JP3191598B2 - How to collect samples for material survey - Google Patents
How to collect samples for material surveyInfo
- Publication number
- JP3191598B2 JP3191598B2 JP03420395A JP3420395A JP3191598B2 JP 3191598 B2 JP3191598 B2 JP 3191598B2 JP 03420395 A JP03420395 A JP 03420395A JP 3420395 A JP3420395 A JP 3420395A JP 3191598 B2 JP3191598 B2 JP 3191598B2
- Authority
- JP
- Japan
- Prior art keywords
- sample
- measured
- collected
- indenter
- crack
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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- Sampling And Sample Adjustment (AREA)
Description
【0001】[0001]
【産業上の利用分野】本発明は、窒化珪素等のセラミッ
クス、鋳鉄等の脆性材料からなる部材の残存寿命を検知
するため、該部材の表面から材料調査用の試料を採取す
る採取方法に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for sampling a material from a surface of a member made of a ceramic such as silicon nitride or the like or a brittle material such as cast iron to detect the remaining life of the member.
【0002】[0002]
【従来の技術】内燃機関のピストン、シリンダヘッド等
の燃焼室構成部材、ガスタービンの燃焼室等の高温下で
使用される部材や、内燃機関用ピストンリング、各種シ
ールリング等、高摩擦状態で使用される部材において
は、一定期間使用後は、定期的に部材から材料調査用の
試料を採取して、微視組織、元素分布状態等を電子顕微
鏡、X線マイクロアナライザ等により調査し、部材の残
存寿命を推定することが行なわれている。2. Description of the Related Art Combustion chamber components such as pistons and cylinder heads of internal combustion engines, members used at high temperatures such as combustion chambers of gas turbines, piston rings for internal combustion engines, various seal rings, etc. For the members used, after a certain period of use, samples for material investigation are periodically collected from the members, and the microstructure, element distribution state, etc. are examined by an electron microscope, an X-ray microanalyzer, etc. Has been performed to estimate the remaining life.
【0003】従来前記のような高温高応力化で使用され
る部材や高摩擦状態下で使用される部材の材料調査を行
う際には、使用中の実機部材から試料を直接切り出して
材料調査用として供していた。[0003] Conventionally, when conducting a material survey of a member used under high-temperature and high-stress conditions as described above or a member used under a high frictional condition, a sample is directly cut out from the actual machine member in use and used for material survey. Was served as.
【0004】[0004]
【発明が解決しようとする課題】しかしながら、前記の
ように、材料調査用の試料を直接実機の部材から切り出
して採取する方法にあっては、試料採取後の部材は試料
採取部分の応力集中に寄る破壊の恐れがあるため、引き
続き使用することは困難である。However, as described above, in the method of directly cutting out a sample for material investigation from a member of an actual machine and collecting the sample, the member after sample collection is subjected to stress concentration at the sample collection portion. Continued use is difficult because of the risk of destruction.
【0005】殊に、高温高応力下あるいは高摩擦状態下
で使用される窒化珪素等のセラミックスや高摩擦状態下
で使用される鋳鉄等の脆性材料からなる部材の場合は、
ノッチ部の強度低下が著しいので、通常の方法による試
料採取後の部材の使用は全くできない。[0005] In particular, in the case of a member made of a brittle material such as ceramics such as silicon nitride used under high-temperature high-stress or high-friction conditions or cast iron used under high-friction conditions,
Since the strength of the notch is remarkably reduced, it is impossible to use the member after sampling by an ordinary method.
【0006】本発明の目的は、各種機器に使用中の部
材、殊にセラミックス、鋳鉄等の脆性材料からなる部材
から材料調査用の試料を採取する際において、試料の採
取後においても、被測定部材が以後の使用に耐え得る強
度を保持し、かつ簡単かつ低コストの手法で試料の採取
を可能とする試料の採取方法を提供することである。SUMMARY OF THE INVENTION An object of the present invention is to obtain a sample for material investigation from a member in use in various devices, particularly a member made of a brittle material such as ceramics or cast iron. An object of the present invention is to provide a method for collecting a sample in which the member retains strength enough to withstand subsequent use, and enables the sample to be collected in a simple and low-cost manner.
