JP3236941B2 - Distance measurement method for lightwave distance meter - Google Patents
Distance measurement method for lightwave distance meterInfo
- Publication number
- JP3236941B2 JP3236941B2 JP23385992A JP23385992A JP3236941B2 JP 3236941 B2 JP3236941 B2 JP 3236941B2 JP 23385992 A JP23385992 A JP 23385992A JP 23385992 A JP23385992 A JP 23385992A JP 3236941 B2 JP3236941 B2 JP 3236941B2
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- Prior art keywords
- light
- measurement
- phase
- internal
- optical path
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Description
【０００１】[0001]
【産業上の利用分野】本発明は、光波距離計における測
距方法に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a distance measuring method in a lightwave distance meter.
【０００２】[0002]
【従来の技術】従来、切換器により内部光路と測定光路
を交互に切り換え、光源から内部光路を通って検出器に
入射する内部光と光源から測定光路を通って検出器に入
射する測定光の位相をそれぞれ少なくとも２つの変調周
波数の光について順次求め、内部光と測定光の位相差か
ら目標点までの測距を行なう光波距離計による測距方法
が知られている。2. Description of the Related Art Conventionally, an internal optical path and a measurement optical path are alternately switched by a switch, and the internal light from the light source passing through the internal optical path to the detector and the measurement light entering the detector via the measurement optical path from the light source to the detector. There is known a distance measuring method using a lightwave distance meter that sequentially obtains phases of light of at least two modulation frequencies and measures a distance from a phase difference between internal light and measurement light to a target point.
【０００３】これを更に詳細に説明すると、図３に示す
ように、内部光の位相測定Ａと測定光の位相測定Ｂとを
切換器の切り換えにより順次行なう場合、例えば３つ
（Ｆ1、Ｆ2、Ｆ3、Ｆ1＞Ｆ2＞Ｆ3とする）の変調周波数
の光を用い、内部光の位相測定Ａは、変調周波数Ｆ3、
Ｆ2及びＦ1の順序で、測定光の位相測定Ｂは変調周波数
Ｆ1、Ｆ2、及びＦ3の順序で行なう。（同図中、１、
２、３はそれぞれ変調周波数Ｆ1、Ｆ2、Ｆ3で測定した
値を示す。） 各変調周波数における測定では、例えば１万回測定して
平均値を求める。測定データＤ1、Ｄ2、Ｄ3、Ｄ4、Ｄ5
は、内部光路から測定光路への切換器による切り換えの
前後に行なわれる周波数Ｆ1、Ｆ2、Ｆ3の内部光の位相
測定と周波数Ｆ1、Ｆ2、Ｆ3の測定光の位相測定とから
求める（同図中Ｄ1〜Ｄ5は測距データＤ1、Ｄ2…Ｄ5が
得られるタイミングを示す。）To explain this in more detail, as shown in FIG. 3, when the phase measurement A of the internal light and the phase measurement B of the measurement light are sequentially performed by switching the switch, for example, three (F 1 , F 1) 2 , F 3 , F 1 > F 2 > F 3 ), and the phase measurement A of the internal light is performed using the modulation frequencies F 3 ,
In order of F 2 and F 1, phase measurement B of the measurement light is carried out in the order of the modulation frequencies F 1, F 2, and F 3. (In the figure, 1,
Numerals 2 and 3 indicate values measured at the modulation frequencies F 1 , F 2 and F 3 , respectively. In the measurement at each modulation frequency, for example, measurement is performed 10,000 times, and an average value is obtained. Measurement data D 1, D 2, D 3 , D 4, D 5
Includes a phase measurement of the measuring beam frequencies F 1, F 2, phase measurements and frequencies F 1 of the internal light of F 3, F 2, F 3 to be performed before and after the switching by switcher from internal optical path to the measurement path obtained from (figure in D 1 to D 5 shows the timing of the distance measurement data D 1, D 2 ... D 5 is obtained.)
