JP2966591B2 - Optical semiconductor device - Google Patents

Optical semiconductor device

Info

Publication number
JP2966591B2
JP2966591B2 JP19422291A JP19422291A JP2966591B2 JP 2966591 B2 JP2966591 B2 JP 2966591B2 JP 19422291 A JP19422291 A JP 19422291A JP 19422291 A JP19422291 A JP 19422291A JP 2966591 B2 JP2966591 B2 JP 2966591B2
Authority
JP
Japan
Prior art keywords
optical semiconductor
lead frame
semiconductor device
integrated circuit
lead
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP19422291A
Other languages
Japanese (ja)
Other versions
JPH0537021A (en
Inventor
啓一 蓮仏
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sanyo Electric Co Ltd
Sanyo Denki Co Ltd
Original Assignee
Tottori Sanyo Electric Co Ltd
Sanyo Denki Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tottori Sanyo Electric Co Ltd, Sanyo Denki Co Ltd filed Critical Tottori Sanyo Electric Co Ltd
Priority to JP19422291A priority Critical patent/JP2966591B2/en
Publication of JPH0537021A publication Critical patent/JPH0537021A/en
Application granted granted Critical
Publication of JP2966591B2 publication Critical patent/JP2966591B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L25/00Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof
    • H01L25/16Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof the devices being of types provided for in two or more different main groups of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. forming hybrid circuits
    • H01L25/167Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof the devices being of types provided for in two or more different main groups of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. forming hybrid circuits comprising optoelectronic devices, e.g. LED, photodiodes
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805Shape
    • H01L2224/4809Loop shape
    • H01L2224/48091Arched
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/30Technical effects
    • H01L2924/301Electrical effects
    • H01L2924/3025Electromagnetic shielding

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Power Engineering (AREA)
  • Led Device Packages (AREA)
  • Led Devices (AREA)
  • Selective Calling Equipment (AREA)
  • Optical Communication System (AREA)

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】本発明は光リモコンなどに好適な光半導体
装置に関する。
The present invention relates to an optical semiconductor device suitable for an optical remote controller or the like.

【0002】[0002]

【従来の技術】近年、オーディオ装置、空調機器、テレ
ビジョン受信機など多くの室内機器に於て、赤外光が雑
音に強くまた比較的多くの情報量を短時間に伝達出来、
さらには短い伝達距離で制御可能なので、光半導体素子
を利用した光リモコンが利用されつつある。その光リモ
コンに用いる光半導体装置は例えば特開昭61−222
182号公報に開示されており、その応用例を図7に示
す。この図に於て、絶縁基板61上に形成された接地電
極62上に、発光ダイオード63と集積回路素子64が
設けられ、絶縁基板61上に電源端子65が設けられて
いる。この様な複数個の光半導体装置66を設けた大基
板67に縦横にV溝68を設けて、手作業により1個ず
つ切り落としていた。
2. Description of the Related Art In recent years, in many indoor devices such as audio devices, air conditioners, and television receivers, infrared light is strong against noise and can transmit a relatively large amount of information in a short time.
Furthermore, since it can be controlled with a short transmission distance, an optical remote controller using an optical semiconductor element is being used. An optical semiconductor device used for the optical remote controller is disclosed in, for example,
No. 182, and an application example thereof is shown in FIG. In this figure, a light emitting diode 63 and an integrated circuit element 64 are provided on a ground electrode 62 formed on an insulating substrate 61, and a power supply terminal 65 is provided on the insulating substrate 61. V-grooves 68 are provided vertically and horizontally on such a large substrate 67 on which a plurality of optical semiconductor devices 66 are provided, and these are manually cut off one by one.

