JP2752671B2 - Lead contact - Google Patents

Lead contact

Info

Publication number
JP2752671B2
JP2752671B2 JP63303147A JP30314788A JP2752671B2 JP 2752671 B2 JP2752671 B2 JP 2752671B2 JP 63303147 A JP63303147 A JP 63303147A JP 30314788 A JP30314788 A JP 30314788A JP 2752671 B2 JP2752671 B2 JP 2752671B2
Authority
JP
Japan
Prior art keywords
contact
lead
shaft
contact portion
case
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP63303147A
Other languages
Japanese (ja)
Other versions
JPH02147871A (en
Inventor
俊弘 藤下
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Kyushu Ltd
Original Assignee
NEC Kyushu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Kyushu Ltd filed Critical NEC Kyushu Ltd
Priority to JP63303147A priority Critical patent/JP2752671B2/en
Publication of JPH02147871A publication Critical patent/JPH02147871A/en
Application granted granted Critical
Publication of JP2752671B2 publication Critical patent/JP2752671B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Connections Arranged To Contact A Plurality Of Conductors (AREA)

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明はリード接触子に関し、特にICの電気的特性試
験を行うコンタクタ内のリード接触子に関する。
Description: BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a lead contact, and more particularly, to a lead contact in a contactor for performing an electrical characteristic test of an IC.

〔従来の技術〕[Conventional technology]

従来、この種のリード接触子は、第4図に示すよう
に、先端にIC(図示せず)のリードと接触する接触部2
を有する軸1bと、軸1bが収納され接触部2を押下したと
き軸1bが内壁面に沿って内部に押込まれるケース3bと、
ケース3bの内部に収納され軸1bが押込まれたとき軸1b
ケース3bの外へ押上げるばね4とを含んで構成されてい
た。
Conventionally, as shown in FIG. 4, this type of lead contact has a contact portion 2 at its tip which contacts a lead of an IC (not shown).
A shaft 1 b having a Murrell casing 3 b pushed inside along the inner wall surface shaft 1 b is when the shaft 1 b presses the stored contact portion 2,
Case 3 Axis 1 b housed inside the b has been configured to include a shaft pushed Gerubane 4 1 b to the outside of the case 3 b when was pushed.

このようなリード接触子を用いたコンタクタ(図示せ
ず)に測定すべきICを挿入すると、ICのリードの先端は
軸1bの先端の接触部2に圧接するようになる。
When inserting such IC to be measured to the lead contacts the contactor used (not shown), the tip of the IC leads become pressed against the contact portion 2 of the end of the shaft 1 b.

〔発明が解決しようとする課題〕[Problems to be solved by the invention]

上述した従来のリード接触子は、接触部がICのリード
と接触するときリードの先端部が接触部の上面と点接触
になるので、電気的特性試験を行う場合接触不良を発生
するという欠点がある。
The conventional lead contact described above has the disadvantage that when the contact part comes into contact with the lead of the IC, the tip of the lead makes point contact with the upper surface of the contact part. is there.

〔課題を解決するための手段〕[Means for solving the problem]

本発明のリード接触子は、先端にICのリードとの接触
部を有する軸と、該軸が収納され前記接触部を押下した
とき内壁面に沿って前記軸が押込まれるケースと、前記
接触部の押下に連動して前記リードを挟んで前記リード
に圧接する接触片と、前記ケース内に収納され前記軸が
押込まれたとき前記軸を外方へ押上げるばねとを含んで
構成される。
A lead contactor according to the present invention includes a shaft having a contact portion with an IC lead at a tip thereof, a case in which the shaft is housed and the shaft is pushed along an inner wall surface when the contact portion is pressed, and A contact piece that presses against the lead with the lead interlocked with the pressing of the portion, and a spring that is housed in the case and pushes the shaft outward when the shaft is pushed in. .

〔実施例〕〔Example〕

次に、本発明について図面を参照して説明する。 Next, the present invention will be described with reference to the drawings.

第1図は本発明の一実施例の断面図である。 FIG. 1 is a sectional view of one embodiment of the present invention.

第1図に示すように、先端に接触部2を有する軸1
と、軸1が収納され接触部2の押下により軸1が内壁面
に沿って押込まれる一端が開口し他端が密閉された中空
円筒状のケース3と、ケース3の内部に収納され軸1が
押込まれたとき軸1をケース3の開口方向へ押上げるば
ね4と、ケース3の開口側の先端に設けられ接触部2の
押下に連動して先端が内側に傾き挿入されたICのリード
を挟んで押圧する弾性材の接触片5と、接触部2がばね
4で初期位置に戻ったとき接触片5を初期状態に戻すケ
ース3内に収納されたばね6とを含む。
As shown in FIG. 1, a shaft 1 having a contact portion 2 at the tip end
And a hollow cylindrical case 3 in which one end is opened and the other end is closed, and the shaft 1 is housed inside the case 3 and the shaft 1 is housed and the contact portion 2 is pushed down to push the shaft 1 along the inner wall surface. A spring 4 for pushing the shaft 1 in the direction of opening of the case 3 when the member 1 is pushed in, and an IC provided at the tip of the case 3 on the opening side and having the tip inclined inward in conjunction with the depression of the contact portion 2 and inserted. The spring includes a contact piece made of an elastic material for pressing the lead therebetween and a spring housed in a case returning the contact piece to an initial state when the contact portion returns to an initial position by the spring.