【0007】本発明は、材料の微視組織や元素分布状態
等を電子顕微鏡、X線マイクロアナライザ等により調査
するための試料の大きさは、100μm程度以下で充分
であることに着目してなされたもので、その要旨とする
点は、被測定部材の表面に微小環状その他の微小閉鎖軌
跡状にクラックを生起せしめ、該クラック部から試料を
採取する方法にある。The present invention is based on the observation that the size of a sample for investigating the microstructure and element distribution state of a material with an electron microscope, an X-ray microanalyzer or the like is sufficient when the size is about 100 μm or less. The gist of the invention lies in a method in which a crack is formed on the surface of a member to be measured in a shape of a small ring or other small closed locus, and a sample is collected from the crack portion.
【0008】そして前記クラックを発生せしめる具体的
手法として、次の3点を特徴としている。 (1)中空微小径の圧子を被測定部材の表面に押し付
け、前記部材の表面に微小クラックを生ぜしめて試料を
採取する。[0008] As a specific method for generating the crack, the following three points are characterized. (1) A hollow micro-diameter indenter is pressed against the surface of a member to be measured, and microcracks are generated on the surface of the member to collect a sample.
【0009】(2)中空微小径の圧子を円周方向に複数
個に分割し、各分割片毎に被測定部材の表面に押し付け
試料を採取する。(2) A hollow micro-diameter indenter is divided into a plurality of pieces in the circumferential direction, and each divided piece is pressed against the surface of a member to be measured to collect a sample.
【0010】(3)被測定部材の表面に、環状にレーザ
ビームを照射し、該表面にクラックを生ぜしめて該クラ
ック部にて被測定部材から試料を分離させて採取する。(3) The surface of the member to be measured is irradiated with a laser beam in a ring shape, cracks are generated on the surface, and the sample is separated from the member to be measured at the crack portion and collected.
【0011】[0011]
【作用】本発明は、窒化珪素等のセラミックスや鋳鉄等
の脆性材料では、破壊基準が最大引張主応力説に従うこ
とから、材料の表面に環状の押圧力を加えれば、逆円錐
状にクラックが進行するという知見に基づいた試料の採
取方法である。According to the present invention, in the case of ceramics such as silicon nitride or brittle materials such as cast iron, the fracture criterion follows the maximum tensile principal stress theory. Therefore, if an annular pressing force is applied to the surface of the material, cracks are formed in an inverted cone shape. This is a method of collecting a sample based on the finding that the process proceeds.
【0012】即ち、材料調査を行うための被測定部材の
表面に、中空微小径の圧子による加圧、レーザビームの
円形状照射と遮断等の手法により微小環状その他の微小
閉鎖軌跡状にクラックを発生せしめると、これが部材内
部に逆円錐状に進行し、円錐状の試料が被測定部材から
分離され採取される。That is, cracks are formed on the surface of a member to be measured for material investigation in the form of a micro ring or other small closed trajectory by a technique such as pressurization with a hollow micro-diameter indenter, irradiation with a laser beam in a circular shape, and blocking. When this occurs, it travels in an inverted conical shape inside the member, and a conical sample is separated from the member to be measured and collected.
【0013】かかる手法により、被測定部材の強度を低
下させない範囲の微小径の材料調査用試料を採取するこ
とが可能となる。According to such a method, it is possible to collect a material inspection sample having a small diameter in a range that does not reduce the strength of the member to be measured.
【0014】これにより、試料採取後の被測定部材は、
実機に組み込み再使用することが可能となり、従来の方
法のように、試料採取の度毎に被測定部材の代品を再製
して実機に組み込む必要が無くなり、部品の無駄な廃棄
がなく、低コストで以て試料の採取が可能となる。Thus, the member to be measured after sampling is
It is possible to incorporate and re-use it in the actual machine, and it is not necessary to remanufacture a substitute for the member to be measured every time a sample is collected and to incorporate it into the actual machine as in the conventional method. Samples can be collected at low cost.
