JP2950084B2 - Wet film thickness measuring device - Google Patents

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an apparatus for measuring a coating thickness from dynamic roughness information of an undried coating surface immediately after a coating is applied, and particularly to an accurate coating thickness on a vertical surface or an inclined surface. The present invention relates to a wet film thickness measuring device that enables measurement.

[0002]

2. Description of the Related Art Conventional wet film thickness measuring devices include various types such as a contact type using a needle gauge and a non-contact type using an electromagnetic or eddy current type.

FIG. 15 is an explanatory view showing a non-contact wet film thickness measuring apparatus utilizing the non-magnetic polarity of a paint, among conventional wet film thickness measuring apparatuses. In this wet coating film thickness measuring device, as shown in FIG. 1A, a non-contact film thickness sensor 82 is previously positioned at a close distance _ho in opposition to a coating surface of an object 81 made of a steel plate. Therefore, a magnetic field is generated between the object to be coated 81 and the non-contact film thickness sensor 82 by the transmission / reception coil provided in the non-contact film thickness sensor 82. Then, as shown in FIG.
When the wet paint 83 is applied on the surface of the first member 1, the magnetic field between the object to be coated 81 and the non-contact thickness sensor 82 is attenuated by the electromagnetic resistance due to the thickness of the coating and is sensed by the receiving coil. Therefore, the coating film thickness can be measured by detecting a change in magnetic flux inversely proportional to the film thickness.

[0004]

Among the above-mentioned wet film thickness measuring devices, those of a contact type such as a needle gauge type have a problem that the quality of the coating is affected by flaws on the coating surface.

[0005] Among the non-contact types, the non-contact type wet film thickness measuring device as shown in FIG. Although it is necessary to set the distance, after coating the object to be coated, there is a problem that the thickness of the coating cannot be measured, or a problem that the measurement itself is required twice before and after the coating, and further, There is a problem that the measurement accuracy is poor.

[0006] In order to solve the above-mentioned problems, the present inventor has previously disclosed in Japanese Patent Application No. 4-306966.
We have proposed a wet film thickness measurement device that can accurately and accurately measure the coating film thickness without contact from the dynamic smoothing characteristics of the roughness of the coating surface immediately after coating.

However, since the prior application uses a formula for calculating a film thickness for a flat surface, accurate film thickness measurement cannot always be performed on a vertical surface or an inclined surface. That is, it has been found that more accurate results can be obtained by measuring the film thickness by the film thickness calculation formula in consideration of the influence of gravity according to the angle condition of the coating surface.

The present invention has been made in view of the above circumstances, and an object of the present invention is to accurately and non-contactly apply a coating film thickness even on a vertical surface or an inclined surface of a coating surface immediately after application of a coating material. An object of the present invention is to provide a wet coating film thickness measuring device capable of measuring.

[0009]

In order to achieve the above object, a wet coating film thickness measuring apparatus according to the present invention comprises an image pickup means for picking up an image of the roughness of an undried coated surface immediately after coating with a paint;
Power spectrum analysis means for analyzing the surface roughness information imaged by the imaging means and outputting it as power spectrum data, and a power spectrum integrated value and wavelength corresponding to the surface roughness from the power spectrum data from the power spectrum analysis means. Calculating means, and input means for inputting the component information and the coating conditions of the paint, and using each smoothing theoretical formula for a horizontal plane or a vertical plane using a power spectrum analysis value, the power spectrum integral value And a coating film thickness calculating means for calculating the coating film thickness based on the wavelength, the component information of the coating material, and the coating conditions.

Further, the wet film thickness measuring apparatus of the present invention comprises a roughness measuring means for measuring the roughness of an undried coated surface immediately after coating the paint, and the surface roughness measured by the roughness measuring means. Calculation means for calculating the surface roughness and the wavelength from the information, time variation calculation means for calculating the time variation of the surface roughness, and inclination angle measurement means for measuring the inclination angle of the coating surface, Input means for inputting the component information and the coating conditions of the paint, and using a smoothing theoretical formula for inclination angle correction, the surface roughness, its time change amount, the wavelength of the surface roughness, the surface of the coating surface The gist of the invention is to have a coating film thickness calculating means for calculating the coating film thickness based on the inclination angle information, the paint component information and the coating conditions.

