JP2909790B2 - Superconducting detection coil - Google Patents

Superconducting detection coil

Info

Publication number
JP2909790B2
JP2909790B2 JP4157764A JP15776492A JP2909790B2 JP 2909790 B2 JP2909790 B2 JP 2909790B2 JP 4157764 A JP4157764 A JP 4157764A JP 15776492 A JP15776492 A JP 15776492A JP 2909790 B2 JP2909790 B2 JP 2909790B2
Authority
JP
Japan
Prior art keywords
superconducting
detection coil
wiring
wiring pattern
coil
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP4157764A
Other languages
Japanese (ja)
Other versions
JPH05302966A (en
Inventor
成計 小田原
徳男 千葉
哲 中山
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Seiko Instruments Inc
Original Assignee
Seiko Instruments Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Instruments Inc filed Critical Seiko Instruments Inc
Priority to US07/914,894 priority Critical patent/US5329229A/en
Priority to EP92112177A priority patent/EP0525533B1/en
Priority to DE69222378T priority patent/DE69222378T2/en
Publication of JPH05302966A publication Critical patent/JPH05302966A/en
Application granted granted Critical
Publication of JP2909790B2 publication Critical patent/JP2909790B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【産業上の利用分野】この発明は高感度磁気センサに応
用する超伝導量子干渉素子(Superconduct
ing Quantum Interference
Device:SQUIDと略す)を使用した磁気セン
サ用検出コイルの構造に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a superconducting quantum interference device (Superconductor) applied to a high-sensitivity magnetic sensor.
ing Quantum Interference
Device: abbreviated as SQUID).

【0002】[0002]

【従来の技術】SQUIDは従来から微小磁場の検出に
応用されている。SQUID磁束計では超伝導線で構成
したボビン型の検出コイルが多く用いられている。図1
0は従来の1次微分ボビン型検出コイルの構成を表した
図である。11はボビン、12は超伝導コイル線、13
は電極、14はダンピング抵抗で、ボビン11に形成さ
れた溝中に、上下2つのコイルが互いに逆巻となるよう
に超伝導コイル線12が配置され、ダンピング抵抗14
が接続された電極13に超伝導コイル線12が接続され
ている構造を表している。
2. Description of the Related Art SQUIDs have been applied to the detection of minute magnetic fields. In the SQUID magnetometer, a bobbin type detection coil formed of a superconducting wire is often used. FIG.
Reference numeral 0 denotes a configuration of a conventional primary differential bobbin type detection coil. 11 is a bobbin, 12 is a superconducting coil wire, 13
And 14 are damping resistors. A superconducting coil wire 12 is disposed in a groove formed in the bobbin 11 so that the upper and lower coils are wound in opposite directions.
Represents a structure in which the superconducting coil wire 12 is connected to the electrode 13 to which is connected.

【0003】図11は従来の2次微分ボビン型検出コイ
ルの構成を表した図である。上下2つのコイルは同方向
に巻かれ、中間のコイルは上下のコイルに対して倍の巻
数で逆巻されている。1次微分ボビン型検出コイル、2
次微分ボビン型検出コイルともにコイル以外の配線はよ
り線とし、配線中に磁束が鎖交するのを防止する構造と
なっている。1次微分ボビン型検出コイルは上部のコイ
ルで検出した磁場信号と下部のコイルで検出した磁場信
号の差、すなわち磁場勾配を検出するものである。2次
微分ボビン型検出コイルは上部のコイルと中間のコイル
で検出した磁場勾配と中間のコイルと下部のコイルで検
出した磁場勾配の差の磁場勾配を検出するものである。
従って、コイルの面積精度、形状精度、相互の位置精
度、相互の平行精度などが磁場勾配感度に影響を与え
る。
FIG. 11 is a diagram showing a configuration of a conventional secondary differential bobbin type detection coil. The upper and lower coils are wound in the same direction, and the middle coil is reversely wound with twice the number of turns of the upper and lower coils. Primary differential bobbin type detection coil, 2
Both the secondary differential bobbin type detection coils have a structure in which the wires other than the coils are stranded, and prevent the magnetic flux from interlinking in the wires. The primary differential bobbin type detection coil detects a difference between a magnetic field signal detected by an upper coil and a magnetic field signal detected by a lower coil, that is, a magnetic field gradient. The secondary differential bobbin type detection coil detects a magnetic field gradient which is a difference between a magnetic field gradient detected by an upper coil and an intermediate coil and a magnetic field gradient detected by an intermediate coil and a lower coil.
Therefore, coil area accuracy, shape accuracy, mutual position accuracy, mutual parallel accuracy, and the like affect the magnetic field gradient sensitivity.

