JP3088031B2 - Optical pulse tester - Google Patents

Optical pulse tester

Info

Publication number
JP3088031B2
JP3088031B2 JP03196491A JP19649191A JP3088031B2 JP 3088031 B2 JP3088031 B2 JP 3088031B2 JP 03196491 A JP03196491 A JP 03196491A JP 19649191 A JP19649191 A JP 19649191A JP 3088031 B2 JP3088031 B2 JP 3088031B2
Authority
JP
Japan
Prior art keywords
light
signal light
optical
pulse
backscattered
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP03196491A
Other languages
Japanese (ja)
Other versions
JPH0540075A (en
Inventor
眞一 古川
史 泉田
弥平 小山田
泉 三川
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Telegraph and Telephone Corp
Original Assignee
Nippon Telegraph and Telephone Corp
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Filing date
Publication date
Application filed by Nippon Telegraph and Telephone Corp filed Critical Nippon Telegraph and Telephone Corp
Priority to JP03196491A priority Critical patent/JP3088031B2/en
Publication of JPH0540075A publication Critical patent/JPH0540075A/en
Application granted granted Critical
Publication of JP3088031B2 publication Critical patent/JP3088031B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Classifications

    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02EREDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E60/00Enabling technologies; Technologies with a potential or indirect contribution to GHG emissions mitigation
    • Y02E60/10Energy storage using batteries

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  • Testing Of Optical Devices Or Fibers (AREA)

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【産業上の利用分野】本発明は光パルス試験器に関し、
特に、光信号の伝送媒体である光ファイバ及び光ファイ
バ線路の光損失等の特性を試験する光パルス試験器に関
するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an optical pulse tester,
In particular, the present invention relates to an optical pulse tester for testing characteristics such as optical loss of an optical fiber and an optical fiber line as a transmission medium of an optical signal.

【0002】[0002]

【従来の技術】従来、信頼性が高く、経済的な光通信シ
ステムを実現するためには、高信頼で経済的な光ファイ
バ線路を構築することが重要であり、そのために光ファ
イバ線路の特性を、高信頼な試験器で短時間で遠距離ま
で測定、試験する必要がある。光パルス試験器(以下、
OTDR (Optical TimeDomain Reflectometer)と称す
る)は、被試験光ファイバに光パルスを送出し、光ファ
イバからの反射光や後方散乱光を受信し、これを解析し
て光損失等の特性をCRT等に表示する装置であり、光
ファイバの片端からの光の入出力により試験できること
から非常に有用な道具とされている。そのため、従来か
らOTDRの測定可能距離(これをダイナミックレンジ
と言う)を拡大する研究開発がなされてきた。
2. Description of the Related Art Conventionally, in order to realize a highly reliable and economical optical communication system, it is important to construct a highly reliable and economical optical fiber line. Must be measured and tested over a short distance with a highly reliable tester. Optical pulse tester (hereinafter referred to as
An OTDR (Optical Time Domain Reflectometer) transmits an optical pulse to an optical fiber under test, receives reflected light and backscattered light from the optical fiber, analyzes the light and analyzes characteristics such as optical loss to a CRT or the like. This is a very useful tool because it is a display device and can be tested by inputting and outputting light from one end of an optical fiber. For this reason, research and development for increasing the OTDR measurable distance (this is called a dynamic range) has been conventionally performed.

【0003】ダイナミックレンジを拡大するには、主に
被試験光ファイバへの送出パルス強度を大きくすること
と、後方散乱光等の受信感度を向上する方法が取られ
る。受信感度を向上する一方法として、ヘテロダインも
しくはホモダイン受信と言ったコヒ−レント検波技術を
適用することが検討されている。
In order to expand the dynamic range, there are mainly employed a method of increasing the intensity of a pulse transmitted to the optical fiber under test and a method of improving the receiving sensitivity of backscattered light and the like. As one method for improving reception sensitivity, application of a coherent detection technique called heterodyne or homodyne reception is being studied.

【0004】コヒ−レント検波技術を用いる従来のOT
DRについて図2をもとに説明する。図2では試験信号
光とロ−カル信号光の発生を同一光源により行ってい
る。図において、1は狭線幅スペクトルの光を発生する
光源部、2は光源部1からの出射光を試験信号光aとロ
−カル信号光bとに分岐する第1の合分岐器、3は分岐
した試験信号光aを一定の周期でパルス化すると共に、
光周波数変調する第1の音響光学スイッチ(以下、AO
スイッチと称する)、4はパルス化した試験信号光aを
被試験光ファイバ5に入射すると共に被試験光ファイバ
5からの反射光及び後方散乱光cを試験器に導く第2の
合分岐器もしくは第2のAOスイッチである。
Conventional OT using coherent detection technology
DR will be described with reference to FIG. In FIG. 2, the test signal light and the local signal light are generated by the same light source. In the drawing, reference numeral 1 denotes a light source unit for generating light having a narrow line width spectrum, and 2 denotes a first multiplexer / demultiplexer for splitting the light emitted from the light source unit 1 into a test signal light a and a local signal light b. Pulsates the branched test signal light a with a constant period,
A first acousto-optic switch (hereinafter referred to as AO) for optical frequency modulation
4) A second multiplexer / demultiplexer or 4 for inputting the pulsed test signal light a to the optical fiber under test 5 and guiding the reflected light and the backscattered light c from the optical fiber 5 to be tested to the tester. This is the second AO switch.

【0005】また、6は試験器内に導かれた反射光及び
後方散乱光cと前記ロ−カル信号光bとを合波する第3
の合分岐器、7は合波された反射光及び後方散乱光cと
ロ−カル信号光bとのビ−ト信号光dを光−電気変換す
る受光器、8は受光器7から出力された電気信号をA/
D変換さらに自乗変換する信号変換器、9は自乗変換し
た一定周期の信号をSN比改善のために加算する加算処
理器、10は加算処理した信号を対数変換する対数変換
器、11は反射光及び後方散乱光cのそれぞれの強度の
長手方向分布を表示するCRT、12は試験信号光aを
一定周期でパルス化したり加算処理するためのタイミン
グ発生器である。8〜11によって電気信号処理系13
が構成されている。
Reference numeral 6 denotes a third signal for multiplexing the reflected light and the backscattered light c guided into the tester with the local signal light b.
7 is a photodetector for performing optical-to-electric conversion of the combined reflected light and backscattered light c and the bit signal light d of the local signal light b, and 8 is output from the photodetector 7. A /
A signal converter for D-conversion and further square conversion, 9 is an addition processor for adding the square-converted signal of a fixed period for improving the SN ratio, 10 is a logarithmic converter for logarithmically converting the added signal, and 11 is reflected light. A CRT 12 for displaying the longitudinal distribution of the intensities of the backscattered light c and the backscattered light c is a timing generator for pulsing the test signal light a at a constant period or performing an addition process. 8 to 11, the electric signal processing system 13
Is configured.

