JP3138810B2 - Ion plating equipment - Google Patents

Ion plating equipment

Info

Publication number
JP3138810B2
JP3138810B2 JP09300095A JP30009597A JP3138810B2 JP 3138810 B2 JP3138810 B2 JP 3138810B2 JP 09300095 A JP09300095 A JP 09300095A JP 30009597 A JP30009597 A JP 30009597A JP 3138810 B2 JP3138810 B2 JP 3138810B2
Authority
JP
Japan
Prior art keywords
electrode plate
substrate
ion plating
bias
thin film
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP09300095A
Other languages
Japanese (ja)
Other versions
JPH11131222A (en
Inventor
均 近藤
貴之 浅野
Original Assignee
森六株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 森六株式会社 filed Critical 森六株式会社
Priority to JP09300095A priority Critical patent/JP3138810B2/en
Publication of JPH11131222A publication Critical patent/JPH11131222A/en
Application granted granted Critical
Publication of JP3138810B2 publication Critical patent/JP3138810B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明はイオンプレーティン
グ装置、特に、真空槽内の上部に、電極板および薄膜形
成用基板を、その電極板が上側となるように配設し、ま
た真空槽内の下部に蒸着用材料を配設し、電極板と蒸着
用材料とを電気的に接続すると共に薄膜形成過程では電
極板に負の自己バイアスを誘起させる高周波電源設備を
備えたイオンプレーティング装置の改良に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an ion plating apparatus, in particular, an electrode plate and a substrate for forming a thin film, which are disposed on an upper portion of a vacuum chamber so that the electrode plate faces upward. Of an ion plating apparatus equipped with a high-frequency power supply for electrically connecting the electrode plate and the material for deposition and inducing a negative self-bias on the electrode plate during the thin film formation process. Regarding improvement.

【0002】[0002]

【従来の技術】従来、この種のイオンプレーティング装
置においては、電極板を基板ホルダに兼用すると共にそ
の電極板と基板とを重ね合せた状態で真空槽内に配設し
ている。
2. Description of the Related Art Conventionally, in this type of ion plating apparatus, an electrode plate is also used as a substrate holder, and the electrode plate and the substrate are arranged in a vacuum chamber in a state of being overlapped.

【0003】[0003]

【発明が解決しようとする課題】前記イオンプレーティ
ング装置において、高周波電源設備の出力を一定とした
とき、電極板の体積と、それに誘起される負の自己バイ
アスとの間には略逆比例の関係が成立する。この場合、
負の自己バイアスが低くなると、真空槽内のプラズマ密
度も低くなる。
In the above-mentioned ion plating apparatus, when the output of the high-frequency power supply is fixed, the volume of the electrode plate and the negative self-bias induced by the electrode plate are substantially inversely proportional. The relationship is established. in this case,
The lower the negative self-bias, the lower the plasma density in the vacuum chamber.

【0004】また高密度な薄膜を形成するためには、電
極板の体積と負の自己バイアスとの間に所定の関係を成
立させなければならない。
In order to form a high-density thin film, a predetermined relationship must be established between the volume of the electrode plate and the negative self-bias.

【0005】従来装置においては、電極板と基板とを重
ね合せているので、その基板が金属板である場合には、
それは電極板と略同様に機能するため、そこには、本来
の電極板と基板とよりなる積層電極板が構成される。
[0005] In the conventional apparatus, since the electrode plate and the substrate are overlapped, when the substrate is a metal plate,
Since it functions in substantially the same way as an electrode plate, a laminated electrode plate composed of an original electrode plate and a substrate is configured there.

【0006】この積層電極板においては、それが高密度
な薄膜を得るために好適な体積を持つ場合、その厚さが
増しているため、それに応じて電極板の表面積、したが
って基板の被薄膜形成面の面積が狭められ、薄膜のワイ
ド化の要請に応ずることができない、という問題があっ
た。
In this laminated electrode plate, if it has a suitable volume for obtaining a high-density thin film, its thickness is increased, and accordingly, the surface area of the electrode plate and, accordingly, the formation of a thin film on the substrate are correspondingly increased. There has been a problem that the area of the surface is reduced, and it is not possible to meet the demand for widening the thin film.