【0004】[0004]

【発明が解決しようとする課題】上記従来の1次微分ボ
ビン型検出コイルでは、超伝導コイル線を配置するため
のボビンの溝に加工精度が要求され、また超伝導コイル
線を配置する際、円形のコイル部分とより線の境界部分
に三角形状の隙間が形成され、上下2つのコイルの面積
精度、形状精度、相互の位置精度、相互の平行精度を向
上させることは容易ではなく、磁場勾配感度および特性
の再現性が低下する問題や、製造作業に熟練が要求され
るため製造が容易ではない問題があった。また検出コイ
ルと並列にダンピング抵抗を接続する際、検出コイルに
直接抵抗を接続することは困難であり、SQUIDと検
出コイルを接続する部分の付近に抵抗を接続していたた
め、作業性が良くなかった。
In the above-mentioned conventional primary differential bobbin type detection coil, machining accuracy is required for the groove of the bobbin for arranging the superconducting coil wire. A triangular gap is formed at the boundary between the circular coil part and the stranded wire, and it is not easy to improve the area accuracy, shape accuracy, mutual position accuracy, and mutual parallel accuracy of the upper and lower two coils, and the magnetic field gradient There was a problem that the reproducibility of sensitivity and characteristics was reduced, and there was a problem that skill was required for the manufacturing operation and the manufacturing was not easy. Also, when connecting a damping resistor in parallel with the detection coil, it is difficult to connect the resistor directly to the detection coil, and since the resistor is connected near the portion where the SQUID and the detection coil are connected, the workability is not good. Was.

【0005】[0005]

【課題を解決するための手段】本発明は、上記の課題を
解決するため、一部に略コの字状の配線部を有する超伝
導配線パターン、あるいはその超伝導配線パターンと抵
抗を形成したフレキシブル基板を円筒状に丸め、略コの
字状の配線部が円筒状の配線パターンを形成するよう構
成し、超伝導検出コイルとしたものである。
According to the present invention, in order to solve the above-mentioned problems, a superconducting wiring pattern partially having a substantially U-shaped wiring portion, or a superconducting wiring pattern and a resistor are formed. The flexible substrate is rolled into a cylindrical shape, and a substantially U-shaped wiring portion is formed to form a cylindrical wiring pattern to form a superconducting detection coil.

【0006】[0006]

【作用】上記のような超伝導検出コイルの構造によれ
ば、通常の基板配線パターン形成技術で検出コイル配線
パターンおよび抵抗パターンを形成し、フレキシブル基
板を円筒状に形成することで容易に超伝導検出コイルを
製造することができ、上下2つのコイルの面積精度、形
状精度、相互の位置精度、相互の平行精度を向上させる
ことができ、かつ、抵抗値の絶対精度および複数の超伝
導検出コイル間での相対精度を向上させることができ
る。
According to the structure of the superconducting detection coil as described above, the detection coil wiring pattern and the resistance pattern are formed by a normal board wiring pattern forming technique, and the superconducting element is easily formed by forming the flexible substrate into a cylindrical shape. A detection coil can be manufactured, the area accuracy, shape accuracy, mutual position accuracy, mutual parallel accuracy of the upper and lower two coils can be improved, and the absolute accuracy of the resistance value and a plurality of superconducting detection coils The relative accuracy between them can be improved.

