JP2720099B2 - Adhesion measuring device - Google Patents
Adhesion measuring deviceInfo
- Publication number
- JP2720099B2 JP2720099B2 JP18283190A JP18283190A JP2720099B2 JP 2720099 B2 JP2720099 B2 JP 2720099B2 JP 18283190 A JP18283190 A JP 18283190A JP 18283190 A JP18283190 A JP 18283190A JP 2720099 B2 JP2720099 B2 JP 2720099B2
- Authority
- JP
- Japan
- Prior art keywords
- lower sample
- sample
- measuring device
- cam
- adhesive force
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Landscapes
- Force Measurement Appropriate To Specific Purposes (AREA)
- Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
Description
【発明の詳細な説明】 〔産業上の利用分野〕 本発明は粘着力測定装置、特に粘着力測定装置の下部
試料支持体に関する。Description: FIELD OF THE INVENTION The present invention relates to an adhesive force measuring device, and particularly to a lower sample support of the adhesive force measuring device.
一般に、ゴム、ゴム状弾性シート又は粘着テープ等の
粘着力を有する試料の粘着力を測定する場合には、二つ
の試料を一定荷重で互いに接触させ、これを剥離するの
に必要な力を測定することにより行われている。Generally, when measuring the adhesive strength of a sample having adhesive strength, such as rubber, a rubber-like elastic sheet, or an adhesive tape, two samples are brought into contact with each other with a constant load, and the force required to separate the two is measured. It is done by doing.
このような圧着剥離型の粘着力測定装置としては、金
属製の円板の周囲に巻きつけた上部試料を支持板上に固
定された下部試料に一定の荷重で接触させ、しかる後
に、金属円板を引き上げて両試料の剥離する力を測定す
ることにより粘着力を測定する所謂ピックアップ型の粘
着力測定装置がある。As such a pressure-bonding-type adhesive force measuring device, an upper sample wrapped around a metal disk is brought into contact with a lower sample fixed on a support plate with a constant load, and then a metal circle is formed. There is a so-called pick-up type adhesive force measuring device that measures the adhesive force by pulling up the plate and measuring the peeling force of both samples.
ところで、上下両試料は、測定の都度、その位置をず
らして新規な面同志を圧着させる必要がある。しかし、
従来の粘着力測定装置は、下部試料を固定する下部試料
支持体が粘着力測定装置自体に固定されているため、測
定毎に粘着力測定装置全体を傾けて下部試料をスライド
させなければならない。By the way, it is necessary to shift the positions of the upper and lower samples each time a new surface is pressed by compression each time measurement is performed. But,
In the conventional adhesive force measuring device, since the lower sample support for fixing the lower sample is fixed to the adhesive force measuring device itself, the lower sample must be slid by tilting the entire adhesive force measuring device every measurement.
従って、従来の粘着力測定装置は、下部試料をスライ
ドさせる操作が非常に面倒であるばかりでなく、下部試
料支持体に固定した下部試料を剥離する時に多大な労力
を必要とした。Therefore, in the conventional adhesive force measuring device, not only is the operation of sliding the lower sample very troublesome, but also a great deal of labor is required when the lower sample fixed to the lower sample support is peeled off.
本発明の目的は、下部試料をスライドさせる際に、下
部試料支持体に固着した下部試料を非常に小さい力で簡
単に剥離できると共に、装置全体を傾斜させる必要のな
い非常に操作性の良好な粘着力測定装置を提供すること
にある。An object of the present invention is to provide a low-slidable sample that can be easily peeled off with a very small force when the lower sample is slid, and has excellent operability without having to tilt the entire apparatus. An object of the present invention is to provide an adhesion measuring device.
すなわち、本発明の粘着力測定装置は、円板に巻き付
けられた上部試料を下部試料に一定荷重で圧着させた
後、前記上部試料を引き上げて両試料間の剥離力を測定
するようにした粘着力測定装置において、前記下部試料
を固定する下部試料押さえ部を枠部に起伏自在に取り付
けると共に、該下部試料押さえ部に対して下部試料押さ
え部固定用の押圧部と下部試料押さえ部引起し用の頭部
とを有するカムを配設し、かつ該カムのカム軸にレバー
を固定したことを特徴とするものである。That is, the adhesive force measuring device of the present invention is such that the upper sample wound on the disk is pressed against the lower sample with a constant load, and then the upper sample is pulled up to measure the peeling force between the two samples. In the force measuring device, a lower sample holding portion for fixing the lower sample is movably mounted on the frame portion, and a pressing portion for fixing the lower sample holding portion and a lower sample holding portion for raising the lower sample holding portion relative to the lower sample holding portion. And a cam having a head and a lever fixed to a cam shaft of the cam.
