JP2935207B2 - Positive photosensitive anion electrodeposition resist composition and method for producing printed wiring board using this composition - Google Patents

Positive photosensitive anion electrodeposition resist composition and method for producing printed wiring board using this composition

Info

Publication number
JP2935207B2
JP2935207B2 JP22771092A JP22771092A JP2935207B2 JP 2935207 B2 JP2935207 B2 JP 2935207B2 JP 22771092 A JP22771092 A JP 22771092A JP 22771092 A JP22771092 A JP 22771092A JP 2935207 B2 JP2935207 B2 JP 2935207B2
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JP
Japan
Prior art keywords
weight
parts
resin
mol
positive photosensitive
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP22771092A
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Japanese (ja)
Other versions
JPH0635187A (en
Inventor
圭祐 成瀬
礼二郎 西田
裕 井上
直純 岩沢
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kansai Paint Co Ltd
Original Assignee
Kansai Paint Co Ltd
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Filing date
Publication date
Application filed by Kansai Paint Co Ltd filed Critical Kansai Paint Co Ltd
Priority to JP22771092A priority Critical patent/JP2935207B2/en
Publication of JPH0635187A publication Critical patent/JPH0635187A/en
Application granted granted Critical
Publication of JP2935207B2 publication Critical patent/JP2935207B2/en
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Expired - Fee Related legal-status Critical Current

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Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【産業上の利用分野】本発明は、稼動安定性に優れ、塗
装作業性が良く、さらに導体画像形成の信頼性の高いレ
ジスト、特にプリント配線基板製造用エツチングレジス
トとして適するポジ型感光性アニオン電着レジスト組成
物に関し、また該レジスト組成物を用いたプリント配線
基板の製造方法にも関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a positive type photosensitive anion electrode which is excellent in operation stability, has good coating workability, and has high reliability for forming a conductor image, and is particularly suitable as an etching resist for manufacturing a printed wiring board. The present invention also relates to a resist composition, and to a method for producing a printed wiring board using the resist composition.

【0002】[0002]

【従来の技術】電子機器などに用いられるプリント配線
基板は主として導体層を表面に有する絶縁基板上にスク
リーン印刷によるパターン印刷法や、感光性ドライフイ
ルムを用いたフオトリソグラフィーにより形成された回
路パターンを利用したサブストラクト法で製造されてい
る。しかし、最近の回路パターンの微細化、スルーホー
ル径の小径化に対応するためポジ型感光性電着レジスト
を利用する方法が提案されている。
2. Description of the Related Art Printed wiring boards used in electronic equipment and the like mainly use a circuit pattern formed by screen printing or photolithography using a photosensitive dry film on an insulating substrate having a conductor layer on the surface. Manufactured by the subtractive method used. However, recently, a method using a positive photosensitive electrodeposition resist has been proposed in order to cope with miniaturization of circuit patterns and reduction in diameter of through holes.

【0003】[0003]

【発明が解決しようとする課題】ポジ型感光性電着レジ
ストとしてはイオン形成基を有するアクリル樹脂等の基
体樹脂にキノンジアジドスルフォン酸類をスルフォン酸
エステル結合を介して基体樹脂に結合せしめた樹脂を主
成分とする組成物(特開昭61−206293号公報参
照)、ポリヒドロキシベンゾフェノンの様なポリフェノ
ール類にキノンジアジドスルフォン酸類をスルフォン酸
エステル結合を介して結合せしめた感光性化合物を、イ
オン形成基を有するアクリル樹脂などの基体樹脂と混合
した組成物(特開昭61−206293号公報参照)、
イオン形成基を有するアクリル樹脂などの基体樹脂にヒ
ドロキシルアミンとキノンジアジドスルフォン酸とをウ
レタン結合およびスルフォンイミド結合を介して結合さ
せた樹脂を主成分とする組成物(特開昭64−9027
0号公報参照)、水酸基を有する化合物又は樹脂にヒド
ロキシアミンとキノンジアジドスルフォン酸とをウレタ
ン結合およびスルフォンイミド結合を介して結合させた
化合物又は樹脂を、イオン形成基を有するアクリル樹脂
などの基体樹脂と混合した組成物(特開平2−2896
60号公報参照)等の、水溶性または水分散性組成物が
提案されている。
As the positive photosensitive electrodeposition resist, a resin obtained by bonding quinonediazidosulfonic acid to a base resin via a sulfonate ester bond to a base resin such as an acrylic resin having an ion-forming group is mainly used. A composition as a component (see JP-A-61-206293), a photosensitive compound in which a quinonediazidosulfonic acid is bonded to a polyphenol such as polyhydroxybenzophenone via a sulfonate ester bond, and has an ion-forming group. A composition mixed with a base resin such as an acrylic resin (see JP-A-61-206293),
Composition comprising a resin in which hydroxylamine and quinonediazidesulfonic acid are bonded to a base resin such as an acrylic resin having an ion-forming group via a urethane bond and a sulfonimide bond (Japanese Patent Laid-Open No. 64-9027).
No. 0), a compound or resin having a hydroxyl group and a hydroxyamine and quinonediazidosulfonic acid bonded via a urethane bond and a sulfonimide bond, to a base resin such as an acrylic resin having an ion-forming group. Mixed composition (JP-A-2-2896)
A water-soluble or water-dispersible composition has been proposed.

【0004】しかしながら、上記従来の組成物において
は下記の問題があり、その解決が望まれている。即ち、
感光性基をスルフォン酸エステル基を介して導入した樹
脂系においては、スルフォン酸エステル基が加水分解さ
れ易く、電着レジスト液としての貯蔵安定性、浴の稼動
安定性に問題がある。また、スルフォン酸エステル結合
を有する感光性化合物を混合した組成物については水溶
化物または水分散物そのものの安定性が充分でないとい
う問題がある。これらの問題点を解決するために、イオ
ン形成基を疎水性ポリマー主鎖から離れた部位に置き、
水分散化によって感光性化合物をコア部(芯)に存在さ
せるようにした水分散体を形成し、スルフォン酸エステ
ルを加水分解から保護し水分散物そのものの安定性を向
上させようとするもの、具体的には、ヒドロキシル基を
末端に有する長鎖の(メタ)アクリレート系モノマーを
共重合したポリマーに多塩基酸の無水物を半エステル化
してイオン形成基を導入した樹脂を基体樹脂として使用
する提案がなされている。しかしながら、上記提案にお
いても基板の処理量が少なくて電着浴液が非常に長期に
わたって浴槽に滞留する(低ターンオーバー)場合にお
いては半エステル化により導入したイオン形成基が徐々
に加水分解を受け、浴の稼動安定性の劣化、形成される
電着レジスト膜の品質劣化を生じやすいという問題があ
る。また、該基体樹脂を合成するためには一般のアクリ
ル樹脂合成の場合に比して複雑で長時間を要する工程が
必要となるという問題もある。また、前記スルフォン酸
イミド結合及びウレタン結合を介して感光性基を導入す
る方法に於いては加水分解に関する問題点は大幅に改善
され、稼動安定性に優れた電着レジスト浴液が得られる
が、ウレタン結合のためか露光部分の現像液に対する溶
解速度が遅く、現像を高温で行なわなければならない、
現像可能な条件幅がやや狭くなる等の問題点がある。ま
た、感光基導入のためにスルフォン酸エステル型の場合
に比して複雑で長時間を要する工程が必要になるという
問題もある。
[0004] However, the above-mentioned conventional composition has the following problems, and it is desired to solve them. That is,
In a resin system in which a photosensitive group is introduced via a sulfonic acid ester group, the sulfonic acid ester group is easily hydrolyzed, and there is a problem in storage stability as an electrodeposition resist solution and operation stability of a bath. Further, a composition in which a photosensitive compound having a sulfonate ester bond is mixed has a problem that the stability of the water-soluble substance or the water-dispersed substance itself is not sufficient. To solve these problems, the ion-forming group is placed at a site away from the hydrophobic polymer main chain,
Forming an aqueous dispersion in which the photosensitive compound is present in the core (core) by water dispersion, protecting the sulfonate ester from hydrolysis, and improving the stability of the aqueous dispersion itself; Specifically, a resin obtained by half-esterifying a polybasic acid anhydride with a polymer obtained by copolymerizing a long-chain (meth) acrylate-based monomer having a hydroxyl group at a terminal and introducing an ion-forming group is used as the base resin. A proposal has been made. However, even in the above proposal, when the amount of the substrate to be treated is small and the electrodeposition bath solution stays in the bath for a very long time (low turnover), the ion-forming group introduced by the half-esterification gradually undergoes hydrolysis. In addition, there is a problem that the operation stability of the bath is deteriorated and the quality of the formed electrodeposition resist film is easily deteriorated. In addition, there is a problem that a complicated and time-consuming process is required for synthesizing the base resin as compared with the case of general acrylic resin synthesis. In addition, in the method of introducing a photosensitive group through the sulfonimide bond and the urethane bond, the problem relating to hydrolysis is greatly improved, and an electrodeposition resist bath solution having excellent operation stability can be obtained. The dissolution rate of the exposed part in the developing solution is slow due to urethane bonding, and development must be performed at a high temperature.
There is a problem that the condition width for developing is slightly narrowed. In addition, there is a problem that a complicated and long process is required for introducing a photosensitive group as compared with a sulfonate type.

