JP3731306B2 - Optical axis inspection instrument and optical axis inspection method using the same - Google Patents
Optical axis inspection instrument and optical axis inspection method using the same Download PDFInfo
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- JP3731306B2 JP3731306B2 JP22506597A JP22506597A JP3731306B2 JP 3731306 B2 JP3731306 B2 JP 3731306B2 JP 22506597 A JP22506597 A JP 22506597A JP 22506597 A JP22506597 A JP 22506597A JP 3731306 B2 JP3731306 B2 JP 3731306B2
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【０００１】
【発明の属する技術分野】
本発明は、光学軸検査器具およびそれを用いた光学軸検査方法に関する。
【０００２】
【従来の技術】
位相差板は光学素子として有用であり、例えば液晶表示装置などに用いられている。
かかる位相差板の光学軸（進相軸または遅相軸）の方向は重要であり、位相差板を液晶表示装置に組込む際には、その光学軸の方向を確認する必要がある。特に最近の液晶表示装置に組込まれる位相差板は、その光学軸の精度が要求されており、光学軸がわずかでもずれていては、液晶表示装置の目的とする性能が確保できないため、精度のよい光学軸の検査方法が必要である。
【０００３】
従来から、位相差板の光学軸の検査方法としては、例えば検査したい位相差板（以下、位相差板試料と称する。）を、光学軸が互いに直交する２枚の偏光板の間に透過光量が最大または最小となるように重ね合せる方法が知られている。しかし、かかる方法によってわずかな光学軸のずれを検出するには、目視による透過光量の比較では精度が低い。そこで、通常は光電子増倍管などを用いて透過光量が比較されるが、光電子増倍管は高価であり、かつ複雑な操作を必要とするため、安価かつ簡便に組み立てられ、しかも精度よく位相差板の光学軸を検査できる器具の開発が望まれていた。
【０００４】
【発明が解決しようとする課題】
そこで、本発明者らは、安価かつ簡便に組み立てられ、しかも精度よく光学軸を検査し得る器具を開発するべく鋭意検討した結果、二つの偏光板を並列的にその光学軸が特定の方向になるように配置し、該二つの偏光板と、特定方向の光学軸を有する第３の偏光板との間に位相差板試料を載置し得るように構成された光学軸検査器具は、目視によっても精度よく位相差板の光学軸の検査を行い得ることを見出し、本発明に至った。
【０００５】
【課題を解決するための手段】
すなわち本発明は、光透過板の上に、基準線に対してその光学軸が平行な第一基準偏光板および該基準線に対してその光学軸が直交する第二基準偏光板が配置され、かつ第三基準偏光板が、第一基準偏光板および第二基準偏光板と重ね合せた際にその光学軸が基準線に対して４５°の方向となるように第一基準偏光板および第二基準偏光板と重ね合せ可能に設けられてなることを特徴とする光学軸検査器具を提供するものである。
【０００６】
【発明の実施の形態】
以下、本発明をより詳細に説明する。
本発明の光学軸検査器具の一例を図１に示す。
光透過板（１）は、例えばアクリル板、ポリカーボネート板、塩化ビニル板などの通常の合成樹脂板であってもよいし、ガラス板であってもよい。かかる光透過板の厚みは、その材質にもよるが、強度および取扱いの容易さの点で通常は１〜１０ｍｍ程度である。光透過板は透明板であってもよいが、検査における疲労が少ない点で、光拡散板であることが好ましい。光拡散板としては、例えば酸化ケイ素、酸化アルミニウムなどの無機フィラーが混合された合成樹脂板や、曇ガラスなどが挙げられる。また、光透過板は、顔料、染料などによって着色されていてもよい。
検査に際して光学軸検査器具は通常、その下からバックライトなどによって照明される。バックライトは、例えば蛍光灯、自然光、白熱電灯など何れであってもよい。
【０００７】
かかる光透過板（１）の上には、第一基準偏光板（２）と第二基準偏光板（３）とが配置されている。
第一基準偏光板（２）と第二基準偏光板（３）とは、光透過板（１）の上で並列的に配置され、実質的に互いに重なり合うことがないように配置されるが、検査に支障のない範囲で重なり合う部分があってもよい。第一基準偏光板の光学軸（４）は基準線（６）と平行であり、第二基準偏光板の光学軸（５）は基準線（６）と直交している。かかる第一基準偏光板（２）および第二基準偏光板（３）を光透過板（１）上に配置するには、例えば粘着剤、接着剤などを用いて固定すればよい。第一基準偏光板（２）と第二基準偏光板（３）とは離れて配置されてもよいが、隣接して配置されている場合は、大きな面積の偏光板試料はもちろん、小さな偏光板試料の検査にも容易に対応できるため、好ましい。
【０００８】
基準線（６）の方向は、光透過板（１）上の任意の方向に設定されるが、実用上は作業者の正面方向となることが好ましい。かかる基準線は、その方向を容易に確認できるように光透過板上に明示されていることが好ましい。また、図２に示すように、該基準線（６）に沿って第一基準偏光板（２）と第二基準偏光板（３）とが隣接するように配置されている場合には、基準線（６）を二つの偏光板の境界線（７）として容易に認識できるため、好ましい。
【０００９】
さらに、本発明の光学軸検査器具には、透明な分度器（９）が設けられていてもよい。かかる分度器としてはアクリル製分度器などが用いられる。分度器（９）の角度中心は基準線（６）上にあってもよいし、基準線から離れていてもよい。かかる分度器を用いることによって、位相差板試料（８）の光学軸の角度を簡便に求めることができる。
【００１０】