以下、図面により本発明の実施例について説明する。 Hereinafter, embodiments of the present invention will be described with reference to the drawings.
第１図において、１は粘着力測定装置、２は既知の測
定装置本体が内蔵されている粘着力測定装置の枠部であ
り、その正面側は操作面３になっている。操作面３に
は、電源が投入されている間だけ点灯する表示灯付き電
源スイッチ４、上部試料昇降操作ボタン5,6、圧着時間
を設定する設定ツマミ７、粘着力表示器８、粘着力表示
器リセットボタン９がそれぞれ配設されている。前記粘
着力表示器８は、目盛板を用いたメーターのようなアナ
ログ表示器であってもよいが、数字表示器のようなデジ
タル表示器を用いると、信号処理回路が簡単になり、好
適である。In FIG. 1, reference numeral 1 denotes an adhesive force measuring device, 2 denotes a frame portion of the adhesive force measuring device in which a known measuring device main body is incorporated, and a front surface thereof is an operation surface 3. The operation surface 3 includes a power switch 4 with an indicator light that is lit only while the power is turned on, upper sample raising / lowering operation buttons 5 and 6, a setting knob 7 for setting a crimping time, an adhesive force display 8, an adhesive force display. The container reset buttons 9 are provided respectively. The adhesive force indicator 8 may be an analog indicator such as a meter using a scale plate. However, if a digital indicator such as a numeric indicator is used, the signal processing circuit is simplified, which is preferable. is there.
粘着力表示器８に連結している可動軸11の下部には、
上部試料支持体10が着脱自在に取り付けられている。こ
の上部試料支持体10の主要部である金属製の円板12の周
囲には、リボン状の上部試料Ｓが装着されている。この
上部試料支持体10上には、必要に応じて重錘13が取り付
けられる。Below the movable shaft 11 connected to the adhesive force indicator 8,
An upper sample support 10 is detachably attached. A ribbon-shaped upper sample S is mounted around a metal disk 12 which is a main part of the upper sample support 10. A weight 13 is mounted on the upper sample support 10 as needed.
この上部試料支持体10の下方には、下部試料支持体20
が配置されている。この下部試料支持体20は、下部試料
Ｓ′を固定する下部試料押さえ部15と、下部試料押さえ
部15を起伏させるカム16と、カム16を回動させるレバー
17とから構成されている。第３図に示すように、下部試
料押さえ部15は、下部試料Ｓ′を押さえる押さえ枠18
と、横断面コ字状の支持部19とから構成されている。こ
の下部試料押さえ部15は、支持部19の下部後端部に取り
付けた支持軸21を介して前述した枠体２の下部フレーム
22に起伏自在に取り付けられている。Below the upper sample support 10 is a lower sample support 20.
Is arranged. The lower sample support 20 includes a lower sample holder 15 for fixing the lower sample S ′, a cam 16 for raising and lowering the lower sample holder 15, and a lever for rotating the cam 16.
It consists of seventeen. As shown in FIG. 3, the lower sample holding section 15 has a holding frame 18 for holding the lower sample S '.
And a support portion 19 having a U-shaped cross section. The lower sample holding section 15 is connected to a lower frame of the frame 2 through a support shaft 21 attached to a lower rear end of the support section 19.
It is attached to 22 up and down freely.
下部試料押さえ部の支持部19を形成する下板23と、上
板24と、立板25とによって囲まれた空間26内には、横断
面五角形のカム16が配設されている。このカム16は、第
１図及び第２図に示すように、カム軸27を介して下部フ
レーム22上に固定された軸固体枠28に回転自在に取り付
けられている。A cam 16 having a pentagonal cross section is provided in a space 26 surrounded by a lower plate 23, a upper plate 24, and an upright plate 25 which form the support 19 of the lower sample holding unit. As shown in FIGS. 1 and 2, the cam 16 is rotatably mounted on a solid shaft frame 28 fixed on the lower frame 22 via a cam shaft 27.
