JP3845610B2 - Handover test method and test apparatus - Google Patents

Description

[0001]
BACKGROUND OF THE INVENTION
The present invention relates to a handover test method and a handover test apparatus that perform a handover test on a mobile terminal.
[0002]
[Prior art]
  For mobile radio communication systems of mobile terminals such as mobile phonesInAs shown in FIG. 7 (a), the mobile terminal 1 has a base station 3 having jurisdiction over a zone (area) 2 in which the mobile terminal 1 is located and the frequency F assigned to the base station 3.₁We are communicating with. When the user of the mobile terminal 1 moves to another zone 2a during a call, the base station 3a having jurisdiction over the zone 2a and the frequency F₂Communicate with. In this case, the function of maintaining the call even if the user of the mobile terminal 1 moves to another zone 2a during the call is referred to as an inter-base station handover (hand over).
[0003]
A mobile terminal test apparatus for testing various functions of the mobile terminal 1 including the inter-base station handover function described above is configured as shown in FIG.
In this mobile terminal test apparatus 4, two test signal generators 5 and 6, a transmission system evaluation unit 7, and a test control unit 8 having the same configuration are incorporated. The test signal generators 5 and 6 send test signals s to the mobile terminal 1 to be tested on behalf of the base stations 3 and 3a adjacent to each other.₁, S₂Is sent out. The transmission system evaluation unit 7 receives the response signal b from the mobile terminal 1 and evaluates the transmission function of the mobile terminal 1 based on the response signal b. The test control unit 8 controls the operation of each unit 5-7.
[0004]
  The reason why the two test signal generators 5 and 6 having the same configuration are incorporated in the mobile terminal test apparatus 4 is that the mobile terminal 1 can receive both radio waves simultaneously as shown in FIG. NaSuch as overlapping parts of zone 2 and zone 2aThis is because a state located in the region can be assumed.
[0005]
As the simplest method (hard handover test) for performing a handover test between base stations using such a mobile terminal test apparatus 4, a test is performed from one test signal generator 5 to the mobile terminal 1 to be tested. Signal s₁When the frequency F of the mobile station 1 is changed, the mobile terminal 1 accurately changes the test signal s₁Test signal s after frequency change₁The transmission system evaluation unit 7 evaluates whether or not the response signal b can be transmitted accurately.
[0006]
Further, as shown in FIG. 11, the frequency F is transmitted from one test signal generator 5 to the mobile terminal 1 to be tested.₁Test signal₁During a period during which the other test signal generator 6 transmits a frequency F to the mobile terminal 1 to be tested.₂Test signal₂To test the operation state of the mobile terminal 1 in the overlap period (soft handover test) can also be performed.
[0007]
Since the form of signals transmitted and received between the base stations 3 and 3a and the mobile terminal 1 varies depending on the communication method employed, the signal is transmitted from the test signal generators 5 and 6 to the mobile terminal 1 to be tested. Test signal s₁, S₂The signal configuration (format) may differ.
[0008]
FIG. 9 shows a W-CDMA test signal a employing a W-CDMA (Wideband Code Division Multiple Access) communication system, which is a typical communication system.₁Signal configuration (format) and GSM test signal a adopting the GSM (Global System for Mobile European mobile communication system) communication system₂The signal configuration (format) is shown.
[0009]
W-CDMA test signal a₁, The period of one frame is 10 ms, and each frame has a frequency F corresponding to each base station.₁, F₂, F_Three, ... are set. Of course, the same frequency may be set for a plurality of consecutive frames.
[0010]
Meanwhile, the GSM test signal a₂In each frame, the period of one frame is 4.62 ms, and in each frame, eight slots each having a period of 0.577 ms are set. If necessary, each slot corresponds to a channel. The frequency is set. The GSM test signal a₂Changes in the frequency in each slot are collectively changed for each frame.
[0011]
  On the other hand, as shown in FIG. 7B, a mobile having a function of performing communication with the W-CDMA base station 9 using the W-CDMA communication method and a function of performing communication with the GSM base station 9a using the GSM communication method. The terminal 1a is being developed. In the mobile terminal 1a having such a function, when the mobile terminal 1a moves from the zone 11 of the W-CDMA base station 9 to the zone 11a of the GSM base station 9a, the communication continues normally between the systems.HandoverIt is necessary to carry out this test.
