JP3416221B2 - How to determine the optical properties of recording materials - Google Patents
How to determine the optical properties of recording materialsInfo
- Publication number
- JP3416221B2 JP3416221B2 JP26622693A JP26622693A JP3416221B2 JP 3416221 B2 JP3416221 B2 JP 3416221B2 JP 26622693 A JP26622693 A JP 26622693A JP 26622693 A JP26622693 A JP 26622693A JP 3416221 B2 JP3416221 B2 JP 3416221B2
- Authority
- JP
- Japan
- Prior art keywords
- recording material
- transmittance
- reflectance
- coefficient
- values
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- Investigating Or Analysing Materials By Optical Means (AREA)
Description
【０００１】[0001]
【産業上の利用分野】本発明は、印刷機、特にカラー複
写機等に用いる記録材の光学特性値、例えばポイント・
スプレッド・ファンクション（以下ＰＳＦと略す。）の
測定法に関するものである。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an optical characteristic value of a recording material used in a printing machine, especially a color copying machine, for example,
The present invention relates to a spread function (hereinafter abbreviated as PSF) measurement method.
【０００２】[0002]
【従来の技術】記録材の光学的特性、例えば散乱係数、
吸収係数等が印刷適正特にカラー印刷適正との関係で重
要視され、特にＰＳＦとして知られている性質が重視さ
れている。そのＰＳＦの測定法として従来は「光技術ハ
ンドブック」（朝倉書店）Ｐ２５０〜Ｐ２５１に示され
ている手法、即ち記録材に細い光線を垂直あるいは斜め
から入射し、その記録材表面における反射光の強度分布
をＣＣＤ、写真等の画像として取り込み、入射光の強度
分布でデコンボリューションして求めるものがあった。2. Description of the Related Art Optical characteristics of a recording material such as a scattering coefficient,
The absorption coefficient and the like are emphasized in relation to printing suitability, especially color printing suitability, and the property known as PSF is particularly emphasized. As a method of measuring the PSF, conventionally, a method shown in "Optical Technology Handbook" (Asakura Shoten) P250 to P251, that is, a thin light beam is vertically or obliquely incident on the recording material, and the intensity of reflected light on the surface of the recording material There has been a method in which the distribution is captured as an image such as a CCD or a photograph and deconvolved with the intensity distribution of incident light to obtain the distribution.
【０００３】[0003]
【発明が解決しようとする課題】現在普通に使用されて
いる草木等の繊維から製造される紙などからなる記録材
は、入射した光が記録材構造の内部で多重散乱されるた
め、仮に光束の幅が無限小の仮想的な光を記録材表面に
入射したとしても、入射した光はその位置を中心に広が
りを持って記録材表面から出射することになる。その際
の出射光の記録材表面での強度分布が一般にＰＳＦと称
されている。A recording material made of paper or the like, which is commonly used at present, is made of fibers such as vegetation. Since incident light is multiple-scattered inside the recording material structure, the light flux is tentatively changed. Even if virtual light having an infinitely small width is incident on the surface of the recording material, the incident light is spread from the surface of the recording material with a spread centering on that position. The intensity distribution of the emitted light at that time on the surface of the recording material is generally called PSF.
【０００４】記録材に印刷を行なった際のドットゲイ
ン、およびカラー印刷時の色のにじみや不要な混色の原
因は上述の内部散乱による光の広がりである。よってそ
の記録材のＰＳＦを知ることができれば、印刷後のドッ
トゲインや色のにじみの程度を予測することができ、従
ってその記録材の光学特性、換言すれば印刷適性を知る
ことができる。The cause of dot gain when printing on a recording material and color bleeding and unnecessary color mixing during color printing is the spread of light due to the above-mentioned internal scattering. Therefore, if the PSF of the recording material can be known, it is possible to predict the dot gain after printing and the degree of color bleeding, and thus the optical characteristics of the recording material, in other words, the printability.
【０００５】しかし前述した測定方法では光学系は複雑
であり、しかも測定には手間がかかり、ＰＳＦの測定角
度の分布や入射角を変える度に同様な測定を繰り返さな
ければならないという難点があった。また実際の測定で
は、反射光強度の角度分布が記録材表面に垂直な軸に対
して対称でない場合、あるいは位置によって角度分布が
異なるときは測定が困難であり、記録材の光学的性質を
容易かつ正確に把握することは非常に困難なことであっ
た。However, the above-mentioned measuring method has a drawback that the optical system is complicated, and the measurement is time-consuming, and the same measurement must be repeated every time the distribution of the measurement angle of the PSF or the incident angle is changed. . In actual measurement, if the angular distribution of reflected light intensity is not symmetrical with respect to the axis perpendicular to the surface of the recording material, or if the angular distribution differs depending on the position, it is difficult to measure, and the optical properties of the recording material are easy to measure. And it was very difficult to grasp accurately.
【０００６】また現在使用されている記録用紙あるいは
ＯＨＰシート等の記録材は、基材層の上に、所謂コート
層と呼ばれる層が存在しているもの等の多層構造の記録
材が多く、特にこれらの記録材に関しては、前述した方
法を初め、従来法では様々な光学特性値の正確な測定は
極めて困難であった。Many recording materials such as recording sheets or OHP sheets currently used have a multi-layer structure such as a layer having a so-called coat layer on a base material layer, and particularly, With respect to these recording materials, it is extremely difficult to accurately measure various optical characteristic values by the conventional method including the method described above.
【０００７】本発明は上記事情に鑑みてなされたもの
で、その課題とするところはあらゆる記録材に対してＰ
ＳＦ等の光学特性値をより正確かつ容易に求める方法を
提供することにある。The present invention has been made in view of the above circumstances, and its problem is that P is applied to all recording materials.
It is to provide a method of more accurately and easily obtaining optical characteristic values such as SF.
