JP2829272B2 - Grounding mechanism of IC package in socket - Google Patents

Grounding mechanism of IC package in socket

Info

Publication number
JP2829272B2
JP2829272B2 JP5421596A JP5421596A JP2829272B2 JP 2829272 B2 JP2829272 B2 JP 2829272B2 JP 5421596 A JP5421596 A JP 5421596A JP 5421596 A JP5421596 A JP 5421596A JP 2829272 B2 JP2829272 B2 JP 2829272B2
Authority
JP
Japan
Prior art keywords
contact
package
socket
lid
heat
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP5421596A
Other languages
Japanese (ja)
Other versions
JPH09223556A (en
Inventor
富男 佐々木
雅明 久保
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Yamaichi Electronics Co Ltd
Original Assignee
Yamaichi Electronics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Yamaichi Electronics Co Ltd filed Critical Yamaichi Electronics Co Ltd
Priority to JP5421596A priority Critical patent/JP2829272B2/en
Publication of JPH09223556A publication Critical patent/JPH09223556A/en
Application granted granted Critical
Publication of JP2829272B2 publication Critical patent/JP2829272B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】この発明はICパッケージを
ソケットに装填した時に接地構造を形成するようにした
ソケットにおけるICパッケージの接地機構に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a grounding mechanism for an IC package in a socket which forms a grounding structure when the IC package is loaded into the socket.

【0002】[0002]

【従来の技術】ICパッケージは絶縁材から成るICパ
ッケージ本体内にICを封入し、このICとICパッケ
ージ本体の側面又は下面に配されたIC端子とをボンデ
ング等の方法により結線している。
2. Description of the Related Art In an IC package, an IC is sealed in an IC package body made of an insulating material, and the IC is connected to an IC terminal disposed on a side surface or a lower surface of the IC package body by a method such as bonding.

【0003】上記ICは絶縁材から成るICパッケージ
本体又はソケット本体の表面に帯電された高圧の静電気
により屡々破損されることがあり、ソケット側における
静電気対策が必要となっている。
The above-mentioned IC is often damaged by high-voltage static electricity charged on the surface of an IC package body or a socket body made of an insulating material.

【0004】従来、上記静電気対策としてICパッケー
ジ用ソケット本体が有するIC端子と接触するコンタク
トの一部を接地用として用いたり、ICパッケージ用ソ
ケット本体に特別に埋め込んだ集電用の金属或はソケッ
ト本体が所有する金属製の軸部材にソケット本体に設け
た接触子を接触させる接地機構等が採られている。
Conventionally, as a countermeasure against the static electricity, a part of a contact which comes into contact with an IC terminal of the IC package socket body is used for grounding, or a current collecting metal or socket specially embedded in the IC package socket body. A grounding mechanism or the like for contacting a contact provided on the socket body with a metal shaft member owned by the body is employed.

【0005】[0005]

【発明が解決しようとする課題】然しながら何れもソケ
ット本体の表面に帯電された静電気の放流には有効であ
るが、これに装填されるICパッケージ本体の表面に帯
電された静電気対策としては間接的であり、殊にICパ
ッケージ本体に内蔵されたICに対する直接的な静電気
対策としては充分な実効をあげ得ない。
However, any of them is effective for discharging static electricity charged on the surface of the socket body, but it is indirect as a countermeasure against static electricity charged on the surface of the IC package body loaded therein. However, it is not possible to achieve a sufficient effect especially as a direct countermeasure against static electricity for the IC built in the IC package body.

【0006】又静電気対策が特に望まれるPGA形IC
パッケージにおいては、ICパッケージの下面から突出
するコンタクトを配線基板の接地ラインに接続する方策
等が採られているが、この方策は集電面積が限定され放
流効果に乏しいことに加えて、ICパッケージ本体に設
けた信号用コンタクトを流用せねばならないか、或はI
Cパッケージ本体に特別の接地手段を設けねばならな
い。
[0006] PGA type ICs where antistatic measures are particularly desired
In the package, a method of connecting a contact projecting from the lower surface of the IC package to the ground line of the wiring board has been adopted. However, this measure has a limited current collecting area and has a poor discharge effect. Either the signal contacts provided on the body must be diverted or
Special grounding means must be provided on the C package body.

【0007】[0007]

【課題を解決するための手段】本発明は上記現状を打開
し、ICパッケージ本体に内蔵されたICの静電気対策
として簡潔で且つ有効な接地効果が得られるソケットに
おけるICパッケージの接地機構を提供するものであ
る。
SUMMARY OF THE INVENTION The present invention overcomes the above circumstances and provides a grounding mechanism for an IC package in a socket which provides a simple and effective grounding effect as a countermeasure against static electricity in an IC built in an IC package body. Things.

【0008】詳述すると、PGA形ICパッケージにお
いてはICパッケージにおけるICの発熱を放熱するた
めの熱対策例として、ICパッケージ本体の下面中央部
で開口するIC内蔵室を設け、該開口面を放熱蓋で覆い
密閉して広面積の放熱面を形成し、IC内蔵室に内蔵さ
れたICからの熱放出を効率的に行なう方法が採られ、
この放熱蓋周域のICパッケージ本体下面から多数のピ
ン端子を剣山状に突出している。上記放熱蓋は熱放出効
果の良好な金属板にて形成している。
More specifically, in a PGA type IC package, as an example of a heat countermeasure for radiating heat generated by the IC in the IC package, an IC built-in chamber opened at the center of the lower surface of the IC package body is provided, and the opening surface is radiated. A method is adopted in which the heat is radiated efficiently from the IC built in the IC built-in chamber by forming a wide area heat dissipation surface by covering with a lid and sealing.
A number of pin terminals protrude from the lower surface of the IC package body around the heat dissipation lid in a sword-like manner. The heat-dissipating lid is formed of a metal plate having a good heat-dissipating effect.

