JP2956718B2 - Electromagnetic field distribution measuring device, electromagnetic wave source analysis system, and electromagnetic field analysis system - Google Patents

Electromagnetic field distribution measuring device, electromagnetic wave source analysis system, and electromagnetic field analysis system

Info

Publication number
JP2956718B2
JP2956718B2 JP3206563A JP20656391A JP2956718B2 JP 2956718 B2 JP2956718 B2 JP 2956718B2 JP 3206563 A JP3206563 A JP 3206563A JP 20656391 A JP20656391 A JP 20656391A JP 2956718 B2 JP2956718 B2 JP 2956718B2
Authority
JP
Japan
Prior art keywords
electromagnetic
electromagnetic field
main body
field
measuring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP3206563A
Other languages
Japanese (ja)
Other versions
JPH0526930A (en
Inventor
高志 原田
昌世 林
賢一 畠山
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Electric Co Ltd filed Critical Nippon Electric Co Ltd
Priority to JP3206563A priority Critical patent/JP2956718B2/en
Publication of JPH0526930A publication Critical patent/JPH0526930A/en
Application granted granted Critical
Publication of JP2956718B2 publication Critical patent/JP2956718B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【産業上の利用分野】本発明は電磁波源本体から放射さ
れる電磁波の電磁界分布測定装置、及び電磁波源解析シ
ステム、及び電磁界分析解析システムに関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an apparatus for measuring an electromagnetic field distribution of an electromagnetic wave radiated from an electromagnetic wave source body, an electromagnetic wave source analyzing system, and an electromagnetic field analyzing and analyzing system.

【0002】[0002]

【従来の技術】コンピュータ,電子医療機器などの電子
機器は、その動作時に不要な電磁波を放射し、しばしば
無線通信などへ電磁干渉を引き起こす。これに対し、多
くの国では電子機器から放射する不要電磁波に規制を設
け、上記の電磁干渉の低減を図っている。
2. Description of the Related Art Electronic devices such as computers and electronic medical devices emit unnecessary electromagnetic waves when they operate, and often cause electromagnetic interference in wireless communication and the like. In many countries, on the other hand, unnecessary electromagnetic waves emitted from electronic devices are regulated to reduce the above-mentioned electromagnetic interference.

【0003】我が国でも情報処理装置等電波障害自主規
制協議会(VCCI)により不要電磁波の放射レベルに
規制値が設けられており、本規制を満足しない電子機器
は、実質的に国内で販売できない(例えば前記協議会発
行VCCIだより、No1参照)。不要電磁波放射を抑
制するためには、電子機器本体における放射源を特定
し、電波吸収材や電磁遮へい体などを用いて放射抑制対
策が施される。
[0003] In Japan, a regulation value is set for the radiation level of unnecessary electromagnetic waves by the Voluntary Control Council for Interference by Information Processing Equipment (VCCI), and electronic equipment that does not satisfy this regulation cannot be sold substantially in Japan ( For example, from the above-mentioned VCCI issued by the Council, see No. 1). In order to suppress unnecessary electromagnetic wave radiation, a radiation source in the electronic device body is specified, and a radiation suppression measure is taken using a radio wave absorber or an electromagnetic shield.

【0004】従来、本体上の電磁波放射源の特定には、
図7のブロック図に示すような電磁波源に直接隣接して
電磁放射監視プローブを平面上に配列した装置31によ
り本体の電磁波源の強度を直接測定する方法(特願昭6
2−237363号参照)、図8に示すような本体近傍
の2次元平面上で電界もしくは磁界プローブを走査する
2次元電磁界プローブ走査装置32にて、平面上の電磁
界分布を測定し、電磁界強度マップを作製して本体表面
上の電磁波源を特定する方法(例えば、“19形ラック
のシールド対策”、電子情報通信学会,電子機器のEM
Cとその対策ワークショップ(第2会資料),P61)
などが用いられてきた。
Conventionally, to specify an electromagnetic radiation source on a main body,
A method of directly measuring the intensity of the electromagnetic wave source of the main body by an apparatus 31 in which electromagnetic radiation monitoring probes are arranged on a plane immediately adjacent to the electromagnetic wave source as shown in the block diagram of FIG.
An electromagnetic field distribution on a plane is measured by a two-dimensional electromagnetic field probe scanning device 32 for scanning an electric or magnetic field probe on a two-dimensional plane near the main body as shown in FIG. Method of creating an electromagnetic field strength map and specifying an electromagnetic wave source on the surface of the main body (for example, "Measures for shielding of 19-inch rack", IEICE, EM
C and its countermeasures workshop (material of the 2nd meeting), P61)
Etc. have been used.

【0005】また、不要電磁波の測定方法に関しては約
50〜500m2の導体面上で放射源本体から3mまた
は10m離れた点における電界強度を測定する方法が規
定されている(例えば前記VCCIだより、No1参
照)。
[0005] Further, with respect to a method for measuring an unnecessary electromagnetic wave, a method for measuring an electric field intensity at a point 3 m or 10 m away from the radiation source main body on a conductor surface of about 50 to 500 m 2 is defined (for example, the above-mentioned VCCI newsletter). , No1).

【0006】[0006]

【発明が解決しようとする課題】ところが、上記の電磁
波源の測定法によるときには、被測定対象が平面に限ら
れること、近傍界測定であるため、電磁界強度の強く測
定された部分が必ずしも放射源とは結びつかず、不要電
磁波放射抑制対策の観点からは十分でないことなどの欠
点があった。
However, when the above-described method for measuring an electromagnetic wave source is used, since the object to be measured is limited to a flat surface and the measurement is in the near field, the portion where the electromagnetic field intensity is strongly measured is not always radiated. There was a drawback that it was not linked to the source and was not sufficient from the viewpoint of measures to suppress unnecessary electromagnetic wave radiation.

