JP2956521B2 - Method for manufacturing high-temperature superconductor - Google Patents
Method for manufacturing high-temperature superconductorInfo
- Publication number
- JP2956521B2 JP2956521B2 JP7074254A JP7425495A JP2956521B2 JP 2956521 B2 JP2956521 B2 JP 2956521B2 JP 7074254 A JP7074254 A JP 7074254A JP 7425495 A JP7425495 A JP 7425495A JP 2956521 B2 JP2956521 B2 JP 2956521B2
- Authority
- JP
- Japan
- Prior art keywords
- film
- temperature superconductor
- oxygen
- coating
- temperature
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E40/00—Technologies for an efficient electrical power generation, transmission or distribution
- Y02E40/60—Superconducting electric elements or equipment; Power systems integrating superconducting elements or equipment
Description
【0001】[0001]
【産業上の利用分野】本発明は、高温超電導体、その製
造方法に関する。The present invention relates to a high-temperature superconductor and a method for manufacturing the same.
【0002】[0002]
【従来の技術】従来、Y1Ba2Cu3O7による超電導体
の臨界温度は90゜K程度であり、又、Y1Ba2Cu3
O7等セラミック系超電導体のコン夕ク卜構造としては
通常銀膜が接触、接続されて成るのが通例であった。Conventionally, the critical temperature of the superconductor by Y 1 Ba 2 Cu 3 O 7 is about 90 ° K, also, Y 1 Ba 2 Cu 3
The contact structure of a ceramic-based superconductor such as O 7 was generally formed by contacting and connecting a silver film.
【0003】[0003]
【発明が解決しようとする課題】しかし、上記従来技術
によると、臨界温度が上がらないと云う課題と、臨界温
度が安定しないと云う課題があった。However, according to the above-mentioned prior art, there are a problem that the critical temperature does not rise and a problem that the critical temperature is not stabilized.
【0004】本発明は、かかる従来技術の課題を解決
し、l00゜K以上で常温以上の臨界温度を安定に持っ
セラミック系高温超電導体構造、処理法及びコン夕クト
構造を提供する事を目的とする。An object of the present invention is to solve the problems of the prior art and to provide a ceramic high-temperature superconductor structure, a processing method, and a contact structure having a stable critical temperature above room temperature at 100 ° K or more. And
【0005】[0005]
【課題を解決するための手段】上記課題を解決するため
に、本発明の高温超電導体の製造方法は、Y1Ba2Cu
3O7等のセラミックス系超伝導体表面に被膜体を形成す
る工程、前記被膜体にコンタクト穴部を形成する工程、
少なくとも前記コンタクト穴部に導電性窒化膜を形成す
る工程、前記被膜体を通して酸素イオン打ち込み処理す
る工程、前記工程後アニール処理する工程を含むことを
特徴とする。また、本発明は、前記被膜体がSi3N4
であることを特徴とする。また、本発明は、前記導電性
窒化膜がTiN膜、WN膜、MoN膜、NbN膜から選
ばれた膜であることを特徴とする。In order to solve the above problems SUMMARY OF THE INVENTION The method for producing a high-temperature superconductor of the present invention, Y 1 Ba 2 Cu
A step of forming a coating on the surface of a ceramic-based superconductor such as 3 O 7, a step of forming a contact hole in the coating,
At least a step of forming a conductive nitride film in the contact hole, a step of implanting oxygen ions through the coating, and a step of annealing after the step are included. Further, the present invention provides a method as described above, wherein the coating is made of Si 3 N 4
It is characterized by being. Further, the present invention is characterized in that the conductive nitride film is a film selected from a TiN film, a WN film, a MoN film, and an NbN film.
【0006】[0006]
【作用】Y1Ba2Cu3O7等のセラミック系超電導体へ
の酸素イオン打込みの作用は、とりわけY1Ba2Cu3
O7では、酸素欠乏ぺロブスカイ卜結晶構造の酸素欠乏
位置へのラジカル酸素の導入作用があり、該ラジカル酸
素の電子のスピン方向が、Cuイオン及び酸素イオン
(結合酸素)等のラジカルイオンの電子のスピン方向と
が異なり、これら電子(又は正孔と見ても良い)のスピ
ンの相互作用が高温超電導現象を発生させる駆動力とな
って居り、酸素欠乏位置等の格子間へのラジカル酸素の
導入は正孔密度の増大により臨界温度を常温程度以上に
高める作用をする。[Action] Y 1 Ba 2 the action of oxygen ion implantation to Cu 3 O 7 or the like ceramic superconductors, inter alia Y 1 Ba 2 Cu 3
O 7 has an action of introducing radical oxygen into the oxygen-deficient position of the oxygen-deficient perovskite crystal structure, and the spin direction of the electron of the radical oxygen changes with the electron of the radical ion such as Cu ion and oxygen ion (bonded oxygen). And the spin interaction of these electrons (or holes) can be a driving force to generate the high-temperature superconductivity phenomenon. The introduction acts to increase the critical temperature to about room temperature or more by increasing the hole density.