【0007】[0007]

【課題を解決するための手段】本発明は、電極板と基板
とを電気的に絶縁して、その電極板に本来の厚さを保持
させ、また基板に蒸着粒子およびそのイオンが確実に照
射されるようにし、これにより高密度な薄膜のワイド化
を達成し得るようにした前記イオンプレーティング装置
を提供することを目的とする。
SUMMARY OF THE INVENTION According to the present invention, an electrode plate and a substrate are electrically insulated so that the electrode plate maintains its original thickness, and the substrate is reliably irradiated with deposited particles and ions thereof. It is an object of the present invention to provide an ion plating apparatus capable of achieving widening of a high-density thin film.

【0008】前記目的を達成するため本発明によれば、
真空槽内の上部に、電極板および薄膜形成用基板を、そ
の電極板が上側となるように配設し、また前記真空槽内
の下部に蒸着用材料を配設し、前記電極板と前記蒸着用
材料とを電気的に接続すると共に薄膜形成過程では前記
電極板に負の自己バイアスを誘起させる高周波電源設備
を備えたイオンプレーティング装置において、前記基板
を、前記電極板から離間させると共にその基板に前記電
極板の負の自己バイアスが現出するように、前記電極板
の負の自己バイアスが反映される範囲内に配設したイオ
ンプレーティング装置が提供される。
[0008] To achieve the above object, according to the present invention,
An electrode plate and a substrate for forming a thin film are disposed on an upper portion in a vacuum chamber so that the electrode plate is on the upper side, and a deposition material is disposed on a lower portion in the vacuum chamber. in the ion plating apparatus having a high-frequency power supply equipment to induce a negative self-bias on the electrode plate is a thin film formation process as well as electrically connecting the evaporation material, before Symbol substrate
Is separated from the electrode plate and the substrate is
An ion plating apparatus is provided which is disposed within a range in which the negative self-bias of the electrode plate is reflected so that the negative self-bias of the electrode plate appears .

【0009】前記のように構成すると、電極板の厚さ
を、従来の積層電極板の略2分の1以下に減じ、これに
より電極板の表面積、したがって基板の被薄膜形成面の
面積を従来の略2倍以上に拡大することが可能である。
With the above construction, the thickness of the electrode plate is reduced to approximately one half or less of that of the conventional laminated electrode plate, whereby the surface area of the electrode plate, and hence the area of the thin film forming surface of the substrate, is reduced. It is possible to enlarge more than approximately two times.

【0010】また基板は、電極板の負の自己バイアス
現出しているから、蒸着粒子とそのイオンを基板に確
実に照射し、これにより高密度で、且つワイドな薄膜を
形成することが可能である。
Further to the substrate, because a negative self-bias of the electrode plates are revealing, reliably irradiate the ions and vapor deposition particles on the substrate, thereby a high density, and to form a wide thin film It is possible.

【0011】[0011]

【発明の実施の形態】図1に示すイオンプレーティング
装置1において、金属製真空槽2内の上部に電極板3お
よび薄膜形成用基板4が、その電極板3を上側にして配
設される。電極板3は、蓋形をなす導電性シールド5の
下向きの開口端面に電気絶縁性枠体7 1 を介して取付け
られている。また基板4は、枠形をなす導電性ホルダ6
に保持され、そのホルダ6は電極板3の下向き面周縁部
に電気絶縁性枠体72 を介して取付けられている。これ
により電極板3と基板4とが電気的に絶縁される。
DETAILED DESCRIPTION OF THE INVENTION Ion plating shown in FIG.
In the apparatus 1, the electrode plate 3 and the
And a thin film forming substrate 4 with its electrode plate 3 facing upward.
Is established. The electrode plate 3 is formed of a conductive shield 5 having a lid shape.
An electrically insulating frame 7 is provided on the downward opening end face. 1Mounted via
Have been. The substrate 4 has a frame-shaped conductive holder 6.
, And the holder 6 is provided at the peripheral edge of the downward facing surface of the electrode plate 3.
Electrically insulating frame 7TwoMounted through. this
Thereby, the electrode plate 3 and the substrate 4 are electrically insulated.