前記カム16は、三角形の頭部29と四角形の押圧部30か
ら構成されている。この押圧部30によって下部試料押さ
え部15を押さえ、頭部29によって下部試料押さえ部15を
反時計方向に引き起こすようになっている。The cam 16 includes a triangular head 29 and a quadrangular pressing portion 30. The pressing portion 30 presses the lower sample holding portion 15, and the head 29 raises the lower sample holding portion 15 in a counterclockwise direction.
さらに、第１図に示すように、カム軸27の一端には、
レバー17が固定されている。このレバー17は、第３図に
示すように、カム16の頭部29の方向と同方向に取り付け
られている。Further, as shown in FIG. 1, at one end of the cam shaft 27,
The lever 17 is fixed. The lever 17 is mounted in the same direction as the direction of the head 29 of the cam 16 as shown in FIG.
前述した下部試料押さえ部の押さえ枠18は上部試料支
持体10を導入する窓31を有している。The holding frame 18 of the lower sample holding section described above has a window 31 into which the upper sample support 10 is introduced.
第１図に示すように、前記下部フレーム22には、調節
ねじ32が取り付けられており、粘着力測定装置１を水平
に保持するようになっている。また、支持板33にも水平
調節ネジ34を設け、支持板33を水平に調整できるように
なっている。As shown in FIG. 1, an adjusting screw 32 is attached to the lower frame 22 so that the adhesive force measuring device 1 is held horizontally. The support plate 33 is also provided with a horizontal adjustment screw 34 so that the support plate 33 can be adjusted horizontally.
上下二つの試料S,S′の粘着力は、第１図に示すよう
に、測定装置本体の可動軸11に上部試料支持体10を装着
すると共に、下部試料支持体20によってシート状の下部
試料Ｓ′を支持体33上に固定し、しかる後に、上部試料
支持体10の円板12に取り付けられた上部試料Ｓを支持板
33上に固定された下部試料Ｓ′に一定荷重で圧着させた
後、上記上部試料Ｓを引き上げて両試料間の剥離力を粘
着力表示器８によって測定することにより行われる。As shown in FIG. 1, the adhesive force of the upper and lower two samples S and S ′ is determined by attaching the upper sample support 10 to the movable shaft 11 of the main body of the measuring apparatus and lowering the sheet sample by the lower sample support 20. S 'is fixed on the support 33, and thereafter, the upper sample S attached to the disk 12 of the upper sample support 10 is fixed to the support plate.
After pressing the lower sample S 'fixed on 33 with a certain load, the upper sample S is pulled up, and the peeling force between the two samples is measured by the adhesive force indicator 8.
測定終了後、第４図に示すように、下部試料Ｓ′を矢
印Ａのように押さえ、しかる後に、レバー17を矢印Ｂの
ように反時計方向に回動させると、カム16の頭部29が下
部試料押さえ部15の上板24に接触し、支持軸21を支点に
して下部試料押さえ部15全体が反時計方向に回動する。
このとき、下部試料押さえ部15はカム16を使ったテコの
原理により非常に小さい力で回動させることができる。
そして、下部試料押さえ部15が回動することにより下部
試料押さえ部15から下部試料Ｓ′が簡単に剥離する。After the measurement is completed, as shown in FIG. 4, the lower sample S 'is pressed as shown by an arrow A, and then the lever 17 is rotated counterclockwise as shown by an arrow B. Comes into contact with the upper plate 24 of the lower sample holding portion 15, and the entire lower sample holding portion 15 rotates counterclockwise around the support shaft 21 as a fulcrum.
At this time, the lower sample holding portion 15 can be rotated with a very small force by the lever principle using the cam 16.
Then, the lower sample holding section 15 rotates, whereby the lower sample S ′ is easily peeled off from the lower sample holding section 15.