【0005】[0005]

【課題を解決するため手段】そこで本発明者らは、電着
レジスト液の貯蔵安定性に優れ、低ターンオーバー速度
に於いても電着浴の稼動安定性が高く、現像の条件幅が
広く、しかも複雑で長時間を要する工程を必要しない方
法で製造できるポジ型感光性電着レジスト組成物を得る
べく鋭意研究を行なった。また電着レジスト組成物を使
用したプリント配線基板の製造方法についても検討を行
なった。その結果、上記問題点を解決できる組成物及び
プリント配線基板の製造方法を見出し本発明を完成させ
たものである。
Accordingly, the present inventors have found that the storage stability of the electrodeposition resist solution is excellent, the operation stability of the electrodeposition bath is high even at a low turnover speed, and the range of conditions for development is wide. In addition, intensive studies have been made to obtain a positive photosensitive electrodeposition resist composition which can be manufactured by a method which does not require a complicated and long process. Further, a method of manufacturing a printed wiring board using the electrodeposition resist composition was also studied. As a result, the present inventors have found a composition and a method for manufacturing a printed wiring board which can solve the above problems, and have completed the present invention.

【0006】すなわち本発明は、 「1. (a)樹脂1Kg中にカルボキシル基0.07
5〜0.55モルおよび水酸基1.5〜5.5モルを有
するアクリル樹脂20〜50重量部、(b)樹脂1Kg
中にカルボキシル基1.20〜2.50モルおよび水酸
基1.5〜5.0モルを有するアクリル樹脂25〜70
重量部および(c)1分子中に下記式[1]、[2]ま
たは[3]で表わされる基 式[1]
That is, the present invention relates to “1. (a) Carboxyl group 0.07 in 1 kg of resin
20 to 50 parts by weight of an acrylic resin having 5 to 0.55 mol and 1.5 to 5.5 mol of hydroxyl groups, (b) 1 kg of resin
Acrylic resin 25 to 70 having 1.20 to 2.50 mol of carboxyl groups and 1.5 to 5.0 mol of hydroxyl groups therein
(C) a group represented by the following formula [1], [2], or [3] in one molecule:

【化4】 式[2]Embedded image Equation [2]

【化5】 式[3]Embedded image Equation [3]

【化6】 を1個以上有する感光剤7.5〜30重量部を含有し、
成分(a)、(b)および(c)の合計量が100重量
部であって、成分(a)、(b)および(c)の合計に
おけるカルボキシル基の含有量が0.60〜1.25モ
ル/Kg、水酸基の含有量が1.2〜3.5モル/Kg
である樹脂混合物を塩基で中和水分散化して得られる水
分散性樹脂組成物を主成分として含有することを特徴と
するポジ型感光性アニオン電着レジスト組成物。 2. (a)、(b)、(c)各成分が、合計100重
量部中(a)成分20〜50重量部、(b)成分25〜
70重量部、(c)成分7.5〜30重量部である1項
に記載されたポジ型感光性アニオン電着レジスト組成
物。 3. 固形分の割合が3〜50%である、1項または2
項に記載されたポジ型感光性アニオン電着レジスト組成
物。 4. (i)電導性被膜を有する回路用基板表面に、1
項記載の電着レジスト組成物を電着塗装し、ポジ型感光
性被膜を形成する工程; (ii)該ポジ型感光性被膜をパターンマスクを介して
露光する工程; (iii)露光部の感光性被膜を除去してエツチングパ
ターンを形成する工程; (iv)露光した電導性被膜をエツチングにより除去す
る工程;及び (v)回路パターン上の感光性被膜を除去する工程を有
することを特徴とするプリント配線基板の製造方法。 5. 電着されたポジ型感光性被膜が乾燥膜厚で2〜5
0μmである、4項に記載されたプリント配線基板の製
造方法。 6. ポジ型感光性被膜をパターンマスクを介して行な
う露光を、3,000〜4,500Åの波長の光線を5
0〜800mj/cm照射して行なう、4項または5
項に記載されたプリント配線基板の製造方法。」に関す
る。
Embedded image Containing 7.5 to 30 parts by weight of a photosensitive agent having at least one
The total amount of the components (a), (b) and (c) is 100 parts by weight, and the content of the carboxyl group in the total of the components (a), (b) and (c) is 0.60 to 1. 25 mol / Kg, the content of the hydroxyl group is 1.2 to 3.5 mol / Kg
A positive photosensitive anion electrodeposition resist composition comprising, as a main component, a water-dispersible resin composition obtained by neutralizing and dispersing a resin mixture as described above in water with a base. 2. The components (a), (b) and (c) are each composed of 20 to 50 parts by weight of the component (a) and 25 to 25 parts by weight of the component (b) in a total of 100 parts by weight.
2. The positive photosensitive anion electrodeposition resist composition according to item 1, wherein 70 parts by weight and 7.5 to 30 parts by weight of the component (c) are used. 3. Item 1 or 2 wherein the solid content is 3 to 50%
The positive-type photosensitive anion electrodeposition resist composition described in the above item. 4. (I) On the surface of the circuit board having the conductive coating, 1
(C) electrodepositing the electrodeposition resist composition described in (1) to form a positive photosensitive film; (ii) exposing the positive photosensitive film via a pattern mask; (iii) exposing the exposed portion to light. Forming an etching pattern by removing the conductive film; (iv) removing the exposed conductive film by etching; and (v) removing the photosensitive film on the circuit pattern. A method for manufacturing a printed wiring board. 5. The electrodeposited positive photosensitive film has a dry film thickness of 2 to 5
Item 5. The method for manufacturing a printed wiring board according to Item 4, which is 0 μm. 6. Exposure to a positive photosensitive film through a pattern mask is performed by applying a light beam having a wavelength of
Irradiation of 0 to 800 mj / cm 2 is performed.
13. The method for manufacturing a printed wiring board according to any one of the above items. About.

【0007】[0007]

【作用】本発明レジスト組成物における、成分(a)で
あるアクリル樹脂は、樹脂1Kg中にカルボキシル基を
0.075〜0.55モル、好ましくは0.10〜0.
45モル、および水酸基を1.5〜5.5モル、好まし
くは1.75〜4.5モル有するアクリル樹脂であれば
よいが、一般に数平均分子量2,000〜200,00
0程度のものが用いられる。上記アクリル樹脂(a)は
公知の方法で重合することによって得ることが出来る。
The acrylic resin as component (a) in the resist composition of the present invention has a carboxyl group content of 0.075 to 0.55 mol, preferably 0.10 to 0.5 mol per kg of the resin.
An acrylic resin having 45 moles and 1.5 to 5.5 moles, preferably 1.75 to 4.5 moles of hydroxyl groups may be used, but generally has a number average molecular weight of 2,000 to 200,00.
About 0 is used. The acrylic resin (a) can be obtained by polymerizing by a known method.

【0008】アクリル樹脂(a)を重合によって得るた
めのモノマー成分は、要求される性能に応じて適宜選択
出来、好ましくは、例えばメチル(メタ)アクリレー
ト、エチル(メタ)アクリレート、n−ブチル(メタ)
アクリレート、イソブチル(メタ)アクリレート、ヘキ
シル(メタ)アクリレート、2−エチルヘキシル(メ
タ)アクリレート、ラウリル(メタ)アクリレートなど
の炭素数1〜18のアルキル(メタ)アクリレート;2
−ヒドロキシエチル(メタ)アクリレート、ヒドロキシ
プロピル(メタ)アクリレート、アリルアルコールなど
の水酸基含有不飽和単量体;(メタ)アクリル酸、クロ
トン酸、イタコン酸、マレイン酸などのカルボキシル基
含有不飽和単量体;グリシジル(メタ)アクリレート、
アリルグリシジルエーテル、3,4−エポキシシクロヘ
キシルメチル(メタ)アクリレートなどのエポキシ基含
有不飽和単量体;スチレン、α−メチルスチレン、ビニ
ルトルエン、酢酸ビニル、(メタ)アクリルアミド、
(メタ)アクリロニトリル、N−メチロール(メタ)ア
クリルアミドブチルエーテルなどの、その他の共重合可
能なモノマーを挙げることが出来る。アクリル樹脂
(a)は,上記カルボキシル基含有不飽和単量体および
水酸基含有モノマーを必須とし、他のモノマー成分を配
合して、例えば重合触媒および好ましくは有機溶剤の存
在下で共重合することによって得ることが出来る。
The monomer component for obtaining the acrylic resin (a) by polymerization can be appropriately selected according to the required performance. Preferably, for example, methyl (meth) acrylate, ethyl (meth) acrylate, n-butyl (meth) )
Alkyl (meth) acrylate having 1 to 18 carbon atoms such as acrylate, isobutyl (meth) acrylate, hexyl (meth) acrylate, 2-ethylhexyl (meth) acrylate, and lauryl (meth) acrylate; 2
-Hydroxyl-containing unsaturated monomers such as hydroxyethyl (meth) acrylate, hydroxypropyl (meth) acrylate and allyl alcohol; carboxyl-containing unsaturated monomers such as (meth) acrylic acid, crotonic acid, itaconic acid and maleic acid Body; glycidyl (meth) acrylate,
Epoxy group-containing unsaturated monomers such as allyl glycidyl ether and 3,4-epoxycyclohexylmethyl (meth) acrylate; styrene, α-methylstyrene, vinyltoluene, vinyl acetate, (meth) acrylamide,
Other copolymerizable monomers such as (meth) acrylonitrile and N-methylol (meth) acrylamidobutyl ether can be exemplified. The acrylic resin (a) essentially contains the above carboxyl group-containing unsaturated monomer and hydroxyl group-containing monomer, and is blended with another monomer component, for example, by copolymerization in the presence of a polymerization catalyst and preferably an organic solvent. Can be obtained.

【0009】本発明組成物における、成分(b)である
アクリル樹脂は樹脂1Kg中にカルボキシル基を1.2
0〜2.50モル、好ましくは1.25〜2.00モ
ル、および水酸基を1.5〜5.0モル、好ましくは
2.0〜4.0モル有するアクリル樹脂であればよい
が、一般に数平均分子量2,000〜20,000程度
のものが用いられる。上記アクリル樹脂(b)は、前記
アクリル樹脂(a)の合成と同様の方法にて、カルボキ
シル基および水酸基の量が所定の値となるようにして、
重合することによって得ることが出来る。
In the composition of the present invention, the acrylic resin as the component (b) has a carboxyl group of 1.2 kg per 1 kg of the resin.
An acrylic resin having 0 to 2.50 mol, preferably 1.25 to 2.00 mol, and 1.5 to 5.0 mol, preferably 2.0 to 4.0 mol of hydroxyl groups may be used. Those having a number average molecular weight of about 2,000 to 20,000 are used. The acrylic resin (b) is prepared in the same manner as in the synthesis of the acrylic resin (a) so that the amounts of the carboxyl group and the hydroxyl group become predetermined values.
It can be obtained by polymerization.

