JP4006660B2 - Pellicle mounting structure - Google Patents

Pellicle mounting structure Download PDF

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Publication number
JP4006660B2
JP4006660B2 JP545998A JP545998A JP4006660B2 JP 4006660 B2 JP4006660 B2 JP 4006660B2 JP 545998 A JP545998 A JP 545998A JP 545998 A JP545998 A JP 545998A JP 4006660 B2 JP4006660 B2 JP 4006660B2
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Japan
Prior art keywords
pellicle
mask
adhesive
mounting
mounting structure
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JP545998A
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Japanese (ja)
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JPH11202478A (en
Inventor
博幸 舟津
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Oki Electric Industry Co Ltd
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Oki Electric Industry Co Ltd
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Description

【0001】
【発明の属する技術分野】
本発明はペリクル(pellicle)の取付構造に係り、さらに詳しくは半導体集積回路の製造工程において、マスク上のパターンを光学的に基板に形成するホトリソ(photolithography)工程で使用されて、上記のマスクに取り付けられてマスク面を覆うペリクルの取付構造に関するものである。
【0002】
【従来の技術】
図4は従来のペリクルの取付構造の要部の構成を示す説明図で、(a)は平面図、(b)は断面図、図5は従来のペリクルの取付構造の動作を示す断面図である。
図4と図5において、1はペリクル膜〔図4(a)では斜線で表示〕、2はペリクルフレーム、3はマスク、4は粘着剤、5はライナーである。ペリクル膜1とペリクルフレーム2等により、ペリクル膜1をマスク3に取り付けるペリクルUが構成されている。
【0003】
粘着剤4には、例えば両面テープのようなものが用いられる。一般に、粘着剤は発泡性樹脂等のベース材の両面に粘着剤を付け、被粘着面に貼り付けるまでは粘着剤にライナー5が添着される。添着したライナー5により、近接物との不本意な付着や粘着面に付着したゴミ等による粘着力の劣化を防止する。ペリクル1の取付用の粘着剤4においても、ペリクルフレーム2のマスク3への貼り付け前は粘着面を覆うようにライナー5が添着されている。そして、粘着剤4に添着されたライナー5を剥がしてからペリクルフレーム2を押し付けて、図5に示されたようにペリクルフレーム2が粘着剤4を介してマスク3の両面に貼り付けられるようになっている。
【0004】
【発明が解決しようとする課題】
従来のペリクルフレーム2の取付構造は、上述のように接触面の全域に亘って設けられた粘着材4の粘着面を介してペリクルフレーム2がマスク3の表面に固着されるようになっていた。したがって、図5に示すように、貼り付けるときの押圧力で、大抵は粘着剤4が横にはみ出すことになる。このため、露光装置で投射されたUV光が粘着剤4の付近に回り込んで、粘着剤4に作用してパーティクル(particle)の発生源となっていた。特に、露光用の投射光にエキシマ光( excimer laser)等のようなの短波長の光を用いた場合は、その傾向が強く転写パターンの品質が落ちて結果的にウエハーの歩留まりを低下させる等の問題点があった。
【0005】
本発明はこのような従来のペリクルフレームの取付構造の問題点を解消するために成されたもので、簡単な取付作業でパーティクルの発生がなく、しかも品質の良いウエハー基板を高い歩留まりで製作できるペリクルの取付構造を実現することを目的にしたものである。
【0006】
【課題を解決するための手段】
