JP2594127Y2 - Substrate heat treatment equipment - Google Patents

Substrate heat treatment equipment

Info

Publication number
JP2594127Y2
JP2594127Y2 JP1993023799U JP2379993U JP2594127Y2 JP 2594127 Y2 JP2594127 Y2 JP 2594127Y2 JP 1993023799 U JP1993023799 U JP 1993023799U JP 2379993 U JP2379993 U JP 2379993U JP 2594127 Y2 JP2594127 Y2 JP 2594127Y2
Authority
JP
Japan
Prior art keywords
substrate
plate
hot plate
support pins
closed space
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP1993023799U
Other languages
Japanese (ja)
Other versions
JPH0679140U (en
Inventor
芳弘 小山
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Screen Holdings Co Ltd
Dainippon Screen Manufacturing Co Ltd
Original Assignee
Screen Holdings Co Ltd
Dainippon Screen Manufacturing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Screen Holdings Co Ltd, Dainippon Screen Manufacturing Co Ltd filed Critical Screen Holdings Co Ltd
Priority to JP1993023799U priority Critical patent/JP2594127Y2/en
Publication of JPH0679140U publication Critical patent/JPH0679140U/en
Application granted granted Critical
Publication of JP2594127Y2 publication Critical patent/JP2594127Y2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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Description

【考案の詳細な説明】[Detailed description of the invention]

【0001】[0001]

【産業上の利用分野】本考案は、半導体ウエハ、フォト
マスク用のガラス基板、液晶表示装置用のガラス基板、
光ディスク用の基板等の基板を加熱または冷却するため
に、加熱手段または冷却手段のうちの少なくとも一方を
備えた熱板と、その熱板に形成した貫通孔に設けられて
熱板よりも上方位置で基板を載置する基板支持ピンと、
その基板支持ピンを熱板の上面より上方の位置と下方の
位置とに昇降するピン昇降手段とを備えた基板熱処理装
置に関する。
The present invention relates to a semiconductor wafer, a glass substrate for a photomask, a glass substrate for a liquid crystal display,
A heating plate provided with at least one of a heating means and a cooling means for heating or cooling a substrate such as a substrate for an optical disk, and a heating plate provided in a through hole formed in the heating plate and located above the heating plate. A substrate support pin for mounting the substrate with
The present invention relates to a substrate heat treatment apparatus including a pin elevating means for elevating and lowering the substrate support pins to positions above and below the upper surface of a hot plate.

【0002】[0002]

【従来の技術】この種の基板熱処理装置としては、従
来、実開昭63−193833号公報に開示されるもの
が知られている。この従来例によれば、加熱手段または
冷却手段を有する熱板に、その板面より微小高さ突出す
るようにセラミック製の球体(ボール)を設け、熱板の
上に、いわゆるプロキシミティギャップと称される微小
な隙間を保って基板を支持することにより、均一に基板
を加熱あるいは冷却できるように構成されている。
2. Description of the Related Art Conventionally, as this type of substrate heat treatment apparatus, one disclosed in Japanese Utility Model Application Laid-Open No. 63-193833 is known. According to this conventional example, a ceramic sphere (ball) is provided on a hot plate having a heating means or a cooling means so as to project from the plate surface by a very small height, and a so-called proximity gap is formed on the hot plate. By supporting the substrate while maintaining a so-called minute gap, the substrate can be uniformly heated or cooled.

【0003】この構成により、基板を熱板上に搬入する
ときに、基板の外周縁を載置支持した基板搬送アームに
よって基板を熱板上に移動し、その状態で基板支持ピン
を上昇させて基板を基板支持ピンに載置支持させ、基板
搬送アームを他所へ移動させた後、基板支持ピンを下降
させることにより基板を球体上に支持するようになって
いる。
[0003] With this configuration, when the substrate is carried on the hot plate, the substrate is moved onto the hot plate by the substrate transfer arm on which the outer peripheral edge of the substrate is placed and supported, and the substrate support pins are raised in that state. The substrate is placed and supported on the substrate support pins, the substrate transfer arm is moved to another position, and then the substrate support pins are lowered to support the substrate on a sphere.

