JP2847536B2 - Interference fringe extraction method - Google Patents

Interference fringe extraction method

Info

Publication number
JP2847536B2
JP2847536B2 JP21163789A JP21163789A JP2847536B2 JP 2847536 B2 JP2847536 B2 JP 2847536B2 JP 21163789 A JP21163789 A JP 21163789A JP 21163789 A JP21163789 A JP 21163789A JP 2847536 B2 JP2847536 B2 JP 2847536B2
Authority
JP
Japan
Prior art keywords
image
interference fringes
movement
interference
real image
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP21163789A
Other languages
Japanese (ja)
Other versions
JPH0375505A (en
Inventor
雄二 太刀掛
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NITSUPEI TOYAMA KK
Original Assignee
NITSUPEI TOYAMA KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NITSUPEI TOYAMA KK filed Critical NITSUPEI TOYAMA KK
Priority to JP21163789A priority Critical patent/JP2847536B2/en
Publication of JPH0375505A publication Critical patent/JPH0375505A/en
Application granted granted Critical
Publication of JP2847536B2 publication Critical patent/JP2847536B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Instruments For Measurement Of Length By Optical Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は、測定光をビームスプリッタを介して被測定
面に照射して得られる干渉縞を含む画像と、前記測定光
を前記ビームスプリッタおよびレンズを介して微小な移
動量で焦点深度の範囲内で移動可能な基準反射面に照射
して得られる干渉縞を含む画像とを測定する光干渉式測
定システムにおいて、被測定面の撮像後に、画像処理に
よって撮像画面から実体像を残して干渉縞を抽出する方
法に関する。
DETAILED DESCRIPTION OF THE INVENTION [Industrial Application Field] The present invention relates to an image including interference fringes obtained by irradiating a measurement surface with a measurement light through a beam splitter, and applying the measurement light to the beam splitter. In an optical interference measurement system that measures an image including interference fringes obtained by irradiating a reference reflection surface movable within a range of the depth of focus with a small amount of movement via a lens, after imaging the surface to be measured, The present invention relates to a method for extracting interference fringes while leaving a real image from an imaging screen by image processing.

〔従来の技術〕[Conventional technology]

光干渉式測定システム例えば面精度測定法は、等厚干
渉を利用して、実体像上の干渉縞の本数や輪郭それらの
分布状況を観測し、表面の微細形状を評価するために利
用される。このような光学的な測定法は、いずれも、被
測定物に対し非接触状態で測定できること、表面状態を
直接肉眼で観測できることなどの特長がある。
Optical interference type measurement system, for example, surface accuracy measurement method, is used to observe the number of interference fringes on a real image and the distribution of those contours by using equal thickness interference, and to evaluate the fine shape of the surface. . All of these optical measurement methods have features such as being able to measure the object to be measured in a non-contact state and being able to directly observe the surface state with the naked eye.

通常、干渉縞は、被測定面の実体像上に明度差として
現れるが、明瞭でないため、明暗の仕上の識別は、この
種の計測で困難な作業である。
Normally, the interference fringes appear as a brightness difference on the real image of the surface to be measured, but since they are not clear, distinguishing between bright and dark finishes is a difficult task in this type of measurement.

〔発明の目的〕[Object of the invention]

したがって、本発明の目的は、光干渉式測定システム
において、被測定面の撮像画面から実体像と干渉縞とを
分離し、干渉縞を抽出する画像処理的な手法を提供し、
計測の容易化を図ることである。
Therefore, an object of the present invention is to provide an image processing method for separating a real image and interference fringes from an imaging screen of a measured surface in an optical interference measurement system and extracting the interference fringes,
This is to facilitate measurement.

〔発明の解決手段〕[Solution of the Invention]

光干渉式測定システムは、例えばマイケルソン干渉計
の原理によって、干渉縞を発生させて、その干渉縞の乱
れ具合から表面の仕上げ程度を観測する。この場合、干
渉縞は、被測定面の上に重なった状態となっている。こ
の観測時に、被測定面または基準反射面に光学系の焦点
深度の方向に微小な移動量が与えられるならば、干渉縞
は、視野平面内で縞ピッチの方向に移動する。
The optical interference measurement system generates interference fringes according to, for example, the principle of a Michelson interferometer, and observes the degree of surface finish based on the degree of disturbance of the interference fringes. In this case, the interference fringes are overlaid on the surface to be measured. At the time of this observation, if a small movement amount is given to the measured surface or the reference reflecting surface in the direction of the depth of focus of the optical system, the interference fringes move in the direction of the fringe pitch in the viewing plane.