[0012]
  In the mobile terminal test apparatus 4 shown in FIG.Handover10, for example, as shown in FIG. 10, the W-CDMA test signal a is sent from one test signal generator 5, for example.₁When a GSM change interrupt is input during transmission to the mobile terminal 1a, the W-CDMA test signal a transmitted from the test signal generator 5 to the mobile terminal 1a from this time point is received.₁GSM test signal a₂Change to (hardHandovertest).
[0013]
As shown in FIG. 11, the W-CDMA test signal a is sent from one test signal generator 5.₁Is transmitted from the other test signal generator 6 to the GSM test signal a.₂Can also be implemented as a soft handover test for starting transmission of the message to the mobile terminal 1a.
[0014]
[Problems to be solved by the invention]
However, the mobile terminal test apparatus 4 that performs the handbar test shown in FIG. 8 still has the following problems to be solved.
[0015]
  As described above, the W-CDMA test signal a shown in FIG.₁And GSM test signal a₂The test signal generators 5 and 6 shown in FIG.₁, A₂Carrier wave generating circuit for generating a carrier wave and a test signal a to be output₁, A₂An attenuator for setting the signal level to a predetermined level is incorporated. For example, the carrier wave generation circuit is composed of a plurality of frequency dividers for obtaining a specified frequency from the frequency of the reference signal. The test control unit 8 then sends a test signal a₁, A₂When the frequency F to be incorporated into is determined,Test signal a ₁ , A ₂ So that the carrier wave has a frequency FSet frequency data D set for each frequency divider_FIs calculated and set in each frequency divider of the carrier wave generation circuit.
[0016]
Similarly, the test control unit 8 sends the test signal a₁, A₂When the frequency F to be incorporated into the signal is determined, the test signal a of the carrier wave of this frequency F₁, A₂Set attenuation amount data D set in the attenuator so that the output signal level of the signal becomes a predetermined signal level._AIs calculated and set to the attenuator.
[0017]
  Thus, the test signal a₁, A₂When the frequency F to be incorporated into is determined,Test signal a ₁ , A ₂ ofSet frequency data D_FAnd set attenuation data D_AAnd then, this calculated set frequency data D_FAnd set attenuation data D_AIs set to one or both of the test signal generators 5 and 6.
[0018]
In the test control unit 8 constituted by a computer, for example,
Set frequency data D_FTime to calculate 0.663ms
Set frequency data D_FSetting time 0.252ms
Set attenuation data D_ATime to calculate 0.046ms
Set attenuation data D_ATime to set 0.176ms
A total of 1.137 ms is required.
[0019]
This one frequency F is used as the test signal a.₁, A₂And the minimum time (1.137 ms) required to set the W-CDMA test signal a in FIG.₁And GSM test signal a₂Compare with W-CDMA test signal a₁In this case, since the minimum time (1.137 ms) described above is shorter than the 10 ms period of one frame, which is the minimum time unit for frequency setting, the frequency F input in one frame is changed to the W-CDMA test signal a.₁Can be incorporated into
[0020]
However, the GSM test signal a₂, The minimum time (1.137 ms) described above is longer than 0.577 ms for one slot, which is the minimum time unit for frequency setting, so the frequency F input in one slot is used as the GSM test signal a.₂There is a problem that can not be incorporated into.
[0021]
Note that the high-speed test control unit 8 may be employed to increase the calculation processing speed. However, if the high-speed test control unit 8 is employed, the manufacturing cost of the entire test apparatus is significantly increased.
[0022]
The present invention has been made in view of such circumstances, and by shifting the calculation timing of the set frequency data and the set attenuation amount data and the set timing of the set frequency data and the set attenuation amount data, the calculation processing speed is reduced. An object of the present invention is to provide a handover test method and a handover test apparatus capable of accurately performing a handover test for a mobile terminal adopting the GSM communication system without increasing.
[0023]
[Means for Solving the Problems]
The present invention implements a handover test between GSM base stations by sending a GSM test signal in which the frequency of each slot changes to a mobile terminal communicating with the GSM base station using the GSM communication system. Applied to the handover test method.
[0024]
  In order to solve the above problem, in the handover test method of the present invention, the GSM test signalInput in synchronization with the GSM frame interrupt signal input for each frame inThis GSM frequency change request is input in response to a GSM frequency change request specifying the frequency of each slot.WasWithin the frame, set frequency data for obtaining a specified frequency and set attenuation data for obtaining a predetermined output signal level are calculated. After that, GSM frequency change request is inputWasIn synchronization with each slot in the next frame of the frame, the set frequency data and set attenuation amount data of the calculated slot are set in the carrier wave generation circuit and the attenuator of the test signal generator.
