JP2870001B2 - Logic circuit package - Google Patents

Description

Description: TECHNICAL FIELD The present invention relates to a logic circuit package, and more particularly, to a logic circuit package configured by mounting a plurality of integrated circuits.

2. Description of the Related Art Generally, a plurality of integrated circuits such as ICs and LSIs are mounted on a printed wiring board and used. In addition, a plurality of logic circuit packages on which the integrated circuit is mounted are inserted and connected into slots and cages to constitute an information processing device and the like.

Therefore, even if one of the integrated circuits fails, the effect is large, and in most cases, the system goes down. For this reason, individual integrated circuits have been required to have higher reliability than necessary, and various inspection techniques have been devised.

However, with the recent increase in the speed and density of integrated circuits, even if expensive equipment and highly skilled inspectors are used for failure diagnosis, a large number of man-hours are required. This is a major problem. That is, the conventional logic circuit package requires a large number of man-hours for failure diagnosis for identifying a failed integrated circuit, and has a disadvantage that the time required for restoring the entire device is long and the number of times is large.

In addition, even in the inspection of each package, which is an intermediate process, there is a disadvantage that it is almost impossible to completely inspect the package in terms of inspection man-hour and inspection technology.

Object of the Invention An object of the present invention is to facilitate inspection of a package unit,
Another object of the present invention is to provide a logic circuit package configured so that a failed integrated circuit can be quickly identified.

The logic circuit package according to the present invention stores data input to the circuit function unit in response to the input of the circuit function unit and the write signal, and stores the data in response to the input of the read signal. A plurality of integrated circuits each including a storage unit that outputs data that has been output are mounted, and an output from the preceding integrated circuit is used as the data, and the output of the storage unit is used to inspect the preceding integrated circuit. It is characterized by comprising.

Embodiment Hereinafter, an embodiment of the present invention will be described with reference to the drawings.

FIG. 1 is a block diagram showing the configuration of an embodiment of a logic circuit package according to the present invention. In the figure, a logic circuit package according to an embodiment of the present invention includes a plurality of integrated circuits 50 to 53 and 60 to 63 mounted on a substrate 100, and a selector 70.
, An input terminal 80, and an output terminal 90. Note that, for simplicity, all signal lines not related to the description are omitted.

A signal from another logic circuit package or from outside the device is input to the input terminal 80, and the signal is input to each of the integrated circuits 50 to 53 and 60.
~ 63. Further, a predetermined logic circuit is realized by, for example, applying the output of each integrated circuit to another integrated circuit,
Its output appears at output terminal 90.

Further, a storage unit such as a memory is provided in each integrated circuit as described later, so that an input signal to the integrated circuit can be held therein as it is. The outputs of the storage units of the respective integrated circuits are all input to the selector 70, and the necessary output from the storage unit of the integrated circuit appears at the output terminal 90 in response to the input of a selection signal (not shown).

Next, the internal configuration of each integrated circuit will be described with reference to FIG. FIG. 2 is a schematic configuration diagram of each integrated circuit. In the figure, an integrated circuit 1 has an input terminal 2 and a possible circuit section 4.
And an output terminal 6.

Further, the integrated circuit 1 includes a data storage unit 5, a control signal input terminal 3, and a data output terminal 7. A is an input data bus, B and C are output data buses, and D is a plurality of control signal lines.

An input signal from another integrated circuit is applied to the input terminal 2 and input to the functional circuit unit 4 and the data storage unit 5 via the input data bus A.

The functional circuit unit 4 is a part that functions as an intrinsic function of the integrated circuit. Therefore, a logic pattern corresponding to the signal input to the input terminal 2 appears at the output terminal 6.

The data storage unit 5 is a memory in which writing or reading is performed by a write enable signal, a read enable signal, a chip enable signal, or other various control signals input to the control signal input terminal 3. Therefore, if a write enable signal is input to the control signal input terminal 3, a signal on the input data bus A, that is, an input signal to the integrated circuit can be stored. When a read enable signal is input, the stored data is sent to the data output terminal 7.

That is, the data storage unit 5 can hold the output signal of the preceding integrated circuit, and can transmit it from the data output terminal 7 as needed.

