JP3314982B2 - Fully automatic semiconductor and liquid crystal panel manufacturing equipment - Google Patents

Fully automatic semiconductor and liquid crystal panel manufacturing equipment

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Publication number
JP3314982B2
JP3314982B2 JP13301993A JP13301993A JP3314982B2 JP 3314982 B2 JP3314982 B2 JP 3314982B2 JP 13301993 A JP13301993 A JP 13301993A JP 13301993 A JP13301993 A JP 13301993A JP 3314982 B2 JP3314982 B2 JP 3314982B2
Authority
JP
Japan
Prior art keywords
vacuum
atmospheric pressure
robot
processing
pressure
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP13301993A
Other languages
Japanese (ja)
Other versions
JPH06324297A (en
Inventor
脩平 篠塚
敏 森
耕司 小野
正夫 松村
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Ebara Corp
Original Assignee
Ebara Corp
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Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【産業上の利用分野】本発明は半導体ウエハ及びガラス
基板などを装置内に投入した後は、人の手を介すること
なく、全自動で半導体及び液晶パネル等を製造する全自
動半導体及び液晶パネル製造装置に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a fully automatic semiconductor and liquid crystal panel for manufacturing semiconductors and liquid crystal panels, etc., without the intervention of human hands after semiconductor wafers and glass substrates are put into the apparatus. The present invention relates to a manufacturing apparatus.

【0002】[0002]

【従来技術】半導体の歩留まりを低下させる原因とし
て、粒子汚染が広く知られている。発塵源としては、ク
リーンルーム環境、人の手によるハンドリング、プロセ
ス装置及びプロセス材料が上げられる。その中で、クリ
ーンルームの清浄化技術の向上やプロセス材料の品質向
上は目覚ましいものがあり、粒子汚染防止に効果を上げ
ている。今後、粒子汚染防止に効果が期待されているの
はプロセス装置自体からの発塵と人の手によるハンドリ
ングである。
2. Description of the Related Art Particle contamination is widely known as a cause of lowering the yield of semiconductors. Sources of dust generation include clean room environments, manual handling, process equipment and process materials. Among them, improvement of clean room cleaning technology and quality improvement of process materials are remarkable, and are effective in preventing particle contamination. What is expected to be effective in preventing particle contamination in the future is dust generation from the process equipment itself and manual handling.

【0003】半導体や液晶パネル等の製造には、成膜工
程と成膜工程の間には必ずと言ってよいぼど、洗浄工程
とリソグラフィ工程が入る。この時の真空状態では成膜
したウエハやガラス基板等を、一旦大気状態に置き、洗
浄し、リソグラフィ工程が入る。その後、ウエットエッ
チング工程等を経て再び真空にし、CVD装置等により
膜形成が行われる。このように、一つの半導体や液晶パ
ネルを製造するのに、大気状態→真空状態→大気状態を
何回となく繰り返す。そのため、真空状態で成膜された
ウエハやガラス基板等を、人の手によって次の大気中で
洗浄工程等に運んだりするが、この間に粒子汚染の恐れ
がある。
[0003] In the manufacture of semiconductors, liquid crystal panels, and the like, a cleaning step and a lithography step are included between film forming steps. At this time, in a vacuum state, a wafer or a glass substrate on which a film is formed is once placed in an air state, washed, and a lithography process is started. Thereafter, vacuum is applied again through a wet etching step and the like, and a film is formed by a CVD apparatus or the like. As described above, in order to manufacture one semiconductor or liquid crystal panel, the atmospheric state → the vacuum state → the atmospheric state is repeated many times. For this reason, a wafer, a glass substrate, or the like formed in a vacuum state is carried to a cleaning step or the like in the next air by hand, but there is a risk of particle contamination during this time.

【0004】また、近年では、半導体の高集積化が進む
に従って、ウエハやガラス基板などの表面に付着した1
原子層の不純物原子が問題となる分子汚染も考慮する必
要がある。
[0004] In recent years, as semiconductors have become more highly integrated, 1
It is also necessary to consider molecular contamination in which impurity atoms in the atomic layer pose a problem.

【0005】更に、プロセスからプロセスに移る間にも
次の工程を待って保管状態に置かれるウエハもあり、こ
の保管中にも保管環境によって粒子汚染・分子汚染の恐
れがある。
[0005] Further, some wafers are kept in a storage state waiting for the next step during the transition from one process to another, and during this storage, there is a risk of particle contamination and molecular contamination depending on the storage environment.

【0006】現在存在するこの種の装置としては、成膜
やエッチング等の真空中で行うプロセスを一つの装置で
行うマルチチャンバー方式のプロセス装置がある。しか
し、それは真空中のプロセスを同一装置で行うため、そ
の後に洗浄をする時は、大気圧に戻してマルチチャンバ
ー装置から人の手によってウエハを運搬し、洗浄機に入
れ、洗浄した後、ウエハを取り出し人の手によってウエ
ハを運搬し、再び真空プロセスの装置に入れている。言
い替えれば、真空中はマルチチャンバーで自動的に成膜
し、洗浄工程でも自動的に洗浄するもので、真空中での
成膜と大気中での洗浄との間は人の手を借りねばなら
ず、現状では半自動装置にしかできない。
[0006] As this type of apparatus currently existing, there is a multi-chamber type process apparatus in which processes such as film formation and etching performed in a vacuum are performed by one apparatus. However, since the process in vacuum is performed by the same apparatus, when cleaning is performed later, the pressure is returned to the atmospheric pressure, the wafer is transported by hand from a multi-chamber apparatus, placed in a cleaning machine, and the wafer is cleaned. The wafer is transported by a person's hand, and is again put into the vacuum processing apparatus. In other words, a film is automatically formed in a multi-chamber in a vacuum, and is also automatically cleaned in a cleaning process, and between the film formation in a vacuum and the cleaning in the air, human assistance is required. At present, only semi-automatic devices are available.