本発明は、この点に着目し、基準反射面を光学系の焦
点深度の範囲内で微小な量だけ移動させ、その移動の前
後で被測定面およびその上の干渉縞を撮像する。
Focusing on this point, the present invention moves the reference reflecting surface by a small amount within the range of the depth of focus of the optical system, and images the surface to be measured and the interference fringes thereon before and after the movement.

このあと、本発明は、画像処理によって、基準反射面
の移動前後の2つの撮像画面上の対応する画素の明度差
と基準値とを比較し、この比較の大小結果に応じて、そ
の画素を実体像または干渉縞として識別していく。
Thereafter, according to the present invention, the brightness difference between corresponding pixels on the two imaging screens before and after the movement of the reference reflection surface is compared with the reference value by image processing, and the pixel is determined according to the magnitude of the comparison. It is identified as a real image or interference fringes.

このように、基準反射面の移動前後の2つの撮像画面
で、明度差の少ない部分を実体像とし、また明度差の多
い部分を干渉縞とすることによって、移動前後の2つの
撮像画面上から実体像と干渉縞とが画像処理によって分
離できることになる。
As described above, in the two imaging screens before and after the movement of the reference reflecting surface, a portion having a small difference in brightness is defined as a real image, and a portion having a large difference in brightness is defined as an interference fringe. The real image and the interference fringes can be separated by image processing.

〔実施例〕〔Example〕

第1図は、光干渉式測定システム1の構成を示してい
る。
FIG. 1 shows the configuration of the optical interference measurement system 1.

光源2は、光干渉に適切な波長例えば5000〔Å〕の測
定光3を発生し、ビームスプリッタ4、対物レンズ5を
経て被測定面6に照射するとともに、対物レンズ7を経
て、基準反射面8にも照射し、反射光として、被測定面
6に照射する。このとき、被測定面6および基準反射面
8からの反射光がビームスプリッタ4上で重なった際
に、両者の画像が干渉しビームスプリッタ4の表面で例
えば黒の干渉縞が発生する。なお、この実施例で、基準
反射面8は、振動子9によって固定部分に取り付けられ
ており、光学系の焦点深度の方向に振動により微細な移
動量だけ移動できるようになっている。そして、この微
細な移動量は、測定時の測定光3の1/4波長程度の値に
設定される。
The light source 2 generates a measurement light 3 having a wavelength suitable for light interference, for example, 5000 [Å], irradiates the measurement target surface 6 via the beam splitter 4 and the objective lens 5, and transmits the measurement light 3 via the objective lens 7 to the reference reflection surface. 8 and irradiates the measured surface 6 as reflected light. At this time, when the reflected light from the measured surface 6 and the reflected light from the reference reflecting surface 8 overlap on the beam splitter 4, both images interfere with each other and, for example, black interference fringes are generated on the surface of the beam splitter 4. In this embodiment, the reference reflecting surface 8 is attached to the fixed portion by the vibrator 9 so that the reference reflecting surface 8 can be moved by a minute movement amount by vibration in the direction of the depth of focus of the optical system. Then, this minute movement amount is set to a value of about / 4 wavelength of the measurement light 3 at the time of measurement.

被測定面6の実体像およびその干渉縞は、工業用テレ
ビ10によって撮像され、画像メモリ11に記憶される。そ
して、画像処理装置12は、本発明に基づくプログラムを
内蔵しており、画像メモリ11のデータを読み込み、画像
モニタ13に撮像画像を表示するほか、本発明による画像
処理のプログラムに基づいて、画像処理を行い、撮像画
面から実体像と干渉縞とを分離し、それぞれのメモリ1
4、15に記憶させていく。
The real image of the measured surface 6 and its interference fringes are picked up by the industrial television 10 and stored in the image memory 11. The image processing device 12 incorporates a program according to the present invention, reads data from the image memory 11, displays a captured image on the image monitor 13, and executes image processing based on the image processing program according to the present invention. Performs processing to separate the real image and interference fringes from the imaging screen,
4 and 15 will be memorized.