【0007】また、前記不要電磁波測定法は、測定場所
として面積の広い敷地を必要とすること、本体以外から
の電磁波の影響を最小限にするため放送波や他の電磁雑
音が少ない地域、もしくは電波暗室内で行わなければな
らず、測定コストが極めて高くなり、放射抑制対策効果
の実験的評価としてふさわしくない。
In addition, the unnecessary electromagnetic wave measurement method requires a large site as a measurement place, and an area where broadcast waves and other electromagnetic noises are small in order to minimize the influence of electromagnetic waves other than the main body, or The measurement must be performed in an anechoic chamber, and the measurement cost is extremely high, which is not suitable as an experimental evaluation of radiation suppression measures.

【0008】本発明の目的は、こうした従来技術の問題
点を解決し、不要電磁波放射抑制対策に寄与する波源分
布を求めるための電磁波源解析システム、及び周囲の電
磁環境に影響されることなく放射電磁界を求めるための
電磁界解析システム、さらに前記二つのシステムの構成
上不可欠である電磁界分布を測定するための測定装置を
提供することにある。
SUMMARY OF THE INVENTION An object of the present invention is to solve such problems of the prior art, and to provide an electromagnetic wave source analysis system for obtaining a wave source distribution that contributes to measures to suppress unnecessary electromagnetic wave radiation, and to radiate the electromagnetic wave without being affected by the surrounding electromagnetic environment. An object of the present invention is to provide an electromagnetic field analysis system for obtaining an electromagnetic field, and a measuring device for measuring an electromagnetic field distribution which is indispensable in the configuration of the two systems.

【0009】[0009]

【課題を解決するための手段】上記目的を達成するた
め、本発明に係る電磁界分布測定装置は、電磁波源本体
からの電磁放射に対し、電界および磁界を測定する電磁
界測定プローブと、前記本体を固定する機構と、前記プ
ローブを前記本体周囲の空間において走査する機構と、
前記本体の近傍に位相の基準を測定するため固定された
電磁界プローブと、前記電磁界測定プローブの出力信号
の振幅と前記電磁界測定プローブと前記基準位相測定用
プローブの出力信号の位相差を測定できる受信機とを有
し、 前記電磁界測定プローブは、測定点において該電磁
界測定の感受する部分を中心として本体に対する向きを
可変とする機能を有しているものである。
In order to achieve the above object, an electromagnetic field distribution measuring apparatus according to the present invention comprises an electromagnetic wave source main body.
For measuring electric and magnetic fields in response to electromagnetic radiation from
A field measurement probe, a mechanism for fixing the main body, and the probe.
A mechanism for scanning a lobe in a space around the main body,
Fixed to measure phase reference near the body
An electromagnetic field probe and an output signal of the electromagnetic field measuring probe
For measuring the amplitude of the electromagnetic field probe and the reference phase
It has a receiver that can measure the phase difference of the probe output signal.
And the electromagnetic field measurement probe detects the electromagnetic field at the measurement point.
The orientation to the main body around the sensitive part of the field measurement
It has a variable function.

【0010】また、本発明に係る電磁波源解析システム
は、本体からの電磁放射に対し、該本体の放射電磁界の
影響が及ぶ領域に仮定した曲面もしくは平面上の電磁界
を測定し、電界と磁界の強度信号と位相信号を出力する
測定手段と、前記電界と磁界の強度信号と位相信号をデ
ジタル変換して数値データを出力するデジタル変換手段
と、前記数値データから前記本体表面及び内部の不要電
磁波放射波源の分布を求めるための逆問題解析機能を有
するコンピュータとで構成されるものである。
[0010] An electromagnetic wave source analysis system according to the present invention.
Of the body's radiated electromagnetic field
Electromagnetic field on a curved or flat surface assuming the affected area
And outputs the electric and magnetic field strength signals and phase signals
Measuring means, and decoding the intensity and phase signals of the electric and magnetic fields.
Digital conversion means for digitally converting and outputting numerical data
And unnecessary electric charges on the surface and inside of the main body from the numerical data.
It has an inverse problem analysis function to find the distribution of magnetic radiation source.
Computer.

【0011】また、本発明に係る電磁界解析システム
は、本体からの電磁放射に対し、前記本体近傍の固定点
における電界および磁界の位相を測定し、前記本体を取
り囲む閉曲面状の電界および磁界の強度と位相を測定
し、前記閉曲面状の電界および磁界の強度と、前記閉曲
面状の電界および磁界の位相と前記本体近傍の固定点に
おける電界および磁界の位相との位相差を出力する手段
と、前記閉曲面状の電界および磁界の強度信号と前記位
相差信号をデジタル変換して数値データを出力するデジ
タル変換手段と、前記数値データから前記本体の放射す
る電磁波の任意の点における電磁界を求める面積積分機
能を有するコンピュータとで構成されるものである。
Further, the electromagnetic field analysis system according to the present invention is characterized in that the electromagnetic radiation from the main body is fixed to
Measure the phase of the electric and magnetic fields at
Measures strength and phase of enclosed electric and magnetic fields
And the strength of the closed surface electric field and magnetic field, and
At the fixed point near the body and the phase of the planar electric and magnetic fields
For outputting the phase difference between the electric field and the magnetic field phase
And the intensity signal of the electric field and the magnetic field of the closed surface and the position
Digital to convert the phase difference signal to digital and output numerical data
And a computer having an area integration function for obtaining an electromagnetic field at an arbitrary point of the electromagnetic wave emitted from the main body from the numerical data.

