JP3498461B2 - Electronic components - Google Patents

Electronic components

Info

Publication number
JP3498461B2
JP3498461B2 JP34448795A JP34448795A JP3498461B2 JP 3498461 B2 JP3498461 B2 JP 3498461B2 JP 34448795 A JP34448795 A JP 34448795A JP 34448795 A JP34448795 A JP 34448795A JP 3498461 B2 JP3498461 B2 JP 3498461B2
Authority
JP
Japan
Prior art keywords
electronic component
reinforcing
protrusion
circuit board
protruding
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP34448795A
Other languages
Japanese (ja)
Other versions
JPH09162241A (en
Inventor
克也 小菅
茂康 伊藤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sony Corp
Original Assignee
Sony Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sony Corp filed Critical Sony Corp
Priority to JP34448795A priority Critical patent/JP3498461B2/en
Publication of JPH09162241A publication Critical patent/JPH09162241A/en
Application granted granted Critical
Publication of JP3498461B2 publication Critical patent/JP3498461B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L24/10Bump connectors ; Manufacturing methods related thereto
    • H01L24/15Structure, shape, material or disposition of the bump connectors after the connecting process
    • H01L24/17Structure, shape, material or disposition of the bump connectors after the connecting process of a plurality of bump connectors
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/10Bump connectors; Manufacturing methods related thereto
    • H01L2224/12Structure, shape, material or disposition of the bump connectors prior to the connecting process
    • H01L2224/14Structure, shape, material or disposition of the bump connectors prior to the connecting process of a plurality of bump connectors
    • H01L2224/1401Structure
    • H01L2224/1403Bump connectors having different sizes, e.g. different diameters, heights or widths
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/10Bump connectors; Manufacturing methods related thereto
    • H01L2224/12Structure, shape, material or disposition of the bump connectors prior to the connecting process
    • H01L2224/14Structure, shape, material or disposition of the bump connectors prior to the connecting process of a plurality of bump connectors
    • H01L2224/1405Shape
    • H01L2224/14051Bump connectors having different shapes
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/10Bump connectors; Manufacturing methods related thereto
    • H01L2224/15Structure, shape, material or disposition of the bump connectors after the connecting process
    • H01L2224/17Structure, shape, material or disposition of the bump connectors after the connecting process of a plurality of bump connectors
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805Shape
    • H01L2224/4809Loop shape
    • H01L2224/48091Arched
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481Disposition
    • H01L2224/48151Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/48221Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/48225Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
    • H01L2224/48227Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation connecting the wire to a bond pad of the item
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/151Die mounting substrate
    • H01L2924/153Connection portion
    • H01L2924/1531Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface
    • H01L2924/15311Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface being a ball array, e.g. BGA
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/11Printed elements for providing electric connections to or between printed circuits
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/30Assembling printed circuits with electric components, e.g. with resistor
    • H05K3/303Surface mounted components, e.g. affixing before soldering, aligning means, spacing means
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/30Assembling printed circuits with electric components, e.g. with resistor
    • H05K3/32Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
    • H05K3/34Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by soldering
    • H05K3/341Surface mounted components
    • H05K3/3431Leadless components

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Wire Bonding (AREA)

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【発明の属する技術分野】本発明は、複数の突起電極を
備える電子部品の改良に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to improvement of an electronic component having a plurality of protruding electrodes.

【0002】[0002]

【従来の技術】電子部品には、たとえば所謂ボールグリ
ッドアレイ(BGA)の構造を有するものや、バンプ付
の抵抗あるいはコンデンサ等がある。この種のボールグ
リッドアレイの半導体パッケージあるいはバンプ付の抵
抗やコンデンサの裏面の突起電極が、回路基板のランド
に対して半田付けにより接続されるようになっている。
図13は、従来用いられているボールグリッドアレイ構
造の電子部品1を示している。この電子部品1は、その
裏面側に複数のボール状の突起電極11が格子状に配列
されている。これらのボール状の突起電極11は、IC
チップ1aから多数の信号を取り出すために、回路基板
に対して電気的に接続する部分である。図13のボール
グリッドアレイ構造の半導体パッケージの突起電極11
は、たとえば0.5mmピッチで、200個程度形成さ
れている。また図14は、バンプ付の抵抗チップ2を示
している。この抵抗チップ2は、たとえばバンプとして
2つの突起電極11,11を有している。
2. Description of the Related Art Electronic components include, for example, components having a so-called ball grid array (BGA) structure, bumped resistors or capacitors, and the like. The semiconductor package of this kind of ball grid array, or the bumps on the back surface of the resistor or capacitor with bumps are connected to the land of the circuit board by soldering.
FIG. 13 shows a conventionally used electronic component 1 having a ball grid array structure. The electronic component 1 has a plurality of ball-shaped protruding electrodes 11 arranged in a grid pattern on the back surface side thereof. These ball-shaped protruding electrodes 11 are ICs
It is a portion that is electrically connected to the circuit board in order to extract a large number of signals from the chip 1a. The protruding electrodes 11 of the semiconductor package having the ball grid array structure of FIG.
Are formed at a pitch of 0.5 mm, for example, about 200 pieces. Further, FIG. 14 shows a resistance chip 2 with bumps. The resistance chip 2 has two protruding electrodes 11, 11 as bumps, for example.