【０００８】[0008]
【課題を解決するための手段】本発明は、（ｉ）予め設
定した記録材の反射係数及び散乱係数を用いて該記録材
内部の光の挙動について近似計算を行って該記録材の反
射率と透過率を計算し、計算値と記録材の反射率および
透過率の測定値とを比較する工程と； （ｉｉ）前記工程（ｉ）における該計算値と測定値とが
等しくない場合には、前記工程（ｉ）を繰り返して、該
計算値と測定値との差が、該記録材の反射率及び透過率
の測定誤差以下となるような、該記録材の反射係数及び
散乱係数の最適値を求める工程と； （ｉｉｉ）前記工程（ｉｉ）で得られた該記録材の反射
係数と散乱係数の最適値を用いて、ポイントスプレッド
ファンクション、ラインスプレッドファンクション、オ
プティカルドットゲイン、分光反射率、不透明度及び白
色度から選ばれる少なくとも１つの該記録材の光学特性
値を求める工程と、を有して成ることを特徴とする記録
材の光学特性値を求める方法
を提供する。また、（ｉ）記録材の入射光に対する反射率（Ｒ）及び
透過率（Ｔ）を測定する工程と； （ｉｉ）該記録材の散乱係数及び反射係数の設定値を、
下記の工程（ａ）〜（ｄ）により、該設定値を用いてモ
ンテカルロ法により算出される反射率とＲとの差、及び
透過率とＴとの差が、Ｒ及びＴの測定誤差以下となるよ
うに最適化する工程と； （ａ）該記録材の散乱係数及び反射係数について、任意
の初期値（ＡＳ * ）及び（ＰＲ * ）を設定し、それらの値
を用いてモンテカルロ法により反射率Ｒ * 及び透過率Ｔ *
を算出する工程と； （ｂ）該散乱係数及び反射係数の任意の初期値（Ａ
Ｓ * 、ＰＲ * ）を微小量変化させ、それらの値を用いてモ
ンテカルロ法により反射率及び透過率を算出し、前記工
程（ａ）で算出したＲ * 及びＴ * との変化の割合ΔＲ及び
ΔＴを求める工程と； （ｃ）該ΔＴ及びΔＲから、Ｒ * ＝Ｒ及びＴ * ＝Ｔとなる
散乱係数（ＡＳ ** ）及び反射係数（ＰＲ ** ）を推定し、
これらＡＳ ** 及びＰＲ ** を用いてモンテカル ロ法により
算出した反射率とＲとの差、及び透過率とＴとの差の有
無を確認する工程と； （ｄ）前記工程（ｃ）において差がある場合に、ＡＳ **
及びＰＲ ** を初期値として設定し、前記工程（ａ）〜
（ｃ）を繰り返す工程； （ｉｉｉ）該記録材の最適化された散乱係数及び反射係
数の値を用いてポイントスプレッドファンクション、ラ
インスプレッドファンクション、オプティカルドットゲ
イン、分光反射率、不透明度及び白色度から選ばれる少
なくとも１つの該記録材の光学特性値を求める工程と、
を有することを特徴とする光学特性値を求める方法を提
供する。 なお、
記録材の入射光に対する反射率（以後Ｒ
と称する）および／または透過率（以後Ｔと称する）を
測定し、次いでそれら測定値から近似計算と最適化手法
により、該記録材の基本的光学特性値を求める工程を、
以後第一段階と称する。また、上記基本的光学特性値に
必要に応じて記録材全体の厚み、各層の厚み等の要素を
さらに加重し、これらの値を基にさらに近似計算を行な
う工程を、以後第二段階と称する。The present invention comprises: (i) setting in advance
Recording material using the specified reflection coefficient and scattering coefficient
Approximate calculation of the internal light behavior was performed to determine the reaction of the recording material.
Emissivity and transmittance are calculated, and the calculated value and the reflectance of the recording material and
A step of comparing the measured value of the transmittance with (ii) the calculated value and the measured value in the step (i)
If not equal, repeat step (i) above
The difference between the calculated value and the measured value is the reflectance and transmittance of the recording material.
And the reflection coefficient of the recording material and
A step of obtaining an optimum value of the scattering coefficient; (iii) reflection of the recording material obtained in the step (ii)
Point spread using optimal values of coefficient and scattering coefficient
Function, line spread function,
Optical dot gain, spectral reflectance, opacity and white
Optical properties of at least one recording material selected from chromaticity
A record comprising a step of obtaining a value and
Provides a method for determining the optical property value of a material . Further, (i) the reflectance (R) of the recording material with respect to incident light and
A step of measuring the transmittance (T); (ii) setting values of the scattering coefficient and the reflection coefficient of the recording material,
Using the set values, the following steps (a) to (d)
Difference between the reflectance calculated by the Monte Carlo method and R, and
The difference between the transmittance and T is less than the measurement error of R and T.
And (a) the scattering coefficient and the reflection coefficient of the recording material are arbitrary.
Initial values (AS * ) and (PR * ) of
Reflectance R * and transmittance T * by Monte Carlo method using
And (b) an arbitrary initial value (A) of the scattering coefficient and the reflection coefficient.
S * , PR * ) is changed by a small amount, and those values are used to monitor
The reflectance and transmittance are calculated by the
The rate of change ΔR with R * and T * calculated in step (a) and
Process and determining a [Delta] T; (c) to the [Delta] T and [Delta] R, the R * = R and T * = T
Estimate the scattering coefficient (AS ** ) and the reflection coefficient (PR ** ),
The Monte Carlo method using these AS ** and PR **
There is a difference between the calculated reflectance and R, and a difference between the transmittance and T.
And (d) if there is a difference in the step (c), AS **
And PR ** are set as initial values, and the steps (a) to
(C) Repeating step; (iii) Optimized scattering coefficient and reflection coefficient of the recording material
The point spread function,
In Spread Function, Optical Dot Game
In, spectral reflectance, opacity and whiteness
At least one step of obtaining an optical characteristic value of the recording material,
Providing a method for obtaining optical characteristic values characterized by having
To serve. The reflectance of the recording material with respect to incident light (hereinafter referred to as R
Measurement) and / or transmittance (hereinafter referred to as T), and then obtaining basic optical characteristic values of the recording material from the measured values by approximate calculation and optimization .
Hereinafter referred to as the first stage . Further , if necessary, factors such as the thickness of the entire recording material and the thickness of each layer are further weighted on the above basic optical characteristic values, and further approximate calculation is performed based on these values.
This process is hereinafter referred to as the second stage .
【０００９】本発明の方法は、１層からなるもの、ある
いは例えばコート紙（基材層：繊維質）やＯＨＰシート
（基材層：透明樹脂層）のような基材層およびコート層
からなる２層構造を有するものに限らず、３層以上の多
層構造の記録材に対しても適用できる。The method of the present invention comprises one layer, or a base layer and a coat layer such as a coated paper (base layer: fibrous material) or an OHP sheet (base layer: transparent resin layer). The present invention can be applied not only to those having a two-layer structure but also to recording materials having a multilayer structure of three or more layers.
【００１０】本発明の方法の第一段階で求めようとする
記録材の基本的光学特性値としては、例えば散乱係数
（以後ＡＳと称する）や反射係数（以後ＰＲと称する）
が、また記録材の光学特性値としては、記録材全体の特
性または各層毎の特性値のいずれであっても良く、前述
のＰＳＦをはじめ、オプティカルドットゲイン、分光反
射率、分光透過率、不透明度、白色度等が挙げられる。The basic optical characteristic value of the recording material to be obtained in the first step of the method of the present invention is, for example, a scattering coefficient (hereinafter referred to as AS) or a reflection coefficient (hereinafter referred to as PR).
However, the optical characteristic value of the recording material may be either the characteristic of the entire recording material or the characteristic value of each layer, such as the above-mentioned PSF, optical dot gain, spectral reflectance, spectral transmittance, Examples include transparency and whiteness.