【0012】[0012]

【0013】[0013]

【0014】[0014]

【作用】電磁波源本体を取り囲む曲面上の電磁界を測定
し、得られた電磁界分布を解析して不要電波放射抑制に
影響を与える波源分布を求める。また、電磁波源本体を
含む閉曲面上の電磁界分布を測定し、この電磁界分布か
ら任意の点における電磁界を求める。
The electromagnetic field on the curved surface surrounding the electromagnetic wave source body is measured, and the obtained electromagnetic field distribution is analyzed to obtain a wave source distribution which affects the suppression of unnecessary radio wave radiation. Further, an electromagnetic field distribution on a closed curved surface including the electromagnetic wave source main body is measured, and an electromagnetic field at an arbitrary point is obtained from the electromagnetic field distribution.

【0015】[0015]

【実施例】以下に本発明の実施例を図面を参照しながら
具体的に説明する。
DESCRIPTION OF THE PREFERRED EMBODIMENTS Embodiments of the present invention will be specifically described below with reference to the drawings.

【0016】図1は、本発明の第1の実施例による電磁
界分布測定装置1と、電磁波放射源本体2の斜視図であ
る。電磁界分布測定装置1は、互いに180°向き合わ
せて配置された二つの校正された電磁界測定プローブ3
と、電磁界測定プローブ3を支持する電磁界プローブ支
持部4、電磁界測定プローブ3を上下するためのガイド
となるポール5、電磁界測定プローブ3を電磁波放射源
本体2を通る軸を中心として180°回転させるための
回転テーブル6、電磁波放射源本体2を載せるための被
測定物固定用テーブル7、及び基底部8で構成される。
回転テーブル6は回転するが、被測定物固定用テーブル
7は高さの調整のみが可能であり回転しない。本装置1
を構成する部品,材料は、電磁界分布を乱すことがない
ようできるだけプラスチック,木などの非金属とする。
FIG. 1 is a perspective view of an electromagnetic field distribution measuring device 1 according to a first embodiment of the present invention and an electromagnetic wave radiation source main body 2. The electromagnetic field distribution measuring apparatus 1 includes two calibrated electromagnetic field measuring probes 3 which are arranged to face each other by 180 °.
And an electromagnetic field probe support 4 for supporting the electromagnetic field measurement probe 3, a pole 5 serving as a guide for moving the electromagnetic field measurement probe 3 up and down, It comprises a rotating table 6 for rotating by 180 °, an object-to-be-measured table 7 for mounting the electromagnetic wave radiation source main body 2, and a base 8.
The rotary table 6 rotates, but the DUT fixing table 7 can only adjust the height and does not rotate. This device 1
The components and materials constituting are made of non-metal such as plastic and wood as much as possible so as not to disturb the electromagnetic field distribution.

【0017】電磁界測定プローブ3は、電界測定時には
電界プローブ、磁界測定時には磁界ループを用いる。電
磁界プローブ支持部4は、ポール5に垂直に、かつ回転
の中心方向にスライドするため、電磁界測定プローブ3
の回転半径は可変である。
The electromagnetic field measuring probe 3 uses an electric field probe when measuring an electric field, and uses a magnetic field loop when measuring a magnetic field. Since the electromagnetic field probe support 4 slides perpendicular to the pole 5 and in the direction of the center of rotation, the electromagnetic field probe 3
Is variable.

【0018】電磁界測定プローブ3として一方向のみの
電界成分もしくは磁界成分を測定するプローブを使用
し、かつ直交する3方向の電界成分または磁界成分を測
定する必要がある場合を考慮して、電磁界プローブ支持
部4には、電磁界測定プローブ3の電磁界感受部を中心
として電磁界測定プローブの向きを直交する3方向で変
えられる機構を設けた。
A probe for measuring an electric field component or a magnetic field component in only one direction is used as the electromagnetic field measuring probe 3, and it is necessary to measure an electric field component or a magnetic field component in three orthogonal directions. The field probe support part 4 was provided with a mechanism that can change the direction of the electromagnetic field measurement probe in three orthogonal directions with the electromagnetic field sensing part of the electromagnetic field measurement probe 3 as the center.

【0019】本測定装置1は、電磁界測定プローブ3を
一定の半径で回転,上下,半径の方向に独立に移動でき
るため、電磁波放射源本体2を取り囲む円筒型閉曲面上
の電磁界分布を測定することができる。電磁界測定プロ
ーブ3は、校正されているため、プローブ位置における
電界、もしくは磁界の絶対値が測定できる。位相の測定
に対しては、電子機器本体の近傍に固定した別の電磁界
プローブ9を設けてこれを位相基準とする。電磁界測定
プローブ3と、測定された電磁界の信号を受信する受信
機(図示略)とは高周波ケーブル10を通して接続され
る。受信機にはネットワークアナライザ,ベクトルボル
トメータなどの振幅と位相の測定が可能な装置を用い
る。
The measuring apparatus 1 can rotate the electromagnetic field measuring probe 3 with a constant radius, move up and down, and independently move in the radial direction, so that the electromagnetic field distribution on the cylindrical closed curved surface surrounding the electromagnetic wave radiation source main body 2 can be measured. Can be measured. Since the electromagnetic field measurement probe 3 is calibrated, the absolute value of the electric field or the magnetic field at the probe position can be measured. To measure the phase, another electromagnetic field probe 9 fixed near the electronic device body is used as a phase reference. The electromagnetic field measurement probe 3 and a receiver (not shown) for receiving a signal of the measured electromagnetic field are connected through a high-frequency cable 10. Network analyzer and vector vol on receiver
Use a device such as a tomometer that can measure the amplitude and phase.