【0003】[0003]

【発明が解決しようとする課題】ところが、上述したよ
うなボールグリッドアレイ状の半導体パッケージを有す
子部品では、次のような問題がある。図15は、図
13の電子部品1と回路基板3が、複数の突起電極11
により電気的に接続されている状態を示している。この
ような構造を持つ電子部品1と回路基板3の間では、突
起電極11付近に応力がかかることが知られており、上
述したような0.5mmピッチで、200個の突起電極
11を有する場合には、その電気的な接続寿命が約5年
である。また、図15において、最も大きな応力のかか
る突起電極11は、最外部の電極と最内部の電極である
ことが本発明者の試験により判明している。従って、こ
れらの最外部の突起電極11や最内部の突起電極11に
マイクロクラックが入った場合には、この電子部品1と
回路基板3の電気的な接続に不都合が生じてしまうこと
になる。
[SUMMARY OF THE INVENTION However, in the child part electrodeposition having a ball grid array semiconductor package as described above has the following problems. FIG. 15 shows that the electronic component 1 and the circuit board 3 of FIG.
Shows the state of being electrically connected. It is known that stress is applied to the vicinity of the protruding electrodes 11 between the electronic component 1 and the circuit board 3 having such a structure, and 200 protruding electrodes 11 are provided at the 0.5 mm pitch as described above. In some cases, the electrical connection life is about 5 years. Further, in FIG. 15, it has been proved by the inventor's test that the protruding electrodes 11 to which the largest stress is applied are the outermost electrode and the innermost electrode. Therefore, if microcracks are formed in the outermost protruding electrode 11 and the innermost protruding electrode 11, a problem will occur in the electrical connection between the electronic component 1 and the circuit board 3.

【0004】また図16に示すように従来の電子部品1
の各突起電極11は、同一の大きさで同一の形状を有し
ている。従って、図17に示すようにして、カメラで電
子部品1の裏面側を認識する場合には次のような問題が
生じる。すなわち、カメラの認識領域により、たとえば
図17の(a)で示すようにカメラが全部の突起電極1
1を認識できる全体領域ARを認識する場合には問題が
ないが、図17の(b)のようにカメラが領域ARの一
部領域AR1しか認識できない場合には、図18に示す
ように、カメラの位置が突起電極11の1つ分あるいは
その整数倍分ずれた場合にも同じ大きさで同じ形状の突
起電極11を認識してしまう。このためカメラが、電子
部品1の裏面側の正しい位置を認識することができない
という問題がある。つまり、図18の(a)で示すよう
に領域AR1が正しい認識位置だとしても、カメラが突
起電極11の1ピッチ分ずれて位置していた場合には、
隣の領域AR2の同じ形状で同じ大きさの突起電極11
を認識してしまうので、誤認識が生じることになる。
Further, as shown in FIG. 16, a conventional electronic component 1
Each of the protruding electrodes 11 has the same size and the same shape. Therefore, as shown in FIG. 17, when the camera recognizes the back side of the electronic component 1, the following problems occur. That is, depending on the recognition area of the camera, for example, as shown in FIG.
There is no problem when recognizing the entire area AR where 1 can be recognized, but when the camera can recognize only a partial area AR1 of the area AR as shown in FIG. 17B, as shown in FIG. Even when the position of the camera is displaced by one protrusion electrode 11 or by an integral multiple thereof, the protrusion electrodes 11 having the same size and the same shape are recognized. Therefore, there is a problem that the camera cannot recognize the correct position on the back surface side of the electronic component 1. That is, even if the area AR1 is at the correct recognition position as shown in FIG. 18A, if the camera is positioned one pitch of the protruding electrode 11 apart,
The protruding electrode 11 having the same shape and the same size in the adjacent area AR2
Will be mistakenly recognized.

【0005】 そこで本発明は上記課題を解消するため
になされたものであり、複数の突起電極の電気的な接続
状態を確保し、しかも電子部品の向きを判別したり電子
部品の位置決め合わせを容易に行うことができる電子部
品を提供することを目的としている。
Therefore, the present invention has been made to solve the above problems, and ensures the electrical connection state of a plurality of projecting electrodes, and moreover, it is easy to determine the direction of electronic components and align electronic components. The purpose is to provide an electronic component that can be performed.

【0006】[0006]

【課題を解決するための手段】本発明の電子部品は、基
板の配線部に電気的に接続するための複数の突起電極及
びこの突起電極とこの基板の配線部の電気的な接続状態
を補強するための補強用の突起を備える電子部品におい
て、この補強用の突起のうちの第1の補強用の突起は、
この複数の突起電極よりも外側に位置し、この補強用の
突起のうちの第2の補強用の突起は、この複数の突起電
極よりも内側に位置しているものである。
The electronic component of the present invention is based on
A plurality of protruding electrodes for electrically connecting to the wiring part of the board and
Electrical connection between the bump electrode and the wiring part of this board
For electronic components that have a protrusion for reinforcement to reinforce
The first reinforcing protrusion of the reinforcing protrusions is
It is located outside of the multiple protruding electrodes and
The second reinforcing protrusion of the protrusions is the plurality of protrusion electrodes.
It is located inside the pole.