【0003】[0003]

【発明が解決しようとする課題】しかして、上述の技術
の第1の欠点は、手作業により1個ずつ切り落とす手間
と、集積回路素子64の端子の数に相当する電源端子6
5を設ける手間と、発光ダイオード63と集積回路素子
64と電源端子65にそれぞれワイヤボンドするため
に、変形し易い薄い絶縁基板61の下に補強板(図示せ
ず)を設ける手間が必要なため、製造が困難となる事で
ある。第2の欠点は、絶縁基板61の表面に順に部品を
配列しているので、外形が大きくなるので装置が小型に
ならない事である。第3の欠点は、絶縁基板61の表面
上の発光ダイオード63から放射された光が同一絶縁基
板61上の集積回路素子64を励起し、誤動作を起こす
事である。故に本発明は上述の欠点を鑑みてなされたも
のであり、すなわち製造し易く小型の、誤動作しない光
半導体装置を提供するものである。
However, the first disadvantage of the above-mentioned technique is that the labor of cutting off one by one manually and the number of power supply terminals 6 corresponding to the number of terminals of the integrated circuit element 64 are large.
5 and the time required to provide a reinforcing plate (not shown) under a thin insulating substrate 61 that is easily deformed in order to wire-bond to the light emitting diode 63, the integrated circuit element 64, and the power supply terminal 65, respectively. It is difficult to manufacture. A second drawback is that since the components are arranged in order on the surface of the insulating substrate 61, the external shape becomes large, so that the device is not downsized. A third disadvantage is that light emitted from the light emitting diodes 63 on the surface of the insulating substrate 61 excites the integrated circuit elements 64 on the same insulating substrate 61 and causes malfunction. Therefore, the present invention has been made in view of the above-mentioned drawbacks, that is, it is an object of the present invention to provide a small-sized optical semiconductor device which is easy to manufacture and does not malfunction.

【0004】[0004]

【課題を解決するための手段】本発明は上述の課題を解
決するために、第1のリードフレームとそれと離れて位
置する第2のリードフレームと、第1のリードフレーム
の表面上に固着された光半導体素子と、第1又は第2の
リードフレームの裏面上に固着された集積回路素子を設
ける。そして光半導体素子及び集積回路素子の外側に形
成された外枠部と第1、第2のリードフレームの隙間に
形成された内枠部を有する樹脂体を設ける。更に望しく
は、第1、第2のリードフレームを隙間近傍に於て、断
面略凸状の先細り形状とするか、又は内枠部を第1、第
2のリードフレームの先端を覆う様に断面略I字状に設
ける。
SUMMARY OF THE INVENTION In order to solve the above-mentioned problems, the present invention provides a first lead frame, a second lead frame located apart from the first lead frame, and a first lead frame fixed on a surface of the first lead frame. And an integrated circuit element fixed on the back surface of the first or second lead frame. A resin body having an outer frame formed outside the optical semiconductor element and the integrated circuit element and an inner frame formed in a gap between the first and second lead frames is provided. More desirably, the first and second lead frames are tapered in the vicinity of the gap so as to have a substantially convex cross section, or the inner frame portion is formed so as to cover the tips of the first and second lead frames. It is provided in a substantially I-shaped cross section.

【0005】[0005]

【作用】上述の様に、光半導体素子と集積回路素子が固
着された第1、第2のリードフレームのパターンを複数
個設けたフレーム群を金型によるプレスにて1度に1個
ずつ切り落とす事が出来るので製造し易い。そして第1
のリードフレームの表面に光半導体素子を固着し、第1
又は第2のリードフレームの裏面に集積回路素子を固着
するので、両面を有効利用することにより装置が小型に
なる。また第1、第2のリードフレームの隙間を内枠部
で仕切るので、光半導体素子から放射した光は集積回路
素子を励起しない。
As described above, a frame group provided with a plurality of first and second lead frame patterns to which an optical semiconductor element and an integrated circuit element are fixed is cut off one by one at a time by a die press. It is easy to manufacture because it can do things. And the first
The optical semiconductor element is fixed to the surface of the lead frame of
Alternatively, since the integrated circuit element is fixed to the back surface of the second lead frame, the size of the device can be reduced by effectively using both surfaces. Further, since the gap between the first and second lead frames is partitioned by the inner frame portion, light emitted from the optical semiconductor element does not excite the integrated circuit element.