【0006】この様なコヒ−レント検波技術を用いるO
TDRは、微弱な反射光及び後方散乱光cに対して比較
的大きな強度のロ−カル信号光bを合波したビ−ト信号
光dを受信検波するものである。ビート信号光dの強度
Adは、反射光及び後方散乱光cの強度をAc、ローカ
ル信号光bの強度をAbとすると、これらの積の平方根
(Ac・Ab)1/2 に比例する。従って、ローカル信号
光強度Abを比較的大きくすることによって、より微弱
な反射光及び後方散乱光cまで受信できることになり、
OTDRとしてのダイナミックレンジを拡大することが
できる。
An O using such a coherent detection technique
The TDR receives and detects a beat signal light d obtained by combining a local signal light b having a relatively large intensity with a weak reflected light and a backscattered light c. The intensity Ad of the beat signal light d is proportional to the square root (Ac · Ab) 1/2 of the product of the reflected light and the backscattered light c, where Ac is the intensity and the intensity of the local signal light b is Ab. Therefore, by making the local signal light intensity Ab relatively large, it is possible to receive even weaker reflected light and backscattered light c,
The dynamic range as the OTDR can be expanded.

【0007】また、コヒーレント検波OTDRにおいて
コヒーレント検波を行なうには、数KHzといった狭線
幅スペクトルの光を発生する光源部1が不可欠であり、
これを実現するために分布帰還型半導体レーザ(以下、
DFBーLDと称する)14等の出力端に長さ1km程
度のシングルモ−ド光ファイバ15を融着接続し、光フ
ァイバ15からの後方散乱光を利用して狭線幅化するこ
となどが行なわれている。
Further, in order to perform coherent detection in the coherent detection OTDR, the light source unit 1 for generating light having a narrow line width spectrum of several KHz is indispensable.
To realize this, a distributed feedback semiconductor laser (hereinafter, referred to as
A single-mode optical fiber 15 having a length of about 1 km is fusion-spliced to an output end of a DFB-LD 14 or the like, and a line width is reduced by using backscattered light from the optical fiber 15. Have been.

【0008】[0008]

【発明が解決しようとする課題】しかしながら、前述し
た従来の光パルス試験器(OTDR)では、コヒーレン
ト検波技術を用いることによってダイナミックレンジは
拡大できるが、狭線幅スペクトルの光源部1を用いるた
めに、後方散乱波形上にフェージングノイズと称される
ノイズを生じる欠点がある。
However, in the above-mentioned conventional optical pulse tester (OTDR), the dynamic range can be expanded by using the coherent detection technique. There is a disadvantage that noise called fading noise is generated on the backscattered waveform.

【0009】この原因は、反射光及び後方散乱光cの偏
波依存性が被試験光ファイバ5の長手方向で違うこと
と、光源部1のコヒーレンシの良さに起因してファイバ
中の光パルス幅相当の微小区間からの散乱光が干渉する
ことにある。
The reason for this is that the polarization dependence of the reflected light and the backscattered light c differs in the longitudinal direction of the optical fiber under test 5 and the light pulse width in the fiber due to the good coherency of the light source 1. Scattered light from a considerable minute section interferes.

【0010】図3に従来のコヒーレント検波OTDRで
観測した後方散乱波形例を示す。図3は、10km長の
被試験光ファイバ5に、波長1.55μm、パルス幅1
μs、パルス周期1ms、ピーク強度ー10dBmの光
パルスを入射したときの後方散乱波形である。
FIG. 3 shows an example of a backscattered waveform observed by the conventional coherent detection OTDR. FIG. 3 shows that an optical fiber 5 under test having a length of 10 km has a wavelength of 1.55 μm and a pulse width of 1.
This is a backscattered waveform when an optical pulse having μs, a pulse period of 1 ms, and a peak intensity of −10 dBm is incident.

【0011】後方散乱波形のSN比改善のための加算回
数は3.9×105 回行なっている。波形は、フェージ
ングノイズがなければ、ほぼ一直線になるべきである
が、フェージングノイズのために±0.2dB程度の揺
らぎが見られる。このようなノイズは、被試験光ファイ
バ5の途中に接続箇所や損失の変化する箇所があって、
本来、後方散乱波形上に段差が見られるべき場合に、段
差を判別できなくする恐れがある。本来の段差が0.1
dB程度であれば、段差は全く判別できない結果とな
る。従って、コヒーレント検波OTDR波形上のフェー
ジングノイズは、高信頼な光線路を構築する場合の道具
として使う上で好ましくない。
The number of additions for improving the SN ratio of the backscattered waveform is 3.9 × 10 5 times. If there is no fading noise, the waveform should be substantially straight, but a fluctuation of about ± 0.2 dB is observed due to the fading noise. Such noise is caused by a connection point or a point where loss changes in the middle of the optical fiber under test 5.
Originally, when a step should be seen on the backscattered waveform, the step may not be discriminated. The original step is 0.1
If it is on the order of dB, the result is that no level difference can be determined. Therefore, fading noise on the coherent detection OTDR waveform is not preferable when used as a tool when constructing a highly reliable optical line.

【0012】本発明の目的は上記の問題点に鑑み、コヒ
ーレント検波方式を用いる光パルス試験器(OTDR)
において、後方散乱波形上のフェージングノイズが小さ
い光パルス試験器を提供することにある。
An object of the present invention is to provide an optical pulse tester (OTDR) using a coherent detection method.
It is an object of the present invention to provide an optical pulse tester in which fading noise on a backscattered waveform is small.