【0007】又、Si3N4膜の形成は、Y1Ba2Cu3
O7等のセラミック系超電導体に対し圧縮応力を加える
作用があり、酸素ラジカルと銅イオンとの距離を縮め、
これ又臨界温度を高める作用があると共に、Si3N4膜
は酸素ラジカルの逸脱を防止する作用もあり、臨界温度
の安定化を計る作用がある。The formation of the Si 3 N 4 film is carried out by using Y 1 Ba 2 Cu 3
It has the effect of applying compressive stress to ceramic superconductors such as O 7 , shortening the distance between oxygen radicals and copper ions,
In addition to the action of raising the critical temperature, the Si 3 N 4 film also has an action of preventing the escape of oxygen radicals and has an action of stabilizing the critical temperature.
【0008】更に、TiN膜等の導電性窒化膜をコン夕
ク卜部に用いると、接触抵抗が小さくする事が出来ると
共に、Si3N4膜と同様に臨界温度を高め、且つ安定化
する作用がある。Further, when a conductive nitride film such as a TiN film is used for the contact portion, the contact resistance can be reduced, and the critical temperature can be increased and stabilized similarly to the Si 3 N 4 film. There is.
【0009】[0009]
【実施例】以下、実施例により本発明を詳述する。The present invention will be described below in detail with reference to examples.
【0010】図lは本発明の一実施例を示す高温超電導
体構造である。すなわち、ガラスや金属から成る基板l
の表面にはCVD法によりSi3N4膜(l)2が形成さ
れ、該Si3N4膜(l)2上にはY1Ba2Cu3O7膜3
がスパッタ法等により形成され、該Y1Ba2Cu3O7表
面にはCVD法等によりSi3N4膜(2)4が被覆さ
れ、該Si3N4膜(2)4の表面から高エネルギーイオ
ン打込み装置により酸素イオン打込み5が施され、Y1
Ba2Cu3O7膜3中に酸素イオンが打込まれ、以後の
アニールにより、該打込み酸素は酸素欠乏位置等の格子
間にラジカル状態で固定されて成る。尚、Y1Ba2Cu
3O7膜3はY1Ba2Cu3O7の単体(格状や線状等)で
あっても良く、Si3N4膜は、これら単体の表面を被覆
すればよく、下地にSio2膜やA23膜が形成されてい
ても良い。更に、酸素イオン打込み5は、Y1Ba2Cu
3O7単体の表面近傍に打込まれて、中心部には打込まれ
なくても良い。又、Si3N4膜は膜のみならず被覆体で
あればよく、焼結体を表面に形成しても良い。FIG. 1 shows a high-temperature superconductor structure showing one embodiment of the present invention. That is, a substrate 1 made of glass or metal
A Si 3 N 4 film (l) 2 is formed on the surface of the substrate by a CVD method, and a Y 1 Ba 2 Cu 3 O 7 film 3 is formed on the Si 3 N 4 film (l) 2.
Is formed by a sputtering method or the like, and the surface of the Y 1 Ba 2 Cu 3 O 7 is coated with a Si 3 N 4 film (2) 4 by a CVD method or the like, and from the surface of the Si 3 N 4 film (2) 4 Oxygen ion implantation 5 is performed by a high energy ion implantation device, and Y 1
Oxygen ions are implanted into the Ba 2 Cu 3 O 7 film 3, and the implanted oxygen is fixed in a radical state between lattices at oxygen-deficient positions and the like by subsequent annealing. In addition, Y 1 Ba 2 Cu
The 3 O 7 film 3 may be a simple substance (shape, linear shape, etc.) of Y 1 Ba 2 Cu 3 O 7 , and the Si 3 N 4 film may cover the surface of these simple substances, and the base may be SiO 2. 2 films and A 23 film may be formed. Further, the oxygen ion implantation 5 is performed using Y 1 Ba 2 Cu
It may be driven into the vicinity of the surface of 3 O 7 alone and not into the center. Further, the Si 3 N 4 film is not limited to the film but may be a coating, and a sintered body may be formed on the surface.
