JP2655562B2 - Qualitative analysis method by X-ray fluorescence analysis - Google Patents

Qualitative analysis method by X-ray fluorescence analysis

Info

Publication number
JP2655562B2
JP2655562B2 JP3142433A JP14243391A JP2655562B2 JP 2655562 B2 JP2655562 B2 JP 2655562B2 JP 3142433 A JP3142433 A JP 3142433A JP 14243391 A JP14243391 A JP 14243391A JP 2655562 B2 JP2655562 B2 JP 2655562B2
Authority
JP
Japan
Prior art keywords
peak
search
analysis
order
spectrum
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP3142433A
Other languages
Japanese (ja)
Other versions
JPH04343052A (en
Inventor
忠弘 塩田
寛友 越智
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimazu Seisakusho KK
Original Assignee
Shimazu Seisakusho KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimazu Seisakusho KK filed Critical Shimazu Seisakusho KK
Priority to JP3142433A priority Critical patent/JP2655562B2/en
Publication of JPH04343052A publication Critical patent/JPH04343052A/en
Application granted granted Critical
Publication of JP2655562B2 publication Critical patent/JP2655562B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【産業上の利用分野】本発明は、蛍光X線分析装置によ
る試料の定性分析で最適なスペクトル同定がコンピュー
タによって自動的に行われるようにするための方法に関
する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for automatically performing optimal spectrum identification by a computer in qualitative analysis of a sample by a fluorescent X-ray analyzer.

【0002】[0002]

【従来の技術】従来のスペクトル自動同定解析手順は、
先ず、得られた測定スペクトルデータから、X線管のタ
ーゲット物質の固有X線のピークを探し出して除去する
(&1)。X線管の影響を除去した測定スペクトルデー
タから最強ピーク検索し、同最強ピークの角度値を読み
取る。角度値から検索ピークの波長を換算し、同換算し
た波長を、各元素の固有X線の名前と波長を表にしたス
ペクトル表データと照合し、上記検索ピークに適合する
元素を検索することによりピーク元素を同定する(&
2)。測定スペクトルデータにおいて、同定されたピー
ク元素の固有X線およびそれに付随するX線のピーク
(例,2次回折X線等)と合致するピークのすべてにマ
ークを付ける(&3)。マークの付いていないピークに
ついて動作(&2)に戻り、すべてのピークについて、
マークが付くまで即ち同定が終了するまで動作(&2)
〜(&4)をくり返す。動作(&2)で使用するスペク
トル表は、蛍光X線で分析可能な 5B〜92Uまでのすべ
ての元素のスペクトル波長をデータとしたテーブルとな
っている。
2. Description of the Related Art A conventional automatic spectrum identification analysis procedure is as follows.
First, a peak of an intrinsic X-ray of a target substance of an X-ray tube is searched for and removed from the obtained measured spectrum data (& 1). The strongest peak is searched from the measured spectrum data from which the influence of the X-ray tube has been removed, and the angle value of the strongest peak is read. By converting the wavelength of the search peak from the angle value, comparing the converted wavelength with the spectrum table data that lists the name and wavelength of the specific X-ray of each element, and searching for an element that matches the above search peak Identify peak elements (&
2). In the measured spectrum data, all the peaks that match the intrinsic X-ray of the identified peak element and the associated X-ray peak (eg, second-order diffracted X-ray, etc.) are marked (& 3). Return to operation (& 2) for unmarked peaks, and for all peaks,
Operate until mark is added, that is, until identification is completed (& 2)
Repeat ~ (& 4). The spectrum table used in the operation (& 2) is a table in which the spectral wavelengths of all the elements from 5 B to 92 U that can be analyzed by X-ray fluorescence are used as data.

