JP3113951B2 - GaAs FET protection power supply circuit - Google Patents

GaAs FET protection power supply circuit

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Publication number
JP3113951B2
JP3113951B2 JP04168105A JP16810592A JP3113951B2 JP 3113951 B2 JP3113951 B2 JP 3113951B2 JP 04168105 A JP04168105 A JP 04168105A JP 16810592 A JP16810592 A JP 16810592A JP 3113951 B2 JP3113951 B2 JP 3113951B2
Authority
JP
Japan
Prior art keywords
voltage
power supply
circuit
gaas fet
output
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP04168105A
Other languages
Japanese (ja)
Other versions
JPH0613862A (en
Inventor
茂 村田
満夫 岩竹
Original Assignee
日本電気エンジニアリング株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 日本電気エンジニアリング株式会社 filed Critical 日本電気エンジニアリング株式会社
Priority to JP04168105A priority Critical patent/JP3113951B2/en
Publication of JPH0613862A publication Critical patent/JPH0613862A/en
Application granted granted Critical
Publication of JP3113951B2 publication Critical patent/JP3113951B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【産業上の利用分野】本発明はGaAsFET(ガリュ
ウムひ素電界効果トランジスタ)保護電源回路に関し,
特に超高周波を利用する無線通信機器における超高周波
GaAsFETを過電流による破壊から保護する機能を
付与したGaAsFET保護電源回路に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a GaAs FET (Gallium Arsenide Field Effect Transistor) protection power supply circuit,
In particular, the present invention relates to a GaAsFET protection power supply circuit provided with a function of protecting an ultrahigh-frequency GaAs FET in a wireless communication device using an ultra-high frequency from being destroyed by an overcurrent.

【0002】[0002]

【従来の技術】超高周波GaAsFETを使用する場
合,ゲート,ソース,ドレイン各電極のバイアス印加順
序を誤まると,これを破壊することがある。
2. Description of the Related Art When an ultra-high frequency GaAs FET is used, if the bias application order of the gate, source, and drain electrodes is incorrect, it may be destroyed.

【0003】バイアスは,たとえば,一般的なドレイン
接地型で使用する場合,電源投入は,最初にゲートに制
御電圧を印加し,次にドレインに印加しなくてはならな
い。
For example, when a bias is used with a common grounded drain type, when power is turned on, a control voltage must first be applied to the gate, and then applied to the drain.

【0004】また,この場合の電源断はまずドレインの
電圧をオフとし,次にゲートの電圧をオフとする順序で
行なわなければ,ドレインに過大電流が流れ,GaAs
FETを破壊するおそれがある。
In this case, if the power supply is not turned off in the order of turning off the drain voltage and then turning off the gate voltage, an excessive current flows through the drain and GaAs
There is a possibility that the FET may be destroyed.

【0005】従来は,ゲート,ドレインのバイアス供給
回路に時定数を持たせ,電源投入時にはドレイン電圧立
上りを遅らせる回路が使用されている。
Conventionally, a circuit has been used in which a gate and drain bias supply circuit has a time constant to delay the rise of the drain voltage when power is turned on.

【0006】[0006]

【発明が解決しようとする課題】超高周波GaAsFE
T用の従来の電源回路では,ドレインまたはソースバイ
アス電源に時定数を持たせ,ドレインまたはソースバイ
アス電圧の立上りをゲートバイアス電圧の立上りよりも
遅らせているため,電源断時,このドレインまたはソー
スバイアス回路に存在する時定数の影響で,ゲートバイ
アス電圧が0Vになったにもかかわらずドレインまたは
ソースバイアス電圧が0Vになりきれず,ドレインまた
はソース電流が流れ,最悪の場合GaAsFETを破壊
するという問題点があった。
SUMMARY OF THE INVENTION Ultra-high frequency GaAsFE
In the conventional power supply circuit for T, the drain or source bias power supply has a time constant and the rise of the drain or source bias voltage is delayed more than the rise of the gate bias voltage. Due to the influence of the time constant existing in the circuit, the drain or source bias voltage cannot be completely reduced to 0 V even though the gate bias voltage is 0 V, and the drain or source current flows, and in the worst case, the GaAs FET is destroyed. There was a point.