【0010】成分(a)は、基本的に非水溶性の樹脂で
あって、疎水性の高い、かつ加水分解を受けやすい感光
性成分(c)を包埋し、連続層の水が成分(c)を攻撃
するのを防止する効果を有する。成分(b)は中和によ
り水溶性または水分散性を示す樹脂であり、成分(c)
を包埋した成分(a)の粒子に対し保護コロイドとして
作用し安定な分散体を形成する。成分(a)と成分
(b)とは互いに適切な親和性を有することが必要であ
り、そのために成分(a)および成分(b)の水酸基含
有量、カルボキシル基含有量が所定範囲内であることが
要求される。
The component (a) is basically a water-insoluble resin and embeds a photosensitive component (c) having high hydrophobicity and being susceptible to hydrolysis. It has the effect of preventing attacking c). Component (b) is a resin that exhibits water solubility or water dispersibility upon neutralization, and component (c)
Acts as a protective colloid for the particles of the component (a) having embedded therein to form a stable dispersion. It is necessary that the component (a) and the component (b) have an appropriate affinity for each other. Therefore, the hydroxyl group content and the carboxyl group content of the component (a) and the component (b) are within predetermined ranges. Is required.

【0011】アクリル樹脂(a)におけるカルボキシル
基の含有量が0.075モル/Kg樹脂より少なくなる
と得られる水分散体の分散粒子の粒径が大きくなって水
分散体の安定性が劣化し、一方、カルボキシル基の含有
量が0.55モル/Kg樹脂より多くなると、(c)成
分を包埋する能力が低下し貯蔵中に(c)成分が連続相
中に析出しやすくなって水分散体の安定性が劣化すると
ともに(c)成分のスルホン酸エステル基が加水分解さ
れ易くなる。
If the content of the carboxyl group in the acrylic resin (a) is less than 0.075 mol / Kg resin, the particle size of the dispersed particles of the obtained aqueous dispersion becomes large, and the stability of the aqueous dispersion is deteriorated. On the other hand, when the content of the carboxyl group is more than 0.55 mol / Kg resin, the ability to embed the component (c) is reduced, and the component (c) is liable to precipitate in the continuous phase during storage, and is dispersed in water. As the stability of the body deteriorates, the sulfonic acid ester group of the component (c) is easily hydrolyzed.

【0012】アクリル樹脂(b)におけるカルボキシル
基の含有量が1.20モル/Kg樹脂より少なくなる
と、得られる水分散体の分散粒子の粒径が大きくなって
水分散体の安定性が劣化し、一方、カルボキシル基の含
有量が2.50モル/Kg樹脂より多くなると水親和性
が高くなりすぎ、水分散体における静電的および立体的
保護相としての効果が低下し水分散体の安定性は低下す
る。
When the content of the carboxyl group in the acrylic resin (b) is less than 1.20 mol / Kg resin, the particle size of the dispersed particles of the obtained aqueous dispersion becomes large, and the stability of the aqueous dispersion is deteriorated. On the other hand, when the content of the carboxyl group is more than 2.50 mol / Kg resin, the water affinity becomes too high, the effect as an electrostatic and steric protective phase in the aqueous dispersion is reduced, and the stability of the aqueous dispersion is reduced. Sex is reduced.

【0013】アクリル樹脂(a)は水酸基の含有量が
1.5〜5.5モル/Kg樹脂であり、アクリル樹脂
(b)は水酸基の含有量が1.5〜5.0モル/Kg樹
脂であることが必要である。それぞれの樹脂において、
水酸基の含有量が下限値である1.5モル/Kg樹脂よ
り低い場合には、水分散体の分散粒子の親水性が不足し
て安定性が低下し、一方、水酸基の含有量が、それぞれ
の上限値を超える場合には、水親和性が高くなり過ぎ
(c)成分に対する保護相としての効果が低下し安定性
が劣化する。
The acrylic resin (a) has a hydroxyl group content of 1.5 to 5.5 mol / Kg resin, and the acrylic resin (b) has a hydroxyl group content of 1.5 to 5.0 mol / Kg resin. It is necessary to be. For each resin,
When the content of the hydroxyl group is lower than the lower limit value of 1.5 mol / Kg resin, the hydrophilicity of the dispersed particles of the aqueous dispersion is insufficient, and the stability is reduced. On the other hand, the content of the hydroxyl group is, When the value exceeds the upper limit, the affinity for water becomes too high, and the effect of the protective phase on the component (c) is reduced, and the stability is deteriorated.

【0014】本発明組成物における(c)成分は前記式
[1]、[2]または[3]で表わされる基を1個以上
有する感光剤である。この感光剤は、例えば、水酸基を
有する化合物と、o−ナフトキノンジアジド−5−スル
ホン酸ハライド、o−ナフトキノンジアジド−4−スル
ホン酸ハライドおよび/またはo−ベンゾキノンジアジ
ド−4−スルホン酸ハライドとを反応させることによっ
て得ることが出来る。該感光剤は一般的に分子量約40
0〜約10,000であり、好ましくは約500〜約
5,000の範囲のものである。該感光性化合物は、代
表的には、トリ−またはテトラ−ヒドロキシベンゾフェ
ノン、ノボラック型フェノール樹脂,ノボラック型クレ
ゾール樹脂またはポリヒドロキシスチレン等と、o−ナ
フトキノンジアジド−5−スルホン酸クロリドまたはo
−ベンゾキノンジアジド−4−スルホン酸クロリドとを
反応させることによって得ることが出来る。
The component (c) in the composition of the present invention is a photosensitive agent having at least one group represented by the above formula [1], [2] or [3]. This photosensitizer reacts, for example, a compound having a hydroxyl group with o-naphthoquinonediazide-5-sulfonic acid halide, o-naphthoquinonediazide-4-sulfonic acid halide and / or o-benzoquinonediazide-4-sulfonic acid halide. Can be obtained. The photosensitizer generally has a molecular weight of about 40.
0 to about 10,000, preferably in the range of about 500 to about 5,000. The photosensitive compound typically includes tri- or tetra-hydroxybenzophenone, a novolak-type phenol resin, a novolak-type cresol resin, polyhydroxystyrene, or the like, and o-naphthoquinonediazide-5-sulfonic acid chloride or o-naphthoquinonediazide-5-sulfonic acid chloride.
-Benzoquinonediazide-4-sulfonic acid chloride.

【0015】(c)成分である感光剤は、光照射によっ
てオルトキノンジアジド部がケテンを経てカルボン酸と
なり、照射されたレジスト部が現像処理によって除去さ
れるようになる。本発明における水分散性樹脂組成物に
おいて、(a)、(b)および(c)成分の配合割合
は、(a)、(b)および(c)成分の合計量100重
量部中、(a)成分20〜50重量部、好ましくは20
〜40重量部、(b)成分25〜70重量部、好ましく
は35〜70重量部、(c)成分7.5〜30重量部、
好ましくは7.5〜25重量部である。
In the photosensitive agent as the component (c), the orthoquinonediazide portion becomes carboxylic acid through ketene by light irradiation, and the irradiated resist portion is removed by development. In the water-dispersible resin composition of the present invention, the compounding ratio of the components (a), (b) and (c) is such that (a), (b) and (c) ) Component 20-50 parts by weight, preferably 20
To 40 parts by weight, 25 to 70 parts by weight of component (b), preferably 35 to 70 parts by weight, 7.5 to 30 parts by weight of component (c),
Preferably it is 7.5 to 25 parts by weight.

【0016】本発明における水分散性樹脂組成物におい
て、(a)、(b)および(c)成分の合計量100重
量部中、(a)成分が20重量部未満では感光剤を充分
に包埋することが出来ず分散粒子の安定性が劣化し、一
方、(a)成分が50重量部を超えると親水性の低い
(a)成分層が分散媒である水に多く接するようになる
ため、(b)成分層による分散保護効果が低下し分散粒
子の安定性が劣化する。(b)成分が25重量部未満で
は分散保護効果が不充分となって分散粒子の安定性が劣
化し、一方、(b)成分が70重量部を超えると系中の
水溶性成分が多くなり過ぎ、分散粒子同志が溶着しやす
くなり不安定化する。(c)成分が7.5重量部未満で
は、レジスト露光後の、露光部と未露光部との現像液に
対する溶解性の差が小さくなるため現像性が低下し、一
方、(c)成分が30重量部を超えると分散粒子の安定
性が劣化するとともに、感光剤を多量に配合することに
よる感度向上も殆ど認められず、高価な感光剤を多量に
使用することは経済的にも不利である。
In the water-dispersible resin composition of the present invention, if the component (a) is less than 20 parts by weight in the total of 100 parts by weight of the components (a), (b) and (c), the photosensitive agent is sufficiently encapsulated. When the component (a) exceeds 50 parts by weight, the component layer (a) having low hydrophilicity comes in contact with water as a dispersion medium. And (b), the dispersion protection effect of the component layer is reduced, and the stability of the dispersed particles is deteriorated. If the amount of the component (b) is less than 25 parts by weight, the effect of protecting the dispersion becomes insufficient and the stability of the dispersed particles is deteriorated. On the other hand, if the amount of the component (b) exceeds 70 parts by weight, the water-soluble component in the system increases. Too long, the dispersed particles are likely to be welded to each other and become unstable. When the amount of the component (c) is less than 7.5 parts by weight, the difference in solubility between the exposed portion and the unexposed portion in the developing solution after exposure of the resist is reduced, so that the developability is reduced. If the amount exceeds 30 parts by weight, the stability of the dispersed particles is deteriorated, and the sensitivity is hardly improved by adding a large amount of the photosensitizer. Therefore, it is economically disadvantageous to use a large amount of the expensive photosensitizer. is there.