【００１１】また、本発明で用いる近似計算とは、例え
ばモンテカルロ法や拡散方程式を用いて記録材内部の光
の挙動を再現し、反射率（Ｒ）や透過率（Ｔ）、ＰＳＦ
等の光学特性値を算出するものである。The approximate calculation used in the present invention is to reproduce the behavior of light inside the recording material using, for example, the Monte Carlo method or the diffusion equation to calculate the reflectance (R), the transmittance (T), the PSF.
It is for calculating optical characteristic values such as.
【００１２】図１０に、上記の基本的光学特性値、光学
特性値および近似計算との関係を示した概念図を示し
た。FIG. 10 is a conceptual diagram showing the relationship between the basic optical characteristic value, the optical characteristic value and the approximate calculation described above.
【００１３】記録材表面に入射した光は、記録材内部に
伝播し、その過程で記録材内部構造で何度も衝突して吸
収、散乱される。散乱された光は方向を曲げられ、一部
は再び記録材の表面から出射し、残りは記録材裏面から
出射する。The light incident on the surface of the recording material propagates inside the recording material, and in the process, it collides with the internal structure of the recording material many times and is absorbed and scattered. The scattered light is bent in its direction, part of which is emitted again from the front surface of the recording material, and the rest is emitted from the rear surface of the recording material.
【００１４】１例として、２層構造を持つ記録材の表入
射の場合の光挙動について説明する。図７は、記録材に
光が表側より入射し（図７（ａ））、その後出射する
（図７（ｂ））様子を表わしたものである。出射が表側
のものは反射光であり、裏側のものは透過光である。図
７（ａ）に示した例では、１２本の光線が入射してい
る。各光線の強度が入射時、出射時で全て等しいと仮定
すると、この場合１２本中９本が反射し３本が透過して
いる（図７（ｂ））ことから、反射率は７５％、透過率
は２５％である。図８は図７の光線の中の１本につい
て、記録材中の軌道を表わした図である。As an example, the optical behavior of a recording material having a two-layer structure in the case of front incidence will be described. FIG. 7 shows how light enters the recording material from the front side (FIG. 7A) and then exits (FIG. 7B). The emission on the front side is reflected light, and the emission on the back side is transmitted light. In the example shown in FIG. 7A, 12 light rays are incident. Assuming that the intensities of the respective light rays are equal at the time of incidence and at the time of emission, in this case, 9 out of 12 rays are reflected and 3 out of them are transmitted (FIG. 7 (b)), so that the reflectance is 75%, The transmittance is 25%. FIG. 8 is a diagram showing the orbit in the recording material for one of the light rays in FIG.
【００１５】この例で示したような過程をモンテカルロ
法などの近似計算によって、次のように再現する。今、
モデル空間における記録材の中で、入射光線がある記録
材構造に衝突して散乱される方向と、次の構造に衝突す
るまでに進む距離とを乱数を使って決定し、光強度は衝
突の度にある割合で減少するものとする。これを記録材
から光線が出射するまで計算機中で繰り返し、最終的に
記録材の表もしくは裏から出射した光線の位置、強度、
出射角を記録する。入射光線の数を非常に多くすること
により、その記録材の任意の角度分布のＰＳＦを得るこ
とができる。The process shown in this example is reproduced as follows by an approximate calculation such as the Monte Carlo method. now,
In the recording material in the model space, the direction in which the incident light collides with a certain recording material structure and is scattered, and the distance traveled until it collides with the next structure are determined using random numbers. It shall decrease at a certain rate. This is repeated in the computer until the light beam is emitted from the recording material, and finally the position, intensity, and
Record the exit angle. By making the number of incident light rays very large, it is possible to obtain a PSF having an arbitrary angular distribution of the recording material.
【００１６】図１に、本発明の方法の手順の概略を示
し、具体的なＲおよびＴの測定例を図２に示す。FIG. 1 shows the outline of the procedure of the method of the present invention, and FIG. 2 shows a concrete example of measurement of R and T.
【００１７】ＲおよびＴの測定は、例えば図２のように
記録材２１に光線２３を垂直に入射させて、その反射光
２４と透過光２５とについて積分球２２を用いて行な
う。次に図１の第一段階として、ＲおよびＴで表現され
る光学的性質を持った記録材の中で実際に起こっている
ことをモンテカルロ法、拡散方程式など（光挙動計算）
の近似計算で再現し、記録材の基本的光学特性であるＡ
ＳとＰＲとを求める。ＡＳとはこの場合、光線が記録材
内部を単位距離進む間に平均して何回反射され得るかを
表わす量であり、ＰＲとは記録材内部の構造に光線が衝
突し、散乱された場合の反射率を表わす。ＲとＴとは記
録材のＡＳとＰＲの関数であり、下記式のような関係に
ある。For example, as shown in FIG. 2, the measurement of R and T is performed by making a light ray 23 vertically incident on the recording material 21 and using the integrating sphere 22 for the reflected light 24 and the transmitted light 25. Next, as the first step in FIG. 1, what actually occurs in the recording material having optical properties represented by R and T is Monte Carlo method, diffusion equation, etc. (optical behavior calculation)
Reproduced by the approximate calculation of A, which is the basic optical characteristic of the recording material.
Find S and PR. In this case, AS is an amount that represents how many times a light beam can be reflected on the inside of the recording material on average while traveling a unit distance, and PR is a case where the light beam collides with the structure inside the recording material and is scattered. Represents the reflectance of. R and T are functions of AS and PR of the recording material, and have a relationship as shown in the following formula.
【００１８】[0018]
【数１】Ｒ＝ｆ（ＡＳ，ＰＲ）[Equation 1] R = f (AS, PR)
【００１９】[0019]
【数２】Ｔ＝ｇ（ＡＳ，ＰＲ）この場合、記録材が１層
構造であればＡＳおよびＰＲはそれぞれ１つであるが、
複数の層から成る構造であれば各層ごとにＡＳおよびＰ
Ｒが異なり、またＲおよびＴも例えば光線の入射が記録
表面側からか裏面からかで異なる。従って、例えば図５
のような２層構造の場合は次の式のような関係となる。## EQU2 ## T = g (AS, PR) In this case, if the recording material has a single-layer structure, there are one AS and one PR, respectively.
If the structure consists of multiple layers, AS and P are provided for each layer.
R is different, and R and T are also different depending on whether the incident light beam is from the recording front surface side or the recording back surface side. Therefore, for example, in FIG.
In the case of such a two-layer structure, the relationship is as in the following equation.