【０００４】[0004]
【発明が解決しようとする課題】前述の測距方法による
と、ドリフトのために比較的正確な測距値が得られない
という課題があった。本発明は、従来の測距方法の課題
を解決することをその目的とするものである。According to the distance measuring method described above, there is a problem that a relatively accurate measured value cannot be obtained due to drift. An object of the present invention is to solve the problems of the conventional distance measuring method.
【０００５】[0005]
【課題を解決するための手段】本発明は、前記目的を達
成するために、切換器により内部光路と測定光路を交互
に切り換え、光源から内部光路を通って検出器に入射す
る内部光と、光源から測定光路を通って検出器に入射す
る測定光の位相を、それぞれ少なくとも２つの変調周波
数の光について求め、測定光と内部光の位相差から目標
点までの測距を行なう光波距離計の測距方法において、
最大変調周波数以外の周波数の測定光又は内部光からそ
の位相の測定を開始し、内部光路から測定光路への切り
換え及び測定光路から内部光路への切り換えをそれぞれ
少なくとも１回行い、該切り換えの直前及び直後には最
大変調周波数の内部光と測定光の位相を測定すると共
に、該切り換え直前の最大変調周波数の内部光及び測定
光の位相の測定の１つ前に、それぞれ最大変調周波数以
外の同一の周波数の内部光及び測定光の位相を測定し、
内部光路から測定光路への切り換え直前に測定した内部
光の位相と切り換え直後に測定した測定光の位相の位相
差と、測定光路から内部光路への切り換え直前に測定し
た測定光の位相と切り換え直後に測定した内部光の位相
の位相差とを平均した平均位相差を目標点までの距離の
算出に用いることを特徴とする。According to the present invention, in order to achieve the above object, an internal light path and a measurement optical path are alternately switched by a switch, and internal light incident on a detector from the light source through the internal optical path, A lightwave distance meter that determines the phase of measurement light incident on a detector through a measurement optical path from a light source for light of at least two modulation frequencies and measures the distance from a phase difference between the measurement light and internal light to a target point. In the distance measurement method,
Start measuring the phase from the measurement light or the internal light at a frequency other than the maximum modulation frequency , and switch from the internal optical path to the measurement optical path.
Switching and switching from the measurement optical path to the internal optical path, respectively.
At least performed one time immediately before and immediately after the switching is determined Then co measurement light phase and the interior light of the most <br/> large modulation frequency
To, the cutting conversion ETadashi internal light and measurement before the maximum modulation frequency
Before one of the measurement of the phase of the light, to measure the internal light and the measurement light phase of the same frequency other than the maximum modulation frequency, respectively,
Internal measured immediately before switching from internal optical path to measurement optical path
The phase of the light phase and the phase of the measurement light measured immediately after switching
Measurement immediately before switching from the measurement optical path to the internal optical path.
Phase of the measured light and the phase of the internal light measured immediately after switching
The average phase difference obtained by averaging the phase difference of
Characterized in be used in actual calculation.
【０００６】[0006]
【作用】前述した測距方法によれば、内部光の位相測定
は、図３に示すように、変調周波数Ｆ3、Ｆ2、Ｆ1の順
序で行ない、測定光の位相測定は、変調周波数Ｆ1、
Ｆ2、F3の順序で行なうが、この測定された位相データ
は、それぞれ、その測定前の周波数と測定時の周波数の
差の大きさにより位相データのドリフト量が異なる。す
なわち、図４に示すように、高い精度が要求される短距
離計測用の高周波数Ｆ1による内部光の位相データＡ
1は、その測定前の周波数Ｆ2と測定時の周波数Ｆ1の差
が大きいためドリフト量が大きいのに対し、高周波数Ｆ
1による測定光の位相データＢ1は、その測定前の周波数
と測定時の周波数がＦ1で変らないため、ドリフト量が
小さい。これは周波数差が大きく変化すると、受光部又
は送光部の電気回路内にあるインダクタンス成分などに
より信号が落ちつくまで時間がかかるためである。According to the distance measuring method described above, the phase measurement of the internal light is performed in the order of modulation frequencies F 3 , F 2 , and F 1 as shown in FIG. F 1 ,
The measurement is performed in the order of F 2 and F 3 , and the measured phase data differs in the drift amount of the phase data depending on the magnitude of the difference between the frequency before the measurement and the frequency at the time of the measurement. That is, as shown in FIG. 4, the internal light due to the high frequencies F 1 for short-range measurement where high accuracy is required phase data A
1, whereas a large amount of drift for a large difference in the frequency F 1 at the time of measurement and the frequency F 2 of the previous measurement, the high frequency F
The phase data B 1 of the measurement light obtained by 1 has a small drift amount because the frequency before measurement and the frequency at the time of measurement do not change with F 1 . This is because if the frequency difference changes greatly, it takes time for the signal to settle down due to an inductance component or the like in the electric circuit of the light receiving unit or the light transmitting unit.