【0017】また本発明組成物においては、(a)、
(b)および(c)成分の合計における、カルボキシル
基の含有量は0.60〜1.25モル/Kg、水酸基の
含有量は1.2〜3.5モル/Kgである。上記カルボ
キシル基の含有量が0.60モル/Kg未満では系全体
の親水性が不足し分散粒子が不安定となり、一方、1.
25モル/Kgを超える場合には、水溶性のものが多く
なるため電着塗装時のクーロン効率が低下し、所定の膜
厚を得るのに電着時間を長くする必要が生じ、また、水
溶性のものが多くなるため分散粒子の溶着が起こりやす
く系の安定性が低下する。上記水酸基の含有量が1.2
モル/Kg未満では現像性が低下し、現像液温度を高く
したり、現像時間を長くする必要が生じるとともに得ら
れる画像の解像力も低下し、一方、3.5モル/Kgを
超える場合には、レジスト膜が現像液やエッチング液で
膨潤しやすくなり、パターン欠陥を生じやすく解像力も
低下する。
In the composition of the present invention, (a)
In the total of the components (b) and (c), the content of the carboxyl group is 0.60 to 1.25 mol / Kg, and the content of the hydroxyl group is 1.2 to 3.5 mol / Kg. When the content of the carboxyl group is less than 0.60 mol / Kg, the hydrophilicity of the whole system becomes insufficient and the dispersed particles become unstable.
If it exceeds 25 mol / Kg, water-soluble ones increase, so that the Coulomb efficiency during electrodeposition coating decreases, and it is necessary to lengthen the electrodeposition time to obtain a predetermined film thickness. In this case, the dispersion particles are likely to be welded to each other, and the stability of the system is lowered. When the content of the hydroxyl group is 1.2
When the amount is less than mol / Kg, the developability decreases, and it becomes necessary to increase the temperature of the developer or the development time, and the resolution of the obtained image also decreases. On the other hand, when the amount exceeds 3.5 mol / Kg, In addition, the resist film is easily swelled with a developing solution or an etching solution, and a pattern defect is easily generated, and the resolution is also reduced.

【0018】本発明組成物の主成分である水分散性樹脂
組成物は(a)、(b)および(c)成分の混合物を塩
基で中和、水分散化して得ることが出来る。中和に用い
られる塩基としては、有機アミン、ヒドロキシアンモニ
ウム塩や水酸化カリウム、水酸化ナトリウム等の無機塩
基を挙げることが出来る。中和の程度は通常、混合物中
のカルボキシル基の50〜100%が中和される程度が
好ましい。
The water-dispersible resin composition as a main component of the composition of the present invention can be obtained by neutralizing a mixture of the components (a), (b) and (c) with a base and dispersing the mixture in water. Examples of the base used for neutralization include organic amines, hydroxyammonium salts, and inorganic bases such as potassium hydroxide and sodium hydroxide. Usually, the degree of neutralization is preferably such that 50 to 100% of the carboxyl groups in the mixture are neutralized.

【0019】水分散化する方法としては、(a)、
(b)および(c)成分の混合中和物を水中に加えて分
散させる方法、混合中和物に水を加えて分散させる方
法、(a)、(b)および(c)成分の混合物を中和用
の塩基を含む水中に加えて分散させる方法および混合物
に塩基を含む水を加えて分散させる方法などを挙げるこ
とが出来る。
As a method of dispersing in water, (a)
A method of adding and dispersing a mixed neutralized product of the components (b) and (c) in water, a method of adding and dispersing water to the mixed neutralized product, and a method of mixing the components (a), (b) and (c). Examples thereof include a method of adding and dispersing in water containing a base for neutralization and a method of adding and dispersing water containing a base to a mixture.

【0020】本発明組成物は、必要に応じて、溶剤、界
面活性剤、流展性調整剤、キレート化剤などの添加剤、
フェノール類、ノボラックフェノールやレゾール等ポリ
フェノール類等の溶解性制御剤、顔料、染料等を含有す
ることが出来る。本発明レジスト組成物の固形分割合は
特に限定されるものではないが通常3〜50%の固形分
範囲である。
The composition of the present invention may contain, if necessary, additives such as a solvent, a surfactant, a flow control agent, and a chelating agent.
It may contain solubility control agents such as phenols, polyphenols such as novolak phenol and resol, pigments and dyes. The solid content of the resist composition of the present invention is not particularly limited, but is usually in the range of 3 to 50%.

【0021】本発明のポジ型感光性電着レジスト組成物
を用いるプリント配線基板の製造は次のようにして行な
うことが出来る。電着塗装浴(浴固形分濃度:3〜30
重量%)中に銅箔などの電導性被膜を有する回路用基板
を陽極として浸漬し、最高印加電圧20〜400Vの直
流電流を通電して電着塗装することによって行なわれ
る。通電時間は30秒〜5分が適当であり、膜厚は乾燥
膜厚で2〜50μm、好適には3〜20μmの範囲内で
あることが望ましい。電着塗装後、電着浴から被塗物を
引き上げ水洗したのち、電着塗膜中に含まれる水分を熱
風などで除去する。次いで、このように形成される感光
性電着塗膜面にパターンマスク(写真ポジ)を介して紫
外線などの活性光線を照射露光する。この露光により露
光された部分のオルトキノンジアジド部がケテンを経て
カルボン酸となるため、アルカリ水溶液などの現像液の
現像処理によって除去され、高解像度を実現することが
出来る。
The production of a printed wiring board using the positive photosensitive electrodeposition resist composition of the present invention can be carried out as follows. Electrodeposition coating bath (bath solid concentration: 3-30
% By weight) of a circuit board having a conductive film such as a copper foil as an anode, and applying a DC current having a maximum applied voltage of 20 to 400 V to perform electrodeposition coating. The energization time is suitably 30 seconds to 5 minutes, and the film thickness is desirably in the range of 2 to 50 μm, preferably 3 to 20 μm in dry film thickness. After the electrodeposition coating, the object to be coated is taken out of the electrodeposition bath and washed with water, and then the moisture contained in the electrodeposition coating film is removed with hot air or the like. Next, the surface of the thus formed photosensitive electrodeposition coating film is exposed to actinic rays such as ultraviolet rays through a pattern mask (photo positive). Since the orthoquinonediazide portion of the exposed portion is converted to carboxylic acid via ketene by this exposure, it is removed by a developing treatment with a developing solution such as an alkaline aqueous solution, and high resolution can be realized.

【0022】本発明において露光に使用する活性光線は
3,000〜4,500Åの波長を有する光線がよい。
これらの光線としては、太陽光、水銀灯、キセノンラン
プ、アーク灯などが挙げられる。活性光線の照射は通
常、50〜800mj/cm、好ましくは50〜50
0mj/cmの範囲内で行なわれる。
In the present invention, the actinic ray used for exposure is preferably a ray having a wavelength of 3,000 to 4,500 °.
These rays include sunlight, mercury lamps, xenon lamps, arc lamps and the like. Irradiation with actinic rays is usually 50 to 800 mj / cm 2 , preferably 50 to 50 mj / cm 2 .
It is performed within a range of 0 mj / cm 2 .

【0023】また、露光部の感光性被膜を除去してエッ
チングパターンを形成する現像処理は通常、塗膜面上に
希アルカリ水を吹きつけて塗膜の感光部分を洗い出すこ
とによって行なうことが出来る。希アルカリ水としては
通常、pH8〜12のカセイソーダ、カセイカリ、ケイ
酸ソーダ、炭酸ソーダ、アンモニア水など塗膜中に有す
る遊離のカルボン酸と中和して水溶性を与えることの出
来るのもが使用可能である。
Further, the developing treatment for removing the photosensitive film on the exposed portion to form an etching pattern can be usually carried out by spraying dilute alkaline water onto the surface of the coating to wash out the photosensitive portion of the coating. . As the dilute alkaline water, those which can be neutralized with free carboxylic acids in the coating film, such as sodium hydroxide, sodium hydroxide, sodium silicate, sodium carbonate, aqueous ammonia, etc., having a pH of 8 to 12 to give water solubility are also used. It is possible.

【0024】現像処理によって基板上に形成されたエッ
チングパターンである露出した導電性被膜(非回路部
分)は次いで、例えば、塩化第2鉄溶液等の酸性エッチ
ング液またはアンモニア/塩化アンモニウム系のような
アルカリエッチング液等を用いた通常のエッチング処理
によって除去される。しかる後、回路パターン上の未露
光塗膜である感光性被膜を除去することによってプリン
ト配線基板を製造することが出来る。未露光塗膜の除去
はエチルセロソルブ、エチルセロソルブアセテート等の
セロソルブ系溶剤;トルエン、キシレン等の芳香族炭化
水素系溶剤;メチルエチルケトン、メチルイソブチルケ
ントンなどのケトン系溶剤;酢酸エチル、酢酸ブチルな
どの酢酸エステル系溶剤;トリクロルエチレンなどのク
ロル系溶剤によってまたは、pH10以上のカセイソー
ダ、カセイカリ水溶液やアミン水溶液などによって除去
される。
The exposed conductive coating (non-circuit portion), which is an etching pattern formed on the substrate by the developing process, is then applied to an acidic etching solution such as a ferric chloride solution or an ammonia / ammonium chloride system. It is removed by a normal etching process using an alkaline etching solution or the like. Thereafter, the printed wiring board can be manufactured by removing the photosensitive film which is the unexposed film on the circuit pattern. Removal of the unexposed coating film is performed using cellosolve solvents such as ethyl cellosolve and ethyl cellosolve acetate; aromatic hydrocarbon solvents such as toluene and xylene; ketone solvents such as methyl ethyl ketone and methyl isobutyl kentone; acetic acid such as ethyl acetate and butyl acetate. Ester solvent: It is removed with a chlorinated solvent such as trichloroethylene, or with caustic soda having a pH of 10 or more, aqueous caustic solution, amine aqueous solution, or the like.