【0006】[0006]

【実施例】以下に受光素子を用いた本発明の第1実施例
を図に従って説明する。図1(a)は本実施例に係る光
半導体装置の平面図であり、図1(b)はそれのAA断
面図であり、図1(c)は本装置の下面図である。これ
らの図に於て、第1のリードフレーム1と第2のリード
フレーム2、3、4はそれぞれ離れて位置し、すべて鉄
などから成りメッキされている。光半導体素子5は例え
ばP型基板に燐を拡散して形成されたPINオートダイ
オードから成る受光素子であり、第1のリードフレーム
1の表面上に載置、固着されている。集積回路素子6は
例えば増幅器とフィルタと復調回路と波形整形回路とト
ランジスターから成り、第2のリードフレーム2の裏面
上に載置、固着されている。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS A first embodiment of the present invention using a light receiving element will be described below with reference to the drawings. FIG. 1A is a plan view of an optical semiconductor device according to the present embodiment, FIG. 1B is a cross-sectional view along the line AA, and FIG. 1C is a bottom view of the present device. In these figures, the first lead frame 1 and the second lead frames 2, 3, and 4 are separated from each other, and are all made of iron or the like and plated. The optical semiconductor element 5 is, for example, a light receiving element composed of a PIN auto diode formed by diffusing phosphorus in a P-type substrate, and is mounted and fixed on the surface of the first lead frame 1. The integrated circuit element 6 includes, for example, an amplifier, a filter, a demodulation circuit, a waveform shaping circuit, and a transistor, and is mounted and fixed on the back surface of the second lead frame 2.

【0007】樹脂体7は例えばポリフェニレンサルファ
イド等の耐熱性熱可塑樹脂から成り外枠部8と内枠部9
を有し、第1、第2のリードフレーム1と2、3、4の
周辺を覆う様に成形加工されている。外枠部8の上側は
光半導体素子5の外側に位置し、外枠部8の下側は集積
回路素子6の外側に位置し、外形が略直方体状に形成さ
れる。内枠部9は第1、第2のリードフレーム1と2、
3、4の隙間を埋める様に形成される。金属細線10、
11、12、13、14はすべて金等から成りそれぞれ
光半導体素子5と第2のリードフレーム2の間、集積回
路素子6と第1のリードフレーム1との間、第2のリー
ドフレーム4との間、第2のリードフレーム2との間、
および第2のリードフレーム3との間でワイヤボンディ
ングされている。透光性樹脂15はエポキシ樹脂等から
成り、光半導体素子5と金属細線10の周辺を覆い、外
枠部8の上側の凹部を覆う様に形成される。遮光性樹脂
16は遮光性を有する黒色の樹脂から成り、集積回路素
子6と金属細線11、12、13と14の周辺を覆い、
外枠部8の下側の凹部を覆う様に形成される。これらの
部品により光半導体装置17は構成されている。Vcc
とGNDは集積回路素子6内の各回路に与えられる印加
電位と接地電位である。電気的信号を変調された赤外光
を受けとった光半導体素子5からの信号VINは、集積回
路素子6を経て、第2のリードフレーム3に電気信号V
oを与える。
The resin body 7 is made of a heat-resistant thermoplastic resin such as polyphenylene sulfide, for example.
And formed so as to cover the periphery of the first and second lead frames 1, 2, 3, and 4. The upper side of the outer frame part 8 is located outside the optical semiconductor element 5, and the lower side of the outer frame part 8 is located outside the integrated circuit element 6, and the outer shape is formed in a substantially rectangular parallelepiped shape. The inner frame portion 9 includes first and second lead frames 1 and 2,
It is formed so as to fill gaps 3 and 4. Metal wire 10,
11, 12, 13, and 14 are all made of gold or the like, respectively, between the optical semiconductor element 5 and the second lead frame 2, between the integrated circuit element 6 and the first lead frame 1, and between the optical semiconductor element 6 and the first lead frame 1. , Between the second lead frame 2,
And the second lead frame 3 is wire-bonded. The translucent resin 15 is made of an epoxy resin or the like, and is formed so as to cover the periphery of the optical semiconductor element 5 and the thin metal wire 10 and to cover the upper concave portion of the outer frame portion 8. The light-shielding resin 16 is made of a black resin having a light-shielding property, and covers the periphery of the integrated circuit element 6 and the thin metal wires 11, 12, 13, and 14.
It is formed so as to cover the lower concave portion of the outer frame portion 8. The optical semiconductor device 17 is constituted by these components. Vcc
And GND are an applied potential and a ground potential applied to each circuit in the integrated circuit element 6. The signal V IN from the optical semiconductor device 5 that has received the infrared light obtained by modulating the electric signal is transmitted to the second lead frame 3 via the integrated circuit device 6 and the electric signal V IN is outputted.
give o.