上記のように、本発明は、上部試料を下部試料に一定
荷重で圧着させた後、上部試料を引き上げて両試料間の
剥離力を測定するようにした粘着力測定装置において、
前記下部試料を固定する下部試料押さえ部を枠部に起伏
自在に取り付けると共に、該下部試料押さえ部に対して
下部試料押さえ部固定用の押圧部と下部試料押さえ部引
起し用の頭部とを有するカムを配設し、かつ該カムのカ
ム軸にレバーを固定したので、下部試料支持体に固着し
た下部試料をカムを使ったテコの原理によって非常に小
さい力で簡単に剥離できるようになった。従って、多大
な労力を要することなく、効率的に粘着力を測定できる
ようになった。As described above, the present invention relates to an adhesive force measuring device in which an upper sample is pressed against a lower sample with a constant load, and then the upper sample is pulled up to measure the peeling force between the two samples.
A lower sample holding portion for fixing the lower sample is attached to the frame portion so as to be able to undulate, and a pressing portion for fixing the lower sample holding portion and a head for raising the lower sample holding portion are provided with respect to the lower sample holding portion. Since the cam has a cam and the lever is fixed to the cam shaft of the cam, the lower sample fixed to the lower sample support can be easily peeled off with a very small force by the leverage principle using the cam. Was. Therefore, the adhesive force can be measured efficiently without requiring much labor.
第１図は本発明にかかる粘着力測定装置の正面図、第２
図はその要部拡大図、第３図は第２図のIII−III断面
図、第４図は下部試料支持体の作動説明図である。 ２……枠部、12……円板、15……下部試料おれえ部、16
……カム、17……レバー、27……カム軸、29……頭部、
30……押圧部、Ｓ……上部試料、Ｓ′……下部試料。FIG. 1 is a front view of an adhesive force measuring device according to the present invention, FIG.
FIG. 3 is an enlarged view of a main part thereof, FIG. 3 is a sectional view taken along the line III-III of FIG. 2, and FIG. 2 ... frame part, 12 ... disk, 15 ... lower sample holder, 16
... Cam, 17 ... Lever, 27 ... Cam shaft, 29 ... Head,
30: pressed part, S: upper sample, S ': lower sample.
Claims (1)
に一定荷重で圧着させた後、前記上部試料を引き上げて
両試料間の剥離力を測定するようにした粘着力測定装置
において、前記下部試料を固定する下部試料押さえ部を
枠部に起伏自在に取り付けると共に、該下部試料押さえ
部に対して下部試料押さえ部固定用の押圧部と下部試料
押さえ部引起し用の頭部とを有するカムを配設し、かつ
該カムのカム軸にレバーを固定した粘着力測定装置。1. An adhesive force measuring device wherein an upper sample wound around a disk is pressed against a lower sample with a constant load, and then the upper sample is pulled up to measure a peeling force between the two samples. A lower sample holding portion for fixing the lower sample is mounted on the frame portion so as to be able to be raised and lowered, and the lower sample holding portion has a pressing portion for fixing the lower sample holding portion and a head for raising the lower sample holding portion. An adhesive force measuring device having a cam and a lever fixed to a cam shaft of the cam.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP18283190A JP2720099B2 (en) | 1990-07-12 | 1990-07-12 | Adhesion measuring device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP18283190A JP2720099B2 (en) | 1990-07-12 | 1990-07-12 | Adhesion measuring device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0470546A JPH0470546A (en) | 1992-03-05 |
| JP2720099B2 true JP2720099B2 (en) | 1998-02-25 |
Family
ID=16125232
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP18283190A Expired - Lifetime JP2720099B2 (en) | 1990-07-12 | 1990-07-12 | Adhesion measuring device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP2720099B2 (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103868847A (en) * | 2014-03-17 | 2014-06-18 | 深圳市华星光电技术有限公司 | Pressing and tearing device and pressing and tearing method for delaminating rate test |
| KR101729420B1 (en) * | 2015-12-07 | 2017-04-24 | 금호타이어 주식회사 | Device for testing tack of tyre rubber composite |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104634625A (en) * | 2013-11-14 | 2015-05-20 | 珠海格力电器股份有限公司 | Experimental device |
-
1990
- 1990-07-12 JP JP18283190A patent/JP2720099B2/en not_active Expired - Lifetime
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103868847A (en) * | 2014-03-17 | 2014-06-18 | 深圳市华星光电技术有限公司 | Pressing and tearing device and pressing and tearing method for delaminating rate test |
| KR101729420B1 (en) * | 2015-12-07 | 2017-04-24 | 금호타이어 주식회사 | Device for testing tack of tyre rubber composite |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0470546A (en) | 1992-03-05 |
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