JP3007653B2 - CRT panel glass - Google Patents

CRT panel glass

Info

Publication number
JP3007653B2
JP3007653B2 JP2134604A JP13460490A JP3007653B2 JP 3007653 B2 JP3007653 B2 JP 3007653B2 JP 2134604 A JP2134604 A JP 2134604A JP 13460490 A JP13460490 A JP 13460490A JP 3007653 B2 JP3007653 B2 JP 3007653B2
Authority
JP
Japan
Prior art keywords
glass
sample
electron beam
ray absorption
browning
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP2134604A
Other languages
Japanese (ja)
Other versions
JPH0431335A (en
Inventor
克彦 今井
和彦 旭
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Electric Glass Co Ltd
Original Assignee
Nippon Electric Glass Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Electric Glass Co Ltd filed Critical Nippon Electric Glass Co Ltd
Priority to JP2134604A priority Critical patent/JP3007653B2/en
Publication of JPH0431335A publication Critical patent/JPH0431335A/en
Application granted granted Critical
Publication of JP3007653B2 publication Critical patent/JP3007653B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Classifications

    • CCHEMISTRY; METALLURGY
    • C03GLASS; MINERAL OR SLAG WOOL
    • C03CCHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
    • C03C3/00Glass compositions
    • C03C3/04Glass compositions containing silica
    • C03C3/076Glass compositions containing silica with 40% to 90% silica, by weight
    • C03C3/095Glass compositions containing silica with 40% to 90% silica, by weight containing rare earths

Description

【発明の詳細な説明】 [産業上の利用分野] 本発明は、カラーテレビジョン管や投写管等に用いら
れる陰極線管パネルガラスに関するものである。
Description: TECHNICAL FIELD The present invention relates to a cathode ray tube panel glass used for a color television tube, a projection tube, and the like.

[従来の技術] カラーテレビジョン管は、電子放射手段である陰極と
これを囲うファンネル及び映像が写し出されるパネルと
から構成され、陰極から出た電子線はパネルの内面に設
けられた蛍光体を発光させてパネルに映像を写し出す
が、この際制動X線が発生し、これがパネルを通過して
管外に漏れると人体に危険であるためパネルガラスには
X線吸収能が高いことが要求される。
2. Description of the Related Art A color television tube is composed of a cathode serving as an electron emitting means, a funnel surrounding the cathode, and a panel on which an image is projected. An electron beam emitted from the cathode emits a phosphor provided on an inner surface of the panel. When the panel is illuminated and an image is displayed on the panel, braking X-rays are generated at this time, and if this passes through the panel and leaks out of the tube, it is dangerous for the human body. You.

現在、0.6Aの波長でのX線吸収係数が28〜29cm-1のガ
ラスがパネルガラスとして使用されており、このガラス
にはX線吸収成分としてSrO、BaO、ZrO2等が含有されて
いる。パネルガラスのX線吸収能力は、ガラスのX線吸
収係数とガラスの厚みによって決定され、パネルの軽量
化を計るためにガラスの厚みを薄くすると、ガラスのX
線吸収係数をより高める必要がある。
Currently, a glass having an X-ray absorption coefficient of 28 to 29 cm -1 at a wavelength of 0.6 A is used as a panel glass, and this glass contains SrO, BaO, ZrO 2 and the like as an X-ray absorption component. . The X-ray absorption capacity of the panel glass is determined by the X-ray absorption coefficient of the glass and the thickness of the glass. When the thickness of the glass is reduced to reduce the weight of the panel, the X-ray absorption of the glass is reduced.
It is necessary to further increase the linear absorption coefficient.

X線吸収係数を高める場合、PbOが最もX線吸収能が
高く、有効な成分であるが、PbOを含有するガラスは電
子線及びX線照射によって、ブラウニングと呼ばれる着
色を生じるので好ましくない。従ってPbOの含有を避け
てガラスのX線吸収係数を更に高める場合には、SrO、B
aO、ZrO2等のX線吸収成分を多量含有させる必要がある
が、一方これらの成分が多いと液相温度が上昇してガラ
スが失透しやすくなり、ガラスの成形が困難になるとい
う問題が生じる。
When increasing the X-ray absorption coefficient, PbO has the highest X-ray absorption ability and is an effective component. However, glass containing PbO is not preferred because it causes coloring called browning due to electron beam and X-ray irradiation. Therefore, to further increase the X-ray absorption coefficient of the glass by avoiding the inclusion of PbO, SrO, B
It is necessary to contain a large amount of X-ray absorbing components such as aO and ZrO 2. On the other hand, if these components are large, the liquidus temperature rises and the glass is liable to devitrify, making the glass molding difficult. Occurs.