第2図は、本発明の造作順序を示している。 FIG. 2 shows the construction sequence of the present invention.

まず、最初に、工業用テレビ10は、被測定面6の像お
よび基準反射面8からの反射光による干渉縞を光学系の
焦点深度の範囲内で微小な移動量の前後で撮像し、第3
図(1)(2)のような移動前後の2つの撮像画面を画
像メモリ11に記憶させる。光学系は、移動前後の2回の
撮像で、測定光3の波長に応じた微小な移動量(1/4波
長程度)で、焦点深度の範囲内で移動している。微小な
移動量は、振動子9により、基準反射面8に振動を与え
ることによって得られる。もちろん、微小な移動量は、
光学系の焦点深度の範囲内であるから、被測定面6の撮
像画質上無視できる位置変化である。なお、2つの撮像
画面は基準反射面8の移動の前後に振動周期を考慮して
撮像される。
First, the industrial television 10 images the image of the surface to be measured 6 and the interference fringes due to the light reflected from the reference reflecting surface 8 before and after a small amount of movement within the depth of focus of the optical system. 3
The two imaging screens before and after the movement as shown in FIGS. 1 and 2 are stored in the image memory 11. The optical system moves within a range of the depth of focus with a small movement amount (about 1/4 wavelength) corresponding to the wavelength of the measurement light 3 in two imagings before and after the movement. The minute movement amount is obtained by applying vibration to the reference reflecting surface 8 by the vibrator 9. Of course, the small amount of movement
Since it is within the range of the depth of focus of the optical system, the position change is negligible in terms of image quality of the surface 6 to be measured. The two imaging screens are imaged before and after the movement of the reference reflection surface 8 in consideration of the vibration cycle.

仮に測定光3の波長が5000〔Å〕であり、光学系の焦
点深度方向の移動量が振動の全振幅として0.1〔μm〕
であるとき、焦点深度は振動の振幅よりも充分に大きい
ため、撮像画面の合焦状態は、基準反射面8の移動の前
後で変化しない。しかし、干渉縞は、第3図(1)
(2)に例示するように、視野の平面内で縞ピッチの半
分近く移動する。視野内の干渉縞の本数が視野内で数本
ないし10数本現れる光学倍率で撮像したと仮定すれば、
視野ピッチの半分近くの移動は、画像上非常に大きな変
化となって現れる。ここで、前述の通り、移動前後の2
つの撮像画面で、移動後の干渉縞が移動前の干渉縞の間
にくるのが最良と考えられるため、最適な移動量は、測
定光3の1/4波長程度である。
Assuming that the wavelength of the measuring light 3 is 5000 [Å] and the moving amount of the optical system in the depth of focus direction is 0.1 [μm] as the total amplitude of the vibration.
In the case of, since the depth of focus is sufficiently larger than the amplitude of the vibration, the in-focus state of the imaging screen does not change before and after the movement of the reference reflecting surface 8. However, the interference fringes are shown in FIG.
As illustrated in (2), it moves close to half the fringe pitch in the plane of the field of view. Assuming that the number of interference fringes in the field of view was imaged at an optical magnification that appears several to ten or more in the field of view,
Movements close to half the field pitch appear as very large changes on the image. Here, as described above, 2
Since it is considered that it is best for the interference fringes after the movement to be between the interference fringes before the movement on one imaging screen, the optimal movement amount is about / 4 wavelength of the measurement light 3.

このように、基準反射面8の微小な移動量の前後で撮
像された2つの撮像画面では、実体像の上に黒い干渉縞
が重っており、両者の撮像画面の対応する位置で、明度
差の少ない部分は、実体像であり、また明度差の多い部
分は、移動前後の干渉縞である。
As described above, in the two imaging screens imaged before and after the slight movement amount of the reference reflecting surface 8, the black interference fringe overlaps the real image, and the brightness at the corresponding position of both imaging screens The portion with a small difference is a real image, and the portion with a large brightness difference is interference fringes before and after movement.

