JP3194766U - Vacuum processing equipment - Google Patents

Vacuum processing equipment Download PDF

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JP3194766U
JP3194766U JP2014005373U JP2014005373U JP3194766U JP 3194766 U JP3194766 U JP 3194766U JP 2014005373 U JP2014005373 U JP 2014005373U JP 2014005373 U JP2014005373 U JP 2014005373U JP 3194766 U JP3194766 U JP 3194766U
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俊人 信清
俊人 信清
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株式会社エヌエス
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Abstract

【課題】真空処理装置の真空予備室において基板交換の作業性が良く、基板保持台、および真空予備室内のメンテナンス、清掃が容易に行える真空処理装置を提供する。【解決手段】真空処理装置10は、少なくとも真空チャンバー本体12と、真空予備室と、基板搬送装置30と、予備室移動機構50を備え、真空チャンバー本体の真空雰囲気中で基板に加工処理を施す真空処理装置であり、真空予備室は、真空チャンバー本体にゲートバルブ15を介して設けられた固定部21と、移動可能な移動部24とで構成され、基板搬送装置は、基板を搭載保持する基板保持台32と、基板保持台を真空チャンバー本体と真空予備室との間を移動可能にする保持台移動機構34を備え、移動部と基板搬送装置は、予備室移動機構に搭載されており、一体的に移動部が固定部に接する位置と離間する位置とに移動可能である。【選択図】図3Provided is a vacuum processing apparatus which has good workability for substrate replacement in a vacuum preparatory chamber of a vacuum processing apparatus and can be easily maintained and cleaned in a substrate holder and a vacuum preparatory chamber. A vacuum processing apparatus includes at least a vacuum chamber main body, a vacuum preliminary chamber, a substrate transfer device, and a preliminary chamber moving mechanism, and performs processing on the substrate in a vacuum atmosphere of the vacuum chamber main body. The vacuum preparatory chamber is composed of a fixed portion 21 provided in the vacuum chamber body via the gate valve 15 and a movable moving portion 24, and the substrate transport device mounts and holds the substrate. A substrate holding table 32 and a holding table moving mechanism 34 that enables the substrate holding table to move between the vacuum chamber main body and the vacuum preparatory chamber are provided. The moving unit and the substrate transfer device are mounted on the preparatory chamber moving mechanism. The moving part can be moved to a position where the moving part is in contact with the fixed part and a position where the moving part is separated from the fixed part. [Selection] Figure 3

Description

考案の詳細な説明Detailed description of the invention

本考案は、真空雰囲気中で基板を加工処理する真空処理装置の構造に関する。The present invention relates to a structure of a vacuum processing apparatus for processing a substrate in a vacuum atmosphere.

真空雰囲気中で、基板表面に特定の加工処理を施す真空チャンバーを備えた真空処理装置は、例えば、半導体製造工程におけるイオンエッチング装置、プラズマCVD装置等様々な装置が知られている。これらの装置では、真空チャンバー内で処理する基板の交換を効率よく行うために、真空予備室を設けて真空チャンバー本体の真空を破ることなく加工処理を連続して行える構造となっている。
図4は従来の装置の説明図であり、装置40は真空チャンバー本体41と、その側面にゲートバルブ42を介して取り付けられた真空予備室45と、基板47を搭載する基板保持台48と、真空予備室45の外側に設けられた保持台移動機構49で構成されている。真空予備室45の上部には基板の交換を行うための開口45aと扉45bが設けられている。保持台移動機構49と基板保持台48とは、真空予備室45の側面壁を貫通する摺動シャフト49aを介して接続されており、基板保持台48は保持台移動機構49が駆動することにより真空チャンバー本体41と真空予備室45の間を往復移動することが可能になる。基板47は、開口45aを通して基板保持台48に搭載される。その後、扉45bは閉じられ、図示しない真空ポンプ機構により真空予備室45が真空にされた後、ゲートバルブ42を開口して保持台移動機構49を駆動することにより基板保持台48は真空チャンバー本体41に移動する。真空チャンバー本体41で加工処理を施された基板47は、上記手順の逆の手順により基板保持台48より取り除かれ、次の新しい基板47が搭載される。
Various apparatuses such as an ion etching apparatus and a plasma CVD apparatus in a semiconductor manufacturing process are known as a vacuum processing apparatus including a vacuum chamber for performing a specific processing process on a substrate surface in a vacuum atmosphere. In these apparatuses, in order to efficiently replace the substrate to be processed in the vacuum chamber, a vacuum preliminary chamber is provided so that the processing can be continuously performed without breaking the vacuum of the vacuum chamber body.
FIG. 4 is an explanatory view of a conventional apparatus. The apparatus 40 includes a vacuum chamber body 41, a vacuum preliminary chamber 45 attached to the side of the apparatus via a gate valve 42, a substrate holder 48 on which a substrate 47 is mounted, The holding stand moving mechanism 49 is provided outside the vacuum preliminary chamber 45. An opening 45a and a door 45b for exchanging the substrate are provided in the upper portion of the vacuum preliminary chamber 45. The holding table moving mechanism 49 and the substrate holding table 48 are connected via a sliding shaft 49 a penetrating the side wall of the vacuum preliminary chamber 45, and the substrate holding table 48 is driven by the holding table moving mechanism 49. It becomes possible to reciprocate between the vacuum chamber main body 41 and the vacuum preliminary chamber 45. The substrate 47 is mounted on the substrate holding table 48 through the opening 45a. Thereafter, the door 45b is closed, and after the vacuum preliminary chamber 45 is evacuated by a vacuum pump mechanism (not shown), the gate valve 42 is opened and the holding table moving mechanism 49 is driven, whereby the substrate holding table 48 is moved to the vacuum chamber body. Move to 41. The substrate 47 processed by the vacuum chamber main body 41 is removed from the substrate holding table 48 by the reverse procedure of the above procedure, and the next new substrate 47 is mounted.