Further, an apparatus for measuring the thickness of a wet coating film according to the present invention is provided with an image pickup means for picking up the roughness of the undried painted surface immediately after coating with the paint, and a power spectrum analysis of the surface roughness information picked up by the image pickup means. Power spectrum analysis means for outputting as power spectrum data, calculation means for calculating a power spectrum integrated value and a wavelength corresponding to surface roughness from the power spectrum data from the power spectrum analysis means, and an inclination angle of the coating surface. Inclination angle measuring means for measuring, input means for inputting the component information of the coating material and coating conditions, and the power spectrum integral value, wavelength, inclination angle of the coating surface using a smoothing theoretical formula for inclination angle correction Information, a coating film thickness calculating means for calculating a coating film thickness based on the coating composition information and the coating conditions. .

[0012]

According to the wet coating thickness measuring apparatus of the present invention, the surface roughness information obtained by imaging the roughness of the undried coating surface immediately after coating is subjected to power spectrum analysis, and the power spectrum integration corresponding to the surface roughness is obtained from the power spectrum data. Calculate the values and wavelengths, and use the power spectrum analysis values to apply the smoothing theoretical formula for the horizontal plane or the vertical plane, and calculate the vertical and horizontal coating films from the power spectrum integrated value, wavelength, paint composition information and coating conditions. Calculate the thickness.

The wet coating thickness measuring apparatus of the present invention measures the roughness of the undried coating surface immediately after coating, calculates the surface roughness and wavelength from the surface roughness information, and calculates the surface roughness. The amount of time change of the surface roughness is calculated based on the time change of the surface roughness, the wavelength of the surface roughness, the inclination angle information of the coating surface, the component information of the coating material, and the coating conditions. calculate.

Further, in the wet coating thickness measuring apparatus of the present invention, the power spectrum analysis is performed on the surface roughness information obtained by imaging the roughness of the undried coating surface immediately after coating, and the power corresponding to the surface roughness is obtained from the power spectrum data. Calculate the spectrum integral value and wavelength, and use the power spectrum integrated value, wavelength, paint surface tilt angle information, paint component information and coating conditions using the smoothing theoretical formula for tilt angle correction using the power spectrum analysis value. Calculate the coating thickness of the slope.

[0015]

DESCRIPTION OF THE PREFERRED EMBODIMENTS The wet film thickness measuring apparatus of the present invention measures the coating film thickness by focusing on the flattening phenomenon of the coating surface in an undried state, that is, a wet state immediately after the coating of the coating material. That is, as shown in FIG. 2 (a), the coating surface in a wet state immediately after coating is in an uneven state,
An initial vortex exists. The unevenness in such a state is flattened with time by the leveling force as shown in FIG. 3B, and finally becomes a flattened state as shown in FIG. The wet film thickness measuring device pays attention to such a flattening phenomenon, and accurately calculates the coating film thickness after the wet coating surface is dried by measuring the unevenness of the coating surface in a non-contact manner. And can be calculated by measurement only after application of the paint.

In particular, in the present invention, attention is paid to the fact that the smoothing force is weakened on the vertical wall surface of a vehicle door or the like because the gravity is orthogonal to the smoothing force, and the smoothing speed is reduced. Paying attention to the point that the effect of gravity is reduced by the inclination angle (cos θ) on the wall surface with a large inclination and the smoothing speed is reduced by that amount, and an appropriate coating film thickness is calculated in consideration of these points. .

First, the smoothing theory will be described separately for a horizontal plane, a vertical plane, and an inclined plane.

<Smoothing Characteristics on Horizontal Surface> Immediately after the coating material is applied, a flow for leveling occurs on the horizontal surface due to the effect of surface tension and gravity.
This relationship will be described with reference to FIG.
Assuming that the amount of fluidization is q (x), the time change of the liquid surface at the point x + Δx is as follows.

[0019]

(Equation 1) Next, the relationship between the pressure p (x) and the force F (x) is as follows, where γ is the surface tension and ρg is the gravity.

[0020]

(Equation 2) Therefore, from equations (3) and (4), the flow velocity v _h is as follows.