【0007】本発明の目的は上述した問題を解決し,電
源断時のドレインバイアス電圧とゲートバイアス電圧の
立下りの順序が,必ずドレイン電圧断の次にゲート電圧
断とさせ,ドレイン電圧のみが印加された状態で過大電
流が流れてGaAsFETが破壊されることを抑止した
GaAsFET保護電源回路を提供することにある。
[0007] An object of the present invention is to solve the above-mentioned problem, and the order of the fall of the drain bias voltage and the gate bias voltage when the power is turned off is always such that the drain voltage is turned off and then the gate voltage is turned off. An object of the present invention is to provide a GaAsFET protection power supply circuit in which a GaAsFET is prevented from being destroyed due to an excessive current flowing in the applied state.

【0008】[0008]

【課題を解決するための手段】本発明のGaAsFET
保護電源回路は,正負いずれか1系統の直流電源を入力
して2分岐し,一方を積分回路を介してGaAsFET
のゲートバイアス用電圧として出力し,他方を前記積分
回路の出力によって制御されるトランジスタスイッチ回
路を介して前記GaAsFETのドレインもしくはソー
スバイアス用電圧として出力し,かつ前記直流電源の投
入時には前記ゲートバイアス用電圧を前記ドレインもし
くはソースバイアス用電圧よりも早く立ち上げ,また前
記直流電源の断時には前記ドレインもしくはソースバイ
アス用電圧を前記ゲートバイアス用電圧よりも早く立ち
下げるようにして前記GaAsFETを保護する構成を
有する。
SUMMARY OF THE INVENTION The GaAs FET of the present invention
The protection power supply circuit is divided into two branches by inputting either one of the positive and negative DC power supplies, one of which is connected to the GaAs FET through the integration circuit.
And the other is output as a drain or source bias voltage of the GaAs FET through a transistor switch circuit controlled by the output of the integration circuit. When the DC power is turned on, the gate bias voltage is output. A configuration is provided in which the GaAs FET is protected by raising the voltage earlier than the voltage for the drain or source bias and dropping the voltage for the drain or source bias earlier than the voltage for the gate bias when the DC power supply is cut off. Have.

【0009】また本発明のGaAsFET保護電源回路
は,正負2系統の直流電源を入力として構成を有する。
The GaAs FET protection power supply circuit of the present invention has a configuration in which two positive and negative DC power supplies are input.

【0010】[0010]

【実施例】次に,本発明について図面を参照して説明す
る。
Next, the present invention will be described with reference to the drawings.

【0011】図1は,本発明の第1の実施例の回路図
(A)および出力電圧特性図(B)である。
FIG. 1 is a circuit diagram (A) and an output voltage characteristic diagram (B) of a first embodiment of the present invention.

【0012】図1は,GaAsFETをドレイン接地方
式で使用した場合で,バイアス電圧としてソースにマイ
ナス,ゲートにもマイナスの電位を印加する場合を例と
している。
FIG. 1 shows a case where a GaAs FET is used in a grounded drain system and a case where a negative potential is applied to a source and a negative potential is also applied to a gate as a bias voltage.

【0013】図1の(B)を参照して説明するに,マイ
ナス電源−Vccは2分岐され,一方はR1,C1より構
成される積分回路によって適当な時定数を持たせること
により,ゲートバイアス用電圧VG 特性1を得,a点の
電圧に達した時に他方のソース系統に構成されたトラン
ジスタスイッチQをオンとし,ソースバイアス用電圧V
s を発生する。
Referring to FIG. 1B, the minus power source -Vcc is divided into two, one of which is provided with an appropriate time constant by an integrating circuit composed of R1 and C1 so that the gate bias is reduced. Voltage VG characteristic 1 is obtained, and when the voltage at the point a is reached, the transistor switch Q formed in the other source system is turned on, and the source bias voltage V
Generate s.

【0014】また,電源断時は,図1(B)のR1,C
1からなる積分回路出力電圧がb点に達した時,トラン
ジスタスイッチQを断とし,ソースバイアス用電圧Vs
は急激に降下して0Vとなる。
When the power is turned off, R1, C in FIG.
When the output voltage of the integrating circuit consisting of 1 reaches the point b, the transistor switch Q is turned off and the source bias voltage Vs
Rapidly drops to 0V.

【0015】一方,ゲートバイアス用電圧VG は,R
1,C1による時定数でゆるやかに電圧が降下し,ソー
スバイアス用電圧Vs との間に時間差を生ずる。
On the other hand, the gate bias voltage VG is R
1, the voltage gradually decreases with the time constant of C1, and a time difference is generated between the voltage and the source bias voltage Vs.

【0016】この時間差は,積分回路のR1,C1およ
びトランジスタスイッチQのバイアス用抵抗R3および
R4を選択することにより,所望の時間を設定すること
ができる。
This time difference can be set to a desired time by selecting R1 and C1 of the integrating circuit and the bias resistors R3 and R4 of the transistor switch Q.