第三基準偏光板（１２）は、第一基準偏光板（２）および第二基準偏光板（３）と重ね合せ可能に設けられている。第三基準偏光板を重ね合せ可能に設けるには、例えば蝶番などによって光透過板（１）と連結しておけばよい。かかる第三基準偏光板を第一基準偏光板および第二基準偏光板に重ね合せた際に、その光学軸（１３）は基準線（６）に対して４５°の方向となる。
【００１１】
本発明の光学軸検査器具を用いて位相差板試料の光学軸を検査するには、例えば第一基準偏光板（２）および第二基準偏光板（３）と、第三基準偏光板（１２）との間で位相差板試料（８）を、
該位相差板試料および第三基準偏光板が第一基準偏光板と重なり合う部分（１０）の色調と、該位相差板試料および第三基準偏光板が第二基準偏光板と重なり合う部分（１１）の色調とが無彩色となり、
かつ該位相差板試料および第三基準偏光板が第一基準偏光板と重なり合う部分（１０）の明度と、該位相差板試料および第三基準偏光板が第二基準偏光板と重なり合う部分（１１）の明度とが等しくなる
ように載置すればよい（図３）。
【００１２】
第一基準偏光板（２）と第二基準偏光板（３）とを基準線（６）に沿って隣接するように配置した場合には、位相差板試料および第三基準偏光板が第一基準偏光板と重なり合う部分（１０）の色調および明度と、位相差板試料および第三基準偏光板が第二基準偏光板と重なり合う部分（１１）の色調および明度を容易かつ精度よく比較できるため、好ましい。
【００１３】
両部分（１０、１１）が無彩色となり、かつ明度が等しくなったとき、位相差板試料（８）の光学軸は基準線（６）と同一方向または直角方向のいずれかである。光学軸がいずれの方向であるかは、位相差板試料（８）をわずかに回転させたときの色調を、予め用意した位相差板の標準試料と比較することにより容易に判断することができる。
【００１４】
また、偏光板試料（８）の光学軸の角度は、例えば予め配置しておいた分度器（９）によって求めることができる。さらに、かかる分度器の角度中心にピン（１４）を設けておけば、該ピン（１４）を支点にして偏光板試料（８）を載置することができ、しかもそのまま光学軸の角度を読み取ることもできるため、好ましい。
【００１５】
【発明の効果】
本発明の光学軸検査器具は、安価かつ簡便に組み立てられ、しかも位相差板試料および第三基準偏光板が第一基準偏光板と重なり合う部分の色調および明度と、位相差板試料および第三基準偏光板が第二基準偏光板と重なり合う部分の色調および明度と比較するので、目視であっても十分な精度で位相差板の光学軸を検査することができる。
【００１６】
【実施例】
以下、実施例により本発明をより詳細に説明するが、本発明はかかる実施例に限定されるものではない。
【００１７】
実施例１
図１に示す光学軸検査器具を写真ネガ観察用のライトボックス上に載置し、裏面から照明した。
第一基準偏光板（２）および第二基準偏光板（３）と、第三基準偏光板（１２）とを重ね合せ、これら第一基準偏光板および第二基準偏光板と、第三基準偏光板との間で、位相差板試料（８）〔４．５ｃｍ×５ｃｍ〕を、該位相差板試料および第三基準偏光板が第一基準偏光板と重なり合う部分（１０）の色調と、該位相差板試料および第三基準偏光板が第二基準偏光板と重なり合う部分（１１）の色調とが無彩色となり、かつ該位相差板試料および第三基準偏光板が第一基準偏光板と重なり合う部分（１０）の明度と、該位相差板試料および第三基準偏光板が第二基準偏光板と重なり合う部分（１１）の明度とが等しくなるよう載置した。その時の位相差板試料（８）の一辺〔長辺（５ｃｍ）〕（１５）と基準線（６）とがなす角度を分度器を用いて読み取り、この角度を位相差板試料の光学軸の角度（θ）とした。
異なる４枚の位相差板試料（８）について求めた光学軸の角度（θ）を表１に示す。
【００１８】
参考例１
実施例１で用いた各位相差板試料の光学軸の角度を偏光顕微鏡を用いて測定した結果を表１に示す。
【００１９】
【表１】
【図面の簡単な説明】
【図１】本発明の光学軸検査器具の一例を示す模式図である。
【図２】本発明の光学軸検査器具の一例を示す模式図である。
【図３】本発明の光学軸検査方法を示す模式図である。
【符号の説明】
１：光透過板
２：第一基準偏光板
３：第二基準偏光板
４：第一基準偏光板の光学軸
５：第二基準偏光板の光学軸
６：基準線
７：第一基準偏光板と第二基準偏光板との境界線
８：偏光板試料
９：分度器
１０：位相差板試料および第三基準偏光板が第一基準偏光板と重なり合う部分
１１：位相差板試料および第三基準偏光板が第二基準偏光板と重なり合う部分
１２：第三基準偏光板
１３：第三基準偏光板の光学軸
１４：ピン
１５：位相差板試料の一辺（長辺）
θ ：位相差板試料の光学軸の角度〔位相差板試料の一辺（長辺）と基準線とがなす角度〕[0001]
BACKGROUND OF THE INVENTION
The present invention relates to an optical axis inspection instrument and an optical axis inspection method using the same.
[0002]
[Prior art]
The retardation plate is useful as an optical element, and is used in, for example, a liquid crystal display device.
The direction of the optical axis (fast axis or slow axis) of such a retardation plate is important, and when the retardation plate is incorporated in a liquid crystal display device, it is necessary to confirm the direction of the optical axis. In particular, a retardation plate incorporated in a recent liquid crystal display device is required to have an accuracy of the optical axis, and even if the optical axis is slightly shifted, the target performance of the liquid crystal display device cannot be secured. A good optical axis inspection method is needed.
