JP3169631B2 - Method and apparatus for electrolytic dressing with semiconductor contact electrode - Google Patents

Method and apparatus for electrolytic dressing with semiconductor contact electrode

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Publication number
JP3169631B2
JP3169631B2 JP12728991A JP12728991A JP3169631B2 JP 3169631 B2 JP3169631 B2 JP 3169631B2 JP 12728991 A JP12728991 A JP 12728991A JP 12728991 A JP12728991 A JP 12728991A JP 3169631 B2 JP3169631 B2 JP 3169631B2
Authority
JP
Japan
Prior art keywords
grindstone
electrode
grinding
dressing
contact surface
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP12728991A
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Japanese (ja)
Other versions
JPH06170732A (en
Inventor
整 大森
威雄 中川
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
RIKEN Institute of Physical and Chemical Research
Original Assignee
RIKEN Institute of Physical and Chemical Research
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Priority to JP12728991A priority Critical patent/JP3169631B2/en
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Application granted granted Critical
Publication of JP3169631B2 publication Critical patent/JP3169631B2/en
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Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【産業上の利用分野】本発明は、機械加工分野における
研削加工に用いられる研削砥石のドレッシング方法及び
装置に係わり、特に、導電性を有する砥石を、電解効果
によりドレッシングする導電性砥石の電解ドレッシング
方法及び装置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method and an apparatus for dressing a grinding wheel used for grinding in the field of machining, and more particularly to electrolytic dressing of a conductive grinding wheel for dressing a conductive grinding wheel by an electrolytic effect. Method and apparatus.

【0002】[0002]

【従来の技術】鋳鉄ファイバボンドダイヤモンド砥石等
の導電性砥石を用い、この砥石に電圧を印加し、砥石を
電解によりドレッシングする導電性砥石の電解ドレッシ
ング方法及び装置が、本願と同一の出願人による特開平
1-188266号( 特願昭63-12305号) に開示され、電子材料
であるシリコン等の半導体材料を鏡面研削することに成
功している。更に、この方法及び装置を発展させた電解
インプロセスドレッシング研削法(Electrolytic Inproc
ess Dressing: 以下 Elid 研削法という) と呼ばれる方
法及び装置が本願出願人により開発され、発表されてい
る( 理研シンボジウム「鏡面研削の最新技術動向」、平
成3年3月5日開催)。
2. Description of the Related Art An electrolytic dressing method and apparatus for a conductive grindstone, which uses a conductive grindstone such as a cast iron fiber bond diamond grindstone, applies a voltage to the grindstone and dresses the grindstone by electrolysis, has been disclosed by the same applicant as the present applicant. JP
It is disclosed in Japanese Patent Application No. 1-188266 (Japanese Patent Application No. 63-12305) and succeeded in mirror-polishing semiconductor materials such as silicon as electronic materials. Further, an electrolysis in-process dressing grinding method (Electrolytic Inproc
A method and apparatus referred to as “ess dressing: Elid grinding method” have been developed and published by the applicant of the present invention (RIKEN Cymbodium, “Latest Technology Trend of Mirror Surface Grinding”, held on March 5, 1991).

【0003】この Elid 研削法は、ワークとの接触面を
有する砥石と、接触面に対向する電極と、砥石と電極と
の間に導電性液を流すノズルと、砥石と電極との間に電
圧を印加する電源及び給電体とからなる装置であり、砥
石と電極との間に導電性液を流しながら、砥石と電極と
の間に電圧を印加し、砥石を電解によりドレッシングす
るものである。
[0003] The Elid grinding method comprises a grindstone having a contact surface with a workpiece, an electrode facing the contact surface, a nozzle for flowing a conductive liquid between the grindstone and the electrode, and a voltage between the grindstone and the electrode. Is a device comprising a power source and a power supply for applying the voltage, applying a voltage between the grindstone and the electrode while flowing a conductive liquid between the grindstone and the electrode, and dressing the grindstone by electrolysis.