本発明は、ペリクルを厚さ方向の一方の面に取り付けたペリクルフレームの他方の面をマスクの取付面に接触させて、ペリクルフレームをマスクに取り付けるペリクルの取付構造において、ペリクルとペリクルフレームにそれぞれ厚さ方向を貫通して、当該ペリクルフレームをマスクの取付面に取り付けるために接着剤が注入される複数の取付孔を設けたペリクルの取付構造を構成したものである。また、本発明は、ペリクルを厚さ方向の一方の面に取り付けた2つのペリクルフレームの他方の面をマスクの両面に接触させて、2つのペリクルフレームをマスクの両側に取り付けるペリクルの取付構造において、両側の複数の取付孔をマスクに対して対称方向に傾斜して設けたペリクルの取付構造を構成したものである。さらに、取付孔の最深部に前記接着剤の溜まり部を設けたペリクルの取付構造を構成したものである。
【0007】
ペリクルを張設したペリクルフレームを、位置決めしながらマスクの表面に押し付ける。ペリクルフレームを押し付けた状態で、四隅の取付孔に次々に接着剤が注入される。注入した接着剤が取付孔内で乾燥固化して、マスクの表面にペリクルフレームが取付られる。また、垂直に立てられたマスクの両側に、ペリクルフレームが押し付けられてセットされる。そして、ベリクルフレームの両側の傾斜した取付孔に、接着剤が左右から注入されて傾斜した取付孔に沿って速やかに最深部の接着面に到達する。最深部に溜まり部が設けられていると、流れ落ちた接着剤が溜まり部に溜められてマスクの両側にペリクルフレームが取り付けられる。
【0008】
【発明の実施の形態】
次に、本発明の実施形態を、図面により説明する。
実施形態1
図1は本発明の実施形態1の要部の構成を示す説明図で、(a)は平面図、(b)は(a)のA−A断面図、(c)はB−B断面図、図2は実施形態1の動作を示す断面図である。本発明の実施形態で従来装置と同じ部分には、同一の符号を付して一部重複するがやや詳しく説明する。
【0009】
図1,2において、1はペリクル膜、2はペリクル膜1を上面に張設したほぼ方形のアルミニウム合金等からなるペリクルフレームである。ペリクル膜1にはニトロセルローズのように、光学的に安定した透明な高分子からなる薄膜が用いられている。実施形態1ではペリクル膜1とペリクルフレーム2により、ペリクルUが構成されている。3はマスクで、上下の両側にペリクルUが取り付けられている。マスク3には石英板等が用いられ、表面にパターンが形成されている。6はペリクルフレーム2の四隅に貫設された取付孔、7は取付孔6の内部に注入された接着剤である。取付孔6は孔径が一様な丸孔で、接着剤7にはエポキシ系等の液状で瞬間的に固化して接着する速乾型が適する。
【0010】
上記のような構成の本発明の実施形態1において、ペリクル膜1を張設したペリクルフレーム2を位置決めしながらマスク3の表面に押し付ける。ペリクルフレーム2を押し付けた状態で、四隅の取付孔6に次々に接着剤7を注入する。注入した接着剤7が取付孔6内で固化して、マスク3上にペリクルフレーム2が取付られる。同様にして、マスク3の裏面側にも、ペリクル膜1を張設したペリクルフレーム2が接着剤7により取り付けられる。そして、ペリクル膜1はペリクルフレーム2を介してマスク3の両側に平行方向に配置されて、ペリクルフレーム2のフレーム内を両側から包囲している。
【0011】
ペリクルフレーム2を介してマスク3の両面に平行に張設されたペリクル膜1により、マスク3に形成されたパターンの形成領域が包囲されて防塵機能が果たされるようになっている。片側又は両側にペリクルUを取り付けたマスク3は、前述のホトリソ工程の露光装置にセットされる。そして、露光装置の光源から光学系を通してUV光等がペリクル膜1とペリクルフレーム2内を通過しながらマスク3に投射されて、マスク3に形成されたパターンが透過面側に配置されたウエハー基板(不図示)上に転写されるようになっている。
【0012】
以上のように本発明の実施形態1によれば、従来のようなライナー5を使用する粘着剤4を利用しない構成となっている。そして、取付孔6に注入した接着剤7でマスク3上にペリクルフレーム2を固定するので、接着剤7がペリクルフレーム2の取付面の幅内に収まり露光時にUV光が直接接着剤7に触れることがない。したがって、従来装置のように粘着剤4の利用に基づくパーティクルの発生がなくなり、長期間安定した状態でマスク3を用いることが可能になると共に、半導体ウエハーに転写されたパターンの品質も向上して結果的にウエハーの歩留も向上することになる。
【0013】
また、上記のようにペリクルフレーム2が直接マスク3に固定される為、ペリクル膜1のマスク3に対する平行度が向上し、転写時のパターンの品質が一層向上することになる。更に、粘着剤4中のベース材はペリクルUの除去時に異物の発生の原因であり、マスク3の洗浄時の従来装置の避けることのできない問題点であった。これに対して、接着剤7を用いる本発明では粘着剤4に比べて容易に溶剤で溶かすことが可能であり、マスク3の洗浄が極めて容易になる。また、取付孔6内に注入した接着剤7の接着面積も従来より遥かに小さくなり、この点でもペリクルフレーム2の除去後の洗浄を更に容易にすることができる。
