JP3203428B2 - Substrate holder for liquid phase epitaxy - Google Patents
Substrate holder for liquid phase epitaxyInfo
- Publication number
- JP3203428B2 JP3203428B2 JP27824691A JP27824691A JP3203428B2 JP 3203428 B2 JP3203428 B2 JP 3203428B2 JP 27824691 A JP27824691 A JP 27824691A JP 27824691 A JP27824691 A JP 27824691A JP 3203428 B2 JP3203428 B2 JP 3203428B2
- Authority
- JP
- Japan
- Prior art keywords
- liquid phase
- substrate holder
- phase epitaxy
- single crystal
- substrate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Landscapes
- Crystals, And After-Treatments Of Crystals (AREA)
- Liquid Deposition Of Substances Of Which Semiconductor Devices Are Composed (AREA)
Description
【0001】本発明は、液相エピタキシィ用基板ホルダ
に係り、特にIII −V族化合物半導体の液相エピタキシ
ャル成長が施されるGaAs又はGaP等の単結晶基板
を収容する凹部を上面に設けたスライドボート方式の液
相エピタキシィ用基板ホルダに関する。The present invention relates to a substrate holder for liquid phase epitaxy, and more particularly to a slide board having a concave portion on its upper surface for accommodating a single crystal substrate such as GaAs or GaP on which liquid phase epitaxial growth of a III-V compound semiconductor is to be performed. The present invention relates to a substrate holder for liquid phase epitaxy of a liquid crystal type.
【0002】[0002]
【従来の技術】従来、この種の液相エピタキシィ用基板
ホルダは、黒鉛等のホルダ本体の表面の一部又は全部に
炭化けい素膜を被覆してなる(特開昭54−15816
5号公報参照)。2. Description of the Related Art Conventionally, this type of substrate holder for liquid phase epitaxy is formed by coating a part or all of the surface of a holder body such as graphite with a silicon carbide film (Japanese Patent Application Laid-Open No. 54-16816).
No. 5).
【0003】[0003]
【発明が解決しようとする課題】しかしながら、上記従
来の液相エピタキシィ用基板ホルダにおいては、コーク
ス等の粉末状の易黒鉛化性カーボン材料に適宜のバイン
ダーを添加、混練し、この混練物を成形、焼成した後、
更に焼成黒鉛化してホルダ本体とし、しかる後にホルダ
本体からの吸蔵ガスの放出等を防止するため、ホルダ本
体を炭化けい素膜で被覆して基板ホルダとしているもの
の、炭化けい素膜のピンホール又は冷熱サイクルの下で
の繰り返し使用により生ずる炭化けい素膜のクラックか
ら放出される吸蔵ガスによって単結晶基板が消耗された
り、熱伝導率が比較的大きいため、単結晶基板が冷却過
程において不均一に冷却されて、エピタキシャル層が不
均一となる問題がある。However, in the above-mentioned conventional substrate holder for liquid phase epitaxy, a suitable binder is added to a powdery graphitizable carbon material such as coke and kneaded, and the kneaded material is formed. After firing,
Furthermore, the holder body is covered with a silicon carbide film to prevent the release of occluded gas from the holder body afterwards, thereby preventing the release of occluded gas from the holder body. The single crystal substrate is consumed by the occluded gas released from cracks in the silicon carbide film generated by repeated use under a cooling / heating cycle, or the single crystal substrate becomes uneven during the cooling process due to its relatively large thermal conductivity. There is a problem that the epitaxial layer becomes non-uniform due to cooling.
【0004】又、炭化けい素膜が溶媒であるGaとぬれ
易いため、エピタキシャル成長の終了した単結晶基板を
基板ホルダから取り外すことが困難となったり、単結晶
基板にチッピング等が生じたり、かつホルダ本体から脱
落したカーボン粒子が単結晶基板のエピタキシャル層中
に巻き込まれたりして不良品となり、歩留まりの低下を
もたらしている。In addition, since the silicon carbide film is easily wetted by Ga as a solvent, it becomes difficult to remove the single crystal substrate after the epitaxial growth from the substrate holder, chipping or the like occurs on the single crystal substrate, The carbon particles dropped from the main body are caught in the epitaxial layer of the single crystal substrate and become defective, resulting in a decrease in yield.