【０００７】したがって周波数Ｆ1による測定光と内部
光の位相差データを求めたとき、ドリフトが相殺され
ず、高い精度が得られない。本発明は、従来の測距方法
についてのこのような考察から導き出されたものであ
る。Therefore, when the phase difference data between the measurement light and the internal light at the frequency F 1 is obtained, the drift is not canceled out and high accuracy cannot be obtained. The present invention has been derived from this consideration of the conventional ranging method.
【０００８】図１に示すように、周波数Ｆ3、Ｆ2及びＦ
1の内部光の位相データＡ3、Ａ2及びＡ1を順次求め、次
いで切換器を切換えて、周波数Ｆ1、Ｆ3、Ｆ2及びＦ1の
測定光の位相データＢ1′、Ｂ3、Ｂ2及びＢ1を求め、再
び切換器を切換えて周波数Ｆ1、Ｆ3、Ｆ2及びＦ1の内部
光の位相データＡ1′、Ａ3、Ａ2及びＡ1を求め、次いで
周波数Ｆ1、Ｆ3、Ｆ2及びＦ1の測定光の位相データ
Ｂ1′、Ｂ3、Ｂ2、Ｂ1を求める。そして位相データ
Ａ1、Ｂ1′及び位相Ｂ1、Ａ1′の平均値を算出し、測距
データＤ1を求める。以下同様の測定を任意回繰返す。As shown in FIG. 1, the frequencies F 3 , F 2 and F
The phase data A 3 , A 2, and A 1 of the internal light 1 are sequentially obtained, and then the switch is switched so that the phase data B 1 ′, B 3 of the measurement light having the frequencies F 1 , F 3 , F 2 and F 1 are obtained. , B 2 and B 1 , and switches are switched again to obtain phase data A 1 ′, A 3 , A 2 and A 1 of the internal light of the frequencies F 1 , F 3 , F 2 and F 1 , and then the frequency The phase data B 1 ′, B 3 , B 2 , and B 1 of the measurement lights of F 1 , F 3 , F 2, and F 1 are obtained. Then, the average value of the phase data A 1 , B 1 ′ and the phases B 1 , A 1 ′ is calculated, and the distance measurement data D 1 is obtained. Hereinafter, the same measurement is repeated arbitrarily.
【０００９】各周波数における測定では、例えば５００
０回測定して平均値を求める。測距データＤ1、Ｄ2…
は、内部光路から測定光路への切換器による切り換えの
前後に行なわれる周波数Ｆ3、Ｆ2、Ｆ1の内部光の位相
測定及び周波数Ｆ1、Ｆ3、Ｆ2、Ｆ1の測定光の位相測定
と、測定光路から内部光路への切換器による切り換えの
直後に行われる周波数Ｆ1の内部光の位相測定とから求
める。In the measurement at each frequency, for example, 500
Measure 0 times and determine the average value. Distance data D 1 , D 2 ...