【0004】この Elid 研削法によるドレッシングの機
構を図8に示す。砥石の目立て開始時(A)には、砥石
と電極との間の電気抵抗が少なく比較的大きい電流(5
〜10A)が流れる。これにより、電解効果により砥石
表面の金属部(ボンド)が溶解し、非導電性のダイヤモ
ンド砥粒が突出する。更に、通電を続けると、酸化鉄(F
e2O3)を主とした絶縁被膜が砥石表面に形成され、砥石
の電気抵抗が大きくなる。これにより、電流が低下し、
ボンドの溶解が減り、砥粒の突出(砥石の目立て)が実
質的に終了する(B)。この状態で研削を開始する
(C)と、被膜が研削屑を遊離しつつ、ワークの研削に
つれてダイヤモンド砥粒が摩耗していく。更に研削を続
けると(D)、砥石表面の絶縁被膜が摩耗により除去さ
れ、砥石の電気抵抗が低下し、砥石と電極間の電流が増
大し、ボンドの溶解が増し、砥粒の突出(砥石の目立
て)が再開される。従って、 Elid 研削法による研削中
には、(B)〜(D)のように被膜の形成・除去により
ボンドの過溶出が抑えられ、砥粒の突出(砥石の目立
て)が自動的に調整される。(B)〜(D)に示す上述
したサイクルを以下 Elid サイクルと呼ぶ。
FIG. 8 shows a dressing mechanism by the Elid grinding method. At the beginning of sharpening of the grinding wheel (A), the electric resistance between the grinding wheel and the electrode is small and a relatively large current (5
-10A) flows. As a result, the metal part (bond) on the surface of the grindstone is dissolved by the electrolytic effect, and the non-conductive diamond abrasive grains protrude. In addition, when energization is continued, iron oxide (F
An insulating film mainly composed of e 2 O 3 ) is formed on the grindstone surface, and the electric resistance of the grindstone increases. This reduces the current,
Dissolution of the bond is reduced, and the protrusion of the abrasive grains (sharpening of the grinding stone) is substantially completed (B). When grinding is started in this state (C), the diamond abrasive grains are worn as the workpiece is ground, while the coating liberates grinding debris. When grinding is further continued (D), the insulating coating on the surface of the grindstone is removed by abrasion, the electric resistance of the grindstone decreases, the current between the grindstone and the electrode increases, the dissolution of the bond increases, and the protrusion of the abrasive grains (grindstone) ) Is resumed. Therefore, during the grinding by the Elid grinding method, the overelution of the bond is suppressed by forming and removing the coating as shown in (B) to (D), and the protrusion of the abrasive grains (grinding of the grindstone) is automatically adjusted. You. The above-described cycle shown in (B) to (D) is hereinafter referred to as an Elid cycle.

【0005】[0005]

【発明が解決しようとする課題】上述した Elid 研削法
は、良好な鏡面粗さを安定して得ることができる点で、
十分満足できるものであったが、次のような問題があっ
た。 (1) 図8の Elid サイクルに入る前、(A)におい
て、形成される絶縁被膜が使用時に必要な被膜厚さに較
べ厚く、そのため、実際の鏡面加工を行う前に、最適な
被膜厚さになるまで本来不必要な研削を行う必要があっ
た。 (2) 絶縁被膜厚さの相違により Elid サイクル中の
ドレッシングの速度が変化する。すなわち、絶縁被膜の
薄い部分と電極との間にスパークが生じ、局部的にドレ
ッシングが進むことがあった。 (3) 最適な Elid サイクルを実現するには、ボンド
の電気分解がある時点で絶縁被膜により抑えられること
が必須であり、上記(1)(2)との関係で、パルス又
はパルスと直流の混在する複雑な電源を必要とした。
The above-mentioned Elid grinding method is capable of stably obtaining good mirror surface roughness.
Although satisfactory, there were the following problems. (1) Before entering the Elid cycle of FIG. 8, in (A), the formed insulating film is thicker than the film thickness required in use, and therefore, before the actual mirror finishing, the optimum film thickness is obtained. Unnecessary grinding had to be performed until it became. (2) The dressing speed during the Elid cycle changes depending on the thickness of the insulating coating. That is, sparks are generated between the thin portion of the insulating film and the electrode, and the dressing may proceed locally. (3) In order to realize an optimal Elid cycle, it is essential that the electrolysis of the bond is suppressed by an insulating coating at a certain point in time. In relation to the above (1) and (2), the pulse or the pulse and the direct current It required mixed and complex power supplies.

