JP3289941B2 - System microscope - Google Patents

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a system microscope capable of performing observation by switching between transmission differential interference observation or transmission polarization observation and epi-illumination observation with a single microscope, and more specifically to transmission differential interference observation or transmission. The present invention relates to improvement of a structure for holding an analyzer and a depolarizer used for polarization observation.

[0002]

2. Description of the Related Art Conventionally, so-called composite observation, in which a sample is observed by combining transmission differential interference observation or transmission polarization observation and incident fluorescence observation, has been known. This involves, for example, confirming in advance the outline of a cell stained with a fluorescent dye by transmission differential interference observation, and then observing the fluorescence emitted within the cell by epifluorescence. In order to enable the above-described combined observation in a system microscope, it is necessary to provide the optical system shown in FIGS. In FIG.
The configuration of the optical system at the time of transmission differential interference observation is shown.

In the transmission differential interference observation, illumination light emitted from a light source 1 is converted into parallel light by a collector lens 2, the parallel light is condensed by a condenser lens 3, and furthermore, a polarizer is passed through a field stop 4 and a return mirror 5. 6 and is converted into linearly polarized light. This linearly polarized light passes through the first differential interference prism 7 and is converted into two orthogonal linearly polarized lights,
The light enters the sample 10 from the back through the aperture stop 8 and the condenser lens 9. Two orthogonally polarized light beams passing through the sample 10 have a phase difference due to the unevenness of the sample 10.

[0004] The two orthogonal linearly polarized lights having the phase difference are captured by an objective lens 11 as observation light, and the observation light is passed through a second differential interference prism 12 and then arranged on an optical path by, for example, a slider 13. The light enters the analyzer 14 and causes interference. The interfering light is depolarized by the same slider 13 by the depolarizer 15 arranged on the optical path, and is condensed by the imaging lens 16. The collected observation light is transmitted to the eyepiece prism 17.
Through the eyepiece 18.

Since the analyzer 14 and the depolarizer 15 are not required for observation of a transmitted bright field, a dark field, a phase difference, and the like, the slider 13 holding the analyzer 14 and the depolarizer 15 can be detachably attached to the optical path. ing. FIG. 8 shows the configuration of an optical system for observation of transmitted polarized light. In the transmission polarization observation, the illumination light emitted from the light source 1 is incident on the polarizer 6 via the same optical system as in the transmission differential interference observation to be linearly polarized light. This linearly polarized light is incident on the sample 10 from the back through the aperture stop 8 and the condenser lens 9.

Then, the linearly polarized light that has passed through the sample 10 enters the objective lens 11 and further enters the analyzer 14 to cause interference. This interfering light is supplied to the depolarizer 15.
The light is made non-polarized light by the focusing lens 16 and is observed by the eyepiece 18.

The above is the orthoscopic observation method in transmission polarization observation. When the conoscopic observation method is used for transmission polarization observation, the pupil plane (rear focal plane) of the objective lens 11 is observed by inserting an intermediate lens barrel including the Bertrand lens 19 at a position shown in the figure. FIG. 9 shows a configuration of an optical system at the time of epi-illumination fluorescence observation.

In the epi-illumination fluorescence observation, the illumination light emitted from the light source 20 is converted into parallel light by a collector lens 21 and further condensed by a condenser lens 22. This light is incident on a fluorescent cube 27 disposed on the optical path via a shutter 23, an aperture stop 24, a field stop 25, and an illumination lens 26.

The light incident on the fluorescent cube 27 is
The light is passed through an excitation filter 28 to become excitation light, and this excitation light is reflected by a dichroic mirror 29 toward the objective lens. The sample 10 is irradiated with the excitation light passing through the objective lens.

When the excitation light is incident on the sample 10,
The fluorescence emitted from the sample 10 passes through the objective lens 11 again and enters the fluorescence cube 27. The fluorescence from the sample 10 passes through the dichroic mirror 29 and enters the absorption filter 30. Then, only the fluorescence passes through the absorption filter 30, is collected by the imaging lens 16, and is observed by the eyepiece 18.