【0004】[0004]

【考案が解決しようとする課題】この種の基板熱処理装
置においては、基板を所望の温度に均一に加熱ないし冷
却するように、熱板の上面は高精度に温度制御されてお
り、所望の温度で所望の均一性の処理結果を得るために
は、基板を熱板の所定の位置に支持することが必要であ
る。
In this type of substrate heat treatment apparatus, the upper surface of the hot plate is precisely controlled so as to uniformly heat or cool the substrate to a desired temperature. In order to obtain a desired uniform processing result, it is necessary to support the substrate at a predetermined position on the hot plate.

【0005】ところで、、従来例の場合においては、基
板搬送アームから受け渡した基板を熱板上に支持させる
ために、基板支持ピンを下降したときに、基板が球体に
接触して球体を介して熱板に支持される直前に横方向に
滑りを生じ、所定の位置に正しく下降できない欠点があ
った。
By the way, in the case of the conventional example, in order to support the substrate delivered from the substrate transfer arm on the hot plate, when the substrate supporting pins are lowered, the substrate comes into contact with the sphere and passes through the sphere. There was a drawback in that the slide occurred in the horizontal direction immediately before being supported by the hot plate, and it was not possible to correctly descend to a predetermined position.

【0006】このような問題を防止するためには、基板
支持ピン上に載置された基板の姿勢や熱板の水平度が高
くなるように位置調整を行う必要があるが、高精度を要
求されるために位置調整に手間を要する欠点があった。
In order to prevent such a problem, it is necessary to adjust the position of the substrate placed on the substrate support pins and the position of the hot plate so as to increase the horizontality thereof. There is a drawback that the position adjustment requires time and effort.

【0007】このような問題点は、主として基板支持ピ
ン上に支持されている基板の姿勢や熱板の上面が水平で
ない場合に起こり、基板支持ピンの下降速度が速いとき
には特に顕著に発生していた。そのため、従来では、基
板支持ピンや熱板等の組み付けを高精度に調整して基板
の姿勢や熱板の上面を厳密に水平に保つようにするとと
もに、やむを得ず低速で基板支持ピンを下降させるよう
にして、この問題点の発生頻度を軽減するようにしてい
た。
Such a problem occurs mainly when the posture of the substrate supported on the substrate support pins or the upper surface of the hot plate is not horizontal, and particularly remarkable when the descending speed of the substrate support pins is high. Was. Therefore, in the past, it was necessary to adjust the assembly of the substrate support pins and the hot plate with high precision to keep the posture of the substrate and the upper surface of the hot plate strictly horizontal, and to lower the substrate support pins at a low speed. Then, the frequency of occurrence of this problem is reduced.

【0008】しかしながら、このような方法では、基板
支持ピンや熱板等の組み付け調整に手間と時間がかかる
うえに、基板の昇降動作に時間を要するので処理効率が
低い欠点があり、しかも、このような対策では、基板が
球体に支持される直前に横方向に滑りを生じるという問
題の発生を完全に防止することはできなかった。
However, such a method has the drawbacks that it takes time and effort to adjust the assembly of the substrate support pins and the hot plate, and that it takes a long time to elevate and lower the substrate, resulting in low processing efficiency. With such measures, it has not been possible to completely prevent the occurrence of the problem that the substrate slides in the lateral direction immediately before being supported by the sphere.

【0009】本考案は、このような事情に鑑みてなされ
たものであって、簡単な構成の付加により、基板を下降
して熱板上に支持させる際の横方向への滑りを防止して
処理効率を向上できるようにすることを目的とする。
The present invention has been made in view of such circumstances, and by adding a simple configuration, it is possible to prevent the substrate from sliding in the horizontal direction when the substrate is lowered and supported on a hot plate. An object is to improve processing efficiency.

