JP3127437B2 - Square chip electronic components - Google Patents

Square chip electronic components

Info

Publication number
JP3127437B2
JP3127437B2 JP03021728A JP2172891A JP3127437B2 JP 3127437 B2 JP3127437 B2 JP 3127437B2 JP 03021728 A JP03021728 A JP 03021728A JP 2172891 A JP2172891 A JP 2172891A JP 3127437 B2 JP3127437 B2 JP 3127437B2
Authority
JP
Japan
Prior art keywords
substrate
electrodes
protective film
electrode
length
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP03021728A
Other languages
Japanese (ja)
Other versions
JPH04237101A (en
Inventor
尊文 勝野
伸治 都田
悦治 宮永
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Rohm Co Ltd
Original Assignee
Rohm Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rohm Co Ltd filed Critical Rohm Co Ltd
Priority to JP03021728A priority Critical patent/JP3127437B2/en
Publication of JPH04237101A publication Critical patent/JPH04237101A/en
Application granted granted Critical
Publication of JP3127437B2 publication Critical patent/JP3127437B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/30Assembling printed circuits with electric components, e.g. with resistor
    • H05K3/32Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
    • H05K3/34Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by soldering
    • H05K3/341Surface mounted components
    • H05K3/3431Leadless components

Landscapes

  • Non-Adjustable Resistors (AREA)

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【産業上の利用分野】本発明は、角形チップ固定抵抗器
や積層チップコンデンサなどの角形チップ状電子部品の
改良に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an improvement in square chip electronic components such as square chip fixed resistors and multilayer chip capacitors.

【0002】[0002]

【従来の技術】角形チップ状電子部品として、チップ部
品の対向両側に端子電極を設け、端子電極のうちチップ
部品の上面に形成される上面電極のチップの端縁寄りの
部分が露出する態様で上面電極上に保護膜を設けたもの
がある。一例として、角形チップ固定抵抗器は、例えば
図3に示す如く、アルミナ基板20上に抵抗体膜(特に
図示せず)が設けられ、抵抗体膜は全体が保護膜22で
覆われて保護されている。アルミナ基板20の左右両側
には電極30,40が形成されており、左右の各端子電
極30,40はそれぞれ上面外部電極31,41と、側
面外部電極32,42と、下面外部電極33,43とで
構成される。この内、上面外部電極31,41は端縁寄
りの部分を残して保護膜22で覆われている。
2. Description of the Related Art As a rectangular chip-shaped electronic component, terminal electrodes are provided on opposite sides of the chip component, and a portion of the terminal electrode near an edge of a chip of an upper surface electrode formed on the upper surface of the chip component is exposed. In some cases, a protective film is provided on the upper electrode. As an example, in the square chip fixed resistor, as shown in FIG. 3, for example, a resistor film (not particularly shown) is provided on an alumina substrate 20, and the resistor film is entirely covered with a protection film 22 and protected. ing. Electrodes 30, 40 are formed on both left and right sides of the alumina substrate 20, respectively. The left and right terminal electrodes 30, 40 are upper surface external electrodes 31, 41, side surface external electrodes 32, 42, and lower surface external electrodes 33, 43, respectively. It is composed of Of these, the upper surface external electrodes 31 and 41 are covered with the protective film 22 except for portions near the edges.

【0003】かかる構造のチップ抵抗器を基板に配線す
る場合、例えば図4に示すように抵抗器50をガラスエ
ポキシ基板70に取付ける場合を例にすると、抵抗器5
0を基板70上に載せた後に、基板上の銅配線71に抵
抗器50の左右電極30,40を半田付けして固定する
のが一般的である。この時、半田付けは下面外部電極3
3,43と側面外部電極32,42だけでなく上面外部
電極31,41にも行われ、図中に斜線で示す如く半田
60は上面外部電極31,41上で盛り上がった状態に
なる。
When a chip resistor having such a structure is wired on a substrate, for example, as shown in FIG.
Generally, the left and right electrodes 30, 40 of the resistor 50 are soldered and fixed to the copper wiring 71 on the substrate after the 0 is mounted on the substrate 70. At this time, soldering is performed on the lower external electrode 3
3, 43 and the side external electrodes 32, 42 as well as the upper external electrodes 31, 41, and the solder 60 is raised on the upper external electrodes 31, 41 as shown by oblique lines in the figure.