【0007】 本発明によれば、第1の補強用の突起が
電子部品において複数の突起電極よりも外側に位置し、
かつ第2の補強用の突起が電子部品においてこの複数の
突起電極よりも内側に位置していると、電子部品の突起
電極と基板の配線部が電気的に接続状態になっている場
合に、外側の補強用の突起と内側の補強用の突起が、発
生する応力に対して耐えることができる。これにより、
突起電極と基板の配線部の電気的な接続状態を長期間確
保することができる。また補強用の突起は、たとえば複
数の突起電極と異なる形状にすることより、電気的な接
続用の複数の突起電極と、補強用の突起の区別を確実に
行うことができる。そして補強用の突起の少なくとも1
つが、複数の突起電極と異なる大きさであれば、電子部
品の向きを確実に認識することができる。
According to the present invention, the first reinforcing protrusion is
Located outside the multiple protruding electrodes in electronic components,
In addition, the second reinforcing projection is used in the electronic component.
If it is located inside the bump electrode, the bump of the electronic component
If the electrode and the wiring part of the board are electrically connected
The outer reinforcement protrusions and the inner reinforcement protrusions
It is able to withstand the stress generated. This allows
Check the electrical connection between the protruding electrode and the wiring of the board for a long time.
Can be kept. Further, by forming the reinforcing protrusion in a shape different from that of, for example, the plurality of protruding electrodes, it is possible to reliably distinguish the plurality of electrically connecting protruding electrodes from the reinforcing protrusion. And at least one of the reinforcing protrusions
If the size is different from the plurality of protruding electrodes, the orientation of the electronic component can be surely recognized.

【0008】[0008]

【0009】[0009]

【発明の実施の形態】以下、本発明の好適な実施の形態
を添付図面に基づいて詳細に説明する。なお、以下に述
べる実施の形態は、本発明の好適な具体例であるから、
技術的に好ましい種々の限定が付されているが、本発明
の範囲は、以下の説明において特に本発明を限定する旨
の記載がない限り、これらの形態に限られるものではな
い。
BEST MODE FOR CARRYING OUT THE INVENTION Preferred embodiments of the present invention will be described in detail below with reference to the accompanying drawings. The embodiment described below is a preferred specific example of the present invention,
Although various technically preferable limitations are given, the scope of the present invention is not limited to these forms unless otherwise specified in the description below.

【0010】 図1は、電子部品の一例およびこの電子
部品20が搭載されている回路基板30を示している。
図2は、この電子部品20の裏面21側を示している。
電子部品の裏面21には、多数の突起電極11が所定の
パターンで配列されている。これらの突起電極11は、
所定のピッチを有するように格子状に配置されている電
極端子であり、好ましくはボール形状を有している。従
って、電子部品20は、所謂ボールグリッドアレイ(B
GA)型の半導体パッケージである。図1の電子部品2
0のサブストレート23の上には、所定の半導体素子2
4が、たとえばエポキシ樹脂のような封止部材25によ
りオーバーコートすることでパッケージングされてい
る。半導体素子24の各信号線は、サブストレート23
のスルーホールを介して、図2の各突起電極11に電気
的に接続されている。
FIG. 1 shows an example of an electronic component and a circuit board 30 on which the electronic component 20 is mounted.
FIG. 2 shows the rear surface 21 side of the electronic component 20.
A large number of protruding electrodes 11 are arranged in a predetermined pattern on the back surface 21 of the electronic component. These protruding electrodes 11 are
The electrode terminals are arranged in a grid pattern so as to have a predetermined pitch, and preferably have a ball shape. Therefore, the electronic component 20 has a so-called ball grid array (B
It is a (GA) type semiconductor package. Electronic component 2 of FIG.
On the substrate 23 of 0, a predetermined semiconductor element 2
4 is packaged by overcoating with a sealing member 25 such as epoxy resin. Each signal line of the semiconductor element 24 is connected to the substrate 23.
2 is electrically connected to each protruding electrode 11 in FIG.

【0011】図2において、電子部品20の裏面21に
おいては、多数の突起電極11の外側に、たとえば4つ
の補強用の突起(補強ランドともいう)40が設けられ
ている。この補強用の突起40は、たとえば裏面21の
四隅に配置されている。補強用の突起40は、突起電極
11と同様に半田バンプであるが、球状もしくは半球状
であり、その直径L1は、突起電極11の直径L2より
も大きく設定されている。これにより、使用者は補強用
の突起40と、突起電極11の区別を確実に行うことが
できる。図2の実施の形態では、このように4つの補強
用の突起40が、裏面21の四隅において、つまり突起
電極11のよりも外側において設定されている。
In FIG. 2, on the back surface 21 of the electronic component 20, for example, four reinforcing protrusions (also referred to as reinforcing lands) 40 are provided outside the many protruding electrodes 11. The reinforcing protrusions 40 are arranged at the four corners of the back surface 21, for example. The protrusion 40 for reinforcement is a solder bump like the protrusion electrode 11, but is spherical or hemispherical, and its diameter L1 is set larger than the diameter L2 of the protrusion electrode 11. As a result, the user can reliably distinguish between the reinforcing protrusion 40 and the protrusion electrode 11. In the embodiment of FIG. 2, the four reinforcing protrusions 40 are thus set at the four corners of the back surface 21, that is, outside the protrusion electrodes 11.