【0015】また、圧子による加圧、レーザビームによ
る加熱と冷却等により被測定材料の表面にクラックを発
生せしめるという、極めて簡単な手法でかつ短時間に試
料の採取を行うことができ、この面からも低コストの材
料調査が実現できる。In addition, a sample can be collected in a very simple manner and in a short time by causing cracks to be generated on the surface of the material to be measured by pressurization by an indenter, heating and cooling by a laser beam, and the like. Therefore, a low-cost material survey can be realized.
【0016】[0016]
【実施例】以下、図1〜図4に基づいて本発明の実施例
につき詳しく説明する。但し、この実施例に記載されて
いる構成部品の寸法、材質、形状、その相対位置などは
特に特定的な記載がない限りは、この発明の範囲をそれ
のみに限定する趣旨ではなく単なる説明例に過ぎない。DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment of the present invention will be described below in detail with reference to FIGS. However, unless otherwise specified, the dimensions, materials, shapes, relative positions, and the like of the components described in this embodiment are not intended to limit the scope of the present invention, but are merely illustrative examples. It's just
【0017】図1に、本発明の第1実施例にかかるセラ
ミックス、鋳鉄等の脆性材料からなる部材からの材料調
査用試料の採取方法を示す。FIG. 1 shows a method for collecting a material inspection sample from a member made of a brittle material such as ceramics or cast iron according to a first embodiment of the present invention.
【0018】窒化珪素等のセラミックスや鋳鉄等の脆性
材料においては、材料の破壊基準が最大引張り主応力説
に従うことが多い。かかる説に従えば、材料の表面に微
小径の環状の押圧力を加えれば、逆円錐状にクラックが
進行し、円錐状の破片が被測定材料から分離することと
なる。In brittle materials such as ceramics such as silicon nitride and cast iron, the fracture criterion of the material often follows the principle of maximum tensile principal stress. According to this theory, if a small-diameter annular pressing force is applied to the surface of the material, the crack progresses in an inverted conical shape, and the conical fragments are separated from the material to be measured.
【0019】図1に示す方法では、前記円錐状の試料を
実機部材即ち被測定部材1から採取するため、ダイヤモ
ンド、サファイア、超硬合金等の硬質材料からなり、先
端部2aが尖鋭に仕上げられた中空微小径(外径Dが1
mm以下)の圧子2を被測定部材1の表面1aに垂直な
押付力Fにて押し付ける。In the method shown in FIG. 1, since the conical sample is collected from the actual machine member, ie, the member 1 to be measured, it is made of a hard material such as diamond, sapphire, or cemented carbide, and the tip 2a is sharply finished. Hollow micro diameter (outer diameter D is 1
mm or less) is pressed against the surface 1a of the measured member 1 with a pressing force F perpendicular to the surface 1a.
【0020】前記被測定部材1は脆性材料から成るた
め、押付力Fによる押し付けにより、押し付け表面に高
い応力集中が起り、表面1aに微小環状にクラック3が
発生し、このクラック3は図1に示すように逆円錐状に
進行する。Since the member to be measured 1 is made of a brittle material, a high stress concentration occurs on the pressed surface due to the pressing with the pressing force F, and a crack 3 is generated on the surface 1a in a small annular shape. It progresses in an inverted conical shape as shown.
【0021】そして、このクラック3の最終段階で円錐
状の破片、即ち試料4が被測定部材1から分離され、採
取される。Then, in the final stage of the crack 3, a conical fragment, that is, a sample 4, is separated from the member 1 to be measured and collected.
【0022】この際において、圧子2に垂直方向の押付
力Fとともに、捩りモーメントMを附加すれば、より容
易に試料4を採取することが可能となり、前記脆性材料
のみならず、これよりもある程度靭性の高い材料からの
使用の採取も可能となる。At this time, if a torsional moment M is applied to the indenter 2 together with the pressing force F in the vertical direction, the sample 4 can be more easily collected. Extraction of use from highly tough materials is also possible.