そこで本出願人は、上記問題を解決するものとしてSr
O、BaO、ZrO2等のX線吸収成分を比較的多量に含有させ
ても失透が起こりにくく、また成形性も良好な陰極線管
パネルガラスを得ることができることを見いだし、特願
平1−147342号において提案した。
Therefore, the present applicant has determined that Sr
It has been found that even if a relatively large amount of X-ray absorbing components such as O, BaO, and ZrO 2 are contained, devitrification hardly occurs and a cathode ray tube panel glass having good moldability can be obtained. No. 147342.

[発明が解決しようとする問題点] しかしながら特願平1−147342号に開示された陰極線
管パネルガラスは、X線吸収係数を高め、且つアルカリ
溶出量を抑える目的でZnOを5.5%以上含有させているた
め、以下のような問題を生じやすいことがわかった。
[Problems to be Solved by the Invention] However, the cathode ray tube panel glass disclosed in Japanese Patent Application No. 1-147342 contains 5.5% or more of ZnO for the purpose of increasing the X-ray absorption coefficient and suppressing the alkali elution amount. Therefore, it was found that the following problems were likely to occur.

すなわちZnOは、ガラス溶融窯に使用する耐火物に対
する侵食性が大きく、そのためZnOを5.5%以上含有する
特願平1−147342号のガラスは、侵食された耐火物に起
因するブツや脈理が製品の欠陥となって歩留りを低下さ
せやすい 本発明の目的は、特に電子線ブラウニングが少なく、
0.6Åの波長におけるX線吸収係数が34cm-1以上と高
く、しかも耐火物に対する侵食性が小さい陰極線管パネ
ルガラスを提供することである。
That is, ZnO is highly erosive to refractories used in a glass melting furnace, and therefore, the glass of Japanese Patent Application No. 1-147342 containing 5.5% or more of ZnO has irregularities and striae caused by the eroded refractories. The purpose of the present invention is to reduce electron beam browning,
An object of the present invention is to provide a cathode ray tube panel glass having an X-ray absorption coefficient at a wavelength of 0.6 ° as high as 34 cm −1 or more and having a low erosion property to refractories.

[問題点を解決するための手段] 本発明に係る陰極線管パネルガラスは電子線によるブ
ラウニングに対する抵抗性をはじめとしてX線吸収能、
X線による耐ブラウニング性、溶融性、成形加工性、熱
膨張率、電気的特性、失透特性等にも留意して各成分の
割合及びNa2OとK2Oの混合割合を厳密に規制したもので
あり、重量%表示で本質的に下記組成 SiO2 50.0 〜 60.0 Al2O3 0 〜 4.0 Li2O 0.5 〜 3.0 Na2O 0.5 〜 2.9 K2O 9.1 〜 15.0 MgO 0 〜 4.0 CaO 0 〜 3.0 SrO 6.0 〜 14.0 BaO 8.0 〜 18.0 ZnO 0 〜 4.9 ZrO2 0 〜 2.0 TiO2 0 〜 2.0 CeO2 0.1 〜 2.0 Sb2O3 0 〜 0.5 P2O5 0 〜 2.0 を有し、Na2O重量%/(Na2O重量%+K2O重量%)=0.0
6〜0.24であることを特徴とする。
[Means for Solving the Problems] The cathode ray tube panel glass according to the present invention has an X-ray absorbing ability including a resistance to browning by an electron beam,
Strictly regulate the ratio of each component and the mixture ratio of Na 2 O and K 2 O, taking into account the X-ray browning resistance, meltability, moldability, thermal expansion coefficient, electrical characteristics, devitrification characteristics, etc. And essentially the following composition in terms of% by weight: SiO 2 50.0 to 60.0 Al 2 O 30 to 4.0 Li 2 O 0.5 to 3.0 Na 2 O 0.5 to 2.9 K 2 O 9.1 to 15.0 MgO 0 to 4.0 CaO 0 have ~ 3.0 SrO 6.0 ~ 14.0 BaO 8.0 ~ 18.0 ZnO 0 ~ 4.9 ZrO 2 0 ~ 2.0 TiO 2 0 ~ 2.0 CeO 2 0.1 ~ 2.0 Sb 2 O 3 0 ~ 0.5 P 2 O 5 0 ~ 2.0, Na 2 O wt% / (Na 2 O wt% + K 2 O wt%) = 0.0
6 to 0.24.