【0008】更に本光半導体装置の製造工程を述べる。
図1(a)で示したリードフレームのパターンを複数個
設けたフレーム群を金型によるプレスにて打抜くと、パ
ターン間に継ぎ部を有するフレーム群が完成する。これ
をメッキ処理する。外枠部8と内枠部9を有する樹脂体
7を各パターン毎に形成する様にインジェクション成形
する。次に第1のリードフレーム1の表面上に光半導体
素子5をダイボンディング及びワイヤボンディングす
る。第2のリードフレーム2の裏面上に集積回路素子6
をダイボンディング及びワイヤボンディングする。透光
性樹脂15及び遮光性樹脂16をモールドする。そして
フレーム群の継ぎ部を金型によりプレスすると1個ずつ
の光半導体装置17が得られる。その後、必要に応じ
て、図1(b)に示す様に、第1、第2のリードフレー
ム1と2、3、4の折曲げを行っても良い。
Next, the manufacturing process of the present optical semiconductor device will be described.
When a frame group provided with a plurality of lead frame patterns shown in FIG. 1A is punched by a press using a mold, a frame group having a joint between the patterns is completed. This is plated. Injection molding is performed so that the resin body 7 having the outer frame portion 8 and the inner frame portion 9 is formed for each pattern. Next, the optical semiconductor element 5 is die-bonded and wire-bonded on the surface of the first lead frame 1. The integrated circuit element 6 is provided on the back surface of the second lead frame 2.
Is subjected to die bonding and wire bonding. The light-transmitting resin 15 and the light-shielding resin 16 are molded. Then, when the joints of the frame group are pressed with a mold, one optical semiconductor device 17 is obtained. Thereafter, if necessary, the first and second lead frames 1, 2, 3, and 4 may be bent as shown in FIG. 1B.

【0009】次に発光ダイオードを用いた本発明の第2
実施例を図に従って説明する。図2(a)は本実施例に
係る光半導体装置の平面図であり、図2(b)はそれの
BB断面図であり、図2(c)は本装置の下面図であ
る。これらの図に於て、第1のリードフレーム18、1
9、20と第2のリードフレーム21、22、23はそ
れぞれ離れて位置し、すべて鉄等から成りメッキされて
いる。光半導体素子24、25、26はそれぞれ第1の
リードフレーム18、19、20の表面上に載置固着さ
れ、例えばGaAlAsから成る発光ダイオードであ
る。集積回路素子27は例えば波形整形回路と変調回路
とトランジスターから成り、第2のリードフレーム21
の裏面上に載置、固着されている。
Next, the second embodiment of the present invention using a light emitting diode
An embodiment will be described with reference to the drawings. FIG. 2A is a plan view of the optical semiconductor device according to the present embodiment, FIG. 2B is a BB cross-sectional view thereof, and FIG. 2C is a bottom view of the present device. In these figures, the first lead frames 18, 1
The lead frames 9, 20 and the second lead frames 21, 22, 23 are separated from each other and are all made of iron or the like and plated. The optical semiconductor elements 24, 25, 26 are mounted and fixed on the surfaces of the first lead frames 18, 19, 20, respectively, and are light emitting diodes made of, for example, GaAlAs. The integrated circuit element 27 includes, for example, a waveform shaping circuit, a modulation circuit, and a transistor.
Is mounted and fixed on the back surface.

【0010】ポリフェニレンサルファイド等から成る樹
脂体28は、光半導体素子24、25、26及び集積回
路素子27の外側に形成された外枠部29及び第1のリ
ードフレーム18、19、20と第2のリードフレーム
21、22、23の隙間を埋める様に形成された内枠部
30を有する。金属細線は、光半導体素子24、25、
26と各リードフレームとの間及び集積回路素子27と
各リードフレームとの間でワイヤボンディングされてい
る。透光性樹脂31は光半導体素子24、25、26と
金属細線を覆う様に形成される。遮光性樹脂32は集積
回路素子27と金属細線を覆う様に形成される。これら
により光半導体装置33が構成されている。第2のリー
ドフレーム22から入った電気信号VINは、集積回路素
子27を経て、光半導体素子24、25、26から電気
信号を変調された赤外光として発光される。
A resin body 28 made of polyphenylene sulfide or the like is provided with an outer frame portion 29 formed outside the optical semiconductor elements 24, 25, 26 and the integrated circuit element 27, the first lead frames 18, 19, 20 and the second lead frame. Has an inner frame portion 30 formed so as to fill the gaps between the lead frames 21, 22, and 23 of FIG. The thin metal wires are the optical semiconductor elements 24, 25,
26 and the lead frame, and between the integrated circuit element 27 and each lead frame. The translucent resin 31 is formed so as to cover the optical semiconductor elements 24, 25, 26 and the fine metal wires. The light-shielding resin 32 is formed so as to cover the integrated circuit element 27 and the fine metal wires. These constitute an optical semiconductor device 33. The electric signal V IN entered from the second lead frame 22 passes through the integrated circuit element 27 and is emitted from the optical semiconductor elements 24, 25, 26 as infrared light obtained by modulating the electric signal.