特開平5−263238号公報JP-A-5-263238

図4に示すような真空処理装置では、基板の交換を作業者が真空予備室の上部開口を通して行うため、基板保持台に対する基板の位置決めなどを含めた交換作業の作業性が悪く、また基板保持台や真空予備室のメンテナンスおよび清掃が必要なときには真空予備室全体をゲートバルブから取り外さなければ行えなかった。In the vacuum processing apparatus as shown in FIG. 4, since the operator replaces the substrate through the upper opening of the vacuum preparatory chamber, the workability of the replacement operation including the positioning of the substrate with respect to the substrate holding table is poor, and the substrate is held. When maintenance and cleaning of the stand and the vacuum preparatory chamber are necessary, it was impossible to remove the entire vacuum preparatory chamber from the gate valve.

本考案は、真空処理装置の真空予備室において基板交換の作業性が良く、基板保持台、真空予備室内のメンテナンス、清掃が容易に行える真空予備室の構造を提供することにある。An object of the present invention is to provide a structure of a vacuum preparatory chamber in which a substrate replacement workability is good in a vacuum preparatory chamber of a vacuum processing apparatus, and maintenance and cleaning of the substrate holder and the vacuum preparatory chamber can be easily performed.

本考案に関わる真空処理装置は、少なくとも真空チャンバー本体と、真空予備室と、基板搬送装置と、予備室移動機構を備え、該真空チャンバー本体の真空雰囲気中で基板に加工処理を施す真空処理装置であり、
前記真空予備室は、前記真空チャンバー本体にゲートバルブを介して設けられた固定部と、移動可能な移動部とで構成され、
前記基板搬送装置は、基板を保持する基板保持台と、該基板保持台を前記真空チャンバー本体と前記真空予備室との間を移動可能にする保持台移動機構を備え、
前記移動部と前記基板搬送装置は、前記予備室移動機構に搭載されており、一体的に前記移動部が前記固定部に接する位置と離間する位置とに移動可能であることを特徴とする。
A vacuum processing apparatus according to the present invention includes at least a vacuum chamber main body, a vacuum preliminary chamber, a substrate transfer device, and a preliminary chamber moving mechanism, and performs processing on a substrate in a vacuum atmosphere of the vacuum chamber main body. And
The vacuum preliminary chamber is composed of a fixed portion provided in the vacuum chamber body via a gate valve, and a movable portion that can be moved.
The substrate transfer apparatus includes a substrate holding table for holding a substrate, and a holding table moving mechanism that enables the substrate holding table to move between the vacuum chamber main body and the vacuum preliminary chamber,
The moving unit and the substrate transfer device are mounted on the preliminary chamber moving mechanism, and the moving unit can be moved to a position where the moving unit is in contact with the fixed unit and a position where the moving unit is separated from the fixed unit.

