JP3351303B2 - Method of bonding electronic components with bumps - Google Patents

Method of bonding electronic components with bumps

Info

Publication number
JP3351303B2
JP3351303B2 JP19670197A JP19670197A JP3351303B2 JP 3351303 B2 JP3351303 B2 JP 3351303B2 JP 19670197 A JP19670197 A JP 19670197A JP 19670197 A JP19670197 A JP 19670197A JP 3351303 B2 JP3351303 B2 JP 3351303B2
Authority
JP
Japan
Prior art keywords
bump
bumps
electronic component
electrode
bonding
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP19670197A
Other languages
Japanese (ja)
Other versions
JPH1140612A (en
Inventor
一雄 有門
雅史 桧作
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Corp
Panasonic Holdings Corp
Original Assignee
Panasonic Corp
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Panasonic Corp, Matsushita Electric Industrial Co Ltd filed Critical Panasonic Corp
Priority to JP19670197A priority Critical patent/JP3351303B2/en
Publication of JPH1140612A publication Critical patent/JPH1140612A/en
Application granted granted Critical
Publication of JP3351303B2 publication Critical patent/JP3351303B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/74Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies and for methods related thereto
    • H01L2224/75Apparatus for connecting with bump connectors or layer connectors
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/74Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies and for methods related thereto
    • H01L2224/75Apparatus for connecting with bump connectors or layer connectors
    • H01L2224/7501Means for cleaning, e.g. brushes, for hydro blasting, for ultrasonic cleaning, for dry ice blasting, using gas-flow, by etching, by applying flux or plasma

Landscapes

  • Wire Bonding (AREA)

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、バンプ付電子部品
のバンプを基板などのワークの電極にボンディングする
バンプ付電子部品のボンディング装置に関するものであ
る。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a device for bonding electronic components with bumps, which bonds the bumps of the electronic component with bumps to electrodes of a work such as a substrate.

【0002】[0002]

【従来の技術】フリップチップなどのバンプ付電子部品
を基板などのワークに実装する方法として、吸着ツール
を用いる方法が知られている。この方法は、吸着ツール
の下面に真空吸着されたバンプ付電子部品のバンプをワ
ークの電極に押し付けてボンディングするものであり、
この場合、ボンディング効果を高めるために、吸着ツー
ルに超音波振動を付与することが知られている。
2. Description of the Related Art As a method of mounting an electronic component with a bump such as a flip chip on a work such as a substrate, a method using a suction tool is known. In this method, a bump of an electronic component with a bump that is vacuum-sucked on the lower surface of a suction tool is pressed against an electrode of a work and bonded.
In this case, it is known to apply ultrasonic vibration to the suction tool in order to enhance the bonding effect.

【0003】[0003]

【発明が解決しようとする課題】ところで、バンプの表
面は円滑な球面ではなく凹凸のある粗面である。このた
めバンプがボンディングされたワークの電極表面との間
に微小なすき間が生じ、ボンディング性や導電性が低下
しやすいという問題点があった。
The surface of the bump is not a smooth spherical surface but a rough surface having irregularities. For this reason, there is a problem that a minute gap is generated between the bump and the electrode surface of the work to which the bump is bonded, and that the bonding property and the conductivity are easily reduced.

【0004】したがって本発明は、その表面に凹凸のあ
るバンプをワークの電極にしっかりボンディングできる
バンプ付電子部品のボンディング方法を提供することを
目的とする。
SUMMARY OF THE INVENTION Accordingly, an object of the present invention is to provide a method of bonding electronic parts with bumps, which can firmly bond bumps having irregularities on the surface to electrodes of a work.

【0005】[0005]

【課題を解決するための手段】本発明のバンプ付電子部
品のボンディング方法は、吸着ツールに保持されたバン
プ付電子部品のバンプをワークの電極に着地させ、バン
プ付電子部品に大きな超音波振動を付与しながら小さな
荷重を付与することにより、バンプと電極の接触面を機
械摩擦によりクリーニングしながら平滑化する第1工程
と、次いでバンプ付電子部品に付与する超音波振動を小
さくするとともに荷重を大きくすることにより、バンプ
と電極の間のすき間を押しつぶして接触面積を拡大し、
バンプを電極にボンディングする第2工程と、を含む。
According to the method of bonding an electronic component with a bump of the present invention, a bump of the electronic component with a bump held by a suction tool lands on an electrode of a work, and a large ultrasonic vibration is applied to the electronic component with a bump. By applying a small load while applying a force, the first step of cleaning the contact surface between the bump and the electrode by mechanical friction while smoothing, and then reducing the ultrasonic vibration applied to the electronic component with the bump and reducing the load. By increasing the size, the gap between the bump and the electrode is crushed to increase the contact area,
Bonding the bump to the electrode.

