JP3271426B2 - Synchrotron radiation beam line device - Google Patents

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a radiation beam line apparatus.

[0002]

2. Description of the Related Art When an electron moving at a speed close to the speed of light is bent by a magnetic field or an electric field, an electromagnetic wave (light) called a radiation is emitted in a tangential direction of an electron orbit.

FIG. 4 shows an example of a means for generating and utilizing synchrotron radiation. Reference numeral 1 denotes a linear accelerator (particle accelerator). The linear accelerator 1 is a straight tube for transferring electrons (charged particles) e. Has an acceleration duct 2.

[0004] The acceleration duct 2 is formed so that the inside thereof can be maintained in an ultra-high vacuum, and applies a high-frequency RF to the electrons e moving inside the acceleration duct 2 maintained in the ultra-high vacuum state to convert the electrons e. A high-frequency accelerator 3 for accelerating is provided.

An electron generator 4 such as an electron gun is provided at one end of the acceleration duct 2, and electrons e generated by the electron generator 4 are emitted toward the hollow portion of the acceleration duct 2. It has become so.

Further, one end of a curved tubular deflecting duct 5 is connected to the other end of the accelerating duct 2, and a deflecting electromagnet 6 is provided at a curved portion of the deflecting duct 5.

The traveling direction of the electrons e incident from the acceleration duct 2 to the deflection duct 5 is bent along the deflection duct 5 by the magnetic field of the deflection electromagnet 6.

Reference numeral 7 denotes a synchrotron. The synchrotron 7 has a circular duct 8 for causing the electrons e to form a circular orbit. 5 is connected to the other end. The circular duct 8 is configured so that the inside thereof can be maintained in an ultra-high vacuum.

The bending portion of the circular duct 8 has a bending electromagnet 9
The electron e incident from the deflection duct 5 to the circular duct 8 held in an ultra-high vacuum state is bent in the traveling direction along the curved portion of the circular duct 8 by the magnetic field of the bending electromagnet 9. It goes around the inside of the circular duct 8.

On the other hand, a high-frequency accelerator 10 is provided at a required portion of the circular duct 8, and electrons e orbiting inside the circular duct 8 are supplied with a high frequency from the high-frequency accelerator 10 and have a light speed. It is to be accelerated to a speed close to.

Reference numerals 11 and 14 denote linearly extending radiation beam line bodies.
4 is connected to a required curved portion of the circular duct 8.

The emitted light beam line bodies 11 and 14 have emitted light emitted when the traveling direction of the electrons e moving through the curved portion of the circular duct 8 at a speed close to the speed of light is bent by the bending electromagnet 9. The beams S are respectively incident.

An experiment for using soft X-rays (electromagnetic wave X1 in the X-ray region having a wavelength of about 10 ° or more) through the diffraction grating spectroscope 13 is provided at the end of the main body 11 of the emitted light beam line. An experiment apparatus 12 is connected, and the radiation beam main body 11, diffraction grating spectroscope 13, and experiment apparatus 12 constitute a radiation beam line apparatus for utilizing soft X-rays.

The diffraction grating spectroscope 13 extracts the electromagnetic wave X1 in the soft X-ray region as shown in FIG. 5 from the emitted light beam S, and makes the electromagnetic wave X1 in the soft X-ray region incident on one experimental device 12. It has become.

The other synchrotron radiation beam line body 14
An experiment device 15 for conducting an experiment using hard X-rays (electromagnetic wave X2 in the X-ray region having a wavelength of less than 10 °) via a double crystal spectroscope 16 is connected to the tip of the. The light beam line main body 14, the double crystal spectroscope 16, and the experimental device 15 constitute a radiation light beam line device for utilizing hard X-rays.

The above-mentioned double crystal spectroscope 16 extracts the electromagnetic wave X2 in the hard X-ray region from the emitted light beam S as shown in FIG.
5.

[0017]

In the above-mentioned means for generating and utilizing radiation, the experimental device 12 using the electromagnetic wave X1 in the soft X-ray region and the experimental device 15 using the electromagnetic wave X2 in the hard X-ray region are separate. Therefore, there are problems that initial equipment costs and maintenance and inspection costs increase, and that a large space is required to provide two synchrotron radiation beam line devices.

