set. The placement area 32 is an area for placing the test tool 7 introduced into the inside of the housing 2 via the introduction portion 22 (see FIG. 1). The photometric area 33 is an area for photometric measurement of a specific component in the sample supplied to the reagent pad 71 by the photometric mechanism 6.
[0018]
The detection mechanism 4 is for detecting whether or not the test tool 7 is placed on the placement area 32, and as shown in FIG. 3, as the light emitting portion 40, the light receiving portion 41, and the light guiding means. The prism 42 is provided.
[0019]
The light emitting unit 40 is for emitting light toward the upper side of the stage 3. When the test tool 7 is placed on the placement area 32, the light is irradiated on the back surface of the test tool 7. can do. The light emitting portion 40 is fixed to the prism 42 so that the emission center axis L1 faces the thickness direction of the stage 3 (vertical direction in FIG. 3). The light receiving unit 41 is for receiving light traveling from above the stage 3, and the prism 42 so that the light receiving central axis L 2 is parallel or substantially parallel to the light emitting central axis L 1 of the light emitting unit 40. It is fixed to. The light emitting unit 40 is configured by, for example, a light emitting diode, and the light receiving unit 41 is configured by, for example, a photodiode. The light emitting unit 40 and the light receiving unit 41 are not necessarily fixed to the prism 42, and the detection mechanism 4 may be configured as a form separated from the prism 42.
[0020]
The prism 42 has an emission region 43 and a light receiving region 44, and the whole is formed to be transparent. These regions 43 and 44 are partitioned by a slit 45. The slit 45 is for suppressing light from the light emitting unit 40 from being directly received by the light receiving unit 41.
[0021]
The emission region 43 has a recess 46 for fitting and fixing the light emission part 40. The bottom surface of the recess 46 constitutes an incident surface 46 </ b> A for introducing light from the light emitting portion 40 into the emission region 43. The incident surface 46A is orthogonal to the emission center axis L1. The emission region 43 further has an emission surface 43A for emitting the light inside the emission region 43 toward the upper side of the stage 3. The emission surface 43A is a flat surface inclined with respect to the emission center axis L1 (light reception center axis L2), and light transmitted through the emission surface 43A is refracted.
[0022]
On the other hand, the light receiving region 44 has an incident surface 44 </ b> A for introducing reflected light from the test tool 7 into the light receiving region 44. The incident surface 44A is a plane that is inclined with respect to the light receiving central axis L2 (emergence central axis L1) opposite to the outgoing surface 43A, so that light transmitted through the incident surface 44A is refracted. . More specifically, the incident surface 44A is a specularly reflected light from the test tool 7 in a state of being placed on the placement area 32 of the stage 3 out of the light emitted from the emission surface 43A toward the upper side of the stage 3. In the light receiving region 44 along the light receiving central axis L2. The light receiving area 44 further has a recess 47 for fitting and fixing the light receiving part 41. The bottom surface of the concave portion 47 constitutes an emission surface 47 </ b> A for emitting the light inside the light receiving region 44 toward the light receiving portion 41. The emission surface 47A is orthogonal to the light receiving center axis L2.
[0023]
In the detection mechanism 4, the light emitted from the light emitting unit 40 is introduced into the emission region 43 via the incident surface 46 </ b> A, and then emitted from the emission region 43 toward the upper side of the stage 3 via the emission surface 43 </ b> A. The When the test tool 7 is not present in the placement area 32 of the stage 3, the light emitted from the emission region 43 is not received by the light receiving unit 41. On the other hand, when the test tool 7 is placed in the placement area 32, the light emitted from the emission region 43 is irradiated on the back surface of the test tool 7, and the reflected light at that time is reflected from the incident region 44. The light enters the incident surface 44A. Of the light incident on the incident surface 44 </ b> A, light regularly reflected on the back surface of the test tool 7 is selectively introduced into the incident region 44. The light introduced into the incident region 44 is emitted from the emission surface 47A and received by the light receiving unit 41.