【0017】図2は本発明の第2の実施例の回路図
(A)および出力電圧特性図(B)である。
FIG. 2 is a circuit diagram (A) and an output voltage characteristic diagram (B) of a second embodiment of the present invention.

【0018】図2(A)に示す回路は,ソース接地方式
で使用できGaAsFETの保護電源回路であり,本実
施例の場合,ドレインバイアス用電圧VD の制御は前述
した図1と同じスイッチングトランジスタQで行なう。
The circuit shown in FIG. 2A is a GaAs FET protection power supply circuit which can be used in a source grounded system. In this embodiment, the control of the drain bias voltage VD is performed by the same switching transistor Q as in FIG. Perform in.

【0019】図2に示すc点の電圧は,ツェナーダイオ
ードCRのツェナー電圧を適宜選択することにより決定
される。
The voltage at point c shown in FIG. 2 is determined by appropriately selecting the Zener voltage of the Zener diode CR.

【0020】抵抗R9,コンデンサC3からなる積分回
路は,図1のR1,C1と同様に所定の時定数を提供す
る。また抵抗R5は電流制限用,抵抗R6はスイッチン
グトランジスタQのバイアス点設定用,抵抗R7はツェ
ナーダイオードCRのバイアス点設定用で,さらにコン
デンサC2はドレインバイアス用VD の立上り時間を調
節し,抵抗R8はドレイン電圧VD の立下りを早くする
目的で利用される。
An integrating circuit composed of a resistor R9 and a capacitor C3 provides a predetermined time constant as in the case of R1 and C1 in FIG. A resistor R5 is used for current limiting, a resistor R6 is used for setting a bias point of the switching transistor Q, a resistor R7 is used for setting a bias point of the Zener diode CR, and a capacitor C2 adjusts a rise time of a drain bias VD. Is used for the purpose of accelerating the fall of the drain voltage VD.

【0021】図2(B)に示す如く,ゲートバイアス用
電圧VG はゆるやかに電圧が降下し,一方ドレインバイ
アス用電圧VD は急激に電圧降下して,両電圧間には所
望の時間差が確保できるものとなっている。
As shown in FIG. 2 (B), the gate bias voltage VG drops gradually, while the drain bias voltage VD drops sharply, and a desired time difference can be secured between the two voltages. It has become something.

【0022】[0022]

【発明の効果】以上説明したように本発明は,超高周波
GaAsFETを動作させる場合,ある一定のゲートバ
イアス用電圧に達した時にソースまたはドレインバイア
ス用電圧が立ち上がるように制御し,かつゲートバイア
ス用電圧がGaAsFETのゲートに印加されてない限
りドレイン電圧およびソースバイアス用電圧が印加され
ないように制御することにより,ドレインバイアス用電
圧およびソースバイアス用電圧のみの印加による過大電
流を抑止し,GaAsFETの破壊を防止することがで
きる効果がある。
As described above, according to the present invention, when an ultra-high-frequency GaAs FET is operated, the source or drain bias voltage is controlled to rise when a certain gate bias voltage is reached, and the gate bias voltage is controlled. By controlling the drain voltage and the source bias voltage not to be applied unless the voltage is applied to the gate of the GaAs FET, an excessive current due to the application of only the drain bias voltage and the source bias voltage is suppressed, and the GaAs FET is destroyed. There is an effect that can be prevented.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の第1の実施例の回路図(A)および出
力電圧特性図(B)である。
FIG. 1 is a circuit diagram (A) and an output voltage characteristic diagram (B) of a first embodiment of the present invention.

【図2】本発明の第2の実施例の回路図(A)および出
力電圧特性図(B)である。
FIG. 2 is a circuit diagram (A) and an output voltage characteristic diagram (B) of a second embodiment of the present invention.