【0010】[0010]

【課題を解決するための手段】本考案は、上述のような
目的を達成するために、加熱手段または冷却手段のうち
の少なくとも一方を備えた熱板と、その熱板に形成した
貫通孔に設けられて熱板よりも上方位置で基板を載置す
る基板支持ピンと、その基板支持ピンを熱板の上面より
上方の位置と下方の位置とに昇降するピン昇降手段とを
備えた基板熱処理装置において、熱板の下面と基板支持
ピンを設けたピン取付部材との間に、貫通孔に連なる閉
空間を形成する伸縮部材を設け、その閉空間に連ねて、
閉空間内から外部への排気のみを許容する排気弁を設け
て構成する。
According to the present invention, in order to achieve the above-mentioned object, a hot plate provided with at least one of a heating means and a cooling means and a through hole formed in the hot plate are provided. A substrate heat treatment apparatus comprising: a substrate support pin provided for mounting a substrate at a position above a hot plate; and pin elevating means for raising and lowering the substrate support pin to positions above and below the upper surface of the hot plate. In, between the lower surface of the hot plate and the pin mounting member provided with the substrate support pins, provided with an expandable member that forms a closed space connected to the through hole, connected to the closed space,
An exhaust valve that allows only exhaust from the inside of the closed space to the outside is provided.

【0011】[0011]

【作用】本考案の基板熱処理装置の構成によれば、基板
を載置支持した状態の基板支持ピンを下降するときに、
ピン取付部材の下降に伴って閉空間内の容積が増大し、
それに伴って閉空間内が負圧となり、貫通孔を通じて熱
板上の空気を吸引する。この熱板上の空気の吸引は、基
板が横方向に滑る問題を解消するのに極めて有効に作用
する。
According to the configuration of the substrate heat treatment apparatus of the present invention, when the substrate support pins in a state where the substrate is placed and supported are lowered,
The volume in the closed space increases with the lowering of the pin mounting member,
Accordingly, the inside of the closed space becomes negative pressure, and the air on the hot plate is sucked through the through holes. The suction of the air on the hot plate works very effectively to eliminate the problem of the substrate sliding in the lateral direction.

【0012】すなわち、かかる欠点が生じでいた原因を
探究した結果、基板が下降して熱板に支持される直前、
基板と熱板との間の空気は、上下に狭く挟まれて逃げ難
くなリ基板を支える状態となり、基板は基板支持ピンに
同期して下降できずに一時的に宙に浮き、基板支持ピン
や熱板等の組み付け調整の極僅かな不備等による些細な
影響で、基板が横方向に滑っていたことが判明した。こ
のため、前記したように本考案では、熱板上の空気を吸
引するから、基板が浮く現象そのものを解消し、基板が
横方向に滑る欠点が解消される。一方、基板支持ピンを
上昇するときには、閉空間内の容積が減少して、その内
圧が高くなるが、排気弁が開いて排気し、貫通孔から基
板側に排気圧を付与せずに基板を上昇することができ
る。
That is, as a result of investigating the cause of such a defect, immediately before the substrate is lowered and supported by the hot plate,
The air between the substrate and the hot plate is in a state in which it is sandwiched vertically and supports the difficult-to-escape substrate.The substrate cannot float down in synchronization with the substrate support pins and temporarily floats in the air. It was found that the board was slid in the horizontal direction due to the trivial effect of the slightest deficiency in the assembly adjustment of the heat plate and the like. For this reason, as described above, in the present invention, since the air on the hot plate is sucked, the phenomenon that the substrate floats itself is eliminated, and the disadvantage that the substrate slides in the horizontal direction is eliminated. On the other hand, when raising the substrate support pins, the volume in the closed space is reduced and the internal pressure is increased, but the exhaust valve is opened to evacuate, and the substrate is removed from the through hole without applying exhaust pressure to the substrate side. Can rise.

【0013】[0013]

【実施例】次に、本考案の実施例を図面に基づいて詳細
に説明する。
Next, an embodiment of the present invention will be described in detail with reference to the drawings.