【0020】本実施例では測定の効率化のため可動する
電磁界測定プローブ3は二つとしたが、一つの電磁界測
定プローブ3を360°回転させるようにしてもよく、
また3つ以上を用いてもよい。電磁界測定プローブ3に
電気−光変換機能を内蔵し、高周波ケーブル10に代え
て光ケーブルを使用すれば、電磁界の乱れを防ぐことが
できる。
In this embodiment, the number of the electromagnetic field measuring probes 3 that can be moved is two in order to improve the efficiency of the measurement. However, one electromagnetic field measuring probe 3 may be rotated by 360 °.
Also, three or more may be used. If the electromagnetic field measuring probe 3 has a built-in electric-optical conversion function and uses an optical cable instead of the high-frequency cable 10, disturbance of the electromagnetic field can be prevented.

【0021】電磁波放射源本体2の固定方法は、テーブ
ル7の代わりに被測定放射源を釣り下げるような構造と
してもよい。電磁界測定プローブ3を走査する面すなわ
ち測定面は、円筒面に限らず球や楕円球など他の曲面
や、平面を組み合わせたものとしてもよい。
The method of fixing the electromagnetic wave radiation source main body 2 may be a structure in which the radiation source to be measured is hung instead of the table 7. The surface on which the electromagnetic field measurement probe 3 scans, that is, the measurement surface is not limited to a cylindrical surface, and may be a combination of other curved surfaces such as a sphere or an elliptical sphere, or a combination of flat surfaces.

【0022】図2は、本発明の電磁波源解析システム1
1を示すブロック図である。本システム11は、電磁波
源本体12の放射電磁界の影響が及ぶ領域に仮定した曲
面もしくは平面上の電界と磁界それぞれの強度と位相の
分布とを測定する電磁界分布測定装置13と、測定され
た電界と磁界それぞれの強度と位相とのデータをデジタ
ル数値データに変換するデジタル変換器14と、変換さ
れた電界と磁界の強度と位相とのデジタル数値データか
ら放射源の内部と表面との電流分布もしくは電荷分布を
求める逆問題計算機能を有するコンピュータ15と、求
められた波源分布を視覚的に表示する表示装置16によ
り構成される。
FIG. 2 shows an electromagnetic wave source analysis system 1 according to the present invention.
FIG. This system 11 includes an electromagnetic field distribution measuring device 13 that measures the distribution of the intensity and phase of each of the electric field and magnetic field on a curved surface or a plane assumed to be in an area affected by the radiated electromagnetic field of the electromagnetic wave source main body 12, A digital converter 14 for converting the data of the intensity and phase of each of the electric and magnetic fields into digital numerical data; It comprises a computer 15 having an inverse problem calculation function for obtaining a distribution or a charge distribution, and a display device 16 for visually displaying the obtained wave source distribution.

【0023】例えば、図3に示すような、空間中に置か
れた電磁放射源17による任意の点Pにおける電磁界
は、Maxwell方程式の積分形を用いて、
For example, as shown in FIG. 3, the electromagnetic field at an arbitrary point P due to the electromagnetic radiation source 17 placed in the space is calculated by using the integral form of the Maxwell equation.

【0024】[0024]

【式1】 (Equation 1)

【0025】J,ρは、それぞれ波源本体31における
電流密度と電荷密度,ωは角周波数,μは透磁率,εは
誘電率,j=√(−1),∇はベクトル演算子,φは、
グリーン関数(φ=exp(−jω/c)/r:rは波
源と点Pとの距離,cは光速)である(例えばSTRA
TTON著,“Electro−Magnetic T
heory”,McCGRAW−HILL BOOK
刊,p466参照)。
J and ρ are the current density and charge density in the wave source body 31, ω is the angular frequency, μ is the magnetic permeability, ε is the permittivity, j = √ (−1), ∇ is the vector operator, and φ is the vector operator. ,
Green function (φ = exp (−jω / c) / r: r is the distance between the wave source and the point P, c is the speed of light) (for example, STRA
TTON, "Electro-Magnetic T"
heory ", McCGRAW-HILL BOOK
Ed., P. 466).

【0026】したがって、測定によりE(p),H
(p)を把握すれば、逆問題解析手法により波源である
本体31上の電流密度分布,電荷密度分布を求めること
ができる。E(p),H(p)の測定範囲は、本体17
からの放射電磁波エネルギーの大部分を網羅するような
領域に設定する。
Therefore, E (p), H
If (p) is grasped, the current density distribution and the charge density distribution on the main body 31 as the wave source can be obtained by the inverse problem analysis method. The measurement range of E (p) and H (p) is
The area is set so as to cover most of the electromagnetic wave energy radiated from.

【0027】電磁波放射源を取り囲む閉曲面で電磁界分
布を測定すれば、波源17の放射するすべての電磁エネ
ルギーを捕捉できるため、信頼性の高い電磁波源分布を
求めることができる。
If the electromagnetic field distribution is measured on a closed curved surface surrounding the electromagnetic wave radiation source, all the electromagnetic energy emitted by the wave source 17 can be captured, so that a highly reliable electromagnetic wave source distribution can be obtained.

