JP4103106B2 - Polishing cloth - Google Patents
Polishing cloth Download PDFInfo
- Publication number
- JP4103106B2 JP4103106B2 JP2002057220A JP2002057220A JP4103106B2 JP 4103106 B2 JP4103106 B2 JP 4103106B2 JP 2002057220 A JP2002057220 A JP 2002057220A JP 2002057220 A JP2002057220 A JP 2002057220A JP 4103106 B2 JP4103106 B2 JP 4103106B2
- Authority
- JP
- Japan
- Prior art keywords
- groove
- polishing cloth
- region
- groove portion
- outer peripheral
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
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Description
【0001】
【発明の属する技術分野】
この発明は、半導体の製造のためなどに使用される研磨布(研磨パッド)に関するものである。
【0002】
【従来の技術】
従来より、被研磨物(ウエハ等)の平坦化処理を化学的機械的研磨加工(CMPプロセス)により行うために研磨布が使用されている。
この研磨布の表面には、被研磨物との間の研磨作業面に新たに供給されたスラリーが浸入し易くするため、同心円状(図7及び図8参照)や格子状(図9及び図10参照)、孔状(図11及び図12参照)などの溝11加工が施されている。なお図中、Cは研磨布の中心を示す。そして回転研磨時に前記溝11によりスラリーの分散を補助して被研磨物の過吸着を防止し、研磨効率を向上させることができるという利点がある。
【0003】
しかし、スラリーの分散が均一にいかず局所的に高い摩擦力が発生することがあり、ひどい場合には回転研磨中に研磨装置が振動し被研磨物が遠心力で飛び出して破損が発生することがあるという問題があった。
【0004】
【発明が解決しようとする課題】
そこでこの発明は、従来よりもスラリーを均一に分散させることができる研磨布を提供しようとするものである。
【0005】
【課題を解決するための手段】
前記課題を解決するためこの発明では次のような技術的手段を講じている。
(1)この発明の研磨布は、供給されたスラリーが分散される複数本の溝部を一定の間隔かつ一定の深さで同心円状に有する研磨布であって、溝幅の共通した複数本の溝部からなる溝部の領域を複数有してなり、各溝部の領域のうち中心側の溝部の領域は溝幅が狭く、外周側の溝部の領域は、中心側の溝部の領域と比較してその溝幅が各領域の複数の溝ごとに徐々に広がっていくように設定したことを特徴とする。
(2)供給されたスラリーが分散される複数本の溝部を一定の間隔かつ一定の深さで同心円状に有する研磨布であって、各溝部のうち中心側の溝部は溝幅が狭く、外周側の溝部は、中心側の溝部と比較してその溝幅が一つの溝ごとに段階的に広がっていくように設定しても良い。
【0006】
すなわち従来は、研磨布の中心側と外周側とで溝部はほぼ一定とされこのため研磨時には回転駆動における変移速度が相対的に遅い中心側と相対的に速い外周側とでスラリーの分散状態にばらつきが生じていたが(外周側のスラリーは中心側と比較して不足する傾向となる)、この研磨布は、回転駆動における変移速度が相対的に遅い中心側と比較して相対的に速い外周側の溝部の領域が大きく設定されたので、変移速度が相対的に速くスラリーが排出され易い外周側の溝部の領域により多くの量のスラリーを供給することができる。
【0007】
【発明の実施の形態】
以下、この発明の実施の形態を図面を参照して説明する。
(実施形態1)
この実施形態の研磨布はウレタン樹脂より成り、図1及び図2に示すように、供給されたスラリーが分散される溝部1を有すると共に、その中心C側の溝部1と比較して外周側の溝部1の領域を大きく設定している。
【0008】
前記溝部1は同心円状に形成すると共に、中心C側の溝部1と比較して外周側の溝部1の領域は徐々にその溝幅が広がっていくように設定している。すなわち前記溝部1の領域は、一番幅の狭い中心C側の3本の第1エリアX、その次の3本の第2エリアY、一番幅の広い外周側の3本の第3エリアZの3つの領域を有するように形成した。
【0009】
次に、この実施形態の研磨布の使用状態を説明する。
【0010】
従来は研磨布の中心側と外周側とで溝部の幅はほぼ一定とされこのため研磨時には回転駆動における変移速度が相対的に遅い中心側と相対的に速い外周側とでスラリーの分散状態にばらつきが生じていたが、この研磨布は、回転駆動における変移速度が相対的に遅い中心C側と比較して相対的に速い外周側の溝部1の領域が大きく設定されたので、変移速度が相対的に速くスラリーが排出され易い外周側の溝部1の領域により多くの量のスラリーを供給することができ、従来よりもスラリーを均一に分散させることができるという利点がある。
【0011】
また、スラリーの不均一な分散による研磨布とウエハとの間の過度な摩擦が減少し、装置の不要な振動の防止やウエハの破損の防止を図ることができるという利点がある。
(実施形態2)
次に、実施形態2を実施形態1との相違点を中心に説明する。
【0012】
図3及び図4に示すように、この実施形態の研磨布も同心円状の溝部1を有すると共に、中心C側の溝部1と比較して外周側の溝部1の領域は段階的にその溝幅が広がっていくように設定した。すなわち、中心C側の溝部1から外周側の溝部1の領域にかけて溝幅が1、1.1、1.2、1.3、1.4、…と、段階的に広がっていくように形成した。
(実施形態3)
次に、実施形態2を上記実施形態との相違点を中心に説明する。
【0013】
図5及び図6に示すように、この実施形態の研磨布は孔状の溝部1を有すると共に中心C側の溝部1と比較して外周側の溝部1の領域は溝部1の孔径が大きくなるように設定した。
【0014】
【発明の効果】
この発明は上述のような構成であり、次の効果を有する。
【0015】
変移速度が相対的に速くスラリーが排出され易い外周側の溝部の領域により多くの量のスラリーを供給することができるので、従来よりもスラリーを均一に分散させることができる研磨布を提供することができる。