By the way, when performing the above-mentioned complex observation with an actual system microscope, the fluorescent cube 27 is not necessary for the transmission differential interference observation, so that an empty cube or a cube is not arranged on the optical path and the shutter 2
3 is closed to prevent incident illumination light from entering the observation optical path.

When performing epi-fluorescence observation, the slider 13 holding the analyzer 14 and the depolarizer 15 is taken out from the observation optical path, and the fluorescent cube 27 is inserted into the observation optical path. This prevents a loss of light quantity by the analyzer 14 which is unnecessary for the epi-fluorescence observation.

[0013]

Incidentally, since the fluorescent dye undergoes fading in accordance with the irradiation time of the illumination light, it is desirable to shorten the irradiation time by the illumination light as much as possible. Therefore, switching from transmission differential interference observation to epi-illumination fluorescence observation needs to be completed quickly and in a short time.

However, in the conventional system microscope described above, when switching from transmission differential interference observation to epi-illumination fluorescence observation, the operation of inserting the fluorescent cube 27 on the observation optical path and the slider 13 holding the analyzer 14 and the depolarizer 15 are performed. Since the operation for taking out from the observation optical path is separately performed separately, it has been difficult to realize a quick switching operation. A similar problem occurs when switching from transmission differential interference observation or transmission polarization observation to various types of epi-illumination observation (eg, epi-illumination bright-field observation, epi-illumination dark-field observation).

The present invention has been made in view of the above circumstances, and enables switching between transmission differential interference observation or transmission polarization observation and various types of epi-illumination observation to be completed in a short time. An object is to provide a system microscope that can be suppressed.

[0016]

Means for Solving the Problems The present invention according to claim 1
Ming has a epi-illumination light source and transmitting light source in the transmissive polarization observation and epi observation and the switched composite observation can be performed system microscope, light between said transmitting light source and the sample
A polarizer arranged in a road and observation light from the sample.
An objective lens for focusing, and the sample during the transmission polarization observation
An analyzer cube having an analyzer and a depolarizer arranged on the optical path of observation light from the above, an epi-illumination observation cube for introducing illumination light from the epi-illumination light source into an observation optical path, the analyzer cube and the epi-illumination observation cube e Bei the movable carrying member for holding a system microscope, characterized in that inserting and removing the analyzer cube or the epi observation cube to the observation optical path by the movement of the carrier.

According to a second aspect of the present invention, in the system microscope according to the first aspect, the analyzer cube holds the analyzer and the depot in such a manner that the analyzer and the depot are inclined in opposite directions with respect to the optical axis of the observation optical path. It is characterized by having been done. The present invention according to claim 3 provides the system microscope according to claim 1, wherein
Optical path between the riser and the sample and the objective lens
It is arranged so that it can be inserted into and removed from the optical path between the carrier
Equipped with a differential interference prism, enabling transmission differential interference observation
It is characterized by having. According to a fourth aspect of the present invention, there is provided a system microscope comprising an epi-illumination light source and a trans-illumination illumination light source and capable of performing composite observation by switching between transmission differential interference observation and epi-fluorescence observation, to collect observation light from a sample. A lens, an analyzer cube having an analyzer and a depolarizer disposed in the optical path after passing through the sample during the transmission differential interference observation, and transmitting light of a predetermined excitation wavelength among illumination light from the epi-illumination light source An epi-fluorescence observation cube having an excitation filter to be excited, a dichroic mirror for introducing the illumination light into an observation optical path, and an absorption filter for transmitting observation light from the sample, the analyzer cube and the epi-fluorescence observation cube are held. A movable carrier, and a differential interference probe disposed in an optical path between the carrier and the objective lens. The analyzer cube, wherein the analyzer and the depolarizer are held so as to be inclined in the same direction with respect to the optical axis of the observation optical path, and the analyzer cube or the incident light is moved by the movement of the carrier. A system microscope, wherein an observation cube is inserted into and removed from the observation optical path. According to the fifth aspect of the present invention,
Equipped with an illumination light source and a transmission illumination light source,
A system microscope that can perform compound observation by switching to fluorescence observation
In the microscope, a polarizer disposed in an optical path between the transmitted illumination light source and the sample, an objective lens for condensing observation light from the sample, and an optical path for observation light from the sample during the transmission polarization observation. Analyzer and Depolara to be deployed
An analyzer cube having a riser and the epi-illumination
Dichroic to introduce illumination light from light source into observation optical path
An epi-fluorescence observation cube having a mirror, at least
Wherein said analyzer cube epifluorescence observation queue
And a movable carrier for holding the carrier.
Movement of the analyzer cube or the epi-illumination
Characterized in that an observation cube is inserted into and removed from the observation optical path.
This is a system microscope.