そこで、画像処理装置12は、移動前後の2つの撮像画
面上で対応する画素の明度差と、撮像対象の画像の明度
特性に応じて予め設定した基準値とを比較する。
Therefore, the image processing device 12 compares the brightness difference between the corresponding pixels on the two imaging screens before and after the movement with a reference value set in advance according to the brightness characteristics of the image to be imaged.

比較の結果、基準反射面8の移動前後の2つの撮像画
面上で対応する画素の明度差が基準値以下であれば、そ
の画素は、実体像の画素と判別される。このため、画像
処理装置12は、比較した2つの画素に関し、実体像用の
メモリ14に、移動前後の2つの撮像対象の画像のいずれ
か一方の画素の値を実体像レベルとして記憶させるか、
または移動前後の2つの撮像対象の画像の2つの画素の
平均値を実体像レベルとして記憶させる。また画像処理
装置12は、干渉縞用のメモリ15に干渉縞無しのレベルと
して例えば白に相当する値を代入する。
As a result of the comparison, if the brightness difference between the corresponding pixels on the two imaging screens before and after the movement of the reference reflecting surface 8 is equal to or smaller than the reference value, the pixel is determined to be a pixel of the real image. For this reason, the image processing apparatus 12 stores the value of one pixel of the two images of the imaging target before and after the movement as the real image level in the real image memory 14 for the two compared pixels,
Alternatively, the average value of the two pixels of the two images of the imaging target before and after the movement is stored as the real image level. Further, the image processing device 12 substitutes, for example, a value corresponding to white as a level without interference fringes into the memory 15 for interference fringes.

なお、基準反射面8の移動の前後において撮像が行わ
れるため、移動の前後の2つの画像において対応する画
素が同じものを表していたとしても、撮像環境の変化に
よってある程度の明度差が避けられないため、2つの画
素のいずれのものを実体像レベルの値として記憶させる
かが問題となる。そこで、この実施例は、移動前後の2
つの画像上で、比較した対応する2つの画素のいずれか
一方のレベルの値を実体像レベルとして記憶させるか、
または比較した対応する2つの画素の平均値を実体像レ
ベルとして記憶させている。
Note that, since imaging is performed before and after the movement of the reference reflection surface 8, even if the corresponding pixels in the two images before and after the movement represent the same pixel, a certain brightness difference can be avoided due to a change in the imaging environment. Therefore, there is a problem as to which one of the two pixels is stored as the value of the real image level. Therefore, in this embodiment, 2
In one image, the value of one of the two corresponding pixels compared is stored as a real image level,
Alternatively, the average value of the compared two corresponding pixels is stored as the real image level.

また、比較の結果、基準反射面8の移動前後の2つの
撮像画面上で対応する画素の明度差が基準値以上である
とき、その画素は干渉縞と判別される。そこで、画像処
理装置12は、比較した画素に関し、実体像用のメモリ14
に、黒い干渉縞よりも明るいレベルの値を入れる。また
画像処理装置12は、干渉縞用のメモリ15に黒の干渉縞を
表すために、暗いレベルの値を代入していく。
As a result of the comparison, when the brightness difference between the corresponding pixels on the two imaging screens before and after the movement of the reference reflection surface 8 is equal to or larger than the reference value, the pixel is determined to be an interference fringe. Therefore, the image processing apparatus 12 stores a memory 14 for a real image with respect to the compared pixels.
A value brighter than the black interference fringe. Further, the image processing device 12 substitutes dark level values into the interference fringe memory 15 in order to represent black interference fringes.

このようにして、画像処理装置12は、以上の手順で、
基準反射面8の移動前後の2つの撮像画面の全画素を例
えば走査方向に処理して行き、第3図の(3)(4)の
ように、縞のない実体像と干渉縞を主体とした画像とを
分離していく。このように処理により、基準反射面8の
移動前後の2つの撮像画面から実体像と干渉縞の像とが
分離した状態が得られる。
In this way, the image processing device 12 performs
All pixels of the two imaging screens before and after the movement of the reference reflecting surface 8 are processed in, for example, the scanning direction, and as shown in (3) and (4) of FIG. And the separated image. As a result of this processing, a state in which the real image and the interference fringe image are separated from the two imaging screens before and after the movement of the reference reflecting surface 8 is obtained.