An object of the present invention is to provide a synchrotron radiation beam line apparatus which can use both an electromagnetic wave X1 in a soft X-ray region and an electromagnetic wave X2 in a hard X-ray region with one experimental apparatus. It is.

[0019]

SUMMARY OF THE INVENTION According to the present invention, a proximal end is connected to a device for generating a radiation beam S and a distal end is connected to a soft X.
A synchrotron radiation beam line main body 11 connected to an experimental device 12 using electromagnetic waves X1 and X2 in the X-ray region and the hard X-ray region;
A reflection mirror 19 and a diffraction grating 2 are disposed inside the radiation beam main body 11 in order from the base end to the tip end.
0, a first dispersive crystal 21 and a second dispersive crystal 22, wherein the light receiving surface 23 of the reflection mirror 19 forms a predetermined angle with respect to the optical axis of the emitted light beam S, and the light receiving surface 23 The reflection mirror 19 is movably supported so that the beam S can be incident thereon, and the radiation light beam S emitted from the reflection mirror 19 can be incident on the light reception surface 24 of the diffraction grating 20 and the light reception surface 24 More synchrotron radiation beamline body 1
1 so that the electromagnetic wave X1 in the soft X-ray region is emitted substantially parallel to the optical axis of the radiated light beam S toward the distal end of the diffraction grating 20.
And supports the first dispersive crystal 21 so that the radiation light beam S can directly enter the light receiving surface 25 of the first dispersive crystal 21. An electromagnetic wave X2 in the hard X-ray region emitted from the spectral crystal 21 can be incident thereon, and the electromagnetic wave X1 in the soft X-ray region is directed from the light receiving surface 26 toward the tip end of the radiation beam main body 11.
The second dispersive crystal 22 is movably supported so that the electromagnetic wave X2 in the hard X-ray region can be emitted substantially coaxially with the optical axis.

[0020]

According to the present invention, when the reflection mirror 19 is positioned on the optical axis of the radiation light beam S and the second dispersive crystal 22 is retracted from the optical axis of the electromagnetic wave X1 in the soft X-ray region, the radiation light beam main body The radiation light beam S incident on the reflection mirror 11
9 is incident on the light receiving surface 23 and is emitted from the light receiving surface 23 to the diffraction grating 20, and the diffraction grating 2 on which the radiation light beam S is incident.
The electromagnetic wave X1 in the soft X-ray region is emitted from the zero light receiving surface 24 toward the distal end side of the emitted light beam line main body 11 substantially in parallel with the optical axis of the emitted light beam S.

When the reflecting mirror 19 is retracted from the optical axis of the radiated light beam S and the second dispersive crystal 22 is positioned on the optical axis of the electromagnetic wave X1 in the soft X-ray region, the light is transmitted to the radiated light beam line main body 11. The incident radiation light beam S is directly incident on the light receiving surface 25 of the first dispersive crystal 21 and is emitted from the light receiving surface 25 to the second dispersive crystal 22, and the second dispersive crystal 22 on which the radiation light beam S is incident From the light receiving surface 26, the electromagnetic wave X2 in the hard X-ray region is emitted substantially in parallel with the optical axis of the radiation light beam S toward the distal end side of the radiation light beam line main body 11.

[0022]

Embodiments of the present invention will be described below with reference to the drawings.

FIGS. 1 to 3 show an embodiment of a radiation beam line apparatus according to the present invention, and reference numeral 11 denotes a radiation beam line main body.

The radiation light beam line main body 11 has a base end (A side in FIG. 1) connected to a device for generating a radiation light beam S and a front end (B side in FIG. 1) in a soft X-ray region. Experimental apparatus 1 using electromagnetic wave X1 of the X-ray and electromagnetic wave X2 of the hard X-ray region
2 are connected.

In the inside of the radiation beam line body 11,
A reflection mirror 19, a diffraction grating 20, a first dispersive crystal 21, and a second dispersive crystal 22 are arranged in this order from the base end side (A side in FIG. 1) to the distal end side (B side in FIG. 1). Have been.

