JP2826825B2 - Polishing tool - Google Patents

Polishing tool

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Publication number
JP2826825B2
JP2826825B2 JP63058392A JP5839288A JP2826825B2 JP 2826825 B2 JP2826825 B2 JP 2826825B2 JP 63058392 A JP63058392 A JP 63058392A JP 5839288 A JP5839288 A JP 5839288A JP 2826825 B2 JP2826825 B2 JP 2826825B2
Authority
JP
Japan
Prior art keywords
polishing
particles
abrasive
polishing tool
resin
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP63058392A
Other languages
Japanese (ja)
Other versions
JPH01234169A (en
Inventor
徳道 川島
俊郎 服部
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toppan Infomedia Co Ltd
Original Assignee
Tokyo Magnetic Printing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Magnetic Printing Co Ltd filed Critical Tokyo Magnetic Printing Co Ltd
Priority to JP63058392A priority Critical patent/JP2826825B2/en
Priority to US07/316,903 priority patent/US4974373A/en
Publication of JPH01234169A publication Critical patent/JPH01234169A/en
Application granted granted Critical
Publication of JP2826825B2 publication Critical patent/JP2826825B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Polishing Bodies And Polishing Tools (AREA)
  • Manufacturing Of Magnetic Record Carriers (AREA)

Description

【発明の詳細な説明】 (発明の利用分野) 本発明は、特にハードディスク、フレキシブルディス
ク等の磁気ディスク用のテクスチャリング、ラッピング
に使用される研磨具に関する。
Description: BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a polishing tool used for texturing and lapping of a magnetic disk such as a hard disk and a flexible disk.

(従来技術) 研磨具は従来ポリエチレンテレフタレート(PET)フ
ィルム、デイスク、シート等の上に研磨材粉末をバイン
ダー樹脂中に分散させた塗料を塗布し、研磨層を連続又
は不連続に形成させたものが有り、研磨材としてはダイ
ヤモンド、アルミナ、シリコンカーバイド、酸化鉄、酸
化クロム等の粉末が用いられている。
(Prior art) A polishing tool is a conventional tool in which a polishing material powder is dispersed in a binder resin and applied to a polyethylene terephthalate (PET) film, disk, sheet, etc., and a polishing layer is formed continuously or discontinuously. Powders such as diamond, alumina, silicon carbide, iron oxide, and chromium oxide are used as abrasives.

高精度研磨には粒度分布の揃った微細な研磨材の使用
が必要となる。ところが研磨材の粒子径が小さくなるに
つれ粒子は凝集しやすく研磨材を樹脂中に均一に分散さ
せる事が困難となる。砥粒が凝集状態で塗布された場
合、被研磨物にキズを与えたり、被研磨物表面の研磨面
が不均一となり研磨ムラを生ずる原因となる。特に磁気
ハードディスクのテクスチャリング面は均一な幅と深さ
を有する研磨面が要求される。しかしながら、従来製造
されているハードデイスク用研磨テープはその研磨層が
多層構造を有しており、粒子同志が密に接触した均一な
表面構造又はBenard cell構造を有している。しかし微
視的に見ると表面は決して一様ではなくて、多数の箇所
で砥粒の凝集塊が研磨層の表面から突出し、このため深
い傷とか擦傷(スクラッチ)を生じる。
High-precision polishing requires the use of a fine abrasive having a uniform particle size distribution. However, as the particle size of the abrasive decreases, the particles tend to agglomerate, making it difficult to uniformly disperse the abrasive in the resin. When the abrasive grains are applied in an aggregated state, the polishing object is scratched, and the polished surface of the polishing object surface becomes non-uniform, causing polishing unevenness. In particular, a textured surface of a magnetic hard disk requires a polished surface having a uniform width and depth. However, conventionally manufactured polishing tapes for hard disks have a polishing layer having a multilayer structure, and have a uniform surface structure or a Benard cell structure in which particles are in close contact with each other. However, when viewed microscopically, the surface is never uniform, and agglomerates of abrasive grains protrude from the surface of the polishing layer at many places, resulting in deep scratches or scratches.