【図面の簡単な説明】
【図1】この発明の研磨布の実施形態1を説明する平面図。
【図2】図1の研磨布の要部拡大破断斜視図。
【図3】この発明の研磨布の実施形態2を説明する平面図。
【図4】図3の研磨布の要部拡大破断斜視図。
【図5】この発明の研磨布の実施形態3を説明する平面図。
【図6】図5の研磨布の要部拡大破断斜視図。
【図7】従来の研磨布を説明する平面図。
【図8】図7の研磨布の要部拡大破断斜視図。
【図9】従来の研磨布の他の例を説明する平面図。
【図10】図9の研磨布の要部拡大破断斜視図。
【図11】従来の研磨布の更に他の例を説明する平面図。
【図12】図11の研磨布の要部拡大破断斜視図。
【符号の説明】
1 溝部
C 中心[0001]
BACKGROUND OF THE INVENTION
The present invention relates to a polishing cloth (polishing pad) used for manufacturing semiconductors.
[0002]
[Prior art]
Conventionally, a polishing cloth has been used for performing a planarization process of an object to be polished (wafer or the like) by a chemical mechanical polishing process (CMP process).
In order to make it easier for the slurry newly supplied to the polishing work surface between the polishing object to enter the surface of the polishing cloth, concentric circles (see FIGS. 7 and 8) and lattice shapes (see FIGS. 9 and 9). 10) and a hole 11 (see FIGS. 11 and 12) is provided. In the figure, C indicates the center of the polishing pad. In addition, there is an advantage that during the rotary polishing, the
[0003]
However, the dispersion of the slurry is not uniform and a high frictional force may be generated locally. In severe cases, the polishing device vibrates during rotary polishing, and the object to be polished pops out due to centrifugal force, causing damage. There was a problem that there was.
[0004]
[Problems to be solved by the invention]
Therefore, the present invention intends to provide an abrasive cloth that can disperse the slurry more uniformly than in the prior art.
[0005]
[Means for Solving the Problems]
In order to solve the above problems, the present invention takes the following technical means.
(1) A polishing cloth according to the present invention is a polishing cloth having a plurality of groove portions in which a supplied slurry is dispersed concentrically at a constant interval and a constant depth, and a plurality of grooves having a common groove width. It has a plurality of groove regions composed of groove portions, and the groove width region on the center side of each groove portion region has a narrow groove width, and the groove portion region on the outer peripheral side is smaller than the groove region on the central side. The groove width is set so as to gradually widen for each of a plurality of grooves in each region.
(2) A polishing cloth having a plurality of groove portions in which the supplied slurry is dispersed concentrically at a constant interval and with a predetermined depth, and the groove portion on the center side of each groove portion has a narrow groove width and an outer periphery. The groove portion on the side may be set so that the groove width gradually expands for each groove as compared with the groove portion on the center side.