[0018]

According to the first aspect , the sample is removed from the sample during transmission polarization observation.
Analyzer and depot placed in the optical path of observation light
By holding the analyzer cube having the analyzer and the epi-illumination observation cube on the carrier, the analyzer cube or the epi-illumination observation cube is inserted into and removed from the observation optical path by the movement of the carrier, so that the epi-illumination observation can be performed from the analyzer cube. Switching to a cube or from a cube for epi-illumination observation to an analyzer cube can be performed in one operation.

According to the second aspect of the present invention, since the analyzer and the depolarizer are held while being tilted in opposite directions to each other, the misalignment of the pupil plane in conoscopic observation in transmission polarization observation does not matter. As a result, image shift between orthoscopic observation and conoscopic observation is prevented. According to the third aspect, the pora
The optical path between the riser and the sample and the
Differential interference pres
Mechanism enables transmission differential interference observation.
Was. According to claim 4, by holding the analyzer cube for transmission differential interference observation and the cube for epi-illumination fluorescence observation on the carrier, the analyzer cube or the cube for epi-illumination fluorescence observation is moved to the observation optical path by movement of the carrier. By inserting and removing, it is possible to switch from the analyzer cube to the cube for epi-illumination fluorescence observation, or from the cube for epi-illumination fluorescence observation to the analyzer cube by one operation. In addition, the analyzer cube
Flare and ghost are removed by holding the analyzer and the depolarizer in the same direction with respect to the optical axis of the observation optical path. According to claim 5,
It is placed in the optical path of the observation light from the sample during transmission polarization observation
Analyzer having analyzer and depolarizer
Guides the illumination light from the cube and the epi-illumination light source to the observation optical path
Epi-fluorescence observation key with a dichroic mirror
Tube and at least the analyzer cube and epifluorescence
By holding the observation cube and the carrier,
Depending on the movement of the carrier, the analyzer cube or incident light
The observation cube can be inserted into and removed from the observation optical path.

[0020]

Embodiments of the present invention will be described below.

FIG. 1 shows the overall configuration of a system microscope according to a first embodiment of the present invention. In this embodiment,
The optical system is configured so that it can be used by switching between transmission differential interference observation, transmission polarization observation, and incident fluorescence observation.
In FIG. 9, the same parts as those of the optical system of each microscopy method described above are denoted by the same reference numerals, and detailed description will be omitted.

In the system microscope of the present embodiment, a lamp house 42 is detachably mounted on the back of a main body base 41, and the light source 1 is housed in the lamp house 42. Inside the main body base 41, a transmission illumination floodlight tube for guiding the transmitted illumination light from the lamp house 42 to the observation optical path is incorporated.

A lamp house 44 is detachably mounted on the back of the main body arm 43, and the light source 20 is housed in the lamp house 44. Body arm 43
Is provided with an epi-illumination floodlight tube for guiding the epi-illumination light from the lamp house 44 to the observation optical path.

A cube switching mechanism 45 is provided at a position where an analyzer and a depolarizer are inserted during transmission differential interference observation and a fluorescent cube is inserted during epifluorescence observation. This cube switching mechanism 45
A carrier 46 having a rotation axis 46a is provided at a position parallel to the optical axis of the observation optical path and at a predetermined distance from the optical axis. The analyzer cube 4
7. An epi-illumination fluorescent cube 48 and an epi-illumination cube 49 (not shown in FIG. 1) are detachably attached. FIG. 2 shows a top view of the cube switching mechanism 45.