【0006】従って、本発明の目的は、絶縁被膜が薄
く、かつ均一に形成され、これにより直流電源の適用が
可能な電解ドレッシング方法及び装置を提供することに
ある。
Accordingly, it is an object of the present invention to provide an electrolytic dressing method and apparatus in which an insulating film is formed thinly and uniformly so that a DC power supply can be applied.

【0007】[0007]

【課題を解決するための手段】上記問題を解決するた
め、本発明によれば、被加工物との接触面を有する導電
性砥石と、前記接触面に対向する電極との間に導電性液
を流し、前記砥石と電極との間に電圧を印加し、砥石を
電解によりドレッシングする電解ドレッシング方法にお
いて、半導体材料からなる電極を砥石の前記接触面に接
触させることを特徴とする導電性砥石の電解ドレッシン
グ方法が提供される。
According to the present invention, there is provided, in accordance with the present invention, a conductive liquid between a conductive grindstone having a contact surface with a workpiece and an electrode opposed to the contact surface. Flowing, applying a voltage between the whetstone and the electrode, in an electrolytic dressing method of dressing the whetstone by electrolysis, the conductive whetstone, characterized in that an electrode made of a semiconductor material is brought into contact with the contact surface of the whetstone An electrolytic dressing method is provided.

【0008】更に、本発明によれば、被加工物との接触
面を有する導電性砥石と、前記接触面に対向する電極
と、前記砥石と電極との間に導電性液を流す手段と、前
記砥石と電極との間に電圧を印加する手段とからなる、
砥石を電解によりドレッシングする電解ドレッシング装
置において、前記電極は半導体材料からなり、かつ砥石
の前記接触面に接触していることを特徴とする導電性砥
石の電解ドレッシング装置が提供される。
Further, according to the present invention, a conductive grindstone having a contact surface with a workpiece, an electrode facing the contact surface, a means for flowing a conductive liquid between the grindstone and the electrode, Means for applying a voltage between the whetstone and the electrode,
In an electrolytic dressing apparatus for dressing a grindstone by electrolysis, there is provided an electrolytic dressing apparatus for a conductive grindstone, wherein the electrode is made of a semiconductor material and is in contact with the contact surface of the grindstone.

【0009】[0009]

【作用】上述した本発明の方法及び装置によれば、電極
が半導体材料であり、かつ砥石の接触面に接触している
ため、絶縁被膜の薄い部分と厚い部分との電気抵抗の差
が少なく、スパークが発生しにくい。従って、絶縁被膜
の厚さの相違によるドレッシングの速度変化が少ない。
According to the method and apparatus of the present invention described above, since the electrode is made of a semiconductor material and is in contact with the contact surface of the grindstone, the difference in electrical resistance between the thin and thick portions of the insulating film is small. , Spark is less likely to occur. Therefore, the change in dressing speed due to the difference in the thickness of the insulating film is small.

【0010】また、スパークが少なく、かつ電極が砥石
の接触面に接触しているため、 Elid サイクルに入る前
の図8(A)において、形成される絶縁被膜が比較的薄
くなる。このため、実際の鏡面加工を行う前に、最適な
被膜厚さになるまで行う研削が少なくなる。更に、ドレ
ッシングの速度変化が少なく、かつ形成される絶縁被膜
が薄く均一であることによって、完全な直流電源の適用
が可能になる。
Further, since the spark is small and the electrode is in contact with the contact surface of the grindstone, the insulating film formed in FIG. 8A before entering the Elid cycle becomes relatively thin. For this reason, before the actual mirror polishing is performed, the amount of grinding performed until the film thickness becomes optimum is reduced. Furthermore, since the change in dressing speed is small and the formed insulating coating is thin and uniform, a complete DC power supply can be applied.