ハードディスクのテクスチャリングの様に研磨テープ
の表面構造が直接研磨面として転写される様な研磨方式
の場合、研磨フィルムの研磨面の均一性が最も重要とな
ってくる。しかしながら従来の多層構造でしかもBenard
cell構造のものでは研磨フィルム表面の均一性を得る
事は困難である。
In the case of a polishing method in which the surface structure of a polishing tape is directly transferred as a polishing surface, such as texturing of a hard disk, uniformity of the polishing surface of a polishing film is most important. However, the conventional multilayer structure and Benard
It is difficult to obtain a uniform polishing film surface with a cell structure.

(発明の目的) 本発明の目的は、被研磨物の傷が少なく、精密研磨に
適した研磨具を提供ことにある。
(Object of the Invention) It is an object of the present invention to provide a polishing tool which has less scratches on an object to be polished and is suitable for precision polishing.

本発明の他の目的は被研磨物の加工(研磨幅、研磨深
さ)の制御が容易となる研磨フィルムの提供と被研磨物
との摩擦が少なく研磨くずによる目づまりを抑制した磁
気ディスク用研磨フィルムの供給にある。
Another object of the present invention is to provide a polishing film that facilitates the control of the processing (polishing width and polishing depth) of an object to be polished, and a polishing method for a magnetic disk in which the friction with the object to be polished is small and clogging due to polishing chips is suppressed. In the supply of film.

(発明の概要) 本発明は、研磨材粒子をポリエステルフィルムの様な
ベース(基体)上に実質的に単層で均一に分散し接着さ
せるた研磨具を使用することにより、使用する研磨材の
平均粒子径、粒度分布に応じた粗さのみを実質的に有す
る研磨面の製造を可能とする。すなわち、本発明の研磨
具で研磨された表面は異常な傷が存在しない一様な研磨
すじを有する。
(Summary of the Invention) The present invention uses a polishing tool in which abrasive particles are substantially uniformly dispersed and adhered in a single layer on a base (substrate) such as a polyester film, so that the abrasive used is It is possible to manufacture a polished surface having substantially only roughness according to the average particle diameter and the particle size distribution. That is, the surface polished by the polishing tool of the present invention has uniform polishing streaks without abnormal scratches.

本発明の研磨具は、砥粒の表面密度が低く、このため
研磨層と被研磨面との接触面積が小さくなる為、同一圧
力下でも多層構造で密な砥粒濃度のものに比べ均一で研
磨溝も深くなり、且つ被研磨物との摩擦が軽減される為
切れ味が良くなり仕上げ面状態も向上する。
The polishing tool of the present invention has a low surface density of the abrasive grains, and therefore a small contact area between the polishing layer and the surface to be polished. The depth of the polishing groove is increased, and the friction with the object to be polished is reduced, so that the sharpness is improved and the finished surface condition is improved.

また研磨材粒子間には間隙が存在するため、粒子と粒
子間の間隙がチップポケットとして作用する為目づまり
が防止出来、耐久性が向上する。
Further, since there is a gap between the abrasive particles, the gap between the particles acts as a chip pocket, so that clogging can be prevented and the durability is improved.

砥粒の表面密度を減少させるには砥粒の量をバインダ
ー樹脂の量に対して0.25対1〜2対1(重量比)で分散
させたものをベース上に、砥粒が単層となるように薄く
塗布すれば良い。
In order to reduce the surface density of the abrasive grains, the abrasive grains become a single layer on a base in which the amount of the abrasive grains is dispersed at a ratio of 0.25 to 1-2 to 1 (weight ratio) with respect to the amount of the binder resin. It may be applied as thin as possible.

(発明の具体的な説明) 本発明は研磨材粒子が単層でしかも出来るだけ一様に
分散した状態で基体上に接着した構造を有する事を特徴
とする。添付した図面に基づいて本発明の基本的な技術
思想を説明する。
(Specific Description of the Invention) The present invention is characterized in that it has a structure in which abrasive particles are adhered to a substrate in a single layer and as uniformly dispersed as possible. The basic technical concept of the present invention will be described with reference to the attached drawings.

第1図、第2図はそれぞれ本発明の研磨具の一部を示
す表面図と断面図である。
1 and 2 are a front view and a sectional view, respectively, showing a part of the polishing tool of the present invention.