【0007】[0007]

【発明が解決しようとする課題】しかしながら、上記従
来の半自動装置では、人の手を介してウエハやガラス基
板を運搬しなければならず、この運搬中にウエハが汚染
されるという問題がある。そして現状においては、ウエ
ハやガラス基板を装置に入れたら人の手を介さずに製品
の半導体や液晶パネルとして搬出される、保管も含めた
全自動半導体及び液晶パネル製造装置はない。
However, in the above-mentioned conventional semi-automatic apparatus, the wafer or the glass substrate must be transported by hand, and there is a problem that the wafer is contaminated during the transport. At present, there is no fully-automatic semiconductor and liquid crystal panel manufacturing apparatus including storage, in which wafers and glass substrates are carried out as semiconductors and liquid crystal panels without the intervention of human hands after being put into the apparatus.

【0008】本発明は上述の点に鑑みてなされたもの
で、一度装置の中にウエハやガラス基板を装置に投入し
たら、製品の半導体や液晶パネルとして該装置から搬出
されるまで、人の手に触れずに半導体や液晶パネルを製
造でき、しかも次の工程に入るまでの保管装置も含め
た、粒子汚染、分子汚染対策も考慮した全自動半導体及
び液晶パネル製造装置を提供することを目的とする。
The present invention has been made in view of the above points, and once a wafer or a glass substrate is put into an apparatus, it is manually operated until it is carried out of the apparatus as a product semiconductor or a liquid crystal panel. The purpose of the present invention is to provide a fully automatic semiconductor and liquid crystal panel manufacturing device that can manufacture semiconductors and liquid crystal panels without touching the surface, and also takes measures against particle contamination and molecular contamination, including storage devices before starting the next process. I do.

【0009】[0009]

【課題を解決するための手段】上記課題を解決するため
請求項1に記載の発明は、各種処理を施す複数の処理部
を具備し、該処理部での処理工程を経て半導体ウエハ又
はガラス基板の処理対象物に各種処理を施し、半導体又
は液晶パネルを製造する半導体及び液晶パネル製造装置
であって、処理部は真空状態で処理を施す複数の真空
処理部と、大気圧状態で処理を施す複数の大気圧処理
部と、真空圧処理部間を真空圧状態内で処理対象物を搬
送する真空圧搬送装置と、大気圧処理部間を大気圧状態
内で前記処理対象物を搬送する大気圧搬送装置と、該真
空圧搬送装置と該大気圧搬送装置の間を処理対象物を搬
送する搬送装置間搬送装置を具備、真空処理部、大気
圧処理部、真空圧搬送装置、大気圧搬送装置及び搬送装
置間搬送装置は外部から遮断されており、装置内に処理
対象物を搬入することにより自動的に該処理対象物に各
種処理を施し、半導体又は液晶パネルを製造することを
特徴とする。
[MEANS FOR SOLVING THE PROBLEMS]
The invention according to claim 1 includes a plurality of processing units for performing various processes, and performs various processes on an object to be processed on a semiconductor wafer or a glass substrate through the processing steps in the processing units, thereby forming a semiconductor or liquid crystal panel. A semiconductor and liquid crystal panel manufacturing apparatus to be manufactured, wherein a processing unit performs processing under a vacuum pressure state.
Pressure processing section, a plurality of atmospheric pressure processing sections that perform processing in an atmospheric pressure state, and a processing object carried in a vacuum pressure state between the vacuum pressure processing sections.
Atmospheric pressure between the vacuum pressure transfer device for feeding and the atmospheric pressure processing unit
An atmospheric pressure transfer device for transferring the object to be processed within
The object to be processed is transferred between the pneumatic transfer device and the atmospheric pressure transfer device.
Comprising a transport device between transfer device for feeding the vacuum processing unit, the atmospheric pressure processing unit, the vacuum pressure conveying device, atmospheric pressure transfer device and the transport instrumentation
The inter-conveyance apparatus is shut off from the outside, and automatically carries out various kinds of processing on the processing object by carrying the processing object into the apparatus, thereby manufacturing a semiconductor or a liquid crystal panel.

【0010】請求項2に記載の発明は請求項1に記載の
全自動半導体及び液晶パネル製造装置において、真空圧
搬送装置は真空状態内で使用する磁気浮上搬送装置で
あり、大気圧搬送装置は大気圧状態内で使用する磁気浮
上搬送装置であることを特徴とする。
[0010] The invention according to claim 2 is the invention according to claim 1.
Vacuum pressure in fully automatic semiconductor and LCD panel manufacturing equipment
The transfer device is a magnetic levitation transfer device used in a vacuum pressure state, and the atmospheric pressure transfer device is a magnetic levitation transfer device used in an atmospheric pressure state.