【0003】しかし、上記のような分析方法では、検索
用のスペクトル表が原子番号順にしかも全ての元素に対
して用意されているので、検出ピークの波長がスペクト
ル表の波長と照合するまでの検索時間は、検出ピーク数
とスペクトル表データ数に比例して長くなるために、非
常に時間がかかると云う問題があった。また、同定スペ
クトルの正解率も、スペクトル表データの情報量が多い
ほど、近接したピークが多くなるために悪くなるので、
正解率も低いと云う問題があった。これらの問題を解消
するために、従来装置のなかでは、解析前に、試料中に
存在していないであろうと思われる元素を、分析者が指
定することによって、分析に必要ない元素のスペクトル
データを検索用のスペクトル表から除去できるようにし
ておき、解析時には、分析に必要ない元素のスペクトル
データが除去された検索用スペクトル表を用いて、測定
スペクトルデータの同定を行うという方法を用いたもの
もあるが、この状態でも、分析試料の主成分の順に検索
を行っていないため、検索時間及び正解率の向上が不充
分であると云う問題があった。
However, in the above-described analysis method, since a search spectrum table is prepared in the order of atomic numbers and for all elements, the search table until the wavelength of the detected peak matches the wavelength in the spectrum table is obtained. Since the time becomes longer in proportion to the number of detected peaks and the number of spectrum table data, there is a problem that it takes much time. In addition, the correct answer rate of the identified spectrum is also worse because the information amount of the spectrum table data is larger, since the number of adjacent peaks is increased.
There was a problem that the accuracy rate was low. In order to solve these problems, in the conventional equipment, before analysis, the analyst specifies the elements that are considered not to be present in the sample, so that the spectral data of the elements not necessary for analysis can be obtained. Can be removed from the search spectrum table, and at the time of analysis, the measured spectrum data is identified using the search spectrum table from which the spectrum data of elements not required for analysis has been removed. However, even in this state, since the search is not performed in the order of the main components of the analysis sample, there is a problem that the search time and the accuracy rate are not sufficiently improved.

【0004】[0004]

【発明が解決しようとする課題】本発明は、蛍光X線分
析における自動同定作業において、検索時間及び正解率
を向上させることを目的とする。
SUMMARY OF THE INVENTION An object of the present invention is to improve search time and correct answer rate in automatic identification work in X-ray fluorescence analysis.

【0005】[0005]

【課題を解決するための手段】蛍光X線分析の定性分析
において、元素スペクトル一覧表から検索しようとする
元素を指定すると共に指定した各元素に検索順位を設定
して検索用順位テーブルを作成し記憶する手段と、蛍光
X線分析によって得られた検出ピーク表から信号強度順
に検出ピークを選定する手段とを設け、上記手段で選定
された最強検出ピークを上記検索順位テーブルによって
同定を行い、同定された元素ピークデータを検索用順位
テーブルから削除すると共に、検出ピーク表から同定元
素から生じる全てのピークデータを削除し、順次選定さ
れた検出ピークを削除した検索用順位テーブルにより同
定を行うようにした。
In the qualitative analysis of X-ray fluorescence analysis, an element to be searched is specified from an element spectrum list, and a search order is set for each specified element to create a search order table. Means for storing, and means for selecting detected peaks in the order of signal intensity from a detected peak table obtained by X-ray fluorescence analysis, and identifying the strongest detected peak selected by the above means using the search order table; In addition to deleting the selected element peak data from the search rank table, all peak data resulting from the identified element is deleted from the detected peak table, and identification is performed using the search rank table in which the detected peaks sequentially selected are deleted. did.

【0006】[0006]

【作用】検索時間が長時間かかったり、正解率が低くな
る原因が、検索用のスペクトル表に多数の元素のピーク
データが無作為に羅列していることによることから、本
発明は、分析前に、元素毎に検索用スペクトル表に要,
不要の指定すると共に、検索用スペクトル表に書き込む
元素に検索順位を強いピークと予測される元素から付け
て、優先的に検索する元素のピークデータから順に並べ
た検索用の順位テーブルを作成し、測定スペクトルデー
タから検出ピークを強い順に並べた検出ピーク表を作成
し、検出ピークの同定を検出ピーク表の上位の検出ピー
クから順番に、上記で作成された順位テーブルの優先順
位の上の元素データから順に比較して同定を行うように
することで、最強検出ピークが主要元素の検出ピークで
あるから、検索時間が大幅に短縮される。また、主要元
素から派生する付随ピークは、少量元素の主要検出ピー
クより強い場合が多く、主要元素から派生する付随検出
ピークを削除することで、判定の誤りを少なくすること
ができる。本発明は、含有量の多い元素程元素名が確か
であり、誤判定が少ない。含有量が多い元素程検出ピー
クが強いので、検出ピークが強い順に同定することは、
誤判定を少なくすることになる。しかも、検出ピークが
同定されるとその同定元素から派生する付随ピークを検
出ピーク表から削除するので、同定しようとする主要検
出ピークより強い付随検出ピークは、該主要検出ピーク
の同定時には、全て削除されており、誤判定が少なくな
り、同定の正確率を高めることができる。また、同定さ
れた元素のピークデータを順位テーブルから順次削除し
ていくことにより、更に短時間に高い正確率で検出ピー
クの同定が可能になる。
According to the present invention, the search time is long and the accuracy rate is low because peak data of many elements are randomly arranged in a search spectrum table. In the search spectrum table for each element,
In addition to specifying unnecessary, an element to be written in the search spectrum table is assigned a search order from the element that is predicted to be a strong peak, and a search order table is created in order from the peak data of the element to be searched preferentially, Create a detection peak table in which the detected peaks are arranged in order of strongest from the measured spectrum data, and identify the detected peaks in order from the upper detection peak in the detection peak table, the element data on the priority order of the ranking table created above Since the identification is performed by comparing in order from, the strongest detected peak is the detected peak of the main element, so that the search time is greatly reduced. In addition, the incidental peak derived from the main element is often stronger than the main detection peak of a small amount of the element, and the erroneous determination can be reduced by deleting the incidental detection peak derived from the main element. In the present invention, the higher the content of the element, the more certain the element name is, and the less erroneous judgment is made. Since the detection peak is stronger as the content of the element is higher, it is necessary to identify the detection peak in order from the strongest.
This reduces erroneous determinations. In addition, when the detected peak is identified, the associated peak derived from the identified element is deleted from the detected peak table. Therefore, all the associated detected peaks stronger than the main detected peak to be identified are deleted when the main detected peak is identified. Thus, erroneous determinations are reduced, and the accuracy of identification can be increased. Further, by sequentially deleting the peak data of the identified elements from the ranking table, it becomes possible to identify the detected peak at a higher accuracy rate in a shorter time.