[0003]
Conventionally, as a method for inspecting an optical axis of a retardation plate, for example, a retardation plate (hereinafter referred to as a retardation plate sample) to be inspected has a maximum transmitted light amount between two polarizing plates whose optical axes are orthogonal to each other. Alternatively, a method of overlapping so as to be minimized is known. However, in order to detect a slight deviation of the optical axis by such a method, the accuracy of the comparison of the amount of transmitted light by visual observation is low. Therefore, the amount of transmitted light is usually compared using a photomultiplier tube, etc. However, since the photomultiplier tube is expensive and requires complicated operation, it can be assembled inexpensively and easily and with high accuracy. Development of an instrument capable of inspecting the optical axis of a phase difference plate has been desired.
[0004]
[Problems to be solved by the invention]
Thus, as a result of intensive studies to develop an instrument that can be assembled inexpensively and easily and can accurately inspect the optical axis, the present inventors have paralleled the two polarizing plates in a specific direction. An optical axis inspection instrument configured so that a retardation plate sample can be placed between the two polarizing plates and a third polarizing plate having an optical axis in a specific direction is visually As a result, it has been found that the optical axis of the retardation plate can be inspected with high accuracy, and the present invention has been achieved.
[0005]
[Means for Solving the Problems]
That is, in the present invention, on the light transmission plate, a first reference polarizing plate whose optical axis is parallel to the reference line and a second reference polarizing plate whose optical axis is orthogonal to the reference line are arranged, In addition, when the third reference polarizing plate is superposed on the first reference polarizing plate and the second reference polarizing plate, the first reference polarizing plate and the second reference polarizing plate are arranged so that the optical axis thereof is 45 ° with respect to the reference line. An optical axis inspection instrument characterized by being provided so as to be superposed on a reference polarizing plate is provided.
[0006]
DETAILED DESCRIPTION OF THE INVENTION
Hereinafter, the present invention will be described in more detail.
An example of the optical axis inspection instrument of the present invention is shown in FIG.