【0025】以上述べた通り、本発明のポジ型感光性ア
ニオン電着レジスト組成物は回路用基板表面に容易に電
着塗装することが出来、析出した塗膜は乾燥されて均一
な感光膜を形成する。この感光膜にパターンマスクを通
して光照射すると、露光部は前記のごとく変化して希ア
ルカリ水によって現像され、またエッチング後感光性被
膜を除去する工程で未露光部も溶剤またはアルカリによ
って溶解除去することが出来る。本発明はリードフレー
ム等作成のためのエッチングによる打抜き加工用レジス
トにも好適に使用できる。
As described above, the positive photosensitive anion electrodeposition resist composition of the present invention can be easily electrodeposited on the surface of a circuit board, and the deposited coating film is dried to form a uniform photosensitive film. Form. When this photosensitive film is irradiated with light through a pattern mask, the exposed portions change as described above and are developed with dilute alkaline water, and the unexposed portions are dissolved and removed with a solvent or alkali in the step of removing the photosensitive film after etching. Can be done. The present invention can also be suitably used for a resist for punching by etching for producing a lead frame or the like.

【0026】[0026]

【実施例】以下、実施例により本発明をさらに具体的に
説明する。
The present invention will be described more specifically with reference to the following examples.

【0027】(a)成分アクリル樹脂の製造Production of component (a) acrylic resin

【0028】製造例1 スチレン 300重量部 n−ブチルメタクリレート 663重量部 2−ヒドロキシエチルアクリレート 350重量部 アクリル酸 13重量部 2,2′−アゾビスイソブチロニトリル 15重量部 上記混合物1341重量部を110℃に加熱した750
重量部のエトキシエタノール中に3時間かけて滴下し
た。滴下終了後、110℃に1時間保持した後2,2′
−アゾビスイソブチロニトリルを3重量部を加え、さら
に110℃で2時間保持した後、冷却し、固形分約57
重量%の樹脂溶液(a−1)を得た。得られた樹脂(固
形分)は、数平均分子量(ゲルパーミュエーションクロ
マトグラフィーによる、以下同様)約35,000、カ
ルボキシル基濃度0.18モル/Kg樹脂、水酸基濃度
3.0モル/Kg樹脂であった。
Preparation Example 1 Styrene 300 parts by weight n-butyl methacrylate 663 parts by weight 2-hydroxyethyl acrylate 350 parts by weight Acrylic acid 13 parts by weight 2,2'-azobisisobutyronitrile 15 parts by weight 1341 parts by weight of the above mixture 750 heated to 110 ° C
It was added dropwise to 3 parts by weight of ethoxyethanol over 3 hours. After completion of dropping, the mixture was kept at 110 ° C. for 1 hour, and
-3 parts by weight of azobisisobutyronitrile was added, and the mixture was further kept at 110 ° C for 2 hours.
As a result, a resin solution (a-1) in a weight% was obtained. The obtained resin (solid content) had a number average molecular weight (by gel permeation chromatography, the same applies hereinafter) of about 35,000, a carboxyl group concentration of 0.18 mol / Kg resin, and a hydroxyl group concentration of 3.0 mol / Kg resin. Met.

【0029】製造例2 n−ブチルメタクリレート 300重量部 n−ブチルアクリレート 440重量部 2−ヒドロキシエチルメタクリレート 240重量部 アクリル酸 20重量部 t−ブチルパーオキシベンゾエート 50重量部 上記混合物1050重量部を125℃に加熱した600
重量部のブトキシエタノール中に3時間かけて滴下し
た。滴下終了後、125℃に3時間保持した後、冷却
し、固形分約62.5重量%の樹脂溶液(a−2)を得
た。得られた樹脂(固形分)は、数平均分子量約12,
000,カルボキシル基濃度0.28モル/Kg樹脂、
水酸基濃度1.9モル/Kg樹脂であった。
Production Example 2 n-butyl methacrylate 300 parts by weight n-butyl acrylate 440 parts by weight 2-hydroxyethyl methacrylate 240 parts by weight acrylic acid 20 parts by weight t-butyl peroxybenzoate 50 parts by weight 1050 parts by weight of the above mixture at 125 ° C. 600 heated to
The solution was added dropwise to 3 parts by weight of butoxyethanol over 3 hours. After completion of the dropwise addition, the mixture was maintained at 125 ° C. for 3 hours and then cooled to obtain a resin solution (a-2) having a solid content of about 62.5% by weight. The obtained resin (solid content) has a number average molecular weight of about 12,
000, carboxyl group concentration 0.28 mol / Kg resin,
The hydroxyl group concentration was 1.9 mol / Kg resin.

【0030】製造例3 スチレン 200重量部 n−ブチルメタクリレート 300重量部 n−ブチルメタアクリレート 231重量部 2−ヒドロキシエチルアクリレート 240重量部 アクリル酸 29重量部 2,2′−アゾビスイソブチロニトリル 70重量部 上記混合物1070重量部を105℃に加熱した600
重量部のメトキシプロパノール中に3時間かけて滴下し
た。滴下終了後、105℃に2時間保持した後、冷却
し、固形分約62.5重量%の樹脂溶液(a−3)を得
た。得られた樹脂(固形分)は、数平均分子量約8,1
00,カルボキシル基濃度0.40モル/Kg樹脂、水
酸基濃度2.1モル/Kg樹脂であった。
Production Example 3 200 parts by weight of styrene 300 parts by weight of n-butyl methacrylate 231 parts by weight of n-butyl methacrylate 240 parts by weight of 2-hydroxyethyl acrylate 29 parts by weight of acrylic acid 2,2'-azobisisobutyronitrile 70 Parts by weight 1070 parts by weight of the above mixture was heated to 105 ° C. 600
It was added dropwise to 3 parts by weight of methoxypropanol over 3 hours. After completion of the dropwise addition, the mixture was maintained at 105 ° C. for 2 hours and then cooled to obtain a resin solution (a-3) having a solid content of about 62.5% by weight. The obtained resin (solid content) has a number average molecular weight of about 8.1.
The carboxyl group concentration was 0.40 mol / Kg resin and the hydroxyl group concentration was 2.1 mol / Kg resin.

【0031】製造例4 メタクリル酸 10重量部 2−ヒドロキシエチルアクリレート 522重量部 メチルメタクリレート 300重量部 n−ブチルアクリレート 168重量部 t−ブチルパーオキシベンゾエート 45重量部 上記混合物1045重量部を125℃に加熱した600
重量部のブトキシエタノール中に3時間かけて滴下し
た。滴下終了後、125℃に3時間保持した後、冷却
し、固形分約62.5重量%の樹脂溶液(a−4)を得
た。得られた樹脂(固形分)は、数平均分子量約13,
000,カルボキシル基濃度0.12モル/Kg樹脂、
水酸基濃度4.5モル/Kg樹脂であった。
Production Example 4 10 parts by weight of methacrylic acid 522 parts by weight of 2-hydroxyethyl acrylate 300 parts by weight of methyl methacrylate 168 parts by weight of n-butyl acrylate 45 parts by weight of t-butyl peroxybenzoate 1045 parts by weight of the above mixture was heated to 125 ° C. 600
The solution was added dropwise to 3 parts by weight of butoxyethanol over 3 hours. After completion of the dropwise addition, the mixture was kept at 125 ° C. for 3 hours and then cooled to obtain a resin solution (a-4) having a solid content of about 62.5% by weight. The obtained resin (solid content) had a number average molecular weight of about 13,
000, carboxyl group concentration 0.12 mol / Kg resin,
The hydroxyl group concentration was 4.5 mol / Kg resin.

【0032】(b)成分アクリル樹脂の製造(B) Production of component acrylic resin

【0033】製造例5 スチレン 240重量部 n−ブチルアクリレート 310重量部 2−ヒドロキシエチルアクリレート 290重量部 メタクリル酸 160重量部 過酸化ベンゾイル 65重量部 上記混合物1065重量部を100℃に加熱した550
重量部のメトキシプロパノール中に3時間かけて滴下し
た。滴下終了後、100℃に1時間保持した後、過酸化
ベンゾイル10重量部をメトキシプロパノール50重量
部に溶解した溶液60重量部を加え、さらに100℃に
2時間保持した後、冷却し、固形分約62.5重量%の
樹脂溶液(b−1)を得た。得られた樹脂(固形分)
は、数平均分子量約9,600,カルボキシル基濃度
1.86モル/Kg樹脂、水酸基濃度2.5モル/Kg
樹脂であった。
Production Example 5 240 parts by weight of styrene 310 parts by weight of n-butyl acrylate 290 parts by weight of methacrylic acid 160 parts by weight 65 parts by weight of benzoyl peroxide 1065 parts by weight of the above mixture was heated to 100 ° C. 550
It was added dropwise to 3 parts by weight of methoxypropanol over 3 hours. After completion of the dropwise addition, the mixture was maintained at 100 ° C. for 1 hour, 60 parts by weight of a solution obtained by dissolving 10 parts by weight of benzoyl peroxide in 50 parts by weight of methoxypropanol was added, and the mixture was further maintained at 100 ° C. for 2 hours, cooled, and solidified. About 62.5% by weight of a resin solution (b-1) was obtained. Obtained resin (solid content)
Has a number average molecular weight of about 9,600, a carboxyl group concentration of 1.86 mol / Kg resin, and a hydroxyl group concentration of 2.5 mol / Kg
It was a resin.