【0007】[0007]

【実施例】以下に本発明の実施例について図面を参照し
て説明する。図1は本発明の実施例1を示す1次微分ボ
ビン型検出コイルのフレキシブル基板上配線パターンを
表した図である。1はフレキシブル基板、2は超伝導配
線パターン、3は電極、4は抵抗配線で、フレキシブル
基板1としてはポリイミド基板、超伝導配線パターン2
および電極3としては鉛錫(Pb−Sn)メッキ配線、
ニオブ(Nb)スパッタ膜配線、鉛インジウム(Pb−
In)蒸着膜配線が用いられるが、他の超伝導薄膜配
線、超伝導厚膜配線でもよい。Pb−Snメッキ膜のバ
ッファー層として、銅(Cu)、パラジウム(Pd)な
どの抵抗材料が用いられるが、他の高抵抗材料を用いる
こともできる。抵抗配線4は、前記Pb−Snメッキ膜
のバッファー層と同様な抵抗材料が用いられる。
Embodiments of the present invention will be described below with reference to the drawings. FIG. 1 is a diagram illustrating a wiring pattern on a flexible substrate of a primary differential bobbin type detection coil according to a first embodiment of the present invention. 1 is a flexible substrate, 2 is a superconducting wiring pattern, 3 is an electrode, 4 is a resistance wiring, and a flexible substrate 1 is a polyimide substrate, a superconducting wiring pattern 2
And lead 3 (Pb-Sn) plated wiring as the electrode 3,
Niobium (Nb) sputtered film wiring, lead indium (Pb-
In) A deposited film wiring is used, but another superconducting thin film wiring or a superconducting thick film wiring may be used. As a buffer layer of the Pb-Sn plating film, a resistance material such as copper (Cu) or palladium (Pd) is used, but another high resistance material can be used. The resistance wiring 4 is made of the same resistance material as the buffer layer of the Pb-Sn plating film.

【0008】図1のAで示した部分とBで示した部分が
重なるように1巻することにより、図3に示す構成の1
巻の1次微分型検出コイルを構成することができる。図
3の矢印はコイルの巻方向を示している。また、図1の
AとCとBが重なるように2巻することにより、図4に
示す構成の2巻の1次微分型検出コイルを構成すること
ができる。図4の矢印はコイルの巻方向を示している。
By winding one turn so that the portion indicated by A in FIG. 1 and the portion indicated by B overlap, one of the configurations shown in FIG.
A first-order differential detection coil having a winding can be configured. The arrow in FIG. 3 indicates the winding direction of the coil. Also, by winding two turns so that A, C and B in FIG. 1 overlap, a two-turn primary differential detection coil having the structure shown in FIG. 4 can be formed. The arrow in FIG. 4 indicates the winding direction of the coil.

【0009】図2は本発明の実施例1を示す1次微分ボ
ビン型検出コイルの構成を表した断面図である。6はボ
ビン、7はカバーである。図1に示した超伝導配線パタ
ーンを形成したフレキシブル基板1をボビン6に巻付
け、円筒型のカバー7を配置した構成を示している。ボ
ビン6の材料としてはFRP,ガラス、テフロン等の円
筒材、円柱材が用いられ、カバー7の材料としてはFR
P,ガラス、テフロン等の円筒材が用いられる。
FIG. 2 is a sectional view showing the structure of a first-order differential bobbin type detection coil according to the first embodiment of the present invention. 6 is a bobbin, 7 is a cover. 1 shows a configuration in which the flexible substrate 1 on which the superconducting wiring pattern shown in FIG. 1 is formed is wound around a bobbin 6 and a cylindrical cover 7 is arranged. As the material of the bobbin 6, a cylindrical material or a cylindrical material such as FRP, glass, Teflon or the like is used.
A cylindrical material such as P, glass, and Teflon is used.