The light transmission plate (1) may be a normal synthetic resin plate such as an acrylic plate, a polycarbonate plate, a vinyl chloride plate, or a glass plate. The thickness of the light transmission plate is usually about 1 to 10 mm in terms of strength and ease of handling, although it depends on the material. The light transmitting plate may be a transparent plate, but is preferably a light diffusing plate from the viewpoint of less fatigue in inspection. Examples of the light diffusing plate include a synthetic resin plate mixed with an inorganic filler such as silicon oxide and aluminum oxide, and frosted glass. The light transmission plate may be colored with a pigment, a dye, or the like.
In the inspection, the optical axis inspection instrument is usually illuminated from below by a backlight or the like. The backlight may be any one of, for example, a fluorescent lamp, natural light, and an incandescent lamp.
[0007]
A first reference polarizing plate (2) and a second reference polarizing plate (3) are disposed on the light transmission plate (1).
The first reference polarizing plate (2) and the second reference polarizing plate (3) are arranged in parallel on the light transmission plate (1) and arranged so as not to substantially overlap each other. There may be overlapping portions within a range that does not hinder the inspection. The optical axis (4) of the first reference polarizing plate is parallel to the reference line (6), and the optical axis (5) of the second reference polarizing plate is orthogonal to the reference line (6). In order to dispose the first reference polarizing plate (2) and the second reference polarizing plate (3) on the light transmission plate (1), for example, an adhesive or an adhesive may be used. The first reference polarizing plate (2) and the second reference polarizing plate (3) may be arranged apart from each other, but when they are arranged adjacent to each other, not only a polarizing plate sample of a large area but also a small polarizing plate This is preferable because it can easily cope with inspection of a sample.
[0008]
Although the direction of the reference line (6) is set to an arbitrary direction on the light transmission plate (1), it is preferably practically the front direction of the operator. The reference line is preferably clearly indicated on the light transmission plate so that the direction can be easily confirmed. In addition, as shown in FIG. 2, when the first reference polarizing plate (2) and the second reference polarizing plate (3) are arranged adjacent to each other along the reference line (6), the reference The line (6) is preferable because it can be easily recognized as the boundary line (7) between the two polarizing plates.
[0009]
Further, the optical axis inspection instrument of the present invention may be provided with a transparent protractor (9). As such a protractor, an acrylic protractor is used. The angle center of the protractor (9) may be on the reference line (6) or may be separated from the reference line. By using such a protractor, the angle of the optical axis of the retardation plate sample (8) can be easily obtained.
[0010]
The third reference polarizing plate (12) is provided so as to be superposed on the first reference polarizing plate (2) and the second reference polarizing plate (3). In order to provide the third reference polarizing plate so as to be superposed, the third reference polarizing plate may be connected to the light transmission plate (1) by a hinge, for example. When this third reference polarizing plate is superimposed on the first reference polarizing plate and the second reference polarizing plate, the optical axis (13) is in the direction of 45 ° with respect to the reference line (6).
[0011]
In order to inspect the optical axis of the retardation plate sample using the optical axis inspection instrument of the present invention, for example, the first reference polarizing plate (2), the second reference polarizing plate (3), and the third reference polarizing plate (12 ) With the retardation plate sample (8),
Color tone of the portion (10) where the retardation plate sample and third reference polarizing plate overlap with the first reference polarizing plate, and portion (11) where the retardation plate sample and third reference polarizing plate overlap with the second reference polarizing plate The tone of the color becomes achromatic,
And the brightness of the portion (10) where the retardation plate sample and third reference polarizing plate overlap the first reference polarizing plate, and the portion where the retardation plate sample and third reference polarizing plate overlap the second reference polarizing plate (11 ) So that the brightness is equal (FIG. 3).
[0012]
When the first reference polarizing plate (2) and the second reference polarizing plate (3) are disposed adjacent to each other along the reference line (6), the retardation plate sample and the third reference polarizing plate are the first. Since the color tone and brightness of the portion (10) overlapping with the reference polarizing plate can be easily and accurately compared with the color tone and brightness of the portion (11) where the retardation plate sample and the third reference polarizing plate overlap with the second reference polarizing plate, preferable.
[0013]
When both portions (10, 11) are achromatic and lightness is equal, the optical axis of the retardation plate sample (8) is either in the same direction or at a right angle to the reference line (6). The direction of the optical axis can be easily determined by comparing the color tone when the retardation plate sample (8) is slightly rotated with a standard sample of a retardation plate prepared in advance. .