【0009】本発明は放熱対策として設けられている上
記放熱蓋を利用し、これを上記静電気対策として兼用す
ることを着想したものである。
The present invention is based on the idea that the above-mentioned heat-dissipating lid provided as a measure against heat dissipation is used, and this is also used as the measure against static electricity.

【0010】そして上記PGA形ICパッケージにおけ
る放熱構造をICパッケージ本体の側面からJ形のIC
端子を突出して成るJベンド形ICパッケージ、又はI
Cパッケージ本体の側面から鉤形に一段曲げしたIC端
子を突出して成るデュアルインライン形ICパッケー
ジ、若しくはICパッケージ本体の側面から二段曲げし
たIC端子を突出して成るガルウィング形ICパッケー
ジ、或はICパッケージ本体の側面からIC端子を水平
に突出して成るフラット形ICパッケージや、IC端子
をICパッケージ本体の側面又は下面に密着して成るリ
ードレス形ICパッケージ等に実施し得ることを考え、
これを利用して各種のICパッケージの静電気対策とし
たものである。
The heat dissipation structure of the PGA type IC package is changed from the side of the IC package body to the J-type IC.
J-bend type IC package with terminal protruding or I
A dual in-line type IC package in which one-stage bent IC terminals are projected from the side surface of the C package body, or a gull-wing type IC package in which two-stage bent IC terminals are projected from the side surface of the IC package body, or an IC package. Considering that the present invention can be applied to a flat type IC package in which IC terminals protrude horizontally from the side surface of the main body, or a leadless type IC package in which IC terminals are in close contact with the side surface or lower surface of the IC package main body,
This is used to take measures against static electricity in various IC packages.

【0011】要述すると、上記ICパッケージはICパ
ッケージ本体の上面又は下面で開口するIC内蔵室を該
開口面を覆う金属製の放熱蓋で密閉して成る。該ICパ
ッケージ用ソケットに上記ICパッケージの外部端子と
接触するコンタクトを具備させると共に、上記放熱蓋の
外表面に接触する接触子を具備させ、該接触子を介して
上記放熱蓋を接地する構成とし、放熱蓋を上記接触子と
協働して放熱手段兼静電気放流手段とした。
In short, the IC package is formed by sealing an IC built-in chamber opened on the upper surface or the lower surface of the IC package body with a metal radiating lid covering the open surface. The IC package socket is provided with a contact for contacting an external terminal of the IC package, and a contact is provided for contacting an outer surface of the heat dissipation lid, and the heat dissipation lid is grounded via the contact. In addition, the heat dissipating lid is used as a heat dissipating means and an electrostatic discharge means in cooperation with the contact.

【0012】又接触子はICパッケージ用ソケットの上
面に沿い横動す移動板によって接触位置と接触解除位置
へ変位される。上記接触子は上記放熱蓋の外表面中央部
に加圧接触するか、上記放熱蓋の外表面の対称位置に接
触するよう複数配置される。
Further, the contact is displaced to a contact position and a contact release position by a moving plate which moves laterally along the upper surface of the IC package socket. A plurality of the contacts are arranged so as to make pressure contact with the central portion of the outer surface of the radiator lid or to contact symmetrical positions on the outer surface of the radiator lid.

【0013】上記接地機構は放熱蓋で放熱効果を得なが
ら、この放熱蓋に加圧接触する接触子をソケット側に付
設する簡素な構造で接地機構が提供できる。加えて広面
積の放熱蓋により集電効果を高め良好な静電気放流効果
が期待できると共に、保護すべきICに直近する放熱蓋
からの放流が行なえるので、ICの静電気保護対策とし
て極めて有効である。
The above-mentioned grounding mechanism can provide a grounding mechanism with a simple structure in which a contact that presses and contacts the heat dissipation lid is attached to the socket side while obtaining a heat dissipation effect with the heat dissipation lid. In addition, a large-area heat-dissipating lid enhances the current collection effect and can be expected to have a good static electricity discharge effect, and can be discharged from the heat-dissipating lid close to the IC to be protected, which is extremely effective as a measure for protecting the IC against static electricity. .

【0014】[0014]

【発明の実施の形態】図2乃至図5は上記接地機構をP
GA形ICパッケージとそのソケットにおいて構成した
第1実施例を示し、又図6乃至図8は上記接地機構をガ
ルウィング形ICパッケージとそのソケットにおいて構
成した第2実施例を示し、更に図9乃至図12は上記接
地機構をJベンド形ICパッケージとそのソケットにお
いて構成した第3実施例を掲げている。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS FIG. 2 to FIG.
FIGS. 6 to 8 show a first embodiment in which a GA type IC package and its socket are configured, and FIGS. 6 to 8 show a second embodiment in which the grounding mechanism is configured in a gull-wing type IC package and its socket. Reference numeral 12 denotes a third embodiment in which the grounding mechanism is constituted by a J-bend type IC package and its socket.