【0006】[0006]

【発明の実施の形態】上記構成の本発明によれば、バン
プと電極の接触面を機械摩擦によりクリーニングしなが
ら平滑化した後、バンプと電極の間のすき間を押しつぶ
して接触面積を拡大し、バンプを電極にしっかりボンデ
ィングできる。
According to the present invention having the above-described structure, after the contact surface between the bump and the electrode is smoothed while being cleaned by mechanical friction, the gap between the bump and the electrode is crushed to enlarge the contact area. The bump can be firmly bonded to the electrode.

【0007】以下、本発明の実施の形態を図面を参照し
て説明する。図1は、本発明の一実施の形態のバンプ付
電子部品のボンディング装置の正面図、図2は同バンプ
付電子部品のボンディング工程図、図3は同バンプ付電
子部品のバンプのボンディング中の部分拡大図、図4
(a)は同バンプ付電子部品の荷重の経時変化図、図4
(b)は同バンプ付電子部品の超音波振動力の経時変化
図である。
Hereinafter, embodiments of the present invention will be described with reference to the drawings. FIG. 1 is a front view of a bonding apparatus for an electronic component with bumps according to an embodiment of the present invention, FIG. 2 is a bonding process diagram of the electronic component with bumps, and FIG. Partial enlarged view, FIG.
FIG. 4A is a graph showing the change over time in the load of the electronic component with bumps, FIG.
(B) is a time-dependent change diagram of the ultrasonic vibration force of the electronic component with bumps.

【0008】まず、図1を参照してバンプ付電子部品の
圧着装置の全体構造を説明する。1は支持フレームであ
って、その前面には第1昇降板2と第2昇降板3が昇降
自在に設けられている。第1昇降板2にはシリンダ4が
装着されており、そのロッド5は第2昇降板3に結合さ
れている。第2昇降板3にはボンディングヘッド10が
装着されている。支持フレーム1の上面にはZ軸モータ
6が設けられている。Z軸モータ6は垂直な送りねじ7
を回転させる。送りねじ7は第1昇降板2の背面に設け
られたナット8に螺合している。したがってZ軸モータ
6が駆動して送りねじ7が回転すると、ナット8は送り
ねじ7に沿って上下動し、第1昇降板2や第2昇降板3
も上下動する。
First, the overall structure of a crimping apparatus for an electronic component with bumps will be described with reference to FIG. Reference numeral 1 denotes a support frame, on the front surface of which a first lifting plate 2 and a second lifting plate 3 are provided so as to be able to move up and down. A cylinder 4 is mounted on the first lifting plate 2, and its rod 5 is connected to the second lifting plate 3. The bonding head 10 is mounted on the second lifting plate 3. On the upper surface of the support frame 1, a Z-axis motor 6 is provided. The Z-axis motor 6 has a vertical feed screw 7
To rotate. The feed screw 7 is screwed into a nut 8 provided on the back surface of the first lifting plate 2. Therefore, when the Z-axis motor 6 is driven and the feed screw 7 is rotated, the nut 8 moves up and down along the feed screw 7, and the first lifting plate 2 and the second lifting plate 3
Also move up and down.

【0009】図1において、基板32は基板ホルダ34
上に載せられており、基板ホルダ34はテーブル35上
に載せられている。テーブル35は可動テーブルであっ
て、基板32をX方向やY方向へ水平移動させ、基板3
2を所定の位置に位置決めする。
In FIG. 1, a substrate 32 is a substrate holder 34.
The substrate holder 34 is placed on a table 35. The table 35 is a movable table, and moves the substrate 32 horizontally in the X direction and the Y direction.
2 is positioned at a predetermined position.