[0024]
Thus, in the detection mechanism 4, the specularly reflected light when the test tool 7 is placed on the placement area 32 is positively introduced into the light receiving region 44 of the prism 42 and received by the light receiving unit 41. It is configured. Therefore, when the test tool 7 is not placed on the placement area 32, for example, when the test tool 7 is positioned above the placement area 32 as shown by the phantom line in FIG. 42 is not introduced. Therefore, although the test tool 7 is not placed in the placement area 32, it is possible to suppress the occurrence of a situation in which it is erroneously detected that the test tool 7 is placed.
[0025]
Since the light emitting diode has a lower directivity than the laser diode, if the light emitting diode is employed as the light emitting portion 40 of the detection mechanism 4, the light from the light emitting portion 40 is reflected as shown in FIG. The light is emitted from the emission region 43 while spreading. Therefore, if a light emitting diode is employed, it is possible to irradiate light over a relatively wide range, so that the range in which it is possible to detect whether or not the test tool 7 is placed can be increased. it can. As a result, when the user places more test kit 7 hand operation, without placing the test kit 7 while strictly positioning, since it detects that the test kit 7 is placed The burden on the user when placing the test tool 7 is reduced.
[0026]
In the detection mechanism 4, the light emitting unit 40 and the light receiving unit 41 are arranged so that the emission center axis L1 and the light receiving center axis L2 are parallel to each other. Thereby, compared with the structure which has arrange | positioned the light emission and light-receiving part so that an output center axis and a light-receiving center axis may become mutually non-parallel, the distance of the light-projection part 40 and the light-receiving part 41 can be set small. As a result, it is possible to achieve downsizing of the detection mechanism 4 and consequently downsizing of the analyzer 1.
[0027]
The transport mechanism 5 is for moving the test tool 7 from the placement area 32 of the stage 3 to the photometry area 33 as shown in FIGS. The transport mechanism 5 includes a slide block 50 capable of reciprocating the upper surface of the stage 3 in the directions indicated by arrows D1 and D2 in the drawing, and a guide rod 51 for reciprocating the slide block 50. ing. The slide block 50 includes an interference portion 50A that slides on the upper surface of the stage 3 and a connecting portion 50B that is connected to the guide rod 51 so as to be relatively movable. The connecting portion 50B is provided with a through hole 50b having a thread groove (not shown) formed on the inner surface. A thread (not shown) is formed on the surface of the guide rod 51 and is screwed to the slide block 50 through the through hole 50b. Therefore, by rotating the guide rod 51, the slide block 50 can be moved according to the rotation direction of the guide rod 51. The guide rod 51 is rotated by, for example, connecting the guide rod 51 to a power source such as a motor (not shown) and using an output from the power source. Then, the test tool 7 can be moved from the placement area 32 to the photometric area 33 by moving the slide block 50 in the direction of the arrow D1 in the figure.
[0028]
The photometric mechanism 6 is for optically measuring the degree of coloration of the reagent pad 71 of the test tool 7 as shown in FIGS. 2, 6 and 7. The photometric mechanism 6 is held by a slider 60 that can reciprocate along the surface of the stage 3 in the directions indicated by arrows D1 and D2, a guide rod 61 for reciprocating the slider 60, and the slider 60. The optical sensor 8 is provided.
[0029]
The slider 60 has a through hole 60b in which a thread groove (not shown) is formed on the inner surface. A thread (not shown) is formed on the surface of the guide rod 61 and is screwed to the slider 60 through the through hole 60b. Therefore, by rotating the guide rod 61, the slider 60, and thus the optical sensor 8, can be moved in the directions of arrows D3 and D4 in the drawing according to the rotation direction of the guide rod 61. The guide rod 61 is rotated, for example, by connecting the guide rod 61 to a power source such as a motor (not shown) and using an output from the power source.
[0030]
As shown in FIGS. 7 and 8, the optical sensor 8 includes a light emitting unit 80, a light receiving unit 81, and a prism 82 as a light guiding unit.
[0031]
The light emitting portion 80 is for emitting light toward the stage 3 and is fixed to the prism 82 so that the emission center axis L3 faces the thickness direction of the stage 3 (vertical direction in FIG. 7). The light receiving unit 81 is for receiving light traveling from the stage 3, and is fixed to the prism 82 so that the light receiving center axis L 4 is parallel or substantially parallel to the emission center axis L 3 of the light emitting unit 80. Has been. The light emitting unit 80 is configured by, for example, a light emitting diode, and the light receiving unit 81 is configured by, for example, a photodiode.
