JP3140866U - Optical analyzer - Google Patents

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JP3140866U
JP3140866U JP2008000492U JP2008000492U JP3140866U JP 3140866 U JP3140866 U JP 3140866U JP 2008000492 U JP2008000492 U JP 2008000492U JP 2008000492 U JP2008000492 U JP 2008000492U JP 3140866 U JP3140866 U JP 3140866U
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sample
sample chamber
heat insulating
light
unit
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英幹 林
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Shimadzu Corp
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Shimadzu Corp
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Abstract

【課題】スライドさせて筐体より挿脱する試料室ユニットを覆うクッション性を有する断熱材の弾力作用方向とスライド方向が垂直の場合でも断熱材が破損しない光分析装置を提供する。
【解決手段】試料室ユニット2と筐体48間の4面にはクッション性を有する部材からなる断熱材44、45、46、47が圧縮され配設されている。なお、弾力作用方向と挿脱方向が垂直の断熱材44、45、46と試料室ユニット2の間には筐体48に一端が保持されたバネ板41、42、43が介在する。
【選択図】 図2
Provided is an optical analysis device in which a heat insulating material is not damaged even when the elastic acting direction of a cushioning heat insulating material covering a sample chamber unit that is slid and inserted / removed from a housing is perpendicular to the sliding direction.
SOLUTION: Thermal insulation materials 44, 45, 46, 47 made of a member having cushioning properties are compressed and arranged on four surfaces between a sample chamber unit 2 and a casing 48. Note that spring plates 41, 42, and 43 having one end held by the casing 48 are interposed between the heat insulating materials 44, 45, and 46 that are perpendicular to the elastic acting direction and the insertion / removal direction and the sample chamber unit 2.
[Selection] Figure 2

Description

本考案は、試料に光を照射してその透過光あるいは反射光または発生する蛍光を測定して物質の定性・定量を行う光分析装置に関し、特には試料を載置する試料室の装置に対する保持挿脱に関する。   The present invention relates to an optical analyzer for qualitatively and quantitatively determining a substance by irradiating a sample with light and measuring the transmitted light or reflected light or generated fluorescence, and in particular, holding the sample chamber with respect to the apparatus. Regarding insertion and removal.

光分析装置にはいろいろな種類があるが、最も一般的な分光光度計は、光を放射する光源とこの光を分光する分光器を備えた光照射ユニットと、分光された光が照射される試料を載置する試料室ユニットと、試料を透過または反射した光を電気信号に変換する検出器と電気回路を備えた測光ユニットと、この電気回路の出力をデータ処理し装置を制御するコンピュータを備えている。   There are various types of optical analyzers, but the most common spectrophotometer is a light irradiation unit that includes a light source that emits light, a spectroscope that splits this light, and the light that is split. A sample chamber unit for placing a sample, a photometric unit including a detector and an electric circuit for converting light transmitted or reflected from the sample into an electric signal, and a computer for processing the output of the electric circuit and controlling the apparatus I have.

光分析装置の他の例として、高速液体クロマトグラフ用蛍光分光検出器は、光を放射する光源とこの光を分光する分光器を備えた光照射ユニットと、フローセルが配設されこのフローセルに試料を導入し分光された光を照射するような構造とした試料室ユニットと、試料で発生する蛍光を分光する分光器と分光された光を電気信号に変換する光電変換器と電気回路を備えた測光ユニットと、この電気回路の出力信号をデータ処理し装置全体を制御するコンピュータから成る。   As another example of the optical analyzer, a fluorescence spectroscopic detector for high-performance liquid chromatograph includes a light irradiation unit including a light source that emits light, a spectroscope that splits the light, a flow cell, and a sample in the flow cell. Equipped with a sample chamber unit configured to irradiate spectroscopic light, a spectroscope that divides the fluorescence generated in the sample, a photoelectric converter that converts the spectroscopic light into an electric signal, and an electric circuit It consists of a photometric unit and a computer that processes the output signal of this electric circuit and controls the entire apparatus.