【0005】そこで本発明は、エピタキシャル基板の品
質を均質とし、かつ歩留まりを高め得る液相エピタキシ
ィ用基板ホルダの提供を目的とする。Accordingly, an object of the present invention is to provide a substrate holder for liquid phase epitaxy which can make the quality of an epitaxial substrate uniform and can increase the yield.
【0006】[0006]
【課題を解決するための手段】前記課題を解決するた
め、本発明の液相エピタキシィ用基板ホルダは、 III−
V族化合物半導体の液相エピタキシャル成長が施される
GaAs又はGaP等の単結晶基板を収容する液相エピ
タキシィ用基板ホルダであって、不純物含有率が5pp
m以下であり、存在する全ての独立閉気孔が50μm以
下であるガラス状カーボンのみからなるものである。In order to solve the above problems, a substrate holder for liquid phase epitaxy according to the present invention comprises:
A substrate holder for liquid phase epitaxy for accommodating a single crystal substrate such as GaAs or GaP on which liquid phase epitaxial growth of a group V compound semiconductor is to be performed, wherein the impurity content is 5 pp.
m or less, and all the closed pores present are 50 μm or less.
It is made of only the glass-like carbon Ru bottom der.
【0007】ここで、ガラス状カーボンとは、液状の熱
硬化性樹脂の硬化物を非酸化性雰囲気中において焼成炭
化して得られ、ガス不透過性に優れ、高硬度で異方性の
ない組織を有する三次元網目状のガラス構造を有する炭
素材である。Here, glassy carbon is obtained by firing and carbonizing a cured product of a liquid thermosetting resin in a non-oxidizing atmosphere, and has excellent gas impermeability, high hardness and no anisotropy. It is a carbon material having a three-dimensional network glass structure having a texture.
【0008】[0008]
【作用】上記手段においては、吸蔵ガスの放出がなく、
かつ熱伝導率が比較的小さくなると共に、不純物含有率
5ppm以下のガラス状カーボンのみからなるためA
s,P,Al等の触媒であるGaとの非ぬれ性が高くな
り、かつバーティクルの発生が少なくなる。In the above means, no occluded gas is released,
In addition, the thermal conductivity is relatively small, and only the glassy carbon having an impurity content of 5 ppm or less is used.
The non-wetting property with Ga, which is a catalyst such as s, P, and Al, is increased, and the generation of verticles is reduced.
【0009】ガラス状カーボンの不純物含有率が5pp
mを超えるとAs,P,Al等の溶媒であるGaとのぬ
れ性が良くなると同時に不純物が放出される。又、存在
する全ての独立閉気孔の大きさが、50μmを超える
と、吸蔵ガスが発生し易くなる。The glassy carbon has an impurity content of 5 pp
If it exceeds m, the wettability with Ga, which is a solvent such as As, P, Al, etc., is improved, and at the same time, impurities are released. Also exist
If the size of all the closed pores exceeds 50 μm, occluded gas is likely to be generated.
【0010】[0010]
【実施例】以下、本発明の実施例について図面を参照し
て説明する。図1は本発明の一実施例の液相エピタキシ
ィ用基板ホルダを備えた液相エピタキシィ装置の概念図
である。Embodiments of the present invention will be described below with reference to the drawings. FIG. 1 is a conceptual diagram of a liquid phase epitaxy apparatus having a liquid phase epitaxy substrate holder according to one embodiment of the present invention.
【0011】液相エピタキシィ用基板ホルダ1は、存在
する全ての独立閉気孔が50μm以下である高純度(不
純物含有率5ppm以下)のガラス状カーボンのみから
なり、矩形平板状のホルダ本体2の上面に単結晶基板3
を収容する基板収容凹部4が設けられており、石英棒5
によって炉心管(図示せず)等に出し入れされる。[0011] The liquid-phase epitaxy for the substrate holder 1, the presence
All independent closed pores is only glassy carbon of high purity Ru der below 50 [mu] m (hereinafter impurity content 5 ppm), the single crystal substrate on the upper surface of the rectangular plate-shaped holder main body 2 3
A substrate accommodating recess 4 for accommodating the quartz rod 5 is provided.