【0012】シールド5の上壁5a外面に中空の支持軸
8が設けられ、その支持軸8は軸受部材9を介して真空
槽2の上壁10に回転可能に支持される。軸受部材9か
ら突出する支持軸8の上端部にギヤボックス11内の被
動ギヤが連結され、そのギヤボックス11内の駆動ギヤ
にモータ12の駆動軸13が連結される。11aはギヤ
ボックス11の支持部材である。
A hollow support shaft 8 is provided on the outer surface of the upper wall 5a of the shield 5, and the support shaft 8 is rotatably supported on the upper wall 10 of the vacuum chamber 2 via a bearing member 9. A driven gear in a gear box 11 is connected to an upper end of the support shaft 8 protruding from the bearing member 9, and a drive shaft 13 of a motor 12 is connected to a drive gear in the gear box 11. 11a is a support member of the gear box 11.

【0013】基板4の下方において、真空槽2の底壁1
4上に導電性基台15が配設され、その基台15上に蒸
着用材料16を入れる導電性ハース17が固定され、ま
たそのハース17の傍に電子銃18が配設される。
Below the substrate 4, the bottom wall 1 of the vacuum chamber 2
A conductive base 15 is provided on the base 4, a conductive hearth 17 for containing the material 16 for vapor deposition is fixed on the base 15, and an electron gun 18 is provided beside the hearth 17.

【0014】真空槽2の外側に高周波電源設備19が配
設される。その設備19は、13.56MHzの高周波
を発信し得る高周波電源20と、それに電気的に接続さ
れたブロッキングコンデンサを持つ整合回路手段21と
よりなる。整合回路手段21から延びる接続線22は中
空の支持軸8を通して電極板3に接続される。また高周
波電源20から延びる接続線23はアースされ、その接
続線23から分岐する接続線24は、真空槽2の周壁2
5に設けられたグロメット26を通して導電性基板15
に接続される。これにより、電極板3と蒸着用材料16
とが高周波電源設備19に電気的に接続される。
A high frequency power supply 19 is provided outside the vacuum chamber 2. The equipment 19 comprises a high frequency power supply 20 capable of transmitting a high frequency of 13.56 MHz and a matching circuit means 21 having a blocking capacitor electrically connected thereto. A connection line 22 extending from the matching circuit means 21 is connected to the electrode plate 3 through the hollow support shaft 8. The connection line 23 extending from the high frequency power supply 20 is grounded, and the connection line 24 branched from the connection line 23 is connected to the peripheral wall 2 of the vacuum chamber 2.
5 through the grommet 26 provided on the conductive substrate 15.
Connected to. Thereby, the electrode plate 3 and the vapor deposition material 16
Are electrically connected to the high-frequency power supply equipment 19.

【0015】真空槽2の周壁25中間部にガス導入管2
7が設けられ、また周壁25下部に真空排気管28が設
けられる。
A gas introduction pipe 2 is provided at an intermediate portion of the peripheral wall 25 of the vacuum chamber 2.
7 is provided, and a vacuum exhaust pipe 28 is provided below the peripheral wall 25.

【0016】真空槽2はステンレス鋼より構成される。
電極板3は厚さ1〜2mmのAl板よりなり、基板4は厚
さ3〜4mmのCu板よりなる。電極板3と基板4間の間
隔dは1〜40mmに設定され、これにより基板4は、電
極板3の負の自己バイアスが反映される範囲内に配設さ
れる。この場合、基板4は、それが電極板3から離間し
ていても、その電極板3の電気作用が及ぶ範囲内に在る
ので、電極板3に負の自己バイアスが誘起されると、そ
の負の自己バイアスは基板4にも、それが電極板3に重
ね合せられているときと同じように現出する。シールド
5およびホルダ6はアルミニウムより構成され、また両
枠体71 ,72 はアルミナより構成され、さらにハース
17はモリブデンより構成される。
The vacuum chamber 2 is made of stainless steel.
The electrode plate 3 is made of an Al plate having a thickness of 1 to 2 mm, and the substrate 4 is made of a Cu plate having a thickness of 3 to 4 mm. The distance d between the electrode plate 3 and the substrate 4 is set to 1 to 40 mm, whereby the substrate 4 is arranged within a range in which the negative self-bias of the electrode plate 3 is reflected. In this case, the substrate 4 is separated from the electrode plate 3
Is in a range where the electric action of the electrode plate 3 reaches.
Therefore, when a negative self-bias is induced in the electrode plate 3,
Negative self-bias is applied to the substrate 4 and the electrode plate 3.
Appears as if they had been joined. Shield 5 and the holder 6 is composed of aluminum, also two frames 7 1, 7 2 is composed of alumina, further Haas 17 is composed of molybdenum.