Further, the connection state of each integrated circuit in FIG. 1 will be described with reference to FIG. FIG. 3 is a block diagram when the integrated circuits in FIG. 1 are cascaded.
In the figure, three integrated circuits 10, 11 and 12 are shown, which are assumed to have, for example, the relationship of 50, 51 and 52 in FIG.

Each integrated circuit has a different or identical functional circuit unit 10
4, 114, and 124, and the integrated circuit 11 is a preceding circuit with respect to the integrated circuit 12, and the integrated circuit 10 is a preceding circuit with respect to the integrated circuit 11. Therefore, the output signal of the functional circuit unit 104 in the integrated circuit 10 is output to the data storage unit 115 in the integrated circuit 11.
Can be held. Similarly, the output signal of the functional circuit unit 114 in the integrated circuit 11 can be held in the data storage unit 125 in the integrated circuit 12.

Therefore, it is possible to observe the transmission and reception of signals between the integrated circuits by actually operating the circuit and holding the output signal from the integrated circuit at the preceding stage in each data storage unit, and then reading from the data storage unit. You can. That is, the control signals 101, 111, 121,
Is input and the output signals of the case data output terminals 107, 117 and 127 are sent to the output terminal 90 via the selector 70 in FIG. 1, so that the input signals of each integrated circuit can be observed.

Actually, each of the integrated circuits is not a simple cascade connection as shown in FIG. 3, and signals are gathered from a plurality of integrated circuits to one integrated circuit or one integrated circuit is not connected. In some cases, a signal is distributed to a plurality of integrated circuits.

Returning to FIG. 1, an inspection procedure for the logic circuit package having such a configuration will be described.

First, a non-defective logic circuit package is used as a preparation stage for inspection, and an input signal to each integrated circuit is held in a storage unit in each integrated circuit. Next, the held signal is transferred to the selector 70.
And read them out and store them in a magnetic disk, memory, or the like (not shown). Then, this becomes a diagnostic dictionary, and becomes an expected value of an input to each integrated circuit.

Next, the input signals of the package to be inspected are similarly stored in the data storage section of each integrated circuit. Then, the held data is sequentially read out from the data storage unit in each integrated circuit, and is compared with the above-mentioned diagnostic dictionary, that is, the expected value. If the comparison result indicates a match, the held data can be determined to be normal, and if not, the held data can be determined to be abnormal.

Therefore, it is possible to identify the integrated circuit preceding the integrated circuit that has sent the held data determined to be abnormal, and the operation is completed by replacing the integrated circuit with a non-defective integrated circuit.

For example, when the integrated circuits 50, 51, and 52 in the figure are cascaded, if the data from the data storage unit in the integrated circuit 51 is determined to be abnormal, the integrated circuit at the preceding stage is determined.
50 can be determined to be defective, and this can be replaced.

In addition, by performing the same inspection for each of the logical packages constituting the information processing apparatus, the inspection can be performed for each integrated circuit and each package.

In this embodiment, the data storage unit for holding the output signal from the preceding integrated circuit is provided in each integrated circuit, but a data storage unit for holding the output signal of the own integrated circuit is provided instead. Obviously, you can. It is apparent that both a data storage unit for holding an output signal from the integrated circuit of the preceding stage and a data storage unit for holding an output signal of the own integrated circuit may be provided.

As described above, according to the present invention, a data storage unit for holding an input signal input to the integrated circuit is provided inside the integrated circuit, and a substrate is provided so that the data held in each data storage unit can be read. By mounting it on the above, there is an effect that comparison with a non-defective package can be easily performed, thereby improving the inspection efficiency and contributing to the promotion of the diagnosis work.

[Brief description of the drawings]

FIG. 1 is a block diagram showing a configuration of a logic circuit package according to an embodiment of the present invention, FIG. 2 is a schematic configuration diagram of each integrated circuit, and FIG. 3 shows a case where the integrated circuits in FIG. It is a block diagram. Explanation of Signs of Main Parts 50 to 53, 60 to 63… Integrated Circuit 70… Selector 80… Input Terminal 90… Output Terminal

Claims (1)

(57) [Claims] 1. A circuit function unit that performs its original function and stores data input to the circuit function unit in response to input of a write signal, and outputs stored data in response to input of a read signal. A plurality of integrated circuits including a storage unit for performing the above, the output from the integrated circuit of the preceding stage is used as the data, and the integrated circuit of the preceding stage is configured to be inspected using the output data of the storing unit. Logic circuit package.