【0004】[0004]

【発明が解決しようとする課題】このような半田付けが
なされると、当該半田付部分が外気などの温度差、特に
自動車産業で要求される「温度サイクル試験」(チップ
抵抗器などのチップ部品を、例えば−50℃程度で15
〜30分間保持した後、150℃程度まで昇温して同様
に15〜30分間保持するサイクルを約1000回繰り
返す試験)を受けた場合、半田付部分の温度差による膨
張・収縮が大きいために、上面外部電極31,41に引
張り応力が発生し、当該電極の内部から亀裂が生じた
り、電極が剥離したり、或いはアルミナ基板20が割れ
ることがある。特に、これらの損傷が著しいと、例えば
上面外部電極31,41を縦断する亀裂が生起して当該
電極が分離された場合や、電極31,41が剥がれて抵
抗体膜との接触が断たれた場合には、断線不良を来すこ
とになる。
When such soldering is performed, a temperature difference between the soldered portion and the outside air, particularly a "temperature cycle test" (a chip component such as a chip resistor) required in the automobile industry. At -50 ° C. for 15
After holding for about 30 minutes, the temperature is raised to about 150 ° C. and the cycle of holding for about 15 to 30 minutes is also repeated about 1000 times). Then, a tensile stress is generated in the upper external electrodes 31 and 41, and a crack may be generated from the inside of the electrodes, the electrodes may be separated, or the alumina substrate 20 may be broken. In particular, when these damages are remarkable, for example, cracks that traverse the upper surface external electrodes 31 and 41 occur and the electrodes are separated, or the electrodes 31 and 41 are peeled off and the contact with the resistor film is cut off. In this case, a disconnection failure occurs.

【0005】上記応力発生のメカニズムについて図5を
参照しながらもう少し詳しく説明する。アルミナ基板2
0上に設けた抵抗体膜21と左側の上面外部電極41と
は相互の端部で重合状態で接続されており、この接続部
を含む抵抗体膜21全体及び電極41の一部が保護膜2
2で被覆されている。なお、電極41上には半田喰れ防
止のためのNiメッキ膜80が形成されている。ここで
電極41上に更にSn/Pbメッキ膜及び半田81を施
して半田付けを終了した後に当該半田付部分に温度差が
生じると、金属部分80,81には矢印イ方向の引張り
応力が、ガラス性の保護膜22には矢印ロ方向の引張り
応力がそれぞれ発生する。一般に、金属の膨張・収縮率
はガラスのそれよりも大きいため、電極41には両応力
イ、ロの差により矢印ハ方向の「ズレ応力」が生起す
る。この「ズレ応力」によって前述の問題点が引起こ
る訳である。
The mechanism of the above-mentioned stress generation will be described in more detail with reference to FIG. Alumina substrate 2
The resistor film 21 provided on the upper surface 0 and the upper surface external electrode 41 on the left side are connected to each other in an overlapped state at their mutual ends. 2
2 coated. Note that a Ni plating film 80 for preventing solder erosion is formed on the electrode 41. Here, when a temperature difference occurs in the soldered portion after the Sn / Pb plating film and the solder 81 are further applied on the electrode 41 and the soldering is completed, the tensile stress in the direction of arrow A is applied to the metal portions 80 and 81. A tensile stress in the direction of arrow B is generated in the glassy protective film 22. In general, since the expansion and contraction ratio of metal is greater than that of glass, a "deviation stress" in the direction of arrow C occurs on the electrode 41 due to the difference between the two stresses a and b. This by "shear stress", which is a translation of the above-mentioned problems is Ru Oko Pull <br/>.