【0010】図5は、本発明の実施例2を示す2次微分
ボビン型検出コイルのフレキシブル基板上配線パターン
を表した図である。フレキシブル基板1、超伝導配線パ
ターン2、Pb−Snメッキ膜のバッファー層、電極
3、抵抗配線4の材質は、実施例1と変わるところはな
い。図5のAで示した配線パターンが交差する部分は導
通しないようにする。例えば、下側の超伝導膜配線を作
製後、ウレタン等の絶縁材料でカバーする。
FIG. 5 is a diagram showing a wiring pattern on a flexible substrate of a secondary differential bobbin type detection coil according to a second embodiment of the present invention. The materials of the flexible substrate 1, the superconducting wiring pattern 2, the buffer layer of the Pb-Sn plating film, the electrode 3, and the resistance wiring 4 are the same as those in the first embodiment. A portion where the wiring pattern shown by A in FIG. For example, after the lower superconducting film wiring is formed, it is covered with an insulating material such as urethane.

【0011】図5のAとBとCが重なるように2巻する
ことにより、図6に示す構成の上、中、下の巻数が1
巻、2巻、1巻の2次微分型検出コイルを構成すること
ができる。図6中の矢印はコイルの巻方向を示してい
る。図5のAとBとCが重なるように4巻することによ
り、上、中、下の巻数が2巻、4巻、2巻の2次微分型
検出コイルを構成することもできる。
By winding two turns so that A, B, and C in FIG. 5 overlap, the number of turns in the upper, middle, and lower parts shown in FIG.
It is possible to configure a secondary differential detection coil having two windings, two windings, and one winding. The arrow in FIG. 6 indicates the winding direction of the coil. By winding four turns so that A, B, and C in FIG. 5 overlap, it is also possible to configure a secondary differential detection coil having two turns, four turns, and two turns in the upper, middle, and lower turns.

【0012】図7は、本発明の実施例3を示す1次微分
ボビン型検出コイルのフレキシブル基板上配線パターン
を表した図である。図7でB−D間の配線の長さとE−
F間の配線の長さは等しい。フレキシブル基板1、超伝
導配線パターン2、Pb−Snメッキ膜のバッファー
層、電極3、抵抗配線4の材質は、実施例1と変わると
ころはない。図7のAとBのちょうど中間の位置Cに、
Dが重なるように1巻することにより1巻の1次微分型
検出コイル、2巻することにより2巻の1次微分型検出
コイルを構成することができる。
FIG. 7 is a view showing a wiring pattern on a flexible substrate of a primary differential bobbin type detection coil according to a third embodiment of the present invention. In FIG. 7, the length of the wiring between B-D and E-
The lengths of the wires between F are equal. The materials of the flexible substrate 1, the superconducting wiring pattern 2, the buffer layer of the Pb-Sn plating film, the electrode 3, and the resistance wiring 4 are the same as those in the first embodiment. At a position C exactly intermediate between A and B in FIG.
By making one turn so that D overlaps, one turn of the primary differential detection coil can be formed by two turns, thereby forming a two-turn primary differential detection coil.

【0013】図7の超伝導配線パターン2のA−E間の
配線を斜めにして、B−D間の配線の長さとE−F間の
配線の長さを等しくすることにより、検出コイルを構成
した時の上下のコイルの面積を正確に一致させることが
できる。また、図7のA−E間の配線のちょうど中間の
位置にD−F間の配線のちょうど中間の位置が重なるよ
うに巻くことにより、検出コイルの横方向の雑音を除去
することができる。
In the superconducting wiring pattern 2 shown in FIG. 7, the wiring between A and E is slanted, and the length of the wiring between B and D is made equal to the length of the wiring between E and F. The upper and lower coils can be made to have exactly the same area when configured. Further, by winding the wiring so that the middle of the wiring between D and F overlaps the middle of the wiring between A and E in FIG. 7, the noise in the lateral direction of the detection coil can be removed.