Is the phase measurement of the internal light at frequencies F 3 , F 2 , and F 1 performed before and after the switch from the internal optical path to the measurement optical path, and the measurement of the measurement light at the frequencies F 1 , F 3 , F 2 , and F 1 . obtained from the phase measurement, the internal light of the phase measurement of the frequencies F 1 which is carried out immediately after the switching by switching unit to the internal optical path from the measurement path.
【００１０】内部光路から測定光路への切り換えの直前
の周波数Ｆ1の内部光の位相データＡ1及び該切り換え直
後の周波数Ｆ1の測定光の位相データＢ1′のドリフト量
は、前述の理由により大（ΔＤ）及び小（Δｄ）であ
り、測定光路から内部光路への切り換えの直前の周波数
Ｆ1の測定光の位相データＢ1及び該切り換え直後の周波
数Ｆ1の内部光の位相データＡ1′のドリフト量は、大
（ΔＤ）及び小（Δｄ）である。The amount of drift of the phase data A 1 of the internal light having the frequency F 1 immediately before switching from the internal optical path to the measuring optical path and the phase data B 1 ′ of the measuring light having the frequency F 1 immediately after the switching is due to the reasons described above. (ΔD) and small (Δd), the phase data B 1 of the measurement light having the frequency F 1 immediately before switching from the measurement optical path to the internal optical path and the phase data A of the internal light having the frequency F 1 immediately after the switching. The drift amount of 1 ′ is large (ΔD) and small (Δd).
【００１１】したがって測距データＤ1は例えば（Δｄ
−ΔＤ）＋（ΔＤ−Δｄ）として平均値を算出して求め
れば位相差データのドリフト量は相殺される。Therefore, the distance measurement data D 1 is, for example, (Δd
If the average value is calculated and calculated as −ΔD) + (ΔD−Δd), the drift amount of the phase difference data is canceled.
【００１２】[0012]
【実施例】以下本発明の実施例を図面につき説明する。BRIEF DESCRIPTION OF THE DRAWINGS FIG.
【００１３】図２は、本発明の測距方法の実施に使用す
る光波距離計の原理図を示す。FIG. 2 shows a principle diagram of a light wave distance meter used for carrying out the distance measuring method of the present invention.
【００１４】同図において、１は、例えば、Ｆ1＝１５
ＭＨｚ、Ｆ2＝１５０ＫＨｚ、Ｆ3＝１６５ＫＨｚの３つ
の周波数の信号を出力する発振器で、この発振器１の出
力は変調器２に供給され、変調器２の出力は例えばレー
ザダイオードの光源３に供給されるようになっている。
４は送受光用ミラー、５は対物レンズ、６は目標点に置
かれた反射鏡、７は光の検出器、８は切換器、９は位相
計である。In FIG. 1, 1 is, for example, F 1 = 15
MHz, F 2 = 150 KHz, and an oscillator that outputs signals of three frequencies of F 3 = 165 KHz. The output of the oscillator 1 is supplied to the modulator 2, and the output of the modulator 2 is supplied to the light source 3 of, for example, a laser diode. It is supposed to be.
Reference numeral 4 denotes a transmitting / receiving mirror, 5 denotes an objective lens, 6 denotes a reflecting mirror placed at a target point, 7 denotes a light detector, 8 denotes a switch, and 9 denotes a phase meter.
【００１５】次に、測距方法について説明すると、先
ず、切換器８を図示の位置にし、光源３から変調周波数
Ｆ3＝１６５ＫＨｚの光を放射させ、この光を内部光と
して、光源３からプリズム１０、１１、１２を経て検出
器７に至る内部光路を経て検出器７に入射させ、この内
部光の位相を位相計９で測定する。この測定は、例えば
１０００回繰返し、その平均値を求める。その後、切換
器８はそのままにして変調周波数がＦ2＝１５０ＫＨ
ｚ、Ｆ1＝１５ＭＨｚの光を順次内部光路に通じて内部
光の位相を測定する。この周波数Ｆ2及びＦ1での内部光
の位相の測定は、それぞれ例えば２５００回、５０００
回行ない、その平均値を算出する。Next, a description will be given of the distance measuring method. First, the switch 8 is set to the position shown in the figure, and the light source 3 emits light having a modulation frequency F 3 = 165 KHz. The light enters the detector 7 via an internal optical path extending to the detector 7 via 10, 11, and 12, and the phase of the internal light is measured by the phase meter 9. This measurement is repeated, for example, 1000 times, and the average value is obtained. Thereafter, the modulation frequency is changed to F 2 = 150 KH while the switch 8 is kept as it is.