【0011】[0011]

【実施例】以下、本発明の好適な一実施例を図面を参照
して説明する。図1は、本発明による電解ドレッシング
装置を模式的に示す図である。この図において、10
は、垂直な軸線を有するほぼ円板状の導電性砥石であ
り、この砥石10は、図示しない加工機の上部ヘッドに
水平に回転可能に固定されている。この上部ヘッドは、
砥石10と共に水平方向及び垂直方向に移動できるよう
になっている。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS A preferred embodiment of the present invention will be described below with reference to the drawings. FIG. 1 is a diagram schematically showing an electrolytic dressing apparatus according to the present invention. In this figure, 10
Is a substantially disk-shaped conductive grindstone having a vertical axis, and the grindstone 10 is horizontally rotatably fixed to an upper head of a processing machine (not shown). This upper head
It can be moved in the horizontal and vertical directions together with the grindstone 10.

【0012】上部ヘッドの下方には、加工機のテーブル
14が水平に設けられている。このテーブル14は、通
常完全に固定されているが、水平方向及び/又は垂直方
向に移動できるようになっていてもよい。テーブル14
の上面には、通常周知の仕方で被加工物すなわちワーク
16が固定される。砥石10の下面すなわちワーク16
との接触面12は、水平な切削面であり、回転する砥石
10の接触面12をワーク16の上面に接触させること
により、ワーク16の上面が切削される。
Below the upper head, a table 14 of a processing machine is provided horizontally. The table 14 is usually completely fixed, but may be movable horizontally and / or vertically. Table 14
A workpiece, that is, a work 16 is fixed to the upper surface of the workpiece in a generally known manner. The lower surface of the grindstone 10, that is, the work 16
The contact surface 12 is a horizontal cutting surface, and the upper surface of the work 16 is cut by bringing the contact surface 12 of the rotating grindstone 10 into contact with the upper surface of the work 16.

【0013】砥石10のワーク16と接触しない部分の
下方には、半導体材料、例えばシリコンで作られた水平
な板状の電極20が砥石10の接触面12に均等に接触
するように付勢して設けられている。砥石10の周囲に
は複数のノズル30が設けられ、これにより、図示しな
い供給パイプを介して砥石10と電極20との間に弱導
電性である切削液すなわちクーラントを流すようになっ
ている。このノズル30は、砥石10とワーク16との
間にもクーラントを流すように設けるのが好ましい。
A horizontal plate-like electrode 20 made of a semiconductor material, for example, silicon, is urged under the portion of the grinding wheel 10 not in contact with the work 16 so as to evenly contact the contact surface 12 of the grinding wheel 10. It is provided. A plurality of nozzles 30 are provided around the grindstone 10, so that a weakly conductive cutting fluid, that is, a coolant, flows between the grindstone 10 and the electrode 20 via a supply pipe (not shown). The nozzle 30 is preferably provided so that coolant flows between the grindstone 10 and the work 16.

【0014】更に、この装置には電源40が設けられ、
砥石10の円周面に接触するようになった給電体42を
介して砥石10に+の電圧を印加し、一方電極20に−
の電圧を印加できるようになっている。この電源40
は、直流定電圧電源であるのが好ましいが、従来のパル
ス電源或いはパルスと直流を混在させた電源でも良い。
図2は、本発明に用いる電極20と給電体42を更に詳
細に示す図である。
Further, the apparatus is provided with a power supply 40,
A positive voltage is applied to the grindstone 10 via a power supply 42 that comes into contact with the circumferential surface of the grindstone 10, while a negative voltage is applied to the electrode 20.
Can be applied. This power supply 40
Is preferably a DC constant voltage power supply, but may be a conventional pulse power supply or a power supply in which pulse and DC are mixed.
FIG. 2 is a diagram showing the electrode 20 and the power supply 42 used in the present invention in more detail.