【0013】[0013]

【課題を解決するための手段】本発明は上記の目的を達
成するために、試験信号光及びロ−カル信号光の信号光
発生手段と、前記試験信号光をパルス化して所定周期ご
とに被試験光ファイバに繰り返し送出する光パルス生成
手段と、前記被試験光ファイバから繰り返し戻ってくる
反射光及び後方散乱光を受光し、前記ロ−カル信号光と
合波してビ−ト信号光を生成する光合波手段と、該ビ−
ト信号光を電気信号に変換する光電気変換手段と、該電
気信号を加算処理する加算処理手段と、該加算処理の結
果に基づいて前記反射光及び後方散乱光の波形を表示す
る表示手段とを備えた光パルス試験器において、前記試
験信号光及びロ−カル信号光の光周波数を、前記光パル
スの所定周期毎に変化させる光周波数可変手段と、前記
試験信号光もしくは前記ロ−カル信号光の偏波状態を、
前記光パルスの所定周期毎に変化させる偏波状態制御手
段とを設けた光パルス試験器を提案する。
SUMMARY OF THE INVENTION In order to achieve the above object, the present invention provides a signal light generating means for generating test signal light and local signal light, and pulsating the test signal light so that the test signal light is pulsed at predetermined intervals. An optical pulse generation means for repeatedly sending out to the test optical fiber, and receiving reflected light and backscattered light repeatedly returned from the optical fiber under test, and multiplexing with the local signal light to form a beat signal light. An optical multiplexing means for generating the beam;
Photoelectric conversion means for converting the signal light into an electric signal, addition processing means for adding the electric signal, and display means for displaying the waveforms of the reflected light and the backscattered light based on the result of the addition processing. An optical pulse tester comprising: an optical frequency varying means for changing the optical frequency of the test signal light and the local signal light at predetermined intervals of the optical pulse; and the test signal light or the local signal. The polarization state of light
An optical pulse tester provided with a polarization state control means for changing the optical pulse at every predetermined cycle is proposed.

【0014】[0014]

【作用】本発明によれば、信号光発生手段によって試験
信号光及びロ−カル信号光が発生され、該試験信号光は
光パルス生成手段によってパルス化され所定周期毎に被
試験光ファイバに繰り返し送出される。前記試験信号光
及びロ−カル信号光の光周波数は、光周波数可変手段に
よって前記光パルスの一周期毎或いは複数周期毎に変化
される。さらに、偏波状態制御手段によって、前記試験
信号光もしくは前記ロ−カル信号光の偏波状態が、前記
光パルスの一周期毎或いは複数周期毎に変化される。ま
た、前記被試験光ファイバから繰り返し戻ってくる反射
光及び後方散乱光は、光合波手段によって受光されると
共に前記ロ−カル信号光と合波されてビ−ト信号光とさ
れる。ここで、例えば前記光周波数可変手段によって前
記試験信号光及びロ−カル信号光の光周波数が僅かづつ
変化されると、前記反射光、後方散乱光及び前記ビ−ト
信号光の干渉特性等は前記光パルスの所定周期毎に異な
るものになる。さらに、前記偏波状態制御手段によって
前記試験信光もしくは前記ロ−カル信号光の偏波状態が
僅かずつ変化されると、前記反射光、後方散乱光及びビ
−ト信号光の偏波特性は前記光パルスの所定周期毎に異
なるものになる。これらのビ−ト信号光は光電気変換手
段によって電気信号に変換される。さらに、この干渉特
性及び偏波特性が僅かずつ異なるビ−ト信号は、加算処
理手段によって加算処理されて後方散乱光上の干渉によ
るノイズ及び偏波依存性によるノイズ成分が平均化さ
れ、該加算処理の結果に基づいて、表示手段によって前
記反射光及び後方散乱光の波形が表示される。
According to the present invention, the test signal light and the local signal light are generated by the signal light generating means, and the test signal light is pulsed by the optical pulse generating means and is repeatedly transmitted to the optical fiber under test every predetermined period. Sent out. The optical frequencies of the test signal light and the local signal light are changed by one cycle of the optical pulse or by a plurality of cycles by the optical frequency variable means. Further, the polarization state of the test signal light or the local signal light is changed by one period or plural periods of the optical pulse by the polarization state control means. The reflected light and the backscattered light that are repeatedly returned from the optical fiber under test are received by the optical multiplexing means and multiplexed with the local signal light to form a beat signal light. Here, for example, when the optical frequencies of the test signal light and the local signal light are slightly changed by the optical frequency varying means, the interference characteristics of the reflected light, the backscattered light, and the beat signal light are changed. It will be different for each predetermined period of the light pulse. Further, when the polarization state of the test signal light or the local signal light is changed little by little by the polarization state control means, the polarization characteristics of the reflected light, the backscattered light and the beat signal light are changed. It will be different for each predetermined period of the light pulse. These beat signal lights are converted into electric signals by photoelectric conversion means. Further, the beat signals having slightly different interference characteristics and polarization characteristics are subjected to addition processing by addition processing means to average out noise due to interference on backscattered light and noise components due to polarization dependence, and Based on the result of the addition processing, the display means displays the waveforms of the reflected light and the backscattered light.

【0015】[0015]

【実施例】本発明は、試験信号光及びロ−カル信号光を
発する光源の光周波数、及び試験信号光もしくはロ−カ
ル信号光の偏波状態を、繰り返し送出している光パルス
の少なくとも1パルス毎に僅かに変化させることによっ
て、後方散乱波形上のフェージングノイズを低減しよう
とするものである。但し、光源からの光出力をほぼ一定
に保たなければならない。
DESCRIPTION OF THE PREFERRED EMBODIMENTS The present invention relates to at least one of an optical pulse that repeatedly transmits the optical frequency of a light source that emits test signal light and local signal light, and the polarization state of the test signal light or local signal light. It is intended to reduce fading noise on the backscattered waveform by making a slight change for each pulse. However, the light output from the light source must be kept almost constant.

【0016】光源からの光出力をほぼ一定に保ちながら
光周波数を変える方法としては、DFBーLDの温度を
変える方法が知られている。例えば、ペルチェ素子上に
マウントした1.5μm帯のDFBーLDを用いて、L
D駆動電流を一定にし、LD温度を15℃から28℃の
間で変化させた結果、光出力は±0.5dB以下とほと
んど変動無く、光周波数を±70GHz変化させること
ができた。
As a method of changing the optical frequency while keeping the light output from the light source almost constant, a method of changing the temperature of the DFB-LD is known. For example, using a 1.5 μm band DFB-LD mounted on a Peltier device,
As a result of keeping the D drive current constant and changing the LD temperature between 15 ° C. and 28 ° C., the optical output could be changed by ± 70 GHz with little variation of ± 0.5 dB or less.

【0017】また、多電極を有するDFBーLD等は、
複数の電極に流す電流を制御することによって、光出力
をほぼ一定に保ちながら光周波数を変えることが可能で
ある。例えば、1.5μm帯の2電極DFBーLDを用
いて、それぞれの電極に流す電流を変化させたところ、
光出力は±0.5dB以下とほとんど変動無く、光周波
数を±30GHz変化させることができた。
A DFB-LD having multiple electrodes is
By controlling the current flowing through the plurality of electrodes, it is possible to change the optical frequency while keeping the optical output almost constant. For example, using a two-electrode DFB-LD in the 1.5 μm band and changing the current flowing through each electrode,
The optical output was ± 0.5 dB or less with little change, and the optical frequency could be changed by ± 30 GHz.