【0023】前記のようにして採取された試料4は、電
子顕微鏡、X線マイクロアナライザ等を使用して微視組
織、元素分布状態等の材料調査に供される。この場合、
試料の大きさが10〜100μm程度あれば、必要とさ
れる材料調査は支障なく施行できるので、前記手法によ
り採取した試料4で充分である。The sample 4 collected as described above is used for material examination such as microstructure and element distribution using an electron microscope, an X-ray microanalyzer, or the like. in this case,
If the size of the sample is about 10 to 100 μm, the required material investigation can be carried out without any trouble. Therefore, the sample 4 collected by the above method is sufficient.
【0024】試料4を採取した後の被測定部材1は、試
料4が10〜100μm程度の微小径であるので、強度
の低下はなく、実機の部材として引き続き使用できる。After the sample 4 is collected, the member 1 to be measured can be used as a member of an actual machine without a decrease in strength because the sample 4 has a small diameter of about 10 to 100 μm.
【0025】図2及び図3は本発明の第2実施例を示
す。この実施例は被測定部材1の表面が平面でない場合
に適用される試料の採取方法に係り、図において10は
前記第1実施例と同様な硬質材料からなる圧子である。FIGS. 2 and 3 show a second embodiment of the present invention. This embodiment relates to a method for collecting a sample applied when the surface of the member 1 to be measured is not flat. In FIG. 10, reference numeral 10 denotes an indenter made of a hard material similar to that of the first embodiment.
【0026】前記圧子10は、第1実施例と同様に先端
部10aが尖鋭に仕上げられた中空微小径(外径Dが1
mm以下)の圧子であるが、表面が平面でない被測定部
材1に対応するため、図2、図3に示されるように、円
周方向に等間隔に複数個の圧子片101に分割してい
る。11はその分割面である。The indenter 10 has a hollow minute diameter (outer diameter D is 1) having a sharp end 10a as in the first embodiment.
mm or less), but is divided into a plurality of indenter pieces 101 at equal intervals in the circumferential direction as shown in FIGS. I have. Numeral 11 denotes the dividing plane.
【0027】前記分割型圧子10を使用して、表面1a
が平面でない被測定部材1の表面から材料調査用の試料
4を採取する際には、図2に示すように、断面がコの字
状で、中央部に板ばね部15aが形成された押え治具1
5を各圧子片101毎に用いる。Using the split type indenter 10, the surface 1a
When the sample 4 for material inspection is collected from the surface of the member 1 to be measured which is not a flat surface, as shown in FIG. 2, a presser having a U-shaped cross section and a leaf spring portion 15a formed in the center is provided. Jig 1
5 is used for each indenter piece 101.
【0028】そして、押え治具15の押え部15cを分
割された各圧子片101の上面に当接させるとともに、
反対側の支持部15bを基盤20上に当接させ、押え治
具15のばね部15aをその上方から押付力Fにて押圧
し、ばね部15aの弾力との共働により、各圧子片10
1を被測定部材1の表面に押し付ける。The pressing portion 15c of the pressing jig 15 is brought into contact with the upper surface of each of the divided indenter pieces 101,
The support portion 15b on the opposite side is brought into contact with the base 20, and the spring portion 15a of the holding jig 15 is pressed from above by a pressing force F, and cooperates with the elasticity of the spring portion 15a to allow each indenter piece 10 to move.
1 is pressed against the surface of the member 1 to be measured.
【0029】この際において、圧子10が複数個の圧子
片101に分割され、各圧子片101毎に押え治具15
によって押圧するので、被測定部材1の表面1aが平面
でなくても、表面の変化に応じて各圧子片101が押圧
され、採取面に均等な押付力が附与され、逆円錐状のク
ラック3が発生し、前記第1実施例と同様な円錐状の試
料4を採取できる。At this time, the indenter 10 is divided into a plurality of indenter pieces 101, and a pressing jig 15 is provided for each indenter piece 101.