またより好ましくは本質的に下記組成 SiO2 54.0 〜 58.0 Al2O3 0 〜 3.0 Li2O 0.8 〜 2.0 Na2O 1.0 〜 2.5 K2O 9.5 〜 12.0 MgO 0 〜 2.0 CaO 0 〜 2.0 SrO 7.0 〜 12.0 BaO 10.0 〜 16.0 ZnO 0 〜 4.5 ZrO2 0 〜 1.5 TiO2 0 〜 1.0 CeO2 0.1 〜 1.0 Sb2O3 0 〜 0.4 P2O5 0 〜 1.5 を有し、Na2O重量%/(Na2O重量%+K2O重量%)=0.1
0〜0.20であることを特徴とする。
Also more preferably, essentially the following composition SiO 2 54.0 to 58.0 Al 2 O 30 to 3.0 Li 2 O 0.8 to 2.0 Na 2 O 1.0 to 2.5 K 2 O 9.5 to 12.0 MgO 0 to 2.0 CaO 0 to 2.0 SrO 7.0 to 12.0 having a BaO 10.0 ~ 16.0 ZnO 0 ~ 4.5 ZrO 2 0 ~ 1.5 TiO 2 0 ~ 1.0 CeO 2 0.1 ~ 1.0 Sb 2 O 3 0 ~ 0.4 P 2 O 5 0 ~ 1.5, Na 2 O wt% / (Na 2 O weight% + K 2 O weight%) = 0.1
0 to 0.20.

[作用] 本発明の陰極線管パネルガラスの組成範囲を上記のよ
うに限定したのは以下の理由による。
[Operation] The reason for limiting the composition range of the cathode ray tube panel glass of the present invention as described above is as follows.

SiO2はガラスのネットワークフォーマーであるが、5
0.0%より少ない場合はガラスの粘度が低下すると共に
化学的耐久性が悪くなる。60.0%より多い場合はガラス
の粘度が高くなりすぎて溶融成形が困難になる。
SiO 2 is a glass network former, but 5
If it is less than 0.0%, the viscosity of the glass decreases and the chemical durability deteriorates. If it is more than 60.0%, the viscosity of the glass becomes too high, so that melt molding becomes difficult.

Al2O3は耐水性向上のため添加できるが、4.0%より多
い場合はガラスの粘度が高くなりすぎて溶融成形が困難
になる。
Al 2 O 3 can be added to improve the water resistance. However, if it is more than 4.0%, the viscosity of the glass becomes too high and melt molding becomes difficult.

Li2Oは電子線によるブラウニングを抑制すると共にガ
ラスの溶融性を向上させ、かつ熱膨張係数を高める成分
であるが、0.5%より少ない場合は上記効果が得られな
くなる。3.0%より多い場合はガラスが失透し易くなる
と共に耐火物に対する侵食性が大きくなる。またLi2O原
料自体が高価であるためコストの面からも多量含有する
ことは好ましくない。
Li 2 O is a component that suppresses the browning due to the electron beam, improves the melting property of the glass, and increases the coefficient of thermal expansion. However, when the content is less than 0.5%, the above effects cannot be obtained. If it is more than 3.0%, the glass tends to be devitrified and the erosion of the refractory increases. In addition, since the Li 2 O raw material itself is expensive, it is not preferable to contain a large amount in terms of cost.