【0012】図3は、この電子部品20の突起電極11
と補強用の突起40が、回路基板30に対して電気的に
接続されている状態を示す図である。補強用の突起40
は、電子部品20と回路基板30の電気的接続には関係
なく、各突起電極11が、電子部品20と回路基板30
の配線部の間での電気的な接続の役割を果たしている。
補強用の突起40が裏面21の四隅にあるので、各突起
電極11にかかる応力は、最も外側に位置する突起にか
かることから、この補強用の突起40が応力に耐える役
割を果たす。従って、電気的接続に関与する突起電極1
1には応力がかかりにくくなり、突起電極11にマイク
ロクラック等の発生がなくなる。従って、電子部品20
の突起電極11と回路基板30の配線部の電気的接続を
長期間確保することができる。
FIG. 3 shows the protruding electrode 11 of the electronic component 20.
FIG. 6 is a diagram showing a state in which the reinforcing protrusions 40 are electrically connected to the circuit board 30. Reinforcing protrusion 40
Irrespective of the electrical connection between the electronic component 20 and the circuit board 30, each protruding electrode 11 is connected to the electronic component 20 and the circuit board 30.
Plays the role of electrical connection between the wiring parts.
Since the reinforcing protrusions 40 are located at the four corners of the back surface 21, the stress applied to each of the protruding electrodes 11 is applied to the outermost protrusions, so that the reinforcing protrusions 40 play a role of withstanding the stress. Therefore, the protruding electrode 1 involved in the electrical connection
1 is less likely to be stressed, and the occurrence of microcracks or the like on the protruding electrode 11 is eliminated. Therefore, the electronic component 20
The electrical connection between the protruding electrode 11 and the wiring portion of the circuit board 30 can be ensured for a long period of time.

【0013】 図4は、図2と異なり、補強用の突起4
0が、突起電極11が存在する領域よりも最も内側に4
つ配置されている。すなわち、図5に示すように、電子
部品120と回路基板30の配線部が突起電極11によ
り電気的に接続されている状態では、最も内側の領域の
補強用の突起40に対して応力が最もかかるので、この
補強用の突起40が応力を受け持つことになり、他の突
起電極11にはマイクロクラック等が発生しない。従っ
て、電子部品120、突起電極11と回路基板30の配
線部の電気的な接続を長期間確保することができる。
FIG. 4 differs from FIG. 2 in that
0 is 4 on the innermost side of the region where the protruding electrode 11 is present.
Are arranged. That is , as shown in FIG. 5, in the state where the wiring parts of the electronic component 120 and the circuit board 30 are electrically connected to each other by the protruding electrodes 11, the stress is most applied to the reinforcing protrusions 40 in the innermost region. since such, results in the projection 40 for the reinforcement charge of stress, microcracks or the like does not occur in the other projection electrodes 11. Therefore, electrical connection between the electronic component 120, the protruding electrode 11 and the wiring portion of the circuit board 30 can be ensured for a long period of time.

【0014】図6は、補強用の突起40が電気的接続用
の突起電極11の配列パターン部の最も外側と最も内側
の両方に4つずつ配置された例を示している。このよう
にすることで、図7に示すように、電子部品220が、
多数の突起電極11を介して回路基板30の配線部に対
して電気的に接続している状態において、補強用の突起
40は最も外側と最も内側にかかる応力を受け持つこと
になる。従って、電気的接続を行うための多数の突起電
極11には応力によるマイクロクラックが生じないの
で、電子部品220の突起電極11と回路基板30の配
線部による電気的な接続を長期間確保することができ
る。
FIG. 6 shows an example in which four reinforcing protrusions 40 are arranged on both the outermost side and the innermost side of the array pattern portion of the protruding electrode 11 for electrical connection. By doing so, as shown in FIG. 7, the electronic component 220 is
When electrically connected to the wiring portion of the circuit board 30 via the large number of protruding electrodes 11, the reinforcing protrusion 40 bears the stress applied to the outermost and innermost portions. Therefore, microcracks due to stress do not occur in a large number of protruding electrodes 11 for electrical connection, so that electrical connection between the protruding electrodes 11 of the electronic component 220 and the wiring portion of the circuit board 30 should be ensured for a long time. You can

【0015】このように、電子部品20,120,22
0で示すように、突起電極11の形成されているパター
ン部の最も外側の位置、あるいは最も内側の位置、ある
いは最も外側の位置と最も内側の位置の両方に対して、
補強用の突起40を設けることにより、補強用の突起4
0が、応力を受け持つことができるために、電気的接続
に必要な多数の突起電極11にマイクロクラックが入ら
ず、回路基板30と電子部品20,120,220の電
気的な接続に不都合がない。しかもこの補強用の突起4
0の大きさが大きい程、その応力を支える強度が上が
り、電子部品と回路基板の電気的な接続状態をさらに長
期間確保することができる。
As described above, the electronic components 20, 120, 22
As shown by 0, with respect to the outermost position, the innermost position, or both the outermost position and the innermost position of the pattern portion in which the bump electrode 11 is formed,
By providing the protrusion 40 for reinforcement, the protrusion 4 for reinforcement is provided.
Since 0 can bear the stress, no microcracks are formed in the many protruding electrodes 11 required for electrical connection, and there is no inconvenience in electrical connection between the circuit board 30 and the electronic components 20, 120, 220. . Moreover, this protrusion 4 for reinforcement
As the value of 0 is larger, the strength for supporting the stress is increased, and the electrical connection state between the electronic component and the circuit board can be secured for a longer period.