【0010】42はカメラであって、一軸テーブル43
に装着されている。44はカメラ42から前方へ延出す
る鏡筒である。カメラ42を一軸テーブル43に沿って
前進させ、鎖線で示すように鏡筒44の先端部を吸着ツ
ール22の下面に吸着して保持されたフリップチップ3
0と基板32の間に位置させ、その状態でフリップチッ
プ30と基板32の位置をカメラ42で観察する。そし
てこの観察結果によりフリップチップ30と基板32の
相対的な位置ずれを検出する。検出された位置ずれは、
テーブル35を駆動して基板32をX方向やY方向へ水
平移動させることにより補正し、これによりフリップチ
ップ30のバンプ31と基板32の電極33(図2)の
位置合わせがなされる。
Reference numeral 42 denotes a camera, which is a uniaxial table 43
It is attached to. Reference numeral 44 denotes a lens barrel extending forward from the camera 42. The camera 42 is moved forward along the one-axis table 43, and the tip of the lens barrel 44 is sucked and held on the lower surface of the suction tool 22 as shown by a chain line.
The position of the flip chip 30 and the substrate 32 is observed by the camera 42 in this state. Then, the relative displacement between the flip chip 30 and the substrate 32 is detected based on the observation result. The detected displacement is
The correction is performed by driving the table 35 to horizontally move the substrate 32 in the X direction or the Y direction, whereby the bumps 31 of the flip chip 30 and the electrodes 33 (FIG. 2) of the substrate 32 are aligned.

【0011】図1において、50は主制御部であり、モ
ータ駆動部51を介してZ軸モータ6を制御し、またテ
ーブル制御部52を介してテーブル35を制御し、また
認識部53を介してカメラ42に接続されている。また
シリンダ4は荷重制御部54を介して主制御部50に接
続されており、シリンダ4のロッド5の突出力すなわち
圧着ツール22でフリップチップ30を基板32に押し
付ける力が制御される。本実施の形態では、シリンダ4
としてエアーシリンダを用い、また荷重制御部54とし
て主制御部50によって空気圧をデジタル的に制御する
電空レギュレータを用いている。
In FIG. 1, reference numeral 50 denotes a main control unit, which controls the Z-axis motor 6 via a motor drive unit 51, controls the table 35 via a table control unit 52, and receives a control signal via a recognition unit 53. Connected to the camera 42. Further, the cylinder 4 is connected to the main control unit 50 via a load control unit 54, and the protrusion output of the rod 5 of the cylinder 4, that is, the force of pressing the flip chip 30 against the substrate 32 by the crimping tool 22 is controlled. In the present embodiment, the cylinder 4
An air-pneumatic regulator for digitally controlling the air pressure by the main control unit 50 is used as the load control unit 54.

【0012】図1において、ボンディングヘッド10は
本体11を主体にしており、本体11の下部に圧着ユニ
ット12が設けられている。圧着ユニット12は棒状の
ホーン21を主体としており、ホーン21の中央部にフ
リップチップ30を真空吸着して保持する吸着ツール2
2を有している。またホーン21には超音波振動手段と
しての圧電素子19が装着されている。圧電素子19
は、超音波振動子駆動部55で駆動される。
In FIG. 1, a bonding head 10 mainly includes a main body 11, and a crimping unit 12 is provided below the main body 11. The crimping unit 12 is mainly composed of a rod-shaped horn 21, and a suction tool 2 for vacuum-holding and holding the flip chip 30 at the center of the horn 21.
Two. The horn 21 is provided with a piezoelectric element 19 as ultrasonic vibration means. Piezoelectric element 19
Are driven by the ultrasonic transducer driving unit 55.

【0013】このバンプ付電子部品のボンディング装置
は上記のように構成されており、次に全体の動作を説明
する。図1において、吸着ツール22の下面にフリップ
チップ30を保持し、フリップチップ30を基板32の
上方に位置させる。そこで鏡筒44を前進させてカメラ
42でフリップチップ30と基板32の画像を入手し、
認識部53へ画像データが送られる。認識部53はこの
画像データからフリップチップ30と基板32の相対的
な位置ずれを検出して主制御部50へ出力し、主制御部
50はこの検出結果にしたがってテーブル制御部52に
指令を送りテーブル35を駆動して、基板32を水平移
動させて位置ずれを補正する。
The bonding apparatus for an electronic component with bumps is configured as described above. Next, the overall operation will be described. In FIG. 1, the flip chip 30 is held on the lower surface of the suction tool 22, and the flip chip 30 is positioned above the substrate 32. Then, the lens barrel 44 is advanced, and the images of the flip chip 30 and the substrate 32 are obtained by the camera 42.
The image data is sent to the recognition unit 53. The recognizing unit 53 detects a relative displacement between the flip chip 30 and the substrate 32 from the image data and outputs it to the main control unit 50. The main control unit 50 sends a command to the table control unit 52 according to the detection result. The table 35 is driven and the substrate 32 is moved horizontally to correct the displacement.