この研磨具はプラスチックフィルム、不織布、金属
箔、金属板、ガラス板などのベース1の上に、バインダ
ー樹脂3中に研磨材粒子2を分散させてなる研磨層が実
質的に単一層として塗布されて形成された構造を有する
ものである。ここに単一層とは粒子の重畳が実質的に無
いことを意味し、好ましくは粒子の2個以上の重畳箇所
が100個の粒子あたり1個以下、より好ましくは1000個
につき1個以下、更に好ましくは10000個似つき1個以
下に押える。これにより、砥粒の平均粒子径で定まる被
研磨物の研磨面の表面粗さに対して、異質な傷(より深
い及び/又は広い傷)ないし擦傷は発生する確率が大幅
に減少し、高精度の研磨が達成し得る。なお、ここで研
磨材粒子の相当数が面方向に相互に接触することは差し
支えない。本発明で避けなければならないのは研磨材粒
子が上下に重畳して異常な突起を形成することである。
In this polishing tool, a polishing layer formed by dispersing abrasive particles 2 in a binder resin 3 is applied as a substantially single layer on a base 1 such as a plastic film, a nonwoven fabric, a metal foil, a metal plate, and a glass plate. It has a structure formed. Here, a single layer means that there is substantially no superposition of particles, and preferably two or more superimposed portions of particles are 1 or less per 100 particles, more preferably 1 or less per 1000 particles, Preferably, it is reduced to 10,000 or less. As a result, the probability of occurrence of extraneous scratches (deeper and / or wider scratches) or scratches on the surface roughness of the polished surface of the object to be polished determined by the average particle size of the abrasive grains is greatly reduced, Precision polishing can be achieved. Here, a considerable number of the abrasive particles may come into contact with each other in the plane direction. What must be avoided in the present invention is that the abrasive particles overlap one another up and down to form abnormal protrusions.

このような単層構造の研磨材層は特殊な方法を用いな
くても適当な高分子バインダー、溶剤、分散剤、それら
の配合比、塗布手段、塗布量等を調節することによって
比較的容易に実現できることが分かった。
Such a single-layer abrasive layer can be relatively easily formed by adjusting appropriate polymer binders, solvents, dispersants, their mixing ratios, coating means, coating amounts, etc. without using a special method. It turns out that it can be realized.

ベースはテープ、シート、ディスク状等任意の形に加
工して使用出来るものである。
The base can be processed into an arbitrary shape such as a tape, a sheet, or a disk and used.

研磨材としてはダイヤモンド、CBN、シリコーンカー
バイド、単結晶アルミナ、電融アルミナ粉砕粉、酸化ク
ロム、酸化鉄、酸化セリウム等がある。
Examples of the abrasive include diamond, CBN, silicone carbide, single-crystal alumina, fused alumina pulverized powder, chromium oxide, iron oxide, and cerium oxide.

研磨材の粒径は1μm以上のものが望ましい。特に5
μm以上の粒子を用いた場合その効果は顕著である。
The abrasive preferably has a particle size of 1 μm or more. Especially 5
The effect is remarkable when particles having a size of not less than μm are used.

バインダー樹脂としては熱硬化性樹脂及び熱可塑性樹
脂が使用でき熱硬化性樹脂としてはポリエステル又はア
クリルポリオールウレタン系樹脂、塩素化ポリプロピレ
ン変性アクリルポリオールウレタン系樹脂、アクリル−
キレート硬化型樹脂、エポキシ又はエポキシペンダント
アクリル樹脂+アミンペンダントアクリル系樹脂、ポリ
オルカノシロキサン系樹脂、各種UV硬化型樹脂、ウレタ
ン化油系樹脂、湿気硬化ポリウレタン系樹脂、ふっ素系
樹脂等100℃以下で硬化反応が進行するものが適してい
る。
As the binder resin, a thermosetting resin and a thermoplastic resin can be used. As the thermosetting resin, polyester or acrylic polyol urethane resin, chlorinated polypropylene-modified acrylic polyol urethane resin, acrylic
Chelate-curable resin, epoxy or epoxy pendant acrylic resin + amine pendant acrylic resin, polyorganosiloxane resin, various UV-curable resins, urethane-based oil resin, moisture-cured polyurethane resin, fluorine resin, etc. 100 ° C or less It is suitable that the curing reaction proceeds.