[0025]
In the handover test method configured as described above, when a GSM frequency change request is input, set frequency data and set attenuation data for each frequency set in each slot are calculated in this frame.
[0026]
Then, in synchronization with each slot of the next frame of this frame, setting processing for the test signal generation unit of the set frequency data and the set attenuation data calculated in the previous frame is performed. Since the time required for setting the calculated set frequency data and set attenuation amount data is sufficiently shorter than the slot period, it is possible to sufficiently set each frequency in each slot of the GSM test signal. Note that the calculation time of the set frequency data and the set attenuation amount data for each frequency set in each slot is sufficiently shorter than the cycle of one frame, so that sufficient processing can be performed within one frame.
[0027]
  Yet another invention communicates with a GSM base station using the GSM communication method.Means andCommunicates with W-CDMA base station using W-CDMA communication methodWith meansSending a GSM test signal whose frequency of each slot changes to the mobile terminalbyHandover between GSM base stationsTest,Changing the GSM test signal sent to the mobile terminal to a W-CDMA test signalFrom GSM communication system to W-CDMA communication systemInter-system handover testAnd selectivelyApplies to the implemented handover test method.
[0028]
  In order to solve the above problem, when performing a handover test between GSM base stations,Input in synchronization with the GSM frame interrupt signal input for each frame inThis GSM frequency change request is input in response to a GSM frequency change request specifying the frequency of each slot.WasWithin the frame, set frequency data for obtaining a specified frequency and set attenuation data for obtaining a predetermined output signal level are calculated, and a GSM frequency change request is input.WasSynchronously with each slot in the next frame of the frame, set the set frequency data and set attenuation data of the corresponding slot to the carrier wave generation circuit and attenuator of the test signal generatorTo do.
[0030]
In the handover test method having such a configuration, a good GSM inter-base station handover test in the above-described invention in the GSM communication system can be performed.
[0032]
  In another invention, communication is performed with a GSM base station using the GSM communication method.Means andCommunicates with W-CDMA base station using W-CDMA communication methodHave meansTo send a GSM test signal whose frequency of each slot changes to the mobile terminalAccordingGSM inter-base station handover testWhen,Changing the W-CDMA test signal transmitted to the mobile terminal to a GSM test signalFrom W-CDMA communication system to GSM communication systemInter-system handover testAnd selectivelyApplies to the implemented handover test method.
[0033]
  AndWhen performing a GSM inter-base station handover test,GSM test signalInput in synchronization with the GSM frame interrupt signal input for each frame inThis GSM frequency change request is input in response to a GSM frequency change request specifying the frequency of each slot.WasWithin the frame, set frequency data for obtaining a specified frequency and set attenuation data for obtaining a predetermined output signal level are calculated. And a GSM frequency change request is inputWasIn synchronization with each slot in the next frame of the frame, the set frequency data and set attenuation amount data of the calculated slot are set in the carrier wave generation circuit and the attenuator of the test signal generator.
[0034]
  In the handover test method configured as described above, a good GSM inter-station handover test in the above-described invention in the GSM communication system is performed.Can be implemented.
[0035]
Yet another invention provides a GSM base station handover test by sending a GSM test signal in which the frequency of each slot changes to a mobile terminal that communicates with a GSM base station using the GSM communication system. Is a handover test apparatus that implements
[0036]
  And GSM test signalA frame generation circuit for inputting a GSM frame interrupt signal for each frame, and in synchronization with the GSM frame interrupt signalGSM frequency change request specifying the frequency of each slotSendDoTest condition input sectionWhen,From the test condition input sectionGSM frequency change request is inputWasWithin a frame, set frequency data for obtaining a specified frequency and set attenuation data for obtaining a predetermined output signal level are calculated.Arithmetic control unitThe set frequency data and the set attenuation amount data of the calculated slot are set in the carrier wave generation circuit and the attenuator in synchronization with each slot in the next frame of the frame in which the GSM frequency change request is input,A test signal sending unit for sending a GSM test signal having a specified frequency and a predetermined signal level to a mobile terminal;It has.