【００２０】[0020]
【数３】Ｒ1＝ｆ1（ＡＳa，ＡＳb，ＰＲa，ＰＲb）## EQU3 ## R 1 = f 1 (AS a , AS b , PR a , PR b )
【００２１】[0021]
【数４】Ｒ2＝ｆ2（ＡＳa，ＡＳb，ＰＲa，ＰＲb）## EQU4 ## R 2 = f 2 (AS a , AS b , PR a , PR b )
【００２２】[0022]
【数５】Ｔ1＝ｇ1（ＡＳa，ＡＳb，ＰＲa，ＰＲb）## EQU5 ## T 1 = g 1 (AS a , AS b , PR a , PR b )
【００２３】[0023]
【数６】Ｔ2＝ｇ2（ＡＳa，ＡＳb，ＰＲa，ＰＲb）
式中、ＡＳa、ＰＲa、ＡＳbおよびＰＲbはそれぞれ、図
８のａ層のＡＳ、ＰＲ、ｂ層のＡＳ、ＰＲであり、
Ｒ1、Ｔ1は表入射の場合のＲ、Ｔで、Ｒ2、Ｔ2は裏入射
の場合のＲ、Ｔである。３層以上の構造の場合も、考慮
すべき特性値の数は増すが、概念としては同様である。## EQU6 ## T 2 = g 2 (AS a , AS b , PR a , PR b ) where AS a , PR a , AS b, and PR b are AS, PR, and b of the a layer in FIG. 8, respectively. AS and PR of the layer,
R 1 and T 1 are R and T for front incidence, and R 2 and T 2 are R and T for back incidence. In the case of a structure having three or more layers, the number of characteristic values to be considered increases, but the concept is the same.
【００２４】しかしながら、関数形（上記の場合、ｆ、
ｆ1、ｆ2、ｇ、ｇ1およびｇ2）が未知であるため、Ｒと
Ｔから直接ＡＳとＰＲを求めることはできない。そこ
で、近似計算および最適化手法によってそれらの値を求
めるのである。However, the functional form (in the above case, f,
Since f 1 , f 2 , g, g 1 and g 2 ) are unknown, AS and PR cannot be directly obtained from R and T. Therefore, these values are obtained by approximation calculation and optimization methods.
【００２５】以下に、近似計算の１例として、モンテカ
ルロ法を用いた光挙動計算について述べる。The optical behavior calculation using the Monte Carlo method will be described below as an example of the approximate calculation.
【００２６】光線がある構造に衝突して次の構造に衝突
するまでに進む距離Ｌは、次式によって求められる。The distance L that a light ray travels before striking one structure and striking the next structure is determined by the following equation.
【００２７】[0027]
【数７】Ｌ＝−ｌｏｇ（（ＲＡＮ）／ＡＳ）
ただし式中、ＲＡＮは、０〜１の一様散乱である。これ
は、散乱をモンテカルロ法で扱う際の一般的な式である
が、これ以外に、散乱体の様子を考慮した確率分布を用
いて距離を決定することもできる。## EQU7 ## L = -log ((RAN) / AS) where RAN is a uniform scattering of 0 to 1. This is a general formula for handling scattering by the Monte Carlo method, but in addition to this, it is also possible to determine the distance using a probability distribution that considers the state of the scatterer.
【００２８】衝突後の光線の進む向きは乱数によってラ
ンダムに決定される。これは等方向的散乱をモデル化し
た１つの例であり、これ以外にも散乱強度の角度依存性
を考慮した確率分布を用いて方向を決定することができ
る。The traveling direction of the light beam after the collision is randomly determined by a random number. This is one example in which isotropic scattering is modeled, and the direction can be determined by using a probability distribution in which the angular dependence of scattering intensity is taken into consideration.
【００２９】次に吸収について説明する。ａ、ｂ、・・
・ｍのｍ個の層から成る記録材において、入射光線の強
度がＩ0のとき出射光線の強度Ｉは下記式を用いて決定
する。Next, absorption will be described. a, b, ...
In a recording material composed of m layers of m, when the intensity of the incident light beam is I 0 , the intensity I of the outgoing light beam is determined using the following formula.
【００３０】[0030]
【数８】
ここで、ｎa、ｎb、・・・ｎmはａ、ｂ、・・・ｍの各
層での総散乱回数である。これ以外にも、総軌道距離を
用いる吸収決定法等を用いることができる。[Equation 8] Here, n a , n b , ... N m are the total number of scatterings in each layer of a, b ,. Other than this, an absorption determination method or the like using the total orbital distance can be used.
【００３１】次に、第一段階の最適化手法について、１
層構造の記録材を対象物とした場合の例を説明する。Next, regarding the optimization method of the first stage, 1
An example in which a recording material having a layered structure is used as an object will be described.
【００３２】入射光線の数を非常に多くし、前記操作を
各光線について行なう。記録材の表から出射した光線の
強度の総和を入射光線の総強度で割った値Ｒ*がＲに一
致し、かつ厚さＬの記録材を透過して裏から出射した光
線の強度の総和を入射光線の総強度で割った値Ｔ*がＴ
に一致するようなＡＳとＰＲの値はただ一組存在する。
従って、この値を求めることで記録材の光学的性質を代
表する値であるＡＳとＰＲが決定される。The number of incident light rays is made very large, and the above operation is performed for each light ray. The value R * obtained by dividing the total intensity of the light rays emitted from the surface of the recording material by the total intensity of the incident light rays is equal to R, and the total intensity of the light rays emitted from the back through the recording material having the thickness L. Divided by the total intensity of the incident ray, T * is T
There is only one set of AS and PR values that match
Therefore, by obtaining this value, AS and PR, which are values representative of the optical properties of the recording material, are determined.
【００３３】ＡＳとＰＲの求め方の１例を挙げると、こ
れら特性値に適当な初期値ＡＳ*、ＰＲ*を与え、ＡＳ*
とＰＲ*の値を微小量変化させる前後で前述の第一段階
の作業を行ない、その際に求められたＲ*、Ｔ*の変化の
割合ΔＲおよびΔＴを求める。As an example of the method of obtaining AS and PR, given these initial values, appropriate initial values AS * and PR * are given .
The above-mentioned first step work is performed before and after minute changes in the values of and PR * , and the change rates ΔR and ΔT of R * and T * obtained at that time are obtained.
【００３４】次に、ΔＲおよびΔＴから線形近似最小二
乗法、ラグランジュ（Lagrange）乗数法、模擬アニーリ
ング（simulated annealing）等の最適化手法で、Ｒ*＝
Ｒ、Ｔ*＝Ｔの条件を満たすＡＳ**とＰＲ**を推定し、
前述の作業を行なって、実際にＲ*＝Ｒ、Ｔ*＝Ｔとなっ
ているかどうかを確認する。この条件が満たされていな
い場合は、ＡＳ**、ＰＲ**を初期値としてＲ**、Ｔ**を
求め、ＲとＲ**、ＴとＴ**の差を得て上記のような評価
を行なう。このような操作は、差がＲおよびＴの測定誤
差以下となるまで繰り返す。Next, an optimization method such as a linear approximation least squares method, a Lagrange multiplier method, or a simulated annealing from ΔR and ΔT is used, and R * =
Estimate AS ** and PR ** satisfying the condition of R, T * = T,
Perform the above-mentioned work to confirm whether or not R * = R and T * = T are actually satisfied. When this condition is not satisfied, R ** and T ** are obtained by using AS ** and PR ** as initial values, and the difference between R and R ** and T and T ** is obtained to obtain the above. Make an evaluation. Such an operation is repeated until the difference becomes equal to or less than the measurement error of R and T.