【0014】
実施形態2
図3は本発明の実施形態2の構成を示す要部の断面図で、(a)はマスクを垂直状態にした断面図、(b)は(a)の一部の拡大図である。
図3において、8は取付孔6の最深部に設けられた溜まり部、9は取付面である。実施形態2では両側のペリクルフレーム2の取付孔6が、マスク3の取付面9に対して角度θで対称的な方向に傾斜して設けられている。マスク3の両面にペリクルUを取り付けるときは、実施形態2の構成が活用される。
【0015】
このようなときは図3(a)のように、マスク3が垂直に立てて設置される。そして、垂直なマスク3の両側にベリクルフレーム2が圧接されて、傾斜した取付孔6に接着剤7が左右から注入される。注入された接着剤7は、それぞれ傾斜した取付孔6に沿って速やかに最深部の取付面9に到達する。この場合、取付孔6の形状を拡大図(b)に示すように最深部に溜まり部8が設けられていると、流れ落ちた接着剤7が溜まり部8に溜められることになる。このような構成の実施形態2によれば、マスク3の両側に同時にペリクルフレーム2を取り付けることが可能になる。よって、ペリクルフレーム2を容易且つ速やかに固着でき、ペリクルUの取付作業の効率を向上することができる。
【0016】
なお、上述の実施形態1,2ではペリクルフレームとマスクがほば方形の場合を例示して説明したが、円形や多角形等の場合にも本発明を適用することができる。また、実施形態2の図面では両側の取付孔の傾斜角θが等しい場合を示したが、全ての傾斜角を異なるように構成してもよい。さらに、取付孔の形状や接着材の種類等についても、同機能で原理的に可能な限りは必ずしも実施形態に限定するものではない。
【0017】
【発明の効果】
本発明は、ペリクルを厚さ方向の一方の面に取り付けたペリクルフレームの他方の面をマスクの取付面に接触させて、ペリクルフレームをマスクに取り付けるペリクルの取付構造において、ペリクルとペリクルフレームにそれぞれ厚さ方向を貫通して、当該ペリクルフレームをマスクの取付面に取り付けるために接着剤が注入される複数の取付孔を設けたペリクルの取付構造を構成した。また、本発明は、ペリクルを厚さ方向の一方の面に取り付けた2つのペリクルフレームの他方の面をマスクの両面に接触させて、2つのペリクルフレームをマスクの両側に取り付けるペリクルの取付構造において、両側の複数の取付孔をマスクに対して対称方向に傾斜して設けたペリクルの取付構造を構成した。さらに、取付孔の最深部に前記接着剤の溜まり部を設けたペリクルの取付構造を構成した。
【0018】
この結果、接着剤がペリクルフレームの取付面の幅内に収まり、露光時にUV光が直接接着剤に触れることがない。したがって、従来装置のように粘着剤の利用に基づくパーティクルの発生がなくなり、長期間安定した状態でマスクを用いることが可能になる。また、ペリクルフレームが直接マスクに固定される為、ペリクルのマスクに対する平行度が向上し、転写時のパターンの品質が一層向上することになる。更に、接着剤を用いる本発明では粘着剤に比べて容易に溶剤で溶かすことが可能であり、マスクの洗浄が極めて容易になる。また、取付孔内に注入した接着剤の接着面積も従来より遥かに小さくなり、この点でもペリクルフレームの除去後の洗浄を更に容易にすることができる。
【0019】
よって、本発明によれば、接着剤の注入という簡単な取付操作で、半導体装置に転写されたパターンの品質を高める等の種々の特長を備えたペリクルの取付構造を提供することができる。
【図面の簡単な説明】
【図1】本発明の実施形態1の要部の構成を示す説明図である。
【図2】実施形態1の動作を示す断面図である。
【図3】実施形態2の構成を示す要部の断面図である。
【図4】従来のペリクルの取付構造の要部の構成を示す説明図である。
【図5】従来のペリクルの取付構造の動作を示す断面図である。
【符号の説明】
1 ペリクル膜
2 ペリクルフレーム
3 マスク
4 粘着剤
5 ライナー
6 取付孔
7 接着剤
8 溜まり部
9 取付面
U ペリクル
[0001]
BACKGROUND OF THE INVENTION
The present invention relates to a pellicle mounting structure, and more particularly, in a manufacturing process of a semiconductor integrated circuit, used in a photolithography process for optically forming a pattern on a mask on a substrate. The present invention relates to a pellicle attachment structure that is attached and covers a mask surface.