【0014】次にZ軸モータ6が駆動してボンディング
ヘッド10は下降し、フリップチップ30のバンプ31
を基板32の電極33上に着地させ、シリンダ4を駆動
して荷重付与を開始する(図2(a)および図4(a)
のタイミングt1)。次にシリンダ4による荷重を徐々
に増大させてバンプ31を電極33に徐々に強く押しつ
けるとともに、吸着ツール22の超音波振動を開始する
(図4(b)のタイミングt2)。
Next, the Z-axis motor 6 is driven to lower the bonding head 10 and the bumps 31 of the flip chip 30.
Is landed on the electrode 33 of the substrate 32, and the cylinder 4 is driven to start applying a load (FIGS. 2A and 4A).
Timing t1). Next, the load by the cylinder 4 is gradually increased, and the bump 31 is gradually and strongly pressed against the electrode 33, and the ultrasonic vibration of the suction tool 22 is started (timing t2 in FIG. 4B).

【0015】図4に示すように、シリンダ4の押圧力に
よりバンプ31に加えられる荷重はt1からt3まで徐
々に増大される。またその間(t2〜t3の間)、バン
プ31には強い超音波振動力F1が加えられる。このt
1〜t3は第1工程であって、バンプ31は強く超音波
振動することにより、図3(a)においてバンプ31と
電極33の接触面は機械的に摩擦され、これによりこの
接触面は強くクリーニングされながら平滑化される。な
お図3(a)は第1工程の開始当初の状態を示すもので
あって、図示するように、バンプ31や電極33の表面
は粗面であって凹凸があり、両者の間には微小なすき間
Gが存在する。またバンプ31や電極33の表面には酸
化膜などの汚れが生じやすい。ただし金バンプや金電極
の場合は酸化膜は生じない。図2(b)は、上記した第
1工程を示している。
As shown in FIG. 4, the load applied to the bump 31 by the pressing force of the cylinder 4 is gradually increased from t1 to t3. During that time (between t2 and t3), a strong ultrasonic vibration force F1 is applied to the bump 31. This t
1 to t3 is a first step. The contact surface between the bump 31 and the electrode 33 is mechanically rubbed by the ultrasonic vibration of the bump 31 in FIG. It is smoothed while being cleaned. FIG. 3A shows a state at the beginning of the first step. As shown, the surfaces of the bumps 31 and the electrodes 33 are rough and have irregularities. A gap G exists. In addition, the surface of the bump 31 or the electrode 33 is liable to be stained by an oxide film or the like. However, in the case of a gold bump or a gold electrode, no oxide film is formed. FIG. 2B shows the above-described first step.

【0016】図4(a)において、t3からt4までの
第2工程では大きな荷重の付与が継続され、また超音波
振動力はF1からF2に減力される。これにより上記す
き間Gは押しつぶされてバンプ31と電極33の接触面
積は拡大し(図3(b))、かつ両者の接合部は融合
し、あるいは合金が生じる(図2(c))。ハッチング
を付した部分34は融合部若しくは合金部である。次い
で、タイミングt4で荷重付加と超音波振動付与は停止
され、ボンディング作業は終了する。
In FIG. 4A, in the second step from t3 to t4, a large load is continuously applied, and the ultrasonic vibration force is reduced from F1 to F2. As a result, the gap G is crushed, and the contact area between the bump 31 and the electrode 33 is increased (FIG. 3B), and the joint between the two is fused or an alloy is formed (FIG. 2C). The hatched portion 34 is a fusion portion or an alloy portion. Next, at timing t4, the application of the load and the application of the ultrasonic vibration are stopped, and the bonding operation is completed.

【0017】[0017]

【発明の効果】本発明によれば、バンプや電極の表面を
クリーニングし、またバンプの表面の凸凹を押しつぶし
ながら、バンプを基板の電極にしっかりボンディングす
ることができる。
According to the present invention, the bumps can be firmly bonded to the electrodes on the substrate while cleaning the surfaces of the bumps and the electrodes and crushing the bumps and bumps on the surfaces of the bumps.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の一実施の形態のバンプ付電子部品のボ
ンディング装置の正面図
FIG. 1 is a front view of a bonding apparatus for an electronic component with bumps according to an embodiment of the present invention.