Into and out of the furnace tube (not shown).
【0012】基板ホルダ1上には、同様のガラス状カー
ボンからなり、矩形平板状のスライダ6が石英棒7によ
って、摺動自在に載置されており、そのスライダ本体8
には,GaP溶液9等を収容する穴10が貫通して設け
られている。On the substrate holder 1, a rectangular flat slider 6 made of the same glassy carbon is slidably mounted by a quartz rod 7, and its slider body 8 is provided.
Is provided with a hole 10 for accommodating the GaP solution 9 and the like.
【0013】上記構成の液相エピタキシィ用基板ホルダ
の製造に際しては、先ず、液状の熱硬化性樹脂、例えば
フラン樹脂、フェノール樹脂、エポキシ樹脂、不飽和ポ
リエステル樹脂、ユリア樹脂、メラミン樹脂、アルキッ
ド樹脂、キシレン樹脂等に、有機スルホン酸を少量ずつ
添加して常温で重合させる操作を繰り返して行い、かつ
重合させた流動性ポリマーを脱泡処理した後、型に注入
して乾燥器に納置し、その中において20℃/hrの昇
温速度で80〜100℃までゆっくり昇温し、この温度
で10時間保持して矩形の樹脂板を得た。In manufacturing the substrate holder for liquid phase epitaxy having the above structure, first, a liquid thermosetting resin such as furan resin, phenol resin, epoxy resin, unsaturated polyester resin, urea resin, melamine resin, alkyd resin, After repeating the operation of adding the organic sulfonic acid little by little to the xylene resin and polymerizing at room temperature, and defoaming the polymerized fluid polymer, pour it into a mold and place it in the dryer, The temperature was slowly raised from 80 to 100 ° C. at a rate of 20 ° C./hr and kept at this temperature for 10 hours to obtain a rectangular resin plate.
【0014】そして、樹脂板を非酸化性雰囲気(ヘリウ
ム、アルゴン、窒素等の不活性ガス雰囲気、水素、ハロ
ゲン等の還元性ガス雰囲気、あるいは減圧若しくは真空
下、又は大気を遮断した状態の雰囲気)中において2〜
3℃/hrの昇温速度で1000℃まで昇温して焼成炭
化し、三次元網目状のガラス構造とし、最後にハロゲン
ガス雰囲気中において2000℃の温度で純化処理を施
して所望の液相エピタキシィ用基板ホルダを得た。Then, the resin plate is placed in a non-oxidizing atmosphere (an inert gas atmosphere such as helium, argon or nitrogen, a reducing gas atmosphere such as hydrogen or halogen, or an atmosphere under reduced pressure or vacuum or in a state where the atmosphere is shut off). 2 in
The temperature was raised to 1000 ° C. at a temperature rising rate of 3 ° C./hr, followed by firing and carbonization to obtain a three-dimensional network glass structure. A substrate holder for epitaxy was obtained.
【0015】上述した液相エピタキシィ用基板ホルダを
用いGaAs単結晶基板100枚に液相エピタキシャル
成長を施したところ、エピタキシャル層のスリップ、カ
ーボン粒子等のパーティクルの付着したパーティクル不
良、チッピング不良等の発生枚数は、黒鉛質のホルダ本
体に炭化けい素膜を被覆した従来の基板ホルダを使用し
た場合のそれらを併記する表1に示すようになった。When liquid phase epitaxial growth was performed on 100 GaAs single crystal substrates using the above-described substrate holder for liquid phase epitaxy, the number of occurrences of slip of the epitaxial layer, defective particles with particles such as carbon particles adhered, chipping defects, etc. Are as shown in Table 1 together with a case where a conventional substrate holder in which a graphite-based holder body is coated with a silicon carbide film is used.
【0016】[0016]
【表1】 [Table 1]
【0017】従って、本発明の液相エピタキシィ用基板
ホルダを用いることにより、エピタキシャル層の均質性
を大幅に高め得ると共に、パーティクルの発生を大幅に
抑制し得、かつチッピング等の発生を低減し得ることが
わかる。Therefore, by using the substrate holder for liquid phase epitaxy of the present invention, the homogeneity of the epitaxial layer can be greatly improved, the generation of particles can be largely suppressed, and the generation of chipping and the like can be reduced. You can see that.