As shown in the figure, the carrier 46 has a quadrangular prism shape, and each side face is provided with a dovetail groove along the optical axis direction. In addition, each cube 47,4
The fitting projections 55 that fit into the dovetail grooves are respectively provided on the mounting surfaces of the support members 8 and 49 on the carrier 46. Further, the cube switching mechanism 45 can rotate the carrier 46 via a drive mechanism (not shown). Then, by rotating the carrier 46, the cubes 47, 48, and 49 are sequentially arranged on the observation optical path. 3A and 3B show an upper surface and a side cross section of the analyzer cube 47, respectively.

The analyzer cube 47 is provided with the fitting projection 55 described above on one side. Further, the analyzer cube 47 is provided with a through-path 56 that forms a part of the optical path when placed on the observation optical path, and the analyzer 51 and the depolarizer 52 are held in this through-path.

In the analyzer 51, a polarizing film 57 is bonded and fixed between glass plates 58 and 59. Then, the analyzer 51 and the depolarizer 52 are adhered and fixed to the through passage 56 of the cube main body with the vibration directions of the analyzer 51 and the depolarizer 52 being aligned at a fixed angle .

The surface 52a of the depolarizer 52 facing the bonding surface with the glass plate 59 and the surface 58a of the glass plate 58 facing the bonding surface with the polarizing film 57 are used to remove flare and ghost generated during observation. Are coated. Further, the analyzer 51 and the depolarizer 52 are held at a certain angle in the same direction with respect to the optical axis.

The epi-cube 49 is a lamp house 4
A half mirror 49a that reflects the incident illumination light from the sample 4 toward the sample and transmits observation light from the sample is provided. In the present embodiment configured as described above, as shown in FIG.
7. The epi-illumination fluorescent cube 48 and the epi-illumination cube 49 are attached via dovetail mechanisms, respectively.

For example, when performing transmission differential interference observation, the carrier 46 is rotated from the outside via the driving mechanism, and the analyzer cube 47 is arranged on the observation optical path. The optical system shown in FIG. 1 shows the arrangement at the time of transmission differential interference observation.

At the time of transmission differential interference observation, incident illumination light from the light source 20 is shielded by the shutter 23, and transmitted illumination light from the light source 1 illuminates the sample 10 from the back. The linearly polarized light that has passed through the sample 10 enters the analyzer cube 47, where it is interfered by the analyzer 51, and the interference light enters the depolarizer 52 to be unpolarized.

Here, the analyzer 51 and the depolarizer 52 are inserted in the parallel light beam of the infinity correcting optical system. However, since the analyzer 51 and the depolarizer 52 are inclined with respect to the optical axis, flare and ghost are caused. Is removed. Moreover, as described above, the glass plate 58,
Since the surface of the depolarizer 52 is coated with a multilayer film, the effect is further improved.

Next, when switching from transmission differential interference observation to epi-illumination fluorescence observation, the carrier 46 is rotated from the outside.
As the carrier 46 rotates, the analyzer cube 47
Escapes from the observation optical path and the analyzer cube 4
Fluorescent cube 48 attached to the side opposite to 7
Moves and is placed on the observation optical path. This completes the preparation for epi-fluorescence observation. In addition, turn off the light source 1 or
Alternatively, the light is blocked on the optical path up to the sample 10 as in the related art.

Also, when switching from transmission polarization observation in which the analyzer cube 47 is arranged on the observation optical path to epi-illumination observation, the rotation of the carrier 46 enables the fluorescent cube 48 to be quickly operated by one operation. It is arranged on the observation optical path.

Therefore, the operation of switching from the transmission differential interference observation or the transmission polarization observation to the epi-illumination fluorescence observation, more specifically, the exchange from the analyzer cube 47 to the fluorescence cube 48 is quickly performed, so that the illumination time of the sample 10 is reduced. It can be shortened and the fading of the fluorescent dye is prevented.

Not only the above-described switching between the transmission differential interference observation or the transmission polarization observation and the epi-illumination fluorescence observation, but also other observations, for example, switching to the epi-illumination bright-field observation and the epi-illumination bright-field observation, can be performed quickly. .