[0006]
That is, conventionally, the groove portion is almost constant between the center side and the outer peripheral side of the polishing cloth, and therefore, during polishing, the slurry is dispersed in the center side where the transition speed in rotation driving is relatively slow and the outer peripheral side where the transition speed is relatively fast. Although there was variation (the slurry on the outer peripheral side tends to be insufficient compared to the center side), this abrasive cloth is relatively fast compared to the center side where the transition speed in rotation drive is relatively slow. Since the outer peripheral groove region is set large, a large amount of slurry can be supplied to the outer peripheral groove region where the transition speed is relatively fast and the slurry is easily discharged .
[0007]
DETAILED DESCRIPTION OF THE INVENTION
Embodiments of the present invention will be described below with reference to the drawings.
(Embodiment 1)
The polishing cloth of this embodiment is made of urethane resin, and has a
[0008]
The
[0009]
Next, the usage state of the polishing cloth of this embodiment will be described.
[0010]
Conventionally, the width of the groove portion is substantially constant between the center side and the outer peripheral side of the polishing cloth, and therefore, during polishing, the slurry is dispersed in the center side where the transition speed in rotation driving is relatively slow and the outer peripheral side where the transition speed is relatively fast. Although the variation occurred, this polishing cloth has a relatively fast transition speed in the rotational drive, and the relatively fast outer
[0011]
Further, excessive friction between the polishing cloth and the wafer due to non-uniform dispersion of the slurry is reduced, and there is an advantage that unnecessary vibration of the apparatus can be prevented and damage to the wafer can be prevented.
(Embodiment 2)
Next, the second embodiment will be described focusing on the differences from the first embodiment.
[0012]
As shown in FIGS. 3 and 4, the polishing cloth of this embodiment also has a
(Embodiment 3)
Next, the second embodiment will be described focusing on the differences from the above embodiment.
[0013]
As shown in FIG. 5 and FIG. 6, the polishing cloth of this embodiment has a hole-
[0014]
【The invention's effect】
The present invention is configured as described above and has the following effects.
[0015]
To provide a polishing cloth that can disperse slurry more uniformly than in the prior art because a larger amount of slurry can be supplied to the region of the groove on the outer peripheral side where the transition speed is relatively fast and the slurry is easily discharged. Can do.
[Brief description of the drawings]
FIG. 1 is a plan view for explaining
2 is an enlarged cutaway perspective view of a main part of the polishing cloth of FIG. 1. FIG.
FIG. 3 is a plan view for explaining a polishing cloth according to a second embodiment of the present invention.
4 is an enlarged fragmentary perspective view of the polishing cloth of FIG. 3;
FIG. 5 is a plan view for explaining a polishing cloth according to a third embodiment of the present invention.
6 is an enlarged cutaway perspective view of a main part of the polishing cloth of FIG. 5;
FIG. 7 is a plan view illustrating a conventional polishing cloth.
8 is an enlarged cutaway perspective view of a main part of the polishing pad of FIG.
FIG. 9 is a plan view illustrating another example of a conventional polishing cloth.
10 is an enlarged cutaway perspective view of a main part of the polishing pad of FIG. 9;
FIG. 11 is a plan view for explaining still another example of a conventional polishing cloth.
12 is an enlarged cutaway perspective view of a main part of the polishing pad of FIG.
[Explanation of symbols]
1 Center of groove C
Claims (2)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2002057220A JP4103106B2 (en) | 2002-03-04 | 2002-03-04 | Polishing cloth |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
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JP2002057220A JP4103106B2 (en) | 2002-03-04 | 2002-03-04 | Polishing cloth |
Publications (2)
Publication Number | Publication Date |
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JP2003260657A JP2003260657A (en) | 2003-09-16 |
JP4103106B2 true JP4103106B2 (en) | 2008-06-18 |
Family
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Application Number | Title | Priority Date | Filing Date |
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JP2002057220A Expired - Lifetime JP4103106B2 (en) | 2002-03-04 | 2002-03-04 | Polishing cloth |
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JP (1) | JP4103106B2 (en) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5222320B2 (en) * | 2010-05-25 | 2013-06-26 | 東洋ゴム工業株式会社 | Polishing pad and semiconductor device manufacturing method |
CN105252408B (en) * | 2015-11-07 | 2017-08-29 | 靖江先锋半导体科技有限公司 | A kind of hole inwall grinding and polishing fixture |
JP7113626B2 (en) * | 2018-01-12 | 2022-08-05 | ニッタ・デュポン株式会社 | polishing pad |
-
2002
- 2002-03-04 JP JP2002057220A patent/JP4103106B2/en not_active Expired - Lifetime
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JP2003260657A (en) | 2003-09-16 |
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