Light of z, F 1 = 15 MHz is sequentially passed through an internal optical path to measure the phase of the internal light. Measurement of the internal light phase at the frequency F 2 and F 1 are respectively, for example 2500 times, 5000
And calculate the average value.
【００１６】次いで、切換器８を上方に移動し、周波数
Ｆ1の光を測定光として、光源３からプリズム１２、送
受光用ミラー４、対物レンズ５、反射鏡６、対物レンズ
５及び前記ミラー４を経て検出器７に至る測定光路を通
って検出器７に入射させ、この測定光の位相を位相計９
で測定する。この周波数Ｆ1は例えば５０００回繰返
し、その平均値を求める。その後、切換器８は、そのま
まにして変調周波数がＦ3＝１６５ＫＨｚ、Ｆ2＝１５０
ＫＨｚ及びＦ1＝１５ＭＨｚの光を順次測定光路に通し
て測定光の位相を測定する。この周波数Ｆ3、Ｆ2及びＦ
1での測定光の位相の測定は、それぞれ例えば１０００
回、２５００回及び１００００回行ない、その平均値を
算出する。以上の測定の後ドリフト量を相殺するため位
相データＡ1、Ｂ1′及びＢ1、Ａ1′の平均値を算出し、
測距データとしてＤ1を求める。再び切換器８を内部光
路側に切り換え、変調周波数をＦ1、Ｆ3、Ｆ2及びＦ1の
順序で変え、それぞれについて内部光の位相を測定す
る。各周波数での内部光の位相測定は前と同じようにＦ
1については５０００回、Ｆ3については１０００回、Ｆ
2については２５００回、Ｆ1については５０００回行な
う。Next, the switch 8 is moved upward, and the light of the frequency F 1 is used as measurement light from the light source 3 to the prism 12, the transmitting / receiving mirror 4, the objective lens 5, the reflecting mirror 6, the objective lens 5, and the mirror. 4 through a measuring optical path leading to the detector 7 to enter the detector 7, and the phase of the measuring light is measured by a phase meter 9
Measure with The frequencies F 1 is repeated for example 5000 times and calculate the average. Thereafter, the switching unit 8 keeps the modulation frequency F 3 = 165 KHz and F 2 = 150
Light of KHz and F 1 = 15 MHz is sequentially passed through a measurement optical path to measure the phase of the measurement light. The frequencies F 3 , F 2 and F
The measurement of the phase of the measurement light at 1 is, for example, 1000
Times, 2500 times and 10000 times, and the average value is calculated. After the above measurement, the average value of the phase data A 1 , B 1 ′ and B 1 , A 1 ′ is calculated to cancel the drift amount,
Request D 1 as the distance measurement data. The switch 8 is again switched to the internal optical path side, the modulation frequency is changed in the order of F 1 , F 3 , F 2 and F 1 , and the phase of the internal light is measured for each. The phase measurement of the internal light at each frequency is the same as before.
5000 times for 1, 1000 for the F 3, F
2500 times for 2, it carried out 5000 times for the F 1.