【符号の説明】[Explanation of symbols]

1 ゲートバイアス用電圧VG 特性 2 ソースバイアス用電圧Vs 特性 3 ドレインバイアス用電圧VD 特性 4 ゲートバイアス用電圧VG 特性 C1〜C3 コンデンサ CR ツェナーダイオード Q スイッチングトランジスタ R1〜R9 抵抗 1 Gate bias voltage VG characteristic 2 Source bias voltage Vs characteristic 3 Drain bias voltage VD characteristic 4 Gate bias voltage VG characteristic C1 to C3 Capacitor CR Zener diode Q Switching transistor R1 to R9 Resistance

───────────────────────────────────────────────────── フロントページの続き (58)調査した分野(Int.Cl.7,DB名) H03K 17/00 - 17/70 ──────────────────────────────────────────────────続 き Continued on front page (58) Field surveyed (Int.Cl. 7 , DB name) H03K 17/00-17/70

Claims (2)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】 GaAsFET保護電源回路において、
正負いずれか1つの直流電源と、前記直流電源の出力電
圧を積分し前記GaAsFETのゲートバイアス用電圧
を生成する積分回路と、前記積分回路の出力電圧が一致
以上の時にonし前記直流電源の出力電圧を前記GaA
sFETのソースバイアスに出力し、前記積分回路の出
力電圧が一定値以下の時にoffし前記GaAsFET
のソースバイアスへの出力電圧の供給を阻止するトラン
ジスタスイッチ回路とからなることを特徴とするGaA
sFET保護電源回路。
In a GaAs FET protection power supply circuit,
A positive or negative DC power supply, an integration circuit that integrates an output voltage of the DC power supply to generate a gate bias voltage of the GaAs FET, and turns on when an output voltage of the integration circuit is equal to or higher than an output voltage of the DC power supply. The voltage is adjusted to the GaAs
output to the source bias of the sFET, and turn off when the output voltage of the integration circuit is equal to or less than a fixed value, and the GaAs FET is turned off.
A transistor switch circuit for preventing supply of an output voltage to a source bias of the GaAs.
sFET protection power supply circuit.
【請求項2】 GaAsFET保護電源回路において、
正負からなる2つの直流電源と、前記負の直流電源の出
力電圧を積分しGaAsFETのゲートバイアス用電圧
を生成する積分回路と、前記負の直流電圧の立ち上がり
から一定時間経過後に当該負の直流電圧を出力する第1
の遅延回路と、前記負の直流電圧の立ち下がりから一定
時間経過後に当該負の直流電圧の出力を阻止する第2の
遅延回路と、前記第1の遅延回路の出力によってonさ
れ前記直流電源の出力電圧を前記GaAsFETのソー
スバイアスに出力し、第2の遅延回路の出力によってo
ffされ前記GaAsFETのソースバイアスへの出力
電圧の供給を阻止するトランジスタスイッチ回路とから
なることを特徴とするGaAsFET保護電源回路。
2. In a GaAs FET protection power supply circuit,
Two positive and negative DC power supplies, an integration circuit for integrating the output voltage of the negative DC power supply to generate a gate bias voltage for the GaAs FET, and the negative DC voltage after a lapse of a predetermined time from the rise of the negative DC voltage Output the first
A delay circuit, a second delay circuit that blocks the output of the negative DC voltage after a lapse of a predetermined time from the fall of the negative DC voltage, and a second power supply of the DC power supply that is turned on by the output of the first delay circuit. The output voltage is output to the source bias of the GaAs FET, and the output of the second delay circuit
a GaAs FET protection power supply circuit, comprising: a transistor switch circuit for blocking supply of an output voltage to the source bias of the GaAs FET.
JP04168105A 1992-06-26 1992-06-26 GaAs FET protection power supply circuit Expired - Fee Related JP3113951B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP04168105A JP3113951B2 (en) 1992-06-26 1992-06-26 GaAs FET protection power supply circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP04168105A JP3113951B2 (en) 1992-06-26 1992-06-26 GaAs FET protection power supply circuit

Publications (2)

Publication Number Publication Date
JPH0613862A JPH0613862A (en) 1994-01-21
JP3113951B2 true JP3113951B2 (en) 2000-12-04

Family

ID=15861941

Family Applications (1)

Application Number Title Priority Date Filing Date
JP04168105A Expired - Fee Related JP3113951B2 (en) 1992-06-26 1992-06-26 GaAs FET protection power supply circuit

Country Status (1)

Country Link
JP (1) JP3113951B2 (en)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4843927B2 (en) 2004-10-13 2011-12-21 ソニー株式会社 High frequency integrated circuit
JP5219736B2 (en) * 2008-10-24 2013-06-26 新日本無線株式会社 High frequency circuit switching method and high frequency circuit
JP5877172B2 (en) * 2012-03-30 2016-03-02 古河電気工業株式会社 Sequence device
CN104298290B (en) * 2014-08-12 2016-12-07 上海航天电子通讯设备研究所 Aerospace GaAsMMIC device power-up device

Also Published As

Publication number Publication date
JPH0613862A (en) 1994-01-21

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