【0017】イオンプレーティングに当っては、先ず、
ハース17に、例えば蒸着用材料16としてSiO2
末を入れた。また真空槽2内を真空排気管28を介して
排気し、次いでその真空槽2内にガス導入管27より反
応性ガスであるO2 ガスを導入して真空槽2内を2×1
-4Torrの真空度に保った。gはO2 ガス分子であ
る。
In ion plating, first,
For example, SiO 2 powder was put into the hearth 17 as the material 16 for vapor deposition. Further, the inside of the vacuum chamber 2 is evacuated through a vacuum exhaust pipe 28, and then O 2 gas, which is a reactive gas, is introduced into the vacuum chamber 2 through a gas introduction pipe 27 to evacuate the vacuum chamber 2 to 2 × 1
The vacuum was kept at 0 -4 Torr. g is an O 2 gas molecule.

【0018】そして、高周波電源設備19を作動させて
電極板3に負の自己バイアスを誘起させると共に真空槽
2内全体に亘りプラズマPを発生させ、また薄膜の均一
形成を狙い、モータ12を駆動して電極板3および基板
4を回転させ、さらに電子銃18を作動させて、その電
子ビームbを蒸着用材料16に照射して多数の蒸着粒子
pを生成させた。
Then, the high frequency power supply 19 is operated to induce a negative self-bias on the electrode plate 3, generate the plasma P over the entire inside of the vacuum chamber 2, and drive the motor 12 in order to form a uniform thin film. Then, the electrode plate 3 and the substrate 4 were rotated, and further, the electron gun 18 was operated to irradiate the electron beam b to the material 16 for vapor deposition to generate a large number of vapor-deposited particles p.

【0019】それら蒸着粒子pの一部はプラズマPによ
りイオン化され、次いで蒸着粒子pとイオンiは電極板
3の負の自己バイアスにより加速されて、その負の自己
バイアスが現出している基板4に確実に照射された。
Some of the deposited particles p are ionized by the plasma P, and then the deposited particles p and the ions i are accelerated by the negative self-bias of the electrode plate 3 and the substrate on which the negative self-bias appears . 4 was reliably irradiated.

【0020】このイオンプレーティング時間を3分間位
に設定することにより、厚さ0.15μmで密度1.4
g/cm 3 のSiO2 薄膜を形成することができた。
By setting the ion plating time to about 3 minutes, the thickness is 0.15 μm and the density is 1.4.
An SiO 2 thin film of 5 g / cm 3 could be formed.

【0021】高密度薄膜を形成し得る基板4の被薄膜形
成面の面積は、従来例の場合500mm×500mm=25
0,000mm2 が限度であったが、実施例の場合は80
0mm×1,000mm=800,000mm2 まで可能であ
って、従来例の3.2倍のワイド化を達成することがで
きた。なお、前記実施例において、電極板3の負の自己
バイアスは約500Vであった。
The area of the surface of the substrate 4 on which a high-density thin film can be formed is 500 mm × 500 mm = 25 in the case of the conventional example.
Although the limit was 000 mm 2 , in the case of the embodiment, it was 80 mm.
0 mm × 1,000 mm = 800,000 mm 2 is possible, and 3.2 times the width of the conventional example can be achieved. In the above embodiment, the negative self-bias of the electrode plate 3 was about 500V.

【0022】前記実施例においては、電極板3および基
板4を回転させたが、これは必須要件ではない。また基
板4は金属板に限らず、合成樹脂板、ガラス板等でもよ
い。
In the above embodiment, the electrode plate 3 and the substrate 4 were rotated, but this is not an essential requirement. The substrate 4 is not limited to a metal plate, but may be a synthetic resin plate, a glass plate, or the like.