Na2OとK2OもLi2Oと共にガラスの溶融性を向上させる
成分であるが、Na2Oが0.5%、K2Oが9.1%より少ない場
合はガラスの粘性が高くなりすぎて溶融成形が困難とな
る。また本発明においては電子線によるブラウニングを
少なくするためNa2O重量%/(Na2O重量%+K2O重量
%)が0.06〜0.24であることが条件であるが、Na2Oが2.
9%より多い場合はこの範囲を満足しがたくなり、K2Oが
15.0%より多い場合はガラスの熱膨張係数が高くなりす
ぎると共に耐火物に対する侵食性が大きくなる。
Na 2 O and K 2 O are also components that improve the melting property of glass together with Li 2 O. However, when Na 2 O is less than 0.5% and K 2 O is less than 9.1%, the viscosity of the glass becomes too high and the glass melts. Molding becomes difficult. Although in the present invention is that condition Na 2 O wt% to reduce browning by electron beam / (Na 2 O wt% + K 2 O wt%) is 0.06-.24, Na 2 O 2.
If it exceeds 9%, it is difficult to satisfy this range, and K 2 O
If it is more than 15.0%, the coefficient of thermal expansion of the glass becomes too high, and the erosion of refractories increases.

MgO及びCaOは主にガラスの粘性曲線を調整するため各
々4.0%、3.0%まで含有可能である。
MgO and CaO can be contained up to 4.0% and 3.0%, respectively, mainly to adjust the viscosity curve of the glass.

SrOはガラスのネットワークモディファイヤーとして
安定したガラスを得るために重要であり、かつX線吸収
能も高いが、6.0%より少ない場合は上記効果が得られ
ず、14.0%より多い場合は、SrO−BaO−SiO2系の結晶が
析出しやすくなると共に液相温度が高くなり成形時に失
透しやすくなるため好ましくない。
SrO is important for obtaining a stable glass as a glass network modifier, and has a high X-ray absorptivity. However, when the content is less than 6.0%, the above effect cannot be obtained. When the content is more than 14.0%, SrO- This is not preferable because BaO—SiO 2 based crystals are likely to precipitate and the liquidus temperature is high, which tends to cause devitrification during molding.

BaOもSroと同様ガラスのネットワークモディファイヤ
ーとして、またガラスのX線吸収能を高めるために含有
されるが、8.0%より少ない場合は上記効果が得られ
ず、18.0%より多い場合は、BaO−SrO−SiO2系の結晶が
析出しやすくなる。
BaO is also contained as a glass network modifier similarly to Sro and in order to enhance the X-ray absorption capacity of the glass. If the content is less than 8.0%, the above effect cannot be obtained. If the content is more than 18.0%, BaO- SrO-SiO 2 based crystals are likely to precipitate.

ZnOはガラスのX線吸収能を高めると共にアルカリ溶
出量を抑えるのに効果があるが、先記したようにこの成
分は耐火物に対する侵食性を大きくするため、その含有
量を4.9%以下に抑えるのが好ましい。
ZnO has the effect of increasing the X-ray absorption capacity of glass and suppressing the amount of alkali elution, but as described above, this component increases the erosion of refractories, so its content is controlled to 4.9% or less. Is preferred.

ZrO2は、ガラスのX線吸収能を高めるために添加でき
るが、2.0%より多い場合はガラスの表面失透温度(空
気、白金、耐火物との界面での液相温度)が高くなり、
表面にK2O−ZrO2−SiO2系の結晶が析出しやすくなる。
表面失透温度が高くなると、ガラス内部での液相温度が
高い場合と同様にガラスの成形が困難となるため好まし
くない。
ZrO 2 can be added to enhance the X-ray absorption capacity of the glass, but if it exceeds 2.0%, the surface devitrification temperature of the glass (the liquidus temperature at the interface with air, platinum, and refractories) increases,
K 2 O—ZrO 2 —SiO 2 based crystals are likely to precipitate on the surface.
If the surface devitrification temperature is high, it is not preferable because molding of the glass becomes difficult as in the case where the liquidus temperature inside the glass is high.

TiO2はガラスの紫外線及びX線によるブラウニングを
防ぐために添加できるが、2.0%より多い場合はガラス
の光線透過率が低下するので好ましくない。
TiO 2 can be added to prevent browning of glass by ultraviolet rays and X-rays. However, if it is more than 2.0%, the light transmittance of the glass is undesirably reduced.