【0016】たとえば、補強用の突起を設けることによ
り、電子部品と回路基板の電気的な接続の寿命が約2.
5倍程度伸びる。この電子部品20,120,220
は、たとえば0.5mmピッチで200個の突起電極1
1を有するボールグリッドアレイタイプのものである。
この場合、その電気的接続を確保できる年数、いわゆる
接続寿命は12年と長期間確保することができる。な
お、補強用の突起を最外周または最内周に設けるか、あ
るいは最外周および最内周の両方ともに設けるかの判断
は、その電子部品の必要寿命等を考えて適切に選択す
る。
For example, by providing the reinforcing protrusion, the life of electrical connection between the electronic component and the circuit board is about 2.
It grows about 5 times. This electronic component 20, 120, 220
Is, for example, 200 protruding electrodes 1 with a pitch of 0.5 mm.
1 of the ball grid array type.
In this case, the number of years that the electrical connection can be secured, that is, the so-called connection life can be secured as long as 12 years. It should be noted that the determination as to whether the reinforcing protrusion is provided at the outermost or innermost circumference, or both the outermost circumference and the innermost circumference, is appropriately selected in consideration of the required life of the electronic component.

【0017】 次に図8と図9を参照する。図8と図9
は、電子部品320の裏面321側を示している。この
電子部品320の裏面321には、複数の突起電極11
が所定のピッチをおいて所定のパターンで形成されてい
る。そして裏面321の四隅には、上述したような2種
類の補強用の突起40,41が形成されている。図8に
おいて、補強用の突起41は、正方形状になっている
が、他の補強用の突起40は円形状になっている。この
ように補強用の突起41と40の形を変えることによ
り、使用者は電子部品320の向きを確実に知ることが
できる。この場合には、1つの補強用の突起41の形状
が他の補強用の突起40の形状と比べて変えてあるの
で、この電子部品320がたとえば1つのピンタイプの
電子部品320であると判断できる。
Next, please refer to FIG. 8 and FIG. 8 and 9
Shows the back surface 321 side of the electronic component 320. On the back surface 321 of the electronic component 320, a plurality of protruding electrodes 11
Are formed in a predetermined pattern with a predetermined pitch. Then, at the four corners of the back surface 321, the above-described two types of reinforcing protrusions 40 and 41 are formed. In FIG. 8, the reinforcing protrusion 41 has a square shape, but the other reinforcing protrusions 40 have a circular shape. By changing the shapes of the reinforcing protrusions 41 and 40 in this manner, the user can surely know the orientation of the electronic component 320. In this case, since the shape of one reinforcing protrusion 41 is different from the shape of the other reinforcing protrusion 40, it is determined that this electronic component 320 is, for example, one pin type electronic component 320. it can.

【0018】図9の電子部品420は、4つの補強用の
突起41を備えている。これらの補強用の突起41は、
電子部品420の裏面421の四隅に配置されている。
補強用の突起41は、正方形状に作られており、接続用
の突起電極11が円形状であるのと異なっている。この
ようにすることで、たとえばカメラを用いてこの電子部
品420の裏面421を画像認識する場合に、カメラの
倍率によっては、1つの補強用の突起41あるいは1つ
の接続用の突起電極11しか認識できない場合(図9
(a)又は図9(b)参照)があるが、この場合であっ
ても、補強用の突起41と接続用の突起電極11の形状
が異なるので、補強用の突起41と接続用の突起電極1
1を誤認識してしまうという恐れがない。
The electronic component 420 shown in FIG. 9 is provided with four reinforcing protrusions 41. These reinforcing protrusions 41 are
It is arranged at four corners of the back surface 421 of the electronic component 420.
The reinforcing protrusion 41 is formed in a square shape, which is different from the connecting protrusion electrode 11 having a circular shape. By doing so, when recognizing an image of the rear surface 421 of the electronic component 420 using a camera, for example, only one reinforcing projection 41 or one connecting projection electrode 11 is recognized depending on the magnification of the camera. If you cannot (Fig. 9
(A) or FIG. 9 (b)), but even in this case, since the shapes of the reinforcing projection 41 and the connecting projection electrode 11 are different, the reinforcing projection 41 and the connecting projection are different. Electrode 1
There is no fear of erroneously recognizing 1.

【0019】 つまり、図8においては、カメラが領域
AR3を認識すれば(図9(a)参照)、正しく画像認
識できたと判断し、カメラが領域AR4を認識すれば
(図9(b)参照)、ピッチずれした画像認識をしたと
判断することができる。
That is, in FIG. 8, if the camera recognizes the area AR3 (see FIG. 9A) , it is determined that the image can be correctly recognized, and if the camera recognizes the area AR4.
(See FIG. 9B) It can be determined that the image recognition is performed with a pitch shift.

【0020】 図10と図11は、電子部品520の上
面522を示している。裏面521の四隅に対応する位
置には、回路基板30側に位置決め用の突起91が配置
されている。この4つの位置決め用の突起91は、電子
部品520を位置決めするために、電子部品520のパ
ッケージ530よりも外側に飛び出すように突出部分9
1aを有している。これにより、電子部品520の突起
電極11は、4つの位置決め用の突起91により位置決
めすることができる。従って、電子部品520の接続用
の各突起電極11が、回路基板30側の配線部30aの
所定の位置に確実に位置決めして接続できる。
10 and 11 show the upper surface 522 of the electronic component 520. Positioning protrusions 91 are arranged on the circuit board 30 side at positions corresponding to the four corners of the back surface 521. In order to position the electronic component 520, the four projections 91 for positioning project the protruding portion 9 so as to project outside the package 530 of the electronic component 520.
1a. Accordingly, the protruding electrode 11 of the electronic component 520 can be positioned by the four positioning protrusions 91. Therefore, each protruding electrode 11 for connection of the electronic component 520 can be reliably positioned and connected at a predetermined position of the wiring portion 30a on the circuit board 30 side.