【0018】[0018]
【発明の効果】以上説明したように、本発明の液相エピ
タキシィ用基板ホルダによれば、吸蔵ガスの放出がな
く、かつ熱伝導率が従来のものに比して比較的小さくな
るので、単結晶基板は吸蔵ガスによって消耗されること
がなく、その品質を向上でき、かつ単結晶基板が冷却過
程において均一に冷却され、エピタキシャル層を均一に
することができる。As described above, according to the substrate holder for liquid phase epitaxy of the present invention, since no occluded gas is released and the thermal conductivity is relatively small as compared with the conventional one, the single-layer substrate holder is simple. The crystal substrate is not consumed by the occluded gas, the quality thereof can be improved, and the single crystal substrate is cooled uniformly in the cooling process, so that the epitaxial layer can be made uniform.
【0019】又、不純物含有率5ppm以下のガラス状
カーボンのみからなるため、As,P,Al等の溶媒で
あるGaとの非ぬれ性が高くなり、かつパーティクルの
発生が少なくなるので、液相エピタキシャル成長が完了
した単結晶基板を基板ホルダから取り出すことが容易と
なってチッピング等が発生をすることがなく、かつ単結
晶基板の汚染が低減されると共に、高耐久性とすること
ができ、ひいては歩留まりを大幅に向上することができ
る。Further, since it is composed of only glassy carbon having an impurity content of 5 ppm or less, the non-wetting property with Ga as a solvent such as As, P, and Al is increased, and the generation of particles is reduced. The single crystal substrate on which the epitaxial growth has been completed can be easily taken out from the substrate holder without causing chipping or the like, and the contamination of the single crystal substrate can be reduced, and the durability can be increased. Yield can be greatly improved.
【図1】本発明の一実施例の液相エピタキシィ用基板ホ
ルダを備えた液相エピタキシィ装置の概念図である。FIG. 1 is a conceptual diagram of a liquid phase epitaxy apparatus provided with a substrate holder for liquid phase epitaxy according to one embodiment of the present invention.
1 基板ホルダ 2 ホルダ本体 4 基板収容凹部 DESCRIPTION OF SYMBOLS 1 Substrate holder 2 Holder main body 4 Substrate accommodation recess
───────────────────────────────────────────────────── フロントページの続き (72)発明者 蒔田 律郎 山形県西置賜郡小国町大字小国町378番 地 東芝セラミックス株式会社 小国製 造所内 (72)発明者 外谷 栄一 山形県西置賜郡小国町大字小国町378番 地 東芝セラミックス株式会社 小国製 造所内 (72)発明者 田中 隆 山形県西置賜郡小国町大字小国町378番 地 東芝セラミックス株式会社 小国製 造所内 (56)参考文献 特開 平3−205388(JP,A) 特開 平3−223196(JP,A) 特開 平2−172887(JP,A) (58)調査した分野(Int.Cl.7,DB名) H01L 21/208,21/368 C30B 19/06 ──────────────────────────────────────────────────続 き Continued on the front page (72) Inventor Ritsuo Makita 378 Oguni-machi, Oguni-machi, Oguni-machi, Nishiokitama-gun, Yamagata Prefecture Inside the Oguni Plant, Toshiba Ceramics Co., Ltd. 378, Toshiba Ceramics Co., Ltd.Oguni Factory (72) Inventor Takashi Tanaka 378, Okunicho, Oguni-machi, Nishiokitama-gun, Yamagata Prefecture Toshiba Ceramics Co., Ltd.Oguni Factory (56) References (JP, A) JP-A-3-223196 (JP, A) JP-A-2-172887 (JP, A) (58) Fields investigated (Int. Cl. 7 , DB name) H01L 21/208, 21 / 368 C30B 19/06
Claims (1)
シャル成長が施されるGaAs又はGaP等の単結晶基
板を収容する液相エピタキシィ用基板ホルダであって、
不純物含有率が5ppm以下であり、存在する全ての独
立閉気孔が50μm以下であるガラス状カーボンのみか
らなることを特徴とする液相エピタキシィ用基板ホル
ダ。1. A liquid phase epitaxy substrate holder for accommodating a single crystal substrate such as GaAs or GaP on which liquid phase epitaxial growth of a III-V compound semiconductor is performed,
And at 5ppm or less impurity content, all independent closed liquid-phase epitaxy substrate holder holes is equal to or only one <br/> Ranaru glassy carbon Ru der below 50μm present.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP27824691A JP3203428B2 (en) | 1991-09-30 | 1991-09-30 | Substrate holder for liquid phase epitaxy |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP27824691A JP3203428B2 (en) | 1991-09-30 | 1991-09-30 | Substrate holder for liquid phase epitaxy |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH0590182A JPH0590182A (en) | 1993-04-09 |
JP3203428B2 true JP3203428B2 (en) | 2001-08-27 |