【0023】[0023]

【発明の効果】本発明によれば、前記のような簡単な手
段を採用することによって、高密度な薄膜のワイド化を
達成し得るイオンプレーティング装置を提供することが
できる。
According to the present invention, it is possible to provide an ion plating apparatus capable of realizing a wide high-density thin film by employing the above simple means.

【図面の簡単な説明】[Brief description of the drawings]

【図1】イオンプレーティング装置の概略断面図であ
る。
FIG. 1 is a schematic sectional view of an ion plating apparatus.

【符号の説明】[Explanation of symbols]

1………イオンプレーティング装置 2………真空槽 3………電極板 4………基板 16……蒸着用材料 19……高周波電源設備 DESCRIPTION OF SYMBOLS 1 ... Ion plating apparatus 2 ... Vacuum tank 3 ... Electrode plate 4 ... Substrate 16 ... Material for vapor deposition 19 ... High frequency power supply equipment

───────────────────────────────────────────────────── フロントページの続き (58)調査した分野(Int.Cl.7,DB名) C23C 14/00 - 14/58 C30B 23/08 H01L 21/203 JICSTファイル(JOIS)──────────────────────────────────────────────────続 き Continued on the front page (58) Fields surveyed (Int. Cl. 7 , DB name) C23C 14/00-14/58 C30B 23/08 H01L 21/203 JICST file (JOIS)

Claims (1)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】 真空槽(2)内の上部に、電極板(3)
および薄膜形成用基板(4)を、その電極板(3)が上
側となるように配設し、また前記真空槽(2)内の下部
に蒸着用材料(16)を配設し、前記電極板(3)と前
記蒸着用材料(16)とを電気的に接続すると共に薄膜
形成過程では前記電極板(3)に負の自己バイアスを誘
起させる高周波電源設備(19)を備えたイオンプレー
ティング装置において、前記基板(4)を、前記電極板
(3)から離間させると共にその基板(4)に前記電極
板(3)の負の自己バイアスが現出するように、前記電
極板(3)の負の自己バイアスが反映される範囲内に配
設したことを特徴とするイオンプレーティング装置。
An electrode plate (3) is provided on an upper part in a vacuum chamber (2).
And a substrate (4) for forming a thin film, with its electrode plate (3) facing upward, and a vapor deposition material (16) disposed below the vacuum chamber (2). Ion plating provided with a high-frequency power supply (19) for electrically connecting the plate (3) and the material for vapor deposition (16) and for inducing a negative self-bias on the electrode plate (3) in the process of forming a thin film. in the apparatus, prior Symbol substrate (4), the electrode plate
(3) and separated from the substrate (4) by the electrode
An ion plating apparatus characterized in that the electrode plate (3) is disposed within a range in which the negative self-bias of the electrode plate (3) is reflected so that the negative self-bias of the plate (3) appears .
JP09300095A 1997-10-31 1997-10-31 Ion plating equipment Expired - Fee Related JP3138810B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP09300095A JP3138810B2 (en) 1997-10-31 1997-10-31 Ion plating equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP09300095A JP3138810B2 (en) 1997-10-31 1997-10-31 Ion plating equipment

Publications (2)

Publication Number Publication Date
JPH11131222A JPH11131222A (en) 1999-05-18
JP3138810B2 true JP3138810B2 (en) 2001-02-26

Family

ID=17880659

Family Applications (1)

Application Number Title Priority Date Filing Date
JP09300095A Expired - Fee Related JP3138810B2 (en) 1997-10-31 1997-10-31 Ion plating equipment

Country Status (1)

Country Link
JP (1) JP3138810B2 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003188115A (en) * 2001-12-17 2003-07-04 Shin Meiwa Ind Co Ltd Method and apparatus for semiconductor wiring formation, method and apparatus for manufacturing semiconductor device, and wafer
JP4656926B2 (en) * 2004-12-09 2011-03-23 セントラル硝子株式会社 Method for forming ITO transparent conductive film and substrate with ITO transparent conductive film

Also Published As

Publication number Publication date
JPH11131222A (en) 1999-05-18

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