【0018】このような光源を使って、被試験光ファイ
バに入射する光パルスの波長即ち光周波数を、少なくと
も1パルス毎に僅かに変化させると共に、試験信号光も
しくはロ−カル信号光の偏波状態を少なくとも1パルス
毎に僅かに変化させる。その結果、被試験光ファイバか
ら戻ってくる後方散乱光、及び後方散乱光とロ−カル信
号光とを合波して得られるビート信号光は、少なくとも
1パルス毎に僅かずつ干渉特性及び偏波特性が異なる。
この僅かずつ異なるビート信号光を検出して電気信号処
理系で加算処理すると、被試験光ファイバからの後方散
乱光上の干渉によるノイズ及び偏波依存性によるノイズ
成分が平均化されるので、後方散乱波形上のフェージン
グノイズを低減できる。
Using such a light source, the wavelength of an optical pulse incident on the optical fiber under test, that is, the optical frequency is slightly changed at least for each pulse, and the polarization of the test signal light or the local signal light is changed. The state is changed slightly at least every one pulse. As a result, the backscattered light returning from the optical fiber under test and the beat signal light obtained by multiplexing the backscattered light and the local signal light have an interference characteristic and a polarization slightly at least every one pulse. Different characteristics.
If this slightly different beat signal light is detected and added by the electric signal processing system, noise due to interference on the backscattered light from the optical fiber under test and noise components due to polarization dependence are averaged. Fading noise on the scattering waveform can be reduced.

【0019】以下、図面に基づいて本発明の実施例を説
明する。図1は本発明の第1の実施例を示す構成図であ
る。図において、前述した従来例と同一構成部分は同一
符号をもって表し、その説明を省略する。21は温度制
御可能なDFBーLD等の半導体レ−ザ、22はペルチ
ェ素子等により構成され、半導体レ−ザ21の温度を制
御する温度制御部であり、これらは狭線幅化用シングル
モード光ファイバ15と合わせて光周波数可変な光源部
23をなす。24は偏波状態制御器で、例えば(1/
4)波長板と(1/2)波長板の2個の位相板が直列接
続された回転位相板方式のもの、或いは2つのファイバ
型ファラデ−回転子がファイバコイルを介して直列接続
されたファラデ−回転子方式のもの等が用いられる。2
5はCPU等からなる主制御部で、温度制御部22、偏
波状態制御器24及びタイミング発生器12の動作を制
御する。光源部23は、従来例における光源部1に代え
て用いられる。また、偏波状態制御器24は、AOスイ
ッチ3と合分岐器4との間に介在される。
An embodiment of the present invention will be described below with reference to the drawings. FIG. 1 is a configuration diagram showing a first embodiment of the present invention. In the figure, the same components as those of the above-described conventional example are denoted by the same reference numerals, and description thereof will be omitted. Reference numeral 21 denotes a semiconductor laser such as a DFB-LD capable of controlling the temperature, and 22 denotes a temperature control unit which is constituted by a Peltier element or the like and controls the temperature of the semiconductor laser 21. A light source unit 23 whose optical frequency is variable together with the optical fiber 15 is formed. Reference numeral 24 denotes a polarization state controller, for example, (1 /
4) A rotary phase plate system in which two phase plates, a wave plate and a (1/2) wave plate, are connected in series, or a Faraday in which two fiber type Faraday rotators are connected in series via a fiber coil. -A rotor type or the like is used. 2
Reference numeral 5 denotes a main control unit including a CPU and the like, which controls operations of the temperature control unit 22, the polarization state controller 24, and the timing generator 12. The light source unit 23 is used instead of the light source unit 1 in the conventional example. The polarization state controller 24 is interposed between the AO switch 3 and the multiplexer / demultiplexer 4.

【0020】次に、前述の構成よりなる本発明の第1の
実施例のコヒーレント検波OTDRの動作について説明
する。温度制御可能な半導体レ−ザ21は、温度制御部
22からの制御により前述したように周辺の温度が制御
され、その結果、光出力はほぼ一定に保たれながら光周
波数が変化される。さらに、半導体レ−ザ21から出射
されたレ−ザ光のスペクトル線幅は狭線幅化用光ファイ
バ15によって、コヒ−レント検波を行うために十分な
線幅に狭くされる。
Next, the operation of the coherent detection OTDR according to the first embodiment of the present invention having the above-described configuration will be described. As described above, the temperature of the semiconductor laser 21 whose temperature can be controlled is controlled by the temperature controller 22. As a result, the optical frequency is changed while the optical output is kept substantially constant. Further, the spectral line width of the laser light emitted from the semiconductor laser 21 is narrowed by the narrowing optical fiber 15 to a line width sufficient for performing coherent detection.

【0021】このように光周波数可変な光源部23から
の出射光は第1の合分岐器2により試験信号光aとロー
カル信号光bとに分岐される。分岐された試験信号光a
はAOスイッチ3で一定の周期でパルス化されると共に
光周波数変調され、さらに偏波状態制御器24によりそ
の偏波状態が制御され、第2の合分岐器4を介して被試
験光ファイバ5に入射される。被試験光ファイバ5から
の反射光及び後方散乱光cは第2の合分岐器4を介して
第3の合分岐器6に導かれる。この第3の合分岐器6に
はローカル信号光bも導かれ、反射光及び後方散乱光c
とロ−カル信号光bとが合波され、ビ−ト信号光dが生
成される。
As described above, the light emitted from the light source unit 23 whose optical frequency is variable is split by the first splitter 2 into a test signal light a and a local signal light b. Test signal light a branched
Is pulsed at a fixed cycle by the AO switch 3 and is optically frequency-modulated, and its polarization state is controlled by a polarization state controller 24. The optical fiber 5 under test is transmitted through a second multiplexer / demultiplexer 4. Is incident on. The reflected light and the backscattered light c from the optical fiber under test 5 are guided to the third coupler 6 via the second coupler 4. The local signal light b is also guided to the third coupler 6 and the reflected light and the backscattered light c
And the local signal light b are multiplexed to generate a beat signal light d.

