JP2692551B2 - Optical waveguide substrate for displacement sensor - Google Patents

Optical waveguide substrate for displacement sensor

Info

Publication number
JP2692551B2
JP2692551B2 JP28464393A JP28464393A JP2692551B2 JP 2692551 B2 JP2692551 B2 JP 2692551B2 JP 28464393 A JP28464393 A JP 28464393A JP 28464393 A JP28464393 A JP 28464393A JP 2692551 B2 JP2692551 B2 JP 2692551B2
Authority
JP
Japan
Prior art keywords
optical waveguide
substrate
displacement sensor
light
reflecting mirror
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP28464393A
Other languages
Japanese (ja)
Other versions
JPH07139908A (en
Inventor
隆 森
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sumitomo Metal Mining Co Ltd
Original Assignee
Sumitomo Metal Mining Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sumitomo Metal Mining Co Ltd filed Critical Sumitomo Metal Mining Co Ltd
Priority to JP28464393A priority Critical patent/JP2692551B2/en
Publication of JPH07139908A publication Critical patent/JPH07139908A/en
Application granted granted Critical
Publication of JP2692551B2 publication Critical patent/JP2692551B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Instruments For Measurement Of Length By Optical Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Optical Integrated Circuits (AREA)

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【産業上の利用分野】本発明は、光学的干渉により被測
定物の変位を測定する変位センサに用いる光導波路基板
に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an optical waveguide substrate used as a displacement sensor for measuring displacement of an object to be measured by optical interference.

【0002】[0002]

【従来の技術】レーザー、エレクトロニクス、マイクロ
コンピューター、センサー素子等の発達により、可干渉
性に優れるレーザー光の光学的干渉による微小部分の変
位センサが普及している。レーザー光を用いる変位セン
サは、非接触でかつ精度が高いため、結晶ウェハー、光
学部品、X線用ミラー等の表面粗さの測定に利用されて
いる。
2. Description of the Related Art With the development of lasers, electronics, microcomputers, sensor elements and the like, displacement sensors for minute portions due to optical interference of laser light, which are excellent in coherence, have become widespread. Since a displacement sensor using laser light is non-contact and highly accurate, it is used for measuring the surface roughness of crystal wafers, optical components, X-ray mirrors, and the like.

【0003】このレーザー光を用いた変位センサに、マ
イケルソン干渉の原理を利用したものがある。これ
は、ニオブ酸リチウム(LiNbO3 )やタンタル酸リ
ウチム(LiTaO3 )等の電気光学結晶基板表面に光
導波路を形成し、被測定物で反射した測定光と、反射鏡
で反射した参照光とを方向性結合器で干渉させて、被測
定物の微小変位を測定するものである。
[0003] the displacement sensor using the laser beam, there is one using the principle of Michelson interferometer. This is because an optical waveguide is formed on the surface of an electro-optical crystal substrate such as lithium niobate (LiNbO 3 ) or lithium tantalate (LiTaO 3 ) and the measurement light reflected by the DUT and the reference light reflected by the reflecting mirror are formed. Is made to interfere with a directional coupler to measure a minute displacement of the object to be measured.

【0004】変位センサでは、光導波路−光ファイバ
ー、光導波路−空気等の、異なる物質の界面をレーザー
光が通過するとき、それらの屈折率の違いによりフレネ
ル反射が起こる。特に、電気光学結晶基板にニオブ酸リ
チウムを用いる場合、この物質の屈折率は2.2で、光
ファイバーの屈折率1.45や、空気の屈折率1.0よ
り大きく、フレネル反射が顕著に起こる。このフレネル
反射はノイズとなり、特に被測定物の反射率が低く、測
定光の強度が弱い場合に正確な変位測定の障害となる。
In the displacement sensor, when laser light passes through the interface of different substances such as optical waveguide-optical fiber and optical waveguide-air, Fresnel reflection occurs due to the difference in refractive index between them. In particular, when lithium niobate is used for the electro-optic crystal substrate, the refractive index of this material is 2.2, which is larger than the refractive index of the optical fiber of 1.45 and the refractive index of air of 1.0, and Fresnel reflection occurs remarkably. . This Fresnel reflection becomes noise, which is an obstacle to accurate displacement measurement especially when the reflectance of the object to be measured is low and the intensity of the measurement light is weak.