【0021】 ところで上述した実施の形態では、所謂
ボールグリッドアレイ型の電子部品を例に挙げて説明し
ているが、これに限らず図14で示すようなバンプ付の
抵抗あるいはコンデンサのような電子部品に対しても適
用することができる。 また半導体パッケージIC型の
電子部品に限らず、フリップチップ等の他の形式の電子
部品についても、本発明は全く同様の効果を発揮するこ
とができる。上述した実施の形態では、電子部品の各コ
ーナ部分に補強用の突起(補強ランド)を設けている
が、補強用の突起は、この部分に限らず、電子部品の各
辺の中央部に設けたりあるいはコーナ部と中央部の両方
あるいはその一方に設けた場合であっても、電子部品の
突起電極と回路基板の配線部との電気的な接続の寿命を
伸ばすことができる。
By the way, in the above-described embodiment, the so-called ball grid array type electronic component is described as an example, but the present invention is not limited to this, and an electronic device such as a bumped resistor or capacitor as shown in FIG. 14 is used. It can also be applied to parts. Further, the present invention is not limited to the semiconductor package IC type electronic component, and the same effects can be exerted on other types of electronic components such as flip chips. In the above-described embodiment, the reinforcing protrusions (reinforcing lands) are provided at the corner portions of the electronic component, but the reinforcing protrusions are not limited to this portion and are provided at the central portions of the sides of the electronic component. Alternatively, even when it is provided in both or one of the corner portion and the central portion, the life of electrical connection between the protruding electrode of the electronic component and the wiring portion of the circuit board can be extended.

【0022】図12は、電子部品の裏面に突起電極およ
び補強用の突起が設けられている場合に、電子部品を回
路基板の配線部に対して搭載する際の手順を示してい
る。回路基板30は、その回路基板30における電子部
品20(120,220,320,420,520)を
位置決めする位置をまず認識する。そして電子部品20
(120,220,320,420,520)の裏面の
認識をして、この電子部品がどのような接続用の突起電
極11のパターンを有し、どのような補強用の突起を有
しているかを認識する。そして電子部品は、回路基板3
0の所定の位置にマウントして、各接続用の突起電極
は、回路基板30の所定の配線部に対して半田により適
切に電気的に接続される。この場合に、補強用の突起は
電子部品と回路基板の電気的接続用には用いず、回路基
板と電子部品の間に発生する応力を負担することにな
る。
FIG. 12 shows a procedure for mounting an electronic component on a wiring portion of a circuit board when a protruding electrode and a reinforcing protrusion are provided on the back surface of the electronic component. The circuit board 30 first recognizes the position where the electronic component 20 (120, 220, 320, 420, 520) on the circuit board 30 is positioned. And electronic component 20
By recognizing the back surface of (120, 220, 320, 420, 520), what kind of pattern of the protruding electrode 11 for connection this electronic component has and what kind of reinforcing protrusion it has Recognize. The electronic component is the circuit board 3
Mounted at a predetermined position of 0, the protruding electrodes for connection are properly electrically connected to a predetermined wiring portion of the circuit board 30 by soldering. In this case, the reinforcing protrusion is not used for electrical connection between the electronic component and the circuit board, and bears the stress generated between the circuit board and the electronic component.

【0023】本発明の実施の形態では、補強用の突起
は、突起電極と基板の配線部の電気的な補強を行って、
接続寿命を伸ばすことができる。また補強用の突起は、
たとえば複数の突起電極と異なる形状にすることによ
り、電気的な接続用の複数の突起電極と、補強用の突起
の区別を確実に行うことができる。そして補強用の突起
の少なくとも1つが、複数の突起電極と異なる大きさで
あれば、電子部品の向きを確実に認識することができ
る。補強用の突起の少なくとも1つが、電子部品の外径
部分より側方に突出していると、電子部品を基板に対し
て実装する場合に、電子部品の向きおよび実装用の位置
合わせのマーカとして使用することができる。
In the embodiment of the present invention, the reinforcing protrusions electrically reinforce the protruding electrodes and the wiring portion of the substrate,
The connection life can be extended. In addition, the protrusion for reinforcement is
For example, by making the shape different from that of the plurality of protrusion electrodes, it is possible to reliably distinguish between the plurality of protrusion electrodes for electrical connection and the protrusion for reinforcement. If at least one of the reinforcing protrusions has a size different from that of the plurality of protrusion electrodes, the orientation of the electronic component can be reliably recognized. When at least one of the protrusions for reinforcement protrudes laterally from the outer diameter portion of the electronic component, when the electronic component is mounted on the board, it is used as a marker for the orientation of the electronic component and the alignment for mounting. can do.

【0024】補強用の突起が、電子部品において複数の
突起電極よりも外側に位置していることにより、電子部
品の突起電極と基板の配線部が電気的に接続された状態
で、補強用の突起が、発生する応力に対して耐えること
ができる。従って、突起電極と基板の配線部の電気的な
接続状態を長期間確保することができる。同様にして補
強用の突起が電子部品において複数の突起電極よりも内
側に位置していることで、突起電極と基板の配線部が電
気的な接続状態にある場合に、補強用の突起が発生する
応力に耐えることができる。
Since the reinforcing protrusion is located outside the plurality of protruding electrodes in the electronic component, the reinforcing protrusion is electrically connected to the protruding electrode of the electronic component and the wiring portion of the substrate. The protrusion can withstand the stress generated. Therefore, the electrical connection state between the protruding electrode and the wiring portion of the substrate can be secured for a long period of time. Similarly, the reinforcing protrusions are located inside the multiple protruding electrodes in the electronic component, so that the reinforcing protrusions are generated when the protruding electrodes are electrically connected to the wiring part of the substrate. Can withstand the stresses that occur.