【００３５】さら図１の次の作業である第二段階とし
て、第一段階で求めたＡＳとＰＲで決定される光学的性
質を持った記録材の１点に任意の方向から入射した光線
の反射光の強度および角度の分布をモンテカルロ法を用
いて求める。すなわち、計算機中で記録材の表面の特定
の１点に任意の方向から幅無限小の光線を非常に多数入
射し、モンテカルロ法で各光線を追跡し、出射した光線
の位置と強度と出射角を記録する。こうして求めた出射
光の強度分布すなわちＰＳＦの例を図３および図４に示
す。図３はモンテカルロ法によりレーザープリンター用
紙に垂直に１万本の光線を入射して求めたＰＳＦであ
る。図中、縦軸は入射光強度を１．０としたときの反射
光強度、横軸はスケールで１辺３００μｍである。図４
は入射角２０度で斜めから入射した例であり、横軸のス
ケールは１辺１００μｍである。Further, as a second step, which is the next work of FIG. 1, a ray of light incident from an arbitrary direction on one point of the recording material having the optical property determined by AS and PR obtained in the first step is used. The distribution of reflected light intensity and angle is obtained using the Monte Carlo method. That is, in the computer, a very large number of infinitely small light rays are made incident on one specific point on the surface of the recording material from an arbitrary direction, each light ray is traced by the Monte Carlo method, and the position, intensity and emission angle of the emitted light ray are calculated. To record. An example of the intensity distribution of the emitted light thus obtained, that is, the PSF is shown in FIGS. 3 and 4. FIG. 3 is a PSF obtained by the Monte Carlo method in which 10,000 light rays are vertically incident on the laser printer paper. In the figure, the vertical axis represents the reflected light intensity when the incident light intensity is 1.0, and the horizontal axis represents the scale of 300 μm on each side. Figure 4
Is an example where light is obliquely incident at an incident angle of 20 degrees, and the scale on the horizontal axis is 100 μm on a side.
【００３６】次に、２層構造の記録材を例に挙げて、本
発明の方法の手順を図を用いて詳細に説明する。Next, the procedure of the method of the present invention will be described in detail with reference to the drawings, taking a recording material having a two-layer structure as an example.
【００３７】図６は、図５のような２層構造の記録材に
関する特性値を求める手順の概略を示し、図９は図６の
第一段階の流れを表わすフローチャートである。FIG. 6 shows the outline of the procedure for obtaining the characteristic values for the recording material having the two-layer structure as shown in FIG. 5, and FIG. 9 is a flow chart showing the flow of the first step of FIG.
【００３８】図９において、分光光度計１により記録材
の反射率、透過率を測定する。表入射および裏入射の両
条件での測定を行ない、Ｔ1、Ｒ1、Ｔ2、Ｒ2の４つの測
定値を得る。ここで言う表とは図５のａ層側であり、裏
とはｂ層側である。In FIG. 9, the reflectance and the transmittance of the recording material are measured by the spectrophotometer 1. The measurement is performed under both conditions of front incidence and back incidence, and four measurement values of T 1 , R 1 , T 2 , and R 2 are obtained. The front side here is the layer a side in FIG. 5, and the back side is the layer b side.
【００３９】近似計算部３は光挙動再現計算部４とそれ
以外の部分に分けられる。光挙動再現計算部４は、４つ
の基本的光学特性値ＡＳa *、ＰＲa *、ＡＳb *、ＰＲb *を
入力パラメータとし、前述のモンテカルロ法等の光挙動
再現計算によって、Ｔ1 *、Ｒ 1 *、Ｔ2 *、Ｒ2 *の４つの反
射率、透過率の出力を得る。The approximate calculation unit 3 includes the optical behavior reproduction calculation unit 4 and
It is divided into other parts. Four light behavior reproduction calculation units 4
Basic optical characteristic value ASa *, PRa *, ASb *, PRb *To
As an input parameter, the optical behavior such as the Monte Carlo method described above
By the reproduction calculation, T1 *, R 1 *, T2 *, R2 *The four anti
Obtain the output of emissivity and transmittance.
【００４０】第１回目には初期値として適当なＡＳa *、
ＰＲa *、ＡＳb *、ＰＲb *を与え、モンテカルロ法等の光
挙動再現計算を行なえばよい。In the first time, AS a * , which is appropriate as an initial value,
PR a * , AS b * , and PR b * are given, and the optical behavior reproduction calculation such as the Monte Carlo method may be performed.
【００４１】比較・精度判定手段１０は、測定で得られ
たＴ1、Ｒ1、Ｔ2、Ｒ2の４値と、光挙動再現計算部によ
り得られたＴ1 *、Ｒ1 *、Ｔ2 *、Ｒ2 *の４値を比較し、も
し充分な精度で一致していれば、ＡＳa *、ＰＲa *、ＡＳ
b *、ＰＲb *をこの記録材の基本的光学特性値ＡＳa、Ｐ
Ｒa、ＡＳb、ＰＲbとして出力する。The comparison / accuracy determining means 10 has four values of T 1 , R 1 , T 2 and R 2 obtained by the measurement and T 1 * , R 1 * and T obtained by the optical behavior reproduction calculation section. The 4 values of 2 * and R 2 * are compared, and if they match with each other with sufficient accuracy, AS a * , PR a * , AS
b * , PR b * are the basic optical characteristic values AS a , P of this recording material
R a, AS b, and outputs a PR b.
【００４２】もし充分な精度で一致していなければ、新
パラメータ決定手段１１により、新しいＡＳa *、Ｐ
Ｒa *、ＡＳb *、ＰＲb *を決定し、光挙動再現計算を繰り
返す。If they do not coincide with each other with sufficient accuracy, the new parameter determining means 11 causes new AS a * , P
R a *, AS b *, determines a PR b *, repeated light behavior reproduced calculation.
【００４３】比較・精度判定手段１０、新パラメータ決
定手段１１としては、前述の線形近似最小二乗法、ラグ
ランジュ（Lagrange）乗数法、模擬アニーリング（simu
lated annealing）法などのいわゆる最適化手法を用い
ることができる。The comparison / accuracy determination means 10 and the new parameter determination means 11 are the above-mentioned linear approximation least squares method, Lagrange multiplier method, and simulated annealing (simu).