[0021]

(Equation 3) Similarly, the flow rate qh is

(Equation 4) Therefore, the time change of the liquid level is

(Equation 5) Here, if h = h0 + a · sin (2π / λ) x,

(Equation 6) In the peak-to-peak portion of the unevenness, as shown in FIG.
Since -h0 = a,

(Equation 7) The above equation (9) is the theoretical equation for smoothing the horizontal plane, and ｛γ + 3
ρgλ ² / (2π) ² }, the surface tension γ
And the gravitational term ρg are added.

<Smoothing Characteristics on Vertical Surface> The flow for flattening on the vertical surface as shown in FIG. 5 is generated by surface tension γ, and gravity g acts as a dripping of the paint downward.

In this case, the relationship between the pressure p (x) and the force F (x) is as follows.

[0024]

(Equation 8) Further, the flow velocity v _h is obtained from the above equation (4) ′.

(Equation 9) Similarly, the flow rate q _h is

(Equation 10) Therefore, similarly to Expressions (8) and (9),

[Equation 11] As can be seen from the above equation, the time constant of the theory of smoothing on the vertical plane is smaller than that of the equation on the horizontal plane by the gravity term of 3ρgλ ² / (2π) ² .

<Smoothing Characteristics on Inclined Surface> As shown in FIG. 7, on a painted surface inclined by an angle θ, the smoothing force (leveling force) of gravity g is ρg · co.
sθ, the above equation (9) becomes:

(Equation 12) Therefore, a = a ₀ · exp (−t / τ) (10) where τ = 3 × η × λ ⁴ / (16π ⁴ × γ ′ × h ³ ) γ ′ = γ + 3ρg · cos θ ｛λ / (2π )｝ ² Therefore, if the peak-to-peak values of the irregularities at times t ₁ and t ₂ immediately after coating are a ₁ and a ₂ , and the wavelength is λ,

A ₁ = a ₀ exp (−t ₁ / τ ₁ ) (11) τ ₁ = {3 × η (t ₁ ) × λ ⁴ } / (16π ⁴ × γ × h ³ ) (12) ) A ₂ = a ₀ exp (−t ₂ / τ ₂ ) (13) τ ₂ = {3 × η (t ₂ ) × λ ₄ } / (16π ⁴ × γ × h ³ ) (14)

A ₁ / a ₂ = exp (−t ₁ / τ ₁ + t ₂ / τ ₂ ) (15) ₁ na ₁ / a ₂ = (− t ₁ / τ ₁ + t ₂ / τ ₂ ) (16) Then, from Equations (12), (14), and (16), the coating film thickness h of the coating surface inclined by the angle θ is obtained as in the following equation.

[0026]

H = {(1na ₁ / a ₂ ) / (− t ₁ / τ ₁ ′ + t ₂ / τ ₂ ′)} ^1/3 (17) τ ₁ ′ = (3η ₁ × λ ⁴ ) / [16π ⁴ (γ + 3ρg · cos θ ｛λ / (2π)｝ ² )] (18) τ ₂ ′ = (3η ₂ × λ ⁴ ) / [16π ⁴ (γ + 3ρg · cos θ ｛λ / (2π)｝ ² )] (19) Next, an embodiment of the present invention will be described.

FIG. 1 is a block diagram showing a configuration of a first embodiment of a wet coating film thickness measuring apparatus according to the present invention.

The apparatus for measuring the thickness of a wet coating film shown in FIG. 1 is provided so as to face the object 1 to be coated, and images the surface of the object 1 to be coated to obtain surface roughness information. It has an imaging unit 2. In the present embodiment, the work 1 is coated with a top coat.

As shown in detail in FIG. 8, the imaging unit 2 includes a light source 2A, a light and dark pattern plate 2B, a reflecting mirror 2C, a lens 2D, and a CCD camera 2E. The surface roughness information of the object 1 is stored in the image processing unit 3
Supplied to

The image processing unit 3 is composed of various image processing programs, an image analysis sequence program, a waveform analysis program, a film thickness calculation program, etc., and performs image processing on the surface roughness information supplied from the imaging unit 2 to obtain a power spectrum. , And the waveform separation of the long wave is performed, and the surface roughness information is supplied to the power spectrum integral value calculation unit 4 as the power spectrum data P.