CeO2はX線によるブラウニング防止効果に優れている
と共に清澄剤としての効果があるが、0.1%より少ない
場合は上記効果が得られず、2.0%より多い場合は、可
視部短波長域の光透過率が低下するので好ましくない。
CeO 2 is excellent in the effect of preventing browning due to X-rays and has an effect as a fining agent. However, if it is less than 0.1%, the above effect cannot be obtained, and if it is more than 2.0%, light in the visible short wavelength region is obtained. It is not preferable because the transmittance is reduced.

Sb2O3は、ガラスの清澄剤として添加できるが、0.5%
より多い場合は、ガラス表面にSrO−Sb2O3系又はBaO−S
b2O3系の結晶が析出しやすくなり、その結果ガラスの表
面失透温度が著しく高くなる。
Sb 2 O 3 can be added as a glass fining agent, but 0.5%
If greater, the surface of the glass SrO-Sb 2 O 3 system or BaO-S
The b 2 O 3 type crystal is easily precipitated, and as a result, the surface devitrification temperature of the glass is significantly increased.

P2O5は失透傾向を抑えるために添加できるが、2.0%
より多い場合は液相の分離現象が起きて逆に失透しやす
くなる。
P 2 O 5 can be added to reduce the tendency to devitrify, but 2.0%
If the amount is larger, a liquid phase separation phenomenon occurs, and conversely, devitrification tends to occur.

また本発明においては上記成分以外にもガラスの溶融
性向上のためにB2O3,Fを、さらにガラスの色調を調整す
るためNiO、CoO、Fe2O3、MnO、Cr2O3等の着色成分を添
加することが可能である。
In the present invention, in addition to the above components, B 2 O 3 , F for improving the melting property of the glass, and NiO, CoO, Fe 2 O 3 , MnO, Cr 2 O 3 for adjusting the color tone of the glass. Can be added.

しかしながら先記したようにPbOを含有すると電子線
及びX線によるブラウニングを起こしやすくするので導
入すべきではない。
However, as described above, PbO should not be introduced because it tends to cause browning by electron beams and X-rays.

[実施例] 以下に本発明を実施例及び比較例に基づいて説明す
る。
[Examples] Hereinafter, the present invention will be described based on examples and comparative examples.

次表は実施例及び比較例のガラス組成、Na2O重量%/
(Na2O重量%+K2O重量%)の比率、X線吸収係数、各
試料に対して電子線を50時間照射した後の電子線ブラウ
ニング、液相温度、表面失透温度、耐火物の侵食深さを
示したものである。
The following table shows the glass compositions of Examples and Comparative Examples, Na 2 O weight% /
(Na 2 O weight% + K 2 O weight%), X-ray absorption coefficient, electron beam browning after irradiating each sample with electron beam for 50 hours, liquidus temperature, surface devitrification temperature, refractory It shows the erosion depth.

表中のNo.1〜5の試料は本発明の実施例であり、No.6
〜9の試料は比較例である。
The samples of Nos. 1 to 5 in the table are examples of the present invention, and
The samples Nos. To 9 are comparative examples.

表に示したNo.1〜9の各試料は次のように調製した。 Each sample of No. 1 to 9 shown in the table was prepared as follows.

各試料のガラス組成になるように調合した原料バッチ
を白金ルツボに入れ約1450℃で4時間溶融した。均質な
ガラスを得るために途中白金攪拌棒で5分間攪拌を行い
脱泡した後、金型に流し込んで板状体に成形し、次いで
徐冷した後、金型から取り出して試料を作製した。これ
を用いてX線吸収係数、電子線ブラウニング、液相温
度、表面失透温度及び耐火物の侵食深さをそれぞれ測定
した。
The raw material batch prepared to have the glass composition of each sample was put in a platinum crucible and melted at about 1450 ° C. for 4 hours. In order to obtain a homogeneous glass, the mixture was agitated with a platinum stirring bar for 5 minutes and defoamed. Then, the mixture was poured into a mold to form a plate-shaped body, then cooled slowly, and then taken out of the mold to prepare a sample. Using these, the X-ray absorption coefficient, electron beam browning, liquidus temperature, surface devitrification temperature, and erosion depth of the refractory were measured, respectively.