[0037]
DETAILED DESCRIPTION OF THE INVENTION
Hereinafter, an embodiment of the present invention will be described with reference to the drawings.
[0038]
FIG. 1 is a block diagram showing a schematic configuration of a mobile terminal test apparatus in which a handover test method and a handover test apparatus according to an embodiment of the present invention are incorporated. The same parts as those in FIGS. 7, 8, and 9 are denoted by the same reference numerals, and detailed description of the overlapping parts is omitted.
[0039]
In this mobile terminal test apparatus 12, there are two test signal generators 13 and 14, transmission system evaluation unit 15, calculation control unit 17, test result evaluation unit 18, test condition input unit 19, and display device 20 having the same configuration. It is incorporated.
[0040]
One test signal generator 13 generates a W-CDMA test signal a shown in FIG.₁Or GSM test signal a₂Test signal s to mobile terminal 1a that can communicate using the GSM communication system and W-CDMA communication system to be tested.₁Send out as The other test signal generation unit 14 is connected to the W-CDMA test signal a shown in FIG.₁Or GSM test signal a₂To the test target mobile terminal 1a.₂Send out as
[0041]
The transmission system evaluation unit 15 receives the response signal b from the mobile terminal 1a, and evaluates the transmission function of the mobile terminal 1a based on the response signal b. The test result evaluation unit 18 evaluates the inter-base station handover function and the inter-system handover function of the mobile terminal 1a using the transmission function evaluation received from the transmission system evaluation unit 15, and displays the evaluation result on the display 20. .
[0042]
  For example, the test condition input unit 19 composed of a personal computer (PC) designates a GSM frequency change request specifying a frequency, a change request to a W-CDMA test signal specifying a frequency, and a frequency input by an operator. Request to change the GSM test signal to the arithmetic processing unit 17In sync withSend it out.
[0043]
  The arithmetic processing unit 17 composed of a computer is set in each of the test signal generators 13 and 14 based on a GSM frequency change request, a change request to a W-CDMA test signal, and a change request to a GSM test signal specifying a frequency. Setting tofrequencyData D_FW, D_FG,SettingAttenuationData D_{AW ,}D_AGIs calculated and set in each of the test signal generators 13 and 14.
[0044]
FIG. 2 is a detailed block diagram showing an essential part of the mobile terminal test apparatus 12 of FIG.
Each test signal generator 13, 14 includes a test signal transmitter 21 and an RF controller 22. In the RF control unit 22, a frame generation circuit 23, a test data memory 24, a set frequency data memory 25, and a set attenuation data memory 26 are formed.
[0045]
Then, the frame generation circuit 23 receives the W-CDMA test signal a shown in FIG.₁Frame of 10 ms period, or GMS test signal a₂8 slots of 0.577 ms are incorporated to generate a frame having a period of 4.62 ms. Which signal a₁, A₂Whether to generate the next frame is based on an instruction from the test condition input unit 19.
[0046]
In the test data memory 24, the W-CDMA test signal a₁Test data composed of, for example, a PN code string and GMS test signal a₂Test data consisting of, for example, a PN code string to be incorporated into each slot is stored.
[0047]
In the set frequency data memory 25, the W-CDMA test signal a calculated by the arithmetic control unit 17 is stored.₁Set frequency data D_FWOr the GMS test signal a calculated by the arithmetic control unit 17₂Frequency data D for each slot_FGIs temporarily stored.
[0048]
In the set attenuation data memory 26, the W-CDMA test signal a calculated by the arithmetic control unit 17 is stored.₁Set attenuation data D_AWOr the GMS test signal a calculated by the arithmetic control unit 17₂Set attenuation data D for each slot_AGIs temporarily stored.
[0049]
  The test signal generators 13 and 14 are connected to the W-CDMA test signal a by the test condition input unit 19 (calculation control unit 17).₁In the test signal sending unit 21, the test data read from the test data memory 24 is transferred to the frame built-in circuit 27.InIt is incorporated into a frame of 10 ms period output from the frame generation circuit 23 and sent to the mixer 28.
[0050]
The mixer 28 modulates the carrier signal of the frequency F output from the carrier generation circuit 29 with the signal input from the frame incorporation circuit 27 and sends it to the attenuator (ATT) 30. The attenuator (ATT) 30 adjusts the signal level of the input modulation signal to a predetermined level, so that the W-CDMA test signal a₁Is sent from the output terminal 31 to the mobile terminal 1a being tested.