[0002]
[Prior art]
4A and 4B are explanatory views showing the configuration of a main part of a conventional pellicle mounting structure, where FIG. 5A is a plan view, FIG. 5B is a cross-sectional view, and FIG. 5 is a cross-sectional view illustrating the operation of the conventional pellicle mounting structure. is there.
4 and 5, 1 is a pellicle film (indicated by hatching in FIG. 4A), 2 is a pellicle frame, 3 is a mask, 4 is an adhesive, and 5 is a liner. A pellicle U for attaching the pellicle film 1 to the mask 3 is constituted by the pellicle film 1 and the pellicle frame 2 and the like.
[0003]
For the adhesive 4, for example, a double-sided tape is used. Generally, the pressure-sensitive adhesive is attached to both sides of a base material such as a foamable resin, and the liner 5 is attached to the pressure-sensitive adhesive until it is attached to the surface to be bonded. The attached liner 5 prevents unintentional adhesion with a nearby object and deterioration of adhesive force due to dust adhering to the adhesive surface. Also in the adhesive 4 for attaching the pellicle 1, the liner 5 is attached so as to cover the adhesive surface before the pellicle frame 2 is attached to the mask 3. Then, the liner 5 attached to the adhesive 4 is peeled off, and then the pellicle frame 2 is pressed so that the pellicle frame 2 is attached to both sides of the mask 3 via the adhesive 4 as shown in FIG. It has become.
[0004]
[Problems to be solved by the invention]
In the conventional mounting structure of the pellicle frame 2, the pellicle frame 2 is fixed to the surface of the mask 3 through the adhesive surface of the adhesive material 4 provided over the entire contact surface as described above. . Therefore, as shown in FIG. 5, the pressure-sensitive adhesive 4 usually protrudes laterally due to the pressing force at the time of attachment. For this reason, the UV light projected by the exposure apparatus goes around the adhesive 4 and acts on the adhesive 4 to become a particle generation source. In particular, when short-wavelength light such as excimer laser is used as the projection light for exposure, the tendency is strong and the quality of the transfer pattern is reduced, resulting in a decrease in wafer yield. There was a problem.
[0005]
The present invention was made to solve the problems of the conventional mounting structure of the pellicle frame, and it is possible to manufacture a high-quality wafer substrate without generation of particles by a simple mounting operation. The object is to realize a pellicle mounting structure.
[0006]
[Means for Solving the Problems]
The present invention relates to a pellicle mounting structure in which a pellicle frame is attached to a mask by bringing the other surface of the pellicle frame in which the pellicle is mounted on one surface in the thickness direction into contact with the mounting surface of the mask. A pellicle mounting structure having a plurality of mounting holes through which adhesive is injected to mount the pellicle frame to the mounting surface of the mask through the thickness direction is configured. Further, the present invention provides a pellicle mounting structure in which two pellicle frames are attached to both sides of a mask by bringing the other side of the two pellicle frames in which the pellicle is attached to one side in the thickness direction into contact with both sides of the mask. A pellicle mounting structure is provided in which a plurality of mounting holes on both sides are inclined in a symmetric direction with respect to the mask. Furthermore, a pellicle mounting structure in which the adhesive reservoir is provided at the deepest part of the mounting hole is configured.