Therefore, even if the surface 1a of the member 1 to be measured is not a flat surface, each indenter piece 101 is pressed according to the change in the surface, an even pressing force is applied to the sampling surface, and an inverted conical crack is formed. 3 is generated, and a conical sample 4 similar to that of the first embodiment can be obtained.
【0030】図4は本発明の第3実施例を示す。この実
施例においては、レーザ照射装置22から被測定部材1
の表面1aに、該照射装置22を回転させながらレーザ
ビーム21を直径Dが1mm以下の微小環状に照射す
る。すると、被測定部材1のレーザビーム21に加熱さ
れる円形状の部分の熱膨張が低温の周囲に拘束され、レ
ーザビーム21の照射が停止されて前記円形状の部分の
温度が降下する際に、この部分に引張力が生じ、ここが
起点となってクラック3が逆円錐形状に進行し、円錐形
状の試料4が被測定部材1から分離される。FIG. 4 shows a third embodiment of the present invention. In this embodiment, the member 1 to be measured is
Is irradiated with the laser beam 21 in a small ring having a diameter D of 1 mm or less while rotating the irradiation device 22. Then, the thermal expansion of the circular portion of the member 1 to be measured which is heated by the laser beam 21 is restrained around the low temperature, and when the irradiation of the laser beam 21 is stopped and the temperature of the circular portion drops, Then, a tensile force is generated in this portion, and the crack 3 proceeds in an inverted conical shape starting from the tensile force, and the conical sample 4 is separated from the member 1 to be measured.
【0031】前記レーザビーム21を照射する際におい
て、該レーザビーム21の照射、遮断を一定周期で繰り
返す方法によれば、クラック3の発生が早くなり、試料
4の採取時間が短縮される。According to the method of irradiating and interrupting the laser beam 21 at a constant cycle when irradiating the laser beam 21, the generation of the cracks 3 is accelerated, and the sampling time of the sample 4 is shortened.
【0032】さらに、図4に示されるように、レーザビ
ーム21の照射後、冷却ノズル23より低温空気、水等
の冷却剤24を被測定部材1のレーザビーム21により
加熱された円形状の部分に噴射し、該部分を冷却すれ
ば、前記の方法よりもさらにクラック3の発生が早くな
る。Further, as shown in FIG. 4, after irradiation with the laser beam 21, a cooling agent 24 such as low-temperature air or water is supplied from the cooling nozzle 23 to the circular portion of the member 1 to be measured which is heated by the laser beam 21. When the portion is cooled and the portion is cooled, the generation of the crack 3 is further accelerated as compared with the above-described method.
【0033】[0033]
【発明の効果】以上のように本発明によれば、被測定部
材の表面に、中空微小径の圧子による押圧、レーザビー
ムによる微小環状軌跡その他の微小閉鎖軌跡を画く如く
照射等によりクラックを発生せしめ、該クラックを被測
定部材内に逆円錐形状に進行させることにより、円錐形
状の試料を採取するように構成したので、被測定部材の
強度を低下させない範囲の微小径の材料調査用試料を採
取することが可能となる。As described above, according to the present invention, cracks are generated on the surface of a member to be measured by pressing with a hollow micro-diameter indenter, irradiating a laser beam so as to draw a micro annular trajectory or other micro-closed trajectories. At least, the crack is advanced into the member to be measured in an inverted conical shape, so that a conical sample is collected.Therefore, a material inspection sample having a small diameter in a range that does not reduce the strength of the member to be measured is used. It becomes possible to collect.
【0034】これにより、試料採取後の被測定部材は、
実機に組み込み再度使用することが可能となり、従来の
方法のように試料採取の度毎に被測定部材の代品を再製
して実機に組み込む必要が無くなり、部品の無駄な廃棄
がなく、低コストで以て試料の採取が可能となる。Thus, the member to be measured after sampling is
It is possible to incorporate it into the actual machine and use it again, eliminating the need to remanufacture a substitute for the member to be measured every time a sample is collected and to incorporate it into the actual machine as in the conventional method. Thus, a sample can be collected.