As described above, according to the present embodiment, the analyzer 51 and the depolarizer 52 are built in the analyzer cube 47 which can be mounted on the carrier 46 on which the fluorescent cube 48 is mounted, and the analyzer cube 47 is supported. Since it is used by being attached to the body 46, switching between transmission differential interference observation or transmission polarization observation and various types of epi-illumination observation can be performed quickly. In particular, the time required for switching from transmission differential interference observation or transmission polarization observation to epi-illumination fluorescence observation can be shortened, which has an effect of preventing fading of the fluorescent dye. Next, a second embodiment of the present invention will be described.

The overall configuration of the system microscope of this embodiment is the same as that of the system microscope shown in FIG. 1, and only the analyzer cube is the analyzer cube 6 shown in FIG.
Replaced with 0. Therefore, in the description of the present embodiment, only the analyzer cube 60 will be described in detail.

FIG. 4 is a side sectional view of the analyzer cube 60. This analyzer cube 60
Has a fitting projection which can be attached to the carrier 46 on one side thereof (not shown in FIG. 4), and forms a part of the optical path therein when arranged on the observation optical path. It has a through passage 61. In the through-path 61, an analyzer 65 composed of a polarizing film 62 and glass plates 63 and 64 sandwiching the polarizing film, and a depolarizer 66 are held so as to be inclined in directions opposite to each other with respect to the optical axis. .

The analyzer 65 includes a glass plate 63,
64 are polished on both sides, and each glass plate 63, 6
4, the parallelism E ° and F ° are adjusted to small values. Moreover, the surfaces of the two glass plates 63 and 64 that are not in contact with the polarizing film 65 are each coated with a multilayer film.
Then, the polarizing film 62 is adhered to the surface of the glass plates 63 and 64 on which the multilayer film is not formed to form the analyzer 65. The parallelism B ° of the depolarizer 66 is reduced by polishing both surfaces thereof.

The optical action of the analyzer cube 60 configured as described above will be described with reference to FIG. 5 and in comparison with the analyzer cube 47 used in the first embodiment. 5A shows the inclination of the emitted light with respect to the optical axis of the analyzer cube 47, and FIG. Assuming that the inclination of the emitted light with respect to the optical axis of the analyzer cube 47 is β °, the inclination β ° is calculated geometrically by several factors as follows. β ° = f (M °, N °, L °, γ °, tA °, tB °)

Here, M ° is the parallelism of the depolarizer 52 alone, N ° is the parallelism of the analyzer 51 alone, L
° is the joint wedge angle generated when the analyzer 51 and the depolarizer 52 are bonded, γ ° is the angle with respect to the optical axis when the bonded analyzer 51 and the depolarizer 52 are held on the cube 47, and tA is the minimum thickness of the depolarizer 52. Here, tB is the minimum thickness of the analyzer 51. Assuming that the inclination of the emitted light with respect to the optical axis of the analyzer cube 60 is α °, the inclination α ° is calculated geometrically as follows. α ° = f (B °, K °, α1 °, α2 °, tC °, tD
°)

Here, K ° is the parallelism of the analyzer 65 alone, α1 ° is the angle with respect to the plane perpendicular to the optical axis when the depolarizer 66 is held on the cube 60, and α2 ° is the analyzer 65 is held on the cube 60. The angle to the plane perpendicular to the optical axis at the time, tC is the depolarizer 66
, TD is the minimum thickness of the analyzer 65. Here, conditions are set as follows. (1) tA = tC, tB = tD (2) γ = α1 = | α2 | (3) B <M, K <N (4) L> 0

Under the above conditions, the exit angle α ° of the analyzer cube 60 of the present embodiment and the analyzer cube 4
7 is generally α ° <β °.
Is established. That is, in the analyzer cube 60 of the present embodiment, the inclination of the emitted light with respect to the optical axis is smaller than that of the analyzer cube 47.

The inclination of the light beam passing through the analyzer cube with respect to the optical axis has an effect when performing transmission polarization observation. That is, in conoscopic observation in transmission polarization observation, a Bertrand lens is inserted into the observation optical path to observe the exit pupil plane of the objective lens 11 (the focal plane of the objective lens). If the pupil is tilted, misalignment of the pupil plane occurs according to the tilt angle.