The power spectrum integrated value calculating section 4 calculates a power spectrum integrated value P _i corresponding to roughness and a long wavelength λ from the power spectrum data from the image processing section 3,
It is supplied to the film thickness calculation unit 5. The film thickness calculating unit 5 includes an input unit 6 in addition to the power spectrum integrated value P _i and the long wavelength λ.
The paint film thickness h is calculated using a smoothing theoretical formula using a power spectrum P described later, based on the paint component information and the paint conditions input from the above. The calculated coating film thickness h is displayed on the display 7 and printed by the plotter 8.

In the present embodiment, the input unit 6 can input, as a coating condition, a condition of the coating surface such as whether the coating surface is horizontal or vertical, in addition to the coating viscosity and the surface tension.

Next, the derivation of the theory of smoothing using the power spectrum P will be described.

[0034] First, when describing the smoothing characteristics of the power spectrum P, a surface roughness R _a and the power spectrum integral value P _i, is in the relationship as shown in FIG. 9, has a following relationship.

[0035]

P _i = P _o + k × R _a ^1/2 (20) R _a = {(P _i −P _o ) / k} ² (21) Derivation of a smoothing theoretical formula based on a power spectrum analysis value Then, first, as a wet coating smoothing theoretical formula (approximate formula),
The surface roughness _Ra is represented by the following equation.

[0036]

R _a = R _ao · exp (−t / τ) (22) By substituting equation (21) into equation (22),

１８ (P _i −P _o ) / k｝ ² = ｛(P _io −P _oo ) / k｝ ² exp (−t / τ) (23) where P _io is P _i Is the initial value of _Po and _Po is _Po
Is the initial value of.

Therefore,

P = P _o · exp (−t / 2τ) (24) where P = P _i −P _o , τ = 3ηλ ⁴ / 16π ⁴ γh.

From the above, the coating film thickness h based on the power spectrum analysis value is given by the following equation depending on the horizontal plane and the vertical plane.

[0039]

H = {(1nP ₁ −P ₂ ) / (− t ₁ / 2τ _i ′ + t ₂ / 2τ _i ′)} ^1/3 (25) where τ ′ _i = 3ηiλ ⁴ / 16π ⁴ γ (26) γ ′ horizontal = γ + K · ρg · λ ² / (2π) ² (27) γ ′ vertical = γ ′ horizontal−K · ρg · λ ² / (2π) ²

Next, the operation of the first embodiment shown in FIG. 1 will be described.

The surface of the coating film of the object 1 is imaged by the imaging unit 2 and the surface roughness information at times t ₁ and t ₂ after the application of the coating material is measured. This information is input to the image processing unit 3. The image is processed, and is supplied to the power spectrum integral value calculation unit 4 as frequency analysis (FFT) processing and power spectrum data for each spatial frequency. The power spectrum integral value calculation unit 4 uses the power spectrum data from the image processing unit 3 to perform waveform separation of the power spectrum and calculation of the long wavelength power spectrum integral value _Pi and the long wavelength λ, and the equivalent of the roughness. The information is supplied to the film thickness calculator 5. The paint thickness information is input to the film thickness calculator 5 from the input unit 6, and the paint condition such as the paint surface condition such as whether the paint surface is horizontal or vertical is input. Power spectrum integrated value P _i
As described above, the coating thickness h is calculated according to whether the coating surface is a horizontal plane or a horizontal plane from the long wavelength λ, and is displayed on the display 7 and printed by the plotter 8.

FIG. 10 is a block diagram showing the configuration of a second embodiment of the wet film thickness measuring apparatus according to the present invention. In the present embodiment, the inclination angle of the coating surface is measured, and the coating film thickness is calculated by a film thickness calculation formula for correcting the inclination angle based on the inclination angle information θ.

In FIG. 10, an object 1 to be coated is provided with a non-contact light interference type surface roughness meter 11 which constitutes a roughness measuring means facing the object. In the present embodiment, a top coat is applied to the object 1 to be coated.

As shown in FIG. 11, the surface roughness meter 11
Light generated from the light source 13 passes through the pinhole and the opening, hits the half mirror, is reflected downward, passes through the objective lens 15, the reference surface 16, and the beam splitter, hits the surface of the workpiece 1, and is reflected upward. After passing through the reference surface 16 and the objective lens 15, the CCD sensor 1 passes through the half mirror, passes through the filter, and passes through the filter.
2 to obtain information on the roughness of the surface of the object 1 to be coated.