【００１７】測距データＤ1は、切換器８の第１回目の
切り換えＳ1の直前の周波数Ｆ1の内部光の位相測定より
２つ手前の周波数Ｆ3の内部光の位相測定から第２回目
の切り換えＳ2の直後の周波数Ｆ1の内部光の位相測定ま
での間に行われる内部光の位相測定及び測定光の位相測
定とから得られる。測距データＤ2は、切換器８の第２
回目の切り換えＳ2の後の周波数Ｆ2の内部光の位相測定
から切換器８の第４回目の切り換えＳ4の後の周波数Ｆ1
の内部光の位相測定までの間に行なわれる内部光の位相
測定及び測定光の位相測定とから得られる。The distance measurement data D 1 is obtained from the phase measurement of the internal light of the frequency F 3 two times before the phase measurement of the internal light of the frequency F 1 immediately before the first switching S 1 of the switch 8, from the second. obtained from the phase measurement and phase measurement of the measuring light inside the light that takes place until the phase measurement of the internal light of frequencies F 1 immediately after the round th switching S 2. The distance measurement data D 2 is stored in the second
Frequencies F 1 after the fourth round of switching S 4 times th switching S frequency F 2 of the switching device 8 from the phase measurement of the internal light after the 2
From the internal light phase measurement and the measurement light phase measurement performed before the internal light phase measurement.
【００１８】[0018]
【発明の効果】本発明は、前述のように、最大変調周波
数以外の周波数の測定光又は内部光からその位相の測定
を開始し、切換器による内部光路と測定光路の切り換え
の直前及び直後には、最大変調周波数の内部光と測定光
の位相を測定し、前記切り換えの直前の１つ前に最大変
調周波数以外の同一の周波数の内部光と測定光の位相を
測定するので、位相測定のドリフト量が相殺され精度の
高い測距値が得られるという効果を有する。As described above, according to the present invention, the measurement of the phase is started from the measuring light or the internal light having a frequency other than the maximum modulation frequency, and immediately before and after the switching between the internal optical path and the measuring optical path by the switch. Measures the phase of the internal light having the maximum modulation frequency and the phase of the measurement light, and measures the phase of the internal light having the same frequency other than the maximum modulation frequency and the phase of the measurement light immediately before the switching immediately before the switching. This has an effect that the drift amount is canceled and a highly accurate ranging value is obtained.
【図１】 本発明の測距方法の実施例を説明するタイム
チャートFIG. 1 is a time chart for explaining an embodiment of a distance measuring method according to the present invention.
【図２】 本発明の測距方法の実施に使用する光波距離
計の原理図FIG. 2 is a diagram showing the principle of a lightwave distance meter used for implementing the distance measuring method of the present invention.
【図３】 従来の光波距離計における測距方法を説明す
るタイムチャートFIG. 3 is a time chart for explaining a distance measuring method in a conventional lightwave distance meter.
【図４】 従来の光波距離計における測定方法による位
相データとドリフトとの関係を示すタイムチャートFIG. 4 is a time chart showing a relationship between phase data and drift by a measurement method in a conventional lightwave distance meter.
１ 発振器 ２ 変調器 ３ 光源 ７ 光の検出器 ８ 切換器 ４ 位相計 DESCRIPTION OF SYMBOLS 1 Oscillator 2 Modulator 3 Light source 7 Light detector 8 Switching device 4 Phase meter
───────────────────────────────────────────────────── フロントページの続き (56)参考文献 特開 平２−242187（ＪＰ，Ａ) 特開 平３−229186（ＪＰ，Ａ) 実開 昭60−113573（ＪＰ，Ｕ) 実開 昭60−113574（ＪＰ，Ｕ) (58)調査した分野(Int.Cl.7，ＤＢ名) G01S 7/00 - 7/42 G01S 17/00 - 17/88 ──────────────────────────────────────────────────続 き Continuation of the front page (56) References JP-A-2-242187 (JP, A) JP-A-3-229186 (JP, A) JP-A 60-113573 (JP, U) JP-A 60-113 113574 (JP, U) (58) Fields investigated (Int. Cl. 7 , DB name) G01S 7 /00-7/42 G01S 17/00-17/88
Claims (1)
に切り換え、光源から内部光路を通って検出器に入射す
る内部光と、光源から測定光路を通って検出器に入射す
る測定光の位相を、それぞれ少なくとも２つの変調周波
数の光について求め、測定光と内部光の位相差から目標
点までの測距を行なう光波距離計の測距方法において、
最大変調周波数以外の周波数の測定光又は内部光からそ
の位相の測定を開始し、内部光路から測定光路への切り
換え及び測定光路から内部光路への切り換えをそれぞれ
少なくとも１回行い、該切り換えの直前及び直後には最
大変調周波数の内部光と測定光の位相を測定すると共
に、該切り換え直前の最大変調周波数の内部光及び測定
光の位相の測定の１つ前に、それぞれ最大変調周波数以
外の同一の周波数の内部光及び測定光の位相を測定し、
内部光路から測定光路への切り換え直前に測定した内部