本考案の真空処理装置は上記の構成からなるので、基板の交換時に基板保持台は真空予備室の移動部と共に予備室移動機構により移動され、真空予備室の固定部と移動部が離間することで形成された開口部に露出し、基板交換の作業性が良くなり、また基板保持台、真空予備室内のメンテナンス、清掃も容易に行える。Since the vacuum processing apparatus of the present invention has the above-described configuration, the substrate holder is moved by the preliminary chamber moving mechanism together with the moving portion of the vacuum preliminary chamber when the substrate is replaced, and the fixed portion and the moving portion of the vacuum preliminary chamber are separated from each other. It is exposed to the opening formed in step (1), and the workability of replacing the substrate is improved, and the maintenance and cleaning of the substrate holder and the vacuum preparatory chamber can be easily performed.

真空処理装置の正面断面図であり、基板保持台が真空チャンバー本体の加工処理位置にある説明図。It is front sectional drawing of a vacuum processing apparatus, and explanatory drawing which has a board | substrate holding stand in the processing position of a vacuum chamber main body. 真空処理装置の正面断面図であり、基板保持台が真空予備室の待機位置にある説明図。It is front sectional drawing of a vacuum processing apparatus, and explanatory drawing which has a substrate holding stand in the standby position of a vacuum preliminary chamber. 真空処理装置の正面断面図であり、移動部が固定部から離間して基板保持台が基板交換位置にある説明図。It is front sectional drawing of a vacuum processing apparatus, explanatory drawing in which a moving part leaves | separates from a fixed part and a board | substrate holding stand exists in a board | substrate exchange position. 従来の真空処理装置を説明する正面断面図であり、基板保持台が真空予備室に位置している図It is front sectional drawing explaining the conventional vacuum processing apparatus, and the figure where the substrate holding stand is located in a vacuum preliminary chamber

以下、図1、2、3を持って参照するに、本考案の真空処理装置10は、少なくとも真空チャンバー本体12と、真空予備室20と、基板搬送装置30と、予備室移動装置50を備える。真空チャンバー本体12は、図示しない配管機構により真空ポンプに接続されており、また被処理体である基板5に加工処理を施すための加工機構を持つ真空槽である。真空チャンバー本体12を真空にすることで、被処理体である基板5は真空雰囲気中で加工処理を施される。加工機構は、イオンミーリング機構、プラズマCVD機構等真空雰囲気中で被処理体を加工処理するものであれば良く限定されるものではない。Hereinafter, referring to FIGS. 1, 2, and 3, the vacuum processing apparatus 10 of the present invention includes at least a vacuum chamber main body 12, a vacuum preliminary chamber 20, a substrate transfer device 30, and a preliminary chamber moving device 50. . The vacuum chamber body 12 is a vacuum tank that is connected to a vacuum pump by a piping mechanism (not shown) and has a processing mechanism for processing the substrate 5 that is a target object. By subjecting the vacuum chamber body 12 to a vacuum, the substrate 5 as the object to be processed is processed in a vacuum atmosphere. The processing mechanism is not particularly limited as long as the processing target is processed in a vacuum atmosphere such as an ion milling mechanism or a plasma CVD mechanism.

真空予備室20は、真空チャンバー本体12の側面に設けられたゲートバルブ15を介して取り付けられ、ゲートバルブ15が開放されることにより真空チャンバー本体12と一体的に真空領域を構成する。真空予備室20は、ゲートバルブ15に固定された固定部21と、固定部21に対して直線的に移動して固定部21と離間できる移動部24で構成され、移動部24が固定部21に接する位置にあるときに固定部21と移動部24は一体的に真空予備室20を構成する。移動部24が固定部21と離間する位置にあるとき、移動部24と固定部21との間には開口部25(図3参照)が形成され、後述する基板保持台32が露出する。固定部21と移動部24の接触部には、シール材26が設けられており真空の漏洩を防止する。固定部21は、真空チャンバー本体12と同様に図示しない配管機構により真空ポンプに接続されており、ゲートバルブ15が閉じられているときにも真空チャンバー本体12とは関係なく独自に真空予備室20を真空状態にすることが可能である。The preliminary vacuum chamber 20 is attached via a gate valve 15 provided on the side surface of the vacuum chamber main body 12 and constitutes a vacuum region integrally with the vacuum chamber main body 12 by opening the gate valve 15. The vacuum preliminary chamber 20 includes a fixed portion 21 fixed to the gate valve 15 and a moving portion 24 that moves linearly with respect to the fixed portion 21 and can be separated from the fixed portion 21. The moving portion 24 is fixed to the fixed portion 21. The fixed portion 21 and the moving portion 24 integrally constitute the vacuum preparatory chamber 20 when in a position in contact with. When the moving part 24 is at a position away from the fixed part 21, an opening 25 (see FIG. 3) is formed between the moving part 24 and the fixed part 21, and a substrate holder 32 described later is exposed. A seal material 26 is provided at a contact portion between the fixed portion 21 and the moving portion 24 to prevent vacuum leakage. The fixing portion 21 is connected to a vacuum pump by a piping mechanism (not shown) similarly to the vacuum chamber main body 12, and is independently independent of the vacuum chamber main body 12 even when the gate valve 15 is closed. Can be in a vacuum state.