【0034】製造例6 スチレン 100重量部 n−ブチルアクリレート 190重量部 メチルメタクリレート 100重量部 2−ヒドロキシエチルメタクリレート 520重量部 アクリル酸 90重量部 t−ブチルパーオキシオクトエート 50重量部 上記混合物1050重量部を125℃に加熱した600
重量部のブトキシエタノール中に3時間かけて滴下し
た。滴下終了後、125℃に2時間保持した後、冷却
し、固形分約62.5重量%の樹脂溶液(b−2)を得
た。得られた樹脂(固形分)は、数平均分子量約10,
500,カルボキシル基濃度1.25モル/Kg樹脂、
水酸基濃度4.0モル/Kg樹脂であった。
Production Example 6 Styrene 100 parts by weight N-butyl acrylate 190 parts by weight Methyl methacrylate 100 parts by weight 2-hydroxyethyl methacrylate 520 parts by weight Acrylic acid 90 parts by weight t-butyl peroxyoctoate 50 parts by weight 1050 parts by weight of the above mixture 600 heated to 125 ° C.
The solution was added dropwise to 3 parts by weight of butoxyethanol over 3 hours. After completion of the dropwise addition, the mixture was kept at 125 ° C. for 2 hours and then cooled to obtain a resin solution (b-2) having a solid content of about 62.5% by weight. The obtained resin (solid content) has a number average molecular weight of about 10,
500, carboxyl group concentration 1.25 mol / Kg resin,
The hydroxyl group concentration was 4.0 mol / Kg resin.

【0035】製造例7 スチレン 200重量部 メチルメタクリレート 100重量部 n−ブチルアクリレート 362重量部 2−ヒドロキシエチルアクリレート 209重量部 メタクリル酸 129重量部 2,2′−アゾビスイソブチロニトリル 60重量部 上記混合物1060重量部を105℃に加熱した600
重量部のメトキシプロパノール中に3時間かけて滴下し
た。滴下終了後、105℃に2時間保持した後、冷却
し、固形分約62.5重量%の樹脂溶液(b−3)を得
た。得られた樹脂(固形分)は、数平均分子量約9,6
00,カルボキシル基濃度1.50モル/Kg樹脂、水
酸基濃度1.8モル/Kg樹脂であった。
Production Example 7 200 parts by weight of styrene 100 parts by weight of methyl methacrylate 362 parts by weight of n-butyl acrylate 209 parts by weight of methacrylic acid 129 parts by weight of methacrylic acid 60 parts by weight of 2,2'-azobisisobutyronitrile 1060 parts by weight of the mixture was heated to 105 ° C. 600
It was added dropwise to 3 parts by weight of methoxypropanol over 3 hours. After completion of the dropwise addition, the mixture was maintained at 105 ° C. for 2 hours and then cooled to obtain a resin solution (b-3) having a solid content of about 62.5% by weight. The obtained resin (solid content) has a number average molecular weight of about 9,6.
The carboxyl group concentration was 1.50 mol / Kg resin, and the hydroxyl group concentration was 1.8 mol / Kg resin.

【0036】製造例8 アクリル酸 126重量部 2−ヒドロキシエチルメタクリレート 390重量部 スチレン 250重量部 n−ブチルアクリレート 234重量部 t−ブチルパーオキシオクトエート 45重量部 上記混合物1045重量部を125℃に加熱した600
重量部のブトキシエタノール中に3時間かけて滴下し
た。滴下終了後、125℃に2時間保持した後、冷却
し、固形分約62.5重量%の樹脂溶液(b−4)を得
た。得られた樹脂(固形分)は、数平均分子量約12,
000,カルボキシル基濃度1.75モル/Kg樹脂、
水酸基濃度3.0モル/Kg樹脂であった。
Production Example 8 126 parts by weight of acrylic acid 390 parts by weight of 2-hydroxyethyl methacrylate 250 parts by weight of styrene 234 parts by weight of n-butyl acrylate 45 parts by weight of t-butyl peroxyoctoate 45 parts by weight of the above mixture 1045 parts by weight was heated to 125 ° C. 600
The solution was added dropwise to 3 parts by weight of butoxyethanol over 3 hours. After completion of the dropwise addition, the mixture was maintained at 125 ° C. for 2 hours and then cooled to obtain a resin solution (b-4) having a solid content of about 62.5% by weight. The obtained resin (solid content) has a number average molecular weight of about 12,
000, carboxyl group concentration 1.75 mol / Kg resin,
The hydroxyl group concentration was 3.0 mol / Kg resin.

【0037】製造例9(比較用) スチレン 200重量部 メチルメタクリレート 100重量部 n−ブチルアクリレート 230重量部 2−ヒドロキシエチルアクリレート 290重量部 アクリル酸 180重量部 2,2′−アゾビスイソブチロニトリル 60重量部 製造例7において、混合物1060重量部のかわりに上
記モノマーと重合開始剤の混合物1060重量部を使用
する以外は製造例7と同様に行なって、固形分約62.
5重量%の樹脂溶液(d−1)を得た。得られた樹脂
(固形分)は、数平均分子量約9,800,カルボキシ
ル基濃度2.50モル/Kg樹脂、水酸基濃度2.5モ
ル/Kg樹脂であった。
Production Example 9 (for comparison) Styrene 200 parts by weight Methyl methacrylate 100 parts by weight n-butyl acrylate 230 parts by weight 2-hydroxyethyl acrylate 290 parts by weight Acrylic acid 180 parts by weight 2,2'-azobisisobutyronitrile 60 parts by weight In the same manner as in Production Example 7, except that 1060 parts by weight of the mixture of the above monomer and polymerization initiator is used instead of 1060 parts by weight of the mixture, the solid content was about 62.5 parts by weight.
A resin solution (d-1) of 5% by weight was obtained. The obtained resin (solid content) had a number average molecular weight of about 9,800, a carboxyl group concentration of 2.50 mol / Kg resin, and a hydroxyl group concentration of 2.5 mol / Kg resin.

【0038】製造例10(比較用) スチレン 235重量部 n−ブチルアクリレート 400重量部 2−ヒドロキシエチルアクリレート 300重量部 アクリル酸 65重量部 2,2′−アゾビスイソブチロニトリル 10重量部 上記混合物1010重量部を105℃に加熱した700
重量部のエトキシエタノール中に3時間かけて滴下し
た。滴下終了後、105℃に1時間保持し、次いで2,
2′−アゾビスイソブチロニトリルを3重量部を加え、
さらに105℃で2時間保持した後、冷却し、固形分約
59重量%の樹脂溶液(d−2)を得た。得られた樹脂
(固形分)は、数平均分子量約35,000、カルボキ
シル基濃度0.90モル/Kg樹脂、水酸基濃度2.3
モル/Kg樹脂であった。
Production Example 10 (for comparison) Styrene 235 parts by weight n-butyl acrylate 400 parts by weight 2-hydroxyethyl acrylate 300 parts by weight Acrylic acid 65 parts by weight 2,2'-azobisisobutyronitrile 10 parts by weight The above mixture 700 obtained by heating 1010 parts by weight to 105 ° C.
It was added dropwise to 3 parts by weight of ethoxyethanol over 3 hours. After the completion of the dropwise addition, the temperature was maintained at 105 ° C. for 1 hour,
3 'parts by weight of 2'-azobisisobutyronitrile were added,
After further keeping at 105 ° C. for 2 hours, the mixture was cooled to obtain a resin solution (d-2) having a solid content of about 59% by weight. The obtained resin (solid content) had a number average molecular weight of about 35,000, a carboxyl group concentration of 0.90 mol / Kg resin, and a hydroxyl group concentration of 2.3.
Mol / Kg resin.

【0039】(c)成分感光剤の製造(C) Production of component photosensitizer

【0040】製造例11 テトラヒドロフラン10,000重量部中に1,2−ナ
フトキノンジアジド−5−スルホニルクロライド535
重量部および2,3,4−トリヒドロキシベンゾフェノ
ン230重量部を配合、溶解した後、0℃に冷却し、こ
の中に撹拌下にて、トリエチルアミン210重量部とテ
トラヒドロフラン400重量部との混合溶液610重量
部を1時間かけて徐々に滴下した。この滴下によって系
の温度は30℃まで上昇した。滴下終了後、30℃で2
時間保持した後、この反応液を大量の0.1重量%塩酸
水溶液中に投入し沈澱物を生成させた。この沈澱物を瀘
別し、洗浄液(メタノール/脱イオン水=1/1混合
液)にて洗液が中性となるまで洗浄し、得られた固形物
を室温にて減圧下で乾燥させて感光剤Aを得た。得られ
た感光剤Aは1分子中に平均約2個の前記式[1]で表
わされる感光基を有していた。
Preparation Example 11 1,2-Naphthoquinonediazide-5-sulfonyl chloride 535 in 10,000 parts by weight of tetrahydrofuran
Parts by weight and 230 parts by weight of 2,3,4-trihydroxybenzophenone are mixed and dissolved, and then cooled to 0 ° C., and a mixed solution 610 of 210 parts by weight of triethylamine and 400 parts by weight of tetrahydrofuran is stirred therein. Parts by weight were gradually added dropwise over 1 hour. The temperature of the system was raised to 30 ° C. by this dropping. After the completion of dropping, 2
After holding for a time, this reaction solution was poured into a large amount of a 0.1% by weight aqueous hydrochloric acid solution to form a precipitate. The precipitate was filtered off, washed with a washing solution (methanol / deionized water = 1/1 mixture) until the washing solution became neutral, and the resulting solid was dried at room temperature under reduced pressure. Photosensitive agent A was obtained. The obtained photosensitive agent A had an average of about two photosensitive groups represented by the above formula [1] in one molecule.