【0011】図2は本発明の他の実施例を示す高温超電
導体のコン夕ク卜構造であり、基板llの表面にはSi
3N4膜(l)l2が形成され、該Si3N4膜(l)l2
の表面にはY1Ba2Cu3O7膜l3が形成され、該Y1
Ba2Cu3O7膜上には、Si3N4膜(2)l4が被覆
されると共に、該Si3N4膜(2)l4にはコン夕ク卜
穴が開けられ、該コンタク卜穴部にはTiN膜l5がス
パッ夕法等により形成され、該TiN膜l5上にはA膜
l6が形成されて成る。本例の場合、TiN膜はコン夕
ク卜穴を完全に埋める構造である必要があり、予じめT
iN膜l5をY1Ba2Cu3O7膜上に形成し、その上に
Si3N4膜(2)l4を形成し、前記TiN膜l5上の
Si3N4膜のコン夕ク卜穴開けを施す等の構造、方法を
とっても良く、又、A膜l6はAg膜等の他の導電材料
であっても良い。更に、TiN膜l5はWN、MoN、
NbN等他の導電性窒化膜であっても良い。コン夕ク卜
電極を形成後に酸素イオン打込みをY1Ba2Cu3O7膜
に施して、アニールしても良い事は云うまでもない。FIG. 2 shows a contact structure of a high-temperature superconductor showing another embodiment of the present invention.
A 3 N 4 film (l) 12 is formed, and the Si 3 N 4 film (l) 12
The surface of the Y 1 Ba 2 Cu 3 O 7 film l3 is formed, the Y 1
On the Ba 2 Cu 3 O 7 film, a Si 3 N 4 film (2) 14 is coated, and a contact hole is formed in the Si 3 N 4 film (2) 14 so that the contact A TiN film 15 is formed in the hole by a sputtering method or the like, and an A film 16 is formed on the TiN film 15. In the case of this example, the TiN film needs to have a structure that completely fills the connection hole.
An iN film 15 is formed on the Y 1 Ba 2 Cu 3 O 7 film, a Si 3 N 4 film (2) 14 is formed thereon, and a connection of the Si 3 N 4 film on the TiN film 15 is formed. A structure and method such as making a hole may be adopted, and the A film 16 may be made of another conductive material such as an Ag film. Further, the TiN film 15 is made of WN, MoN,
Another conductive nitride film such as NbN may be used. It goes without saying that oxygen ion implantation may be performed on the Y 1 Ba 2 Cu 3 O 7 film after the formation of the connection electrode, followed by annealing.
【0012】更に、Y1Ba2Cu3O7膜l3は他のセラ
ミック系超電導膜であっても良く、膜構造のみならず単
体(棒状、線状、及び格状等)構造であっても良い事は
云うまでもない。 Furthermore, Y 1 Ba 2 Cu 3 O 7 film l3 may be another ceramic superconducting film, single not film structure only (rod-like, linear, and rated shaped, etc.) have a structure Needless to say good things.
【0013】[0013]
【発明の効果】本発明により100K以上で常温以上の
臨界温度を持つセラミック系高温超電導体が臨界温度の
変動もなく安定に供給できる効果がある。さらに、本発
明によると、コンタクト穴部に導電性窒化膜を形成した
ので、コンタクト部の酸素の抜けを抑えることができる
という有利な効果を奏する。According to the present invention, there is an effect that a ceramic high-temperature superconductor having a critical temperature of 100 K or more and a normal temperature or more can be stably supplied without fluctuation of the critical temperature. Furthermore, according to the present invention, since the conductive nitride film is formed in the contact hole, there is an advantageous effect that the escape of oxygen from the contact portion can be suppressed.
【図1】本発明の一実施例を示す高温超電導体構造を示
す図。FIG. 1 is a diagram showing a high-temperature superconductor structure showing one embodiment of the present invention.
【図2】本発明の他の実施例を示す高温超電導体のコン
夕ク卜構造を示す図。FIG. 2 is a view showing a connection structure of a high-temperature superconductor according to another embodiment of the present invention.
l、ll・・・・・・・基板 2、l2、4、l4・・Si3N4膜 3、l3・・・・・・・Y1Ba2Cu3O7膜 5・・・・・・・・・・酸素イオン打込み l5・・・・・・・・・・TiN膜 l6・・・・・・・・・・A膜········· Substrate 2, 12 · 4 · 14 ··· Si 3 N 4 film 3 · 13 ····· Y 1 Ba 2 Cu 3 O 7 film 5 ··· ···· Oxygen ion implantation 15 ··········· TiN film 16 ········ A film
───────────────────────────────────────────────────── フロントページの続き (58)調査した分野(Int.Cl.6,DB名) H01L 39/24 H01B 12/02 H01B 13/00 565 H01L 39/02 H01L 39/00 H01L 39/22 H01L 39/06 ──────────────────────────────────────────────────続 き Continued on the front page (58) Field surveyed (Int.Cl. 6 , DB name) H01L 39/24 H01B 12/02 H01B 13/00 565 H01L 39/02 H01L 39/00 H01L 39/22 H01L 39 / 06
Claims (3)
導体表面に被膜体を形成する工程、前記被膜体にコンタ
クト穴部を形成する工程、少なくとも前記コンタクト穴
部に導電性窒化膜を形成する工程、前記被膜体を通して
酸素イオン打ち込み処理する工程、前記工程後アニール
処理する工程を含むことを特徴とする高温超電導体の製
造方法。A step of forming a coating on the surface of a ceramic superconductor such as Y 1 Ba 2 Cu 3 O 7 , a step of forming a contact hole in the coating, and a step of forming a conductive nitride on at least the contact hole. A method for manufacturing a high-temperature superconductor, comprising a step of forming a film, a step of implanting oxygen ions through the coating, and a step of annealing after the step.