【0005】この問題を解決するものとして、光導波路
端面に反射防止膜を形成する方法、あるいは、光ファイ
バーと接続される導波路の望む端面を斜めに研磨し、フ
レネル反射ノイズを防ぐ方法がある。後者は光ファイバ
ージャイロ用光導波路に適用されている(例えばPCT
/US90/00989)。
To solve this problem, an optical waveguide
There is a method of forming an antireflection film on the end surface or a method of obliquely polishing the desired end surface of the waveguide connected to the optical fiber to prevent Fresnel reflection noise . The latter is an optical fiber
-Applied to optical waveguide for gyro (eg PCT
/ US90 / 00989).

【0006】前者によれば、フレネル反射ノイズを最大
30dBまで抑制できる。しかし、被測定物の色や表面
状態等条件によっては、反射戻り光がフレネル反射ノイ
ズと同程度になる場合もある。そのように反射光量の小
さい被測定物の測定をするためには、よりフレネル反射
ノイズを低減する必要がある。後者を変位センサ用導波
路基板に適用し、ファイバー接続端、測定光入出力端を
斜めにカットすればフレネル反射を60dB程度まで抑
制できる。しかしながら、この方法では、参照光を得る
ための反射鏡からの反射光量も減衰してしまう
According to the former, the Fresnel reflection noise is maximized.
It can be suppressed up to 30 dB. However, the color and surface of the DUT
Depending on conditions such as conditions, the reflected return light may have Fresnel reflection noise.
In some cases, it will be about the same. As such, the amount of reflected light is small
In order to measure the DUT, more Fresnel reflection
It is necessary to reduce noise. Waveguide for displacement sensor
It is applied to the circuit board, and the fiber connection end and the measurement light input / output end are
If it is cut diagonally, Fresnel reflection can be suppressed to about 60 dB.
Can be controlled. However, with this method, a reference beam is obtained
Therefore, the amount of light reflected from the reflecting mirror is also attenuated .

【0007】また、反射鏡を光導波路基板の端面に形成
せず、光導波路の途中に形成する方法があるが、これを
実現するには極めて複雑な工程が必要であり、実用的な
方法ではない。
Further, there is a method of forming the reflecting mirror in the middle of the optical waveguide instead of forming it on the end face of the optical waveguide substrate. However, in order to realize this, an extremely complicated process is required, and it is not a practical method. Absent.

【0008】[0008]

【発明が解決しようとする課題】そこで本発明は、フレ
ネル反射によるノイズ発生を防止し、正確な変位測定を
可能とした変位センサに用いる光導波路基板を提供する
ことを目的とする。
SUMMARY OF THE INVENTION Therefore, an object of the present invention is to provide an optical waveguide substrate used for a displacement sensor which prevents noise generation due to Fresnel reflection and enables accurate displacement measurement.

【0009】[0009]

【課題を解決するための手段】上記目的を達成するため
に、請求項1に記載の変位センサ用光導波路基板によれ
ば、電気光学結晶基板表面に、光導波路、方向性結合
器、及び、反射鏡が形成された変位センサ用光導波路基
板であって、該方向性結合器から該反射鏡へ至る該光導
波路が該基板の側面に対して斜め方向に形成され、か
つ、該基板の該反射鏡を形成する端面が上記斜め方向に
対して垂直な面となっていることを特徴としている。
[MEANS FOR SOLVING THE PROBLEMS] To achieve the above object
The optical waveguide substrate for a displacement sensor according to claim 1,
For example, optical waveguides and directional couplings on the electro-optic crystal substrate surface.
And an optical waveguide substrate for a displacement sensor, in which a reflecting mirror is formed
A plate, the light guide from the directional coupler to the reflector
The waveguide is formed obliquely to the side surface of the substrate,
The end face of the substrate forming the reflecting mirror is inclined in the oblique direction.
The feature is that it is a vertical surface.