真空予備室20の固定部21と移動部24の離間寸法は、資料保持台32が全て露出する寸法が良く、それにより、基板の交換、およびメンテナンスが容易になる。固定部21の移動部24と接する端部からゲートバルブまでの寸法は、資料保持台32の寸法より少し大きめの寸法とすることが出来るが、限定するものではなく真空予備室20全体を移動部24としても良い。その場合、ゲートバルブ15の端面が固定部21の役割をすることになる。また、移動部24を移動部24の側面壁28だけにしても良い。The distance between the fixed portion 21 and the moving portion 24 of the vacuum prechamber 20 is good enough to expose the document holding base 32, thereby facilitating substrate replacement and maintenance. The dimension from the end of the fixed part 21 in contact with the moving part 24 to the gate valve can be a little larger than the dimension of the material holding table 32, but is not limited and the entire vacuum preliminary chamber 20 is moved to the moving part. It may be 24. In that case, the end face of the gate valve 15 serves as the fixing portion 21. Further, the moving unit 24 may be only the side wall 28 of the moving unit 24.

基板搬送装置30は、基板5を搭載保持する基板保持台32と、該基板保持台32を真空チャンバー本体12と真空予備室20との間で移動させる保持台移動機構34とを備える。基板保持台32は、真空領域内に設けられており、保持台移動機構34は真空領域外に設けられている。真空領域内に設けた保持台32は、真空領域外に設けた保持台移動機構34から予備室20の側面壁28を貫通して延びる摺動シャフト37の先端部に固定されている。そのことにより、基板保持台32は、保持台移動機構34により基板5を加工処理する真空チャンバー本体12の加工処理位置(図1参照)と、基板5を交換する真空予備室20の待機位置(図2参照)の間を直線的に移動することが可能になる。The substrate transfer device 30 includes a substrate holding table 32 for mounting and holding the substrate 5, and a holding table moving mechanism 34 for moving the substrate holding table 32 between the vacuum chamber body 12 and the vacuum preliminary chamber 20. The substrate holding table 32 is provided in the vacuum region, and the holding table moving mechanism 34 is provided outside the vacuum region. The holding table 32 provided in the vacuum region is fixed to the tip of a sliding shaft 37 extending from the holding table moving mechanism 34 provided outside the vacuum region through the side wall 28 of the preliminary chamber 20. As a result, the substrate holding table 32 has a processing position (see FIG. 1) of the vacuum chamber body 12 that processes the substrate 5 by the holding table moving mechanism 34 and a standby position (see FIG. 1) of the vacuum preliminary chamber 20 that replaces the substrate 5. (See FIG. 2).

側面壁28と摺動シャフト37との摺動面にはシール材38が設けられており、摺動面からの真空漏洩を防止している。摺動シャフト37は、その内部が空洞のパイプ構造であり、その内部を通して、基板保持台32に必要な用力を供給するため電線、管、チューブ等が配設される。A sealing material 38 is provided on the sliding surface between the side wall 28 and the sliding shaft 37 to prevent vacuum leakage from the sliding surface. The sliding shaft 37 has a hollow pipe structure, and an electric wire, a tube, a tube, and the like are disposed through the inside to supply necessary power to the substrate holding base 32.