【0011】請求項3に記載の発明は請求項1又は2に
記載の全自動半導体及び液晶パネル製造装置において、
搬送装置間搬送装置は、前記真空圧搬送装置側に真空
状態内で使用する真空圧ロボット、大気圧搬送装置側に
大気圧状態で使用する大気圧ロボット、中間にロード
・ロック室を配置し、真空圧搬送装置側から大気圧搬送
装置側に前記処理対象物を搬送する場合は、ロード・ロ
ック室を真空状態にして該ロード・ロック室に真空
搬送装置側から前記真空圧ロボットで処理対象物を搬入
した後、該ロード・ロック室を大気圧状態にし大気圧ロ
ボットで該処理対象物を大気圧搬送装置側に搬送し、大
気圧搬送装置側から真空圧搬送装置側に処理対象物を搬
送する場合は、ロード・ロック室を大気圧状態にして該
ロード・ロック室に大気圧搬送装置側から大気圧ロボッ
トで処理対象物を搬入した後、該ロード・ロック室を真
空状態にし真空圧ロボットで該処理対象物を真空圧搬送
装置側に搬送することを特徴とする。
The third aspect of the present invention is directed to the first or second aspect.
In the fully automatic semiconductor and liquid crystal panel manufacturing apparatus described in
Conveying apparatus between the transport device, the vacuum pressure vacuum robot used in a vacuum <br/> state to the transport apparatus, atmospheric robot for use in an atmospheric pressure state to the atmospheric pressure conveying device side, the load to the intermediate- A lock chamber is arranged, and atmospheric pressure is transferred from the vacuum transfer device side
When transporting the processed object on the apparatus side, the vacuum pressure in the load lock chamber and the load lock chamber to a vacuum pressure state
After the conveying apparatus has carried the processing object in said vacuum pressure robot, and the load lock chamber to the atmospheric pressure conveying the treated object at atmospheric pressure robot atmospheric pressure transfer apparatus, atmospheric pressure transfer apparatus When transferring an object to be processed from the vacuum pressure transfer device side to the vacuum pressure transfer device side, after the load lock chamber is brought into the atmospheric pressure state and the process target object is loaded into the load lock chamber from the atmospheric pressure transfer device side by the atmospheric pressure robot, The load / lock chamber is evacuated and the object to be processed is transferred under vacuum by a vacuum pressure robot.
It is transported to the device side.

【0012】請求項4に記載の発明は請求項1又は2又
は3に記載の全自動半導体及び液晶パネル製造装置にお
いて、真空圧搬送装置と前記真空処理部間の間に
空圧状態内で使用する真空ロボットを配設し、該真空
搬送装置と該真空処理部間の処理対象物の搬送は該真空
ロボットで行うと共に、前記大気圧搬送装置前記大気
圧処理部の間に大気圧状態内で使用する大気圧ロボット
を配設し、該大気圧搬送装置と該大気圧処理部間の処理
対象物の搬送は該大気圧ロボットで行うようにしたこと
を特徴とする。
[0012] The invention described in claim 4 is claim 1 or 2 or
Is for fully automatic semiconductor and liquid crystal panel manufacturing equipment described in 3.
There are, in the vacuum pressure processing unit period of the vacuum pressure conveying device is disposed a vacuum robot for use within the true <br/> pneumatic state, the vacuum pressure
Performs the conveying this vacuum robot processing object between the conveyance device and the vacuum processing unit, disposed to atmospheric robot for use in an atmospheric pressure state between the atmospheric transport unit and the atmospheric pressure processing unit The transfer of an object to be processed between the atmospheric pressure transfer device and the atmospheric pressure processing unit is performed by the atmospheric pressure robot.

【0013】また、複数の真空処理部はエッチャー室、
スパッタ室、CVD室、イオン注入室及びドライ洗浄室
であり、複数の大気圧処理部はウエット洗浄室、乾燥
室、ウエットエッチング室、リソグラフィ室、露光室、
ドライ洗浄室であることを特徴とする。
Further, the plurality of vacuum processing units include an etcher chamber,
A sputter chamber, a CVD chamber, an ion implantation chamber, and a dry cleaning chamber, and a plurality of atmospheric pressure processing units include a wet cleaning chamber, a drying chamber, a wet etching chamber, a lithography chamber, an exposure chamber,
It is a dry cleaning room.

【0014】請求項5に記載の発明は請求項1乃至4の
いずれか1項に記載の全自動半導体及び液晶パネル製造
装置において、真空処理部として1個以上の処理対象
物を保管する中真空保管室、高真空保管室及び超高真空
保管室を設け、大気圧処理部として1個以上の処理対象
物を保管する保管室を設けたことを特徴とする。
The invention described in claim 5 is the invention according to claims 1 to 4.
Fully automatic semiconductor and liquid crystal panel manufacturing according to any one of the preceding claims.
The equipment has a medium vacuum storage room, high vacuum storage room and ultra-high vacuum storage room for storing one or more processing objects as a vacuum pressure processing unit, and stores one or more processing objects as an atmospheric pressure processing unit. A storage room is provided for

【0015】また、大気処理部の少なくとも1個が処理
対象物の搬入口又は完成した半導体及び液晶パネルの搬
出口であることを特徴とする。
Further, at least one of the air processing sections is a carry-in port of a processing object or a carry-out port of a completed semiconductor and liquid crystal panel.

【0016】[0016]

【作用】本発明は上記構成を採用することにより、処理
対象物を外部から遮断された装置内に搬入することによ
り、該処理対象物は搬送手段により施す処理に応じて、
例えば、エッチャー室、スパッタ室、CVD室、イオン
注入室、ドライ洗浄室、ウエット洗浄室、乾燥室、ウエ
ットエッチング室、リソグラフィ室、露光室、ドライ洗
浄室に自動的に真空処理部又は大気圧処理部に搬送さ
れ、そこで自動的に各処理部の処理が施される。このよ
うな搬送及び処理が完成品となるまで人手を介すること
なく繰り返され、完成品は必要に応じて、高真空保管
室、超高真空保管、保管室に保管される。
According to the present invention, by adopting the above structure, the object to be processed is carried into an apparatus which is shielded from the outside, and the object to be processed is processed according to the processing performed by the transport means.
For example, a vacuum processing unit or an atmospheric pressure processing is automatically performed in an etcher room, a sputtering room, a CVD room, an ion implantation room, a dry cleaning room, a wet cleaning room, a drying room, a wet etching room, a lithography room, an exposure room, and a dry cleaning room. Is transported to the processing section, where the processing of each processing section is automatically performed. Such transfer and processing are repeated without manual intervention until a finished product is obtained, and the finished product is stored in a high vacuum storage room, an ultra-high vacuum storage, or a storage room as needed.