【0014】図8は、本発明の実施例4を示す1次微分
ボビン型検出コイルのフレキシブル基板上配線パターン
を表した図である。フレキシブル基板1、超伝導配線パ
ターン2、Pb−Snメッキ膜のバッファー層、電極
3、抵抗配線4の材質は、実施例1と変わるところはな
い。超伝導配線パターン2はフレキシブル基板1の両面
又は異なるレイヤーに配線されている。両面又は異なる
レイヤーの超伝導配線パターン間の導通は、バッファー
層およびフレキシブル基板1にコンタクトホール5をあ
けて超伝導体で導通をとっている。図8のAにBが重な
るように1巻することで1巻の1次微分型検出コイル、
2巻することで2巻の1次微分型検出コイルが構成され
る。
FIG. 8 is a diagram showing a wiring pattern on a flexible substrate of a primary differential bobbin type detection coil according to a fourth embodiment of the present invention. The materials of the flexible substrate 1, the superconducting wiring pattern 2, the buffer layer of the Pb-Sn plating film, the electrode 3, and the resistance wiring 4 are the same as those in the first embodiment. The superconducting wiring pattern 2 is wired on both sides of the flexible substrate 1 or on different layers. The continuity between the superconducting wiring patterns on both sides or different layers is made by a superconductor by opening a contact hole 5 in the buffer layer and the flexible substrate 1. By winding one turn so that B overlaps A in FIG. 8, one turn of the primary differential detection coil,
The two turns constitute a two-turn primary differential detection coil.

【0015】図9は、本発明の実施例5を示す1次微分
ボビン型検出コイルのフレキシブル基板上配線パターン
を表した図である。フレキシブル基板1、超伝導配線パ
ターン2、Pb−Snメッキ膜のバッファー層、電極
3、抵抗配線4の材質は、実施例1と変わるところはな
い。超伝導配線パターン2は実施例4と同様の方法でフ
レキシブル基板1の両面又は異なるレイヤーに配線され
ている。
FIG. 9 is a diagram showing a wiring pattern on a flexible substrate of a primary differential bobbin type detection coil according to a fifth embodiment of the present invention. The materials of the flexible substrate 1, the superconducting wiring pattern 2, the buffer layer of the Pb-Sn plating film, the electrode 3, and the resistance wiring 4 are the same as those in the first embodiment. The superconducting wiring pattern 2 is wired on both surfaces of the flexible substrate 1 or on different layers in the same manner as in the fourth embodiment.

【0016】図9に示すように電極3からAおよびBの
間の超伝導配線パターンは、横方向の雑音を除去させる
ために、たがいちがいにフレキシブル基板1の表裏又は
異なるレイヤーに配線している。図9のAとBのちょう
ど中間の位置Cに、Dが重なるように1巻することによ
り1巻の1次微分型検出コイル、2巻することにより2
巻の1次微分型検出コイルを構成することができる。
As shown in FIG. 9, the superconducting wiring pattern between the electrodes 3 and A and B is connected to the front and back surfaces of the flexible substrate 1 or to different layers in order to eliminate horizontal noise. . One turn of the primary differential detection coil is formed by winding one turn so that D overlaps the position C exactly in the middle between A and B in FIG.
A first-order differential detection coil having a winding can be configured.

【0017】上記のような超伝導検出コイルの構造によ
れば、コイル配線パターンを形成したフレキシブル基板
を円筒状に形成することで、容易に任意の巻数で1次お
よび高次微分型の超伝導検出コイルを製造することがで
き、各コイルの面積精度、形状精度、相互の位置精度、
相互の平行精度を向上させることができる。また、ダン
ピング抵抗の絶対精度および複数の超伝導検出コイル間
での相対精度を向上させることができる。上記により、
磁場勾配感度および特性の再現性を向上させることが可
能となる。
According to the structure of the superconducting detection coil as described above, by forming the flexible substrate on which the coil wiring pattern is formed into a cylindrical shape, the primary and higher-order differential superconductivity can be easily formed with an arbitrary number of turns. Detection coils can be manufactured, area accuracy of each coil, shape accuracy, mutual positional accuracy,
Mutual parallel accuracy can be improved. Further, the absolute accuracy of the damping resistance and the relative accuracy among the plurality of superconducting detection coils can be improved. By the above,
The magnetic field gradient sensitivity and the reproducibility of characteristics can be improved.