すなわち、軸1の先端の接触部2の外周に接触片5が
設けられていて、図示しないICのリードで接触部2が押
下され、従って、軸1がケース3内に押込まれたとき、
接触部2の下面が接触片5の底面を押すことにより、接
触片5の先端部が内側へ傾きリードを挟むようにしてリ
ードに圧接する。ばね6は接触片5の復帰用であり、
又、ばね4は軸1の復帰用である。
That is, the contact piece 5 is provided on the outer periphery of the contact portion 2 at the tip of the shaft 1, and when the contact portion 2 is pressed by the lead of the IC (not shown), and when the shaft 1 is pushed into the case 3,
When the lower surface of the contact portion 2 presses the bottom surface of the contact piece 5, the tip of the contact piece 5 tilts inward and presses against the lead so as to sandwich the lead. The spring 6 is for returning the contact piece 5,
The spring 4 is for returning the shaft 1.

第2図は第1図の実施例を用いたコンタクタの断面図
である。
FIG. 2 is a sectional view of a contactor using the embodiment of FIG.

第2図において、リード接触子10はコンタクタ11内に
内蔵される。IC12は上部から下方へ押下げられIC12のリ
ードが各々のリード接触子10の中へ挿入され接触をと
る。
In FIG. 2, a lead contact 10 is built in a contactor 11. The IC 12 is pushed down from above and the leads of the IC 12 are inserted into each lead contact 10 to make contact.

第3図は本発明の第2の実施例の断面図である。 FIG. 3 is a sectional view of a second embodiment of the present invention.

第3図に示すように、第2の実施例ではケース3aの先
端部に弾性材の接触片5aを形成し、軸1aの先端の接触部
2がケース3aの接触片5aを外方へ押広げている。
Third, as shown in figure, in the second embodiment the contact piece 5 a of the elastic member is formed at the tip portion of the casing 3 a, the axis 1 a of the tip contact piece 5 a of the contact portion 2 cases 3 a of Is spreading outward.

ICのリードが接触部2を押下げ軸1aがケース3a内に押
込まれたとき、接触部2がなくなるため接触片5aが弾性
で内側に閉まり、リードを挟んでリードに圧接する。
When IC leads pressing axis 1 a of the contact portion 2 is pushed into the case 3 a, the contact piece 5 a the contact portion 2 is eliminated is closed inwardly by resilient and pressure contact with the leading sides of the lead.

第2の実施例では、ケース3aと接触片5aとが一体とな
っているため、より確実な接触性を得ることができると
ともに、構造が簡単になる利点がある。
In the second embodiment, since the case 3a and the contact piece 5a are integrated, there is an advantage that more reliable contact can be obtained and the structure is simplified.

〔発明の効果〕〔The invention's effect〕

以上説明したように本発明は、ICのリードが接触部を
押下げることにより、先端の接触片がリードを挟んで圧
接するので、確実な接触性を得ることができ、従って、
良好な電気的特性試験ができる効果がある。
As described above, according to the present invention, when the lead of the IC presses down the contact portion, the contact piece at the tip presses against the lead, so that reliable contact can be obtained.
There is an effect that a good electrical characteristic test can be performed.

【図面の簡単な説明】[Brief description of the drawings]

第1図は本発明の第1の実施図の断面図、第2図は第1
図の第1の実施例を用いたコンタクタの断面図、第3図
は本発明の第2の実施例の断面図、第4図は従来のリー
ド接触子の一例の断面図である。 1,1a,1b…軸、3…接触部、3,3a,3b…ケース、4…ば
ね、5,5a…接触片、6…ばね。
FIG. 1 is a sectional view of the first embodiment of the present invention, and FIG.
FIG. 3 is a sectional view of a contactor using the first embodiment, FIG. 3 is a sectional view of a second embodiment of the present invention, and FIG. 4 is a sectional view of an example of a conventional lead contact. 1, 1 a, 1 b ... shaft, 3 ... contact portion, 3,3 a, 3 b ... case, 4 ... spring, 5,5 a ... contact piece, 6 ... spring.

Claims (1)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】先端にICのリードとの接触部を有する軸
と、該軸が収納され前記接触部を押下したとき内壁面に
沿って前記軸が押込まれるケースと、前記接触部の押下
に連動して前記リードを挟んで前記リードに圧接する接
触片と、前記ケース内に収納され前記軸が押込まれたと
き前記軸を外方へ押上げるばねとを含むことを特徴とす
るリード接触子。
1. A shaft having a contact portion with an IC lead at a tip, a case in which the shaft is housed and the shaft is pushed along an inner wall surface when the contact portion is pushed, and a push of the contact portion. A contact piece that presses against the lead with the lead interposed therebetween, and a spring that is housed in the case and pushes the shaft outward when the shaft is pushed in, the lead contact comprising: Child.
JP63303147A 1988-11-29 1988-11-29 Lead contact Expired - Fee Related JP2752671B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP63303147A JP2752671B2 (en) 1988-11-29 1988-11-29 Lead contact

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP63303147A JP2752671B2 (en) 1988-11-29 1988-11-29 Lead contact

Publications (2)

Publication Number Publication Date
JPH02147871A JPH02147871A (en) 1990-06-06
JP2752671B2 true JP2752671B2 (en) 1998-05-18

Family

ID=17917450

Family Applications (1)

Application Number Title Priority Date Filing Date
JP63303147A Expired - Fee Related JP2752671B2 (en) 1988-11-29 1988-11-29 Lead contact

Country Status (1)

Country Link
JP (1) JP2752671B2 (en)

Also Published As

Publication number Publication date
JPH02147871A (en) 1990-06-06

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