【0017】[0017]

【実施例】以下、本発明の実施例を図面に基づいて説明
する。図1及び図2は本発明の全自動半導体及び液晶パ
ネル製造装置のシステム構成の概念を示す図、図1は平
面図、図2はB−B’断面図である。図中、装置構成部
品の番号で頭にAが付いているものは大気中で、Vが付
いているものは真空中で使用する装置を示す。
Embodiments of the present invention will be described below with reference to the drawings. 1 and 2 are views showing the concept of the system configuration of the fully automatic semiconductor and liquid crystal panel manufacturing apparatus of the present invention, FIG. 1 is a plan view, and FIG. 2 is a cross-sectional view along BB '. In the figure, those with an A in the head of the device component number indicate the devices used in the atmosphere, and those with a V indicate the devices used in a vacuum.

【0018】本半導体及び液晶パネル製造装置は、大気
中でウエハやガラス基板を運搬する磁気浮上搬送装置A
1と真空中でウエハやガラス基板を運搬する磁気浮上搬
送装置V1を具備する。
The present semiconductor and liquid crystal panel manufacturing apparatus comprises a magnetic levitation transfer apparatus A for transferring a wafer or a glass substrate in the atmosphere.
1 and a magnetic levitation transfer device V1 for transferring a wafer or a glass substrate in a vacuum.

【0019】大気中で使用する磁気浮上搬送装置A1に
は、ロボット室A4を介してウエット洗浄室A7、乾燥
室A8及びウエットエッチング室A9が、ロボット室A
5を介してリソグラフィ室(レジスト塗布・ベーキン
グ)、ドライ洗浄室A11及び露光室(露光・現像)A
12が、ロボット室A6を介して表面酸化処理室A1
5、搬入搬出口A14及び保管室A13がそれぞれ接続
される。
The magnetic levitation transfer device A1 used in the atmosphere includes a wet cleaning room A7, a drying room A8, and a wet etching room A9 via a robot room A4.
5, a lithography chamber (resist coating / baking), a dry cleaning chamber A11 and an exposure chamber (exposure / development) A
12 is a surface oxidation treatment room A1 through a robot room A6.
5, the carry-in / out port A14 and the storage room A13 are connected respectively.

【0020】真空中で使用する磁気浮上搬送装置V1に
は、ロボット室V4を介してエッチャー室V7、スパッ
タ室V8及びCVD室V9が、ロボット室V5を介して
イオン注入室(ドーピング)V15、ドライ洗浄室V1
0及び表面酸化処理室V14が、ロボット室V6を介し
て中真空保管室V11、高真空保管室V12及び超真空
保管室V13が接続される。
The magnetic levitation transfer device V1 used in vacuum includes an etcher chamber V7, a sputtering chamber V8 and a CVD chamber V9 via a robot chamber V4, and an ion implantation chamber (doping) V15 via a robot chamber V5. Cleaning room V1
The medium vacuum storage room V11, the high vacuum storage room V12, and the ultra-vacuum storage room V13 are connected to the surface vacuum treatment room V14 through the robot room V6.

【0021】また、大気中で使用される磁気浮上搬送装
置A1と真空中で使用される磁気浮上搬送装置V1と
は、ロボット室A2及びロボット室V2を介してL/L
室(ロード・ロック室)10と、ロボット室A3及びロ
ボット室V3を介してL/L室(ロード・ロック室)1
1とで接続されている。なお、本実施例ではL/L室を
2箇所に持つ板が、1箇所以上であれば何箇所であって
もよい。また、20〜47はそれぞれバルブである。
The magnetic levitation transfer device A1 used in the atmosphere and the magnetic levitation transfer device V1 used in a vacuum are connected to each other via a robot room A2 and a robot room V2.
Room (load / lock room) 10 and an L / L room (load / lock room) 1 via a robot room A3 and a robot room V3.
1 and connected to each other. In the present embodiment, the number of plates having two L / L chambers may be any number as long as the number is one or more. Reference numerals 20 to 47 denote valves.

【0022】極く一般的な半導体製造工程を例に本装置
のウエハ運搬工程を説明する。 (1)先ず、搬入搬出口A14から装置内にウエハを投
入する。 (2)ロボット室A6のロボットによって、大気中で使
用する磁気浮上搬送装置A1のステーションS3に停止
しているカート12に該ウエハを載せる。 (3)磁気浮上搬送装置A1によって、カート12上の
ウエハはステーションS3からステーションS1に運ば
れる。
The wafer transporting process of the present apparatus will be described by taking a very general semiconductor manufacturing process as an example. (1) First, a wafer is loaded into the apparatus from the loading / unloading port A14. (2) The robot in the robot room A6 places the wafer on the cart 12 stopped at the station S3 of the magnetic levitation transfer device A1 used in the atmosphere. (3) The wafer on the cart 12 is transferred from the station S3 to the station S1 by the magnetic levitation transfer device A1.

【0023】(4)ステーションS1において、カート
12上のウエハはロボット室A4内のロボットによりウ
エット洗浄室A7に運ばれ、通常はRCA洗浄がなされ
る。 (5)洗浄されたウエハはロボット室A4内のロボット
によって乾燥室8に運ばれ、乾燥される。 (6)乾燥されたウエハはロボット室A4内のロボット
によってステーションS1に停止しているカート12に
載せられ、磁気浮上搬送装置A1により、ステーション
S1からステーションS3へと運ばれる。
(4) In the station S1, the wafer on the cart 12 is transferred to the wet cleaning room A7 by the robot in the robot room A4, and RCA cleaning is usually performed. (5) The washed wafer is carried to the drying chamber 8 by the robot in the robot chamber A4 and dried. (6) The dried wafer is placed on the cart 12 stopped at the station S1 by the robot in the robot room A4, and is carried from the station S1 to the station S3 by the magnetic levitation transfer device A1.