【0015】上記各接地機構の共通構造を図1に基いて
説明すると、各種形式のICパッケージはICパッケー
ジ本体1の上面又は下面で開口するIC内蔵室2を該開
口面を覆う金属製の放熱蓋4で密閉しIC内蔵室2内に
IC3を内蔵している。
The common structure of the grounding mechanisms will be described with reference to FIG. 1. In various types of IC packages, an IC built-in chamber 2 opened on the upper or lower surface of the IC package body 1 is provided with a metal heat radiator covering the open surface. The IC 3 is built in the IC built-in room 2 with the lid 4 sealed.

【0016】該ICパッケージ用のソケットに上記IC
パッケージの外部端子と接触するコンタクト5を具備さ
せると共に、上記放熱蓋4の外表面に接触する接触子6
を具備させ、該接触子6を介して上記放熱蓋4を接地す
る構成とした接地機構である。
The above-mentioned IC is connected to the socket for the IC package.
A contact 6 for contacting an external terminal of the package, and a contact 6
And a grounding mechanism configured to ground the heat-dissipating lid 4 via the contact 6.

【0017】第1実施例(図2乃至図5参照) PGA形ICパッケージは図2,図3に示すように絶縁
材から成る方形で薄平形のICパッケージ本体1の中央
部にその下面で開口する有底のIC内蔵室2を有し、該
開口面を方形金属板から成る放熱蓋4で覆い密閉してお
り、該放熱蓋4周域のICパッケージ本体の下面から多
数の外部端子(ピン端子)7を剣山状に突出している。
First Embodiment (See FIGS. 2 to 5) As shown in FIGS. 2 and 3, the PGA type IC package has an opening at the center at the center of a rectangular and thin IC package body 1 made of an insulating material. The opening surface is covered and sealed by a heat radiating lid 4 made of a square metal plate, and a large number of external terminals (pins) are formed from the lower surface of the IC package body around the heat radiating lid 4. The terminal 7 protrudes like a sword.

【0018】上記放熱蓋4は図3に示すように、IC内
蔵室2の周壁部におけるICパッケージ本体1の下面に
一体に取付けられており、該IC内蔵室2に内蔵された
IC3は図3Aに示すように、上記放熱蓋4の内面に重
合し接触する構造、又は図3Bに示すように、IC内蔵
室2の内底壁に重合し接触する構造、又は図3Cに示す
ようにIC内蔵室2の内底面と放熱蓋4の内面間に挟持
し、両面に接する構造とする。
As shown in FIG. 3, the heat radiating lid 4 is integrally attached to the lower surface of the IC package body 1 in the peripheral wall of the IC built-in chamber 2, and the IC 3 built in the IC built-in chamber 2 is shown in FIG. As shown in FIG. 3, a structure that overlaps and contacts the inner surface of the heat dissipation lid 4, or as shown in FIG. 3B, a structure that overlaps and contacts the inner bottom wall of the IC built-in chamber 2, or as shown in FIG. The structure is sandwiched between the inner bottom surface of the chamber 2 and the inner surface of the heat radiating lid 4 and is in contact with both surfaces.

【0019】上記IC3は接着等の方法により固定され
ており、該IC3と上記外部端子7とはIC内蔵室2の
周囲においてボンディング等の方法により互いに結線さ
れている。この結線状態は図示を省略する。
The IC 3 is fixed by a method such as bonding, and the IC 3 and the external terminal 7 are connected to each other around the IC built-in room 2 by a method such as bonding. This connection state is not shown.

【0020】図4は上記PGA形ICパッケージが搭載
されるソケットを示しており、このソケットは絶縁材か
ら成るソケット本体8の上面に沿い横動する既知の接触
及び接触解除用絶縁材から成る移動板9を備え、図4A
は上記移動板9を矢印で示す方向に横移動した状態を示
し、この状態においてソケット本体8に保有させたコン
タクト5を開状態にし、この開状態において、該ICパ
ッケージのIC外部端子7を無負荷挿入する。
FIG. 4 shows a socket on which the above-mentioned PGA type IC package is mounted. This socket is made of a known contact and contact release insulating material which traverses along the upper surface of a socket body 8 made of an insulating material. FIG. 4A with plate 9
Indicates a state in which the movable plate 9 is laterally moved in the direction indicated by the arrow. In this state, the contacts 5 held in the socket body 8 are opened, and in this open state, the IC external terminals 7 of the IC package are disconnected. Insert the load.

【0021】次に図4Bは移動板9を矢印で示す上記と
は逆方向に横動した状態を示し、この横動によって上記
コンタクト5を閉状態にし上記IC外部端子7を弾力的
に挟持し加圧接触を得るようになっている。
Next, FIG. 4B shows a state in which the movable plate 9 is laterally moved in a direction opposite to the above direction indicated by an arrow, and the lateral movement closes the contact 5 to elastically hold the IC external terminal 7. Pressure contact is obtained.

【0022】上記ICパッケージの外部端子7は移動板
9に設けた上下に貫通する多数の孔10を通して上記開
状態にあるコンタクト5の接片間に挿入される。
The external terminals 7 of the IC package are inserted between the contact pieces of the contacts 5 in the open state through a large number of holes 10 penetrating vertically provided in the moving plate 9.

【0023】図4A,Bは移動板9がコンタクトの接片
と係合してこれを開閉する場合を示しているが、他のP
GA形ICパッケージ用のソケット形式として、ICパ
ッケージの外部端子7を移動板9の貫通孔10を通して
コンタクトの側部に無負荷挿入し、次で移動板9を横動
することによって上記ICパッケージ及び外部端子7を
上記挿入位置から移動板9と一緒に横動してコンタクト
の接片間に弾力的に強制介入する方式のソケットが既知
である。
FIGS. 4A and 4B show the case where the movable plate 9 engages with the contact piece of the contact and opens and closes it.
As a socket type for the GA type IC package, the external terminal 7 of the IC package is inserted into the side of the contact through the through hole 10 of the moving plate 9 with no load, and then the moving plate 9 is laterally moved. There is known a socket of the type in which the external terminal 7 is laterally moved together with the movable plate 9 from the insertion position and elastically forcibly intervenes between the contact pieces of the contact.