保持台移動機構34は、駆動機構と摺動ガイドを持つ公知の移動機構であり、図ではその移動方向を基板保持台32の移動方向と同じ方向になるように、真空予備室20の外側において後述する予備室移動装置50に搭載されて設けられている。保持台移動機構34の前記駆動機構は手動でも良く、また電動、エアーシリンダ等による駆動機構でも良く限定されるものではない。保持台移動機構34の移動方向は、基板保持台32の移動方向と同じでなくとも良く、基板保持台32が、真空チャンバー本体12と真空予備室20との間を往複移動できるならどの方向でも良い。The holding table moving mechanism 34 is a known moving mechanism having a driving mechanism and a sliding guide. In the figure, the holding table moving mechanism 34 is arranged outside the vacuum preliminary chamber 20 so that the moving direction is the same as the moving direction of the substrate holding table 32. It is mounted on a spare room moving device 50 to be described later. The drive mechanism of the holding table moving mechanism 34 may be manual, or may be a drive mechanism using an electric motor, an air cylinder, or the like, and is not limited. The moving direction of the holding table moving mechanism 34 does not have to be the same as the moving direction of the substrate holding table 32, and can be moved in any direction as long as the substrate holding table 32 can move back and forth between the vacuum chamber body 12 and the vacuum preliminary chamber 20. good.

予備室移動装置50は、真空予備室20の移動部24と基板搬送装置30を搭載して一体的に移動させる。図で移動部24は、固定板29を介して保持台移動機構34を搭載した予備室移動装置50に固定されている。移動部24は、予備室移動機構50が駆動することにより、固定部21に接する位置と離間する位置に直線的に移動が可能になる。予備室移動装置50は、基板保持台32が真空チャンバー本体12の加工処理位置と真空予備室20の待機位置の間で移動する方向に、移動部24と保持台搬送装置30を移動させる。移動部24が、固定部21と離間する位置にあるとき、基板保持台32は、開口部25の基板交換位置に位置している。The preliminary chamber moving device 50 is mounted and moved integrally with the moving unit 24 of the vacuum preliminary chamber 20 and the substrate transfer device 30. In the figure, the moving unit 24 is fixed to a preliminary chamber moving device 50 equipped with a holding table moving mechanism 34 via a fixed plate 29. The moving part 24 can move linearly to a position away from a position in contact with the fixed part 21 by driving the auxiliary chamber moving mechanism 50. The preliminary chamber moving device 50 moves the moving unit 24 and the holding table transport device 30 in the direction in which the substrate holding table 32 moves between the processing position of the vacuum chamber main body 12 and the standby position of the vacuum preliminary chamber 20. When the moving unit 24 is at a position away from the fixed unit 21, the substrate holding table 32 is positioned at the substrate replacement position of the opening 25.

上記に説明した構造の真空処理装置10における基板5の交換手順を以下に図を持って説明する。図1で、ゲートバルブ15は開放されて真空チャンバー本体12と真空予備室20は一体の真空領域であり、真空ポンプ(図示しない)により必要な真空度を保持している。基板保持台32は真空チャンバー本体12内の加工処理位置にあり、基板保持台32に搭載された基板5は、真空チャンバー本体12に備えられた加工機構により真空雰囲気中で加工処理を施される。The procedure for replacing the substrate 5 in the vacuum processing apparatus 10 having the structure described above will be described below with reference to the drawings. In FIG. 1, the gate valve 15 is opened, and the vacuum chamber main body 12 and the vacuum preparatory chamber 20 are an integral vacuum region, and a necessary degree of vacuum is maintained by a vacuum pump (not shown). The substrate holding base 32 is at a processing position in the vacuum chamber main body 12, and the substrate 5 mounted on the substrate holding base 32 is processed in a vacuum atmosphere by a processing mechanism provided in the vacuum chamber main body 12. .

加工処理後、資料5を搭載した資料保持台32は、保持台移動機構34が駆動することにより真空チャンバー本体12の加工処理位置から真空予備室20の待機位置(図2参照)に移動する。その後、ゲートバルブ15は閉じられ、真空状態の真空予備室20に窒素等の不活性ガスが注入されて大気圧に戻される。そのとき、真空チャンバー本体12の真空度は、ゲートバルブが閉じられていることにより保持される。After the processing, the material holding table 32 loaded with the material 5 is moved from the processing position of the vacuum chamber body 12 to the standby position of the vacuum preliminary chamber 20 (see FIG. 2) by driving the holding table moving mechanism 34. Thereafter, the gate valve 15 is closed, and an inert gas such as nitrogen is injected into the vacuum preliminary chamber 20 in a vacuum state to return to the atmospheric pressure. At that time, the degree of vacuum of the vacuum chamber main body 12 is maintained by closing the gate valve.