【0024】(7)ステーションS3に運ばれたカート
12上のウエハはロボット室A6のロボットにより表面
酸化処理室A15に運ばれる。 (8)表面酸化処理室A15に運ばれたウエハはアニー
ルし表面に中間絶縁膜であるSiO2膜が形成される。 (9)表面にSiO2膜が形成されたウエハは、ロボッ
ト室A6のロボットによりステーションS3に運ばれ、
ロボット室A3のロボットにより内部が大気圧状態にな
っているL/L室11に入れられる。
[0024] (7) wafers on the cart 12 carried in station S3 is carried on the surface oxidation treatment chamber A 15 by the robot of the robot chamber A6. (8) a wafer carried on the surface oxidation treatment chamber A 15 is a SiO 2 film which is an intermediate insulating film on the annealed surface. (9) The wafer with the SiO 2 film formed on the surface is carried to the station S3 by the robot in the robot room A6,
The robot is placed in the L / L chamber 11 in which the inside is at atmospheric pressure by the robot in the robot room A3.

【0025】(10)L/L室11はウエハが入れられ
た後、大気圧から真空状態にし、ロボット室V3のロボ
ットにより、真空中で使用する磁気浮上搬送装置V1の
ステーションS6上に待機しているカート13上に載せ
られる。 (11)ウエハを載せたカート13は磁気浮上搬送装置
V1によりステーションS4に運ばれる。続いてロボッ
ト室V4のロボットにより、CVD室V9に運ばれる。 (12)該CVD室V9に運ばれたウエハはその表面の
SiO2膜の上にSi34膜の絶縁膜を形成する。
(10) After the wafers are put in the L / L chamber 11, the pressure is changed from the atmospheric pressure to a vacuum state, and the robot in the robot chamber V3 stands by on the station S6 of the magnetic levitation transfer device V1 used in vacuum. Is placed on the cart 13 which is in operation. (11) The cart 13 on which the wafers are loaded is carried to the station S4 by the magnetic levitation transfer device V1. Subsequently, it is carried to the CVD room V9 by the robot in the robot room V4. (12) The wafer transferred to the CVD chamber V9 forms an insulating film of a Si 3 N 4 film on the SiO 2 film on its surface.

【0026】(13)該Si34膜を形成したウエハ
は、ロボット室V4のロボットによりステーションS4
に待機しているカート13に載せられる。 (14)ロボット室V2のロボットによって内部が真空
状態になっているL/L室10に運ばれ、L/L室10
を真空から大気圧状態にする。 (15)大気圧状態に置かれたウエハはロボット室A2
のロボット14によってステーションS1に待機してい
るカート12上に載せられ、該ウエハを載せたカート1
2は磁気浮上搬送装置A1によりステーションS2に運
ばれる。
(13) The wafer having the Si 3 N 4 film formed thereon is transferred to the station S4 by the robot in the robot room V4.
Is put on the waiting cart 13. (14) The robot in the robot room V2 is transported to the L / L room 10 where the inside is in a vacuum state, and the L / L room 10
From vacuum to atmospheric pressure. (15) The wafer placed at atmospheric pressure is in the robot room A2.
Is placed on the cart 12 waiting at the station S1 by the robot 14 and the cart 1 on which the wafer is placed is placed.
2 is carried to the station S2 by the magnetic levitation transfer device A1.

【0027】(16)ロボット室A5のロボットによ
り、リソグラフィ室A10に入れ、レジスト塗布、プリ
ベーキングをし、再びロボット室A5のロボットで露光
室A12に入れ、該露光室A12において、露光、現像
を行い、再びロボット室A5のロボットでリソグラフィ
室A10に入れ、該リソグラフィ室A10において、ポ
ストベーキングを行う。
(16) The robot in the robot room A5 enters the lithography room A10, performs resist coating and pre-baking, and again enters the exposure room A12 with the robot in the robot room A5, where exposure and development are performed. Then, the robot is put into the lithography room A10 again by the robot in the robot room A5, and post-baking is performed in the lithography room A10.

【0028】(17)リソグラフィ工程が終了したウエ
ハは、ロボット室A5のロボットによりステーションS
2に待機するカート12上に運び、磁気浮上搬送装置A
1において、ステーションS1に運び、ロボット室A4
のロボットにより、ウエットエッチング室A9に入れら
れ、ウエットエッチング室A9において、湿式により目
的とする領域のSi34膜を取り除く。若しくはステー
ションS1からロボット室A2のロボット14により大
気圧状態のL/L室10に運び、L/L室10を真空に
し、ロボット室V2のロボット15により、ステーショ
ンS4に待機しているカート13に運び、更にロボット
室V4のロボットによりエッチャー室V7に運び乾式に
より目的とする領域のSi34膜を取り除く。
(17) The wafer after the lithography step is removed from the station S by the robot in the robot room A5.
2 is carried on the cart 12 waiting on the magnetic levitation transfer device A
At 1, the robot is transported to the station S1 and the robot room A4
In the wet etching chamber A9, the Si 3 N 4 film in the target area is removed by a wet method in the wet etching chamber A9. Alternatively, the robot 14 in the robot room A2 carries the L / L chamber 10 from the station S1 to the atmospheric pressure L / L chamber 10 by evacuating the L / L chamber 10, and the robot 15 in the robot room V2 places the cart 13 in the station S4 on standby. It is transported to the etcher room V7 by the robot in the robot room V4, and the Si 3 N 4 film in the target area is removed by a dry method.