【0022】第3の合分岐器6によって生成されたビー
ト信号光dは、ダブルバランス型PIN−FET等の受
光器7で光/電気変換される。受光器7によって光/電
気変換されたビート信号は、信号変換器8でA/D変換
されると共に自乗変換され、加算処理器9でSN改善の
ために加算される。さらにこの後、対数変換器10で対
数変換され、CRT11に信号の時間的変化,即ち長手
方向の分布として表示される。タイミング発生器12
は、試験信号光aをパルス化するための信号をAOスイ
ッチ3の駆動部に供給すると共に加算処理器9へ加算処
理タイミング信号を供給する。
The beat signal light d generated by the third coupler 6 is subjected to optical / electrical conversion by a light receiver 7 such as a double-balanced PIN-FET. The beat signal optically / electrically converted by the light receiver 7 is A / D-converted and square-converted by the signal converter 8 and added by the addition processor 9 for SN improvement. Thereafter, the logarithmic converter 10 performs logarithmic conversion and displays the signal on the CRT 11 as a temporal change, that is, a distribution in the longitudinal direction. Timing generator 12
Supplies a signal for pulsing the test signal light a to the drive unit of the AO switch 3 and supplies an addition processing timing signal to the addition processor 9.

【0023】主制御部25は、温度制御部22、偏波状
態制御器24及びタイミング発生器12の動作制御を行
ない、その結果、被試験光ファイバ5に送出する光パル
スのタイミングに応じて試験信号光a及びロ−カル信号
光bの光周波数を変化させると共に、試験信号光aの偏
波状態の制御を行なうものである。これら光周波数及び
偏波状態の制御は、光周波数及び偏波状態を、例えば光
パルスの送出前に変化させて光パルスを送出した後、次
の光パルス送出前までの間は一定に保ったり、或いは光
パルスの送出タイミングに関係なく時間に対応して直線
的に変化させるように行う。
The main control unit 25 controls the operation of the temperature control unit 22, the polarization state controller 24, and the timing generator 12, and as a result, the test is performed in accordance with the timing of the optical pulse transmitted to the optical fiber 5 under test. The optical frequency of the signal light a and the local signal light b are changed, and the polarization state of the test signal light a is controlled. The control of the optical frequency and the polarization state is performed by changing the optical frequency and the polarization state, for example, before transmitting the optical pulse, and after transmitting the optical pulse, maintaining the optical frequency and the polarization state constant until before transmitting the next optical pulse. Alternatively, it is performed so as to change linearly in response to time regardless of the transmission timing of the optical pulse.

【0024】次に、第1の実施例のコヒーレント検波O
TDRを用いた実験結果に基づいて本発明の効果につい
て説明する。この実験では、回転位相板方式の偏波状態
制御器24を用いた。また、被試験光ファイバ5の長さ
は10km、被試験光ファイバ5に送出する光パルス
は、波長1.55μm、パルス幅1μs、パルス周期1
ms、ピーク強度−10dBmであり、図2に示す従来
例と同じである。さらに、長さ1kmの狭線幅化用シン
グルモ−ド光ファイバ15によってスペクトル線幅は3
KHz以下とされると共に、第3の合分岐器6に入力さ
れるローカル信号光bの強度はほぼ0dBmであり、従
来例の場合と同じに設定されている。また、後方散乱波
形のSN改善のための加算回数は従来例と同様に3.9
×105 回行なった。従って、加算時間は390秒であ
る。
Next, the coherent detection O of the first embodiment is described.
The effects of the present invention will be described based on experimental results using TDR. In this experiment, a polarization state controller 24 of a rotating phase plate type was used. The length of the optical fiber under test 5 is 10 km, and the light pulse transmitted to the optical fiber 5 under test has a wavelength of 1.55 μm, a pulse width of 1 μs, and a pulse period of 1 μm.
ms, and the peak intensity is −10 dBm, which is the same as the conventional example shown in FIG. Further, the spectral line width is reduced to 3 by the single mode optical fiber 15 for narrowing the line width of 1 km.
KHz or less, and the intensity of the local signal light b input to the third multiplexer / demultiplexer 6 is almost 0 dBm, which is set to be the same as in the conventional example. The number of additions for improving the SN of the backscattered waveform is 3.9 as in the conventional example.
× 10 5 times. Therefore, the addition time is 390 seconds.

【0025】図4の(a) 〜(c) に、実験によって得られ
た後方散乱波形を示す。それぞれの図において、横軸は
被試験光ファイバ5の長さを表し、縦軸は後方散乱光c
の強度を表している。
FIGS. 4A to 4C show backscattering waveforms obtained by experiments. In each figure, the horizontal axis represents the length of the optical fiber under test 5, and the vertical axis represents the backscattered light c.
Represents the intensity of

【0026】図4(a) は、試験信号光aの偏波状態を一
定に保ち、3.9×105 回の加算の間、光周波数を変
化させたときの後方散乱波形を示す図である。ここで、
光周波数変化は、光パルス送出タイミングに関係なく時
間に対応してほぼ直線的に±70GHzの間を往復さ
せ、一往復時間を65秒とした。図3に示す従来例の実
験結果に比べてフェ−ジングノイズが小さくなっている
ことが分かる。
FIG. 4A is a diagram showing a backscattering waveform when the optical frequency is changed during the addition of 3.9 × 10 5 times while maintaining the polarization state of the test signal light a constant. is there. here,
The change in the optical frequency was made to reciprocate between ± 70 GHz substantially linearly in response to time irrespective of the light pulse transmission timing, and one round trip time was set to 65 seconds. It can be seen that the fading noise is smaller than the experimental result of the conventional example shown in FIG.

【0027】図4(b) は、試験信号光a及びロ−カル信
号光bの光周波数を一定に保ち、3.9×105 回の加
算の間、0.65×105 回の加算回数毎に試験信号光
aの偏波状態を変えたときの後方散乱波形を示す図であ
る。これもまた、図3に示す従来例の実験結果に比べて
フェ−ジングノイズが小さくなっていることが分かる。
図4(c) は、試験信号光a及びロ−カル信号光bの光
周波数変化させると共に、試験信号光aの偏波状態を変
化させたときの後方散乱波形を示す図である。ここで
は、光周波数変化は、光パルス送出タイミングに関係な
く時間に対応してほぼ直線的に±70GHzの間を往復
させ、一往復時間を65秒とし、3.9×105 回の加
算の間、0.65×105 回の加算回数毎に試験信号光
aの偏波状態を変化させた。図3に示す従来例の実験結
果に比べてフェ−ジングノイズは0.05dB以下と非
常に小さくなっており、波形がほぼ一直線になっている
ことが分かる。また、光周波数だけを変化させた図4
(a) 及び偏波状態だけを変化させた図4(b) の後方散乱
波形よりもさらにフェ−ジングノイズは小さくなってお
り、本発明の有効性が確認できた。
FIG. 4 (b) shows that the optical frequencies of the test signal light a and the local signal light b are kept constant, and 0.65 × 10 5 additions are performed during 3.9 × 10 5 additions. FIG. 7 is a diagram illustrating a backscattering waveform when the polarization state of the test signal light a is changed for each number of times. This also shows that the fading noise is smaller than the experimental result of the conventional example shown in FIG.
FIG. 4C is a diagram showing a backscattering waveform when the optical frequencies of the test signal light a and the local signal light b are changed and the polarization state of the test signal light a is changed. Here, the change of the optical frequency is substantially linearly reciprocated between ± 70 GHz corresponding to the time irrespective of the optical pulse transmission timing, and one round trip time is 65 seconds, and 3.9 × 10 5 additions are performed. During this time, the polarization state of the test signal light a was changed every 0.65 × 10 5 times. The fading noise is much smaller than 0.05 dB as compared with the experimental result of the conventional example shown in FIG. 3, and it can be seen that the waveform is almost straight. FIG. 4 shows only the optical frequency changed.
The fading noise is smaller than that of the backscattered waveform of FIG. 4B in which only the polarization state is changed, and the effectiveness of the present invention can be confirmed.