【0024】上記移動板9の横動手段としてはソケット
本体8と移動板9間に設けた既知のクランクレバー等の
操作レバーを用いることができる。或いはこれら操作レ
バーを用いずに工具等を用いて移動板9を横動すること
ができる。
As the laterally moving means of the moving plate 9, a known operating lever such as a crank lever provided between the socket body 8 and the moving plate 9 can be used. Alternatively, the movable plate 9 can be moved laterally using a tool or the like without using these operation levers.

【0025】上記各形式の接触及び解除用移動板9を備
えたソケットの本体8に図4A,Bに示す如き接触子6
を保有させ、この接触子6を放熱蓋4の外表面に加圧接
触させるように配置する。即ち、ソケット本体8の中央
部には放熱蓋4に対応する接触子6を配し、該接触子6
の周域に前記コンタクト5を配する。又移動板9の中央
部に放熱蓋4と対応する開口部11を設け、上記接触子
6はこの開口部11を通し放熱蓋4と加圧接触する構成
とする。
A contact body 6 as shown in FIGS. 4A and 4B is attached to a socket body 8 having a moving plate 9 for contact and release of each type described above.
The contact 6 is arranged so as to be brought into pressure contact with the outer surface of the heat radiating cover 4. That is, a contact 6 corresponding to the heat radiating cover 4 is disposed at the center of the socket body 8.
The contact 5 is arranged in the peripheral region of the above. An opening 11 corresponding to the heat radiating lid 4 is provided at the center of the moving plate 9, and the contact 6 is configured to make pressure contact with the heat radiating lid 4 through the opening 11.

【0026】上記接触子6は横方向に延ばされた座片6
aの上位に該座片6aから延出されて横方向に延ばされ
た上下弾性を有する接片6bを有し、該弾性接片6bの
自由端に上方へ向け突出する載接片6cを有し、この載
接片6cを上記移動板9の中央開口部11内に存するよ
うに配し、この中央開口部11において載接片6cと放
熱蓋4とを対向させ、載接片6cに放熱蓋4の外表面を
加圧接触せしめる。即ち、ICパッケージを移動板9上
に搭載することによって放熱蓋4が載接片6cに押し付
けられて接片6bをバネに抗し下方へ撓ませ、その反作
用として載接片6cと放熱蓋4との加圧接触が得られ
る。
The contact 6 is a seat 6 extending in the lateral direction.
a contact piece 6b extending vertically from the seat piece 6a and extending in the lateral direction and having a vertical elasticity, and a mounting contact piece 6c projecting upward at a free end of the elastic contact piece 6b. The mounting piece 6c is disposed so as to be present in the central opening 11 of the moving plate 9, and the mounting piece 6c and the heat-dissipating lid 4 are opposed to each other at the central opening 11, so that the mounting piece 6c is The outer surface of the heat radiation cover 4 is brought into pressure contact. That is, when the IC package is mounted on the movable plate 9, the heat dissipating lid 4 is pressed against the mounting piece 6c, and the contact piece 6b is bent downward against the spring. Pressure contact is obtained.

【0027】又座片6aの下位に該座片6aから下方へ
向け延ばされた雄端子6dを有し、座片6aをソケット
本体8に座着すると共に、この雄端子6dをソケット本
体8を貫通して下方へ突出し配線基板との接続に供され
る。従って接触子6は放熱蓋4と接触しつつ、この放熱
蓋4を配線基板の接地ラインに接続する接地手段とな
る。
A male terminal 6d is provided below the seat 6a and extends downward from the seat 6a. The seat 6a is seated on the socket body 8 and the male terminal 6d is connected to the socket body 8a. , And project downward to provide connection to the wiring board. Therefore, the contact 6 serves as grounding means for connecting the heat radiation lid 4 to the ground line of the wiring board while being in contact with the heat radiation lid 4.

【0028】上記接触子6は単数又は複数設け、放熱蓋
4に集電された静電気をこの接触子6を介して放流す
る。図4A,BはPGA形ICパッケージをICソケッ
トの移動板9に搭載した時に、放熱蓋4によって載接片
6cを押し下げ、接触子6との加圧接触が得られるよう
にした例を示しているが、図5A,Bは上記目的の接触
子6を移動板9の横動によって放熱蓋4との接触位置と
解除位置へ弾性変位せしめる例を示している。
The contact 6 is provided singly or plurally, and discharges the static electricity collected in the heat radiating cover 4 through the contact 6. 4A and 4B show an example in which when the PGA type IC package is mounted on the moving plate 9 of the IC socket, the mounting piece 6c is pushed down by the heat dissipating lid 4 so that a press contact with the contact 6 can be obtained. 5A and 5B show an example in which the target contact 6 is elastically displaced by the lateral movement of the movable plate 9 to a position where it comes into contact with the heat radiating lid 4 and a release position.