熱可塑性樹脂としては純アクリル系樹脂、塩化ビニル
系樹脂、ニトロセルロース系樹脂、ニトロセルロース−
アクリル系樹脂、変性アクリル系樹脂、アルキッド系、
ポリオレフィン系樹脂、ポリエステル系樹脂、ゴム系樹
脂であるウレタンエラストマー、ニトリルゴム、シリコ
ンゴム、エチレン酢ビゴム、ふっ素ゴム系樹脂、その他
水溶性樹脂、エマルジョン系樹脂のものが使用される。
As the thermoplastic resin, pure acrylic resin, vinyl chloride resin, nitrocellulose resin, nitrocellulose
Acrylic resin, modified acrylic resin, alkyd,
Polyolefin resins, polyester resins, rubber resins such as urethane elastomers, nitrile rubber, silicone rubber, ethylene vinyl acetate rubber, fluorine rubber resins, other water-soluble resins, and emulsion resins are used.

ベースフィルム基体としてはプラスチックフィルムと
してポリエチレンテレフタレート、ポリイミド、ポリカ
ーボネート及びそれらの表面処理したフィルムその他合
成紙、不織布その他金属ハク等が用いられる。又リジッ
トな基体としてはガラス、金属等も使用する事が出来
る。
As the base film substrate, a plastic film such as polyethylene terephthalate, polyimide, polycarbonate, and a surface-treated film thereof, such as a synthetic paper, a nonwoven fabric, and a metal shell are used. Also, glass, metal, etc. can be used as a rigid substrate.

(研磨具の製法) 研磨材はバインダー樹脂及び溶剤と混合されたうえ、
適当な塗布手段により砥粒の粒度分布により適当な塗布
厚に調整されフィルム等の基体に塗布される。
(Method of manufacturing polishing tool) After the polishing material is mixed with a binder resin and a solvent,
The coating is adjusted to an appropriate coating thickness by a suitable coating means according to the particle size distribution of the abrasive grains, and is applied to a substrate such as a film.

例えば、メイヤバーコーター、グラビアコーター、リ
バースロールコーター、ナイフコーター等が使用し得
る。
For example, a Meyer bar coater, a gravure coater, a reverse roll coater, a knife coater and the like can be used.

こうして得られた被膜は乾燥又は硬化処理により基体
に固着される。
The coating thus obtained is fixed to the substrate by a drying or curing treatment.

次に本発明の実施例について説明する。 Next, examples of the present invention will be described.

実施例1 この実施例は、本発明による研磨フィルムを試作実験
する為研磨層のバインダー樹脂として熱可塑性樹脂を使
用した場合の例であり、先ず次の表に示す様な組成の塗
工液が準備された。
Example 1 This example is an example in which a thermoplastic resin is used as a binder resin of a polishing layer in order to experimentally produce a polishing film according to the present invention. First, a coating liquid having a composition shown in the following table was used. Prepared.

砥粒としては電融アルミナの粉砕粉WAを用いて平均粒
径の異なった各種メッシュのものを砥粒/樹脂の比率が
1対1に成る様調整した。WA2000のものについては砥粒
/樹脂濃度を3種変化させ砥粒濃度の影響を検討した。
As the abrasive grains, various kinds of meshes having different average particle diameters were adjusted by using pulverized powder WA of electrofused alumina so that the ratio of abrasive grains / resin was 1: 1. For WA2000, the effect of abrasive grain concentration was examined by changing the abrasive grain / resin concentration by three types.