【0011】次に本発明の第3実施例を図に従って説明
する。図3(a)は本実施例に係る光半導体装置の平面
図であり、図3(b)はそれのDD断面図である。これ
らの図に於て、第1のリードフレーム34と第2のリー
ドフレーム35、36、37、38、39、40、4
1、42、43はそれぞれ鉄等から成り離れて位置して
いる。そして、これらのリードフレームは互いの隙間近
傍に於て、端部44の断面が略凸状の先細りの形状を成
す様に、コイニングプレスして形成されメッキ処理され
る。光半導体素子45は第1のリードフレーム34の表
面上に載置、固着され、集積回路素子46は第1のリー
ドフレーム34の裏面上に載置、固着される。樹脂体4
7は外枠部48と内枠部49を有し、外枠部48は第
1、第2のリードフレーム34ないし43の周辺を覆う
様に形成される。内枠部49は端部44の周辺を覆って
いる。この様なリードフレームの端部44の形状をする
ことにより、リードフレームの固定が強固になる。
Next, a third embodiment of the present invention will be described with reference to the drawings. FIG. 3A is a plan view of the optical semiconductor device according to the present embodiment, and FIG. 3B is a cross-sectional view of the optical semiconductor device taken along the line DD. In these figures, a first lead frame 34 and second lead frames 35, 36, 37, 38, 39, 40, 4
Reference numerals 1, 42, and 43 are made of iron or the like and are located apart from each other. These lead frames are formed by coining press and plated so that the cross section of the end portion 44 has a tapered shape having a substantially convex shape in the vicinity of the gap between the lead frames. The optical semiconductor element 45 is mounted and fixed on the front surface of the first lead frame 34, and the integrated circuit element 46 is mounted and fixed on the back surface of the first lead frame 34. Resin body 4
7 has an outer frame portion 48 and an inner frame portion 49, and the outer frame portion 48 is formed so as to cover the periphery of the first and second lead frames 34 to 43. The inner frame 49 covers the periphery of the end 44. With such a shape of the end portion 44 of the lead frame, the fixing of the lead frame is strengthened.

【0012】更にリードフレームの固定を強固にする他
の手段として、本発明の第4実施例を図4の断面図に従
って説明する。内枠部50は第1、第2のリードフレー
ム51、52の先端を覆う様に断面略I字状に形成され
ている。この様な内枠部50の形状をすればリードフレ
ームの固定が強固になる。
As another means for further fixing the lead frame, a fourth embodiment of the present invention will be described with reference to the sectional view of FIG. The inner frame portion 50 is formed in a substantially I-shaped cross section so as to cover the tips of the first and second lead frames 51 and 52. With such a shape of the inner frame portion 50, the fixing of the lead frame becomes strong.

【0013】次に本発明の応用例として、第5実施例を
図5の断面図に従って説明する。この図に於て、光半導
体装置17は第1実施例で述べたものと同一である。外
枠樹脂体53は耐熱性、耐湿性、耐薬品性、耐圧性の優
れた樹脂、例えばシリカ又はグラスファイバーを充填さ
れたエポキシ樹脂から成り、光半導体装置17を包む様
に成形される。そして外枠樹脂体53にレンズ部54を
形成すれば、光半導体素子5に対して集光性が向上する
効果が得られる。
Next, as an application example of the present invention, a fifth embodiment will be described with reference to the sectional view of FIG. In this figure, the optical semiconductor device 17 is the same as that described in the first embodiment. The outer frame resin body 53 is made of a resin having excellent heat resistance, moisture resistance, chemical resistance, and pressure resistance, for example, an epoxy resin filled with silica or glass fiber, and is formed so as to surround the optical semiconductor device 17. When the lens portion 54 is formed on the outer frame resin body 53, an effect of improving the light collecting property for the optical semiconductor element 5 can be obtained.