以上の説明は、干渉縞が白地に黒いレベルの線で現れ
る場合を想定しており、画像処理上、白黒レベルが反転
した場合には、明暗の判断を逆に設定する。また、干渉
縞の画像抽出時に、そのまま2値化することも可能であ
るが、干渉縞は、実体像との区別が不鮮明であり、他の
画像処理の手法による特徴づけの併用を考慮して、干渉
縞をそのままの明るさで抽出する方式で説明した。しか
し、必要に応じて2値化して処理することも可能であ
る。
In the above description, it is assumed that the interference fringe appears as a black level line on a white background, and when the black and white level is reversed in image processing, the light / dark determination is set in reverse. It is also possible to binarize the interference fringes as they are when extracting the image of the interference fringes. However, the interference fringes are unclearly distinguished from the real images, and are considered in combination with the characterization by other image processing methods. The method of extracting interference fringes with the same brightness has been described. However, it is also possible to perform binarization as required.

干渉縞の抽出時に、移動前後の2つの撮像画面から取
り出すと、干渉縞の本数が2倍近くなることもおき得る
ので、必要に応じて、両者の撮像画面のうち例えば移動
後の画面のほうが暗いときのみ干渉縞用のメモリ15へ取
り出すことにより、いずれか一方のみの干渉縞を抽出す
ることも可能である。
When the interference fringes are extracted from the two imaging screens before and after the movement when the interference fringes are extracted, the number of the interference fringes may be nearly doubled. Therefore, if necessary, for example, the screen after the movement is better among the two imaging screens. By taking out to the interference fringe memory 15 only when it is dark, it is possible to extract only one of the interference fringes.

〔発明の効果〕〔The invention's effect〕

本発明では、ほぼ連続して撮像された基準反射面の移
動前後の2つの撮像画面の対応する画素の明度差と基準
値との比較結果によって、被測定面の実体像および干渉
縞とが画像処理で分離でき、ほぼ同質の画像の比較であ
るから処理の合理化が図れるほか、実体像とこれに対応
する干渉縞とが別画像として抽出できるため、干渉縞の
本数や輪郭またその縞ピッチなどの計測が容易となる。
According to the present invention, the actual image and the interference fringe of the surface to be measured are formed based on the comparison result between the brightness difference between the corresponding pixels of the two imaging screens before and after the movement of the reference reflection surface, which is captured almost continuously, and the reference value. It can be separated by processing, and because it is a comparison of images of almost the same quality, the processing can be streamlined, and since the real image and the corresponding interference fringe can be extracted as separate images, the number of interference fringes, contours and their pitch, etc. Measurement becomes easy.

また、撮像過程で、基準反射面を焦点深度の方向に微
小な移動する方式のため、移動量が焦点深度の範囲内で
あれば実体像と干渉縞との分離を可能にできる。
In addition, in the imaging process, since the reference reflecting surface is minutely moved in the direction of the depth of focus, the separation between the real image and the interference fringes can be performed if the amount of movement is within the range of the depth of focus.

【図面の簡単な説明】[Brief description of the drawings]

第1図は測定システムのブロック線図、第2図は本発明
の測定方法のフローチャート図、第3図は2つの撮像画
面と分離後の実体像および干渉縞の説明図である。 1……光干渉式測定システム、2……光源、3……測定
光、4……ビームスプリッタ、5……対物レンズ、6…
…被測定面、7……対物レンズ、8……基準反射面、9
……振動子、10……工業用テレビ、11……画像メモリ、
12……画像処理装置、13……画像モニタ、14、15……メ
モリ。
FIG. 1 is a block diagram of a measurement system, FIG. 2 is a flowchart of a measurement method of the present invention, and FIG. 3 is an explanatory diagram of two imaging screens, a separated real image and interference fringes. DESCRIPTION OF SYMBOLS 1 ... Interferometric measuring system, 2 ... Light source, 3 ... Measurement light, 4 ... Beam splitter, 5 ... Objective lens, 6 ...
... Measurement surface, 7 ... Objective lens, 8 ... Reference reflection surface, 9
…… Vibrator, 10 …… Industrial TV, 11 …… Image memory,
12 ... Image processing device, 13 ... Image monitor, 14, 15 ... Memory.