【0014】図1は、本考案の実施例を示す全体縦断面
図であり、ハウジング2内の下方に基板熱処理装置とし
ての基板冷却装置3が設けられ、その上方に基板熱処理
装置としての基板加熱装置4が設けられている。
FIG. 1 is an overall longitudinal sectional view showing an embodiment of the present invention, in which a substrate cooling device 3 as a substrate heat treatment device is provided below a housing 2 and a substrate heating device as a substrate heat treatment device is provided above it. A device 4 is provided.

【0015】基板冷却装置3は、処理室5内に熱板とし
ての冷却プレート6を設け、その冷却プレート6に形成
した貫通孔7を通じて基板支持ピン8を昇降可能に設け
るとともに、その基板支持ピン8…を一体的に取り付け
たピン取付部材9にピン昇降手段としてのエアシリンダ
10を連動連結して構成され、エアシリンダ10の伸縮
によって基板支持ピン8…を昇降し、基板支持ピン8を
上昇させた状態で基板搬送ロボット(図示せず)により
基板Wの搬入・搬出を行い、そして、基板支持ピン8を
下降させることにより、基板Wを冷却プレート6上に支
持できるようになっている。
The substrate cooling device 3 includes a cooling plate 6 as a heating plate in the processing chamber 5, and a substrate supporting pin 8 provided so as to be able to move up and down through a through hole 7 formed in the cooling plate 6. An air cylinder 10 as a pin elevating means is interlockedly connected to a pin mounting member 9 integrally attached with the substrate supporting pins 8. The substrate supporting pins 8 are raised and lowered by the expansion and contraction of the air cylinder 10, and the substrate supporting pins 8 are raised. In this state, the substrate W is loaded / unloaded by a substrate transfer robot (not shown), and the substrate W is supported on the cooling plate 6 by lowering the substrate support pins 8.

【0016】冷却プレート6は、基板Wを支持するアル
ミ製の伝熱プレート11と、アルミ製の水冷式の水冷板
12と、伝熱プレート11と水冷板12との間に介在さ
れた急冷用のペルチェ素子13…とから構成されてい
る。この水冷板12とペルチェ素子13とが実用新案登
録請求の範囲にいうところの冷却手段に相当する。
The cooling plate 6 includes an aluminum heat transfer plate 11 for supporting the substrate W, an aluminum water-cooled water cooling plate 12, and a quenching plate interposed between the heat transfer plate 11 and the water cooling plate 12. Peltier elements 13... The water cooling plate 12 and the Peltier element 13 correspond to a cooling means as defined in the claims of the present invention.

【0017】基板加熱装置4は、処理室14内に、板状
ヒータなどの加熱手段を備えた熱板としての加熱プレー
ト15を備えて構成され、基板冷却装置3におけると同
様に、その加熱プレート15に形成した貫通孔7を通じ
て基板支持ピン8が昇降可能に設けられるとともに、基
板支持ピン8…を一体的に取り付けたピン取付部材9に
ピン昇降手段としてのエアシリンダ10が連動連結さ
れ、基板支持ピン8…の昇降と搬送ロボット(図示せ
ず)とにより基板Wを搬入・搬出するとともに、搬入し
た基板Wを加熱プレート15に支持できるようになって
いる。
The substrate heating device 4 is provided with a heating plate 15 as a heating plate provided with a heating means such as a plate heater in a processing chamber 14. The board support pins 8 are provided so as to be able to move up and down through the through holes 7 formed in the base member 15, and an air cylinder 10 as a pin elevating means is interlockingly connected to a pin mounting member 9 integrally mounted with the board support pins 8. The substrate W is loaded and unloaded by the lifting and lowering of the support pins 8 and a transfer robot (not shown), and the loaded substrate W can be supported by the heating plate 15.