【0014】更に、本発明の他の応用例として、第6実
施例を図6の断面図に従って説明する。外枠樹脂体55
はシリカ又はグラスファイバー入りのエポキシ樹脂から
成り光半導体装置17の上半分の外形より少し大きい内
形寸法にて成形される。そして光半導体装置17の上半
分に挿入して、例えば接着剤等で固定される。これによ
り第5実施例より簡単な装置が得られる。
Further, as another application example of the present invention, a sixth embodiment will be described with reference to the sectional view of FIG. Outer frame resin body 55
Is formed of an epoxy resin containing silica or glass fiber, and is formed with an inner size slightly larger than the outer shape of the upper half of the optical semiconductor device 17. Then, it is inserted into the upper half of the optical semiconductor device 17 and fixed with, for example, an adhesive. As a result, a device simpler than that of the fifth embodiment can be obtained.

【0015】また上述のすべての実施例に於て、集積回
路素子は複数の第2のリードフレーム中の1個のリード
フレーム上に設けたが、複数の第2のリードフレームに
またがって載置、固着しても構わない。更に上述のすべ
ての実施例に於て、集積回路素子はダイボンディングさ
れるが、他の手段として半田リフロー等により固定して
も良い。
In all of the embodiments described above, the integrated circuit device is provided on one of the plurality of second lead frames, but is mounted on the plurality of second lead frames. , May be fixed. Further, in all of the above embodiments, the integrated circuit element is die-bonded, but may be fixed by solder reflow or the like as another means.

【0016】[0016]

【発明の効果】本発明は上述の様に、光半導体素子と集
積回路素子をリードフレームに固着するので、このパタ
ーンを複数個設けたフレーム群を金型によるプレスにて
1度に1個ずつ切り落とす事が出来るから、製造し易
い。そして第1のリードフレームの表面に光半導体素子
を固着し、第1又は第2のリードフレームの裏面に集積
回路素子を固着するので、両面を有効利用することによ
り装置が小型になる。また第1、第2のリードフレーム
の隙間を内枠部で仕切るので、光半導体素子からの光が
集積回路素子に影響を与えないから、誤動作を生じな
い。
According to the present invention, as described above, the optical semiconductor element and the integrated circuit element are fixed to the lead frame. Therefore, a frame group provided with a plurality of the patterns is pressed one by one by a die. Easy to manufacture because it can be cut off. Since the optical semiconductor element is fixed to the front surface of the first lead frame and the integrated circuit element is fixed to the rear surface of the first or second lead frame, the size of the device can be reduced by effectively using both surfaces. Further, since the gap between the first and second lead frames is partitioned by the inner frame portion, the light from the optical semiconductor element does not affect the integrated circuit element, so that no malfunction occurs.

【0017】更に、本発明は第1、第2のリードフレー
ムに外枠部を設け、リードフレームの隙間に内枠部を設
けて装置を補強しているので、ワイヤボンディング時に
装置が変形しない。また内枠部を設ける事により、上の
実装面と下の実装面を完全に分離している。そして上の
光半導体素子の固定はダイボンディングとワイヤボンデ
ィングし、下の集積回路素子の固定は半田リフローによ
る事も出来る。故に、上での実装方法と下での実装方法
を別々の方法で行なえ、素子に適した実装方法が選択で
きるという利点が得られる。そして上の実装面と下の実
装面を完全に分離しているので、上の実装面では光半導
体素子を透光性樹脂で覆い、下の実装面では集積回路素
子を遮光性樹脂で覆う様に、素子とその用途に合せてパ
ッケージ方法と材料を選択できるという利点が得られ
る。
Further, according to the present invention, since the outer frame portion is provided on the first and second lead frames and the inner frame portion is provided in the gap between the lead frames to reinforce the device, the device does not deform during wire bonding. By providing the inner frame portion, the upper mounting surface and the lower mounting surface are completely separated. The upper optical semiconductor element can be fixed by die bonding and wire bonding, and the lower integrated circuit element can be fixed by solder reflow. Therefore, there is an advantage that the above mounting method and the lower mounting method can be performed by different methods, and a mounting method suitable for the element can be selected. Since the upper mounting surface and the lower mounting surface are completely separated from each other, cover the optical semiconductor element with a translucent resin on the upper mounting surface, and cover the integrated circuit element with a light-shielding resin on the lower mounting surface. In addition, there is an advantage that the packaging method and material can be selected according to the device and its use.