[0032]
The prism 82 has an emission area 83 and a light receiving area 84, and is entirely transparent. These regions 83 and 84 are partitioned by slits 85. The slit 85 is for suppressing the light from the light emitting unit 80 from being directly received by the light receiving unit 81.
[0033]
The emission region 83 has a recess 86 for fitting and fixing the light emission part 80. The bottom surface of the recess 86 constitutes an incident surface 86 </ b> A for introducing light from the light emitting portion 80 into the emission region 83. The incident surface 86A is orthogonal to the emission center axis L3. The emission region 83 further has an emission surface 83 </ b> A for emitting light inside the emission region 83 toward the test tool 7. The emission surface 83A is a flat surface inclined with respect to the emission center axis L3 (light reception center axis L4), and the light transmitted through the emission surface 83A is refracted.
[0034]
On the other hand, the light receiving region 84 has an entrance surface 84A for interior introduction of receiving light region 84 from the test instrument 7. The incident surface 84A is orthogonal to the light receiving center axis L4 (outgoing center axis L3). More specifically, the incident surface 84A refracts the scattered light from the test tool 7 that travels along the light receiving central axis L4 out of the light emitted from the output surface 83A toward the test tool 7. Instead, it is configured to travel along the light receiving center axis L4 inside the light receiving region 84. The light receiving region 84 further includes a recess 87 for fitting and fixing the light receiving portion 81. The bottom surface of the recess 87 constitutes an emission surface 87A for emitting the light inside the light receiving region 84 toward the light receiving portion 81. The emission surface 87A is orthogonal to the light receiving center axis L4.
[0035]
The optical sensor 8 is moved in the directions of arrows D3 and D4 (longitudinal direction of the test tool 7) together with the slider 60 by rotating the guide rod 61. Therefore, in the photometric mechanism 6, all of the plurality of reagent pads 71 can be irradiated by emitting light by the light emitting unit 80 while moving the optical sensor 8 in the longitudinal direction of the test tool 7. . On the other hand, the light receiving unit 81 can receive scattered light from each reagent pad 71.
[0036]
In the photometric mechanism 6 (the optical sensor 8) described above, the light emitting unit 80 and the light receiving unit 81 are arranged such that the emission center axis L3 and the light receiving center axis L4 are parallel to each other. Therefore, as clearly shown in FIG. 9, the optical sensor is compared with the configuration in which the light emitting part 80 'and the light receiving part 81 are arranged so that the emission center axis L3' and the light receiving center axis L4 are not parallel to each other. 8, the distance between the light emitting unit 80 and the light receiving unit 81 can be set small. As a result, miniaturization of the optical sensor 8, it is possible to turn reduce the size of the metering mechanism 6 and the analyzer 1.
[0037]
In the illustrated optical sensor 8, the emission surface 83A is inclined with respect to the emission center axis L3 (light reception center axis L4), while the incidence surface 84A is orthogonal to the light reception center axis L4 (emission center axis L3). but while orthogonalizing the emitting surface 83A with respect to emission axis L3 (light reception axis L4), may be inclined to the incident surface 84A with respect to light reception axis L4 (emission axis L3), output surface 83A In addition, both the incident surface 84A and the light incident central axis L3 or the light receiving central axis L4 may be inclined.
[0038]
Figure 10 (a) ~ (e) shows a reference example of the present invention.