【0041】製造例12 テトラヒドロフラン15,000重量部中に1,2−ナ
フトキノンジアジド−4−スルホニルクロライド80
2.5重量部および2,3,4,4′−テトラヒドロキ
シベンゾフェノン246重量部を配合、溶解した後、0
℃に冷却し、この中に撹拌下にて、トリエチルアミン2
10重量部とテトラヒドロフラン400重量部との混合
溶液610重量部を1時間かけて徐々に滴下した。滴下
終了後、30℃で2時間保持した後、この反応液を製造
例11と同様の方法にて沈澱、瀘過、乾燥させて感光剤
Bを得た。得られた感光剤Bは1分子中に平均約3個の
前記式[2]で表わされる感光基を有していた。
Production Example 12 1,2-Naphthoquinonediazide-4-sulfonyl chloride 80 in 15,000 parts by weight of tetrahydrofuran
After mixing and dissolving 2.5 parts by weight and 246 parts by weight of 2,3,4,4'-tetrahydroxybenzophenone,
° C and stirred therein while stirring triethylamine 2
610 parts by weight of a mixed solution of 10 parts by weight and 400 parts by weight of tetrahydrofuran was gradually dropped over 1 hour. After completion of the dropwise addition, the mixture was maintained at 30 ° C. for 2 hours, and the reaction solution was precipitated, filtered and dried in the same manner as in Production Example 11 to obtain Photosensitive Agent B. The obtained photosensitive agent B had an average of about 3 photosensitive groups represented by the formula [2] in one molecule.

【0042】製造例13 数平均分子量約3,000のポリ(パラヒドロキシビニ
ルベンゼン)100重量部をテトラヒドロフラン100
重量部に溶解させた溶液に、o−ナフトキノンジアジド
−5−スルホン酸クロリド100重量部をテトラヒドロ
フラン1,000重量部に溶解させた溶液1,100重
量部を加えた後、撹拌下にて、液温を20℃に保持しな
がらトリエチルアミン50重量部を30分かけて滴下
し、さらに20℃に2時間保持し、次いで内容物を多量
の0.5重量%塩酸水溶液中に注ぎ込み、沈降物を瀘別
し、多量の脱イオン水で洗浄後、常温で減圧乾燥させて
感光剤Cを得た。得られた感光剤Cは1分子中に平均約
11個の前記式[1]で表わされる感光基を有してい
た。
Production Example 13 100 parts by weight of poly (parahydroxyvinylbenzene) having a number average molecular weight of about 3,000 was added to tetrahydrofuran 100
1,100 parts by weight of a solution obtained by dissolving 100 parts by weight of o-naphthoquinonediazide-5-sulfonic acid chloride in 1,000 parts by weight of tetrahydrofuran were added to the solution dissolved in parts by weight. While maintaining the temperature at 20 ° C., 50 parts by weight of triethylamine was added dropwise over 30 minutes, further maintained at 20 ° C. for 2 hours, and then the contents were poured into a large amount of a 0.5% by weight aqueous hydrochloric acid solution, and the precipitate was filtered. Separately, the resultant was washed with a large amount of deionized water and dried under reduced pressure at normal temperature to obtain a photosensitive agent C. The obtained photosensitive agent C had an average of about 11 photosensitive groups represented by the formula [1] in one molecule.

【0043】製造例14 テトラヒドロフラン5,000重量部中に1,2−ベン
ゾキノンジアジド−4−スルホニルクロライド546重
量部および2,3,4−トリヒドロキシベンゾフェノン
230重量部を配合、溶解した後、0℃に冷却し、この
中に撹拌下にて、トリエチルアミン270重量部とテト
ラヒドロフラン300重量部との混合溶液570重量部
を1時間かけて徐々に滴下した。滴下終了後、30℃で
2時間保持した後、この反応液を製造例11と同様の方
法にて沈澱、瀘過、乾燥させて感光剤Dを得た。得られ
た感光剤Dは1分子中に平均約2.5個の前記式[3]
で表わされる感光基を有していた。
Production Example 14 Into 5,000 parts by weight of tetrahydrofuran, 546 parts by weight of 1,2-benzoquinonediazide-4-sulfonyl chloride and 230 parts by weight of 2,3,4-trihydroxybenzophenone were mixed and dissolved. 570 parts by weight of a mixed solution of 270 parts by weight of triethylamine and 300 parts by weight of tetrahydrofuran were gradually added dropwise thereto over 1 hour under stirring. After completion of the dropwise addition, the mixture was kept at 30 ° C. for 2 hours, and the reaction solution was precipitated, filtered and dried in the same manner as in Production Example 11 to obtain Photosensitive Agent D. The obtained photosensitive agent D has an average of about 2.5 per formula [3] in one molecule.
And a photosensitive group represented by

【0044】実施例1 製造例1で得た樹脂溶液(a−1) 526重量部 製造例6で得た樹脂溶液(b−2) 800重量部 製造例11で得た感光剤A 200重量部 活性剤E(HLB14 のノニオン系界面活性剤)10重量部 ベンジルアルコール 400重量部 上記混合物にトリエチルアミン74.5重量部(中和度
75重量%に相当する量)を加えて撹拌中和した後、混
合物を撹拌機にて1,500γpmで撹拌しつつ徐々に
脱イオン水847重量部を加えて安定なエマルジョン液
である、不揮発分約35重量%の電着レジスト組成物を
得た。
Example 1 526 parts by weight of the resin solution (a-1) obtained in Production Example 1 800 parts by weight of the resin solution (b-2) obtained in Production Example 6 200 parts by weight of the photosensitive agent A obtained in Production Example 11 Activator E (nonionic surfactant of HLB14) 10 parts by weight 400 parts by weight of benzyl alcohol 74.5 parts by weight of triethylamine (an amount corresponding to a degree of neutralization of 75% by weight) was added to the above mixture, and the mixture was neutralized with stirring. 847 parts by weight of deionized water was gradually added while stirring the mixture with a stirrer at 1,500 gpm to obtain an electrodeposited resist composition having a nonvolatile content of about 35% by weight, which was a stable emulsion liquid.

【0045】実施例2〜5および比較例1〜4 後記表1に示す配合とする以外は実施例1と同様に行な
い、各電着レジスト組成物を得た。各例で得た電着レジ
スト組成物の性状値を表1に示す。
Examples 2 to 5 and Comparative Examples 1 to 4 The same procedures as in Example 1 were carried out except for using the formulations shown in Table 1 below to obtain each electrodeposition resist composition. Table 1 shows the property values of the electrodeposition resist compositions obtained in each example.

【0046】[0046]

【表1】 なお表1における(註)は下記の通りである。 (註1)の活性剤F:HLB16 のノニオン系界面
活性剤 (註2)表中の各記号は次の化合物の略号である。 TEA:トリエチルアミン、DMAE:ジメチルアミノ
エタノール、BA:ベンジルアルコール、DMG:ジメ
チルグライム
[Table 1] (Note) in Table 1 is as follows. ( * 1) * Activator F: Nonionic surfactant of HLB16 ( * 2) Each symbol in the table is an abbreviation for the following compound. TEA: triethylamine, DMAE: dimethylaminoethanol, BA: benzyl alcohol, DMG: dimethylglyme

【0047】実施例1〜5および比較例1〜4で得た各
電着レジスト組成物を脱イオン水にて不揮発分が10重
量%になるように希釈して各電着浴を作成した。各電着
レジスト組成遣物(原液)および各電着浴液の液安定性
について試験を行なった。試験結果を表2に示す。試験
方法は下記の通りである。
Each of the electrodeposition resist compositions obtained in Examples 1 to 5 and Comparative Examples 1 to 4 was diluted with deionized water so that the non-volatile content was 10% by weight to prepare each electrodeposition bath. A test was conducted on the stability of each electrodeposition resist composition applied solution (stock solution) and each electrodeposition bath solution. Table 2 shows the test results. The test method is as follows.

【0048】液安定性:各原液および電着浴液を密閉
し、30℃にて6ヶ月間まで1ヶ月置きに液状態をを調
べた。また貯蔵1日後の液状態も調べた。また、各電着
浴液について貯蔵前および貯蔵6ヶ月後における、分散
しているエマルジョン粒子の粒径をCoulter M
odel N4SD(Coulter Electro
nics Inc. 製)にて測定した。液状態につい
ては、固化、著しい増粘、沈降、分離などの異常のない
ものを○と表示した。長期貯蔵における○は6ヶ月貯蔵
後に上記異常のないことを示す。また上記、貯蔵前およ
び6ヶ月貯蔵後の各電着浴液を28℃に保った浴中で、
0.3mmΦの銅メッキ付きスルーホールを有する銅張
り積層板(基板)を陽極として対極の間に60mA/d
の直流を3分間印加した後、該積層板(基板)を浴
より引き出し、水洗後80℃で10分間水切乾燥してレ
ジスト膜を得た。得られたレジスト膜の膜厚、塗面外観
を後記表2に示す。外観上、異常の認められないものを
○とした。また、得られたレジスト膜のスルーホール部
を遮光し、その他の部分にラインスペース30μm/3
0μmの白黒パターンを有するポリエステル製パターン
マスクを密着し、超高圧水銀灯で150mj/cm
露光を行なった。さらに、露光を行なった基板に、それ
ぞれ20℃、25℃、30℃、35℃、40℃、45℃
に保った1%炭酸ソーダ水溶液を1分間噴霧して現像を
行なった。次いで、塩化第2銅で露出した銅をエッチン
グ除去後、50℃の1%水酸化ナトリウム水溶液で残存
するレジスト膜を除去してエッチングパターンを得た。
得られたエッチングパターンの状態をライン/スペース
部およびスルーホール部について調べた。ライン/スペ
ース部においては、パターンの剥離欠損や銅残りのない
ものを○と表示し、スルーホール部についてはメッキが
完全な状態で残っているものを○と表示した。また、現
像が行なえる現像液の実用温度範囲も調べた。試験結果
を後記表2に示す。
Liquid stability: Each stock solution and the electrodeposition bath solution were sealed, and the liquid state was checked at 30 ° C. every other month for up to 6 months. The state of the liquid one day after storage was also examined. Further, the particle size of the dispersed emulsion particles before storage and after 6 months of storage for each of the electrodeposition bath solutions was determined by Coulter M.
model N4SD (Coulter Electro
nics Inc. Manufactured). Regarding the liquid state, those having no abnormalities such as solidification, remarkable thickening, sedimentation, and separation were indicated by ○.に お け る in long-term storage indicates that there is no abnormality after storage for 6 months. In addition, the above-mentioned electrodeposition bath solutions before storage and after storage for 6 months were kept in a bath kept at 28 ° C.
A copper-clad laminate (substrate) having a through-hole with a copper plating of 0.3 mmφ is used as an anode, and 60 mA / d between counter electrodes.
After applying a direct current of m 2 for 3 minutes, the laminate (substrate) was taken out of the bath, washed with water, and then drained and dried at 80 ° C. for 10 minutes to obtain a resist film. Table 2 below shows the thickness and the appearance of the coated surface of the obtained resist film. A sample in which no abnormality was observed in appearance was marked with “○”. Further, the through-hole portion of the obtained resist film is shielded from light, and a line space of 30 μm / 3 is provided in other portions.
A polyester pattern mask having a black and white pattern of 0 μm was brought into close contact, and exposure was performed at 150 mj / cm 2 using an ultra-high pressure mercury lamp. Further, the exposed substrate is placed at 20 ° C., 25 ° C., 30 ° C., 35 ° C., 40 ° C., 45 ° C., respectively.
Was sprayed with a 1% aqueous solution of sodium carbonate maintained for 1 minute for development. Next, after the copper exposed by cupric chloride was removed by etching, the remaining resist film was removed with a 1% aqueous sodium hydroxide solution at 50 ° C. to obtain an etching pattern.
The state of the obtained etching pattern was examined for the line / space portion and the through-hole portion. In the line / space portion, those having no pattern peeling loss or copper residue were indicated by ○, and those in the through hole portion where plating remained in a complete state were indicated by ○. Further, the practical temperature range of the developing solution that can be developed was also examined. The test results are shown in Table 2 below.