【0025】[0025]

【発明の効果】以上説明したように、本発明によれば、
複数の突起電極が存在する領域の、外側と内側に配置さ
れる補強用の突起により、複数の突起電極の電気的な接
続状態を長期間確保することができ、しかも電子部品の
向きを判別したり電子部品の位置決め合わせを容易に行
うことができる。
As described above, according to the present invention,
Located on the outside and inside of the area where multiple bump electrodes are present.
Due to the reinforcing protrusions, the electrical connection state of the plurality of protrusion electrodes can be ensured for a long period of time , and moreover, the orientation of the electronic component can be determined and the positioning of the electronic component can be easily performed.

【図面の簡単な説明】[Brief description of drawings]

【図1】電子部品が回路基板に対して搭載されている状
態を示す斜視図。
FIG. 1 is a perspective view showing a state in which electronic components are mounted on a circuit board.

【図2】図1の電子部品の裏面側に設けられた突起電極
と補強用の突起の配置例を示す図。
FIG. 2 is a view showing an arrangement example of a protruding electrode and a reinforcing protrusion provided on the back surface side of the electronic component of FIG.

【図3】図2の突起電極と補強用の突起を用いて電子部
品と回路基板が接続されている状態を示す図。
FIG. 3 is a diagram showing a state in which an electronic component and a circuit board are connected using the protruding electrode and the reinforcing protrusion of FIG.

【図4】電子部品の裏面側における突起電極と補強用の
突起の別の配列例を示す図。
FIG. 4 is a diagram showing another example of arrangement of protruding electrodes and reinforcing protrusions on the back surface side of an electronic component.

【図5】図4における電子部品と回路基板との接続を示
す図。
5 is a diagram showing the connection between the electronic component and the circuit board in FIG.

【図6】本発明の電子部品における接続用の突起電極と
補強用の突起の別の配列パターンを示す図。
FIG. 6 is a diagram showing another arrangement pattern of connection projection electrodes and reinforcement projections in the electronic component of the present invention.

【図7】図6の電子部品と回路基板の接続例を示す図。FIG. 7 is a diagram showing an example of connection between the electronic component of FIG. 6 and a circuit board.

【図8】電子部品の補強用の突起と接続用の突起電極の
別の配列パターンを示す図。
FIG. 8 is a diagram showing another arrangement pattern of reinforcing protrusions and connecting protrusion electrodes of an electronic component.

【図9】電子部品の更に別の補強用の突起および接続用
の突起電極の配列パターンを示す図。
FIG. 9 is a diagram showing an array pattern of yet another reinforcing projection and connection projection electrode of the electronic component.

【図10】電子部品が回路基板に位置決めして搭載され
ている状態を示す斜視図。
FIG. 10 is a perspective view showing a state in which electronic components are positioned and mounted on a circuit board.

【図11】図10の電子部品と回路基板の平面図。11 is a plan view of the electronic component and the circuit board of FIG.

【図12】電子部品の裏面側に接続用の突起電極を有す
る場合に、この電子部品を回路基板に対してマウントす
る際の手順例を示す図。
FIG. 12 is a diagram showing an example of a procedure for mounting an electronic component on a circuit board when the electronic component has a protruding electrode for connection on the back surface side.

【図13】従来のボールグリッドアレイ構造の電子部品
の一例を示す側面図。
FIG. 13 is a side view showing an example of a conventional electronic component having a ball grid array structure.

【図14】通常のバンプ付抵抗を示す斜視図。FIG. 14 is a perspective view showing a normal bumped resistor.

【図15】従来の電子部品を回路基板に対して接続用の
突起電極を介して接続している状態を示す図。
FIG. 15 is a view showing a state in which a conventional electronic component is connected to a circuit board via a connecting projection electrode.

【図16】従来の電子部品の突起電極の配列パターンを
示す図。
FIG. 16 is a diagram showing an array pattern of protruding electrodes of a conventional electronic component.

【図17】従来の電子部品の接続用の突起電極をカメラ
で認識する様子を示す図。
FIG. 17 is a view showing a state in which a camera recognizes a protruding electrode for connection of a conventional electronic component.

【図18】図17におけるカメラによる電子部品の裏面
の認識操作例を示す図。
18 is a diagram showing an example of a recognition operation of the back surface of the electronic component by the camera in FIG.

【符号の説明】 11 接続用の突起電極 20 電子部品 30 回路基板(基板) 40 補強用の突起[Explanation of symbols] 11 Projection electrode for connection 20 electronic components 30 circuit board (board) 40 Reinforcing protrusion

───────────────────────────────────────────────────── フロントページの続き (56)参考文献 特開 平1−238148(JP,A) 特開 昭58−53837(JP,A) 特開 平7−183426(JP,A) 特開 平8−70062(JP,A) 実開 平4−99537(JP,U) (58)調査した分野(Int.Cl.7,DB名) H01L 21/60 311 H01L 23/12 ─────────────────────────────────────────────────── ─── Continuation of the front page (56) Reference JP-A-1-238148 (JP, A) JP-A-58-53837 (JP, A) JP-A-7-183426 (JP, A) JP-A-8- 70062 (JP, A) Actual Kaihei 4-99537 (JP, U) (58) Fields investigated (Int.Cl. 7 , DB name) H01L 21/60 311 H01L 23/12