【0029】(18)目的とする領域のSi34膜を取
り除いたウエハは、上記(1)乃至(10)に示す要領
でロボット、磁気浮上搬送装置を用いてイオン注入室V
15に運び、B+(ボロンイオン)をドーピングする。
(19)ドーピングの終了したウエハは上記と同様ロボ
ット、磁気浮上搬送装置を用いてドライ洗浄室A11に
運び、O3(オゾン)、UV(紫外線)ランプにより、
レジストを取り除く。 (20)レジストを取り除いたウエハは、ロボット、磁
気浮上搬送装置を用いてウエット洗浄室A7に運び、再
び洗浄する。
(18) The wafer from which the Si 3 N 4 film in the target area has been removed is placed in the ion implantation chamber V using the robot and the magnetic levitation transfer device in the manner described in (1) to (10) above.
Then, it is transferred to No. 15 and doped with B + (boron ion).
(19) The wafer after the doping is transported to the dry cleaning chamber A11 by using a robot and a magnetic levitation transfer device in the same manner as described above, and is subjected to O 3 (ozone) and UV (ultraviolet) lamps.
Remove the resist. (20) The wafer from which the resist has been removed is transported to the wet cleaning chamber A7 using a robot and a magnetic levitation transfer device, and cleaned again.

【0030】上記(2)乃至(20)に示す工程を何度
も繰り返し一つの半導体が製造される。製造された半導
体はロボット室A6のロボットにより搬入搬出口A14
から取り出す。
The steps (2) to (20) are repeated many times to manufacture one semiconductor. The manufactured semiconductor is loaded and unloaded A14 by the robot in the robot room A6.
Remove from

【0031】上記システム構成の製造装置によれば、搬
入搬出口A14から搬入されたウエハは、半導体となっ
て再び搬入搬出口A14から搬出されるまで、人の手に
触れることがなく、人による粒子汚染の恐れは全くな
い。
According to the manufacturing apparatus having the above system configuration, the wafer carried in from the carry-in / out port A14 becomes a semiconductor and does not touch human hands until it is carried out again through the carry-in / out port A14. There is no risk of particle contamination.

【0032】図1には、真空中の磁気浮上搬送装置と大
気中の磁気浮上装置とのウエハの行き来をロボットを用
いてハンドリングで行う例を示したが、この間のウエハ
の行き来も磁気浮上搬送装置を用いてカートにウエハを
載せたまま磁気浮上搬送から各プロセスまで搬送しても
よい。
FIG. 1 shows an example in which a wafer is transferred between a magnetic levitation transfer device in vacuum and a magnetic levitation device in the atmosphere by using a robot. The wafer may be transferred from the magnetic levitation transfer to each process while the wafer is placed on the cart using the apparatus.

【0033】半導体を製造する工程において、次の工程
に入る前にウエハ等を待たせる状態(Waitting)がしば
しばある。このような時には、ウエハ等を保管室A13
又は中真空保管室V11、高真空保管室V12、超高真
空保管室V13に入れ待機させる。
In the process of manufacturing a semiconductor, there is often a state (Waitting) in which a wafer or the like is made to wait before starting the next process. In such a case, the wafer or the like is stored in the storage room A13.
Alternatively, they are put in the medium vacuum storage room V11, the high vacuum storage room V12, and the ultra-high vacuum storage room V13 and are put on standby.

【0034】また、分子汚染を起こしたくない状態のウ
エハは、例えばRCA洗浄し、表面に酸化膜をつけたく
ないウエハ、コンタクトホールを造り配線工程を待つウ
エハなどに対しては、超高純度清浄N2ガスを流し続け
る保管室A13にて保管するか、若しは内部が超真空
(1/107Torr以下)の超高真空保管室V13にて保
管する。
For wafers in a state where molecular contamination is not desired, for example, RCA cleaning is performed, and wafers for which an oxide film is not desired to be formed on the surface and wafers for which contact holes are formed and waiting for a wiring process are subjected to ultra-high purity cleaning. It is stored in a storage room A13 in which N 2 gas is continuously flowing, or stored in an ultra-high vacuum storage room V13 in which the inside is ultra-vacuum (1/10 7 Torr or less).

【0035】真空中での保管に関しては、3種類の真空
状態の保管室を用意し、ウエハが要求される清浄度に合
わせて保管室を選ぶことができる。また、3種類の条件
の保管室をつくることにより、小さい保管室のみ超高真
空を造り出すだけでよく、磁気浮上搬送装置とそれに付
随するプロセス装置を超高真空にする必要がないので、
経済的である。
With respect to storage in a vacuum, three types of vacuum storage chambers are prepared, and the storage chamber can be selected according to the required cleanliness of the wafer. Also, by creating storage rooms with three types of conditions, it is only necessary to create an ultra-high vacuum only in a small storage room, and there is no need to make the magnetic levitation transfer device and the associated process equipment an ultra-high vacuum.
It is economical.

【0036】大気圧状態を造り出すには、不活性清浄ガ
ス(清浄N2ガスなど)を封じ込めるか、数リットル/
minから数十リットル/min流し続けるだけでよ
い。普通には10リットル/minの清浄N2ガスを流
し続れば、粒子汚染・分子汚染が十分防ぐことができ
る。
In order to create an atmospheric pressure state, an inert clean gas (such as clean N 2 gas) is contained or several liters /
It is only necessary to keep flowing from min to several tens of liters / min. Normally, if the clean N 2 gas is continuously supplied at a flow rate of 10 liter / min, particle contamination and molecular contamination can be sufficiently prevented.