【0015】この図において、電極20は導電性の良い
金属板22の両面に半導体であるシリコン24を接合さ
せたものであり、この金属板22に電源40から−の電
圧が印加されている。この電極20は、ほぼ水平な板バ
ネ26の一端に水平に固定されており、板バネ26の他
端は、絶縁体28に固定され、更にこの絶縁体28は、
加工機の上部ヘッド18に周知の手段により固定されて
いる。この構成により、板バネ26の弾性力により、電
極20は常に上方に付勢される。
In FIG. 1, an electrode 20 is formed by bonding silicon 24 as a semiconductor to both surfaces of a metal plate 22 having good conductivity, and a negative voltage is applied to the metal plate 22 from a power supply 40. The electrode 20 is horizontally fixed to one end of a substantially horizontal leaf spring 26, and the other end of the leaf spring 26 is fixed to an insulator 28.
It is fixed to the upper head 18 of the processing machine by known means. With this configuration, the electrode 20 is always urged upward by the elastic force of the leaf spring 26.

【0016】給電体42も周知の仕方で砥石10の外周
面に付勢された状態で、加工機の上部ヘッド18に周知
の手段で固定される。本発明の構成をいわゆるカップ砥
石について、説明したが、本発明は、ストレート砥石そ
の他の砥石にも適用することができる。次に本発明によ
る装置の使用方法を説明する。
The power supply 42 is also fixed to the upper head 18 of the processing machine by known means while being urged against the outer peripheral surface of the grindstone 10 in a known manner. Although the configuration of the present invention has been described for a so-called cup grindstone, the present invention can also be applied to a straight grindstone and other grindstones. Next, a method of using the device according to the present invention will be described.

【0017】まず、導電性砥石10と電極30との間に
導電性液すなわちクーラントが流される。次いで、砥石
10と電極20との間に電圧が印加され、この状態で砥
石10をワーク16に接触させて切削が行われる。切削
中の砥石のドレッシングの機構は、従来と基本的には同
一であり、上述した Elid サイクルにより、研削中に、
図8(B)〜(D)に示したように被膜の形成・除去に
よりボンドの過溶出が抑えられ、砥粒の突出(砥石の目
立て)が自動的に調整される。
First, a conductive liquid, that is, a coolant, flows between the conductive grindstone 10 and the electrode 30. Next, a voltage is applied between the grindstone 10 and the electrode 20, and in this state, the grindstone 10 is brought into contact with the work 16 to perform cutting. The mechanism of dressing of the grinding wheel during cutting is basically the same as the conventional one.
As shown in FIGS. 8B to 8D, overelution of the bond is suppressed by forming and removing the film, and the protrusion of the abrasive grains (grinding of the grindstone) is automatically adjusted.

【0018】実施例1 表1に示す研削機械、砥石、電源及び被削材等を使用し
て本発明による装置により鏡面研削を実施した。その結
果を図3〜7に示す。図において、(A)は従来の Eli
d 研削法によるものを示し、(B)は本発明によるもの
を示している。
Example 1 Specular grinding was performed by an apparatus according to the present invention using a grinding machine, a grindstone, a power supply, a work material and the like shown in Table 1. The results are shown in FIGS. In the figure, (A) shows the conventional Eli
d shows the result of the grinding method, and (B) shows the result of the present invention.

【0019】[0019]

【表1】 [Table 1]