【0018】また、樹脂体の表面に接して外枠樹脂体を
設ける事により、集光性が向上し、耐熱性、耐湿性、耐
薬品性、耐圧性を確保できる。更に、第1、第2のリー
ドフレームの端部を断面略凸状に形成し、又は内枠部を
略I字状に形成する事により第1、第2のリードフレー
ムの支持力が増加し固定が強固になる。故にワイヤボン
ド時に変形しないし、半導体装置自体の強度が確保され
る。更に、従来の装置は高価格の絶縁基板を用いるが、
本発明は低価格のリードフレームを用いるので低価格の
光半導体装置が得られる。また従来では外部端子を独立
した工程中に設けていたが、本発明では外部端子を通常
の工程に設けているので、工程が少なくなり、コストも
下がる。
Further, by providing the outer frame resin body in contact with the surface of the resin body, the light collecting property is improved, and heat resistance, moisture resistance, chemical resistance, and pressure resistance can be secured. Further, by forming the end portions of the first and second lead frames to have a substantially convex cross section or forming the inner frame portion to have a substantially I-shape, the supporting force of the first and second lead frames increases. Fixation becomes strong. Therefore, it is not deformed at the time of wire bonding, and the strength of the semiconductor device itself is secured. Furthermore, conventional devices use expensive insulating substrates,
Since the present invention uses a low-cost lead frame, a low-cost optical semiconductor device can be obtained. In the related art, the external terminals are provided in an independent process, but in the present invention, the external terminals are provided in a normal process, so that the number of processes is reduced and the cost is reduced.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の第1実施例に係る光半導体装置の平面
図(a)と、それのAA断面図(b)と、本装置の下面
図(c)である。
FIG. 1A is a plan view of an optical semiconductor device according to a first embodiment of the present invention, FIG. 1B is an AA cross-sectional view thereof, and FIG.

【図2】本発明の第2実施例に係る光半導体装置の平面
図(a)と、それのBB断面図(b)と、本装置の下面
図(c)である。
2A is a plan view of an optical semiconductor device according to a second embodiment of the present invention, FIG. 2B is a cross-sectional view of the device, and FIG. 2B is a bottom view of the device.

【図3】本発明の第3実施例に係る光半導体装置の平面
図(a)と、それのDD断面図(b)である。
FIG. 3A is a plan view of an optical semiconductor device according to a third embodiment of the present invention, and FIG.

【図4】本発明の第4実施例に係る光半導体装置の断面
図である。
FIG. 4 is a sectional view of an optical semiconductor device according to a fourth embodiment of the present invention.

【図5】本発明の第5実施例に係る光半導体装置の断面
図である。
FIG. 5 is a sectional view of an optical semiconductor device according to a fifth embodiment of the present invention.

【図6】本発明の第6実施例に係る光半導体装置の断面
図である。
FIG. 6 is a sectional view of an optical semiconductor device according to a sixth embodiment of the present invention.

【図7】従来の光半導体装置の断面図である。FIG. 7 is a sectional view of a conventional optical semiconductor device.

【符号の説明】[Explanation of symbols]

1 第1のリードフレーム 2、3、4 第2のリードフレーム 5 光半導体素子 6 集積回路素子 7 樹脂体 8 外枠部 9 内枠部 17 光半導体装置 REFERENCE SIGNS LIST 1 first lead frame 2, 3, 4 second lead frame 5 optical semiconductor element 6 integrated circuit element 7 resin body 8 outer frame section 9 inner frame section 17 optical semiconductor device

───────────────────────────────────────────────────── フロントページの続き (58)調査した分野(Int.Cl.6,DB名) H01L 33/00 ──────────────────────────────────────────────────続 き Continued on the front page (58) Field surveyed (Int.Cl. 6 , DB name) H01L 33/00