表1の組成(数値は重量部、またV200は東洋紡社製ポ
リエステル樹脂である)の塗工液をリバースロールコー
ターで25μmの厚さのポリエチレンテレフタレートフィ
ルム上に各種粒径に応じた塗布厚で塗布し溶剤を乾燥
後、所定の幅にスリットしテープ状に加工しハードディ
スク用ニッケルメッキ基板の研磨に併した。なお使用し
た研磨材粉末の平均粒径は次ぎの通りであった。WA800
は20μm、WA1000は11μm、WA1500は8μm、WA2000は
7μm、及びWA3000は5μm. この様にして製造された研磨テープと同一の研磨材粒
子を用いて通常の方法で製造された従来の高密度で砥粒
を含有するバインダーを塗布して得た砥粒の密集した研
磨フィルム(以下多層構造タイプと称する)でハードデ
ィスクのテクスチャリングを行なった。
A coating liquid of the composition shown in Table 1 (the numerical values are parts by weight, and V200 is a polyester resin manufactured by Toyobo Co., Ltd.) is applied by a reverse roll coater onto a 25 μm-thick polyethylene terephthalate film at an application thickness corresponding to various particle sizes. After drying the solvent, it was slit to a predetermined width, processed into a tape shape, and simultaneously polished with a nickel-plated substrate for a hard disk. The average particle size of the used abrasive powder was as follows. WA800
Is 20 μm, WA1000 is 11 μm, WA1500 is 8 μm, WA2000 is 7 μm, and WA3000 is 5 μm. The conventional high-density manufactured by the usual method using the same abrasive particles as the abrasive tape manufactured in this way. The hard disk was textured with a polishing film (hereinafter referred to as a multilayer structure type) in which abrasive grains were densely obtained by applying a binder containing abrasive grains.

通常の多層構造タイプを用いて表2に示される様な結
果を与える条件下で本発明による研磨テープを用いて研
磨したところ表3に示す様な仕上げ面粗さと仕上げ面状
態が得られた。表中、異常個数とは、目立つ大きさのえ
ぐれの個数を示し、スクラッチの個数とは通常の研磨す
じよりも太く長いすじのことを指す。
Polishing with a polishing tape according to the present invention using the ordinary multilayer structure type under the conditions giving the results shown in Table 2 gave the finished surface roughness and finished surface condition shown in Table 3. In the table, the abnormal number indicates the number of scrambles of a noticeable size, and the number of scratches indicates a streak that is thicker and longer than a normal polishing streak.

表4は研磨具の塗膜の表面状態の測定結果を示す。 Table 4 shows the measurement results of the surface condition of the coating film of the polishing tool.

表3の結果から分かるように、本発明の単層構造の研
磨層を有する研磨具は通常の研磨すじ以外の表面傷を全
く発生させなかった。
As can be seen from the results in Table 3, the polishing tool having the polishing layer having the single-layer structure of the present invention did not generate any surface scratches other than ordinary polishing streaks.

更に、この実施例によるすべての研磨具の表面を顕微
鏡で観察したところ、粒子の重なりと見られるものは全
く見られなかった。第3図は上記の実施例で製造された
もののうち、WA1500を用いたものの例を示す。第4図は
同じWA1500を用いたものの表面の実測した触針プロフィ
ルを示す。更に、表4から、単層とみなし得る塗膜面が
得られていることが分かる。
Further, when the surfaces of all the polishing tools according to this example were observed with a microscope, none of the particles that appeared to be overlapping particles were found. FIG. 3 shows an example of one manufactured in the above embodiment using WA1500. FIG. 4 shows the measured stylus profile of the surface of the same WA1500. Further, from Table 4, it can be seen that a coating film surface that can be regarded as a single layer was obtained.

実施例2 実施例1において、バインダー樹脂をビニルアルコー
ル成分を有する塩かビニル−酢酸ビニル共重合体よりな
る熱硬化性樹脂(ユニオン.カーバイド社製のVAGH)及
びその硬化剤(日本ポリウレタン社製のコロネートEH)
とし、砥粒(P)とバインダー樹脂(R)との重量比P/
Rを表5の通りに変えて塗工液を製造し、熱硬化して単
層塗膜を有する研磨テープを製造した。
Example 2 In Example 1, the binder resin was a thermosetting resin (VAGH manufactured by Union Carbide Co., Ltd.) composed of a salt having a vinyl alcohol component or a vinyl-vinyl acetate copolymer, and a curing agent (manufactured by Nippon Polyurethane Co., Ltd.) Coronate EH)
And the weight ratio P / of the abrasive grains (P) and the binder resin (R)
A coating liquid was produced by changing R as shown in Table 5, and was thermally cured to produce a polishing tape having a single-layer coating film.