[0051]
The frequency F of the carrier wave signal output from the carrier wave generation circuit 29 is read from the set frequency data memory 25 and set frequency data D set._FWDetermined by Further, the attenuation amount 30 of the attenuator (ATT) is set from the set attenuation amount data D read out from the set attenuation amount data memory 26 and set._AWDetermined by
[0052]
  On the other hand, the test signal generators 13 and 14 are connected to the GSM test signal a by the test condition input unit 19 (calculation control unit 17).₂Specified to sendIf the testIn the signal transmission unit 21, the test data read from the test data memory 24 is incorporated into each slot of 0.577 ms in the frame of the 4.62 ms cycle output from the frame generation circuit 23 in the frame incorporation circuit 27. 28.
[0053]
The mixer 28 modulates the carrier signal of the frequency F for each slot output from the carrier generation circuit 29 with the signal input from the frame built-in circuit 27 and sends the modulated signal to an attenuator (ATT) 30. The attenuator (ATT) 30 adjusts the signal level of the input modulation signal to a predetermined level, and the GSM test signal a₂Is sent from the output terminal 31 to the mobile terminal 1a being tested.
[0054]
The frequency F for each slot of the carrier signal output from the carrier generation circuit 29 is read from the set frequency data memory 25 and set frequency data D for each slot set for each slot._FGDetermined by The attenuation amount for each slot of the attenuator (ATT) 30 is read from the set attenuation amount data memory 26 and set attenuation amount data D of each slot set for each slot._AGDetermined by
[0055]
  The arithmetic control unit 17 includes test signal generators 13 and 14 that receive W-CDMA test signals a.₁During the output periodAnywayThe W-CDMA frame interrupt signal is input from the frame generation circuit 23 every 10 ms. Further, the arithmetic control unit 17 includes test signal generators 13 and 14 that receive the GSM test signal a.₂During the output periodAnywayThe GSM frame interrupt signal every 4.62 ms and the GSM slot interrupt signal every 0.577 ms are input from the frame generation circuit 23.
[0056]
  In addition, a GSM frequency change request designating each slot and each frequency F is input to the arithmetic control unit 17 from the test condition input unit 19 in synchronization with the GSM frame interrupt signal as required.
  Further, the calculation control unit 17 has a test condition input unit 19 as required.In inter-system handover from GSM communication system to W-CDMA communication systemW-CDMA test signal a specifying frequency F₁Request to change toIn inter-system handover from W-CDMA communication system to GSM communication systemGSM test signal a specifying frequency F₂A change request to is entered.
[0057]
As shown in FIG. 3, the mobile terminal test apparatus 12 has
(1) Handover tests between GSM base stations, between W-CDMA / GSM systems, and between GSM / W-CDMA systems using only one test signal generator 13 (hard handover test)
(2) GSM base station handover test using both test signal generators 13 and 14 (soft handover test)
(3) Inter-system handover test between GSM / W-CDMA systems and between W-CDMA / GSM systems using both test signal generators 13 and 14 (soft handover test)
Can be implemented.
[0058]
Here, in order to simplify the description, the processing procedure of the inter-GSM base station and inter-system handover test (hard handover test) using only one test signal generator 13 of (1) will be described.
[0059]
In this case, the arithmetic control unit 17 performs an interrupt process according to the flowchart of FIG.
[0060]
  At S1,When a GSM frame interrupt signal is input from the frame generation circuit 23, Test condition input unit 19From thisGSM frame interrupt signalSynchronizedGSM frequency change request specifying each slot and each frequency FEnteredIn this case (S2), this slot and frequency F are temporarily stored in its own designated memory (S3), and the change instruction flag is set to 1 (S4). In S2, a GSM frequency change request is issued.inputIf not, do nothing.
[0061]
Before describing the interrupt process performed by the arithmetic control unit 17 when the GSM slot interrupt signal in FIG. 4 is input, the main calculation process performed by the arithmetic control unit 17 will be described with reference to FIG.
[0062]
When the change instruction flag = 1 set in S4 of the interrupt process is detected in Q1, each slot and each frequency F written in its designated memory are read, and the set frequency data D of each slot is read._FG(Q2), and the calculated set frequency data D of each slot_FGIs written into the set frequency data memory 25 of the RF controller 22 of the test signal generator 13 (Q3). Further, each slot and each frequency F written in its designated memory are read, and set attenuation amount data D of each slot is read out._AGIs calculated (Q4), and the calculated set attenuation amount data D of each slot is calculated._AGIs written into the set attenuation data memory 26 of the RF controller 22 of the test signal generator 13 (Q5).