このような光分析装置は、物質の定性等のために吸収スペクトル測定や蛍光スペクトル測定をするだけでなく、物質の濃度測定のための定量測定や、酵素反応速度測定などのための吸光度の時間変化測定等幅広い分野で使用されている。   Such an optical analyzer not only performs absorption spectrum measurement and fluorescence spectrum measurement for qualitative substances, but also absorbance time for substance concentration measurement and enzyme reaction rate measurement. Used in a wide range of fields such as change measurement.

測定対象となる試料の測定環境や形態および形状は目的に応じて極めて多様であり、1種類の試料室ユニットではあらゆる試料に対応するのは不可能であるため、通常は一つの光分析装置に対して複数の種類の試料室ユニットが準備されており、目的に合致する試料室ユニットが選択使用される。このような試料室ユニットの多様化に伴い、保持固定機構に嵌合しない別種の被保持構造を具備する試料室ユニットを保持固定するための着脱可能なアダプターを備えた装置が供給されている(例えば特許文献1参照)。
実登3116455号公報
The measurement environment, form, and shape of the sample to be measured are extremely diverse depending on the purpose, and it is impossible to handle every sample with one type of sample chamber unit. On the other hand, a plurality of types of sample chamber units are prepared, and sample chamber units matching the purpose are selectively used. Along with the diversification of such sample chamber units, an apparatus having a detachable adapter for holding and fixing a sample chamber unit having another type of held structure that does not fit into the holding and fixing mechanism is being supplied ( For example, see Patent Document 1).
Noto 3116455 gazette

上記光分析装置の一例として、試料室ユニットのメンテナンスを容易に行うために、筐体から試料室ユニットを単一方向に摺接(スライド)させて挿脱するものがある。試料を温度制御された環境下で測定する場合、試料室ユニットの保温性と気密性を保つために断熱性と弾性を有する断熱材で外周面を覆う必要がある。断熱材の弾性による力が作用する方向(弾力作用方向)と試料室ユニットのスライド方向とが同一の場合は問題ないが、弾力作用方向とスライド方向が垂直の場合、試料室ユニットをスライドさせて挿脱させると、断熱材が接触面で摩擦によりスライド方向に引き寄せられ、終には破損にいたる。本考案の目的は、弾力作用方向とスライド方向が垂直の場合でも断熱材が破損しない光分析装置を提供することである。   As an example of the above-described optical analyzer, there is one that inserts and removes the sample chamber unit by sliding it in a single direction from the housing in order to easily maintain the sample chamber unit. When measuring a sample in a temperature-controlled environment, it is necessary to cover the outer peripheral surface with a heat insulating material having heat insulating properties and elasticity in order to maintain the heat retaining property and air tightness of the sample chamber unit. There is no problem if the direction in which the force due to the elasticity of the heat insulating material acts (elasticity acting direction) and the sliding direction of the sample chamber unit are the same, but if the elastic acting direction and the sliding direction are perpendicular, slide the sample chamber unit. When it is inserted and removed, the heat insulating material is drawn in the sliding direction by friction on the contact surface, and eventually it is damaged. An object of the present invention is to provide an optical analyzer that does not damage the heat insulating material even when the direction of elastic action and the direction of sliding are perpendicular.

本考案は、光を試料に照射する光照射ユニットと、前記試料を収容載置する試料室ユニットと、前記照射に伴い生じる透過光、反射光およびまたは蛍光を測定する測光ユニットと、前記各ユニットを収容保持する収容部を備えた筐体とからなる光分析装置において、前記筐体の収容部における内壁面に対して垂直方向に弾力を生起する断熱材と、該断熱材を収容部の内方から覆う形で内張りされたバネ板を付設し、試料室ユニットが筐体の収容部に対して挿入されるとき前記弾力にて保持され取り出し時には弾力に抗して取り出し可能である。また、収容部内壁面とバネ板との間には断熱材が充填されている。したがって、試料室ユニットのスライド面と断熱材とは接触しない。   The present invention includes a light irradiation unit that irradiates a sample with light, a sample chamber unit that houses and mounts the sample, a photometric unit that measures transmitted light, reflected light, and / or fluorescence generated by the irradiation, and the units. An optical analysis device comprising a housing having a housing portion for housing and holding a heat insulating material that generates elasticity in a direction perpendicular to an inner wall surface of the housing portion of the housing; A spring plate that is lined so as to cover from the side is attached, and is held by the elasticity when the sample chamber unit is inserted into the housing portion of the housing, and can be taken out against the elasticity at the time of removal. Further, a heat insulating material is filled between the inner wall surface of the housing portion and the spring plate. Therefore, the slide surface of the sample chamber unit and the heat insulating material do not contact each other.

