JP2775480B2 - Method of forming photovoltaic device - Google Patents

Method of forming photovoltaic device

Info

Publication number
JP2775480B2
JP2775480B2 JP1213955A JP21395589A JP2775480B2 JP 2775480 B2 JP2775480 B2 JP 2775480B2 JP 1213955 A JP1213955 A JP 1213955A JP 21395589 A JP21395589 A JP 21395589A JP 2775480 B2 JP2775480 B2 JP 2775480B2
Authority
JP
Japan
Prior art keywords
electrode layer
back electrode
layer
hole
forming
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP1213955A
Other languages
Japanese (ja)
Other versions
JPH0377381A (en
Inventor
信宏 奥田
総一 酒井
三千年 大西
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sanyo Denki Co Ltd
Original Assignee
Sanyo Denki Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sanyo Denki Co Ltd filed Critical Sanyo Denki Co Ltd
Priority to JP1213955A priority Critical patent/JP2775480B2/en
Publication of JPH0377381A publication Critical patent/JPH0377381A/en
Application granted granted Critical
Publication of JP2775480B2 publication Critical patent/JP2775480B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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Classifications

    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02EREDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00Energy generation through renewable energy sources
    • Y02E10/50Photovoltaic [PV] energy

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は、第1裏面電極層と、スルーホールを介して
透明電極層に接触した第2裏面電極層とから集電を行う
光起電力装置の形成方法に関する。
The present invention relates to a photovoltaic device that collects electricity from a first back electrode layer and a second back electrode layer that is in contact with a transparent electrode layer through a through hole. The present invention relates to a method for forming an apparatus.

〔従来の技術〕[Conventional technology]

従来、太陽電池等の光起電力装置は、ガラス等の透明
性絶縁基板上に酸化スズ〔SnO2〕やITOなどからなる透
明電極層が形成され、この透明電極層上に半導体接合形
成層,及びアルミニウム〔Al〕や銀〔Ag〕等からなる金
属電極が順次形成されて構成され、透明電極層及び金属
電極から集電,即ち外部に起電力を取り出すようになっ
ている。
Conventionally, a photovoltaic device such as a solar cell has a transparent electrode layer made of tin oxide [SnO 2 ], ITO, or the like formed on a transparent insulating substrate made of glass or the like. And a metal electrode made of aluminum [Al], silver [Ag], or the like, are sequentially formed, and current is collected from the transparent electrode layer and the metal electrode, that is, an electromotive force is extracted to the outside.

ところが、透明電極層は一般に導電率が低く、抵抗損
失が大きくなって集電効率の低下を招くため、光電変換
効率の向上を図る上で大きな問題となっている。
However, since the transparent electrode layer generally has a low conductivity and a large resistance loss, which leads to a decrease in current collection efficiency, this is a major problem in improving photoelectric conversion efficiency.

そこで従来、特開昭61-20371号公報(HO1L 31/04)に
記載のようないわゆるスルーホールコンタクト構造の光
起電力装置が考えられており、更にこれを集積型に拡張
したものも提案され、特に集積型では前記した集電効率
の低下防止のほかに、有効面積の増大を図る上でスルー
ホールコンタクト構造は有効であり、このスルーホール
コンタクト構造の集積型光起電力装置は例えば第2図に
示すように構成されている。
Therefore, a photovoltaic device having a so-called through-hole contact structure as described in Japanese Patent Application Laid-Open No. 61-20371 (HO1L 31/04) has been proposed, and a further extension of the photovoltaic device to an integrated type has been proposed. In particular, in the case of the integrated type, in addition to the above-described prevention of the reduction of the current collection efficiency, the through-hole contact structure is effective in increasing the effective area. It is configured as shown in the figure.

第2図において、1はガラス等の透光性絶縁基板、2
は基板1上に形成され所定パターンにパターニングされ
たSnO2,ITO等からなる透明電極層、3は透明電極層2上
及び露出した基板1上に形成された少なくとも1つのpn
接合或いはpin接合を有するアモルファスシリコン等か
らなる半導体接合形成層、4は第1裏面電極層であり、
Al又はAg等からなり、接合形成層3上に形成されてい
る。
In FIG. 2, reference numeral 1 denotes a light-transmitting insulating substrate such as glass;
Is a transparent electrode layer made of SnO 2 , ITO, etc., formed on the substrate 1 and patterned in a predetermined pattern, and 3 is at least one pn formed on the transparent electrode layer 2 and on the exposed substrate 1.
A semiconductor junction forming layer 4 made of amorphous silicon or the like having a junction or a pin junction, 4 is a first back electrode layer,
It is made of Al, Ag, or the like, and is formed on the bonding layer 3.