【0037】[0037]

【発明の効果】以上、説明した本発明によれば処理対象
物であるウエハ又はガラス基板を装置内に搬入すること
により、半導体又は液晶パネルとなるまでの処理を人手
を介することなく、全て自動的に処理するので、粒子汚
染や分子汚染の恐れが殆どないという優れた効果が得ら
れる。
As described above, according to the present invention, a wafer or a glass substrate to be processed is carried into the apparatus, so that the processing up to a semiconductor or liquid crystal panel can be performed automatically without human intervention. , The excellent effect that there is almost no risk of particle contamination or molecular contamination can be obtained.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の全自動半導体及び液晶パネル製造装置
のシステム構成の概念を示す平面図である。
FIG. 1 is a plan view showing the concept of the system configuration of a fully automatic semiconductor and liquid crystal panel manufacturing apparatus according to the present invention.

【図2】図1のB−B’断面図である。FIG. 2 is a sectional view taken along line B-B 'of FIG.

【符号の説明】[Explanation of symbols]

A1 磁気浮上搬送装置 A2〜6 ロボット室 A7 ウエット洗浄室 A8 乾燥室 A9 ウエットエッチング A10 リソグラフィ室 A11 ドライ洗浄室 A12 露光室 A13 保管室 A14 搬入搬出口 A15 表面酸化処理室 V1 磁気浮上搬送装置 V2〜6 ロボット室 V7 エッチャー室 V8 スパッタ室 V9 CVD室 V10 ドライ洗浄室 V11 中真空保管室 V12 高真空保管室 V13 超高真空保管室 V14 表面酸化処理室 V15 イオン注入室 10,11 L/L室 A1 Magnetic levitation transfer device A2-6 Robot room A7 Wet cleaning room A8 Drying room A9 Wet etching A10 Lithography room A11 Dry cleaning room A12 Exposure room A13 Storage room A14 Loading / unloading port A15 Surface oxidation treatment room V1 Magnetic levitation transfer device V2-6 Robot room V7 Etcher room V8 Sputter room V9 CVD room V10 Dry cleaning room V11 Medium vacuum storage room V12 High vacuum storage room V13 Ultra high vacuum storage room V14 Surface oxidation treatment room V15 Ion implantation room 10, 11 L / L room

───────────────────────────────────────────────────── フロントページの続き (72)発明者 松村 正夫 神奈川県藤沢市本藤沢4丁目2番1号 株式会社荏原総合研究所内 (56)参考文献 特開 平4−275449(JP,A) (58)調査した分野(Int.Cl.7,DB名) H01L 21/68 B65G 49/00 B65G 49/06 B65G 49/07 G02F 1/13 101 ──────────────────────────────────────────────────続 き Continuation of the front page (72) Inventor Masao Matsumura 4-2-1 Motofujisawa, Fujisawa-shi, Kanagawa Inside Ebara Research Institute, Inc. (56) References JP-A-4-275449 (JP, A) (58) ) Surveyed field (Int.Cl. 7 , DB name) H01L 21/68 B65G 49/00 B65G 49/06 B65G 49/07 G02F 1/13 101