【0028】電磁界分布測定装置13には、第1の実施
例で示した電磁界分布測定装置1や他の曲面または平面
上の電磁界分布を測定できる装置を用いる。コンピュー
タ15には、電磁界分布測定装置13の制御とデジタル
変換器14の機能を含めることにより本システム全自動
化が可能である。
As the electromagnetic field distribution measuring device 13, the electromagnetic field distribution measuring device 1 shown in the first embodiment or another device capable of measuring the electromagnetic field distribution on a curved surface or a plane is used. By including the control of the electromagnetic field distribution measuring device 13 and the function of the digital converter 14 in the computer 15, the system can be fully automated.

【0029】図4は、本発明による電磁波源解析システ
ムにより求められた箱型の金属製電磁放射源本体18の
電流密度19の解析結果である。放射源表面の電荷は等
価的に電流密度に置換えて示した。この電流密度19の
分布は、放射電磁界の測定結果より求められたものであ
るため放射に寄与する成分のみが示されている。電波吸
収材,電磁遮へい体などを使用して電流密度19を抑制
することで不要電磁波抑制対策が効率的に行える。
FIG. 4 shows an analysis result of the current density 19 of the box-shaped metal electromagnetic radiation source body 18 obtained by the electromagnetic wave source analysis system according to the present invention. The charge on the radiation source surface is equivalently replaced by the current density. Since the distribution of the current density 19 is obtained from the measurement result of the radiated electromagnetic field, only components that contribute to radiation are shown. By suppressing the current density 19 using a radio wave absorbing material, an electromagnetic shield, or the like, unnecessary electromagnetic wave suppression measures can be efficiently performed.

【0030】図5は、本発明の電磁界解析システム21
を示すブロック図である。本システム21は、電磁波源
本体22を囲む閉曲面上すべての電界と磁界の強度と位
相との分布を測定する電磁界分布測定装置23と、測定
された電界と磁界それぞれの強度と位相とのデータをデ
ジタル数値データに変換するデジタル変換器24と、変
換された電界と磁界の強度と位相とのデジタル数値デー
タから閉曲面の外部の任意の点における電磁界を計算す
る面積積分機能を有するコンピュータ25と、求められ
た波源分布を視覚的に表示する表示装置26により構成
される。
FIG. 5 shows an electromagnetic field analysis system 21 according to the present invention.
FIG. The present system 21 includes an electromagnetic field distribution measuring device 23 that measures the distribution of the intensity and phase of all electric and magnetic fields on a closed curved surface surrounding the electromagnetic wave source main body 22, and the intensity and phase of each of the measured electric and magnetic fields. A digital converter 24 for converting data into digital numerical data, and a computer having an area integration function for calculating an electromagnetic field at an arbitrary point outside the closed surface from the converted digital numerical data of electric field and magnetic field intensity and phase And a display device 26 for visually displaying the obtained wave source distribution.

【0031】図6に示すように、空間上に二つの波源2
7,28があり、波源27を取り囲むように閉曲面29
を仮定すると、閉曲面29の外側の任意の点Pにおける
電界E(p)及び磁界H(p)はMaxwell方程式
の積分形の変形により閉曲面29上の電界Es,Hsを
用いて、
As shown in FIG. 6, two wave sources 2
7 and 28, a closed surface 29 surrounding the wave source 27.
Assuming that, the electric field E (p) and the magnetic field H (p) at an arbitrary point P outside the closed surface 29 are obtained by using the electric fields Es, Hs on the closed surface 29 by a modified integral form of Maxwell's equation.

【0032】[0032]

【式2】 (Equation 2)

【0033】閉曲面29上の面積積分,ωは角周波数,
μは透磁率,εは誘電率,j=√(−1),∇はベクト
ル演算子,nは閉曲面29の内向きにとった単位法線ベ
クトル,φはグリーン関数(φ=exp(−jω/c)
/r:rは閉曲面29上の任意点と点Pとの距離,cは
光速)である。
The area integral on the closed surface 29, ω is the angular frequency,
μ is magnetic permeability, ε is dielectric constant, j = j (−1), ∇ is a vector operator, n is a unit normal vector taken inward of the closed surface 29, and φ is a Green function (φ = exp (− jω / c)
/ R: r is the distance between an arbitrary point on the closed curved surface 29 and the point P, and c is the speed of light).

【0034】波源27,28と閉曲面29との位置関係
が図6に示したような場合には、(3)式,(4)式に
おいて、閉曲面29上の面積積分を実行する際に閉曲面
29の外部にある波源28からの放射電磁界の影響が取
り除かれ、P点における電界E(p),磁界H(p)は
波源27からの放射によるものだけとなる。
When the positional relationship between the wave sources 27 and 28 and the closed curved surface 29 is as shown in FIG. 6, when performing the area integration on the closed curved surface 29 in the equations (3) and (4), The influence of the electromagnetic field radiated from the wave source 28 outside the closed curved surface 29 is removed, and the electric field E (p) and the magnetic field H (p) at the point P are only due to the radiation from the wave source 27.