[0063]
Thereafter, the setting flag of the slot in which the frequency F is set is set to 1 (Q6). Further, the setting flag of the slot where the frequency F is not set is canceled to 0 (Q7). Finally, the change instruction flag is cleared to 0 (Q8).
[0064]
As described above, the arithmetic control unit 17 does not perform the interrupt process but the main calculation process in the GSM test signal a.₂Set frequency data D of frequency F set in each slot_FGAnd set attenuation data D_AGIs calculated.
[0065]
Then, when a GSM slot interrupt signal is input in S5 in the flowchart of FIG. 4, if the setting flag of the corresponding slot is set to 1 in S6, the RF controller 22 of the test signal generator 13 Set frequency data D of the corresponding slot in the set frequency data memory 25_FGIs set in the carrier wave generation circuit 29 of the test signal transmission unit 21 (S7). Further, the set frequency data D of the corresponding slot in the set attenuation data memory 26 of the RF controller 22 of the test signal generator 13._FGIs set in the attenuator (ATT) 30 of the test signal transmission unit 21 (S8).
[0066]
If the setting flag of the corresponding slot is not set to 1 in S6, it is determined that there is no need to set the frequency F because no test data is set in the corresponding slot, and nothing is done. .
[0067]
  Of FIG.Regarding interrupt processingIn S9 in the flowchart,Synchronously with W-CDMA frame interrupt, W-CDMA test signal a₁Specified frequency F toChange interrupt signalIs input from the frequency F to the set frequency data D described above._FWIs calculated and written into the set frequency data memory 25 of the RF controller 22 of the test signal generator 13 (S10). Further, the set attenuation data D described above_AWIs calculated and written into the set attenuation data memory 26 of the RF controller 22 (S11).
[0068]
  In this embodiment, since the handover test between W-CDMA base stations is not performed, in the flowchart of FIG. 4, when a W-CDMA frame interrupt signal is input (S13), the frequency is changed. Need to changeWithout setting frequency data D of frequency F _FW And set attenuation data D _AW Is not calculated,Setting frequency data D stored in the setting frequency data memory 25_FWIs set in the carrier wave generation circuit 29 of the test signal transmission unit 21 and the set attenuation data D stored in the set attenuation data memory 26 is set._AWIs set in the attenuator (ATT) 30 of the test signal transmission unit 21 (S12).
[0069]
In the case of carrying out the inter-GSM base station and inter-system handover test (hard handover test) using only one of the test signal generators (1) described above in the mobile terminal test apparatus 12 configured as described above. GSM test signal a₂, W-CDMA test signal a₁The timing of each interrupt signal, each interrupt process, and the main process when creating the data is shown in the time chart of FIG.
[0070]
  For example, the test signal generator 13 generates a GSM test signal a₂OutputDuring the period,Time t₁, T₂, T_Three, T_Four,..., A GSM frame interrupt signal (GSMF) is input, and eight GSM slot interrupt signals are input between one GSM frame interrupt signal and the next GSM frame interrupt signal. And time t₂The frequency change request is synchronized with the GSM frame interrupt signal.EnteredAnd
[0071]
  Each time each GSM slot interrupt signal is input, the set frequency data D of the corresponding slot in the set frequency data memory 25 and the set attenuation data memory 26_FGAnd set attenuation data D_AGAre set to the carrier wave generation circuit 29 and the attenuator (ATT) 30. And time t₂The frequency change request is synchronized with the GSM frame interrupt signal.EnteredThenslotAnd the frequency F are temporarily stored in the designated memory.
[0072]
Then, time t₂Then, the main calculation process is started, and the set frequency data D of each slot designated to change the frequency_FGAnd set attenuation data D_AGIs calculated and written to the set frequency data memory 25 and the set attenuation data memory 26. The set frequency data D_FGAnd set attenuation data D_AGIs calculated and written at time t₂To time t_ThreeComplete within 1 GSM frame period.