【0007】[0007]

【実施例】図1に本発明の一実施例のフローチャートを
示す。先ず、分析前に、分析条件を設定する(#1)。
測定条件を設定する(#2)。検索元素順位テーブルを
検索不要の元素を削除し含有率が高いと予想される元素
から順次検索優先順位を付けて作成する(#3)。分析
を開始し、スペクトル測定を行い(#4)、測定スペク
トルデータを記憶する(#5)。次にデータ処理を開始
する。先ず、記憶した測定スペクトルデータからピーク
を検索し、検出ピーク表を作成する(#6)。検出ピー
ク表から管球のターゲットによるピークを除去する(#
7)。検出ピーク表から最強検出ピークを検索し、同最
強検出ピークの波長をλ0 とする(#8)。Nを1とす
る(#9)。順位テーブルのN番目の元素波長をλN
し(#10)。λ0 =λN かどうか判定する(#1
1)。λ0 =λN でない場合は、Nに1加算して、N←
N+1とし(#12)、ステップ#10に戻る。λ0
λNの場合は、検出ピークの元素をN番目元素であると
判定し(#13)、同元素データを順位テーブルから削
除し(#14)、同元素の付随スペクトルのピーク(固
有X線及びその回折X線によるピーク)を検出ピーク表
から削除し(#15)、削除された検出ピーク表におい
て、残査ピークが有るかどうかを判定し(#16)、残
査ピークが有る場合には、順位テーブルで残っている元
素の先頭をN=1として、ステップ#8に戻り、残査ピ
ークの同定解析を続行する。残査ピークが無い場合に
は、分析結果を出力し(#17)、分析を終了する。
FIG. 1 shows a flow chart of an embodiment of the present invention. First, before analysis, analysis conditions are set (# 1).
The measurement conditions are set (# 2). A search element ranking table is created by deleting search unnecessary elements and sequentially assigning search priority to elements expected to have a high content (# 3). The analysis is started, the spectrum is measured (# 4), and the measured spectrum data is stored (# 5). Next, data processing is started. First, a peak is searched from the stored measured spectrum data, and a detected peak table is created (# 6). Remove the peak due to the tube target from the detection peak table (#
7). The strongest detected peak is searched from the detected peak table, and the wavelength of the strongest detected peak is set to λ 0 (# 8). N is set to 1 (# 9). The N-th element wavelength in the ranking table is set to λ N (# 10). It is determined whether λ 0 = λ N (# 1
1). If not λ 0 = λ N , add 1 to N and N ←
N + 1 is set (# 12), and the process returns to step # 10. λ 0 =
In the case of λ N , the element of the detected peak is determined to be the N-th element (# 13), the data of the same element is deleted from the ranking table (# 14), and the peak of the incidental spectrum of the same element (specific X-ray and The peak due to diffraction X-rays) is deleted from the detected peak table (# 15), and it is determined whether there is a residual peak in the deleted detected peak table (# 16). Then, the head of the remaining elements in the ranking table is set to N = 1, the process returns to step # 8, and the identification analysis of the residual peak is continued. If there is no residual peak, the analysis result is output (# 17), and the analysis ends.