試料室ユニットと断熱材とはスライド面で直接には接触しないため、断熱材の弾力作用方向と試料室ユニットのスライド方向が垂直の場合でも断熱材が破損しない。したがって、試料室ユニットは、長期にわたり安定性良好な温度特性を維持できる。   Since the sample chamber unit and the heat insulating material are not in direct contact with each other on the slide surface, the heat insulating material is not damaged even when the elastic acting direction of the heat insulating material is perpendicular to the slide direction of the sample chamber unit. Therefore, the sample chamber unit can maintain temperature characteristics with good stability over a long period of time.

バネ板は熱伝導が小さく耐腐食性の大きな素材が採用され、さらに長さ方向の熱伝導を小さくするために極薄い板が使用される。   The spring plate is made of a material having low heat conduction and high corrosion resistance, and an extremely thin plate is used to further reduce heat conduction in the length direction.

本考案の実施例について図1、図2を参照して説明する。図1は、本考案の実施例による光分析装置の概略構造を示す図である。図2は、本考案の実施例による試料室ユニットと断熱材などの配置を示す図である。   An embodiment of the present invention will be described with reference to FIGS. FIG. 1 is a diagram showing a schematic structure of an optical analyzer according to an embodiment of the present invention. FIG. 2 is a diagram illustrating an arrangement of a sample chamber unit and a heat insulating material according to an embodiment of the present invention.

本考案の光分析装置は、図1に示すとおり、光を試料Sに照射する光照射ユニット1と、フローセルが設けられその中を試料Sが流れる試料室ユニット2と、試料Sへの光照射に伴い生ずる蛍光を測定する測光ユニット3と、試料Sの温度を調節する温調ユニット4と、分析データや操作メニューなどを表示する表示器6と、各ユニットを制御し測光ユニット3の出力信号をデータ処理する制御ユニット5を備えている。   As shown in FIG. 1, the optical analyzer of the present invention includes a light irradiation unit 1 that irradiates a sample S with light, a sample chamber unit 2 in which a flow cell is provided and the sample S flows, and light irradiation to the sample S. Metering unit 3 for measuring the fluorescence generated by the light source, a temperature control unit 4 for adjusting the temperature of the sample S, a display 6 for displaying analysis data, an operation menu, and the like, and an output signal of the metering unit 3 by controlling each unit. Is provided with a control unit 5 for data processing.

光照射ユニット1は、例えばキセノンランプなどからなる光源11と、光源11で発生する光を分光する分光器12と、分光された光の方向を変えるミラー13から成り、分光された光を図示しないフローセルに導入された試料Sに照射する。分光器12は制御ユニット5により制御され、分光器12を出射する光の波長が決まる。測光ユニット3は、試料Sで発生した蛍光を分光する分光器31と、分光された蛍光を電気信号に変換する検出器32と、この電気信号を増幅し制御ユニット5へ出力する増幅器33から成る。分光器31は制御ユニット5により制御され、測定する蛍光の波長が決まる。   The light irradiation unit 1 includes a light source 11 made of, for example, a xenon lamp, a spectroscope 12 that splits light generated by the light source 11, and a mirror 13 that changes the direction of the split light, and the split light is not illustrated. The sample S introduced into the flow cell is irradiated. The spectroscope 12 is controlled by the control unit 5, and the wavelength of the light emitted from the spectroscope 12 is determined. The photometric unit 3 includes a spectroscope 31 that splits the fluorescence generated in the sample S, a detector 32 that converts the spectroscopic fluorescence into an electric signal, and an amplifier 33 that amplifies the electric signal and outputs the electric signal to the control unit 5. . The spectroscope 31 is controlled by the control unit 5, and the wavelength of fluorescence to be measured is determined.