【0049】[0049]

【表2】 (註) 表中のHCはハードケーキングの略号である。[Table 2] (Note) HC in the table is an abbreviation for hard caking.

【0050】[0050]

【発明の効果】本発明レジスト組成物は、塗装時の稼動
安定性に優れ、塗装作業性が良いものであって、導体画
像形成の信頼性の高いレジストを得ることが出来るもの
である。本発明レジスト組成物は、特にプリント配線基
板製造用エッチングレジストに適しており、本発明レジ
スト組成物を使用した本発明のプリント配線基板の製造
方法によれば、浴液の滞留時間の長い稼動条件下におい
ても信頼性の高いプリント配線基板を製造することが出
来る。
The resist composition of the present invention has excellent operational stability during coating, good coating workability, and can provide a resist having high reliability in forming a conductive image. The resist composition of the present invention is particularly suitable for an etching resist for manufacturing a printed wiring board, and according to the method for manufacturing a printed wiring board of the present invention using the resist composition of the present invention, operating conditions with a long residence time of a bath solution. Even below, a highly reliable printed wiring board can be manufactured.

フロントページの続き (72)発明者 岩沢 直純 神奈川県平塚市東八幡4丁目17番1号 関西ペイント株式会社内 (56)参考文献 特開 平2−289660(JP,A) 特開 平4−53877(JP,A) 特開 平4−100870(JP,A) 特開 昭63−141048(JP,A) 特開 平3−100073(JP,A) (58)調査した分野(Int.Cl.6,DB名) G03F 7/023 501 C08L 33/00 C09D 133/00 G03F 7/022 H05K 3/06 Continuation of the front page (72) Inventor Naozumi Iwasawa 4-171-1, Higashi-Hachiman, Hiratsuka-shi, Kanagawa Pref. Kansai Paint Co., Ltd. (56) References JP-A-2-289660 (JP, A) JP-A-4-53877 ( JP, A) JP-A-4-100870 (JP, A) JP-A-63-141048 (JP, A) JP-A-3-100073 (JP, A) (58) Fields investigated (Int. Cl. 6 , (DB name) G03F 7/023 501 C08L 33/00 C09D 133/00 G03F 7/022 H05K 3/06

Claims (6)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】 (a)樹脂1Kg中にカルボキシル基
0.075〜0.55モルおよび水酸基1.5〜5.5
モルを有するアクリル樹脂20〜50重量部、(b)樹
脂1Kg中にカルボキシル基1.20〜2.50モルお
よび水酸基1.5〜5.0モルを有するアクリル樹脂2
5〜70重量部および(c)1分子中に下記式[1]、
[2]または[3]で表わされる基 式[1] 【化1】 式[2] 【化2】 式[3] 【化3】 を1個以上有する感光剤7.5〜30重量部を含有し、
成分(a)、(b)および(c)の合計量が100重量
部であって、成分(a)、(b)および(c)の合計に
おけるカルボキシル基の含有量が0.60〜1.25モ
ル/Kg、水酸基の含有量が1.2〜3.5モル/Kg
である樹脂混合物を塩基で中和水分散化して得られる水
分散性樹脂組成物を主成分として含有することを特徴と
するポジ型感光性アニオン電着レジスト組成物。
1. (a) 0.075 to 0.55 mol of carboxyl groups and 1.5 to 5.5 hydroxyl groups per 1 kg of resin.
20 to 50 parts by weight of an acrylic resin having a molar amount of (b) an acrylic resin 2 having a carboxylic acid group of 1.20 to 2.50 mol and a hydroxyl group of 1.5 to 5.0 mol in 1 kg of the resin
5 to 70 parts by weight and (c) the following formula [1] in one molecule:
A group represented by the formula [1] represented by [2] or [3]: Formula [2] Formula [3] Containing 7.5 to 30 parts by weight of a photosensitive agent having at least one
The total amount of the components (a), (b) and (c) is 100 parts by weight, and the content of the carboxyl group in the total of the components (a), (b) and (c) is 0.60 to 1. 25 mol / Kg, the content of the hydroxyl group is 1.2 to 3.5 mol / Kg
A positive photosensitive anion electrodeposition resist composition comprising, as a main component, a water-dispersible resin composition obtained by neutralizing and dispersing a resin mixture as described above in water with a base.
【請求項2】 (a)、(b)、(c)各成分が、合計
100重量部中(a)成分20〜50重量部、(b)成
分25〜70重量部、(c)成分7.5〜30重量部で
ある請求項1に記載されたポジ型感光性アニオン電着レ
ジスト組成物。
2. Components (a), (b) and (c) each comprising 100 to 50 parts by weight of component (a), 20 to 50 parts by weight, component (b) 25 to 70 parts by weight, and component (c) 7 The positive photosensitive anion electrodeposition resist composition according to claim 1, wherein the amount is from 0.5 to 30 parts by weight.
【請求項3】 固形分の割合が3〜50%である、請求
項1または2に記載されたポジ型感光性アニオン電着レ
ジスト組成物。
3. The positive photosensitive anion electrodeposition resist composition according to claim 1, wherein the proportion of the solid content is 3 to 50%.
【請求項4】 (i)電導性被膜を有する回路用基板表
面に、請求項1記載の電着レジスト組成物を電着塗装
し、ポジ型感光性被膜を形成する工程; (ii)該ポジ型感光性被膜をパターンマスクを介して
露光する工程; (iii)露光部の感光性被膜を除去してエツチングパ
ターンを形成する工程; (iv)露光した電導性被膜をエツチングにより除去す
る工程;及び (v)回路パターン上の感光性被膜を除去する工程を有
することを特徴とするプリント配線基板の製造方法。
4. A step of (i) electrodepositing the electrodeposition resist composition according to claim 1 on a surface of a circuit substrate having an electrically conductive film to form a positive photosensitive film; Exposing the photosensitive film through a pattern mask; (iii) removing the photosensitive film in the exposed area to form an etching pattern; (iv) removing the exposed conductive film by etching; and (V) A method for manufacturing a printed wiring board, comprising a step of removing a photosensitive film on a circuit pattern.
【請求項5】 電着されたポジ型感光性被膜が乾燥膜厚
で2〜50μmである、請求項4に記載されたプリント
配線基板の製造方法。
5. The method according to claim 4, wherein the electrodeposited positive photosensitive film has a dry film thickness of 2 to 50 μm.
【請求項6】 ポジ型感光性被膜をパターンマスクを介
して行なう露光を、3,000〜4,500Åの波長の
光線を50〜800mj/cm照射して行なう、請求
項4または5に記載されたプリント配線基板の製造方
法。
6. The exposure according to claim 4, wherein the exposure of the positive photosensitive film through the pattern mask is performed by irradiating a light beam having a wavelength of 3,000 to 4,500 ° with 50 to 800 mj / cm 2. Of manufacturing a printed circuit board.
JP22771092A 1992-07-14 1992-07-14 Positive photosensitive anion electrodeposition resist composition and method for producing printed wiring board using this composition Expired - Fee Related JP2935207B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP22771092A JP2935207B2 (en) 1992-07-14 1992-07-14 Positive photosensitive anion electrodeposition resist composition and method for producing printed wiring board using this composition

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP22771092A JP2935207B2 (en) 1992-07-14 1992-07-14 Positive photosensitive anion electrodeposition resist composition and method for producing printed wiring board using this composition

Publications (2)

Publication Number Publication Date
JPH0635187A JPH0635187A (en) 1994-02-10
JP2935207B2 true JP2935207B2 (en) 1999-08-16

Family

ID=16865142

Family Applications (1)

Application Number Title Priority Date Filing Date
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Country Status (1)

Country Link
JP (1) JP2935207B2 (en)

Also Published As

Publication number Publication date
JPH0635187A (en) 1994-02-10

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