[0073]
Therefore, time t_ThreeAfter the GSM frame interrupt signal, the GSM test signal a in which the changed frequency F is set in the designated slot in synchronization with each GSM slot interrupt signal₂Is started to be sent from the test signal generator 13 to the mobile terminal 1a to be tested. Therefore, the mobile terminal test apparatus 12 can perform the GSM base station handover test.
[0074]
  Time t_FiveW-CDMA test signal a₁Change interrupt signal specifying frequency F(W-CDMA change)Is input from the test signal generator 13 to the W-CDMA test signal a.₁Is output from the mobile terminal test apparatus 12 to the mobile terminal 1a to be tested, the GSM test signal a₂To W-CDMA test signal a₁Changed to Therefore, the mobile terminal test apparatus 12 can perform an inter-system handover test.
[0075]
That is, the W-CDMA test signal a₁When the change interrupt signal designating the frequency F is input to the set frequency data D using the designated frequency F_FWAnd set attenuation data D_AWIs calculated and written to the set frequency data memory 25 and the set attenuation data memory 26. Further, the set frequency data D of the set frequency data memory 25 and the set attenuation data memory 26_FWAnd set attenuation data D_AWAre set to the carrier wave generation circuit 29 and the attenuator (ATT) 30.
[0076]
The W-CDMA test signal a₁In the output period, the set frequency data D of the set frequency data memory 25 and the set attenuation data memory 26 are synchronized with the W-CDMA frame interrupt signal._FWAnd set attenuation data D_AWAre set to the carrier wave generation circuit 29 and the attenuator (ATT) 30.
[0077]
The set frequency data D_FGAnd set attenuation data D_AGCalculation, writing, and setting processing are performed at time t._FiveTo time t₆It is completed within 1W-CDMA frame period.
[0078]
As described above, when the GSM communication system handover test is performed in the mobile terminal 1a having the function of performing communication using the W-CDMA communication system and the function of performing communication using the GSM communication system, Frequency data D_FGAnd set attenuation data D_AGAnd the set frequency data D after the calculation_FGAnd set attenuation data D_AGIs different from the set frame.
[0079]
On the other hand, when the inter-system handover test from the GSM base station to the W-CDMA base station is performed, the W-CDMA test signal a₁Frequency data D required for_FWAnd set attenuation data D_AWAnd set frequency data D_FWAnd set attenuation data D_AWAre executed in the same frame.
[0080]
Note that the W-CDMA test signal a in the time chart of FIG.₁At time t during the output period₆Thereafter, when a GSM frame interrupt signal designating the frequency F is input, the GSM test signal a₂The test signal generator 13 receives the W-CDMA test signal a.₁Instead of GSM test signal a₂Therefore, the inter-system handover test from the W-CDMA base station to the GSM base station is performed.
[0081]
Therefore, the GSM inter-base station handover test and the inter-system handover test can be satisfactorily performed.
[0082]
It should be noted that both test signals s shown in the above (2) and (3) using both test signal generators 13 and 14 are used.₁, S₂The soft handover test including the overlapping period in which the two are simultaneously output can also be performed by the above-described test procedure.
[0083]
【The invention's effect】
  As described above, in the handover test method and the handover test apparatus of the present invention,According to GSM communication systemThe calculation timing of the set frequency data and the set attenuation data is shifted from the setting timing of the set frequency data and the set attenuation data. Therefore, it is possible to accurately perform a handover test for a mobile terminal adopting the GSM communication method without increasing the calculation processing speed.
[Brief description of the drawings]
FIG. 1 is a block diagram showing a schematic configuration of a mobile terminal test apparatus incorporating a handover test method and a handover test apparatus according to an embodiment of the present invention.
FIG. 2 is a detailed block diagram showing an essential part of the mobile terminal test apparatus according to the embodiment.
FIG. 3 is a diagram showing types of handover tests that can be performed by the mobile terminal test apparatus of the embodiment;
FIG. 4 is a flowchart showing an interrupt processing operation of an arithmetic control unit in the mobile terminal test apparatus of the embodiment;
FIG. 5 is a flowchart showing a main processing operation of an arithmetic control unit in the mobile terminal test apparatus of the embodiment;
FIG. 6 is a time chart showing the operation of the mobile terminal test apparatus according to the embodiment;
FIG. 7 is a diagram for explaining handover
FIG. 8 is a block diagram showing a schematic configuration of a conventional mobile terminal test apparatus.
FIG. 9 is a diagram illustrating a format of each test signal for performing a handover test.