On the other hand, in the orthoscopic observation in the transmission polarization observation, the Bertrand lens is removed from the observation optical path, the light converted into a parallel light beam by the infinity correction optical system is imaged by the imaging lens, and the image plane is observed. Therefore, no shift occurs in the observation image.

In transmission polarization observation, orthoscopic observation and conoscopic observation are sometimes superimposed. In such observation, an orthoscopic observation image which is not affected by the inclination of the emitted light is placed on an image. Since the images of the conoscopic observation in which the pupil plane is misaligned are superimposed, an image misalignment occurs between the two.

In this embodiment, the analyzer cube 60
Is used, the emission angle α of the light incident on the analyzer cube 60 with respect to the optical axis becomes a very small value. Therefore, even when the orthoscopic observation and the conoscopic observation are superimposed and observed by the transmission polarization observation, the distance between the two can be obtained. , Image shift hardly occurs, and good observation is realized. The operation of switching between transmission differential interference observation or transmission polarization observation and epi-illumination fluorescence observation and the operation of switching to other epi-illumination bright-field observation and epi-illumination bright-field observation have been described in detail in the first embodiment, and will not be described here. Is omitted.

As described above, according to this embodiment, the same operation and effect as those of the first embodiment can be obtained, and the analyzer cube 60 is provided with the analyzer 65 and the depolarizer 66 in directions opposite to each other with respect to the optical axis. In this case, it is possible to suppress the misalignment of the pupil plane in the conoscopic observation and to prevent the image shift between the orthoscopic observation and the conoscopic observation. FIG.
Shows a modification of the second embodiment.

The analyzer cube 70 shown in FIG.
The basic configuration is the same as that shown in FIG. 4 except that the thickness of each of the analyzer 65 'and the depolarizer 66' is t6 and t5.

The analyzer cube 70 has inclinations α1 ° and α2 ° of the analyzer 65 ′ and the depolarizer 66 ′ with respect to a plane perpendicular to the optical axis, and the analyzer 65 ′,
By selecting the parallelisms B ° and K ° of the depolarizer 66 ′ and the thicknesses t6 and t5 of the individual elements to appropriate values, the optical axis of the outgoing light with respect to the incident light generated by the above three elements is selected. Is set to 0.

Therefore, in the analyzer cube 70 of the present modification, since the emitted light does not deviate from the optical axis at all, it is extremely accurate with no image deviation on the image plane and no core deviation on the pupil plane.

The present invention is not limited to the above embodiments and modifications. For example, in the first and second embodiments, the combination of the dovetail groove and the fitting projection 55 is used to detachably attach the analyzer cube to the carrier 46, but a slider may be used, for example. .

[0054] In the but in each embodiment uses a carrier 46 which rotates in the exchange of the cube, exchange with respect to the observation optical path
It is also possible to use a slider that is provided so as to be linearly movable in the difference direction . When this slider is used as a carrier, a fluorescence filter set (excitation filter, dichroic mirror, absorption filter), a polarization set ( analyzer and depolarizer ) , various epi- illumination observation sets
Each set of ( half mirror etc.) needs to be continuously provided on the slider.

[0055]

As described above in detail, according to the present invention, transparency is improved.
An analyzer required for hyperdifferential interference observation or transmission polarization observation
Required for risers and depolarizers and various types of epi-illumination observation
In consideration of the optical element to be used , switching between transmission differential interference observation or transmission polarization observation and various types of epi-illumination observation can be completed in a short time, and in particular, a system microscope capable of suppressing fading of a fluorescent dye can be provided. Also, according to the present invention,
Misalignment in the pupil plane during conoscopic observation in light observation
Can be suppressed, resulting in orthoscopic observation
System that can prevent image misalignment between
Can provide a microscope.

[Brief description of the drawings]

FIG. 1 is an overall configuration diagram of a system microscope according to a first embodiment of the present invention.

FIG. 2 is a top view of a cube switching mechanism provided in the first embodiment.