その結果、比較例の各試料は、X線吸収係数が35.4cm
-1と高く、良好なX線吸収特性を示したが、ZnOを8.0%
含有するNo.6の試料及び7.5%含有するNo.7の試料は、
耐火物の侵食深さが各々4.8mm、4.5mmと大きかった。ま
たNa2O重量%/(Na2O重量%+K2O重量%)が0.50であ
るNo.7の試料及びPbOを3.5%含有するNo.9の試料は、電
子線ブラウニングが各々51、75であり、電子線によるブ
ラウニングが生じやすいことがわかった。さらにZrO2
4.0%含有するNo.8の試料は、液相温度及び表面失透温
度が各々970℃、1190℃と非常に高かった。
As a result, each sample of the comparative example had an X-ray absorption coefficient of 35.4 cm.
-1 and showed good X-ray absorption characteristics, but ZnO was 8.0%
The No. 6 sample and the 7.5% No. 7 sample contained
The erosion depth of the refractory was as large as 4.8 mm and 4.5 mm, respectively. In addition, the No. 7 sample in which Na 2 O wt% / (Na 2 O wt% + K 2 O wt%) is 0.50 and the No. 9 sample containing 3.5% PbO have electron beam brownings of 51 and 75, respectively. It was found that browning by an electron beam was likely to occur. More ZrO 2
Sample No. 8 containing 4.0% had extremely high liquidus temperatures and surface devitrification temperatures of 970 ° C. and 1190 ° C., respectively.

それに対し本発明の実施例であるNo.1〜5の試料は、
X線吸収係数が34.2cm-1以上、電子線ブラウニングが3
〜7といずれも良好な値を示し、また液相温度が900℃
以下、表面失透温度が925℃以下と低いため溶融成形性
に優れており、さらに耐火物の侵食深さが2.0〜3.0mmと
小さいため耐火物の侵食性が小さいことがわかった。
On the other hand, the samples of Nos. 1 to 5 which are the examples of the present invention are:
X-ray absorption coefficient 34.2cm -1 or more, electron beam browning 3
~ 7 show good values and liquidus temperature is 900 ℃
Below, it was found that since the surface devitrification temperature was as low as 925 ° C. or less, the melt moldability was excellent, and furthermore, the erosion depth of the refractory was small, 2.0 to 3.0 mm, so that the erosion of the refractory was small.

尚、電子線ブラウニングの測定方法は以下のとおりで
ある。
In addition, the measuring method of electron beam browning is as follows.

予め透過率を測定した各試料ガラスに3000Åの厚みの
アルミニウムを蒸着してカラーテレビジョン管のシャド
ーマスクにワイヤーで固定した後、電子銃から印加電圧
30kV、電子ビームの電流密度3μA/cm2の条件で電子線
を各試料に50時間照射した。その後、ワイヤーから各試
料を取りはずし、蒸着アルミニウムを除去して透過率を
測定し、照射前後の波長400nmにおける透過率差を求
め、その値を表に示した。
After 3,000 mm of aluminum was vapor-deposited on each sample glass whose transmittance was measured in advance and fixed with a wire to the shadow mask of the color television tube, the applied voltage from the electron gun
Each sample was irradiated with an electron beam for 50 hours under the conditions of 30 kV and an electron beam current density of 3 μA / cm 2 . Thereafter, each sample was removed from the wire, the evaporated aluminum was removed, the transmittance was measured, and the transmittance difference at a wavelength of 400 nm before and after irradiation was determined. The values are shown in the table.

また液相温度及び表面失透温度の測定方法は以下のと
おりである。
The method for measuring the liquidus temperature and the surface devitrification temperature is as follows.