図2は図1における試料室ユニット2の周辺の構造を示す図で、図2(a)は図2(b)の断面B−Bを矢印の方向から見た断面図であり、図2(b)は図2(a)の断面A−Aを矢印の方向から見た断面図である。試料室ユニット2と筐体48間の4面にはクッション性を有する部材からなる断熱材44、45、46、47が圧縮され配設されている。なお、弾力作用方向と挿脱方向が垂直の断熱材44、45、46と試料室ユニット2の間には筐体48に一端が保持されたバネ板41、42、43が介在されている。筐体48と断熱材47は、試料Sを照射する光束が通過する開孔H1を有し、筐体48および断熱材45とバネ板42は、試料Sから発生する蛍光が通過する開孔H2を有する。   2 is a view showing the structure around the sample chamber unit 2 in FIG. 1, and FIG. 2 (a) is a cross-sectional view of the cross section BB in FIG. 2 (b) as seen from the direction of the arrow. FIG. 2B is a cross-sectional view of the cross section AA of FIG. On the four surfaces between the sample chamber unit 2 and the casing 48, heat insulating materials 44, 45, 46 and 47 made of a member having cushioning properties are compressed and disposed. In addition, spring plates 41, 42, 43 having one end held by the casing 48 are interposed between the heat insulating materials 44, 45, 46 that are perpendicular to the elastic acting direction and the insertion / removal direction and the sample chamber unit 2. The casing 48 and the heat insulating material 47 have an opening H1 through which the light beam that irradiates the sample S passes. The housing 48, the heat insulating material 45, and the spring plate 42 have an opening H2 through which the fluorescence generated from the sample S passes. Have

試料室ユニット2は、その底面が温調ユニット4に接触し、熱伝導により温度制御される。試料室ユニット2は、図2(b)に示すレール49、50、51、52に沿ってバネ板41、42、43に接触しつつ、挿脱方向にスライドし取り外しと取り付けが行われる。   The bottom surface of the sample chamber unit 2 is in contact with the temperature control unit 4, and the temperature is controlled by heat conduction. The sample chamber unit 2 slides in the insertion / removal direction while being in contact with the spring plates 41, 42, 43 along the rails 49, 50, 51, 52 shown in FIG.

本考案は以上の構造であるから、バネ板41、42、43の介在により試料室ユニット2と断熱材44、45、46とはスライド面で直接には接触しないため、断熱材44、45、46の弾力作用方向と試料室ユニット2のスライド方向が垂直であるが、断熱材44、45、46は破損しない。したがって、試料室ユニット2は、長期にわたり安定性良好な温度特性を維持できる。   Since the present invention has the above-described structure, the sample chamber unit 2 and the heat insulating materials 44, 45, 46 are not in direct contact with each other on the slide surface due to the interposition of the spring plates 41, 42, 43. Although the elastic action direction of 46 and the sliding direction of the sample chamber unit 2 are perpendicular, the heat insulating materials 44, 45, and 46 are not damaged. Therefore, the sample chamber unit 2 can maintain temperature characteristics with good stability over a long period of time.

図示例においては、試料Sに光を照射して発生する蛍光を測定する構造としたが、試料Sに光を照射して透過する光あるいは反射する光を測定する構造でも本考案は適用可能である。また、試料Sは、試料室ユニット2に備えられたフローセルを流れる液体試料であるが、キュベットに注入された液体試料または固体試料ホルダーに保持された個体試料でもよい。また、バネ板41、42、43の代わりに弾性板からなる構造でも同様な機能を有し本考案に含まれる。上述のとおり光分析装置は種々の構造とすることができ、本考案はこれら変形例を包含する。   In the illustrated example, the fluorescence generated by irradiating the sample S with light is measured. However, the present invention can be applied to a structure in which the sample S is irradiated with light to measure transmitted light or reflected light. is there. The sample S is a liquid sample flowing through the flow cell provided in the sample chamber unit 2, but may be a liquid sample injected into a cuvette or an individual sample held in a solid sample holder. Moreover, the structure which consists of an elastic board instead of the spring board 41,42,43 has the same function, and is included in this invention. As described above, the optical analyzer can have various structures, and the present invention includes these modifications.