得られた塗膜表面の表面粗さを触針式表面粗さ計によ
り測定したところ表7の結果を得た。上記結果から配合
比の変動があっても、実質的に単層と見なし得る塗膜の
形成が可能である。実際、顕微鏡観察により粒子の重畳
は観察視野の中で認められなかった。配合比の変動は余
り臨界的ではなく、平均粒子径、粒度分布、単位面積あ
たりに塗布される粒子数などが重要と思われる。一般に
は樹脂が余り多いと砥粒がバインダー樹脂に埋まるの
で、単層の実現が難しく、バインダーが少な過ぎると、
砥粒のベースへの接着力が低下する。
When the surface roughness of the obtained coating film surface was measured by a stylus type surface roughness meter, the results shown in Table 7 were obtained. From the above results, it is possible to form a coating film which can be regarded as a substantially single layer even if the mixing ratio fluctuates. In fact, no superposition of particles was observed in the observation field by microscopic observation. Variations in the compounding ratio are not critical, and the average particle size, particle size distribution, the number of particles applied per unit area, and the like seem to be important. In general, if there is too much resin, the abrasive grains will be buried in the binder resin, so it is difficult to realize a single layer, and if there is too little binder,
The adhesive strength of the abrasive grains to the base decreases.

また、これらの研磨具を使用して研磨作業を行なった
ところ、表6の結果を得た。ただし、WA8000のものは、
従来の研磨具と特に変りがなかった。これは粉末の平均
粒径が小さ過ぎるためと思われる。この表から明らかな
ように、本発明の研磨具は非常に優れた研磨特性を有す
ることが分かる。
When the polishing operation was performed using these polishing tools, the results shown in Table 6 were obtained. However, for WA8000,
There was no particular difference from the conventional polishing tool. This is probably because the average particle size of the powder was too small. As is clear from this table, the polishing tool of the present invention has very excellent polishing characteristics.

(作用効果) 以上のように、本発明により次の作用効果が得られ
た。
(Operation and Effect) As described above, the following operation and effect were obtained by the present invention.

1)粒子が単層でしかも樹脂中に出来るだけ均一に立分
散した状態でポリエチレンテレフタレートフィルムの様
なベースに接着されている為研磨フィルムは砥粒径の粒
度分布、形状に応じた表面粗さを有し、被加工面形状の
制御が容易となる。
1) Since the particles are adhered to a base such as a polyethylene terephthalate film in a state where the particles are in a single layer and evenly dispersed in the resin as uniformly as possible, the abrasive film has a particle size distribution of abrasive particle diameter and a surface roughness corresponding to the shape. And the control of the shape of the work surface is facilitated.

2)粒子間の空隙がチップポケットとして作用する為目
づまりを防止し研磨寿命(耐久性)を向上させる。
2) Since voids between particles act as chip pockets, clogging is prevented and polishing life (durability) is improved.

3)研磨時の被研磨物との摩擦低減となる為(研磨フィ
ルムと被研磨物との接触面積が減少する為)研磨の仕上
り面は良好となり摩擦熱によるバインダー樹脂の融着等
も防止出来る。
3) Since the friction with the object to be polished during polishing is reduced (the contact area between the polishing film and the object to be polished is reduced), the finished surface of the polishing is good, and the fusion of the binder resin due to frictional heat can be prevented. .

4)粒子が単層でしかも出来るだけ独立、分散した状態
で存在している為、ダイヤモンド、CBN単結晶アルミナ
等の高価な砥粒に関しては特に経済的である。
4) Since the particles are present in a single layer and as independent and dispersed as possible, it is particularly economical for expensive abrasive grains such as diamond and CBN single crystal alumina.

【図面の簡単な説明】 第1図は本発明による研磨具の概要を示す平面図、第2
図はその断面図、第3図は本発明の実施例による研磨具
の表面状態を示す図、及び第4図は第3図の研磨具の表
面粗さの実測パターンである。
BRIEF DESCRIPTION OF THE DRAWINGS FIG. 1 is a plan view schematically showing a polishing tool according to the present invention, and FIG.
FIG. 3 is a cross-sectional view, FIG. 3 is a view showing a surface state of the polishing tool according to the embodiment of the present invention, and FIG. 4 is a measured pattern of the surface roughness of the polishing tool of FIG.