Family
ID=17594660
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP27824691A Expired - Lifetime JP3203428B2 (en) | 1991-09-30 | 1991-09-30 | Substrate holder for liquid phase epitaxy |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP3203428B2 (en) |
-
1991
- 1991-09-30 JP JP27824691A patent/JP3203428B2/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
JPH0590182A (en) | 1993-04-09 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP3898278B2 (en) | Method for manufacturing silicon carbide single crystal and apparatus for manufacturing the same | |
US6066205A (en) | Growth of bulk single crystals of aluminum nitride from a melt | |
EP0389533B1 (en) | Sublimation growth of silicon carbide single crystals | |
US3634149A (en) | Method of manufacturing aluminium nitride crystals for semiconductor devices | |
JP5304792B2 (en) | Method and apparatus for producing SiC single crystal film | |
CN114375351B (en) | SiC substrate, siC epitaxial substrate, siC ingot, and methods for producing the same | |
JP2013537164A (en) | Method for graphene growth | |
US4865659A (en) | Heteroepitaxial growth of SiC on Si | |
EP1852527A1 (en) | Silicon carbide single crystal, silicon carbide single crystal wafer, and process for producing the same | |
EP1154049B1 (en) | Method of manufacturing single-crystal silicon carbide | |
EP1375423B1 (en) | Use of a low nitrogen concentration carbonaceous material as a jig. | |
JPH1012692A (en) | Dummy wafer | |
JP4460236B2 (en) | Silicon carbide single crystal wafer | |
JP3203428B2 (en) | Substrate holder for liquid phase epitaxy | |
JPH08509575A (en) | Substrate for growth of 3C-silicon carbide | |
JPH07157307A (en) | Production of high purity beta-type silicon carbide powder for producing silicon carbide single crystal | |
JP2009184897A (en) | Method for manufacturing silicon carbide single crystal | |
JP4661039B2 (en) | Method for manufacturing silicon carbide substrate | |
JP3657036B2 (en) | Silicon carbide thin film and method for manufacturing silicon carbide thin film laminated substrate | |
JPH10130055A (en) | Production of electrode plate for plasma treatment device | |
CA2380145C (en) | Growth of bulk single crystals of aluminum | |
JP2528912B2 (en) | Semiconductor growth equipment | |
JPH0443878B2 (en) | ||
JPH07263366A (en) | Susceptor and its manufacture | |
JPS63225591A (en) | Manufacture of silicon carbide-coated graphite material |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
S531 | Written request for registration of change of domicile |
Free format text: JAPANESE INTERMEDIATE CODE: R313531 |
|
R350 | Written notification of registration of transfer |
Free format text: JAPANESE INTERMEDIATE CODE: R350 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20080629 Year of fee payment: 7 |
|
S111 | Request for change of ownership or part of ownership |
Free format text: JAPANESE INTERMEDIATE CODE: R313111 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20080629 Year of fee payment: 7 |
|
R371 | Transfer withdrawn |
Free format text: JAPANESE INTERMEDIATE CODE: R371 |
|
S111 | Request for change of ownership or part of ownership |
Free format text: JAPANESE INTERMEDIATE CODE: R313111 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20080629 Year of fee payment: 7 |
|
R350 | Written notification of registration of transfer |
Free format text: JAPANESE INTERMEDIATE CODE: R350 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20080629 Year of fee payment: 7 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20090629 Year of fee payment: 8 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20100629 Year of fee payment: 9 |