【0029】上記接触子6は斜め上方に傾斜するよう延
ばされた弾性接片6bを有し、この弾性接片6bの上部
自由端に載接片6cを有し、該弾性接片6bの下端から
垂直方向に延ばされた雄端子6dをソケット本体8を貫
通して下方へ突出し、配線基板の接地ラインとの接続に
供する。
The contact 6 has an elastic contact piece 6b extending obliquely upward and a mounting contact piece 6c at an upper free end of the elastic contact piece 6b. The male terminal 6d extending vertically from the lower end penetrates through the socket body 8 and protrudes downward to be connected to a ground line of the wiring board.

【0030】而して図5Aに示すように、移動板9が一
方向に横動した時に、前記コンタクト5の開状態が形成
されると同時に、接触子6の弾性接片6bが移動板9に
設けた加圧部12によって押し下げられ、載接片6cを
移動板9上に搭載されるICパッケージの放熱蓋4の外
表面から下方へ離間する接触解除位置へ変位せしめる。
As shown in FIG. 5A, when the movable plate 9 is moved in one direction, the open state of the contact 5 is formed, and at the same time, the elastic contact piece 6b of the contact 6 is moved. Is pressed down by the pressurizing portion 12 provided in the movable plate 9 to displace the mounting piece 6c to the contact release position which is separated downward from the outer surface of the heat radiating cover 4 of the IC package mounted on the movable plate 9.

【0031】この状態で前記PGA形ICパッケージを
移動板9上に搭載した後、図5Bに示すように、移動板
9を前記とは逆方向に横動することによって上記弾性接
片6bに対する加圧部12による上記押し下げ力が解除
され、弾性接片6bは上方へ復元し、載接片6cを放熱
蓋4の外表面(下面)に加圧接触せしめる。載接片6c
は移動板9の中央部に設けた開口部11を通して、この
開口部11に対面する放熱蓋4に加圧接触する。図5B
においてはICパッケージが搭載されていない場合の接
触子6の復元位置を実線で示した。
After the PGA type IC package is mounted on the moving plate 9 in this state, as shown in FIG. 5B, the moving plate 9 is laterally moved in the opposite direction to the elastic contact piece 6b. The pressing force by the pressure portion 12 is released, the elastic contact piece 6b is restored upward, and the mounting contact piece 6c is brought into pressure contact with the outer surface (lower surface) of the heat radiation lid 4. Mounting piece 6c
Is pressed through the opening 11 provided at the center of the moving plate 9 to the radiating lid 4 facing the opening 11. FIG. 5B
5, the solid line represents the restoring position of the contact 6 when the IC package is not mounted.

【0032】第2実施例(図6乃至図8参照) ガルウィング形ICパッケージは図6,図7に示すよう
に、絶縁材から成る方形のICパッケージ本体1の対向
する側面から二段曲げして突出したIC外部端子7を有
している。そして上記ICパッケージ本体の中央部にそ
の下面で開口するIC内蔵室2を有し、このIC内蔵室
2の開口面を放熱蓋4で覆い、IC3を密閉している。
Second Embodiment (See FIGS. 6 to 8) As shown in FIGS. 6 and 7, a gull-wing type IC package is formed by bending a rectangular IC package body 1 made of an insulating material in two steps from opposing side surfaces. It has a protruding IC external terminal 7. In the center of the IC package main body, there is provided an IC built-in chamber 2 having an opening at the lower surface, and the opening surface of the IC built-in chamber 2 is covered with a heat radiation cover 4 to seal the IC 3.

【0033】放熱蓋4は図7に示すように、IC内蔵室
2の内面に嵌着して本体1と一体にする。又は図3にお
いて説明したように、放熱蓋4をIC内蔵室2を画成す
る周壁の下面、即ち、ICパッケージ本体1の下面に重
合し、本体1と一体にする。又IC3は図3A,B,C
において説明したと同一の態様を以ってIC内蔵室2内
に内蔵される。
The heat dissipating lid 4 is fitted to the inner surface of the IC built-in chamber 2 to be integrated with the main body 1 as shown in FIG. Alternatively, as described with reference to FIG. 3, the heat dissipation lid 4 is overlapped on the lower surface of the peripheral wall defining the IC built-in chamber 2, that is, the lower surface of the IC package main body 1, and is integrated with the main body 1. IC3 is shown in Fig.3A, B, C
Is built in the IC built-in chamber 2 in the same manner as described in (1).

【0034】即ち、図7Aに示すようにIC3をIC内
蔵室2の内底面と放熱蓋4の内面間に保持し両面にIC
3の上下面が接触するようにするか、又は図7Bに示す
ようにIC3をIC内蔵室2の内底面に接し、放熱蓋4
の内面とは微小の間隙を存して内蔵する。又は図7Cに
示すように、IC3を放熱蓋4の内面に重合して接触
し、IC内蔵室2の内底面とは微小の間隙を存して内蔵
する。
That is, as shown in FIG. 7A, the IC 3 is held between the inner bottom surface of the IC built-in chamber 2 and the inner surface of the heat radiation cover 4 and the IC
3 so that the upper and lower surfaces are in contact with each other, or as shown in FIG.
Is built in with a small gap from the inner surface of the substrate. Alternatively, as shown in FIG. 7C, the IC 3 is superimposed on and contacts the inner surface of the heat dissipation lid 4, and is built in with a small gap from the inner bottom surface of the IC built-in chamber 2.