【0020】(1)ドレッシング特性 従来の装置と同様に、通電時間とともに実電流の低減が
記録された(図3、○印)。電流が1A前後にまで低下
した時点での砥石面の状態は、電極の接触にもかかわら
ず、不導体被膜すなわち絶縁被膜が生成されていた。 (2)鏡面研削特性 研削抵抗変動の様子を図4に示す。従来と同様に、研削
抵抗は加工面の鏡面化に伴い上昇し、安定化する傾向に
あったが、従来に較べやや高い荷重を示した。電極の接
触圧力により若干砥粒の摩耗が生じていると考えられ
る。 (3)加工面粗さ 窒素珪素仕上面の粗さパターンを図5に示す。図から明
らかなように従来と同様の鏡面が得られた。 (4)直流電源の適用 直流電源による初期ドレッシング特性を調査した結果を
図3(●印)に示す。電流低減の挙動から充分薄い不導
体被膜が生成されていることがわかる。 (5)直流電源による鏡面研削特性 通常の直流電源を用いた従来の電解ドレッシングでは、
ドレス時の被膜厚が大きすぎ、その速やかな剥離が困難
であったが、本願の装置では、直流電源によっても図6
に示す鏡面が得られた。又直流電源を用いた場合の切削
抵抗は、図7に示すように従来に較べて若干高めであっ
た。
(1) Dressing characteristics As in the case of the conventional apparatus, the decrease in the actual current with the energization time was recorded (FIG. 3, circle). When the current decreased to about 1 A, the state of the grindstone surface was such that a nonconductive film, that is, an insulating film was formed despite contact of the electrodes. (2) Mirror surface grinding characteristics Fig. 4 shows how the grinding resistance varies. As in the past, the grinding resistance tended to increase and stabilize with the mirror finishing of the processing surface, but showed a slightly higher load than in the past. It is thought that the abrasive pressure of the abrasive grains slightly occurred due to the contact pressure of the electrodes. (3) Roughness of Processed Surface FIG. 5 shows the roughness pattern of the nitrogen-silicon finished surface. As is clear from the figure, a mirror surface similar to the conventional one was obtained. (4) Application of DC power supply The results of investigation of the initial dressing characteristics with the DC power supply are shown in FIG. It can be seen from the current reduction behavior that a sufficiently thin non-conductive film was formed. (5) Mirror grinding characteristics by DC power supply In conventional electrolytic dressing using a normal DC power supply,
Although the film thickness at the time of dressing was too large and it was difficult to quickly remove the film, in the apparatus of the present invention, even if a DC power supply was used as shown in FIG.
Was obtained. Further, the cutting resistance when a DC power supply was used was slightly higher than that of the conventional one as shown in FIG.

【0021】[0021]

【発明の効果】上述したように、本発明の方法及び装置
によれば、電極が半導体材料であり、かつ砥石の接触面
に接触しているため、絶縁被膜の薄い部分と厚い部分と
の電気抵抗の差が少なく、スパークが発生しにくい。従
って、絶縁被膜の厚さの相違によるドレッシングの速度
変化が少ない。
As described above, according to the method and apparatus of the present invention, since the electrode is made of a semiconductor material and is in contact with the contact surface of the grindstone, the electric connection between the thin and thick portions of the insulating coating is obtained. The difference in resistance is small, and sparks are unlikely to occur. Therefore, the change in dressing speed due to the difference in the thickness of the insulating film is small.

【0022】また、スパークが少なく、かつ電極が砥石
の接触面に接触しているため、 Elid サイクルに入る前
の図8(A)において、形成される絶縁被膜が比較的薄
くなる。このため、実際の鏡面加工を行う前に、最適な
被膜厚さになるまで行う研削が少なくなる。更に、ドレ
ッシングの速度変化が少なく、かつ形成される絶縁被膜
が薄く均一であることによって、完全な直流電源の適用
が可能になる等の大きな効果が得られる。
Further, since there is little spark and the electrode is in contact with the contact surface of the grindstone, the insulating film formed in FIG. 8A before entering the Elid cycle becomes relatively thin. For this reason, before the actual mirror polishing is performed, the amount of grinding performed until the film thickness becomes optimum is reduced. Further, since the change in dressing speed is small and the formed insulating film is thin and uniform, a great effect such as a complete DC power supply can be obtained.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明による電解ドレッシング装置を模式的に
示す図である。
FIG. 1 is a view schematically showing an electrolytic dressing apparatus according to the present invention.

【図2】電極と給電体を更に詳細に示す図である。FIG. 2 is a diagram showing an electrode and a power supply body in further detail.

【図3】接触電解ドレッシングによる挙動・特性を示す
図である。
FIG. 3 is a diagram showing behavior and characteristics by contact electrolytic dressing.

【図4】パルス電源を用いた場合の研削抵抗を示す図で
ある。
FIG. 4 is a diagram showing a grinding resistance when a pulse power supply is used.

【図5】Elid 研削後の面粗さを示す図である。FIG. 5 is a diagram showing surface roughness after Elid grinding.