【図2】本発明の一実施の形態のバンプ付電子部品のボ
ンディング工程図
FIG. 2 is a bonding process diagram of the electronic component with bumps according to one embodiment of the present invention;

【図3】本発明の一実施の形態のバンプ付電子部品のバ
ンプのボンディング中の部分拡大図
FIG. 3 is an enlarged view of a part of the electronic component with bumps during bonding of the bumps according to the embodiment of the present invention;

【図4】(a)本発明の一実施の形態のバンプ付電子部
品の荷重の経時変化図 (b)本発明の一実施の形態のバンプ付電子部品の超音
波振動力の経時変化図
FIG. 4A is a diagram showing a change over time of a load of an electronic component with a bump according to an embodiment of the present invention; FIG. 4B is a diagram showing a change over time of an ultrasonic vibration force of an electronic component with a bump according to an embodiment of the present invention;

【符号の説明】[Explanation of symbols]

22 吸着ツール 30 フリップチップ 31 バンプ 32 基板 33 電極 G すき間 22 Suction tool 30 Flip chip 31 Bump 32 Substrate 33 Electrode G Clearance

───────────────────────────────────────────────────── フロントページの続き (56)参考文献 特開 平7−115109(JP,A) 特開 平9−153524(JP,A) 特開 平9−270443(JP,A) 特開 平10−335373(JP,A) (58)調査した分野(Int.Cl.7,DB名) H01L 21/60 H01L 21/607 ──────────────────────────────────────────────────続 き Continuation of the front page (56) References JP-A-7-115109 (JP, A) JP-A-9-153524 (JP, A) JP-A-9-270443 (JP, A) JP-A-10- 335373 (JP, A) (58) Fields investigated (Int. Cl. 7 , DB name) H01L 21/60 H01L 21/607

Claims (1)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】吸着ツールに保持されたバンプ付電子部品
のバンプをワークの電極に着地させ、バンプ付電子部品
に大きな超音波振動を付与しながら小さな荷重を付与す
ることにより、バンプと電極の接触面を機械摩擦により
クリーニングしながら平滑化する第1工程と、次いでバ
ンプ付電子部品に付与する超音波振動を小さくするとと
もに荷重を大きくすることにより、バンプと電極の間の
すき間を押しつぶして接触面積を拡大し、バンプを電極
にボンディングする第2工程と、を含むことを特徴とす
るバンプ付電子部品のボンディング方法。
A bump of an electronic component with a bump held by a suction tool is landed on an electrode of a work, and a small load is applied to the electronic component with a bump while applying a large ultrasonic vibration to the electronic component. The first step of smoothing the contact surface while cleaning it by mechanical friction, and then reducing the ultrasonic vibration applied to the electronic component with bumps and increasing the load, thereby crushing the gap between the bump and the electrode to make contact. A second step of increasing the area and bonding the bump to the electrode.
JP19670197A 1997-07-23 1997-07-23 Method of bonding electronic components with bumps Expired - Fee Related JP3351303B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP19670197A JP3351303B2 (en) 1997-07-23 1997-07-23 Method of bonding electronic components with bumps

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP19670197A JP3351303B2 (en) 1997-07-23 1997-07-23 Method of bonding electronic components with bumps

Publications (2)

Publication Number Publication Date
JPH1140612A JPH1140612A (en) 1999-02-12
JP3351303B2 true JP3351303B2 (en) 2002-11-25

Family

ID=16362157

Family Applications (1)

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JP19670197A Expired - Fee Related JP3351303B2 (en) 1997-07-23 1997-07-23 Method of bonding electronic components with bumps

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JP4911189B2 (en) 2009-03-30 2012-04-04 ブラザー工業株式会社 Liquid ejecting apparatus and manufacturing method thereof
CN104205441A (en) * 2012-03-28 2014-12-10 旭硝子株式会社 Binder for electricity storage device
JP2016034656A (en) * 2014-08-01 2016-03-17 株式会社アドウェルズ Face joining method
KR102037972B1 (en) * 2018-05-30 2019-10-29 세메스 주식회사 Die bonding method
JP7318904B2 (en) * 2019-02-18 2023-08-01 株式会社アルテクス metal joining method

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