5はエッチング或いはレーザビームによるパターニン
グ等により形成され,第1裏面電極層4及び接合形成層
3を貫通し透明電極層2に達するスルーホール、6はエ
ッチング或いはレーザビームによるパターニング等によ
り形成され,第1裏面電極層4及び接合形成層3を貫通
し基板1に達するセル分離のための分離溝、7は絶縁層
であり、無機又は有機絶縁材料からなり、分離溝6内,
第1裏面電極層4上及びスルーホール5の周面に形成さ
れている。
Numeral 5 is formed by etching or patterning with a laser beam, and the like is formed through the first back electrode layer 4 and the junction forming layer 3 to reach the transparent electrode layer 2, and 6 is formed by etching or patterning with a laser beam. 1 Separation grooves for cell separation penetrating through the back electrode layer 4 and the junction forming layer 3 and reaching the substrate 1; 7 is an insulating layer made of an inorganic or organic insulating material;
It is formed on the first back electrode layer 4 and on the peripheral surface of the through hole 5.

このとき、スルーホール5内にも一様に絶縁層7が形
成されたのち、スルーホール5内の絶縁層7の一部がエ
ッチング或いはレーザビームによるパターニングにより
除去され、スルーホール5内ではスルーホール5の周面
にのみ絶縁層7が形成される。
At this time, after the insulating layer 7 is uniformly formed in the through hole 5, a part of the insulating layer 7 in the through hole 5 is removed by etching or patterning with a laser beam. The insulating layer 7 is formed only on the peripheral surface of the substrate 5.

また、透明電極層2の少なくとも一端の上側の絶縁層
7も同時に除去され、隣接セル間の接続のための接続溝
8が形成される。
Further, the insulating layer 7 on at least one end of the transparent electrode layer 2 is also removed at the same time, and a connection groove 8 for connecting between adjacent cells is formed.

さらに、第2図において、9は第2裏面電極層であ
り、Al又はAg又は導電ペースト等からなり、接続溝8
内,絶縁層7上及びスルーホール5内に形成されたの
ち、所定パターンにパターニングされる。
Further, in FIG. 2, reference numeral 9 denotes a second back electrode layer, which is made of Al, Ag, conductive paste, or the like.
After that, after being formed on the insulating layer 7 and in the through hole 5, it is patterned into a predetermined pattern.

このようにして形成されたスルーホールコンタクト構
造の集積型光起電力装置では、1つのセルについて見た
場合、第1裏面電極層4及び第2裏面電極層9から集電
されることになり、第2図からわかるように、接続溝8
内の第2裏面電極層9が隣接したセルの第1裏面電極層
4に接触し、各セルが直列接続されているため、初段の
セルの第1裏面電極層4又は第2裏面電極層9と、最終
段のセルの第2裏面電極層9又は第1裏面電極層4とか
ら集電される。
In the integrated photovoltaic device having the through-hole contact structure thus formed, when viewed from one cell, current is collected from the first back electrode layer 4 and the second back electrode layer 9, As can be seen from FIG.
Since the second back electrode layer 9 in the inside contacts the first back electrode layer 4 of the adjacent cell and each cell is connected in series, the first back electrode layer 4 or the second back electrode layer 9 of the first stage cell is formed. And the second back electrode layer 9 or the first back electrode layer 4 of the last stage cell.

〔発明が解決しようとする課題〕[Problems to be solved by the invention]

従来方法で形成されたスルーホールコンタクト構造の
集積型光起電力装置は、透明電極層と第2裏面電極層と
の接触抵抗が大きく、そのため、集電効率が悪く、光電
変換効率が低いという問題点がある。
The integrated photovoltaic device having the through-hole contact structure formed by the conventional method has a problem that the contact resistance between the transparent electrode layer and the second back electrode layer is large, and therefore, the current collection efficiency is low and the photoelectric conversion efficiency is low. There is a point.