【図6】直流電源を用いた Elid 研削後の面粗さ示す図
である。
FIG. 6 is a view showing surface roughness after Elid grinding using a DC power supply.

【図7】直流電源を用いた場合の研削抵抗を示す図であ
る。
FIG. 7 is a diagram showing a grinding resistance when a DC power supply is used.

【図8】Elid 研削法における Elid サイクルを示す説
明図である。
FIG. 8 is an explanatory diagram showing an Elid cycle in the Elid grinding method.

【符号の説明】[Explanation of symbols]

10 砥石 12 接触面 14 テーブル 16 被加工物 18 上部ヘッド 20 電極 22 金属板 24 シリコン 26 板バネ 28 絶縁体 30 ノズル 40 電源 42 給電体 DESCRIPTION OF SYMBOLS 10 Grinding stone 12 Contact surface 14 Table 16 Workpiece 18 Upper head 20 Electrode 22 Metal plate 24 Silicon 26 Leaf spring 28 Insulator 30 Nozzle 40 Power supply 42 Feeder

───────────────────────────────────────────────────── フロントページの続き (58)調査した分野(Int.Cl.7,DB名) B24B 53/00 B23H 5/00 B23H 5/10 ──────────────────────────────────────────────────続 き Continued on the front page (58) Field surveyed (Int. Cl. 7 , DB name) B24B 53/00 B23H 5/00 B23H 5/10

Claims (2)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】 被加工物との接触面を有する導電性砥石
と前記接触面に対向する電極との間に導電性液を流し、
前記砥石と電極との間に電圧を印加し、砥石を電解によ
りドレッシングする電解ドレッシング方法において、 半導体材料からなる電極を砥石の前記接触面に接触させ
ることを特徴とする導電性砥石の電解ドレッシング方
法。
A conductive liquid is caused to flow between a conductive grindstone having a contact surface with a workpiece and an electrode facing the contact surface,
An electrolytic dressing method for applying a voltage between the whetstone and an electrode to dress the whetstone by electrolysis, comprising: bringing an electrode made of a semiconductor material into contact with the contact surface of the whetstone. .
【請求項2】 被加工物との接触面を有する導電性砥石
と、前記接触面に対向する電極と、前記砥石と電極との
間に導電性液を流す手段と、前記砥石と電極との間に電
圧を印加する手段とからなる、砥石を電解によりドレッ
シングする電解ドレッシング装置において、 前記電極は半導体材料からなり、かつ砥石の前記接触面
に接触していることを特徴とする導電性砥石の電解ドレ
ッシング装置。
2. An electroconductive grindstone having a contact surface with a workpiece, an electrode facing the contact surface, means for flowing a conductive liquid between the grindstone and the electrode, and A means for applying a voltage therebetween, in an electrolytic dressing apparatus for dressing the grindstone by electrolysis, wherein the electrode is made of a semiconductor material, and the conductive grindstone characterized in that it is in contact with the contact surface of the grindstone Electrolytic dressing equipment.
JP12728991A 1991-05-30 1991-05-30 Method and apparatus for electrolytic dressing with semiconductor contact electrode Expired - Fee Related JP3169631B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP12728991A JP3169631B2 (en) 1991-05-30 1991-05-30 Method and apparatus for electrolytic dressing with semiconductor contact electrode

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12728991A JP3169631B2 (en) 1991-05-30 1991-05-30 Method and apparatus for electrolytic dressing with semiconductor contact electrode

Publications (2)

Publication Number Publication Date
JPH06170732A JPH06170732A (en) 1994-06-21
JP3169631B2 true JP3169631B2 (en) 2001-05-28

Family

ID=14956285

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12728991A Expired - Fee Related JP3169631B2 (en) 1991-05-30 1991-05-30 Method and apparatus for electrolytic dressing with semiconductor contact electrode

Country Status (1)

Country Link
JP (1) JP3169631B2 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3344558B2 (en) * 1998-02-26 2002-11-11 理化学研究所 Electric dressing grinding method and apparatus

Also Published As

Publication number Publication date
JPH06170732A (en) 1994-06-21

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