【0006】この種の問題は、上記角形チップ固定抵抗
器に限らず、積層チップコンデンサなどの角形チップ部
品全般に相当する。これは、チップ抵抗器の如きチップ
部品には厳しい信頼性が要求されることからすると甚だ
好ましくない。従って、本発明の目的は、上記従来の角
形チップ固定抵抗器を始めとする種々の角形チップ状電
子部品の半田付けで生じていた不都合な点を解消するこ
とにある。
[0006] This kind of problem is not limited to the above-mentioned square chip fixed resistors, but also applies to all square chip components such as multilayer chip capacitors. This is extremely undesirable because strict reliability is required for chip components such as chip resistors. SUMMARY OF THE INVENTION Accordingly, it is an object of the present invention to eliminate disadvantages caused by soldering various rectangular chip-shaped electronic components including the above-described conventional rectangular chip fixed resistors.

【0007】[0007]

【課題を解決するための手段】前記目的を達成するため
に、本発明者らは上面電極を覆う保護膜の形状や大きさ
と上記問題点との因果関係について鋭意研究に勤しんだ
結果、基板の端子電極形成側面を結ぶ方向における保護
膜の長さ(l)が方向における基板上面の長さ(L)
と等しいと共に、前記保護膜の前記端子電極形成側面側
の側面が前記基板の端子電極形成側面と一致し、且つ前
基板の端子電極非形成側面を結ぶ方向における保護膜
の長さが方向における基板上面の長さと略等しけれ
ば、「ズレ応力」が上面電極に発生しないことを見出
し、本発明を完成するに至った。
Means for Solving the Problems In order to achieve the above object, the present inventors have worked diligently on the causal relationship between the shape and size of the protective film covering the upper electrode and the above-mentioned problems, and as a result, have found that The length (l) of the protective film in the direction connecting the side surfaces on which the terminal electrodes are formed is the length (L) of the upper surface of the substrate in the same direction.
And the side of the protective film on which the terminal electrode is formed.
If the side surface of the substrate coincides with the terminal electrode forming side surface of the substrate, and the length of the protective film in the direction connecting the terminal electrode non-forming side surfaces of the substrate is substantially equal to the length of the substrate upper surface in the same direction, the "deviation stress" The present inventors have found that no occurrence occurs on the upper surface electrode, and have completed the present invention.

【0008】基板の端子電極形成側面を結ぶ方向におけ
る保護膜の長さ(l)が方向における基板上面の長さ
(L)と等しいと共に、前記保護膜の前記端子電極形成
側面側の側面が前記基板の端子電極形成側面と一致し、
且つ前記基板の端子電極非形成側面を結ぶ方向における
保護膜の長さが方向における基板上面の長さと略等し
いことにより、上面電極の略全てが保護膜によって覆わ
れ、上面電極が基板上面の端縁に殆ど露出せず、金属部
分である半田付部分とガラス性保護膜との膨張・収縮率
の差異が実質上無くなるため、前記図5に基づいて説明
した「ズレ応力」が上面電極に発生しなくなる。この結
果、上面電極の亀裂や剥離、アルミナ基板の割れ、及び
これらに起因する断線不良などの問題は殆ど皆無にな
る。
The length (l) of the protective film in the direction connecting the side faces of the substrate on which the terminal electrodes are formed is equal to the length (L) of the upper surface of the substrate in the same direction, and the length of the protective film in the direction of the terminal electrodes formation
The side surface of the side surface coincides with the terminal electrode forming side surface of the substrate ,
In addition, since the length of the protective film in the direction connecting the side surfaces on which the terminal electrodes are not formed is substantially equal to the length of the upper surface of the substrate in the same direction, substantially all of the upper surface electrode is covered with the protective film, and the upper surface electrode is Since it is hardly exposed to the edge, and the difference in expansion / shrinkage ratio between the soldered portion, which is a metal portion, and the glassy protective film is substantially eliminated, the “deviation stress” described with reference to FIG. No longer occurs. As a result, there are almost no problems such as cracking or peeling of the upper electrode, cracking of the alumina substrate, and disconnection failure caused by these.