これは、第2図に示したように、スルーホール5内の
透明電極層2の表面に付着絶縁層10が付着し、透明電極
層2と第2裏面電極層9との接触抵抗が増大するからで
ある。
This is because, as shown in FIG. 2, the adhesion insulating layer 10 adheres to the surface of the transparent electrode layer 2 in the through hole 5, and the contact resistance between the transparent electrode layer 2 and the second back electrode layer 9 increases. Because.

この付着絶縁層10はつぎのようなメカニズムで形成さ
れ付着すると考えられる。
It is considered that the adhesion insulating layer 10 is formed and adhered by the following mechanism.

まず、レーザビームによるパターニングによってスル
ーホール5の周面にのみ絶縁層7を形成する際に、スル
ーホール5内の絶縁層7の中央部分のみを完全に除去す
ることができず、スルーホール5内の透明電極層2の表
面に絶縁層7が残留し、その結果、付着絶縁層10が付着
する。
First, when the insulating layer 7 is formed only on the peripheral surface of the through hole 5 by patterning with a laser beam, only the central portion of the insulating layer 7 in the through hole 5 cannot be completely removed. The insulating layer 7 remains on the surface of the transparent electrode layer 2, and as a result, the adhered insulating layer 10 adheres.

また、絶縁層7に有機絶縁材料を使用した場合には、
エッチングによってスルーホール5の周面にのみ絶縁層
7を形成する際に、エッチング処理の過程において、ス
ルーホール5内の透明電極層2の表面に付着絶縁層10が
付着する。
When an organic insulating material is used for the insulating layer 7,
When the insulating layer 7 is formed only on the peripheral surface of the through hole 5 by etching, the adhesive insulating layer 10 adheres to the surface of the transparent electrode layer 2 in the through hole 5 during the etching process.

そして、この付着絶縁層10はせいぜい1000Å程度の非
常に薄いものであるが、この付着絶縁層10によってスル
ーホール5内の透明電極層2と第2裏面電極層9との接
触抵抗が大きくなり、両層2,9の電気的な接続不良を招
き、発生起電力を効率よく外部に取り出すことができな
くなる。
The adhesion insulating layer 10 is very thin, at most about 1000 °, but the adhesion insulation layer 10 increases the contact resistance between the transparent electrode layer 2 in the through hole 5 and the second back electrode layer 9, This causes a poor electrical connection between the two layers 2 and 9, and the generated electromotive force cannot be efficiently extracted to the outside.

なお、この問題は集積型に限らず、スルーホールコン
タクト構造の光起電力装置においても同様に生じる。
This problem occurs not only in the integrated type but also in a photovoltaic device having a through-hole contact structure.

本発明は、前記の点に留意してなされ、いわゆるスル
ーホールコンタクト構造の光起電力装置の集電用電極層
の接続不良を簡単な手法で改善し、光電変換効率の向上
を図れるようにすることを目的とする。
The present invention has been made in consideration of the above points, and is intended to improve the connection failure of a current collecting electrode layer of a photovoltaic device having a so-called through-hole contact structure by a simple method, and to improve photoelectric conversion efficiency. The purpose is to:

〔課題を解決するための手段〕[Means for solving the problem]

前記目的を達成するために、透光性絶縁基板上に透明
電極層,半導体接合形成層及び第1裏面電極層を積層形
成し、 前記第1裏面電極層及び前記半導体接合形成層を貫通
し前記透明電極層に達するスルーホールを形成し、 前記第1裏面電極層上及び前記スルーホールの周面に
絶縁層を形成し、 前記絶縁層上及び前記スルーホール内に第2裏面電極
層を形成する光起電力装置の形成方法において、本発明
は、 前記第2裏面電極層を形成した後に、針による加圧に
より前記スルーホール内の前記透明電極層表面に付着し
た付着絶縁層を除去し、前記第2裏面電極層と前記透明
電極層とを接続することを特徴としている。
In order to achieve the above object, a transparent electrode layer, a semiconductor junction formation layer, and a first back electrode layer are formed on a light-transmitting insulating substrate in a stacked manner, and the transparent electrode layer, the semiconductor junction formation layer, and the semiconductor junction formation layer penetrate through the first back electrode layer and the semiconductor junction formation layer. Forming a through hole reaching the transparent electrode layer; forming an insulating layer on the first back electrode layer and on a peripheral surface of the through hole; forming a second back electrode layer on the insulating layer and in the through hole. In the method for forming a photovoltaic device, the present invention is configured such that, after forming the second back electrode layer, removing the adhered insulating layer adhered to the surface of the transparent electrode layer in the through hole by pressing with a needle, It is characterized in that a second back electrode layer is connected to the transparent electrode layer.