その後、図3に示すように、基板5を搭載した基板保持台32を含む基板搬送装置30と真空予備室20の移動部24は、一体的に予備室移動装置50により真空予備室20の固定部21から離間する位置に移動し、基板5を搭載した基板保持台32は、真空予備室20の固定部21と移動部24が離間することにより形成された開口部25の基板交換位置に露出する。基板保持台32から処理済の基板5を取り除き、新たな基板5を搭載する。After that, as shown in FIG. 3, the substrate transfer device 30 including the substrate holding table 32 on which the substrate 5 is mounted and the moving part 24 of the vacuum preliminary chamber 20 are fixed together by the preliminary chamber moving device 50. The substrate holding base 32 on which the substrate 5 is mounted is moved to a position away from the portion 21 and exposed to the substrate replacement position of the opening 25 formed by the separation of the fixed portion 21 and the moving portion 24 of the vacuum preliminary chamber 20. To do. The processed substrate 5 is removed from the substrate holding table 32 and a new substrate 5 is mounted.

新たな基板5を搭載した基板保持台32は、上記手順の逆の手順で真空チャンバー本体12の加工処理位置に搬送され、新たな基板5は加工処理を施される。The substrate holder 32 on which the new substrate 5 is mounted is transported to the processing position of the vacuum chamber body 12 in the reverse order of the above procedure, and the new substrate 5 is processed.

本考案の真空処理装置は、半導体製造装置におけるイオンミーリング装置、プラズマCVD装置等、真空雰囲気中で基板に加工処理を施す装置に利用できる。The vacuum processing apparatus of the present invention can be used for an apparatus for processing a substrate in a vacuum atmosphere, such as an ion milling apparatus and a plasma CVD apparatus in a semiconductor manufacturing apparatus.

5 47 基板
10 40 真空処理装置
12 41 真空チャンバー本体
15 42 ゲートバルブ
20 45 真空予備室
21 固定部
24 移動部
25 開口部
26 シール材
28 側面壁
29 固定板
30 基板搬送装置
32 48 基板保持台
34 49 保持台移動機構
37 摺動シャフト
38 シール材
50 予備室移動装置
5 47 Substrate 10 40 Vacuum processing device 12 41 Vacuum chamber body 15 42 Gate valve 20 45 Vacuum prechamber 21 Fixing portion 24 Moving portion 25 Opening portion 26 Sealing material 28 Side wall 29 Fixing plate 30 Substrate transport device 32 48 Substrate holder 34 49 Holding stand moving mechanism 37 Sliding shaft 38 Sealing material 50 Spare chamber moving device

Claims (1)

少なくとも真空チャンバー本体と、真空予備室と、基板搬送装置と、予備室移動機構を備え、該真空チャンバー本体の真空雰囲気中で基板に加工処理を施す真空処理装置であり、前記真空予備室は、前記真空チャンバー本体にゲートバルブを介して設けられた固定部と、移動可能な移動部とで構成され、
前記基板搬送装置は、基板を搭載保持する基板保持台と、該基板保持台を前記真空チャンバー本体と前記真空予備室との間を移動可能にする保持台移動機構を備え、
前記移動部と前記基板搬送装置は、前記予備室移動機構に搭載されており、一体的に前記移動部が前記固定部に接する位置と離間する位置とに移動可能であることを特徴とする真空処理装置。
At least a vacuum chamber main body, a vacuum preliminary chamber, a substrate transfer device, and a preliminary chamber moving mechanism, a vacuum processing device for processing a substrate in a vacuum atmosphere of the vacuum chamber main body, the vacuum preliminary chamber, The vacuum chamber body is composed of a fixed part provided via a gate valve, and a movable part that can be moved.
The substrate transfer device includes a substrate holding table for mounting and holding a substrate, and a holding table moving mechanism that enables the substrate holding table to move between the vacuum chamber main body and the vacuum preliminary chamber,
The moving unit and the substrate transfer device are mounted on the preliminary chamber moving mechanism, and the moving unit can be moved to a position where the moving unit is in contact with the fixed unit and a position where the moving unit is separated from the fixed unit. Processing equipment.
JP2014005373U 2014-09-20 2014-09-20 Vacuum processing equipment Expired - Fee Related JP3194766U (en)

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