【0018】[0018]

【発明の効果】以上説明したように本発明によれば、超
伝導膜配線および抵抗配線を形成したフレキシブル基板
を円筒状に配置して超伝導検出コイルを構成することに
より、容易に超伝導検出コイルを製造することができ、
上下2つのコイルの面積精度、形状精度、相互の位置精
度、相互の平行精度を向上させることができ、またダン
ピング抵抗の絶対精度および複数の超伝導検出コイル間
での相対精度を向上させることができ、磁場勾配感度お
よび特性の再現性を向上させることが可能となる。
As described above, according to the present invention, a superconducting detection coil can be easily formed by arranging a flexible substrate on which a superconducting film wiring and a resistance wiring are formed in a cylindrical shape to form a superconducting detecting coil. Coils can be manufactured,
The area accuracy, shape accuracy, mutual position accuracy, and mutual parallel accuracy of the upper and lower two coils can be improved, and the absolute accuracy of the damping resistor and the relative accuracy between a plurality of superconducting detection coils can be improved. As a result, the magnetic field gradient sensitivity and the reproducibility of characteristics can be improved.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の実施例1を示す1次微分ボビン型検出
コイルのフレキシブル基板上配線パターンである。
FIG. 1 is a wiring pattern on a flexible substrate of a primary differential bobbin type detection coil according to a first embodiment of the present invention.

【図2】本発明の実施例1を示す1次微分ボビン型検出
コイルの構成を表した断面図である。
FIG. 2 is a cross-sectional view illustrating a configuration of a primary differential bobbin type detection coil according to the first embodiment of the present invention.

【図3】1巻の1次微分型検出コイルの構成を示した図
である。
FIG. 3 is a diagram showing a configuration of a first-order primary differential detection coil.

【図4】2巻の1次微分型検出コイルの構成を示した図
である。
FIG. 4 is a diagram showing a configuration of a two-turn primary differential detection coil.

【図5】本発明の実施例2を示す1次微分ボビン型検出
コイルのフレキシブル基板上配線パターンである。
FIG. 5 is a wiring pattern on a flexible board of a first-order differential bobbin type detection coil according to a second embodiment of the present invention.

【図6】上、中、下の検出コイルが1巻、2巻、1巻の
2次微分型検出コイルの構成を示した図である
FIG. 6 is a diagram showing a configuration of a secondary differential detection coil in which the upper, middle, and lower detection coils have one turn, two turns, and one turn.

【図7】本発明の実施例3を示す1次微分ボビン型検出
コイルのフレキシブル基板上配線パターンである。
FIG. 7 is a wiring pattern on a flexible board of a primary differential bobbin type detection coil according to a third embodiment of the present invention.

【図8】本発明の実施例4を示す1次微分ボビン型検出
コイルのフレキシブル基板上配線パターンである。
FIG. 8 is a wiring pattern on a flexible board of a first-order differential bobbin type detection coil according to a fourth embodiment of the present invention.

【図9】本発明の実施例5を示す1次微分ボビン型検出
コイルのフレキシブル基板上配線パターンである。
FIG. 9 is a wiring pattern on a flexible board of a first-order differential bobbin type detection coil according to a fifth embodiment of the present invention.

【図10】従来の1次微分ボビン型検出コイルの構成を
表した図である。
FIG. 10 is a diagram showing a configuration of a conventional primary differential bobbin type detection coil.

【図11】従来の2次微分ボビン型検出コイルの構成を
表した図である。
FIG. 11 is a diagram illustrating a configuration of a conventional secondary differential bobbin type detection coil.