本考案は、試料に光を照射してその透過光あるいは反射光または発生する蛍光を測定して物質の定性・定量を行う光分析装置に関し、特には試料を載置する試料室の装置に対する保持挿脱に関する。   The present invention relates to an optical analyzer for qualitatively and quantitatively determining a substance by irradiating a sample with light and measuring the transmitted light or reflected light or generated fluorescence, and in particular, holding the sample chamber with respect to the apparatus. Regarding insertion and removal.

本考案の実施例による光分析装置の概略構造を示す図である。It is a figure which shows schematic structure of the optical analyzer by the Example of this invention. 本考案の実施例による試料室ユニットと断熱材などの配置を示す図である。It is a figure which shows arrangement | positioning of the sample chamber unit and heat insulating material by the Example of this invention.

符号の説明Explanation of symbols

1 光照射ユニット
2 試料室ユニット
3 測光ユニット
4 温調ユニット
5 制御ユニット
6 表示器
11 光源
12 分光器
13 ミラー
31 分光器
32 検出器
33 増幅器
41 バネ板
42 バネ板
43 バネ板
44 断熱材
45 断熱材
46 断熱材
47 断熱材
48 筐体
49 レール
50 レール
51 レール
52 レール
H1 開孔
H2 開孔
S 試料
DESCRIPTION OF SYMBOLS 1 Light irradiation unit 2 Sample chamber unit 3 Photometry unit 4 Temperature control unit 5 Control unit 6 Display 11 Light source 12 Spectroscope 13 Mirror 31 Spectroscope 32 Detector 33 Amplifier 41 Spring plate 42 Spring plate 43 Spring plate 44 Heat insulation material 45 Heat insulation Material 46 Heat insulation material 47 Heat insulation material 48 Case 49 Rail 50 Rail 51 Rail 52 Rail H1 Open hole H2 Open hole S Sample

Claims (2)

光を試料に照射する光照射ユニットと、前記試料を収容載置する試料室ユニットと、前記照射に伴い生じる透過光、反射光およびまたは蛍光を測定する測光ユニットと、前記各ユニットを収容保持する収容部を備えた筐体とからなる光分析装置において、前記筐体の収容部における内壁面に対して垂直方向に弾力を生起する断熱材と、該断熱材を収容部の内方から覆う形で内張りされたバネ板を付設し、試料室ユニットが筐体の収容部に対して挿入されるとき前記弾力にて保持され取り出し時には弾力に抗して取り出し可能であることを特徴とする光分析装置。   A light irradiation unit for irradiating a sample with light, a sample chamber unit for storing and mounting the sample, a photometric unit for measuring transmitted light, reflected light and / or fluorescence generated by the irradiation, and storing and holding each unit In an optical analyzer comprising a housing having a housing portion, a heat insulating material that generates elasticity in a direction perpendicular to the inner wall surface of the housing portion of the housing, and a shape that covers the heat insulating material from the inside of the housing portion An optical analysis characterized in that a spring plate lined with is attached, the sample chamber unit is held by the elasticity when inserted into the housing of the housing, and can be taken out against the elasticity when taken out. apparatus. 収容部内壁面とバネ板との間には断熱材が充填されていることを特徴とする請求項1記載の光分析装置。
The optical analyzer according to claim 1, wherein a heat insulating material is filled between the inner wall surface of the housing portion and the spring plate.
JP2008000492U 2008-02-01 2008-02-01 Optical analyzer Expired - Lifetime JP3140866U (en)

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