[0039]
The detection mechanism 4A shown in FIG. 10A is configured such that the light guide means is configured as a prism 42A. The prism 42A inverts the prism 42 in the detection mechanism 4 (see FIG. 3 and the like) upside down. It has been configured. In the detection mechanism 4B shown in FIG. 10B, the light guide means is configured as a cylindrical lens 42B. In the detection mechanism 4C shown in FIG. 10 (c), the light guide means is configured as a Fresnel lens 42C. The full-les Nerurenzu 42C has a plurality of convex portions 42CA, is a cover 42Cb so as to cover these protrusions 42CA is placed. Detection mechanism 4D shown in FIG. 10 (d) top cover 42Db of full les Nerurenzu 42D are those that are integrally molded. In the detection mechanisms 4C and 4D shown in FIGS. 10C and 10D, the upper surface of the light guide means can be flattened, so that the upper surface is a bent surface or a curved surface (see FIGS. 3, 10A and 10A). Compared with (b), the height dimension of the central portion can be reduced. For this reason, in the detection mechanisms 4C and 4D, the dimensions of the detection mechanisms 4C and 4D can be reduced. Also, off-les Nerurenzu 42C, covers an upper surface of 42D 42Cb, be covered by 42 dB, full-les Nerurenzu 42C, it is possible to suppress the adhesion of dust and dirt in the upper surface of 42D, also dust and dirt off Les Nerurenzu 42C, than 42D Since it adheres to the covers 42Cb and 42Db with little unevenness, it is easy to remove dust and dirt. Detection mechanism shown in FIG. 10 (e) 4E are those guiding means is configured as a lens 42E combining a cylindrical lens and a full-les Nerurenzu. Also in the detection mechanism 4E, the upper surface of the lens 42E may be covered with a cover.
[Brief description of the drawings]
FIG. 1 is an overall perspective view showing an example of an analyzer according to the present invention.
FIG. 2 is a perspective view showing the main part of the internal configuration of the analyzer shown in FIG.
3 is a cross-sectional view taken along line III-III in FIG.
4 is a cross-sectional view taken along line IV-IV in FIG.
5 is a cross-sectional view taken along line VV in FIG.
6 is a cross-sectional view taken along line VI-VI in FIG.
7 is a cross-sectional view taken along line VII-VII in FIG.
FIG. 8 is a perspective view showing a main part of a photometric mechanism.
FIG. 9 is a cross-sectional view for explaining the operation of the photometric mechanism.
FIG. 10 is a cross-sectional view showing a reference example of a detection mechanism.
FIG. 11 is a schematic diagram for explaining an example of a conventional method for detecting a test tool.
[Explanation of symbols]
DESCRIPTION OF SYMBOLS 1 Analyzer 4,4A-4E Detection mechanism 40 Light-emitting part 41 Light-receiving part 42,42A Prism (light guide means)
42B Cylindrical lens (light guide)
42C, 42D Fresnel lens (light guiding means)
42E lens (light guiding means)
43A first exit surface 44A second entrance surface 46A first entrance surface 47A second exit surface 7 test tool L3 exit center axis L4 receive center axis

Claims (4)

A detection mechanism for detecting whether or not a test tool exists in a target area, and for receiving a reflected light from the test tool and a light emitting part for emitting light toward the target area In the detection mechanism comprising
While the light emitting part and the light receiving part are arranged so that the emission central axis of the light emitting part and the light receiving central axis of the light receiving part are parallel to each other,
A light guide means for defining a traveling path of light from the light emitting portion toward the target region and light from the target region toward the light receiving portion;
The light guide means reflects the light emitted from the light emitting portion to the inside of the light guide means on the base end side, and the light guide means after reflecting the light on the test tool. A second emission surface for emitting the light introduced into the light means toward the light receiving portion, and introduced into the light guide means from the light emission portion on the tip side thereof A first light emitting surface for emitting light toward the test tool and reflected light from the test tool positioned with a space with respect to the first light emitting surface, the light guiding means via the space And at least one of the first exit surface and the second entrance surface is configured to refract light passing through the surface. And
The light guide means is recessed at a predetermined depth from the base end side in parallel with the emission center axis or the light reception center axis, and is positioned between the first incident surface and the second emission surface. A detection mechanism for a test tool, which is divided into an emission region and a light receiving region by a slit . The test tool detection mechanism according to claim 1, wherein the light guide means is configured as a prism or a lens. The light-emitting unit includes a light emitting diode, test kit the detection mechanism according to claim 1 or 2. An analysis apparatus configured to analyze a sample using a test tool and having a detection mechanism for detecting whether or not the test tool exists in a target area,
4. The analyzer according to claim 1, wherein the detection mechanism is the one described in any one of claims 1 to 3 .

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