【0009】但し、保護膜の幅(前記基板の端子電極非
形成側面を結ぶ方向における長さ)は、その長さlと同
様に基板上面の幅(方向における長さ)と敢えて同一
にする必要はなく、チップ部品の基板への実装作業の容
易性などを考慮すると従来と同様でよい。
However, the width of the protective film ( the terminal electrode of the substrate
The length in the direction connecting the formation side surfaces ) need not be the same as the width l of the upper surface of the substrate ( the length in the same direction), like the length l, and the ease of mounting the chip components on the substrate can be improved. Considering the above, it may be the same as the conventional one.

【0010】なお、本発明においていうチップ状電子部
品は、既記から理解されるように、基板の対向両側に端
子電極を設け、端子電極のうち基板の上面に在る上面電
極上に保護膜を設けたものを指し、具体例として角形チ
ップ固定抵抗器、積層チップコンデンサなどが列挙され
る。
As understood from the above description, the chip-shaped electronic component according to the present invention is provided with terminal electrodes on opposite sides of a substrate, and a protective film is formed on an upper electrode of the terminal electrodes on the upper surface of the substrate. , And specific examples thereof include a square chip fixed resistor, a multilayer chip capacitor, and the like.

【0011】[0011]

【実施例】以下、本発明の角形チップ状電子部品を実施
例に基づいて詳説する。但し、下記の実施例ではチップ
部品の代表例として角形チップ固定抵抗器に関して説明
する。
DESCRIPTION OF THE PREFERRED EMBODIMENTS Hereinafter, a rectangular chip-shaped electronic component of the present invention will be described in detail with reference to embodiments. However, in the following embodiments, a square chip fixed resistor will be described as a typical example of a chip component.

【0012】図1はその一実施例の斜視(メッキ膜1
7,17′及びメッキ膜18,18′を除く)を、図2
は図1の線A−Aにおける断面を示す。アルミナ基板1
上には順に抵抗体膜2、抵抗体膜2を覆う内部保護膜
3、更に内部保護膜3を覆う別の内部保護膜4が設けら
れている。なお、抵抗体膜2のほぼ中央にはレーザトリ
ミング溝5が形成されている。又、基板1の対向両側に
は各々、例えばAg/Pd系導電性ペーストとAg系導
電性ペーストとからなる上面電極10,10′、及び当
該電極に電気的に接続したAg系導電性ペーストなどか
らなる側面電極11,11′が付設され、側面電極1
1,11′は基板1の下面において下面電極12,1
2′を形成している。側面電極11,11′上には半田
喰れ防止のためにそれぞれNiメッキ膜17,17′
と、Sn/Pbメッキ膜18,18′が施されている。
なお、ここでは、端子電極は、上面電極10,10′、
側面電極11,11′、Niメッキ膜17,17′、及
びSn/Pbメッキ膜18,18′で構成される。
FIG. 1 is a perspective view of one embodiment (a plating film 1).
7, 17 'and the plating films 18, 18')
Shows a cross section taken along line AA in FIG. Alumina substrate 1
A resistor film 2, an internal protection film 3 covering the resistance film 2, and another internal protection film 4 covering the internal protection film 3 are provided in this order. Note that a laser trimming groove 5 is formed substantially at the center of the resistor film 2. On the opposite sides of the substrate 1, for example, upper electrodes 10, 10 'made of an Ag / Pd-based conductive paste and an Ag-based conductive paste, and an Ag-based conductive paste electrically connected to the electrodes, for example. Side electrodes 11, 11 'made of
1, 11 'are lower surface electrodes 12, 1 on the lower surface of the substrate 1.
2 '. Ni plating films 17 and 17 'are formed on the side electrodes 11 and 11' to prevent solder erosion.
And Sn / Pb plating films 18 and 18 '.
Here, the terminal electrodes are the upper electrodes 10, 10 ',
It is composed of side electrodes 11, 11 ', Ni plating films 17, 17', and Sn / Pb plating films 18, 18 '.