【0035】したがって、波源27を囲む閉曲面29上
の電磁界の分布を測定することにより(3)式,(4)
式の計算を実行してP点における電界E(p),磁界H
(p)を求めることができる。閉曲面29上に外部波源
28からの放射電磁界の影響が著しく小さい部分が存在
する場合には、この部分の電磁界測定を行わなくても、
すなわち完全な閉曲面で電磁界を測定しなくても信頼性
の高い放射電磁界が求められる。
Therefore, by measuring the distribution of the electromagnetic field on the closed curved surface 29 surrounding the wave source 27, the expression (3) and the expression (4) are obtained.
The calculation of the equation is performed to calculate the electric field E (p) and the magnetic field H at the point P.
(P) can be obtained. If there is a portion on the closed curved surface 29 where the effect of the radiated electromagnetic field from the external wave source 28 is extremely small, even if the electromagnetic field measurement of this portion is not performed,
That is, a highly reliable radiated electromagnetic field is required without measuring the electromagnetic field on a completely closed surface.

【0036】電磁界分布測定装置23には、第1の実施
例で示した電磁界分布測定装置1や他の閉曲面上の電磁
界分布を測定できる装置を用いる。コンピュータ25に
は、電磁界分布測定装置23の制御とデジタル変換器2
4の機能をもたせることにより本システム全自動化が可
能である。
As the electromagnetic field distribution measuring device 23, the electromagnetic field distribution measuring device 1 shown in the first embodiment or another device capable of measuring the electromagnetic field distribution on a closed curved surface is used. The computer 25 includes the control of the electromagnetic field distribution measuring device 23 and the digital converter 2
This system can be fully automated by providing the functions of (4).

【0037】[0037]

【発明の効果】以上説明したように本発明の電磁波源解
析システムによれば、不要電磁波放射抑制に影響を与え
る波源分布を求めることができるため、効率的に不要電
磁波抑制対策を行える効果を有する。
As described above, according to the electromagnetic wave source analysis system of the present invention, it is possible to obtain the distribution of the wave sources affecting the suppression of the unnecessary electromagnetic wave radiation, and therefore, it is possible to efficiently take measures for suppressing the unnecessary electromagnetic wave. .

【0038】また本発明の電磁界解析システムによれ
ば、放射源を囲む閉曲面の電磁界分布の測定により閉曲
面外部の波源の影響を除去できるため、周囲の電磁環境
に影響されず必要とする電磁波放射源からの電磁界を把
握できる効果を有する。
Further, according to the electromagnetic field analysis system of the present invention, the influence of the wave source outside the closed surface can be removed by measuring the electromagnetic field distribution of the closed surface surrounding the radiation source. This has the effect of being able to ascertain the electromagnetic field from the electromagnetic radiation source.

【0039】また、本発明の電磁界分布測定装置は上記
の二つのシステムを構成する電磁界分布測定装置手段に
共通して適用できる効果を有する。
Further, the electromagnetic field distribution measuring device of the present invention has an effect that can be applied commonly to the electromagnetic field distribution measuring device constituting the above two systems.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明による電磁界分布測定装置の実施例を示
す斜視図である。
FIG. 1 is a perspective view showing an embodiment of an electromagnetic field distribution measuring device according to the present invention.

【図2】本発明による電磁波源解析システムの構成を示
すブロック図である。
FIG. 2 is a block diagram showing a configuration of an electromagnetic wave source analysis system according to the present invention.

【図3】本発明の電磁波源解析システムの解析原理を示
す図である。
FIG. 3 is a diagram showing an analysis principle of the electromagnetic wave source analysis system of the present invention.

【図4】本発明の電磁波源解析システムによって得られ
た波源上の電流分布を示す図である。
FIG. 4 is a diagram showing a current distribution on a wave source obtained by the electromagnetic wave source analysis system of the present invention.

【図5】本発明による電磁界解析システムの構成を示す
ブロック図である。
FIG. 5 is a block diagram showing a configuration of an electromagnetic field analysis system according to the present invention.

【図6】本発明による電磁界解析システムの解析原理を
示す図である。
FIG. 6 is a diagram showing the analysis principle of the electromagnetic field analysis system according to the present invention.

【図7】従来技術による電磁界分布測定装置のブロック
図である。
FIG. 7 is a block diagram of a conventional electromagnetic field distribution measuring device.

【図8】従来技術による2次元電磁界分布測定装置の斜
視図である。
FIG. 8 is a perspective view of a conventional two-dimensional electromagnetic field distribution measuring device.

【符号の説明】[Explanation of symbols]

1 電磁界分布測定装置 2 電磁波放射源本体 3 電磁界測定プローブ 4 電磁界プローブ支持部 5 ポール 6 回転テーブル 7 被測定物固定用テーブル 8 基底部 9 位相基準測定用固定電磁界プローブ 10 高周波ケーブル 11 電磁波源解析システム 12 電磁波源本体 13 電磁界分布測定装置 14 アナログ−デジタル変換器 15 逆問題計算機能を有するコンピュータ 16 視覚化表示装置 17 波源 18 金属製の箱型電磁放射源 19 電流密度 21 電磁界解析システム 22 電磁波源本体 23 閉曲面上電磁界分布測定装置 24 アナログ−デジタル変換器 25 面積積分計算機能を有するコンピュータ 26 視覚化表示装置 27 閉曲面内部の波源 28 閉曲面外部の波源 29 閉曲面 DESCRIPTION OF SYMBOLS 1 Electromagnetic field distribution measuring device 2 Electromagnetic wave radiation source main body 3 Electromagnetic field measuring probe 4 Electromagnetic field probe support part 5 Pole 6 Rotary table 7 Table for fixing object to be measured 8 Base 9 Fixed electromagnetic field probe for phase reference measurement 10 High frequency cable 11 Electromagnetic wave source analysis system 12 Electromagnetic wave source body 13 Electromagnetic field distribution measuring device 14 Analog-digital converter 15 Computer having inverse problem calculation function 16 Visualization display device 17 Wave source 18 Metal box-shaped electromagnetic radiation source 19 Current density 21 Electromagnetic field Analysis system 22 Electromagnetic wave source main body 23 Electromagnetic field distribution measuring device on closed surface 24 Analog-digital converter 25 Computer having area integral calculation function 26 Visualization display device 27 Wave source inside closed surface 28 Wave source outside closed surface 29 Closed surface