【0008】[0008]

【発明の効果】本発明によれば、解析前に、判定用のス
ペクトル表を分析試料に含有されている元素で強いピー
クが予想される順番に並べ変えて順位テーブルを作成
し、その順位テーブルを用いて検出ピークの同定を行う
ことで、強いピークから順に同定されることとなり、そ
の強いピークを発生させる元素から派生する他のピーク
も順位テーブルから削除されることとなるので、弱いピ
ークを同定する時には、主要元素から派生した付随ピー
クは全て削除された後のピークしか残っていないので、
その判定の誤りは少なくなり、解析スピード及び正解率
を大幅に向上した。また、各試料形態毎に試料元素に対
して解析優先順位を設定することが可能であることか
ら、コンピュータによる自動データ処理を、分析者が意
図するデータ処理と同じデータ処理方法に近付けること
ができるようになった。
According to the present invention, prior to analysis, a ranking table is created by rearranging a spectrum table for determination in an order in which strong peaks are expected for elements contained in an analysis sample, and the ranking table is prepared. By identifying the detected peaks by using, the peaks are identified in order from the strongest peak, and other peaks derived from the element that generates the strong peak will also be deleted from the ranking table. At the time of identification, only the peaks after all the accompanying peaks derived from the main elements have been deleted, so
The number of errors in the determination is reduced, and the analysis speed and the accuracy rate are greatly improved. In addition, since analysis priorities can be set for sample elements for each sample form, automatic data processing by a computer can be made closer to the same data processing method as the data processing intended by the analyst. It became so.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の一実施例のフローチャートFIG. 1 is a flowchart of an embodiment of the present invention.

───────────────────────────────────────────────────── フロントページの続き (56)参考文献 特開 昭60−135849(JP,A) 日刊工業新聞社「放射線計測ハンドブ ック」P609〜610昭和57年発行 ──────────────────────────────────────────────────続 き Continuation of the front page (56) References JP-A-60-135549 (JP, A) Nikkan Kogyo Shimbun "Radiation Measurement Handbook", pages 609-610, published in 1982

Claims (1)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】元素スペクトル一覧表から検索する元素を
指定すると共に各元素に検索順位を設定して検索用順位
テーブルを作成し記憶する手段と、蛍光X線分析によっ
て得られた検出ピーク表から信号強度順に検出ピークを
選定する手段とを設け、上記手段で選定された検出ピー
クを強度順に上記検索順位テーブルによって同定を行
い、検索用順位テーブルから同定元素ピークデータを削
除すると共に、検出ピーク表から同定元素から生じる全
てのピークデータを削除し、次の強度の検出ピークにつ
いて、上記の同定動作を行うようにしたことを特徴とす
る蛍光X線分析による定性分析方法。
1. A means for designating an element to be searched from an element spectrum list, setting a search order for each element, creating and storing a search order table, and a means for detecting a search peak table obtained by X-ray fluorescence analysis. Means for selecting detection peaks in order of signal intensity, identifying the detection peaks selected by the means in accordance with the search order table in order of intensity, deleting the identified element peak data from the search order table, A qualitative analysis method based on X-ray fluorescence analysis, wherein all peak data generated from an identified element are deleted from the above, and the above-described identification operation is performed on a detected peak of the next intensity.
JP3142433A 1991-05-17 1991-05-17 Qualitative analysis method by X-ray fluorescence analysis Expired - Fee Related JP2655562B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3142433A JP2655562B2 (en) 1991-05-17 1991-05-17 Qualitative analysis method by X-ray fluorescence analysis

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3142433A JP2655562B2 (en) 1991-05-17 1991-05-17 Qualitative analysis method by X-ray fluorescence analysis

Publications (2)

Publication Number Publication Date
JPH04343052A JPH04343052A (en) 1992-11-30
JP2655562B2 true JP2655562B2 (en) 1997-09-24

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Country Link
JP (1) JP2655562B2 (en)

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4255012B2 (en) * 2003-10-10 2009-04-15 株式会社リガク X-ray fluorescence analyzer
CN118294400B (en) * 2024-06-06 2024-08-23 天津市产品质量监督检测技术研究院 Rapid identification method for non-degradable plastic product

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0678998B2 (en) * 1983-12-26 1994-10-05 株式会社島津製作所 Qualitative analyzer

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
日刊工業新聞社「放射線計測ハンドブック」P609〜610昭和57年発行

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