とする請求項1記載の高温超電導体の製造方法。2. The method according to claim 1, wherein said coating is made of Si 3 N 4 .
oN膜、NbN膜から選ばれた膜であることを特徴とす
る請求項1記載の高温超電導体の製造方法。3. The method according to claim 1, wherein the conductive nitride film is a TiN film, a WN film,
2. The method for manufacturing a high-temperature superconductor according to claim 1, wherein the high-temperature superconductor is a film selected from an oN film and an NbN film.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7074254A JP2956521B2 (en) | 1995-03-30 | 1995-03-30 | Method for manufacturing high-temperature superconductor |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7074254A JP2956521B2 (en) | 1995-03-30 | 1995-03-30 | Method for manufacturing high-temperature superconductor |
Related Parent Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP63077254A Division JP2666337B2 (en) | 1988-03-30 | 1988-03-30 | High-Tc superconductor contact structure |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH07307499A JPH07307499A (en) | 1995-11-21 |
JP2956521B2 true JP2956521B2 (en) | 1999-10-04 |
Family
ID=13541842
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP7074254A Expired - Lifetime JP2956521B2 (en) | 1995-03-30 | 1995-03-30 | Method for manufacturing high-temperature superconductor |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP2956521B2 (en) |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS63261770A (en) * | 1987-04-18 | 1988-10-28 | Semiconductor Energy Lab Co Ltd | Manufacture of superconducting device |
JPH01132008A (en) * | 1987-11-18 | 1989-05-24 | Matsushita Electric Ind Co Ltd | Superconductor and its manufacture |
-
1995
- 1995-03-30 JP JP7074254A patent/JP2956521B2/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
JPH07307499A (en) | 1995-11-21 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US4145699A (en) | Superconducting junctions utilizing a binary semiconductor barrier | |
JPS6010773A (en) | Method of forming 1-element fet-memory capacitor circuit | |
EP0397186A3 (en) | Superconducting device and manufacturing method thereof | |
CA2052508A1 (en) | Method for manufacturing superconducting device having a reduced thickness of oxide superconducting layer and superconducting device manufactured thereby | |
JP3382588B2 (en) | Use of ion implantation to create normal layers during superconducting-normal-superconducting Josephson junctions | |
JP2956521B2 (en) | Method for manufacturing high-temperature superconductor | |
JP2666337B2 (en) | High-Tc superconductor contact structure | |
CA2051778A1 (en) | Method for manufacturing superconducting device having a reduced thickness of oxide superconducting layer and superconducting device manufactured thereby | |
US5714767A (en) | Method for manufacturing superconducting device having a reduced thickness of oxide superconducting layer and superconducting device manufactured thereby | |
KR100421300B1 (en) | Method for producing semiconductor component with low contact resistence to highly doped regions | |
EP0088808A1 (en) | Process for producing niobium Josephson junctions | |
US6352741B1 (en) | Planar high temperature superconductive integrated circuits for using ion implantation | |
JP2712272B2 (en) | High temperature superconductor | |
JPH08227743A (en) | Metal electrode for oxide superconductor | |
JP2641977B2 (en) | Superconducting element fabrication method | |
KR20030034679A (en) | Methode for bonding electrode superconductor | |
JPH01186657A (en) | Manufacture of semiconductor device | |
JP2641973B2 (en) | Superconducting element and manufacturing method thereof | |
KR100202667B1 (en) | Forming method for semiconductor device | |
JP2599500B2 (en) | Superconducting element and fabrication method | |
JPH01161731A (en) | Superconducting wiring and forming method thereof | |
JP2641974B2 (en) | Superconducting element and fabrication method | |
EP0228183A3 (en) | Method for manufacturing semiconductor device | |
JPH01120845A (en) | Superconducting wiring | |
JPH0537036A (en) | Superconductive device and manufacture thereof |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
EXPY | Cancellation because of completion of term | ||
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20080723 Year of fee payment: 9 |