【0013】更に、本発明の特徴である外部保護膜6が
内部保護膜4と上面電極10,10′の殆どを被覆して
いる。即ち、本実施例では、上面電極10,10′の
板1の端子電極形成側面を結ぶ方向における保護膜6の
長さlは、該方向における抵抗器(基板1)上面の長さ
Lに等しく、上面電極10,10′は保護膜6によって
完全に覆われた態様のものである(図1参照)。なお、
保護膜6の幅(基板1の端子電極非形成側面を結ぶ方向
における長さ)は従来と同様に抵抗器上面の幅(同じく
基板1の端子電極非形成側面を結ぶ方向における長さ)
よりも狭小であり、前記横断方向における端縁部から内
部保護膜4が現出している。
Further, the outer protective film 6, which is a feature of the present invention, covers most of the inner protective film 4 and the upper electrodes 10, 10 '. That is, in the present embodiment, the base electrodes 10 and 10 '
The length 1 of the protective film 6 in the direction connecting the terminal electrode forming side surfaces of the plate 1 is equal to the length L of the upper surface of the resistor (substrate 1) in the direction, and the upper electrodes 10, 10 'are completely covered by the protective film 6. It is a covered embodiment (see FIG. 1). In addition,
The width of the protective film 6 (the length in the direction connecting the side surfaces on which the terminal electrodes are not formed of the substrate 1 ) is the same as the conventional width of the upper surface of the resistor (also the
(Length in the direction connecting the side surfaces of the substrate 1 where the terminal electrodes are not formed )
And the inner protective film 4 is exposed from the edge in the transverse direction.

【0014】このような抵抗器を、図4に示した如く、
ガラスエポキシ基板70に実装して半田付けした場合、
上面電極10,10′がガラス性外部保護膜6によって
覆われているため、半田が金属性の上面電極上には付着
せず、同じ金属性の側面電極11,11′と下面電極1
2,12′のみが半田付けされ、従来のように上面電極
まで半田が多量に付くようなことがなくなる。この結
果、上面電極10,10′に温度差による「ズレ応力」
が発生するようなことは殆ど無くなり、上面電極の亀裂
や剥離などの発生を回避できる。
Such a resistor is, as shown in FIG.
When mounted on a glass epoxy board 70 and soldered,
Since the upper electrodes 10, 10 'are covered with the glassy outer protective film 6, the solder does not adhere to the metallic upper electrodes, and the same metallic side electrodes 11, 11' and lower electrodes 1
Only 2, 12 'is soldered, so that a large amount of solder does not adhere to the upper surface electrode as in the conventional case. As a result, the "displacement stress" caused by the temperature difference between the upper surface electrodes 10, 10 '.
Is almost eliminated, and the occurrence of cracks or peeling of the upper electrode can be avoided.

【0015】[0015]

【発明の効果】本発明の角形チップ状電子部品は、以上
説明したように構成されているので、上面電極が保護膜
で殆ど覆われることになる結果、上面電極には半田が付
着せず、上面電極に「ズレ応力」は発生し難い。故に、
「ズレ応力」に起因する上面電極の亀裂や剥離、基板の
割れ、これらによって起こる電極の断線不良を防止でき
る。また、その構造により、保護膜を形成した後に端子
電極を形成することになるので(基板分割前に保護膜を
形成するので)、製造工程が簡略になる。
Since the rectangular chip-shaped electronic component of the present invention is configured as described above, the upper electrode is almost covered with the protective film. As a result, no solder adheres to the upper electrode. "Displacement stress" hardly occurs on the upper electrode. Therefore,
It is possible to prevent cracking or peeling of the upper electrode, cracking of the substrate, and disconnection failure of the electrode caused by these, due to "shift stress". In addition, the structure simplifies the manufacturing process because the terminal electrode is formed after forming the protective film (because the protective film is formed before the substrate is divided).

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明のチップ状電子部品の代表例としてのチ
ップ抵抗器を示す斜視図である。
FIG. 1 is a perspective view showing a chip resistor as a typical example of a chip-shaped electronic component of the present invention.

【図2】図1に示す抵抗器の線A−Aにおける断面図で
ある。
FIG. 2 is a cross-sectional view of the resistor shown in FIG. 1 taken along line AA.