【0035】図8は上記ガルウィング形ICパッケージ
用のソケットを例示しており、同図に示すように、ソケ
ット本体8は上記ICパッケージの外部端子7と対応す
るコンタクト5を保有すると共に、放熱蓋4の外表面
(下面)に加圧接触する接触子6を保有している。上記
コンタクト5及び接触子6は第1実施例に基いて説明し
たと同様の座片5a,6aと弾性接片5b,6bと載接
片5c,6cと雄端子5d,6dとを有しており、上記
IC外部端子7は上記コンタクト5の載接片5cの上面
に加圧接触され、放熱蓋4は接触子6の載接片6cの上
面に加圧接触される。
FIG. 8 exemplifies a socket for the gull-wing type IC package. As shown in FIG. 8, the socket body 8 has contacts 5 corresponding to the external terminals 7 of the IC package and a heat radiation cover. 4 has a contact 6 that comes into pressure contact with the outer surface (lower surface). The contact 5 and the contact 6 have the same seat pieces 5a, 6a, elastic contact pieces 5b, 6b, mounting contact pieces 5c, 6c, and male terminals 5d, 6d as described with reference to the first embodiment. The IC external terminal 7 is in pressure contact with the upper surface of the mounting piece 5c of the contact 5, and the heat dissipation lid 4 is in pressure contact with the upper surface of the mounting piece 6c of the contact 6.

【0036】上記加圧手段としてソケット本体8に開閉
される押えカバー13を設け、この押えカバー13の一
端をソケット本体8の一端に軸14により回動可に枢支
し、この押えカバー13にIC外部端子7の上面に接し
て押し下げる押え部材16を軸15によりカバー13に
調動可に取付け、この押え部材16によって外部端子7
を押し下げるように配置する。
A pressing cover 13 which is opened and closed by the socket body 8 is provided as the pressurizing means, and one end of the pressing cover 13 is rotatably supported on one end of the socket body 8 by a shaft 14. A holding member 16 which is brought into contact with the upper surface of the IC external terminal 7 and pressed down is attached to the cover 13 by a shaft 15 so as to be adjustable.
To be pressed down.

【0037】詳述するとガルウィング形のICパッケー
ジはソケット本体8に搭載して外部接点7をコンタクト
5の載接片5cに載荷した後、押えカバー13を閉合し
た時に、押え部材16がIC外部端子7を押圧してコン
タクト5及び接触子6の載接片5c,6cを押し下げ、
弾性接片5b,6bをその弾性に抗し下方へ変位させ、
その反力によりコンタクト5の載接片5cにIC外部端
子7を加圧接触すると共に、接触子6の載接片6cに放
熱蓋4を加圧接触せしめる。
More specifically, the gull-wing type IC package is mounted on the socket body 8, the external contacts 7 are loaded on the mounting pieces 5c of the contacts 5, and when the pressing cover 13 is closed, the pressing member 16 is connected to the IC external terminal. 7, the contact pieces 5c and 6c of the contact 5 and the contact 6 are pushed down,
The elastic contact pieces 5b, 6b are displaced downward against their elasticity,
Due to the reaction force, the IC external terminal 7 is brought into pressure contact with the mounting contact piece 5c of the contact 5, and the heat dissipating lid 4 is brought into pressure contact with the mounting contact piece 6c of the contact 6.

【0038】上記加圧接触状態はソケット本体8に閉合
された押えカバー13の自由端をロックレバー17によ
ってソケット本体8の端部に係合することによって維持
させる。第1,第2実施例におけるコンタクト5及び接
触子6と、IC外部端子7及び放熱蓋4との加圧接触状
態は、ソケット本体8とは結合されていない押えカバー
又はロボットのマニプレーター、又は手指にて維持する
ことができる。
The press contact state is maintained by engaging the free end of the press cover 13 closed to the socket body 8 with the end of the socket body 8 by the lock lever 17. The press contact state between the contact 5 and the contact 6 and the IC external terminal 7 and the heat radiating cover 4 in the first and second embodiments is the pressing cover or the manipulator of the robot or the finger which is not connected to the socket body 8. Can be maintained.

【0039】上記第2実施例においては、複数の接触子
6を放熱板4の対称位置に加圧接触してICパッケージ
本体1に対し均等の押上力を付与している。
In the second embodiment, the plurality of contacts 6 are brought into pressure contact with the symmetrical positions of the heat sink 4 to apply a uniform lifting force to the IC package body 1.

【0040】上記対称接触状態は第1実施例においても
実施できる。又ICパッケージに対し均等の押上力を付
与する手段として、放熱蓋4の中央部に接触子6を加圧
接触させることができる。第1、第2実施例においては
何れも接触子6として座片6aと弾性接片6bと載接片
6cと雄端子6dを有する構造のものを用いた場合を示
したが、この接触子6に換えて、第3実施例で述べる如
き、直線的に伸縮するコンタクトプローブを用いること
を妨げない。
The above-mentioned symmetric contact state can be implemented also in the first embodiment. Further, as a means for applying a uniform pushing force to the IC package, the contact 6 can be brought into pressure contact with the central portion of the heat radiation lid 4. In both the first and second embodiments, the case where a structure having the seat piece 6a, the elastic contact piece 6b, the mounting contact piece 6c, and the male terminal 6d is used as the contact 6 is shown. Instead, as described in the third embodiment, use of a contact probe that expands and contracts linearly is not prevented.