A so-called optimization method such as a plated annealing) method can be used.
【００４４】引き続き、求めた基本的光学特性値Ａ
Ｓa、ＰＲa、ＡＳb、ＰＲbを基に、さらに前述の如く近
似計算を行なって（第二段階）、ＰＳＦ等の記録材の光
学特性値を求める。Subsequently, the obtained basic optical characteristic value A
Based on S a , PR a , AS b , and PR b , approximation calculation is further performed as described above (second step) to obtain the optical characteristic value of the recording material such as PSF.
【００４５】本発明で扱う記録材の各層毎の基本的光学
特性値、全体の光学特性値等は全て、光の波長に対して
依存性であるのが普通である。それゆえ本発明の方法
は、波長毎に行なうことが本来望ましいが、ある波長区
間の平均値等を用いることもできる。All the basic optical characteristic values and the entire optical characteristic values of each layer of the recording material treated in the present invention are usually dependent on the wavelength of light. Therefore, it is originally desirable to perform the method of the present invention for each wavelength, but an average value or the like of a certain wavelength section can be used.
【００４６】[0046]
【実施例】以下、実施例により本発明を具体的に説明す
る。EXAMPLES The present invention will be specifically described below with reference to examples.
【００４７】（実施例１）記録材として山陽国策パルプ
（株）製のホワイトリサイクルペーパーＥＷ−５００の
記録用紙を用いて光学特性値を求めた。Example 1 Optical characteristic values were obtained using a recording paper such as white recycled paper EW-500 manufactured by Sanyo Kokusaku Pulp Co., Ltd. as a recording material.
【００４８】まず、島津製作所製の島津自記分光光度計
ＵＶ−３１００Ｓを用いて、反射率Ｒと透過率Ｔを測定
した結果、可視波長平均値でＲ＝０．７４、Ｔ＝０．１
３であった。測定時の光学条件は積分球を用いた全拡散
光測定である。この値を基に、紙の散乱係数ＡＳと反射
係数ＰＲを、Ｒ＝０．７４、Ｔ＝０．１３の条件を満た
すようにモンテカルロ法を適用して、ＡＳ＝８４．９／
ｍｍ、ＰＲ＝０．９８８７と決定した。First, the reflectance R and the transmittance T were measured using a Shimadzu self-recording spectrophotometer UV-3100S manufactured by Shimadzu Corporation. As a result, the average visible wavelength was R = 0.74, T = 0.1.
It was 3. The optical condition at the time of measurement is total diffused light measurement using an integrating sphere. Based on this value, the scattering coefficient AS and the reflection coefficient PR of the paper are applied with the Monte Carlo method so as to satisfy the conditions of R = 0.74 and T = 0.13, and AS = 84.9 /
mm, PR = 0.9887 was determined.
【００４９】次にこの値を用いて上記の紙のライン・ス
プレッド・ファンクション（以後ＬＳＦと略す）をモン
テカルロ法による計算により求めた。ここで、ＬＳＦと
はＰＳＦの一種のコンボリューションである。モンテカ
ルロ法による計算値が図１１、上記の紙のＬＳＦ実測値
が図１２である。図１１と図１２においては横軸はスリ
ット状の検出領域の中央部の位置を示し、縦軸は反射光
強度（％）（ナイフエッジから充分離れた位置にある紙
面からの反射光を１００とする）である。測定は、紙面
に鏡面のナイフエッジを配置し、充分広い範囲を斜め上
から４５度の角度で照明し、幅約１０μｍ長さ２５０μ
ｍの微小なスリット状の領域からの反射光を検出して行
なった。図１２は、上記の条件で測定領域をエッジと垂
直方向にエッジをはさんで２００μｍにわたって操作し
た結果である。Next, using this value, the line spread function of the above paper (hereinafter abbreviated as LSF) was obtained by calculation by the Monte Carlo method. Here, LSF is a kind of convolution of PSF. FIG. 11 shows calculated values by the Monte Carlo method, and FIG. 12 shows measured LSF values of the above paper. 11 and 12, the horizontal axis represents the position of the central portion of the slit-shaped detection area, and the vertical axis represents the reflected light intensity (%) (the reflected light from the paper surface at a position sufficiently separated from the knife edge is 100). Yes). The measurement is performed by arranging the knife edge of the mirror surface on the paper surface and illuminating a sufficiently wide range at an angle of 45 degrees from diagonally above, width about 10 μm and length 250 μ
The measurement was performed by detecting the reflected light from the minute slit-shaped area of m. FIG. 12 shows the result of operating the measurement area for 200 μm across the edge in the direction perpendicular to the edge under the above conditions.
【００５０】なおここで、図１２の最高値が１００％を
超えているのは、実測値のバラツキのためである。Note that the maximum value in FIG. 12 exceeds 100% because of variations in the actual measurement values.
【００５１】図１１と図１２を比較すると両者はよく相
関し、本発明の方法は記録材の光学的特性値判定方法と
して有用であることが明らかである。Comparing FIG. 11 and FIG. 12, it is clear that the two correlate well and that the method of the present invention is useful as a method for determining the optical characteristic value of the recording material.
【００５２】（実施例２）次に、図８に示したような２
層構造で、コート層および紙層から成るコート紙につい
て、本発明の光線追跡を光線１万本に関して行ない、計
算を実施した。その結果得られた特性値からＰＳＦを求
め、実測の結果と比較したところ、両者の間には良好な
一致が見られ、本発明の方法により得られた光学的特性
値は実測結果を良好に反映することがわかった。(Embodiment 2) Next, as shown in FIG.
The ray tracing of the present invention was performed on 10,000 coated rays in a coated paper having a layered structure and comprising a coated layer and a paper layer, and calculations were performed. When PSF was calculated from the obtained characteristic values and compared with the actual measurement results, a good agreement was found between the two, and the optical characteristic values obtained by the method of the present invention showed that the actual measurement results were good. It turned out to reflect.
【００５３】[0053]
【発明の効果】以上説明した通り、本発明では記録材の
透過率と吸収率の測定値を基に、モンテカルロ法などの
近似計算によってＰＳＦを求めることができる。従っ
て、複雑な光学系も画像処理装置も必要とせず、ひとた
びＡＳ、ＰＲの値を求めれば、何度も煩わしい測定を行
なうことなく、任意の入射角で任意の角度分布における
ＰＳＦを何度でも求めることができる。さらに、本発明
の方法は、単層、２層の記録材に限らず、３層以上の多
層構造の記録材における特性値決定においても有効であ
り、従来法より正確な値を容易に求めることができる。As described above, in the present invention, the PSF can be obtained by an approximate calculation such as the Monte Carlo method based on the measured values of the transmittance and the absorptance of the recording material. Therefore, a complicated optical system and an image processing device are not required, and once the values of AS and PR are obtained, the PSF at an arbitrary incident angle and an arbitrary angular distribution can be repeatedly calculated without any troublesome measurement. You can ask. Further, the method of the present invention is effective not only for the recording material having a single layer or two layers but also for determining the characteristic value in the recording material having a multilayer structure of three or more layers, and it is possible to easily obtain a more accurate value than the conventional method. You can
【図１】本発明の記録材の光学特性値推定法の流れを示
す概略図である。FIG. 1 is a schematic diagram showing a flow of a method for estimating an optical characteristic value of a recording material of the present invention.