[0007]
The pellicle frame on which the pellicle is stretched is pressed against the surface of the mask while positioning. With the pellicle frame pressed, adhesive is successively injected into the mounting holes at the four corners. The injected adhesive is dried and solidified in the attachment hole, and the pellicle frame is attached to the surface of the mask. Also, the pellicle frame is pressed and set on both sides of the vertically erected mask. Then, the adhesive is injected from the left and right into the inclined mounting holes on both sides of the vericle frame, and quickly reaches the deepest bonding surface along the inclined mounting holes. When the reservoir portion is provided at the deepest portion, the adhesive that has flowed down is stored in the reservoir portion, and the pellicle frame is attached to both sides of the mask.
[0008]
DETAILED DESCRIPTION OF THE INVENTION
Next, an embodiment of the present invention will be described with reference to the drawings.
Embodiment 1
1A and 1B are explanatory views showing a configuration of a main part of Embodiment 1 of the present invention, in which FIG. 1A is a plan view, FIG. 1B is a cross-sectional view along A-A in FIG. FIG. 2 is a cross-sectional view showing the operation of the first embodiment. In the embodiment of the present invention, the same parts as those of the conventional apparatus are denoted by the same reference numerals, and a part of them will be described in detail.
[0009]
1 and 2, reference numeral 1 denotes a pellicle film, and 2 denotes a pellicle frame made of a substantially square aluminum alloy or the like with a pellicle film 1 stretched on the upper surface. As the pellicle film 1, a thin film made of an optically stable transparent polymer such as nitrocellulose is used. In the first embodiment, the pellicle U is configured by the pellicle film 1 and the pellicle frame 2. 3 is a mask, and pellicles U are attached to both upper and lower sides. A quartz plate or the like is used for the mask 3, and a pattern is formed on the surface. Reference numeral 6 denotes attachment holes penetrating the four corners of the pellicle frame 2, and 7 denotes an adhesive injected into the attachment hole 6. The mounting hole 6 is a round hole having a uniform hole diameter, and a quick-drying type in which the adhesive 7 is solidified and bonded instantaneously in a liquid such as epoxy is suitable.
[0010]
In the first embodiment of the present invention configured as described above, the pellicle frame 2 on which the pellicle film 1 is stretched is pressed against the surface of the mask 3 while being positioned. In a state where the pellicle frame 2 is pressed, adhesives 7 are injected one after another into the mounting holes 6 at the four corners. The injected adhesive 7 is solidified in the mounting hole 6 and the pellicle frame 2 is mounted on the mask 3. Similarly, the pellicle frame 2 with the pellicle film 1 stretched is attached to the back side of the mask 3 with the adhesive 7. The pellicle film 1 is arranged in parallel to both sides of the mask 3 via the pellicle frame 2, and surrounds the frame of the pellicle frame 2 from both sides.
[0011]
The pellicle film 1 stretched in parallel on both sides of the mask 3 via the pellicle frame 2 surrounds the pattern formation region formed on the mask 3 to perform a dustproof function. The mask 3 with the pellicle U attached to one side or both sides is set in the above-described exposure apparatus for the photolithography process. Then, UV light or the like is projected from the light source of the exposure apparatus through the optical system to the mask 3 while passing through the pellicle film 1 and the pellicle frame 2, and the wafer substrate on which the pattern formed on the mask 3 is arranged on the transmission surface side. The image is transferred onto (not shown).