【0028】このように、被試験光ファイバ5に入射す
る光パルスの光周波数を、少なくとも1パルス毎に僅か
に変化させると共に、試験信号光aの偏波状態を少なく
とも1パルス毎に僅かに変化させると、被試験光ファイ
バ5から戻ってくる後方散乱光c、及び後方散乱光cと
ロ−カル信号光bとを合波して得られるビート信号光d
は、少なくとも1パルス毎に僅かずつ干渉特性及び偏波
特性が異なる。この僅かずつ異なるビート信号光dを検
出して電気信号処理系で加算処理すると、被試験光ファ
イバ5からの後方散乱光上の干渉によるノイズ及び偏波
依存性によるノイズが平均化されるので、後方散乱波形
上のフェージングノイズを低減することができる。
As described above, the optical frequency of the light pulse incident on the optical fiber under test 5 is slightly changed at least every one pulse, and the polarization state of the test signal light a is slightly changed every at least one pulse. Then, the back scattered light c returning from the optical fiber under test 5 and the beat signal light d obtained by multiplexing the back scattered light c and the local signal light b.
Has a slightly different interference characteristic and polarization characteristic at least for each pulse. If this slightly different beat signal light d is detected and added by the electric signal processing system, noise due to interference on the backscattered light from the optical fiber 5 to be tested and noise due to polarization dependence are averaged. Fading noise on the backscattering waveform can be reduced.

【0029】次に、本発明の第2の実施例を図5に基づ
いて説明する。図5は第2の実施例を示す構成図であ
る。図において、前述した第1の実施例と同一構成部分
は同一符号をもって表し、その説明を省略する。31は
複数の電極を有する半導体レーザで、例えば2電極を有
するDFBーLD、32は半導体レ−ザ31の複数の電
極に対応した駆動電流制御部、33は主制御部で、駆動
電流制御部32、偏波状態制御器24及びタイミング発
生器12を制御する主制御部である。半導体レ−ザ3
1、駆動電流制御部32及び主制御部33のそれぞれ
は、前述した第1の実施例における半導体レ−ザ21、
温度制御部22、主制御部25に代えて用いられる。ま
た、第2の実施例においては、AOスイッチ3からの出
力光パルスを直接第2の合分岐器4に入射すると共に、
偏波状態制御器24を第1の合分岐器2と第3の合分岐
器6との間に介在させ、ロ−カル信号光bの偏波状態を
変化させている。
Next, a second embodiment of the present invention will be described with reference to FIG. FIG. 5 is a configuration diagram showing the second embodiment. In the figure, the same components as those in the first embodiment described above are denoted by the same reference numerals, and description thereof will be omitted. Reference numeral 31 denotes a semiconductor laser having a plurality of electrodes, for example, a DFB-LD having two electrodes; 32, a drive current control unit corresponding to the plurality of electrodes of the semiconductor laser 31; 33, a main control unit; 32, a main control unit that controls the polarization state controller 24 and the timing generator 12. Semiconductor laser 3
1. Each of the drive current control unit 32 and the main control unit 33 includes the semiconductor laser 21 of the first embodiment described above,
It is used in place of the temperature control unit 22 and the main control unit 25. In the second embodiment, the output optical pulse from the AO switch 3 is directly incident on the second branching device 4, and
The polarization state controller 24 is interposed between the first multiplexer / demultiplexer 2 and the third multiplexer / demultiplexer 6 to change the polarization state of the local signal light b.

【0030】半導体レーザ31は、複数の電極に対応し
た数の電流駆動ができる駆動電流制御部32によって制
御され、複数の電極に流す電流の比が適切に設定される
ことによって、光出力の変動を小さく保ちながら、光周
波数が変化させられる。
The semiconductor laser 31 is controlled by a drive current control unit 32 capable of driving a number of currents corresponding to a plurality of electrodes. The optical frequency can be varied while keeping small.

【0031】次に、前述の構成よりなる第2の実施例の
動作を説明する。半導体レ−ザ31の出力光は、狭線幅
化用シングルモ−ド光ファイバ15によってスペクトル
線幅が小さくされ、第1の合分岐器2によって試験信号
光aとローカル信号光bに分岐される。試験信号光aは
AOスイッチ3でパルス化された後、第2の合分岐器4
を介して被試験光ファイバ5に入射される。被試験光フ
ァイバ5からの反射光及び後方散乱光cは、第2の合分
岐器4を介して第3の合分岐器6に導かれる。また、ロ
−カル信号光bは、偏波状態制御器24によってその偏
波状態が制御された後、第3の合分岐器6に導かれる。
この第3の合分岐器6において、反射光及び後方散乱光
cとロ−カル信号光bとが合波され、ビ−ト信号光dが
生成される。この後、第3の合分岐器6によって生成さ
れたビート信号光dが、受光器7によって光/電気変換
され、さらに電気信号処理系13によって電気処理され
て表示される点は、前述した第1の実施例と同様であ
る。
Next, the operation of the second embodiment having the above configuration will be described. The output light of the semiconductor laser 31 is reduced in spectral line width by the single-mode optical fiber 15 for narrowing the line width, and is split by the first splitter 2 into test signal light a and local signal light b. . After the test signal light a is pulsed by the AO switch 3, the second
Through the optical fiber 5 under test. The reflected light and the backscattered light c from the optical fiber under test 5 are guided to the third coupler 6 via the second coupler 4. Further, the polarization state of the local signal light b is controlled by the polarization state controller 24, and then guided to the third coupler 6.
In the third multiplexer / demultiplexer 6, the reflected light and the backscattered light c and the local signal light b are multiplexed to generate a beat signal light d. Thereafter, the beat signal light d generated by the third coupler 6 is optically / electrically converted by the light receiver 7 and further subjected to electric processing by the electric signal processing system 13 to be displayed. This is the same as in the first embodiment.