【0041】第3実施例(図10乃至図12参照) この実施例におけるJベンド形ICパッケージは図9,
図10に示すように、絶縁材から成る方形のICパッケ
ージ本体1の二側面又は四側面からJ形に折曲して突出
したIC外部端子7を有している。そして、上記ICパ
ッケージ本体1の中央部にその下面で開口するIC内蔵
室2を有し、このIC内蔵室2の開口面を放熱蓋4で覆
い密閉している。この放熱蓋4による密閉構造及びIC
3の配置は、図3A,B,C及び図7A,B,Cに基い
て説明したと同様の構造を採ることができる。
Third Embodiment (See FIGS. 10 to 12) A J-bend type IC package in this embodiment is shown in FIGS.
As shown in FIG. 10, a rectangular IC package body 1 made of an insulating material has IC external terminals 7 which are bent and protruded into a J shape from two or four sides. The IC package body 1 has a built-in IC chamber 2 which is opened at the lower surface in the center of the IC package main body 1, and the opening surface of the IC built-in chamber 2 is covered with a heat radiating lid 4 to be sealed. Sealed structure by this heat radiation lid 4 and IC
The arrangement of 3 can have the same structure as that described with reference to FIGS. 3A, 3B, and 7A and FIGS. 7A, 7B, and 7C.

【0042】図11,図12に示すように、上記Jベン
ド形の外部端子7を有するICパッケージは、ソケット
本体8の上面で開口するIC収容部に装填され、即ちI
C収容部の辺縁に沿い対向して配置されたコンタクト5
間に強制挿入され、コンタクト5の接片に加圧接触し、
このコンタクト5の接片によってICパッケージがIC
収容部内に弾力的に保持される。
As shown in FIGS. 11 and 12, the IC package having the J-bend type external terminal 7 is loaded in an IC accommodating portion opened on the upper surface of the socket body 8, ie, I
Contact 5 arranged opposite along the edge of the C accommodating portion
Forcibly inserted into the gap, and press-contacted the contact piece of the contact 5,
The contact piece of the contact 5 makes the IC package an IC.
Resiliently held in the housing.

【0043】上記ソケット本体8の中央部に放熱蓋4と
対応する接触子6を配置する。この接触子6は第1,第
2実施例において説明した横U字形の弾性接片6bを有
する接触子を用いることができる他、図11,図12に
示すように上下に直線的に伸縮可能なピン端子形のコン
タクトプローブを用いることができる。このコンタクト
プローブとしては外筒6eにピン端子6fを内挿し、こ
のピン端子6fを外筒6eに内蔵させたタコイルバネ等
によって上方へ付勢するようにしたものを用いることが
できる。
The contact 6 corresponding to the heat radiating cover 4 is arranged at the center of the socket body 8. As the contact 6, the contact having the elastic contact piece 6b of the horizontal U-shape described in the first and second embodiments can be used, and it can also expand and contract linearly up and down as shown in FIGS. A simple pin terminal type contact probe can be used. As the contact probe, a probe in which a pin terminal 6f is inserted into the outer cylinder 6e and the pin terminal 6f is urged upward by a tacoil spring or the like built in the outer cylinder 6e can be used.

【0044】上記接触子6を図11に示すように、放熱
板4の外表面の対称位置に加圧接触するように複数配置
するか、又は図12に示すように、放熱板4の中央部下
面に加圧接触するように単数又は複数配置する。図1
1,図12は何れも、接触子6がICパッケージに対し
左右均等の押上力を付与する。
As shown in FIG. 11, a plurality of the contacts 6 are arranged so as to be in pressure contact with symmetrical positions on the outer surface of the heat radiating plate 4, or as shown in FIG. One or more are arranged so as to be in pressure contact with the lower surface. FIG.
1 and FIG. 12, the contact 6 applies a left-right equal push-up force to the IC package.

【0045】[0045]

【発明の効果】本発明のソケットにおけるICパッケー
ジの接地機構は放熱蓋で効熱効果を得ながら、この放熱
蓋に加圧接触する接触子をソケット側に付設する簡素な
構造で接地機構が提供できる。加えて広面積の放熱蓋に
より集電効果を高め良好な静電気放流効果が期待できる
と共に、保護すべきICに直近する放熱蓋から効率的に
放流できるので、ICの静電気保護対策として極めて有
効である。
The grounding mechanism of the IC package in the socket according to the present invention provides a grounding mechanism with a simple structure in which a contact that presses and contacts the heat dissipation lid is provided on the socket side while obtaining a heat effect with the heat dissipation lid. it can. In addition, a large-area heat-dissipating lid enhances the current collection effect and can be expected to have a good electrostatic discharge effect, and can be efficiently discharged from the heat-dissipating lid close to the IC to be protected. .

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明に係る接地機構の原理を示す断面図。FIG. 1 is a sectional view showing the principle of a grounding mechanism according to the present invention.

【図2】PGA形ICパッケージの底面図。FIG. 2 is a bottom view of the PGA type IC package.

【図3】A、B、Cは上記PGA形ICパッケージの断
面図であり、ICの内蔵態様を夫々例示する図。
FIGS. 3A, 3B, and 3C are cross-sectional views of the PGA type IC package, each illustrating a built-in mode of the IC; FIGS.

【図4】A、Bは上記PGA形ICパッケージとそのソ
ケットによる接地機構を示す断面図であり、移動板によ
ってコンタクトを開閉した状態を示す図。
FIGS. 4A and 4B are cross-sectional views showing a grounding mechanism using the PGA type IC package and its socket, showing a state in which contacts are opened and closed by a moving plate.

【図5】A、Bは上記移動板によって接触子を開閉する
構造例を示す要部断面図。
FIGS. 5A and 5B are cross-sectional views of a main part showing a structural example in which a contact is opened and closed by the moving plate.

【図6】ガルウィング形ICパッケージの底面図。FIG. 6 is a bottom view of the gull-wing type IC package.