Claims (1)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】測定光をビームスプリッタを介して被測定
面に照射して得られる干渉縞を含む画像と、前記測定光
を前記ビームスプリッタおよびレンズを介して微小な移
動量で焦点深度方向に移動可能な基準反射面に照射して
得られる干渉縞を含む画像とを測定する光干渉式測定シ
ステムにおいて、 前記基準反射面を焦点深度の範囲内で移動する前に撮像
した画像と移動後の画像とを比較して、移動の前後の両
画像に対応する画素の明度差を予め定められた基準値と
比較し、両画像の明度差の少ない部分を実体像とし、明
度差の多い部分を干渉縞と判断して、実体像から干渉縞
を抽出することを特徴とする干渉縞の抽出方法。
An image including an interference fringe obtained by irradiating a measurement light to a surface to be measured via a beam splitter, and the measurement light is moved in a depth of focus direction by a small amount of movement through the beam splitter and a lens. In an optical coherence measurement system that measures an image including interference fringes obtained by irradiating a movable reference reflecting surface, an image captured before moving the reference reflecting surface within the range of the depth of focus and a post-movement image Compare the brightness difference between the pixels corresponding to the two images before and after the movement with a predetermined reference value, and determine a portion having a small brightness difference between the two images as a real image, and a portion having a large brightness difference between the two images. A method for extracting interference fringes, comprising determining an interference fringe and extracting the interference fringes from a real image.
JP21163789A 1989-08-17 1989-08-17 Interference fringe extraction method Expired - Lifetime JP2847536B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP21163789A JP2847536B2 (en) 1989-08-17 1989-08-17 Interference fringe extraction method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP21163789A JP2847536B2 (en) 1989-08-17 1989-08-17 Interference fringe extraction method

Publications (2)

Publication Number Publication Date
JPH0375505A JPH0375505A (en) 1991-03-29
JP2847536B2 true JP2847536B2 (en) 1999-01-20

Family

ID=16609077

Family Applications (1)

Application Number Title Priority Date Filing Date
JP21163789A Expired - Lifetime JP2847536B2 (en) 1989-08-17 1989-08-17 Interference fringe extraction method

Country Status (1)

Country Link
JP (1) JP2847536B2 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6695122B2 (en) 2015-10-15 2020-05-20 サンコール株式会社 Manufacturing method of shunt resistor

Also Published As

Publication number Publication date
JPH0375505A (en) 1991-03-29

Similar Documents

Publication Publication Date Title
EP1061332B1 (en) Shearographic imaging machine
US8939580B2 (en) Characteristic image extraction method and ophthalmologic apparatus
JP6503221B2 (en) Three-dimensional information acquisition apparatus and three-dimensional information acquisition method
JPH06505096A (en) light sensor
JPH08160305A (en) Laser scanning microscope
JP5847510B2 (en) Image processing apparatus and image processing method
US9995924B2 (en) Three-dimensional position information acquiring method and three-dimensional position information acquiring apparatus
TWI500963B (en) An image capturing device and method
KR101652356B1 (en) optical apparatus for examining pattern image of semiconductor device
JP2847536B2 (en) Interference fringe extraction method
DE112020002180T5 (en) NORMAL INCIDENCE PHASE-SHIFT DEFLECTOMETRY SENSOR, SYSTEM AND METHOD FOR INSPECTING A SURFACE OF A SAMPLE
Paoletti et al. A new method for measuring the diffusivity of liquid binary mixtures using DSPI
US5414512A (en) Method and apparatus for viewing a shearographic image
CN108692676A (en) The three-dimensional shape measuring method of sweep type white interference microscope is used
JP7362324B2 (en) Inspection method, manufacturing method and inspection device for image display device
JP3228458B2 (en) Optical three-dimensional measuring device
JP2005221368A (en) Observation device and observation method
JP3637165B2 (en) Surface measuring device
JP2001201325A (en) Three-dimensional shape observing apparatus
JP3390931B2 (en) Inspection method for colored pattern defects
JP5325481B2 (en) Measuring method of optical element and manufacturing method of optical element
JPH05118831A (en) End-face inspecting apparatus for optical connector
US20230104022A1 (en) Optical metrology with incoherent holography
JP2686146B2 (en) Interferometer
JP6932581B2 (en) Ophthalmic equipment, information processing equipment, information processing methods and programs