The information on the surface roughness of the workpiece 1 from the surface roughness meter 11 is transmitted to the image processing apparatus 1 constituting the controller 20.
7, where the coordinates and coordinate transformation are performed.
It is supplied to the surface roughness calculation processing device 18.

The surface roughness arithmetic processing unit 18 calculates the surface roughness and the surface roughness wavelength from the surface roughness image information supplied from the image processing unit 17, and calculates the film thickness arithmetic processing unit 19
To supply. By using the surface roughness and the wavelength thereof, the average coating film thickness can be calculated in a relatively short measuring time, and there is an advantage that a process of selecting specific irregularities on the coating surface is not required. As the surface roughness degree and wavelength, using an average roughness degree R _a and mean wavelength lambda _a and the root mean square R _q and the root mean square wavelength lambda _q,.

Further, to the film thickness calculating device 19, the component information of the paint including the content of the volatile component and the like is input from the input section 6 and the tilt angle information θ measured by the inclinometer 21 is input. As a result, the film thickness calculation processor 19
Calculates the coating film thickness based on the film thickness calculation formula for correcting the inclination angle, and displays the calculated coating film thickness on the display 7 and the plotter 8.
Output to

The image processing unit 17, the surface roughness calculating unit 18 and the film thickness calculating unit 19 constitute a controller 20.

Next, the operation of the embodiment shown in FIG. 10 will be described with reference to the flowchart shown in FIG.

In FIG. 12, first, at the time t ₁ immediately after the paint is applied by the surface roughness meter 11, the surface of the work 1 is irradiated with light, and the reflected light is received. Is obtained from the light source 13 in the surface roughness meter 11 (step 11).
0), the light is separated by the spectroscopic unit (step 120), and the object to be coated 1
The painted surface was irradiated (step 130), and metering the reflected light by the photometry unit from the painted surface (step 140), thereby the image information at the time t _1, i.e. the object to be coated 1
Is obtained (step 150), and the image information is stored in a memory (step 160).

The acquisition of the surface roughness information is performed repeatedly at the time t ₂ (= t ₁ + Δt) after the time Δt, following the time t ₁ , whereby the object to be coated at the times t ₁ and t ₂ is obtained. The surface roughness information of the object 1 is measured and stored in a memory as image information. This image information is stored in the image processing device 1
7, and the image processing device 17 performs coordinate conversion and coordinate conversion (step 170).

Next, the surface roughness information of the object to be coated 1, which is the image information converted and coordinated by the image processing device 17, is supplied to the surface roughness calculation processing device.

The surface roughness calculation processor 18 calculates the time t ₁ from the surface roughness image information supplied from the image processor 17.
And roughness of the surface at t ₂ and wavelength, i.e. to calculate the average roughness degree R _a and its mean wavelength lambda _a and the root mean square R _q and root mean square lambda _q (step 182), the film thickness calculation It is supplied to the processing device 19.

[0054] The film thickness processing unit 19, the roughness of the surface and the wavelength, i.e. the average roughness degree R _a and its mean wavelength lambda _a and the root mean square R _q and root mean square lambda
_{When q} is supplied, the coating film thickness h is calculated in accordance with the above-described equations (17) to (19) based on the information, the paint condition supplied from the input unit 6 and the inclination angle information θ supplied from the inclinometer 21. It is calculated (step 200).

[0055] That is, (17), the roughness of the surface and the wavelength, i.e. the average roughness degree R _a and its mean wavelength lambda _a and the root mean square R _q and root mean square lambda
_The following holds for _q .

[0056]

H = {(1nR _a1 / R _a2 ) / (− t ₁ / τ ₁ ′ + t ₂ / τ ₂ ′)} ^1/3 (29) τ ₁ ′ = (3η ₁ × λ ⁴ ) / [16π ⁴ (γ + 3ρg · cos θ ｛λ / (2π)｝ ² )] (18) τ ₂ ′ = (3η ₂ × λ ⁴ ) / [16π ⁴ (γ + 3ρg · cos θ ｛λ / (2π)｝ ² )] (19) FIG. 13 shows a third example of the wet coating film thickness measuring apparatus according to the present invention.
FIG. 3 is a block diagram illustrating a configuration of an example.