[0012]
As described above, according to the first embodiment of the present invention, the conventional adhesive 5 using the liner 5 is not used. Then, since the pellicle frame 2 is fixed on the mask 3 with the adhesive 7 injected into the mounting hole 6, the adhesive 7 fits within the width of the mounting surface of the pellicle frame 2, and UV light directly touches the adhesive 7 during exposure. There is nothing. Therefore, the generation of particles based on the use of the pressure-sensitive adhesive 4 as in the conventional apparatus is eliminated, the mask 3 can be used in a stable state for a long time, and the quality of the pattern transferred to the semiconductor wafer is improved. As a result, the yield of the wafer is also improved.
[0013]
Further, since the pellicle frame 2 is directly fixed to the mask 3 as described above, the parallelism of the pellicle film 1 with respect to the mask 3 is improved, and the quality of the pattern at the time of transfer is further improved. Furthermore, the base material in the pressure-sensitive adhesive 4 is a cause of generation of foreign matters when the pellicle U is removed, and is a problem that cannot be avoided by the conventional apparatus when cleaning the mask 3. On the other hand, in the present invention using the adhesive 7, it can be easily dissolved with a solvent as compared with the pressure-sensitive adhesive 4, and cleaning of the mask 3 becomes extremely easy. In addition, the bonding area of the adhesive 7 injected into the mounting hole 6 is also much smaller than before, and in this respect, the cleaning after the removal of the pellicle frame 2 can be further facilitated.
[0014]
Embodiment 2
3A and 3B are cross-sectional views of the main part showing the configuration of Embodiment 2 of the present invention, in which FIG. 3A is a cross-sectional view in which the mask is in a vertical state, and FIG.
In FIG. 3, 8 is a reservoir provided at the deepest part of the attachment hole 6, and 9 is an attachment surface. In the second embodiment, the mounting holes 6 of the pellicle frames 2 on both sides are provided so as to be inclined in a symmetric direction with respect to the mounting surface 9 of the mask 3 at an angle θ. When attaching the pellicle U to both sides of the mask 3, the configuration of the second embodiment is utilized.
[0015]
In such a case, the mask 3 is placed upright as shown in FIG. Then, the vericle frame 2 is pressed against both sides of the vertical mask 3, and the adhesive 7 is injected into the inclined mounting holes 6 from the left and right. The injected adhesive 7 quickly reaches the deepest mounting surface 9 along the inclined mounting holes 6. In this case, if the reservoir 8 is provided at the deepest part as shown in the enlarged view (b) of the shape of the attachment hole 6, the adhesive 7 that has flowed down is stored in the reservoir 8. According to the second embodiment having such a configuration, the pellicle frame 2 can be attached to both sides of the mask 3 at the same time. Therefore, the pellicle frame 2 can be fixed easily and quickly, and the efficiency of the mounting operation of the pellicle U can be improved.
[0016]
In the first and second embodiments, the case where the pellicle frame and the mask are almost rectangular has been described as an example. However, the present invention can also be applied to a case where the pellicle frame and the mask are circular or polygonal. In the drawing of the second embodiment, the case where the inclination angles θ of the mounting holes on both sides are equal is shown. However, all the inclination angles may be different. Furthermore, the shape of the mounting hole, the type of the adhesive, and the like are not necessarily limited to the embodiment as long as the same function is possible in principle.
[0017]
【The invention's effect】
The present invention relates to a pellicle mounting structure in which a pellicle frame is attached to a mask by bringing the other surface of the pellicle frame in which the pellicle is mounted on one surface in the thickness direction into contact with the mounting surface of the mask. A pellicle mounting structure having a plurality of mounting holes through which adhesive is injected to mount the pellicle frame to the mounting surface of the mask through the thickness direction was configured. Further, the present invention provides a pellicle mounting structure in which two pellicle frames are attached to both sides of a mask by bringing the other side of the two pellicle frames in which the pellicle is attached to one side in the thickness direction into contact with both sides of the mask. A pellicle mounting structure is provided in which a plurality of mounting holes on both sides are inclined in a symmetrical direction with respect to the mask. Furthermore, a pellicle mounting structure in which the adhesive reservoir was provided at the deepest part of the mounting hole was constructed.