FIG. 3 is a top view and a side sectional view of an analyzer cube provided in the first embodiment.

FIG. 4 is a side sectional view of an analyzer cube provided in a system microscope according to a second embodiment of the present invention.

FIG. 5 is an explanatory diagram of an operation of an analyzer cube provided in the second embodiment.

FIG. 6 is a side sectional view of an analyzer cube according to a modification of the second embodiment.

FIG. 7 is a configuration diagram of an optical system during transmission differential interference observation.

FIG. 8 is a configuration diagram of an optical system during transmission polarization observation.

FIG. 9 is a configuration diagram of an optical system during epifluorescence observation.

[Explanation of symbols]

1, 20: light source, 6: polarizer, 7, 12: differential interference prism, 10: sample, 11: objective lens, 28: excitation filter, 29: dichroic mirror, 30: absorption filter, 46 : carrier, 47: analyzer Cube, 48 ... Fluorescent cube, 51 ... Analyzer , 52 ...
Depolarizer.

──────────────────────────────────────────────────続 き Continued on the front page (58) Field surveyed (Int. Cl. ⁷ , DB name) G02B 19/00-21/00 G02B 21/06-21/36

Claims (5)

(57) [Claims] 1. An epi-illumination light source and a transmission illumination light source ,
In a system microscope capable of performing composite observation by switching between transmission polarization observation and epi-illumination observation, a polarizer disposed in an optical path between the transmission illumination light source and a sample is provided.
Riser and an objective lens for focusing the observation light from the sample, the analyzer cube with analyzers and Deporaiza is disposed in an optical path of the observation light from the sample during the transmitting polarization observation, illumination from the epi-illumination light source and cubes for epi observed for introducing light into the observation light path, e Bei a movable bearing member for holding said epi observation cube and the analyzer cube, the analyzer cube or for the epi observation by the movement of the carrier A system microscope, wherein a cube is inserted into and removed from the observation optical path. 2. The system microscope according to claim 1, wherein in the analyzer cube, the analyzer and the depot are held so as to be inclined in directions opposite to each other with respect to an optical axis of the observation optical path. 3. An optical path between the polarizer and the sample.
And an optical path between the objective lens and the carrier.
Equipped with a differential interference prism that can be inserted and removed
Claim 1 Symbol, characterized in that to allow differential interference observation
Mounting of the system microscope. 4. An epi-illumination light source and a transmission illumination light source,
In a system microscope capable of performing composite observation by switching between transmission differential interference observation and incident fluorescence observation, an objective lens for condensing observation light from a sample, and an objective lens disposed in an optical path after passing through the sample during the transmission differential interference observation An analyzer cube having an analyzer and a depolarizer, an excitation filter that transmits light of a predetermined excitation wavelength among illumination light from the epi-illumination light source, a dichroic mirror that introduces the illumination light into an observation optical path, and the sample. An epi-fluorescence observation cube having an absorption filter that transmits observation light, a movable carrier that holds the analyzer cube and the epi-fluorescence observation cube, and a movable carrier between the carrier and the objective lens. A differential interference prism disposed in an optical path, wherein the analyzer cube is an analyzer The depolarizer is held in a state of being inclined in the same direction with respect to the optical axis of the observation optical path, and the analyzer cube or the epi-illumination observation cube is inserted into and removed from the observation optical path by moving the carrier. Features system microscope. 5. An epi-illumination light source and a transmission illumination light source,
Switching between transmission polarization observation and epi-illumination fluorescence observation enables complex observation
In a system microscope, the polarizer disposed in an optical path between the transmitted illumination light source and the sample, an objective lens for condensing observation light from the sample, and an optical path of observation light from the sample during the transmission polarization observation With analyzer and depolarizer arranged in
A riser cube and a light guide for introducing illumination light from the epi-illumination light source into an observation optical path.
Epi-fluorescence cube with ichroic mirror
And at least the analyzer cube and the reflected fluorescent light
A movable support for holding the observation cube and the analyzer cube or
Is to insert and remove the epi-illumination observation cube from the observation optical path.
And a system microscope.