【0010】[0010]

【作用】図1は、本発明の光導波路基板の一実施例を示
す概念図である。光導波路基板1に入射されたレーザー
光L1は、光導波路2aより方向性結合器3を通って2
分され、一方は光導波路2cを通って測定光L2とな
り、他方は光導波路2dを通って参照光L3となる。測
定光L2は被測定物5に当たって反射され、再び光導波
路2cより方向性結合器3へ至り、参照光L3は反射鏡
4に反射され、再び光導波路2dより方向性結合器3へ
至る。方向性結合器3では測定光L2と参照光L3とが
干渉し、その一部が干渉光L4となって光導波路2bよ
り出力される。干渉光L4の強度を測定すれば、被測定
物5の表面の微小変位が測定できる。
1 is a conceptual view showing an embodiment of the optical waveguide substrate of the present invention. The laser light L1 incident on the optical waveguide substrate 1 passes through the directional coupler 3 from the optical waveguide 2a and passes through the directional coupler 2.
One of them is divided into the measurement light L2 through the optical waveguide 2c, and the other becomes the reference light L3 through the optical waveguide 2d. The measurement light L2 hits the object to be measured 5, is reflected, reaches the directional coupler 3 again from the optical waveguide 2c, and the reference light L3 is reflected by the reflecting mirror 4, and reaches the directional coupler 3 again from the optical waveguide 2d. In the directional coupler 3, the measurement light L2 and the reference light L3 interfere with each other, and a part of the interference light L4 is output from the optical waveguide 2b. By measuring the intensity of the interference light L4, the minute displacement of the surface of the DUT 5 can be measured.

【0011】本発明の変位センサ用光導波路基板は、方
向性結合器3から該反射鏡へ至る該光導波路が基板に対
して斜め方向に形成されるため、フレネル反射が発生し
ても戻り光とならない。また、光導波路基板の反射鏡を
形成する端面が、上記斜め方向に対して垂直な面となっ
ているため、測定光は光導波路基板に戻ることができ
る。
In the optical waveguide substrate for a displacement sensor of the present invention, since the optical waveguide extending from the directional coupler 3 to the reflecting mirror is formed in an oblique direction with respect to the substrate, the return light is generated even if Fresnel reflection occurs. It does not become. Moreover, since the end surface of the optical waveguide substrate forming the reflecting mirror is a surface perpendicular to the oblique direction, the measurement light can return to the optical waveguide substrate.

【0012】電気光学結晶基板には、LiNbO3また
はLiTaO3の結晶を用いることができ、光導波路
は、基板表面にプロトン交換することで形成される。反
射鏡には、金属や酸化物を蒸着したものを用いることが
できる。
A crystal of LiNbO 3 or LiTaO 3 can be used for the electro-optic crystal substrate, and the optical waveguide is formed by proton exchange on the substrate surface. A metal or oxide vapor-deposited one can be used for the reflecting mirror.

【0013】[0013]

【実施例】図1に示す構成の光導波路基板を作成し、変
位センサに用いた。電気光学結晶基板1には、厚さ1m
m、幅2.8mm、長さ30mmのLiNbO3製結晶
を用い、端面1a、1cを平行にかつ端面1bに対して
80゜の傾斜で斜め研磨した。光導波路2と方向性結合
器3は、基板1表面にプロトン交換して形成した。この
うち光導波路2dは、方向性結合器3から外側へ向けて
曲率半径60mmで曲げ、基板端面1a近傍では端面1
bに対して10゜の角度方向の直線とした。
EXAMPLE An optical waveguide substrate having the structure shown in FIG. 1 was prepared and used as a displacement sensor. The electro-optic crystal substrate 1 has a thickness of 1 m
Using LiNbO 3 crystal having m, width of 2.8 mm, and length of 30 mm, the end faces 1a and 1c were slanted parallel to each other and inclined at an angle of 80 ° with respect to the end face 1b. The optical waveguide 2 and the directional coupler 3 were formed by exchanging protons on the surface of the substrate 1. Of these, the optical waveguide 2d is bent outward from the directional coupler 3 with a radius of curvature of 60 mm, and the end face 1 is formed near the substrate end face 1a.
A straight line having an angle of 10 ° with respect to b was used.