[0018]
As a result, the adhesive falls within the width of the mounting surface of the pellicle frame, and UV light does not directly touch the adhesive during exposure. Therefore, unlike the conventional apparatus, the generation of particles based on the use of the adhesive is eliminated, and the mask can be used in a stable state for a long time. Further, since the pellicle frame is directly fixed to the mask, the parallelism of the pellicle with respect to the mask is improved, and the pattern quality at the time of transfer is further improved. Furthermore, in the present invention using an adhesive, it can be easily dissolved in a solvent as compared with a pressure-sensitive adhesive, and the mask can be cleaned very easily. In addition, the bonding area of the adhesive injected into the mounting hole is much smaller than before, and in this respect, cleaning after removing the pellicle frame can be further facilitated.
[0019]
Therefore, according to the present invention, it is possible to provide a pellicle mounting structure having various features such as improving the quality of a pattern transferred to a semiconductor device by a simple mounting operation of injecting an adhesive.
[Brief description of the drawings]
FIG. 1 is an explanatory diagram illustrating a configuration of a main part of a first embodiment of the present invention.
FIG. 2 is a cross-sectional view showing the operation of the first embodiment.
FIG. 3 is a cross-sectional view of a main part showing the configuration of the second embodiment.
FIG. 4 is an explanatory view showing a configuration of a main part of a conventional pellicle mounting structure.
FIG. 5 is a cross-sectional view showing the operation of a conventional pellicle mounting structure.
[Explanation of symbols]
DESCRIPTION OF SYMBOLS 1 Pellicle film 2 Pellicle frame 3 Mask 4 Adhesive 5 Liner 6 Mounting hole 7 Adhesive 8 Pool part 9 Mounting surface U Pellicle

Claims (3)

ペリクル膜を厚さ方向の一方の面に取り付けたペリクルフレームの他方の面をマスクの取付面に接触させて、前記ペリクルフレームをマスクに取り付けるペリクルの取付構造において、
前記ペリクルフレームにそれぞれ厚さ方向を貫通して、当該ペリクルフレームを前記マスクの取付面に取り付けるために接着剤が注入される複数の取付孔を設けたことを特徴とするペリクルの取付構造。
In the pellicle mounting structure in which the other surface of the pellicle frame in which the pellicle film is mounted on one surface in the thickness direction is brought into contact with the mounting surface of the mask, and the pellicle frame is mounted on the mask.
A pellicle mounting structure characterized in that a plurality of mounting holes are provided through the pellicle frame in the thickness direction and into which an adhesive is injected to mount the pellicle frame on the mounting surface of the mask .
ペリクル膜を厚さ方向の一方の面に取り付けた2つのペリクルフレームの他方の面をマスクの両面に接触させて、前記2つのペリクルフレームをマスクの両側に取り付けるペリクルの取付構造において、
前記両側の複数の取付孔を前記マスクの取付面に対して対称方向に傾斜して設けたことを特徴とする請求項1記載のペリクルの取付構造。
In a pellicle mounting structure in which the other pellicle frame with the pellicle film mounted on one surface in the thickness direction is brought into contact with both sides of the mask, and the two pellicle frames are mounted on both sides of the mask.
2. The pellicle mounting structure according to claim 1, wherein the plurality of mounting holes on both sides are inclined in a symmetrical direction with respect to the mounting surface of the mask.
前記取付孔の最深部に前記接着剤の溜まり部を設けたことを特徴とする請求項2記載のペリクルの取付構造。  The pellicle mounting structure according to claim 2, wherein the adhesive reservoir is provided at a deepest portion of the mounting hole.
JP545998A 1998-01-14 1998-01-14 Pellicle mounting structure Expired - Fee Related JP4006660B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP545998A JP4006660B2 (en) 1998-01-14 1998-01-14 Pellicle mounting structure

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP545998A JP4006660B2 (en) 1998-01-14 1998-01-14 Pellicle mounting structure

Publications (2)

Publication Number Publication Date
JPH11202478A JPH11202478A (en) 1999-07-30
JP4006660B2 true JP4006660B2 (en) 2007-11-14

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