Claims (2)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】 第1のリードフレームと、それと離れて
位置する第2のリードフレームと、前記第1のリードフ
レームの表面上に固着された光半導体素子と、前記第1
又は第2のリードフレームの裏面上に固着された集積回
路素子と、前記光半導体素子及び前記集積回路素子の外
側に形成された外枠部と前記第1、第2のリードフレー
ムの隙間に形成された内枠部を有する樹脂体とを具備す
る事を特徴とする光半導体装置。
A first lead frame, a second lead frame located apart from the first lead frame, an optical semiconductor element fixed on a surface of the first lead frame, and the first lead frame.
Alternatively, an integrated circuit element fixed on the back surface of the second lead frame, an outer frame formed outside the optical semiconductor element and the integrated circuit element, and a gap formed between the first and second lead frames. An optical semiconductor device, comprising: a resin body having an inner frame portion formed.
【請求項2】 前記第1、第2のリードフレームが前記
隙間近傍に於て、断面略凸状の先細りの形状を成し、又
は前記内枠部が前記第1、第2のリードフレームの先端
を覆う様に断面略I字状を成す事を特徴とする請求項1
の光半導体装置。
2. The method according to claim 1, wherein the first and second lead frames have a tapered shape having a substantially convex cross section in the vicinity of the gap, or the inner frame portion is formed of a tapered shape of the first and second lead frames. 2. A substantially I-shaped section so as to cover the tip.
Optical semiconductor device.
JP19422291A 1991-08-02 1991-08-02 Optical semiconductor device Expired - Fee Related JP2966591B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP19422291A JP2966591B2 (en) 1991-08-02 1991-08-02 Optical semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP19422291A JP2966591B2 (en) 1991-08-02 1991-08-02 Optical semiconductor device

Publications (2)

Publication Number Publication Date
JPH0537021A JPH0537021A (en) 1993-02-12
JP2966591B2 true JP2966591B2 (en) 1999-10-25

Family

ID=16320993

Family Applications (1)

Application Number Title Priority Date Filing Date
JP19422291A Expired - Fee Related JP2966591B2 (en) 1991-08-02 1991-08-02 Optical semiconductor device

Country Status (1)

Country Link
JP (1) JP2966591B2 (en)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3497330B2 (en) * 1996-09-30 2004-02-16 シャープ株式会社 Side-emitting LED lamp and mobile phone equipped with the same
JP2002223003A (en) * 2001-01-26 2002-08-09 Nichia Chem Ind Ltd Package molding, its manufacturing method and light emitting device
JP3659635B2 (en) * 2001-04-10 2005-06-15 株式会社東芝 Optical semiconductor device
US7692206B2 (en) * 2002-12-06 2010-04-06 Cree, Inc. Composite leadframe LED package and method of making the same
KR100650191B1 (en) * 2005-05-31 2006-11-27 삼성전기주식회사 High brightness led with protective function of electrostatic discharge damage
JP5038623B2 (en) * 2005-12-27 2012-10-03 株式会社東芝 Optical semiconductor device and manufacturing method thereof
DE102007001706A1 (en) 2007-01-11 2008-07-17 Osram Opto Semiconductors Gmbh Housing for optoelectronic component and arrangement of an optoelectronic component in a housing
JP2008244200A (en) * 2007-03-28 2008-10-09 ▲せん▼宗文 Manufacturing method of surface sticky type light emitting diode of single-grain and its structure
JP2008244350A (en) * 2007-03-28 2008-10-09 ▲せん▼宗文 Manufacturing method of multi-particle surface self-adhesive light emitting diode and structure of same
DE102009023854B4 (en) * 2009-06-04 2023-11-09 OSRAM Opto Semiconductors Gesellschaft mit beschränkter Haftung Optoelectronic semiconductor component
JP5742629B2 (en) * 2011-09-26 2015-07-01 東芝ライテック株式会社 LIGHT EMITTING DEVICE AND LIGHTING APPARATUS HAVING THE SAME
DE102018100946A1 (en) * 2018-01-17 2019-07-18 Osram Opto Semiconductors Gmbh COMPONENT AND METHOD FOR PRODUCING A COMPONENT

Also Published As

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