The reflecting mirror 19 has a light receiving surface 23
A radiation light beam S incident from a device for generating a radiation light beam S to the radiation grating, and receiving the radiation light beam S so that the received radiation light beam S is emitted toward the diffraction grating 20. It is disposed at a predetermined position inside the radiation light beam line main body 11 at a required angle with respect to the axis, and can be retracted from the aforementioned position to a position off the optical axis of the radiation light beam S from the aforementioned position as necessary. It is movably supported by a control device 27 that can be driven and adjusted from outside the radiation beam main body 11.

The diffraction grating 20 can receive the radiated light beam S emitted from the reflection mirror 19 to the light receiving surface 24 thereof. Radiation beam S toward the side
Is fixedly supported at a predetermined position inside the radiation light beam line main body 11 at a required angle with respect to the optical axis of the radiation light beam S so that the electromagnetic wave X1 in the soft X-ray region can be emitted substantially parallel to the optical axis of the radiation light beam line S. ing.

Further, the first dispersive crystal 21 can receive a radiation light beam S incident from a device for generating a radiation light beam S on its light receiving surface 25 and is included in the received radiation light beam S. The electromagnetic wave X2 in the hard X-ray region is
Is arranged at a predetermined angle with respect to the optical axis of the radiated light beam S at a predetermined position inside the radiated light beam line main body 11 so as to be emitted toward the dispersive crystal 22.

Further, the second spectral crystal 22 can receive the electromagnetic wave X2 in the hard X-ray region incident on the light receiving surface 26 from the first spectral crystal 21, and converts the received electromagnetic wave X2 into the light. From the light receiving surface 26 of the main body 11 toward the distal end side of the radiation beam main body 11, the radiation beam line is formed at a required angle with respect to the optical axis of the electromagnetic wave X2 so as to be emitted substantially coaxially with the optical axis of the electromagnetic wave X1. A control device 28 which is arranged at a predetermined position inside the main body 11 and which can be driven and adjusted from the outside of the radiation beam line main body 11 so as to be retracted from the aforementioned position to a position outside the optical axis of the electromagnetic wave X2 as required. It is movably supported by.

By operating the control device 27, the reflection mirror 19 is moved to be positioned on the optical axis of the radiation light beam S, and by operating the control device 28, the second spectral crystal 22 is moved and the electromagnetic wave X1 is moved. When retracted from the optical axis of
As shown in FIG. 2, the radiation light beam S incident on the radiation light beam line main body 11 from the device for generating the radiation light beam S is incident on the light receiving surface 23 of the reflection mirror 19 and is diffracted from the light receiving surface 23 by the diffraction grating. 20 and the emitted light beam S
Is incident on the light receiving surface 24 of the diffraction grating 20 and emits the electromagnetic wave X1 in the soft X-ray region substantially in parallel with the optical axis of the radiation light beam S toward the distal end of the radiation light beam line main body 11.

Further, by operating the control device 27, the reflecting mirror 19 is moved to retract from the optical axis of the radiated light beam S, and by operating the control device 28, the second spectral crystal 22 is moved. When positioned on the optical axis of the electromagnetic wave X 1, as shown in FIG. 3, the radiation light beam S incident on the radiation light beam line main body 11 from the device that generates the radiation light beam S The electromagnetic wave X2 in the hard X-ray region, which is directly incident on the light receiving surface 25 and is extracted from the radiated light beam S incident on the light receiving surface 25, is emitted from the light receiving surface 25 to the second dispersive crystal 22, and is hard X-ray. Light receiving surface 2 of the second dispersive crystal 22 on which the electromagnetic wave X2 of the region is incident
Numeral 6 emits the electromagnetic wave X2 in the hard X-ray region substantially coaxially with the optical axis of the electromagnetic wave X1 toward the distal end side of the radiation beam main body 11.