フロントページの続き (56)参考文献 特開 平1−312472(JP,A) 特開 平4−329376(JP,A) 特開 平5−26928(JP,A) 実開 平2−81479(JP,U)Continuation of the front page (56) References JP-A-1-312472 (JP, A) JP-A-4-329376 (JP, A) JP-A-5-26928 (JP, A) JP-A-2-81479 (JP) , U)

Claims (3)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】電磁波源本体からの電磁放射に対し、電界
および磁界を測定する電磁界測定プローブと、前記本体
を固定する機構と、前記プローブを前記本体周囲の空間
において走査する機構と、前記本体の近傍に位相の基準
を測定するため固定された電磁界プローブと、前記電磁
界測定プローブの出力信号の振幅と前記電磁界測定プロ
ーブと前記基準位相測定用プローブの出力信号の位相差
を測定できる受信機とを有し、 前記電磁界測定プローブは、測定点において該電磁界測
定の感受する部分を中心として本体に対する向きを可変
とする機能を有している構造を特徴とする電磁界分布測
定装置。
An electromagnetic field measuring probe for measuring an electric field and a magnetic field with respect to electromagnetic radiation from an electromagnetic wave source main body; a mechanism for fixing the main body; a mechanism for scanning the probe in a space around the main body; An electromagnetic field probe fixed for measuring a phase reference near the main body, an amplitude of an output signal of the electromagnetic field measuring probe, and a phase difference between an output signal of the electromagnetic field measuring probe and an output signal of the reference phase measuring probe are measured. And a receiver capable of changing the direction of the electromagnetic field measurement probe at a measurement point with respect to the main body around a portion where the electromagnetic field measurement is sensed at the measurement point. measuring device.
【請求項2】本体からの電磁放射に対し、該本体の放射
電磁界の影響が及ぶ領域に仮定した曲面もしくは平面上
の電磁界を測定し、電界と磁界の強度信号と位相信号を
出力する測定手段と、前記電界と磁界の強度信号と位相
信号をデジタル変換して数値データを出力するデジタル
変換手段と、前記数値データから前記本体表面及び内部
の不要電磁波放射波源の分布を求めるための逆問題解析
機能を有するコンピュータとで構成されることを特徴と
する電磁波源解析システム。
2. An electromagnetic field from a main body is measured on a curved surface or a plane assumed to be in an area where the radiated electromagnetic field of the main body is affected, and an intensity signal and a phase signal of the electric and magnetic fields are output. Measuring means, digital converting means for converting the electric field and magnetic field intensity signals and phase signals into digital data and outputting numerical data, and an inverse method for obtaining the distribution of unnecessary electromagnetic wave radiation wave sources on the surface and inside of the main body from the numerical data. An electromagnetic wave source analysis system comprising a computer having a problem analysis function.
【請求項3】本体からの電磁放射に対し、前記本体近傍
の固定点における電界および磁界の位相を測定し、前記
本体を取り囲む閉曲面状の電界および磁界の強度と位相
を測定し、前記閉曲面状の電界および磁界の強度と、前
記閉曲面状の電界および磁界の位相と前記本体近傍の固
定点における電界および磁界の位相との位相差を出力す
る手段と、前記閉曲面状の電界および磁界の強度信号と
前記位相差信号をデジタル変換して数値データを出力す
るデジタル変換手段と、前記数値データから前記本体の
放射する電磁波の任意の点における電磁界を求める面積
積分機能を有するコンピュータとで構成されることを特
徴とする電磁界解析システム。
3. In the vicinity of the main body against electromagnetic radiation from the main body.
Measuring the phase of the electric and magnetic fields at the fixed point of
The strength and phase of electric and magnetic fields in the form of a closed surface surrounding the body
Are measured, and the intensity of the electric field and magnetic field of the closed
The phase of the electric field and the magnetic field of the closed curved surface and the
Outputs the phase difference between the electric and magnetic fields at a fixed point
Means, and the intensity signal of the electric field and magnetic field of the closed curved surface and
Digitally convert the phase difference signal and output numerical data
An electromagnetic field analysis system comprising: a digital conversion means; and a computer having an area integration function for obtaining an electromagnetic field at an arbitrary point of an electromagnetic wave emitted from the main body from the numerical data.
JP3206563A 1991-07-23 1991-07-23 Electromagnetic field distribution measuring device, electromagnetic wave source analysis system, and electromagnetic field analysis system Expired - Fee Related JP2956718B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3206563A JP2956718B2 (en) 1991-07-23 1991-07-23 Electromagnetic field distribution measuring device, electromagnetic wave source analysis system, and electromagnetic field analysis system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3206563A JP2956718B2 (en) 1991-07-23 1991-07-23 Electromagnetic field distribution measuring device, electromagnetic wave source analysis system, and electromagnetic field analysis system

Publications (2)