〔作用〕[Action]

したがって、スルーホール内の透明電極層表面に付着
した付着絶縁層が、第2裏面電極層の形成後、針により
加圧する簡単な手法で除去され、スルーホール内の透明
電極層と第2裏面電極層との電気的接続が簡単な手法で
改善され、集電効率が向上して光起電力装置の光電変換
効率の向上が図られる。
Therefore, the adhered insulating layer adhered to the surface of the transparent electrode layer in the through hole is removed by a simple method of pressing with a needle after the formation of the second back electrode layer, and the transparent electrode layer in the through hole and the second back electrode are removed. The electrical connection with the layer is improved by a simple method, the current collection efficiency is improved, and the photoelectric conversion efficiency of the photovoltaic device is improved.

〔実施例〕〔Example〕

1実施例について第1図を参照して説明する。 One embodiment will be described with reference to FIG.

第1図は最終的に得られる光起電力装置の断面図であ
り、第2図と同一記号は同一もしくは相当するものを示
す。
FIG. 1 is a sectional view of a photovoltaic device finally obtained, and the same symbols as those in FIG. 2 indicate the same or corresponding components.

そして、第1図の装置は、第2図の従来方法の装置の
場合と同様の工程を経て基板1上に第2裏面電極層9ま
でが形成され、このとき、スルーホール5内に従来と同
じように付着絶縁層10が残存したままとなる。
In the apparatus of FIG. 1, through the same steps as those of the apparatus of the conventional method of FIG. 2, up to the second back electrode layer 9 is formed on the substrate 1, and at this time, Similarly, the adhesion insulating layer 10 remains.

そこで、第2裏面電極層9の形成後、第2裏面電極層
9のスルーホール5の上側を極細の針によって加圧し、
この加圧により、図1に示すように付着絶縁層10を破砕
して除去し、第2裏面電極層9と透明電極層2とを電気
的に接続する。
Therefore, after the formation of the second back electrode layer 9, the upper side of the through hole 5 of the second back electrode layer 9 is pressed with a very fine needle,
By this pressing, the adhered insulating layer 10 is crushed and removed as shown in FIG. 1, and the second back electrode layer 9 and the transparent electrode layer 2 are electrically connected.

そして、スルーホール5内の付着絶縁層10を除去する
ことにより、得られた光起電力装置の曲線因子が大幅に
改善され、従来のものと比較すると、出力が向上する。
Then, by removing the adhered insulating layer 10 in the through hole 5, the fill factor of the obtained photovoltaic device is largely improved, and the output is improved as compared with the conventional one.

なお、加圧前にスルーホール5内の透明電極層2及び
第2裏面電極層9との間の接触抵抗が無限大であったも
のが、前記の加圧・除去によって激減することは実験的
にも確かめられた。
Although the contact resistance between the transparent electrode layer 2 and the second back electrode layer 9 in the through-hole 5 before pressurization was infinite, it is experimentally found that the contact resistance between the transparent electrode layer 2 and the second back electrode layer 9 is infinitely reduced by the above-described pressurization and removal. Was also confirmed.

ところで、前記実施例では集積型光起電力装置に適用
した場合について説明したが、単一セル型のスルーホー
ルコンタクト構造のものにおいても、本発明を同様に実
施することができる。
By the way, in the above embodiment, the case where the present invention is applied to an integrated photovoltaic device is described. However, the present invention can be similarly applied to a single-cell type through-hole contact structure.

〔発明の効果〕〔The invention's effect〕

本発明は、以上説明したように構成されているため、
以下に記載する効果を奏する。
Since the present invention is configured as described above,
The following effects are obtained.