【図２】反射率および吸収率の測定法の１例を示す概略
図である。FIG. 2 is a schematic diagram showing an example of a method for measuring reflectance and absorptance.
【図３】本発明を実施して求められたＰＳＦの例を示し
た図である。FIG. 3 is a diagram showing an example of PSF obtained by carrying out the present invention.
【図４】本発明を実施して求められたＰＳＦの別の例を
示した図である。FIG. 4 is a diagram showing another example of PSF obtained by carrying out the present invention.
【図５】２層構造の記録材の各層の基本的光学特性値を
示す図である。FIG. 5 is a diagram showing basic optical characteristic values of each layer of a recording material having a two-layer structure.
【図６】本発明の２層構造の記録材の光学特性値推定法
の流れを示す概略図である。FIG. 6 is a schematic diagram showing a flow of an optical characteristic value estimation method for a recording material having a two-layer structure of the present invention.
【図７】２層記録材における光線の入射と出射を模式的
に表わす図である。FIG. 7 is a diagram schematically showing incidence and emission of light rays on a two-layer recording material.
【図８】２層記録材における１光線の軌道追跡と吸収を
表わす模式図である。FIG. 8 is a schematic diagram showing trajectory tracking and absorption of one ray in a two-layer recording material.
【図９】図６の本発明の第一段階の手順を示すフローチ
ャートである。9 is a flowchart showing a procedure of a first step of the present invention in FIG.
【図１０】本発明における、基本的光学特性値、近似計
算および光学特性値との間の関連を示す概略図である。FIG. 10 is a schematic diagram showing a relationship between a basic optical characteristic value, an approximate calculation, and an optical characteristic value in the present invention.
【図１１】本発明におけるＬＳＦ計算値を示すグラフで
ある。FIG. 11 is a graph showing LSF calculated values according to the present invention.
【図１２】本発明におけるＬＳＦ実測値を示すグラフで
ある。FIG. 12 is a graph showing measured LSF values in the present invention.
１ 分光光度計 ２ 反射率、透過率データ ３ 近似計算部 ４ 光挙動計算部 ５ 光線入射部 ６ 散乱吸収部 ７ 光線出射部 ８ 反射率、透過率データ ９ 基本的光学特性値パラメータ １０ 比較・精度判定手段 １１ 新パラメータ決定手段 １２ 基本的光学特性 ２１ 記録材 ２２ 積分球 ２３ 入射光 ２４ 反射光 ２５ 透過光 1 spectrophotometer 2 Reflectance and transmittance data 3 Approximate calculation section 4 Light behavior calculator 5 Light incident part 6 Scatterer 7 Light emitting part 8 Reflectance and transmittance data 9 Basic optical characteristic value parameters 10 Comparison / accuracy determination means 11 New parameter determination means 12 Basic optical characteristics 21 recording material 22 integrating sphere 23 incident light 24 reflected light 25 transmitted light
───────────────────────────────────────────────────── フロントページの続き (72)発明者 中井 逹也 北海道札幌市西区西野一条一丁目６−10 (58)調査した分野(Int.Cl.7，ＤＢ名) G01N 21/00 - 21/01 G01N 21/17 - 21/61 ＪＯＩＳ、ＰＡＴＯＬＩＳ─────────────────────────────────────────────────── ─── Continued Front Page (72) Inventor Tatsuya Nakai 1-6-10 Nishino 1-chome, Nishi-ku, Sapporo-shi, Hokkaido (58) Fields investigated (Int.Cl. 7 , DB name) G01N 21/00-21/01 G01N 21/17-21/61 JOIS, PATOLIS
Claims (10)
び散乱係数を用いて該記録材内部の光の挙動について近
似計算を行って該記録材の反射率と透過率を計算し、計
算値と記録材の反射率および透過率の測定値とを比較す
る工程と； （ｉｉ）前記工程（ｉ）における該計算値と測定値とが
等しくない場合には、前記工程（ｉ）を繰り返して、該
計算値と測定値との差が、該記録材の反射率及び透過率
の測定誤差以下となるような、該記録材の反射係数及び
散乱係数の最適値を求める工程と； （ｉｉｉ）前記工程（ｉｉ）で得られた該記録材の反射
係数と散乱係数の最適値を用いて、ポイントスプレッド
ファンクション、ラインスプレッドファンクション、オ
プティカルドットゲイン、分光反射率、不透明度及び白
色度から選ばれる少なくとも１つの該記録材の 光学特性
値を求める工程と、を有して成ることを特徴とする記録
材の光学特性値を求める方法。1. (i) The reflection coefficient of a recording material set in advance
And the scattering coefficient are used to perform a similarity calculation on the behavior of light inside the recording material to calculate the reflectance and the transmittance of the recording material,
Compare the calculated value with the measured reflectance and transmittance of the recording material.
That step a; (ii) the said calculated value in step (i) and the measured value
If not equal, repeat step (i) above
The difference between the calculated value and the measured value is the reflectance and transmittance of the recording material.
And the reflection coefficient of the recording material and
A step of obtaining an optimum value of the scattering coefficient; (iii) reflection of the recording material obtained in the step (ii)
Point spread using optimal values of coefficient and scattering coefficient
Function, line spread function,
Optical dot gain, spectral reflectance, opacity and white
At least one method for determining the optical property of the recording material, characterized the step of obtaining the optical characteristic value, by comprising a of the recording material selected from the chromaticity.
係数と散乱係数の最適値を用いて、該記録材の表面の１
点に任意の方向から入射した光線の反射光の強度および
角度の分布を求めることにより、該記録材の光学特性値
としてのポイントスプレッドファンクションを求める工
程を有する請求項１に記載の方法。 2. The step (iii) comprises the step of reflecting the recording material.
Using the optimum values of the coefficient and the scattering coefficient, 1 of the surface of the recording material is used.
The intensity of the reflected light of a ray incident on the point from any direction and
The optical characteristic value of the recording material is obtained by obtaining the distribution of angles.
As a point spread function as
The method of claim 1, wherein the method comprises:
ンテカルロ法を用いて求める請求項２記載の方法。 3. The distribution of intensity and angle of the reflected light is
The method according to claim 2, which is obtained by using the Monte Carlo method.