FIG. 10 is a diagram showing a format of a test signal for performing an inter-system handover test
FIG. 11 is a diagram showing a handover test method using both test signal generators.
[Explanation of symbols]
  1a: Mobile terminal
  12 ... Mobile terminal test equipment
  13, 14 ...Test signal generator
  15 ... Transmitting system evaluation section
  17 ... Calculation control unit
  19 ... Test condition input section
  21 ... Test signal sending part
  22 ... RF control unit
  23. Frame generation circuit
  24 ... Test data memory
  25 ... Setting frequency data memory
  26: Set attenuation data memory
  29 ... Carrier wave generation circuit
  30 ... Attenuator (ATT)

Claims (4)

A handover test for performing a handover test between GSM base stations by sending a GSM test signal in which the frequency of each slot changes to a mobile terminal that communicates with the GSM base station using the GSM communication system In the method
In response to a GSM frequency change request specifying the frequency of each slot inputted in synchronization with the GSM frame interrupt signal inputted for each frame in the GSM test signal, the GSM frequency change request is inputted in the frame. In the above, calculating the set frequency data for obtaining the specified frequency and the set attenuation data for obtaining a predetermined output signal level,
Synchronously with each slot in the next frame of the frame in which the GSM frequency change request is input, set the set frequency data and set attenuation data of the corresponding slot in the carrier wave generation circuit and attenuator of the test signal generator A handover test method characterized by: The mobile terminal having means for communicating using the W-CDMA communication method between the means and the W-CDMA base station that performs communication using the GSM communication method with a GSM base station, each slot and hand-over study between GSM base station by sending a GSM test signal whose frequency varies in the GSM communication system by changing the GSM test signal being sent to the mobile terminal to the W-CDMA test signal In a handover test method for selectively performing an inter-system handover test from a system to the W-CDMA communication system ,
When performing the GSM base station handover test,
In response to a GSM frequency change request specifying the frequency of each slot inputted in synchronization with the GSM frame interrupt signal inputted for each frame in the GSM test signal, the GSM frequency change request is inputted in the frame. And calculating the set frequency data for obtaining the specified frequency and the set attenuation data for obtaining a predetermined output signal level,
Synchronously with each slot in the next frame of the frame in which the GSM frequency change request is input, set the set frequency data and set attenuation data of the corresponding slot in the carrier wave generation circuit and attenuator of the test signal generator A handover test method characterized by: The mobile terminal having means for communicating with the W-CDMA communication system with the means communicating with the W-CDMA base station using a GSM communication method with a GSM base station, each slot wherein by changing the handover test between GSM base station by sending a GSM test signal whose frequency varies, the W-CDMA test signal is sent to the mobile terminal to the GSM test signal W- In a handover test method for selectively performing an inter-system handover test from a CDMA communication system to the GSM communication system ,
When performing the GSM base station handover test,
In response to a GSM frequency change request specifying the frequency of each slot inputted in synchronization with the GSM frame interrupt signal inputted for each frame in the GSM test signal, the GSM frequency change request is inputted in the frame. In the above, calculating the set frequency data for obtaining the specified frequency and the set attenuation data for obtaining a predetermined output signal level,
Synchronously with each slot in the next frame of the frame in which the GSM frequency change request is input, set the set frequency data and set attenuation data of the corresponding slot in the carrier wave generation circuit and attenuator of the test signal generator A handover test method characterized by: A handover test for performing a handover test between GSM base stations by sending a GSM test signal in which the frequency of each slot changes to a mobile terminal that communicates with the GSM base station using the GSM communication system In the device
A frame generation circuit (23) for inputting a GSM frame interrupt signal (GSMF) for each frame in the GSM test signal ;
A test condition input unit (19) for sending a GSM frequency change request designating the frequency of each slot in synchronization with the GSM frame interrupt signal ;
An operation for calculating set frequency data for obtaining the designated frequency and set attenuation data for obtaining a predetermined output signal level within a frame in which the GSM frequency change request from the test condition input unit is input. A control unit (17) ;
The GSM frequency change request in synchronization with each slot in the next frame of the frame input, set frequency data of the calculated corresponding slot (D _FG) and set the attenuation data (D _AG) a carrier wave generating circuit (29 ) And an attenuator (30), and a test signal sending unit (21) for sending a GSM test signal having the designated frequency and a predetermined signal level to the mobile terminal . A handover test apparatus.

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