Publication Number Publication Date
JPH0526930A JPH0526930A (en) 1993-02-05
JP2956718B2 true JP2956718B2 (en) 1999-10-04

Family

ID=16525468

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3206563A Expired - Fee Related JP2956718B2 (en) 1991-07-23 1991-07-23 Electromagnetic field distribution measuring device, electromagnetic wave source analysis system, and electromagnetic field analysis system

Country Status (1)

Country Link
JP (1) JP2956718B2 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103238080A (en) * 2010-10-08 2013-08-07 萨蒂莫工业公司 Method and device for electromagnetically testing object
CN102066955B (en) * 2008-06-23 2013-12-18 微波视点公司 Improvements in determination of at least one value associated with electromagnetic radiation of object being tested

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH11281721A (en) 1998-03-31 1999-10-15 Advantest Corp Electromagnetic field measuring method
US6249248B1 (en) * 1998-04-17 2001-06-19 Advantest Corporation Radio wave visualizing method and apparatus
CA2511134C (en) * 2004-07-05 2011-04-19 Ntt Docomo, Inc. Measurement system of specific absorption rate
JP5669337B2 (en) * 2006-10-23 2015-02-12 株式会社Nttドコモ System and method for measuring specific absorption rate
JP4683342B2 (en) * 2007-01-26 2011-05-18 ジーコム株式会社 3D electromagnetic field measuring device
US8810460B2 (en) * 2009-11-05 2014-08-19 Atc Logistics & Electronics, Inc. Multidimensional RF test fixture and method for securing a wireless device for RF testing
CN104655941B (en) * 2015-03-24 2018-08-10 联想(北京)有限公司 Detection method of electromagnetic radiation, device and electronic equipment
CN106053965B (en) * 2016-07-08 2018-12-04 北京航空航天大学 A method of emf probe micro-disturbance is studied by changing radiation source type
CN108761221A (en) * 2018-08-02 2018-11-06 长虹美菱股份有限公司 A kind of test system and method for measuring space electrical field
CN113009242B (en) * 2021-02-25 2022-10-04 西安理工大学 Device and method for measuring surface potential distribution and attenuation of array fluxgate

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2755955B2 (en) * 1988-06-10 1998-05-25 日本電信電話株式会社 Electromagnetic field strength estimation method and electromagnetic field strength estimation system
JPH0281479U (en) * 1988-12-12 1990-06-22

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102066955B (en) * 2008-06-23 2013-12-18 微波视点公司 Improvements in determination of at least one value associated with electromagnetic radiation of object being tested
CN103238080A (en) * 2010-10-08 2013-08-07 萨蒂莫工业公司 Method and device for electromagnetically testing object
CN103238080B (en) * 2010-10-08 2015-08-05 萨蒂莫工业公司 For the method and apparatus that the electromagnetism of object is tested

Also Published As

Publication number Publication date
JPH0526930A (en) 1993-02-05

Similar Documents

Publication Publication Date Title
JP2956718B2 (en) Electromagnetic field distribution measuring device, electromagnetic wave source analysis system, and electromagnetic field analysis system
US5231346A (en) Field strength measuring instrument for the simultaneous detection of e and h fields
EP1452880B1 (en) Apparatus for measuring specific absorption rate of radio communication apparatus
Scharfetter et al. Magnetic induction tomography: hardware for multi-frequency measurements in biological tissues
Bucci et al. Advanced field interpolation from plane-polar samples: experimental verification
JP5249294B2 (en) Electromagnetic field distribution measuring apparatus and computer-readable recording medium
JP5669337B2 (en) System and method for measuring specific absorption rate
JP4130365B2 (en) Method and apparatus for measuring electromagnetic field strength, method for measuring electromagnetic field intensity distribution, and method and apparatus for measuring current-voltage distribution of the apparatus
AU2016313274A1 (en) Hand held devices for magnetic induction tomography
JPH1062467A (en) Unnecessary electromagnetic wave measuring system
JP3760908B2 (en) Narrow directional electromagnetic antenna probe and electromagnetic field measuring device, current distribution exploration device or electrical wiring diagnostic device using the same
JP3709708B2 (en) Electromagnetic wave source exploration device and exploration method thereof
Spang et al. Application of probes with multiple outputs on probe-compensated EMC near-field measurements
US20060017428A1 (en) Electrical magnetic interference test system
Wittmann Spherical near-field scanning: Determining the incident field near a rotatable probe
Wang et al. Research on shielding effectiveness test of bulkhead in a compartment shelter
JP2008082945A (en) Near electromagnetic field distribution measurement apparatus
Araneo et al. Exact solution of the low-frequency coplanar loops shielding configuration
Ozaki et al. Equivalent circuit model for the electric field sensitivity of a magnetic search coil of space plasma
JP2004069372A (en) Method, apparatus and program for calculating intensity of distant electromagnetic field, and recording medium recording the program
JPH08112266A (en) Simulator for scan room of mri apparatus
JPH10185973A (en) Method and device for measuring electromagnetic interference of circuit substrate
Betta et al. The accurate calibration of EMC antennas in compact chambers—Measurements and uncertainty evaluations
Loh et al. A method to minimize emission measurement uncertainty of electrically large EUTs in GTEM cells and FARs above 1 GHz
Klein et al. A large and quick induction field scanner for examining the interior of extended objects or humans

Legal Events

Date Code Title Description
A02 Decision of refusal

Free format text: JAPANESE INTERMEDIATE CODE: A02

Effective date: 19981222

A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 19990629

LAPS Cancellation because of no payment of annual fees