【0035】また、圧子による加圧、レーザビームによ
る加熱と冷却等により被測定部材の表面にクラックを発
生せしめるという、きわめて簡単な手法でかつ短時間に
試料の採取を行うことができ、この面からも低コストの
材料調査が実現できる。In addition, a sample can be collected in a very simple manner and in a short time by causing cracks to be generated on the surface of the member to be measured by pressing with an indenter, heating and cooling with a laser beam, and the like. Therefore, a low-cost material survey can be realized.
【図1】本発明の第1実施例に係る材料調査用試料の採
取方法を示す概略断面図。FIG. 1 is a schematic sectional view showing a method for collecting a sample for material investigation according to a first embodiment of the present invention.
【図2】本発明の第2実施例を示す図1応当図。FIG. 2 is a diagram showing a second embodiment of the present invention.
【図3】図2のA矢視図。FIG. 3 is a view taken in the direction of arrow A in FIG. 2;
【図4】本発明の第3実施例を示す図1応当図。FIG. 4 is a view corresponding to FIG. 1 showing a third embodiment of the present invention.
1 被測定部材 1a 表面 2、10 圧子 101 圧子片 3 クラック 4 試料 15 押え治具 21 レーザビーム 22 レーザ照射装置 23 冷却ノズル 24 冷却剤 DESCRIPTION OF SYMBOLS 1 Member to be measured 1a Surface 2, 10 Indenter 101 Indenter piece 3 Crack 4 Sample 15 Holding jig 21 Laser beam 22 Laser irradiation device 23 Cooling nozzle 24 Coolant
───────────────────────────────────────────────────── フロントページの続き (58)調査した分野(Int.Cl.7,DB名) G01N 1/00 - 1/34 JICSTファイル(JOIS)──────────────────────────────────────────────────続 き Continuation of the front page (58) Field surveyed (Int.Cl. 7 , DB name) G01N 1/00-1/34 JICST file (JOIS)
Claims (4)
り、被測定部材の表面に微小環状その他の微小閉鎖軌跡
状にクラックを生起せしめ、該クラック部から試料を採
取することを特徴とする材料調査用試料の採取方法。1. A material inspection method for collecting a micro sample for material investigation, wherein a crack is formed on the surface of the member to be measured in a shape of a micro ring or other small closed locus, and the sample is collected from the crack portion. Sample collection method.
押し付け、前記部材の表面にクラックを生じせしめて、
試料を採取することを特徴とする試料の採取方法。2. A hollow micro-diameter indenter is pressed against the surface of a member to be measured to cause cracks on the surface of the member,
A method for collecting a sample, comprising collecting the sample.
分割し、各分割片毎に被測定部材の表面に押し付け試料
を採取することを特徴とする試料の採取方法。3. A method for collecting a sample, comprising: dividing a hollow micro-diameter indenter into a plurality of pieces in a circumferential direction, and pressing a sample against a surface of a member to be measured for each divided piece.
ビームを照射し、該表面にクラックを生じせしめて該ク
ラック部にて被測定部材から試料を分離させて採取する
ことを特徴とする試料の採取方法。4. A surface of a member to be measured is irradiated with a laser beam in a substantially small annular shape, a crack is generated on the surface, and a sample is separated from the member to be measured at the crack portion and collected. How to collect samples.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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JP03420395A JP3191598B2 (en) | 1995-01-31 | 1995-01-31 | How to collect samples for material survey |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP03420395A JP3191598B2 (en) | 1995-01-31 | 1995-01-31 | How to collect samples for material survey |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH08201243A JPH08201243A (en) | 1996-08-09 |
JP3191598B2 true JP3191598B2 (en) | 2001-07-23 |
Family
ID=12407611
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
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JP03420395A Expired - Fee Related JP3191598B2 (en) | 1995-01-31 | 1995-01-31 | How to collect samples for material survey |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP3191598B2 (en) |
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1995
- 1995-01-31 JP JP03420395A patent/JP3191598B2/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
JPH08201243A (en) | 1996-08-09 |
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