【0018】前記冷却プレート6を構成する伝熱プレー
ト11、および、加熱プレート15それぞれには、図2
の要部の斜視図(ここでは加熱プレート15で説明す
る)に示すように、3個の凹部が正三角形の頂点の位置
関係で形成され、それらの凹部それぞれにはボール16
が置かれている。ボール16…それぞれは、例えば、ア
ルミナ、マテアタイト等の低伝熱部材によって製作さ
れ、ボール16…の上部側が加熱プレート15の上面よ
りも微小量だけ突出され、いわゆるプロキシミティギャ
ップと称される所定の隙間が有る状態で基板Wをボール
16…上に載置支持し、均一に加熱または冷却できるよ
うに構成されている。
Each of the heat transfer plate 11 and the heating plate 15 constituting the cooling plate 6 has a structure shown in FIG.
As shown in the perspective view of the main part of (a heating plate 15 here), three recesses are formed in a positional relationship of the vertices of an equilateral triangle, and each of the recesses has a ball 16.
Is placed. Each of the balls 16 is made of, for example, a low heat transfer member such as alumina or matateite, and the upper side of the balls 16 is protruded from the upper surface of the heating plate 15 by a minute amount. The substrate W is placed and supported on the balls 16 in a state where there is a gap, so that the substrate W can be uniformly heated or cooled.

【0019】加熱プレート15の下面とピン取付部材9
との間に、貫通孔7…に連なる閉空間Sを形成するよう
に伸縮部材(ベローズ)17が設けられ、かつ、ピン取
付部材9に、閉空間Sに連なるように、その閉空間S内
の圧力が外部の圧力より高くなった時に開き、一方、閉
空間S内の圧力が外部の圧力より低くなった時に閉じる
排気弁としての逆止弁18が設けられ、閉空間S内から
外部への排気のみを許容するように構成されている。冷
却プレート6を構成する水冷板12とピン取付部材9と
の間においても同じ構成が採用されている。
The lower surface of the heating plate 15 and the pin mounting member 9
Is provided with an elastic member (bellows) 17 so as to form a closed space S connected to the through-holes 7, and the pin mounting member 9 is provided in the closed space S so as to be connected to the closed space S. Is opened when the pressure in the closed space S becomes higher than the external pressure, while a check valve 18 is provided as an exhaust valve which closes when the pressure in the closed space S becomes lower than the external pressure. It is configured to allow only the exhaust of the air. The same configuration is employed between the water cooling plate 12 and the pin mounting member 9 that constitute the cooling plate 6.

【0020】上記構成により、基板Wを載置支持した状
態の基板支持ピン8…を下降するときに、図3の(a)
の下降動作を説明する断面図に示すように、逆止弁18
が閉じたままで伸縮部材17が伸長し、それに伴って閉
空間S内が負圧となり、貫通孔7…を通じて加熱プレー
ト15(または冷却プレート6)上の空気を吸引し、基
板Wと加熱プレート15との間の空気を吸引除去するか
ら、基板Wが浮くことを解消でき、基板Wを横滑りを生
じることなく鉛直方向に下降させることができる。一
方、基板支持ピン8…を上昇するときには、図3の
(b)の上昇動作を説明する断面図に示すように、閉空
間S内の容積が減少して、その内圧が高くなるが、それ
に伴って逆止弁18が開いて排気され、貫通孔7…から
基板W側に排気圧を付与せずに基板Wを上昇することが
できる。
With the above configuration, when the substrate supporting pins 8 with the substrate W placed and supported thereon are lowered, FIG.
As shown in the sectional view for explaining the lowering operation of the check valve 18,
The expansion and contraction member 17 extends while the closed state is maintained, and the inside of the closed space S becomes negative pressure, thereby sucking air on the heating plate 15 (or the cooling plate 6) through the through holes 7. The substrate W can be prevented from floating, and the substrate W can be lowered in the vertical direction without causing side slip. On the other hand, when the substrate support pins 8 are raised, the volume in the closed space S decreases and the internal pressure increases as shown in the cross-sectional view illustrating the raising operation of FIG. Accordingly, the check valve 18 is opened and exhausted, and the substrate W can be lifted without applying exhaust pressure from the through holes 7 to the substrate W side.