In this embodiment, the film thickness of the inclined surface is calculated by using the theoretical equation of smoothing using the power spectrum P shown in FIG. The inclinometer 21 for measuring the inclination angle is provided, and the inclination angle information θ is supplied to the film thickness calculation unit 22.

Then, the coating composition information and the coating conditions are input from the input section 6 to the film thickness calculating section 22, and this information, the power spectrum integrated value P _i from the power spectrum integrated value calculating section 4, and the long wavelength λ are input. As described above, the coating thickness h corresponding to the tilt angle of the coating surface is calculated from the tilt information θ input from the inclinometer 21, displayed on the display 7, and printed by the plotter 8.

Also in this case, equation (17) holds as shown in the following equation.

[0060]

H = {(1nP ₁ −P ₂ ) / (− t ₁ / 2τ ₁ ′ + t ₂ / 2τ ₂ ′)} ^1/3 (30) τ ₁ ′ = (3η ₁ × λ ⁴ ) / [16π ⁴ (γ + 3ρg · cos θ ｛λ / (2π)｝ ² )] ··· (18) τ ₂ ′ = (3η ₂ × λ ⁴ ) / [16π ⁴ (γ + 3ρg · cos θ ｛λ / (2π)｝ ² )] ... (19) FIG. 14 shows a fourth example of the wet film thickness measuring apparatus according to the present invention.
FIG. 3 is a block diagram illustrating a configuration of an example.

In this embodiment, the sharpness of the dry painted surface is estimated from the sharpness of the wet painted surface and the dry film thickness is estimated from the wet coated film thickness. Thus, the paintability is determined from the above, the optimum coating film thickness is calculated, the deviation of the dry coating film thickness from the optimum coating film thickness is calculated, and this deviation is fed back as the coating condition.

In FIG. 14, the image-processed surface roughness information from the imaging unit 2 is supplied to a wet sharpness calculation unit 41 and a power spectrum integral value calculation unit 21.

The wet sharpness calculating section 41 calculates the sharpness of the wet painted surface, that is, the sharpness including the smoothness, the stickiness, and the glossiness, based on the image processing data from the image processing section 3. The sharpness is supplied to the dry sharpness calculation unit 42. The dry sharpness computing section 42 determines the final coating quality based on the sharpness of the wet painted surface supplied from the wet sharpness computing section 41 and the coating conditions including the coating color supplied from the input section 6. The sharpness of a certain dry painted surface is estimated, and the sharpness of the dry painted surface and the sharpness of the wet painted surface are supplied to the paintability determining unit 43.

On the other hand, the power spectrum integral value calculation section 4
Calculates the power spectrum integral value P _i and the long wavelength λ corresponding to the roughness from the power spectrum data from the image processing unit 3 and supplies them to the film thickness calculation unit 5. The film thickness calculation unit 5 adds, in addition to the power spectrum integrated value P _i and the long wavelength λ,
Based on the coating conditions input from the input unit 6, the coating thickness h is calculated using a smoothing theoretical formula using the power spectrum P. The wet coating film thickness h is supplied to the dry coating film thickness calculating section 23, and the dry coating film thickness is calculated based on the coating composition solid content ratio information of the coating conditions from the input section 6, that is, the coating NV information (non-boller information). The thickness h ′ is estimated, and the dry film thickness h ′ and the wet film thickness h are supplied to the paintability judging section 43.

The paintability judging section 43 is provided with the sharpness of the dry painted surface and the sharpness of the wet painted surface supplied from the dry sharpness computing section 42 and the dry paint supplied from the dry film thickness computing section 23. Based on the film thickness h 'and the wet film thickness h, the paintability (quality) of the painted surface is determined, the optimum film thickness is calculated, and the deviation of the dry film thickness h' from the optimum film thickness is calculated. calculate. The coating thickness deviation information is supplied to the coating condition control system 44, and the coating thickness deviation, the dry coating thickness, the wet coating thickness, the sharpness of the dry coating surface, and the sharpness of the wet coating surface are provided. Is output to the display 7 and the plotter 8 to be displayed and printed, respectively.

The coating condition control system 44 controls, for example, the coating conditions based on the coating thickness deviation information supplied from the coating quality judging section 43, and thereby performs feedback control so as to obtain the optimum coating thickness and coatability. I do.