第2裏面電極層の形成後に、針により加圧する簡単な
手法でスルーホール内の透明電極層表面に付着した付着
絶縁層を除去し、スルーホール内の透明電極層と第2裏
面電極層との接触抵抗増大の原因を排除したため、スル
ーホール内の透明電極層と第2裏面電極層とを簡単な手
法で電気的に良好に接続して集電効率を改善し、光電変
換効率を向上することができ、光起電力装置の特性向上
を図ることができる。
After the formation of the second back electrode layer, the adhered insulating layer adhered to the surface of the transparent electrode layer in the through hole is removed by a simple method of pressing with a needle, and the transparent electrode layer in the through hole and the second back electrode layer are separated. Because the cause of the increase in contact resistance has been eliminated, the transparent electrode layer in the through hole and the second backside electrode layer are electrically connected well by a simple method to improve current collection efficiency and improve photoelectric conversion efficiency. Thus, the characteristics of the photovoltaic device can be improved.

【図面の簡単な説明】[Brief description of the drawings]

第1図は本発明の1実施例の断面図、第2図は従来例の
断面図である。 1……透光性絶縁基板、2……透明電極層、3……半導
体接合形成層、4……第1裏面電極層、5……スルーホ
ール、7……絶縁層、9……第2裏面電極層、10……付
着絶縁層。
FIG. 1 is a sectional view of one embodiment of the present invention, and FIG. 2 is a sectional view of a conventional example. DESCRIPTION OF SYMBOLS 1 ... Transmissive insulating substrate, 2 ... Transparent electrode layer, 3 ... Semiconductor junction formation layer, 4 ... First back electrode layer, 5 ... Through hole, 7 ... Insulating layer, 9 ... Second Back electrode layer, 10 ... Adhesive insulating layer.

フロントページの続き (56)参考文献 特開 昭60−149178(JP,A) 特開 昭62−11280(JP,A) 特開 昭61−6828(JP,A) 特開 昭61−20371(JP,A) 特開 昭61−284974(JP,A) (58)調査した分野(Int.Cl.6,DB名) H01L 31/04Continuation of the front page (56) References JP-A-60-149178 (JP, A) JP-A-62-11280 (JP, A) JP-A-61-6828 (JP, A) JP-A-61-20371 (JP, A) , A) JP-A-61-284974 (JP, A) (58) Fields investigated (Int. Cl. 6 , DB name) H01L 31/04

Claims (1)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】透光性絶縁基板上に透明電極層,半導体接
合形成層及び第1裏面電極層を積層形成し、 前記第1裏面電極層及び前記半導体接合形成層を貫通し
前記透明電極層に達するスルーホールを形成し、 前記第1裏面電極層上及び前記スルーホールの周面に絶
縁層を形成し、 前記絶縁層上及び前記スルーホール内に第2裏面電極層
を形成する光起電力装置の形成方法において、 前記第2裏面電極層を形成した後に、針による加圧によ
り前記スルーホール内の前記透明電極層表面に付着した
付着絶縁層を除去し、前記第2裏面電極層と前記透明電
極層とを接続することを特徴とする光起電力装置の形成
方法。
1. A transparent electrode layer, a semiconductor junction forming layer and a first back electrode layer are formed on a light-transmitting insulating substrate in a laminated manner, and the transparent electrode layer penetrates the first back electrode layer and the semiconductor junction forming layer. Forming a through hole reaching the first back electrode layer, and forming an insulating layer on the first back electrode layer and the peripheral surface of the through hole; and forming a second back electrode layer on the insulating layer and in the through hole. In the method for forming a device, after forming the second back electrode layer, the adhesion insulating layer attached to the surface of the transparent electrode layer in the through hole is removed by pressing with a needle, and the second back electrode layer and the second back electrode layer are formed. A method for forming a photovoltaic device, comprising: connecting a transparent electrode layer.
JP1213955A 1989-08-19 1989-08-19 Method of forming photovoltaic device Expired - Fee Related JP2775480B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1213955A JP2775480B2 (en) 1989-08-19 1989-08-19 Method of forming photovoltaic device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1213955A JP2775480B2 (en) 1989-08-19 1989-08-19 Method of forming photovoltaic device

Publications (2)

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JPH0377381A JPH0377381A (en) 1991-04-02
JP2775480B2 true JP2775480B2 (en) 1998-07-16

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JP1213955A Expired - Fee Related JP2775480B2 (en) 1989-08-19 1989-08-19 Method of forming photovoltaic device

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Publication number Priority date Publication date Assignee Title
JPS60149178A (en) * 1984-01-13 1985-08-06 Fuji Electric Corp Res & Dev Ltd Solar cell
JPS6211280A (en) * 1985-07-09 1987-01-20 Tdk Corp Solar battery and manufacture of the same

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