【0021】なお、ピン昇降手段としてエアシリンダを
使用し、その作動を低速で行うと、エアシリンダの特性
として動作速度が安定性に欠けるものとなってしまう不
都合が避け難いものであるが、ところが、本考案では、
基板支持ピン8…の下降速度を速くしても基板が横方向
に滑ることがないので、エアシリンダを高速で使用でき
るから、ピン昇降手段にエアシリンダを使用した場合で
も、昇降動作が不安定になることを回避でき、好都合で
ある。
If an air cylinder is used as the pin lifting and lowering means and its operation is performed at a low speed, it is unavoidable that the operation speed of the air cylinder lacks stability as a characteristic of the air cylinder. In the present invention,
Even if the lowering speed of the substrate support pins 8 is increased, the substrate does not slide in the horizontal direction, so that the air cylinder can be used at a high speed. Therefore, even when the air cylinder is used as the pin elevating means, the elevating operation is unstable. Can be avoided, which is convenient.

【0022】上述実施例では、基板支持ピン8…を上昇
するに伴って伸縮部材17で形成した閉空間S内の圧力
が外部の圧力よりも高くなったときに、閉空間S内から
外部に排気するために、逆止弁18を設けているが、本
考案としては、例えば、逆止弁18に代えて排気弁とし
ての電磁開閉弁を設け、一方、基板支持ピン8…の上昇
動作を検出するセンサを設けるとともに、そのセンサと
電磁開閉弁とを連係し、基板支持ピン8の上昇時にのみ
電磁開閉弁を自動的に開くように構成するものでも良
い。
In the above embodiment, when the pressure in the closed space S formed by the elastic member 17 becomes higher than the external pressure as the substrate support pins 8 are raised, the closed space S is moved out of the closed space S. The check valve 18 is provided for exhausting the gas. However, in the present invention, for example, an electromagnetic opening / closing valve as an exhaust valve is provided instead of the check valve 18, while the raising operation of the substrate support pins 8. In addition to providing a sensor for detection, the sensor and the electromagnetic on / off valve may be linked to each other so that the electromagnetic on / off valve is automatically opened only when the substrate support pin 8 is raised.

【0023】また、基板支持ピン8…を昇降するのに、
上記実施例ではエアシリンダ10を用いているが、例え
ば、ピン取付部材9にロッドを突設するとともに、その
ロッドにネジを形成し、一方、そのネジに噛み合う内ネ
ジを形成した内ネジ部材を電動モータで回転するように
構成した、いわゆるボールネジの構成など各種のピン昇
降手段が適用できる。
Further, when raising and lowering the substrate support pins 8,...
Although the air cylinder 10 is used in the above embodiment, for example, a rod is protruded from the pin mounting member 9 and a screw is formed on the rod, while an internal screw member formed with an internal screw meshing with the screw is used. Various pin lifting / lowering means such as a so-called ball screw configuration configured to rotate with an electric motor can be applied.

【0024】本考案は、上述実施例のようなボール16
…を設けずに、冷却プレート6または加熱プレート15
に密着させて基板Wを載置するタイプの基板熱処理装置
にも適用できる。
According to the present invention, the ball 16 as in the above embodiment is used.
.. Are not provided, and the cooling plate 6 or the heating plate 15 is not provided.
It can also be applied to a substrate heat treatment apparatus of a type in which a substrate W is placed in close contact with a substrate.

【0025】[0025]

【考案の効果】以上説明したように、本考案の基板熱処
理装置によれば、基板を載置して基板支持ピンを下降す
るときに、基板と熱板との間の空気を吸引除去するか
ら、基板の下降速度を高速にしても、基板支持ピンから
基板が浮く状態になることを回避できるとともに、熱板
側への載せ替え時の横方向への滑りを防止できる。した
がって、基板の処理効率を向上できる。
As described above, according to the substrate heat treatment apparatus of the present invention, when the substrate is placed and the substrate support pins are lowered, the air between the substrate and the hot plate is suctioned and removed. Even if the lowering speed of the substrate is increased, it is possible to prevent the substrate from floating from the substrate support pins and to prevent the substrate from slipping in the horizontal direction when the substrate is replaced on the hot plate side. Therefore, the processing efficiency of the substrate can be improved.