Claims (3)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】 基板の配線部に電気的に接続するための
複数の突起電極及び前記突起電極と前記基板の配線部の
電気的な接続状態を補強するための補強用の突起を備え
る電子部品において、前記補強用の突起のうちの第1の補強用の突起は、前記
複数の突起電極よりも外側に位置し、前記補強用の突起
のうちの第2の補強用の突起は、前記複数の突起電極よ
りも内側に位置している ことを特徴とする電子部品。
1. A plurality of protruding electrodes for electrically connecting to a wiring portion of a substrate, and a plurality of protruding electrodes and the wiring portion of the substrate.
In an electronic component including a reinforcing protrusion for reinforcing an electrically connected state, a first reinforcing protrusion of the reinforcing protrusions is
The reinforcing protrusions are located outside the plurality of protrusion electrodes.
The second reinforcing protrusion of the
An electronic component characterized by being located inside .
【請求項2】 請求項1に記載の電子部品において、 前記突起電極は、 ボールグリッドアレイ構造を有していることを特徴とす
る電子部品。
2. The electronic component according to claim 1, wherein the protruding electrode has a ball grid array structure.
Electronic components.
【請求項3】 請求項1に記載の電子部品において、 前記補強用の突起は、基板の配線部を有する基板面に配
置されたことを特徴とする電子部品。
3. The electronic component according to claim 1, wherein the reinforcing projections are arranged on a surface of the board having a wiring portion of the board.
Electronic parts characterized by being placed.
JP34448795A 1995-12-05 1995-12-05 Electronic components Expired - Fee Related JP3498461B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP34448795A JP3498461B2 (en) 1995-12-05 1995-12-05 Electronic components

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP34448795A JP3498461B2 (en) 1995-12-05 1995-12-05 Electronic components

Publications (2)

Publication Number Publication Date
JPH09162241A JPH09162241A (en) 1997-06-20
JP3498461B2 true JP3498461B2 (en) 2004-02-16

Family

ID=18369649

Family Applications (1)

Application Number Title Priority Date Filing Date
JP34448795A Expired - Fee Related JP3498461B2 (en) 1995-12-05 1995-12-05 Electronic components

Country Status (1)

Country Link
JP (1) JP3498461B2 (en)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003008186A (en) * 2001-06-21 2003-01-10 Sony Corp Semiconductor device
JP4738996B2 (en) 2004-12-13 2011-08-03 キヤノン株式会社 Semiconductor device
JP4906563B2 (en) * 2007-04-04 2012-03-28 新光電気工業株式会社 Semiconductor device, wiring board, and manufacturing method thereof
JP5538682B2 (en) * 2008-03-06 2014-07-02 ピーエスフォー ルクスコ エスエイアールエル Semiconductor device and manufacturing method thereof
JP2009246166A (en) * 2008-03-31 2009-10-22 Fujitsu Ltd Electronic device package, substrate unit, printed wiring board and method of manufacturing the same
JP2019513488A (en) * 2016-04-18 2019-05-30 カーディアック ペースメイカーズ, インコーポレイテッド Implantable medical device with core circuit support structure

Also Published As

Publication number Publication date
JPH09162241A (en) 1997-06-20

Similar Documents

Publication Publication Date Title
KR100843202B1 (en) Semiconductor package having test pad on both side of substrate and method for testing thereof
KR101167490B1 (en) Single package design for 3-axis magnetic sensor
US5045914A (en) Plastic pad array electronic AC device
US20050070133A1 (en) Device for establishing non-permanent electrical connection between an integrated circuit device lead element and a substrate
US20030173666A1 (en) Semiconductor device
US7131847B2 (en) Test apparatus having intermediate connection board for package
JP2005322921A (en) Flip-chip semiconductor package for testing bumps and method of fabricating same
US6324068B1 (en) Electronic component device, and main board for circuit boards
US20050062151A1 (en) Semiconductor integrated circuit and electronic apparatus having the same
KR0157906B1 (en) Bga package using a dummy ball and a repairing method thereof
JP3498461B2 (en) Electronic components
JP2974436B2 (en) Solder bump formation method
US6340797B1 (en) Printed circuit board having signal patterns of varying widths
US7449364B2 (en) Device and method for including passive components in a chip scale package
JPH08139233A (en) Module component
US6882037B2 (en) Die paddle for receiving an integrated circuit die in a plastic substrate
JP3157817B2 (en) Back electrode type electric component, wiring board for mounting the same, and electric component device including these
JP3555828B2 (en) Semiconductor device provided with circuit board for semiconductor mounting
US6727586B2 (en) Semiconductor component
JPH05110239A (en) Printed wiring board
JP2788196B2 (en) IC board for IC card
JP2534515B2 (en) Electronic component mounting board
JP3583022B2 (en) Semiconductor device
JPS62134939A (en) Hybrid integrated circuit
JP2715586B2 (en) Resin-sealed semiconductor device

Legal Events

Date Code Title Description
FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20071205

Year of fee payment: 4

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20081205

Year of fee payment: 5

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20091205

Year of fee payment: 6

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20091205

Year of fee payment: 6

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20101205

Year of fee payment: 7

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20111205

Year of fee payment: 8

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20111205

Year of fee payment: 8

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20121205

Year of fee payment: 9

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20121205

Year of fee payment: 9

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20131205

Year of fee payment: 10

LAPS Cancellation because of no payment of annual fees