【図7】A,B,Cは上記ガルウィング形ICパッケー
ジの断面図であり、ICの内蔵態様を夫々例示する図。
FIGS. 7A, 7B, and 7C are cross-sectional views of the gull-wing type IC package, each illustrating a built-in mode of the IC;

【図8】上記ガルウィング形ICパッケージとそのソケ
ットによる接地機構を示す断面図。
FIG. 8 is a cross-sectional view showing a grounding mechanism using the gull-wing type IC package and its socket.

【図9】Jベンド形ICパッケージの底面図。FIG. 9 is a bottom view of the J-bend type IC package.

【図10】上記Jベンド形ICパッケージの断面図。FIG. 10 is a sectional view of the J-bend type IC package.

【図11】上記Jベンド形ICパッケージとそのソケッ
トによって形成される接地機構を示す断面図。
FIG. 11 is a sectional view showing a grounding mechanism formed by the J-bend type IC package and its socket.

【図12】上記接地機構の他例を示す断面図。FIG. 12 is a sectional view showing another example of the grounding mechanism.

【符号の説明】[Explanation of symbols]

1 ICパッケージ本体 2 IC内蔵室 3 IC 4 放熱蓋 5 コンタクト 6 接触子 7 IC外部端子 8 ソケット本体 9 移動板 10 貫通孔 12 加圧部 11 開口部 13 押えカバー 16 押え部材 17 ロックレバー DESCRIPTION OF SYMBOLS 1 IC package main body 2 IC built-in room 3 IC 4 Heat radiation cover 5 Contact 6 Contact 7 IC external terminal 8 Socket main body 9 Moving plate 10 Through hole 12 Pressurizing part 11 Opening 13 Pressing cover 16 Pressing member 17 Lock lever

───────────────────────────────────────────────────── フロントページの続き (58)調査した分野(Int.Cl.6,DB名) H01R 33/76 H01L 23/32──────────────────────────────────────────────────続 き Continued on the front page (58) Fields surveyed (Int.Cl. 6 , DB name) H01R 33/76 H01L 23/32

Claims (4)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】ICパッケージ本体の上面又は下面で開口
するIC内蔵室を該開口面を覆う金属製の放熱蓋で密閉
して成るICパッケージ用のソケットにおいて、該IC
パッケージ用ソケットに上記ICパッケージの外部端子
と接触するコンタクトを具備させると共に、上記放熱蓋
の外表面に弾性的に加圧接触する接触子を具備させ、該
接触子を介して上記放熱蓋を接地する構成としたことを
特徴とするソケットにおけるICパッケージの接地機
構。
An IC package socket in which an IC built-in chamber which is opened at an upper surface or a lower surface of an IC package body is sealed with a metal heat radiating cover which covers the opening surface.
The package socket is provided with a contact for contacting the external terminal of the IC package, and a contact for elastically pressing the outer surface of the heat dissipation lid is provided. The heat dissipation lid is grounded via the contact. A grounding mechanism for an IC package in a socket, characterized in that:
【請求項2】上記接触子がICパッケージ用ソケットの
上面に沿い横動する移動板によって接触位置と接触解除
位置へ変位されることを特徴とする請求項1記載のソケ
ットにおけるICパッケージの接地機構。
2. A grounding mechanism for an IC package in a socket according to claim 1, wherein said contact is displaced to a contact position and a contact release position by a moving plate which moves laterally along an upper surface of the IC package socket. .
【請求項3】上記接触子が上記放熱蓋の外表面中央部に
加圧接触することを特徴とする請求項1記載のソケット
におけるICパッケージの接地機構。
3. A grounding mechanism for an IC package in a socket according to claim 1, wherein said contact contacts the central portion of the outer surface of said heat radiating lid under pressure.
【請求項4】上記接触子が上記放熱蓋の外表面の対称位
置に接触するよう複数配置されていることを特徴とする
請求項1記載のソケットにおけるICパッケージの接地
機構。
4. The grounding mechanism of an IC package in a socket according to claim 1, wherein a plurality of said contacts are arranged so as to contact symmetrical positions on an outer surface of said heat radiation lid.
JP5421596A 1996-02-16 1996-02-16 Grounding mechanism of IC package in socket Expired - Lifetime JP2829272B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5421596A JP2829272B2 (en) 1996-02-16 1996-02-16 Grounding mechanism of IC package in socket

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5421596A JP2829272B2 (en) 1996-02-16 1996-02-16 Grounding mechanism of IC package in socket

Publications (2)

Publication Number Publication Date
JPH09223556A JPH09223556A (en) 1997-08-26
JP2829272B2 true JP2829272B2 (en) 1998-11-25

Family

ID=12964330

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5421596A Expired - Lifetime JP2829272B2 (en) 1996-02-16 1996-02-16 Grounding mechanism of IC package in socket

Country Status (1)

Country Link
JP (1) JP2829272B2 (en)

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5259945B2 (en) * 2006-10-30 2013-08-07 スリーエム イノベイティブ プロパティズ カンパニー IC socket with heat dissipation function
JP2009283211A (en) * 2008-05-20 2009-12-03 Oki Semiconductor Co Ltd Socket, and inspection device using the same, and method of manufacturing semiconductor device
JP6234441B2 (en) 2013-04-11 2017-11-22 ルネサスエレクトロニクス株式会社 Manufacturing method of semiconductor device
CN112133684B (en) * 2020-09-11 2022-08-02 安徽龙芯微科技有限公司 Radiating cover grounding packaging structure and process thereof

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