【0014】反射鏡4は、基板端面1aの光導波路2d
端部の1mm四方の部分に、Tiを20nm、その上に
Alを300nm蒸着させて形成した。従って光導波路
2dは、基板端面1a及び反射鏡4の面に垂直となっ
た。
The reflecting mirror 4 is an optical waveguide 2d on the end face 1a of the substrate.
It was formed by vapor-depositing Ti to a thickness of 20 nm and Al to a thickness of 300 nm on a 1 mm square portion of the end portion. Therefore, the optical waveguide 2d is perpendicular to the substrate end face 1a and the surface of the reflecting mirror 4.

【0015】フレネル反射による戻り光が60dBまで
下がり、干渉光2bの強度の変動は1/30となった。
従って、この光導波路基板は、変位センサに十分使用す
ることができる。
The return light due to Fresnel reflection was reduced to 60 dB, and the fluctuation of the intensity of the interference light 2b became 1/30.
Therefore, this optical waveguide substrate can be sufficiently used for a displacement sensor.

【0016】[0016]

【発明の効果】フレネル反射によるノイズ発生を防止
し、正確な変位測定を可能とした変位センサに用いる光
導波路基板が提供される。
EFFECT OF THE INVENTION There is provided an optical waveguide substrate used in a displacement sensor capable of preventing generation of noise due to Fresnel reflection and enabling accurate displacement measurement.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の光導波路基板の一実施例を示す概念図
である。
FIG. 1 is a conceptual diagram showing an embodiment of an optical waveguide substrate of the present invention.

【符号の説明】[Explanation of symbols]

1 電気光学結晶基板 1a 電気光学結晶基板の反射鏡を形成する端面 1b 電気光学結晶基板の側面 1c 電気光学結晶基板の入出力光側端面 2 光導波路 2a 入射光の光導波路 2b 干渉光の光導波路 2c 測定光の光導波路 2d 参照光の光導波路 3 方向性結合器 4 反射鏡 5 被測定物 L1 レーザー光 L2 測定光 L3 参照光 L4 干渉光 DESCRIPTION OF SYMBOLS 1 Electro-optic crystal substrate 1a End face for forming a reflection mirror of electro-optic crystal substrate 1b Side face of electro-optic crystal substrate 1c Input / output light side end face of electro-optic crystal substrate 2 Optical waveguide 2a Incident light optical waveguide 2b Interfering light optical waveguide 2c Optical Waveguide for Measurement Light 2d Optical Waveguide for Reference Light 3 Directional Coupler 4 Reflector 5 Object to be Measured L1 Laser Light L2 Measurement Light L3 Reference Light L4 Interference Light

Claims (1)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】 電気光学結晶基板表面に、光導波路、方
向性結合器、及び、反射鏡が形成された変位センサ用光
導波路基板であって、該方向性結合器から該反射鏡へ至
る該光導波路が該基板の側面に対して斜め方向に形成さ
れ、かつ、該基板の該反射鏡を形成する端面が上記斜め
方向に対して垂直な面となっていることを特徴とする変
位センサ用光導波路基板。
1. An optical waveguide substrate for a displacement sensor, wherein an optical waveguide, a directional coupler, and a reflecting mirror are formed on a surface of an electro-optic crystal substrate, the optical waveguide substrate extending from the directional coupler to the reflecting mirror. For a displacement sensor, wherein an optical waveguide is formed in an oblique direction with respect to a side surface of the substrate, and an end surface of the substrate forming the reflecting mirror is a surface perpendicular to the oblique direction. Optical waveguide substrate.
JP28464393A 1993-11-15 1993-11-15 Optical waveguide substrate for displacement sensor Expired - Lifetime JP2692551B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP28464393A JP2692551B2 (en) 1993-11-15 1993-11-15 Optical waveguide substrate for displacement sensor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP28464393A JP2692551B2 (en) 1993-11-15 1993-11-15 Optical waveguide substrate for displacement sensor

Publications (2)

Publication Number Publication Date
JPH07139908A JPH07139908A (en) 1995-06-02
JP2692551B2 true JP2692551B2 (en) 1997-12-17

Family

ID=17681127

Family Applications (1)

Application Number Title Priority Date Filing Date
JP28464393A Expired - Lifetime JP2692551B2 (en) 1993-11-15 1993-11-15 Optical waveguide substrate for displacement sensor

Country Status (1)

Country Link
JP (1) JP2692551B2 (en)

Also Published As

Publication number Publication date
JPH07139908A (en) 1995-06-02

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