[0014]
Further, the angle of the optical axis of the polarizing plate sample (8) can be obtained by a protractor (9) arranged in advance, for example. Further, if a pin (14) is provided at the angle center of the protractor, the polarizing plate sample (8) can be placed with the pin (14) as a fulcrum, and the angle of the optical axis can be read as it is. Is also preferable.
[0015]
【The invention's effect】
The optical axis inspection instrument of the present invention is assembled inexpensively and simply, and the color tone and brightness of the portion where the retardation plate sample and the third reference polarizing plate overlap the first reference polarizing plate, the retardation plate sample and the third reference Since the polarizing plate is compared with the color tone and brightness of the portion where the second reference polarizing plate overlaps, the optical axis of the retardation plate can be inspected with sufficient accuracy even by visual observation.
[0016]
【Example】
EXAMPLES Hereinafter, although an Example demonstrates this invention in detail, this invention is not limited to this Example.
[0017]
Example 1
The optical axis inspection instrument shown in FIG. 1 was placed on a light box for photographic negative observation and illuminated from the back side.
The first reference polarizing plate (2) and the second reference polarizing plate (3) are superposed on the third reference polarizing plate (12), and the first reference polarizing plate, the second reference polarizing plate, and the third reference polarizing plate. A phase difference plate sample (8) [4.5 cm × 5 cm] between the plate and the color tone of the portion (10) where the phase difference plate sample and the third reference polarizing plate overlap the first reference polarizing plate, The color tone of the portion (11) where the retardation plate sample and the third reference polarizing plate overlap with the second reference polarizing plate becomes achromatic, and the retardation plate sample and the third reference polarizing plate overlap with the first reference polarizing plate. The lightness of the portion (10) and the lightness of the portion (11) where the retardation plate sample and the third reference polarizing plate overlap with the second reference polarizing plate were set to be equal. The angle formed by one side [long side (5 cm)] (15) of the retardation plate sample (8) and the reference line (6) is read using a protractor, and this angle is the angle of the optical axis of the retardation plate sample. (Θ).
Table 1 shows the angle (θ) of the optical axis obtained for four different retardation plate samples (8).
[0018]
Reference example 1
Table 1 shows the result of measuring the angle of the optical axis of each retardation plate sample used in Example 1 using a polarizing microscope.
[0019]
[Table 1]
[Brief description of the drawings]
FIG. 1 is a schematic view showing an example of an optical axis inspection instrument of the present invention.
FIG. 2 is a schematic view showing an example of an optical axis inspection instrument of the present invention.
FIG. 3 is a schematic diagram showing an optical axis inspection method of the present invention.
[Explanation of symbols]
1: light transmission plate 2: first reference polarizing plate 3: second reference polarizing plate 4: optical axis of first reference polarizing plate 5: optical axis of second reference polarizing plate 6: reference line 7: first reference polarizing plate 8: Polarizing plate sample 9: Protractor 10: Phase plate sample and third reference polarizing plate overlap with the first reference polarizing plate 11: Phase plate sample and third reference polarizing plate Portion where plate overlaps second reference polarizing plate 12: Third reference polarizing plate 13:
θ: angle of optical axis of retardation plate sample [angle formed by one side (long side) of retardation plate sample and reference line]
Claims (4)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP22506597A JP3731306B2 (en) | 1997-08-21 | 1997-08-21 | Optical axis inspection instrument and optical axis inspection method using the same |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP22506597A JP3731306B2 (en) | 1997-08-21 | 1997-08-21 | Optical axis inspection instrument and optical axis inspection method using the same |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH1164160A JPH1164160A (en) | 1999-03-05 |
| JP3731306B2 true JP3731306B2 (en) | 2006-01-05 |
Family
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP22506597A Expired - Fee Related JP3731306B2 (en) | 1997-08-21 | 1997-08-21 | Optical axis inspection instrument and optical axis inspection method using the same |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP3731306B2 (en) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR2826857B1 (en) | 2001-07-09 | 2004-03-12 | Oreal | INSTRUMENT FOR OBSERVING SKIN OR HAIR |
| FR2878424B1 (en) | 2004-11-26 | 2008-02-01 | Oreal | METHOD FOR OBSERVING A BIOLOGICAL TISSUE, IN PARTICULAR HUMAN SKIN |
| WO2006129523A1 (en) * | 2005-05-30 | 2006-12-07 | Sharp Kabushiki Kaisha | Liquid crystal display device manufacturing method and liquid crystal display device manufacturing device |
-
1997
- 1997-08-21 JP JP22506597A patent/JP3731306B2/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| JPH1164160A (en) | 1999-03-05 |
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