【図3】従来の一般的なチップ抵抗器を示す斜視図であ
る。
FIG. 3 is a perspective view showing a conventional general chip resistor.

【図4】図3に示す如き従来の抵抗器を基板上に半田付
けした時の状態を示す断面図である。
FIG. 4 is a sectional view showing a state when the conventional resistor as shown in FIG. 3 is soldered on a substrate.

【図5】従来技術において上面電極に「ズレ応力」が発
生する仕組みを説明するための説明図である。
FIG. 5 is an explanatory diagram for explaining a mechanism in which “displacement stress” occurs in an upper electrode in a conventional technique.

【符号の説明】[Explanation of symbols]

1 アルミナ基板 2 抵抗体膜 3,4 内部保護膜 6 外部保護膜 10,10′ 上面電極 11,11′ 側面電極 12,12′ 下面電極 DESCRIPTION OF SYMBOLS 1 Alumina substrate 2 Resistor film 3, 4 Internal protective film 6 External protective film 10, 10 'Upper surface electrode 11, 11' Side surface electrode 12, 12 'Lower surface electrode

───────────────────────────────────────────────────── フロントページの続き (72)発明者 宮永 悦治 京都市右京区西院溝崎町21番地 ローム 株式会社内 (56)参考文献 実開 平2−8001(JP,U) 実開 平3−10502(JP,U) 実開 平3−10270(JP,U) ──────────────────────────────────────────────────続 き Continued on the front page (72) Inventor Etsuji Miyanaga 21 Ryosaki-cho, Saiin-ku, Ukyo-ku, Kyoto Inside ROHM Co., Ltd. , U) Hikaru 3-10270 (JP, U)

Claims (1)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】基板の対向両側に端子電極を設け、端子電
極のうち基板上面に形成される上面電極及び基板上面上
に保護膜を設けた角形チップ状電子部品において、 前記基板の端子電極形成側面を結ぶ方向における保護膜
の長さ(l)が方向における基板上面の長さ(L)と
等しいと共に、前記保護膜の前記端子電極形成側面側の
側面が前記基板の端子電極形成側面と一致し、且つ前記
基板の端子電極非形成側面を結ぶ方向における保護膜の
長さが方向における基板上面の長さと略等しいことを
特徴とする角形チップ状電子部品。
1. A rectangular chip-shaped electronic component having terminal electrodes provided on opposite sides of a substrate and having an upper electrode formed on the upper surface of the substrate and a protective film formed on the upper surface of the substrate, wherein the terminal electrodes of the substrate are formed. The length (l) of the protective film in the direction connecting the side surfaces is equal to the length (L) of the upper surface of the substrate in the same direction, and the length of the protective film on the side where the terminal electrode is formed is located.
The side surface coincides with the terminal electrode forming side surface of the substrate , and
A rectangular chip-shaped electronic component, wherein the length of the protective film in a direction connecting the side surfaces on which the terminal electrodes are not formed of the substrate is substantially equal to the length of the upper surface of the substrate in the same direction.
JP03021728A 1991-01-21 1991-01-21 Square chip electronic components Expired - Fee Related JP3127437B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP03021728A JP3127437B2 (en) 1991-01-21 1991-01-21 Square chip electronic components

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP03021728A JP3127437B2 (en) 1991-01-21 1991-01-21 Square chip electronic components

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP9299983A Division JP2963420B2 (en) 1997-10-31 1997-10-31 Square chip electronic components

Publications (2)

Publication Number Publication Date
JPH04237101A JPH04237101A (en) 1992-08-25
JP3127437B2 true JP3127437B2 (en) 2001-01-22

Family

ID=12063138

Family Applications (1)

Application Number Title Priority Date Filing Date
JP03021728A Expired - Fee Related JP3127437B2 (en) 1991-01-21 1991-01-21 Square chip electronic components

Country Status (1)

Country Link
JP (1) JP3127437B2 (en)

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH028001U (en) * 1988-06-24 1990-01-18

Also Published As

Publication number Publication date
JPH04237101A (en) 1992-08-25

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