【符号の説明】[Explanation of symbols]

1 フレキシブル基板 2 超伝導配線パターン 3 電極 4 抵抗配線 5 コンタクトホール 6 ボビン 7 カバー 11 従来例によるボビン 12 超伝導コイル線 13 従来例による電極 14 従来例によるダンピング抵抗 DESCRIPTION OF SYMBOLS 1 Flexible board 2 Superconducting wiring pattern 3 Electrode 4 Resistance wiring 5 Contact hole 6 Bobbin 7 Cover 11 Conventional bobbin 12 Superconducting coil wire 13 Conventional electrode 14 Conventional damping resistance

───────────────────────────────────────────────────── フロントページの続き (56)参考文献 特開 平3−199985(JP,A) 実開 平1−174904(JP,U) (58)調査した分野(Int.Cl.6,DB名) G01R 33/00 - 33/18 H01F 6/00 - 6/06 H01L 39/00 - 39/24 ──────────────────────────────────────────────────続 き Continuation of the front page (56) References JP-A-3-199985 (JP, A) JP-A-1-174904 (JP, U) (58) Fields investigated (Int. Cl. 6 , DB name) G01R 33/00-33/18 H01F 6/00-6/06 H01L 39/00-39/24

Claims (2)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】少なくとも一部に略コの字状の配線部を有
する超伝導配線パターンを形成したフレキシブル基板を
円筒状に丸め、前記略コの字状の配線部が少なくとも上
下一対の円筒状配線パターンを形成するよう構成したこ
とを特徴とする超伝導検出コイル。
1. A flexible substrate on which a superconducting wiring pattern having a substantially U-shaped wiring portion is formed at least partially in a cylindrical shape, wherein the substantially U-shaped wiring portion has at least a pair of upper and lower cylindrical shapes. A superconducting detection coil configured to form a wiring pattern.
【請求項2】少なくとも一部に略コの字状の配線部を有
する超伝導配線パターンと、前記超伝導配線パターンと
電気的に並列に接続された抵抗をそれぞれ形成したフレ
キシブル基板を円筒状に丸め、前記略コの字状の配線部
が少なくとも上下一対の円筒状配線パターンを形成する
よう構成したことを特徴とする超伝導検出コイル。
2. A superconducting wiring pattern having a substantially U-shaped wiring portion in at least a part thereof, and a flexible substrate on which a resistor electrically connected in parallel with the superconducting wiring pattern is formed. A superconducting detection coil, wherein the rounded, substantially U-shaped wiring portion forms at least a pair of upper and lower cylindrical wiring patterns.
JP4157764A 1991-07-25 1992-06-17 Superconducting detection coil Expired - Fee Related JP2909790B2 (en)

Priority Applications (3)

Application Number Priority Date Filing Date Title
US07/914,894 US5329229A (en) 1991-07-25 1992-07-15 Magnetic field detection coils with superconducting wiring pattern on flexible film
EP92112177A EP0525533B1 (en) 1991-07-25 1992-07-16 Superconducting detection coils
DE69222378T DE69222378T2 (en) 1991-07-25 1992-07-16 Superconducting detection coils

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP3-186495 1991-07-25
JP18649591 1991-07-25

Publications (2)

Publication Number Publication Date
JPH05302966A JPH05302966A (en) 1993-11-16
JP2909790B2 true JP2909790B2 (en) 1999-06-23

Family

ID=16189491

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4157764A Expired - Fee Related JP2909790B2 (en) 1991-07-25 1992-06-17 Superconducting detection coil

Country Status (1)

Country Link
JP (1) JP2909790B2 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4495635B2 (en) * 2005-04-14 2010-07-07 内橋エステック株式会社 Magneto-impedance effect sensor and method of using magneto-impedance effect sensor
JP5051506B2 (en) * 2006-08-21 2012-10-17 学校法人金沢工業大学 Planar SQUID sensor

Also Published As

Publication number Publication date
JPH05302966A (en) 1993-11-16

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