３のいずれか１項に記載の方法。Wherein to the recording material is no claim 1 consisting of one layer
The method according to any one of the three.
の各層について、前記工程（ｉ）及び（ｉｉ）を行っ
て、各層の反射係数及び散乱係数の最適値を求め、各々
の層の反射係数及び散乱係数の最適値を用いて前記工程
（ｉｉｉ）を行う請求項１ないし３のいずれか１項に記
載の方法。 Wherein Ri formed the recording material is a plurality of layers, each layer of the recording medium, performing the step (i) and (ii)
The optimum value of the reflection coefficient and scattering coefficient of each layer.
Using the optimum values of the reflection coefficient and the scattering coefficient of the layer of
The method according to any one of claims 1 to 3, wherein (iii) is performed.
How to list.
方法。6. The method according to claim 5, wherein said recording material comprises two layers.
て、該記録材の記録表面および裏面への入射光について
の測定値を用いる請求項５または６に記載の方法。As 7. Measurements of the reflectivity and the transmittance method according to claim 5 or 6 using the measurement values of the incident light on the recording surface and the back surface of the recording material.
て、該記録材の記録表面および裏面への入射角の異なる
複数の入射光についての複数の測定値を用いる請求項５
または６に記載の方法。As 8. Measurements of the reflectivity and the transmittance claim using a plurality of measurements for different incident light of the incident angle of the recording surface and the back surface of the recording material 5
Or the method according to 6 .
モンテカルロ法で行う請求項１ないし８のいずれか１項
に記載の方法。 9. The approximation calculation in the step (ii)
9. The method according to claim 1, wherein the Monte Carlo method is used.
The method described in.
（Ｒ）及び透過率（Ｔ）を測定する工程と； （ｉｉ）該記録材の散乱係数及び反射係数の設定値を、
下記の工程（ａ）〜（ｄ）により、該設定値を用いてモ
ンテカルロ法により算出される反射率とＲとの差、及び
透過率とＴとの差が、Ｒ及びＴの測定誤差以下となるよ
うに最適化する工程と； （ａ）該記録材の散乱係数及び反射係数について、任意
の初期値（ＡＳ * ）及び（ＰＲ * ）を設定し、それらの値
を用いてモンテカルロ法により反射率Ｒ * 及び透過率Ｔ *
を算出する工程と； （ｂ）該散乱係数及び反射係数の任意の初期値（Ａ
Ｓ * 、ＰＲ * ）を微小量変化させ、それらの値を用いてモ
ンテカルロ法により反射率及び透過率を算出し、前記工
程（ａ）で算出したＲ * 及びＴ * との変化の割合ΔＲ及び
ΔＴを求める工程と； （ｃ）該ΔＴ及びΔＲから、Ｒ * ＝Ｒ及びＴ * ＝Ｔとなる
散乱係数（ＡＳ ** ）及び反射係数（ＰＲ ** ）を推定し、
これらＡＳ ** 及びＰＲ ** を用いてモンテカルロ法により
算出した反射率とＲとの差、及び透過率とＴとの差の有
無を確認する工程と； （ｄ）前記工程（ｃ）において差がある場合に、ＡＳ **
及びＰＲ ** を初期値として設定し、前記工程（ａ）〜
（ｃ）を繰り返す工程； （ｉｉｉ）該記録材の最適化された散乱係数及び反射係
数の値を用いてポイントスプレッドファンクション、ラ
インスプレッドファンクション、オプティカルドットゲ
イン、分光反射率、不透明度及び白色度から選ばれる少
なくとも１つの該記録材の光学特性値を求める工程と、
を有することを特徴とする光学特性値を求める方法。 10. (i) Reflectance of recording material to incident light
A step of measuring (R) and a transmittance (T); (ii) setting values of a scattering coefficient and a reflection coefficient of the recording material,
Using the set values, the following steps (a) to (d)
Difference between the reflectance calculated by the Monte Carlo method and R, and
The difference between the transmittance and T is less than the measurement error of R and T.
And (a) the scattering coefficient and the reflection coefficient of the recording material are arbitrary.
Initial values (AS * ) and (PR * ) of
Reflectance R * and transmittance T * by Monte Carlo method using
And (b) an arbitrary initial value (A) of the scattering coefficient and the reflection coefficient.
S * , PR * ) is changed by a small amount, and those values are used to monitor
The reflectance and transmittance are calculated by the
The rate of change ΔR with R * and T * calculated in step (a) and
Process and determining a [Delta] T; (c) to the [Delta] T and [Delta] R, the R * = R and T * = T
Estimate the scattering coefficient (AS ** ) and the reflection coefficient (PR ** ),
By using these AS ** and PR ** by Monte Carlo method
There is a difference between the calculated reflectance and R, and a difference between the transmittance and T.
And (d) if there is a difference in the step (c), AS **
And PR ** are set as initial values, and the steps (a) to
(C) Repeating step; (iii) Optimized scattering coefficient and reflection coefficient of the recording material
The point spread function,
In Spread Function, Optical Dot Game
In, spectral reflectance, opacity and whiteness
At least one step of obtaining an optical characteristic value of the recording material,
A method for obtaining an optical characteristic value, which comprises:
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP26622693A JP3416221B2 (en) | 1992-11-06 | 1993-10-25 | How to determine the optical properties of recording materials |
Applications Claiming Priority (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP29726792 | 1992-11-06 | ||
| JP5-236168 | 1993-09-22 | ||
| JP4-297267 | 1993-09-22 | ||
| JP23616893 | 1993-09-22 | ||
| JP26622693A JP3416221B2 (en) | 1992-11-06 | 1993-10-25 | How to determine the optical properties of recording materials |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH07140070A JPH07140070A (en) | 1995-06-02 |
| JP3416221B2 true JP3416221B2 (en) | 2003-06-16 |
Family
ID=27332340
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP26622693A Expired - Fee Related JP3416221B2 (en) | 1992-11-06 | 1993-10-25 | How to determine the optical properties of recording materials |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP3416221B2 (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP3681142A1 (en) * | 2019-01-14 | 2020-07-15 | GMG GmbH & Co. KG | Method for estimating an expected spectral reflection value of a layer system |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5783564B2 (en) * | 2011-08-15 | 2015-09-24 | 国立大学法人神戸大学 | Calculation method of effective scattering coefficient of three-dimensional light scatterer |
-
1993
- 1993-10-25 JP JP26622693A patent/JP3416221B2/en not_active Expired - Fee Related
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP3681142A1 (en) * | 2019-01-14 | 2020-07-15 | GMG GmbH & Co. KG | Method for estimating an expected spectral reflection value of a layer system |
| WO2020148177A1 (en) * | 2019-01-14 | 2020-07-23 | Gmg Gmbh & Co.Kg | Method for estimating a spectral reflectance value to be expected of a layer system |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH07140070A (en) | 1995-06-02 |
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