Claims (5)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】 各種処理を施す複数の処理部を具備し、
該処理部での処理工程を経て半導体ウエハ又はガラス基
板の処理対象物に各種処理を施し、半導体又は液晶パネ
ルを製造する半導体及び液晶パネル製造装置であって、 前記処理部は真空状態で処理を施す複数の真空処理
部と、大気圧状態で処理を施す複数の大気圧処理部と、
前記真空圧処理部間を真空圧状態内で前記処理対象物を
搬送する真空圧搬送装置と、前記大気圧処理部間を大気
圧状態内で前記処理対象物を搬送する大気圧搬送装置
と、該真空圧搬送装置と該大気圧搬送装置の間を前記処
理対象物を搬送する搬送装置間搬送装置を具備し、前記 真空処理部、前記大気圧処理部、前記真空圧搬送
装置、前記大気圧搬送装置及び搬送装置間搬送装置は外
部から遮断されており、装置内に前記処理対象物を搬入
することにより自動的に該処理対象物に各種処理を施
し、半導体又は液晶パネルを製造することを特徴とする
全自動半導体及び液晶パネル製造装置。
A plurality of processing units for performing various types of processing;
A semiconductor and liquid crystal panel manufacturing apparatus for manufacturing a semiconductor or a liquid crystal panel by performing various processes on a processing target of a semiconductor wafer or a glass substrate through a processing step in the processing unit, wherein the processing unit is processed in a vacuum pressure state. A plurality of vacuum pressure processing units, and a plurality of atmospheric pressure processing units performing processing in an atmospheric pressure state,
The object to be processed is placed in a vacuum state between the vacuum processing units.
Atmosphere between the vacuum pressure transfer device to transfer and the atmospheric pressure processing unit
Atmospheric pressure transfer device for transferring the object to be processed in a pressure state
Between the vacuum transfer device and the atmospheric transfer device.
Comprising a transport device between transfer device for transferring the physical object, the vacuum pressure processing unit, the atmospheric pressure processing unit, the vacuum pressure conveying
Device, wherein the atmospheric pressure transfer device and the transport device between the conveying device are blocked from the outside, automatically various processing on the processing object by loading the processing object in the device, a semiconductor or a liquid crystal panel A fully automatic semiconductor and liquid crystal panel manufacturing apparatus characterized by manufacturing.
【請求項2】 前記真空圧搬送装置は真空状態内で使
用する磁気浮上搬送装置であり、前記大気圧搬送装置
大気圧状態内で使用する磁気浮上搬送装置であることを
特徴とする請求項1に記載の全自動半導体及び液晶パネ
ル製造装置。
2. The apparatus according to claim 1, wherein said vacuum pressure transfer device is a magnetic levitation transfer device used in a vacuum pressure state, and said atmospheric pressure transfer device is a magnetic levitation transfer device used in an atmospheric pressure state. Item 2. The fully automatic semiconductor and liquid crystal panel manufacturing apparatus according to Item 1.
【請求項3】 搬送装置間搬送装置は、前記真空圧搬送
装置側に真空状態内で使用する真空圧ロボット、前記
大気圧搬送装置側に大気圧状態で使用する大気圧ロボ
ット、中間にロード・ロック室を配置し、前記真空圧搬
送装置側から大気圧搬送装置側に前記処理対象物を搬送
する場合は、前記ロード・ロック室を真空状態にして
該ロード・ロック室に真空圧搬送装置側から前記真空圧
ロボットで処理対象物を搬入した後、該ロード・ロック
室を大気圧状態にし前記大気圧ロボットで該処理対象物
を大気圧搬送装置側に搬送し、前記大気圧搬送装置側か
前記真空圧搬送装置側に処理対象物を搬送する場合
は、前記ロード・ロック室を大気圧状態にして該ロード
・ロック室に大気圧搬送装置側から前記大気圧ロボット
で処理対象物を搬入した後、該ロード・ロック室を真空
状態にし前記真空ロボットで該処理対象物を真空圧搬送
装置側に搬送することを特徴とする請求項1又は2に記
載の全自動半導体及び液晶パネル製造装置。
3. The transfer device between transfer devices , wherein the transfer device is a vacuum pressure transfer device.
Vacuum robot used in a vacuum pressure state to the device side, the <br/> atmospheric robot for use at atmospheric pressure transfer apparatus in the atmospheric pressure state, place the intermediate in the load lock chamber, the vacuum圧搬
When transporting the processed object from the feeder side to atmospheric pressure transfer apparatus, the vacuum pressure robot processed from vacuum pressure conveying device side said load lock chamber to the load lock chamber in the vacuum state after carrying things, the load lock chamber and transported to an atmospheric pressure condition wherein the processing object at atmospheric pressure robot atmospheric pressure transfer device side, processing in the vacuum pressure conveying device side from the atmospheric pressure transfer apparatus when transporting the object after loading the atmospheric robot in the processing object from atmospheric pressure transfer apparatus the load lock chamber to the load lock chamber in the atmospheric pressure, the load lock chamber vacuum conveying the treated object by the vacuum robot into a vacuum state
3. The fully automatic semiconductor and liquid crystal panel manufacturing apparatus according to claim 1, wherein the apparatus is transported to a device side.
【請求項4】 前記真空搬送装置と前記真空処理部
間の間には真空状態内で使用する真空圧ロボットを配
設し、該真空搬送装置と該真空処理部間の処理対象
物の搬送は該真空圧ロボットで行うと共に、前記大気圧
搬送装置と前記大気圧処理部の間に大気圧状態内で使用
する大気圧ロボットを配設し、該大気圧搬送装置と該大
気圧処理部間の処理対象物の搬送は該大気圧ロボットで
行うようにしたことを特徴とする請求項1又は2又は3
に記載の全自動半導体及び液晶パネル製造装置。
4. disposed vacuum pressure robot used in a vacuum state in the vacuum pressure processing unit period of said vacuum pressure conveying device, processing between vacuum pressure conveying device and the vacuum pressure processing unit together with the conveying of the object is carried out in vacuum pressure robot, the disposed atmospheric robot for use in an atmospheric pressure state between the atmospheric transport unit and the atmospheric pressure processing unit, the large pressure transfer device and the large 4. The method according to claim 1, wherein the transfer of the processing target between the atmospheric pressure processing units is performed by the atmospheric pressure robot.
2. A fully automatic semiconductor and liquid crystal panel manufacturing apparatus according to item 1.
【請求項5】 前記真空処理部として1個以上の処理
対象物を保管する中真空保管室、高真空保管室及び超高
真空保管室を設け、大気圧処理部として1個以上の処理
対象物を保管する保管室を設けたことを特徴とする請求
項1乃至4のいずれか1項に記載の全自動半導体及び液
晶パネル製造装置。
5. A medium-pressure storage room, a high-vacuum storage room, and an ultra-high-vacuum storage room for storing one or more objects to be processed as said vacuum pressure processing part, and one or more objects to be processed as an atmospheric pressure processing part. 5. The fully automatic semiconductor and liquid crystal panel manufacturing apparatus according to claim 1, further comprising a storage room for storing objects.
JP13301993A 1993-05-10 1993-05-10 Fully automatic semiconductor and liquid crystal panel manufacturing equipment Expired - Fee Related JP3314982B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13301993A JP3314982B2 (en) 1993-05-10 1993-05-10 Fully automatic semiconductor and liquid crystal panel manufacturing equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13301993A JP3314982B2 (en) 1993-05-10 1993-05-10 Fully automatic semiconductor and liquid crystal panel manufacturing equipment

Publications (2)

Publication Number Publication Date
JPH06324297A JPH06324297A (en) 1994-11-25
JP3314982B2 true JP3314982B2 (en) 2002-08-19

Family

ID=15094900

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13301993A Expired - Fee Related JP3314982B2 (en) 1993-05-10 1993-05-10 Fully automatic semiconductor and liquid crystal panel manufacturing equipment

Country Status (1)

Country Link
JP (1) JP3314982B2 (en)

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN100376936C (en) * 2004-05-28 2008-03-26 鸿富锦精密工业(深圳)有限公司 LCD production system and control method thereof
KR20230104973A (en) * 2020-12-14 2023-07-11 가부시키가이샤 야스카와덴키 Substrate transport system and substrate transport device

Also Published As

Publication number Publication date
JPH06324297A (en) 1994-11-25

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