光の位相と切り換え直後に測定した測定光の位相の位相
差と、測定光路から内部光路への切り換え直前に測定し
た測定光の位相と切り換え直後に測定した内部光の位相
の位相差とを平均した平均位相差を目標点までの距離の
算出に用いることを特徴とする光波距離計における測距
方法。An internal light path and a measurement optical path are alternately switched by a switch, and a phase of internal light entering the detector from the light source through the internal optical path and a phase of measurement light entering the detector through the measurement optical path from the light source. Is obtained for light of at least two modulation frequencies, and a distance measurement method of a light wave distance meter for measuring a distance from a phase difference between the measurement light and the internal light to a target point.
Start measuring the phase from the measurement light or the internal light at a frequency other than the maximum modulation frequency , and switch from the internal optical path to the measurement optical path.
Switching and switching from the measurement optical path to the internal optical path, respectively.
At least performed one time immediately before and immediately after the switching is determined Then co measurement light phase and the interior light of the most <br/> large modulation frequency
To, the cutting conversion ETadashi internal light and measurement before the maximum modulation frequency
Before one of the measurement of the phase of the light, to measure the internal light and the measurement light phase of the same frequency other than the maximum modulation frequency, respectively,
Internal measured immediately before switching from internal optical path to measurement optical path
The phase of the light phase and the phase of the measurement light measured immediately after switching
Measurement immediately before switching from the measurement optical path to the internal optical path.
Phase of the measured light and the phase of the internal light measured immediately after switching
The average phase difference obtained by averaging the phase difference of
Ranging method in optical distance meter, characterized in be used in actual calculation.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP23385992A JP3236941B2 (en) | 1992-09-01 | 1992-09-01 | Distance measurement method for lightwave distance meter |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP23385992A JP3236941B2 (en) | 1992-09-01 | 1992-09-01 | Distance measurement method for lightwave distance meter |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0682552A JPH0682552A (en) | 1994-03-22 |
| JP3236941B2 true JP3236941B2 (en) | 2001-12-10 |
Family
ID=16961694
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP23385992A Expired - Lifetime JP3236941B2 (en) | 1992-09-01 | 1992-09-01 | Distance measurement method for lightwave distance meter |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP3236941B2 (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7339655B2 (en) | 2004-10-20 | 2008-03-04 | Sokkia Co., Ltd. | Electric optical distance wavelength meter |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2681967B2 (en) * | 1988-02-12 | 1997-11-26 | トヨタ自動車株式会社 | Piston-Piston ring assembly |
| JP2010014502A (en) * | 2008-07-02 | 2010-01-21 | Murata Mach Ltd | Optical range finder |
| US10230934B2 (en) * | 2013-06-14 | 2019-03-12 | Microsoft Tehcnology Licensing, Llc | Depth map correction using lookup tables |
-
1992
- 1992-09-01 JP JP23385992A patent/JP3236941B2/en not_active Expired - Lifetime
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7339655B2 (en) | 2004-10-20 | 2008-03-04 | Sokkia Co., Ltd. | Electric optical distance wavelength meter |
| CN100565243C (en) * | 2004-10-20 | 2009-12-02 | 株式会社扫佳 | Light wave rangefinder |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0682552A (en) | 1994-03-22 |
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