[0067]

As described above, according to the present invention, the coating film thickness can be accurately measured without contact even on a vertical surface or an inclined surface of the coating surface immediately after the application of the coating material.

[Brief description of the drawings]

FIG. 1 is a block diagram showing a configuration of a first embodiment of a wet coating film thickness measuring apparatus according to the present invention.

FIG. 2 is an explanatory diagram of a flattening phenomenon of an uneven state of a coating surface in a wet state immediately after coating.

FIG. 3 is an explanatory diagram showing a smoothing characteristic on a horizontal plane.

FIG. 4 is an explanatory diagram showing smoothing characteristics on a horizontal plane.

FIG. 5 is an explanatory diagram showing smoothing characteristics on a vertical plane.

FIG. 6 is an explanatory diagram showing smoothing characteristics on a vertical plane.

FIG. 7 is an explanatory diagram showing a smoothing characteristic on an inclined surface.

FIG. 8 is a configuration diagram of an imaging unit used in the wet coating film thickness measuring device of FIG. 1;

FIG. 9 is a graph showing the relationship between the surface roughness and the integrated value of the power spectrum.

FIG. 10 shows a second example of the wet film thickness measuring apparatus according to the present invention.
FIG. 3 is a block diagram illustrating a configuration of an example.

11 is a configuration diagram of a surface roughness meter used in the wet coating film thickness measuring device of FIG.

FIG. 12 is a flowchart showing the operation of the wet coating film thickness measuring device of FIG.

FIG. 13 shows a third example of the wet film thickness measuring apparatus according to the present invention.
FIG. 3 is a block diagram illustrating a configuration of an example.

FIG. 14 shows a fourth example of the wet film thickness measuring apparatus according to the present invention.
FIG. 3 is a block diagram illustrating a configuration of an example.

FIG. 15 is an explanatory view showing a conventional coating film thickness measuring device.

[Explanation of symbols]

 REFERENCE SIGNS LIST 1 coating target 2 imaging unit 3 image processing unit 4 power spectrum integral value calculation unit 5, 22 film thickness calculation unit 6 input unit 7 display 8 plotter 8 fixing screw 11 surface roughness meter 18 surface roughness calculation processing unit 21 Inclinometer

Claims (3)

(57) [Claims] An imaging means for imaging the roughness of an undried coating surface immediately after coating with a paint, and a power spectrum analysis for analyzing surface roughness information imaged by the imaging means and outputting it as power spectrum data. Means, calculating means for calculating a power spectrum integrated value and a wavelength corresponding to surface roughness from power spectrum data from the power spectrum analyzing means, input means for inputting the component information of the paint and coating conditions, and power spectrum analysis. A coating film thickness calculating means for calculating a coating film thickness based on the power spectrum integrated value, the wavelength, the component information of the coating material, and the coating condition, using a smoothing theoretical formula for a horizontal plane or a vertical plane using the values. A wet film thickness measuring device, comprising: 2. A roughness measuring means for measuring the roughness of an undried coated surface immediately after coating with a paint, and calculating a surface roughness and a wavelength from the surface roughness information measured by the roughness measuring means. Calculating means for calculating a time change amount of the surface roughness, a tilt angle measuring means for measuring a tilt angle of the coating surface, and inputting component information and coating conditions of the paint. Using an input means to perform, using a smoothing theoretical formula for inclination angle correction, the surface roughness, its time change amount, the wavelength of the surface roughness, the inclination angle information of the coating surface, the component information of the coating material and the coating conditions A coating film thickness calculating device for calculating a coating film thickness based on the following formula: 3. An imaging means for imaging the roughness of the undried painted surface immediately after coating with a paint, and a power spectrum analysis for analyzing the surface roughness information imaged by the imaging means and outputting it as power spectrum data. Means, calculating means for calculating a power spectrum integrated value and a wavelength corresponding to surface roughness from the power spectrum data from the power spectrum analyzing means, tilt angle measuring means for measuring the tilt angle of the coating surface, Using input means for inputting component information and coating conditions, using a smoothing theoretical formula for tilt angle correction, the power spectrum integral value, wavelength, tilt angle information of the coating surface, component information of the coating material and coating conditions. And a coating film thickness calculating device for calculating a coating film thickness based on the coating film thickness.