In this embodiment having the above-described structure, the reflection mirror 19 and the second dispersive crystal 22 are movably arranged, and the position of the reflection mirror 19 with respect to the optical axis of the radiation light beam S is moved as necessary. Or the electromagnetic wave X1
The position of the second dispersive crystal 22 with respect to the optical axis is moved to generate a soft X-ray region included in the radiation light beam S incident on the radiation light beam line main body 11 from the device for generating the radiation light beam S. The electromagnetic wave X1 in the hard X-ray region or the electromagnetic wave X2 in the hard X-ray region can be emitted to the distal end side of the radiation beam main body 11. Can be used, the initial equipment cost and the maintenance and inspection cost can be reduced, and the space for providing the synchrotron radiation beam line device can be reduced.

It should be noted that the present invention is not limited to the above-described embodiment, and it goes without saying that various changes can be made without departing from the spirit of the present invention.

[0034]

According to the synchrotron radiation beam line device of the present invention, various excellent effects can be obtained as follows.

1) One experimental apparatus 12 can use both the electromagnetic wave X1 in the soft X-ray region and the electromagnetic wave X2 in the hard X-ray region.

2) Therefore, it is possible to reduce the initial equipment cost and the maintenance and inspection cost, and it is possible to reduce the space for providing the radiation beam line device.

[Brief description of the drawings]

FIG. 1 is a sectional view schematically showing an embodiment of a synchrotron radiation beam line device according to the present invention.

FIG. 2 is a layout diagram showing positions of a reflection mirror and a second dispersive crystal when an electromagnetic wave in a soft X-ray region related to FIG. 1 is incident on an experimental apparatus.

FIG. 3 is a layout diagram showing positions of a reflection mirror and a second dispersive crystal when an electromagnetic wave in a hard X-ray region related to FIG. 1 is incident on an experimental apparatus.

FIG. 4 is a configuration diagram schematically illustrating an example of means for generating and using emitted light.

FIG. 5 is a diagram showing electromagnetic waves in a soft X-ray region and electromagnetic waves in a hard X-ray region related to FIG. 4;

[Explanation of symbols]

 REFERENCE SIGNS LIST 11 synchrotron radiation beam line body 12 experimental apparatus 19 reflecting mirror 20 diffraction grating 21, 22 spectral crystal 23, 24, 25, 26 light receiving surface S synchrotron radiation beam X1, X2 electromagnetic wave

Continuation of the front page (58) Field surveyed (Int.Cl. ⁷ , DB name) G21K 5/00 G21K 1/06 H05H 13/04

Claims (1)

(57) [Claims] 1. An experimental apparatus (12) in which a base end is connected to a device for generating a radiation light beam (S) and a front end uses electromagnetic waves (X1) and (X2) in a soft X-ray region and a hard X-ray region. ), A reflection mirror (19), a diffraction grating (20) arranged in order from the base end side to the distal end side inside the radiation light beam line main body (11). ), A first dispersive crystal (21) and a second dispersive crystal (22), and a light-receiving surface (2) of a reflection mirror (19).
3) makes the reflection mirror (19) movable at a predetermined angle with respect to the optical axis of the emitted light beam (S) so that the emitted light beam (S) can enter the light receiving surface (23). A radiation light beam (S) emitted from the reflection mirror (19) can be incident on the light receiving surface (24) of the diffraction grating (20), and a radiation light beam line can be transmitted from the light receiving surface (24). Radiation light beam (S) toward the tip of main body (11)
The diffraction grating (20) is supported so that the electromagnetic wave (X1) in the soft X-ray region is emitted substantially in parallel with the optical axis of the first light-splitting crystal (21). S) supports the first dispersive crystal (21) so that S) can be directly incident thereon, and hard X emitted from the first dispersive crystal (21) on the light receiving surface (26) of the second dispersive crystal (22). Electromagnetic wave in the line region (X2)
From the light receiving surface toward the distal end side of the radiation beam main body (11), and the electromagnetic wave (in the hard X-ray region) substantially coaxially with the optical axis of the electromagnetic wave (X1) in the soft X-ray region. X
2. A synchrotron radiation beam line device characterized in that a second dispersive crystal (22) is movably supported so that 2) can be emitted.