【0032】また、第2の実施例のコヒ−レント検波O
TDRを用いた実験においても、図4に示す第1の実験
結果と同様の後方散乱波形が得られた。即ち、この実験
においても前述した第1の実施例の実験と同様に、回転
位相板方式の偏波状態制御器24を用いると共に、被試
験光ファイバ5の長さを10km、被試験光ファイバ5
に送出する光パルスを、波長1.55μm、パルス幅1
μs、パルス周期1ms、ピーク強度−10dBmとし
た。また、光周波数及び偏波状態を変化させる条件も第
1の実施例の実験と同様とした。
Further, the coherent detection O of the second embodiment
In the experiment using the TDR, a backscattering waveform similar to the result of the first experiment shown in FIG. 4 was obtained. That is, in this experiment, similarly to the experiment of the first embodiment described above, the polarization state controller 24 of the rotating phase plate type is used, the length of the optical fiber 5 under test is 10 km, and the length of the optical fiber 5 under test is
The light pulse to be transmitted to the device has a wavelength of 1.55 μm and a pulse width of 1.
μs, a pulse period of 1 ms, and a peak intensity of −10 dBm. The conditions for changing the optical frequency and the polarization state were the same as in the experiment of the first embodiment.

【0033】この結果、試験信号光a及びロ−カル信号
光bの光周波数だけを変化させたときは図4(a) と同様
の後方散乱波形が得られ、ロ−カル信号光bの偏波状態
だけを変化させたときは図4(b) と同様の後方散乱波形
が得られた。また、試験信号光a及びロ−カル信号光b
の光周波数変化させると共に、ロ−カル信号光bの偏波
状態を変化させたときの後方散乱波形は図4(C) と同様
となった。
As a result, when only the optical frequencies of the test signal light a and the local signal light b are changed, a backscattering waveform similar to that shown in FIG. 4A is obtained, and the polarization of the local signal light b is obtained. When only the wave state was changed, a backscattering waveform similar to that of FIG. 4B was obtained. Further, the test signal light a and the local signal light b
4C, and the backscattering waveform when the polarization state of the local signal light b was changed was the same as that in FIG.

【0034】このように、被試験光ファイバ5に入射す
る光パルスの光周波数を、少なくとも1パルス毎に僅か
に変化させると共に、ロ−カル信号光bの偏波状態を少
なくとも1パルス毎に僅かに変化させると、被試験光フ
ァイバ5から戻ってくる後方散乱光c、及び後方散乱光
cとロ−カル信号光bとを合波して得られるビート信号
光dは、少なくとも1パルス毎に僅かずつ干渉特性及び
偏波特性が異なる。この僅かずつ異なるビート信号光d
を検出して電気信号処理系で加算処理すると、被試験光
ファイバ5からの後方散乱光上の干渉によるノイズ及び
偏波依存性によるノイズ成分が平均化されるので、後方
散乱波形上のフェージングノイズを低減することができ
る。
As described above, the optical frequency of the optical pulse incident on the optical fiber under test 5 is slightly changed at least every one pulse, and the polarization state of the local signal light b is slightly changed every at least one pulse. The back scattered light c returning from the optical fiber under test 5 and the beat signal light d obtained by combining the back scattered light c and the local signal light b are changed at least every one pulse. The interference characteristics and the polarization characteristics are slightly different. This slightly different beat signal light d
Is detected and added by the electric signal processing system, noise due to interference on the backscattered light from the optical fiber under test 5 and noise components due to polarization dependence are averaged, so that fading noise on the backscattered waveform is obtained. Can be reduced.

【0035】以上述べたように、本発明の第1及び第2
の実施例は、光周波数可変な光源部1を用いて、試験信
号光a及びロ−カル信号光bの光周波数を少なくとも1
パルス毎に僅かに変化させると共に、試験信号光aもし
くはロ−カル信号光bの偏波状態を少なくとも1パルス
毎に僅かに変化させ、干渉特性及び偏波特性が僅かずつ
異なるビート信号光dを加算処理することによって、被
試験光ファイバ5からの後方散乱光c上のフェージング
ノイズを低減するものである。
As described above, the first and second embodiments of the present invention
In this embodiment, the light frequency of the test signal light a and the local signal light b is set to at least 1
The pulse signal is slightly changed for each pulse, and the polarization state of the test signal light a or the local signal light b is slightly changed for at least one pulse, so that the beat signal light d having slightly different interference characteristics and polarization characteristics. Is added to reduce the fading noise on the backscattered light c from the optical fiber 5 under test.

【0036】従って本発明の光パルス試験器を用いるこ
とにより、コヒーレント検波技術を用いるOTDRの最
大の問題であった後方散乱波形上のフェージングノイズ
が低減されるので、被試験光ファイバ5の途中に接続箇
所や損失の変化する箇所があれば、後方散乱波形上で段
差として判別できるようになる。即ち、高信頼な光線路
を構築するための道具としてコヒーレント検波OTDR
を実用に供することが可能となる。
Therefore, by using the optical pulse tester of the present invention, fading noise on the backscattered waveform, which is the biggest problem of the OTDR using the coherent detection technique, is reduced. If there is a connection point or a point where the loss changes, it can be determined as a step on the backscattered waveform. That is, coherent detection OTDR is used as a tool for constructing a highly reliable optical line.
Can be put to practical use.

【0037】[0037]

【発明の効果】以上説明したように本発明によれば、光
パルスの所定周期毎に試験信号光及びロ−カル信号光の
光周波数が変化され、さらに前記試験信号光もしくは前
記ロ−カル信号光の偏波状態が変化されるので、被試験
光ファイバからの後方散乱光及びビ−ト信号光の干渉特
性及び偏波特性は前記光パルスの所定周期毎に異なるも
のになり、前記後方散乱光の干渉によるノイズ及び偏波
依存性によるノイズ成分が平均化され、後方散乱波形上
のフェ−ジングノイズが低減される。これにより、被試
験光ファイバの途中に接続箇所や損失の変化する箇所が
あれば、後方散乱波形上で段差として判別できるように
なり、高信頼な光線路を構築するための道具としてコヒ
ーレント検波光パルス試験器を実用に供することができ
るという非常に優れた効果を奏するものである。
As described above, according to the present invention, the optical frequencies of the test signal light and the local signal light are changed every predetermined period of the optical pulse, and the test signal light or the local signal light is further changed. Since the polarization state of the light is changed, the interference characteristics and the polarization characteristics of the backscattered light from the optical fiber under test and the beat signal light are different for each predetermined period of the light pulse, and The noise due to the interference of the scattered light and the noise component due to the polarization dependence are averaged, and the fading noise on the backscattered waveform is reduced. As a result, if there is a connection point or a point where the loss changes in the middle of the optical fiber under test, it can be identified as a step on the backscattered waveform, and the coherent detection light is used as a tool for constructing a highly reliable optical line. This is a very excellent effect that the pulse tester can be put to practical use.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の第1の実施例のコヒ−レント検波方式
光パルス試験器を示す構成図
FIG. 1 is a configuration diagram showing a coherent detection type optical pulse tester according to a first embodiment of the present invention.