まず各試料を粉砕し、この粉砕物の中で32メッシュ篩
は通過するが48メッシュは通過しない粉砕物だけを取り
出し、水洗いした後、乾燥して白金ボート内へ移した。
この白金ボートを700〜1200℃の温度勾配のついた電気
炉内に入れて、48時間熱処理した後、白金ボートを取り
出し、放冷してから試料ガラスを白金ボートから取り出
した。次いでこの試料ガラスを偏光顕微鏡で観察してガ
ラスの底部から約2mm上方の部分において結晶が析出し
ている部分と析出していない部分との境界を見い出し、
その境界の位置に対応する電気炉内の温度を求め液相温
度とした。また同じようにガラスの表面において結晶が
析出している部分と析出していない部分との境界を見い
出し、その位置のあった電気炉内の温度を求め表面失透
温度とした。
First, each sample was pulverized, and among the pulverized materials, only the pulverized materials that passed through the 32 mesh sieve but did not pass through the 48 mesh were taken out, washed with water, dried, and transferred into a platinum boat.
This platinum boat was placed in an electric furnace having a temperature gradient of 700 to 1200 ° C., and heat-treated for 48 hours. Then, the platinum boat was taken out, allowed to cool, and then the sample glass was taken out of the platinum boat. Next, the sample glass was observed with a polarizing microscope to find a boundary between a portion where crystals were precipitated and a portion where crystals were not precipitated in a portion about 2 mm above the bottom of the glass,
The temperature in the electric furnace corresponding to the position of the boundary was determined and defined as the liquidus temperature. Similarly, on the surface of the glass, a boundary between a portion where crystals are precipitated and a portion where crystals are not precipitated was found, and the temperature in the electric furnace where the crystal was located was determined as the surface devitrification temperature.

さらに耐火物の侵食深さは、ASTM C−621に規定さ
れている方法に基づいて、白金ルツボ内のガラス融液中
に18φ×70mmのAZS耐火物の一部を浸漬した後、さらに
ガラスを1500℃、40時間の条件で溶融し、ガラス融液表
面における耐火物の侵食深さを調べ、その値を表に示し
た。
Further, the erosion depth of the refractory is determined by immersing a part of the AZS refractory of 18 mm x 70 mm in a glass melt in a platinum crucible based on the method specified in ASTM C-621, and further immersing the glass. Melting was performed at 1500 ° C. for 40 hours, and the erosion depth of the refractory on the surface of the glass melt was examined. The values are shown in the table.

[発明の効果] 以上のように本発明の陰極線管パネルガラスは、電子
線によるブラウニングに対して高い抵抗性を有すると共
に0.6Åの波長におけるX線吸収係数が34cm-1以上の高
いX線吸収能を有し、また液相温度及び表面失透温度が
低いため溶融成形が容易であり、しかも耐火物に対する
侵食性が小さいため歩留り良く生産することが可能であ
り、カラーテレビジョン管や投写型パネルガラスとして
好適である。
[Effects of the Invention] As described above, the cathode ray tube panel glass of the present invention has high resistance to electron beam browning and has a high X-ray absorption coefficient of 34 cm -1 or more at a wavelength of 0.6 mm. It has a low liquidus temperature and a low surface devitrification temperature, so it is easy to melt-mold, and because it has low erosion to refractories, it can be produced with good yield. It is suitable as a panel glass.

───────────────────────────────────────────────────── フロントページの続き (58)調査した分野(Int.Cl.7,DB名) C03C 3/00 - 4/00 H01J 29/86 ──────────────────────────────────────────────────続 き Continued on the front page (58) Field surveyed (Int.Cl. 7 , DB name) C03C 3/00-4/00 H01J 29/86