───────────────────────────────────────────────────── フロントページの続き (58)調査した分野(Int.Cl.6,DB名) B25D 11/00 G11B 5/84──────────────────────────────────────────────────続 き Continued on front page (58) Field surveyed (Int.Cl. 6 , DB name) B25D 11/00 G11B 5/84

Claims (4)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】研磨材粒子をバインダー樹脂中に研磨材粒
子とバインダー樹脂の配合重量比0.25対1〜2対1で分
散させたものをベース上に実質的に重畳しない粒子とし
て単層構造で接着してなる研磨層を形成させたことを特
徴とする磁気ディスクテクスチャリング用研磨具。
1. A single-layer structure in which abrasive particles are dispersed in a binder resin at a compounding weight ratio of the abrasive particles and the binder resin of 0.25: 1 to 2: 1 as particles which do not substantially overlap on the base. A polishing tool for magnetic disk texturing, wherein a polishing layer formed by bonding is formed.
【請求項2】バインダー樹脂は研磨材粒子層の平均粒子
径よりも薄い層を形成している前記第1項記載の磁気デ
ィスクテクスチャリング用研磨具。
2. The polishing tool for texturing a magnetic disk according to claim 1, wherein the binder resin forms a layer thinner than the average particle diameter of the abrasive particle layer.
【請求項3】研磨材粒子が、100個につき1個以下の重
畳粒子しか有しない前記第1項記載の磁気ディスクテク
スチャリング用研磨具。
3. The polishing tool for texturing a magnetic disk according to claim 1, wherein the abrasive particles have no more than one superposed particle per 100 particles.
【請求項4】ベースがフィルム、金属板、ガラス板、金
属箔、不織布より選択されるものである前記第1項また
は第2項記載の磁気ディスク用テクスチャリング研磨
具。
4. The texturing polishing tool for a magnetic disk according to claim 1, wherein the base is selected from a film, a metal plate, a glass plate, a metal foil, and a nonwoven fabric.
JP63058392A 1988-03-14 1988-03-14 Polishing tool Expired - Lifetime JP2826825B2 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP63058392A JP2826825B2 (en) 1988-03-14 1988-03-14 Polishing tool
US07/316,903 US4974373A (en) 1988-03-14 1989-02-28 Abrasive tools

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP63058392A JP2826825B2 (en) 1988-03-14 1988-03-14 Polishing tool

Publications (2)

Publication Number Publication Date
JPH01234169A JPH01234169A (en) 1989-09-19
JP2826825B2 true JP2826825B2 (en) 1998-11-18

Family

ID=13083076

Family Applications (1)

Application Number Title Priority Date Filing Date
JP63058392A Expired - Lifetime JP2826825B2 (en) 1988-03-14 1988-03-14 Polishing tool

Country Status (1)

Country Link
JP (1) JP2826825B2 (en)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01274966A (en) * 1988-04-28 1989-11-02 Tokyo Jiki Insatsu Kk Polishing device
JP3026988B2 (en) * 1990-02-05 2000-03-27 東京磁気印刷株式会社 Polishing tool
KR100366906B1 (en) * 1994-02-22 2003-02-11 니혼 미크로 코팅 가부시끼 가이샤 Abrasive Sheet and Method of Manufacturing Same
US5681361A (en) * 1996-01-11 1997-10-28 Minnesota Mining And Manufacturing Company Method of making an abrasive article and abrasive article produced thereby
JP3314154B2 (en) * 1998-01-26 2002-08-12 日本ミクロコーティング株式会社 Polishing sheet and method for producing the same
JP2012115957A (en) * 2010-12-02 2012-06-21 Nihon Micro Coating Co Ltd Abrasive sheet, and method for manufacturing the same

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57168869A (en) * 1981-04-02 1982-10-18 Kanai Hiroyuki Abrasive
JPS6294269A (en) * 1985-10-18 1987-04-30 Fuji Photo Film Co Ltd Abrasive tape
JPS62241671A (en) * 1986-04-14 1987-10-22 Fuji Photo Film Co Ltd Abrasive tape
JPH0753348B2 (en) * 1986-06-17 1995-06-07 松下電器産業株式会社 Polishing wheel for composite materials

Also Published As

Publication number Publication date
JPH01234169A (en) 1989-09-19

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