【図2】従来例のコヒ−レント検波方式光パルス試験器
を示す構成図
FIG. 2 is a block diagram showing a conventional coherent detection type optical pulse tester.

【図3】従来例を用いて測定した後方散乱波形を示す図FIG. 3 is a diagram showing a backscattering waveform measured using a conventional example.

【図4】本発明の第1の実施例を用いて測定した後方散
乱波形を示す図
FIG. 4 is a diagram showing a backscattering waveform measured using the first embodiment of the present invention.

【図5】本発明の第2の実施例のコヒ−レント検波方式
光パルス試験器を示す構成図
FIG. 5 is a configuration diagram showing a coherent detection type optical pulse tester according to a second embodiment of the present invention.

【符号の説明】[Explanation of symbols]

1…光源部、2,4,6…合分岐器、3…AOスイッ
チ、5…被試験光ファイバ、7…受光器、8…信号変換
器、9…加算処理器、10…対数変換器、11…CR
T、12…タイミング発生器、13…電気信号処理系、
14…DFB−LD、15…狭線幅化用光ファイバ、2
1…半導体レ−ザ、22…温度制御部、23…光源部、
24…偏波状態制御器、25…主制御部、31…半導体
レ−ザ、32…駆動電流制御部、33…主制御部。
DESCRIPTION OF SYMBOLS 1 ... Light source part, 2, 4, 6 ... Branching device, 3 ... AO switch, 5 ... Optical fiber under test, 7 ... Light receiver, 8 ... Signal converter, 9 ... Addition processor, 10 ... Logarithmic converter, 11 ... CR
T, 12: timing generator, 13: electric signal processing system,
14: DFB-LD, 15: Optical fiber for narrowing line width, 2
DESCRIPTION OF SYMBOLS 1 ... Semiconductor laser, 22 ... Temperature control part, 23 ... Light source part
24: polarization state controller, 25: main control unit, 31: semiconductor laser, 32: drive current control unit, 33: main control unit.

フロントページの続き (72)発明者 三川 泉 東京都千代田区内幸町一丁目1番6号 日本電信電話株式会社内 (56)参考文献 特開 平2−79034(JP,A) 特開 昭62−231129(JP,A) (58)調査した分野(Int.Cl.7,DB名) G01M 11/00 - 11/02 H04B 9/00 実用ファイル(PATOLIS) 特許ファイル(PATOLIS)Continuation of the front page (72) Inventor Izumi Mikawa 1-6-6 Uchisaiwaicho, Chiyoda-ku, Tokyo Nippon Telegraph and Telephone Corporation (56) References JP-A-2-79034 (JP, A) JP-A-62-231129 (JP, A) (58) Fields investigated (Int. Cl. 7 , DB name) G01M 11/00-11/02 H04B 9/00 Practical file (PATOLIS) Patent file (PATOLIS)

Claims (1)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】 試験信号光及びロ−カル信号光の信号光
発生手段と、前記試験信号光をパルス化して所定周期ご
とに被試験光ファイバに繰り返し送出する光パルス生成
手段と、前記被試験光ファイバから繰り返し戻ってくる
反射光及び後方散乱光を受光し、前記ロ−カル信号光と
合波してビ−ト信号光を生成する光合波手段と、該ビ−
ト信号光を電気信号に変換する光電気変換手段と、該電
気信号を加算処理する加算処理手段と、該加算処理の結
果に基づいて前記反射光及び後方散乱光の波形を表示す
る表示手段とを備えた光パルス試験器において、 前記試験信号光及びロ−カル信号光の光周波数を、前記
光パルスの所定周期毎に変化させる光周波数可変手段
と、 前記試験信号光もしくは前記ロ−カル信号光の偏波状態
を、前記光パルスの所定周期毎に変化させる偏波状態制
御手段とを設けた、 ことを特徴とする光パルス試験器。
A signal light generating means for generating a test signal light and a local signal light; an optical pulse generating means for pulsating the test signal light and repeatedly transmitting the test signal light to an optical fiber under test at predetermined intervals; An optical multiplexing means for receiving reflected light and backscattered light repeatedly returned from the optical fiber, and multiplexing with the local signal light to generate a beat signal light;
Photoelectric conversion means for converting the signal light into an electric signal, addition processing means for adding the electric signal, and display means for displaying the waveforms of the reflected light and the backscattered light based on the result of the addition processing. An optical pulse tester comprising: an optical frequency variable means for changing an optical frequency of the test signal light and the local signal light at predetermined intervals of the optical pulse; and the test signal light or the local signal. An optical pulse tester, comprising: a polarization state control unit that changes a polarization state of light at predetermined intervals of the optical pulse.
JP03196491A 1991-08-06 1991-08-06 Optical pulse tester Expired - Lifetime JP3088031B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP03196491A JP3088031B2 (en) 1991-08-06 1991-08-06 Optical pulse tester

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP03196491A JP3088031B2 (en) 1991-08-06 1991-08-06 Optical pulse tester

Publications (2)

Publication Number Publication Date
JPH0540075A JPH0540075A (en) 1993-02-19
JP3088031B2 true JP3088031B2 (en) 2000-09-18

Family

ID=16358662

Family Applications (1)

Application Number Title Priority Date Filing Date
JP03196491A Expired - Lifetime JP3088031B2 (en) 1991-08-06 1991-08-06 Optical pulse tester

Country Status (1)

Country Link
JP (1) JP3088031B2 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013230749A (en) * 2012-04-27 2013-11-14 Ube Kosan Kaiun Kk Cargo lifting device
JP2014076695A (en) * 2012-10-09 2014-05-01 Ube Kosan Kaiun Kk Powder and granular material carrying vessel and powder and granular material fluidization method

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1996024038A1 (en) * 1995-02-02 1996-08-08 Yokogawa Electric Corporation Optical fibre detecting device

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013230749A (en) * 2012-04-27 2013-11-14 Ube Kosan Kaiun Kk Cargo lifting device
JP2014076695A (en) * 2012-10-09 2014-05-01 Ube Kosan Kaiun Kk Powder and granular material carrying vessel and powder and granular material fluidization method

Also Published As

Publication number Publication date
JPH0540075A (en) 1993-02-19

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