Claims (2)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】重量%表示で本質的に下記組成 SiO2 50.0 〜 60.0 Al2O3 0 〜 4.0 Li2O 0.5 〜 3.0 Na2O 0.5 〜 2.9 K2O 9.1 〜 15.0 MgO 0 〜 4.0 CaO 0 〜 3.0 SrO 6.0 〜 14.0 BaO 8.0 〜 18.0 ZnO 0 〜 4.9 ZrO2 0 〜 2.0 TiO2 0 〜 2.0 CeO2 0.1 〜 2.0 Sb2O3 0 〜 0.5 P2O5 0 〜 2.0 を有し、Na2O重量%/(Na2O重量%+K2O重量%)=0.0
6〜0.24であることを特徴とする陰極線管パネルガラ
ス。
The composition is essentially the following, expressed in terms of% by weight: SiO 2 50.0 to 60.0 Al 2 O 30 to 4.0 Li 2 O 0.5 to 3.0 Na 2 O 0.5 to 2.9 K 2 O 9.1 to 15.0 MgO 0 to 4.0 CaO 0 have ~ 3.0 SrO 6.0 ~ 14.0 BaO 8.0 ~ 18.0 ZnO 0 ~ 4.9 ZrO 2 0 ~ 2.0 TiO 2 0 ~ 2.0 CeO 2 0.1 ~ 2.0 Sb 2 O 3 0 ~ 0.5 P 2 O 5 0 ~ 2.0, Na 2 O wt% / (Na 2 O wt% + K 2 O wt%) = 0.0
A cathode ray tube panel glass having a diameter of 6 to 0.24.
【請求項2】重量%表示で本質的に下記組成 SiO2 54.0 〜 58.0 Al2O3 0 〜 3.0 Li2O 0.8 〜 2.0 Na2O 1.0 〜 2.5 K2O 9.5 〜 12.0 MgO 0 〜 2.0 CaO 0 〜 2.0 SrO 7.0 〜 12.0 BaO 10.0 〜 16.0 ZnO 0 〜 4.5 ZrO2 0 〜 1.5 TiO2 0 〜 1.0 CeO2 0.1 〜 1.0 Sb2O3 0 〜 0.4 P2O5 0 〜 1.5 を有し、Na2O重量%/(Na2O重量%+K2O重量%)=0.1
0〜0.20であることを特徴とする特許請求の範囲第1項
記載の陰極線管パネルガラス。
2. The composition essentially expressed by weight% as follows: SiO 2 54.0 to 58.0 Al 2 O 30 to 3.0 Li 2 O 0.8 to 2.0 Na 2 O 1.0 to 2.5 K 2 O 9.5 to 12.0 MgO 0 to 2.0 CaO 0 have ~ 2.0 SrO 7.0 ~ 12.0 BaO 10.0 ~ 16.0 ZnO 0 ~ 4.5 ZrO 2 0 ~ 1.5 TiO 2 0 ~ 1.0 CeO 2 0.1 ~ 1.0 Sb 2 O 3 0 ~ 0.4 P 2 O 5 0 ~ 1.5, Na 2 O wt% / (Na 2 O wt% + K 2 O wt%) = 0.1
2. A cathode ray tube panel glass according to claim 1, wherein said glass is 0 to 0.20.
JP2134604A 1990-05-24 1990-05-24 CRT panel glass Expired - Lifetime JP3007653B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2134604A JP3007653B2 (en) 1990-05-24 1990-05-24 CRT panel glass

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2134604A JP3007653B2 (en) 1990-05-24 1990-05-24 CRT panel glass

Publications (2)

Publication Number Publication Date
JPH0431335A JPH0431335A (en) 1992-02-03
JP3007653B2 true JP3007653B2 (en) 2000-02-07

Family

ID=15132288

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2134604A Expired - Lifetime JP3007653B2 (en) 1990-05-24 1990-05-24 CRT panel glass

Country Status (1)

Country Link
JP (1) JP3007653B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1439151A1 (en) * 2003-01-10 2004-07-21 L. Electric Glass Co., Ltd. Lead free glass and a glass tube made therefrom

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5108960A (en) * 1991-02-13 1992-04-28 Corning Incorporated Glasses for cathode ray tube faceplates
WO1998001399A1 (en) * 1995-04-14 1998-01-15 Nippon Electric Glass Co., Ltd. Substrate glass and plasma display made by using the same
KR100437139B1 (en) * 1997-07-16 2004-08-25 삼성코닝 주식회사 Substrate glass composition for plasma image display panel, increasing deformation point and transition point and having low expansibility
CN1100734C (en) * 1999-12-23 2003-02-05 洛阳玻璃股份有限公司 Glass substrate of plasma display screen
SG99350A1 (en) * 2000-02-17 2003-10-27 Hoya Corp Glass for cathode-ray tube, strengthened glass, method for the production thereof and use thereof
JP2003137596A (en) 2001-10-30 2003-05-14 Nippon Electric Glass Co Ltd Panel glass for cathode-ray tube
CN1548394A (en) * 2003-05-21 2004-11-24 河南安彩集团成都电子玻璃有限公司 Glass for glass bulb screen of monochromic projection tube and its production process
JP4811779B2 (en) * 2005-05-19 2011-11-09 日本電気硝子株式会社 GLASS COMPOSITION FOR LIGHTING, TUBE GLASS USING THE SAME, Fluorescent Lamp Bulb, Stem Tube, Incandescent Ball

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1439151A1 (en) * 2003-01-10 2004-07-21 L. Electric Glass Co., Ltd. Lead free glass and a glass tube made therefrom

Also Published As

Publication number Publication date
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