【0026】しかも、基板支持ピンを上昇するときに
は、排気弁により排気しているので、熱板の上側方向に
排気圧を付与することがなく、貫通孔の下方から上方に
向けての気流を発生させることが無い。したがって、下
方から塵埃が混じった空気を熱板上に送り込むことがな
く、基板を汚染してしまうことが無い。
In addition, when the substrate support pins are lifted, the exhaust gas is exhausted by the exhaust valve, so that an exhaust pressure is not applied to the upper side of the hot plate, and an air current is generated from below the through hole upward. I won't let you. Therefore, air mixed with dust from below is not sent to the hot plate, and the substrate is not contaminated.

【0027】また、上述のように、基板と熱板との間の
空気を吸引除去するために真空ポンプなどの強制的な吸
気手段をせずに済み、全体として、貫通孔に連なる閉空
間を形成する伸縮部材と排気弁とを設けるだけの簡単な
構成の付加でありながら、基板を横滑りさせずに熱板上
の所定の位置に正確に降下させて支持でき、良好な処理
が行える。
Further, as described above, forcibly removing the air between the substrate and the hot plate, there is no need to use a forced suction means such as a vacuum pump. With the addition of a simple configuration in which the formed elastic member and the exhaust valve are provided, the substrate can be accurately lowered and supported at a predetermined position on the hot plate without side-sliding, and favorable processing can be performed.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本考案の実施例を示す全体縦断面図である。FIG. 1 is an overall vertical sectional view showing an embodiment of the present invention.

【図2】要部の斜視図である。FIG. 2 is a perspective view of a main part.

【図3】動作説明のための要部の断面図である。FIG. 3 is a sectional view of a main part for describing an operation.

【符号の説明】[Explanation of symbols]

6…熱板としての冷却プレート 7…貫通孔 8…基板支持ピン 9…ピン取付部材 10…ピン昇降手段としてのエアシリンダ 15…熱板としての加熱プレート 17…伸縮部材 18…排気弁としての逆止弁 S…閉空間 W…基板 Reference Signs List 6 Cooling plate as hot plate 7 Through hole 8 Board support pin 9 Pin mounting member 10 Air cylinder as pin elevating means 15 Heating plate as hot plate 17 Telescopic member 18 Reversed as exhaust valve Stop valve S: closed space W: board

───────────────────────────────────────────────────── フロントページの続き (56)参考文献 特開 平4−158511(JP,A) 特開 平4−56146(JP,A) 特開 平4−142027(JP,A) 特開 平2−238616(JP,A) 特開 平2−196416(JP,A) 特開 平2−187015(JP,A) 特開 平6−244095(JP,A) 実開 平6−77231(JP,U) (58)調査した分野(Int.Cl.6,DB名) H01L 21/027 G11B 7/26 H01L 21/324 H01L 21/68 ────────────────────────────────────────────────── ─── Continuation of front page (56) References JP-A-4-158511 (JP, A) JP-A-4-56146 (JP, A) JP-A-4-142027 (JP, A) JP-A-2- 238616 (JP, A) JP-A-2-196416 (JP, A) JP-A-2-187015 (JP, A) JP-A-6-244095 (JP, A) JP-A-6-77231 (JP, U) (58) Field surveyed (Int.Cl. 6 , DB name) H01L 21/027 G11B 7/26 H01L 21/324 H01L 21/68

Claims (1)

(57)【実用新案登録請求の範囲】(57) [Scope of request for utility model registration] 【請求項1】 加熱手段または冷却手段のうちの少なく
とも一方を備えた熱板と、 前記熱板に形成した貫通孔に設けられて前記熱板よりも
上方位置で基板を載置する基板支持ピンと、 前記基板支持ピンを前記熱板の上面より上方の位置と下
方の位置とに昇降するピン昇降手段とを備えた基板熱処
理装置において、 前記熱板の下面と前記基板支持ピンを設けたピン取付部
材との間に、前記貫通孔に連なる閉空間を形成する伸縮
部材を設け、前記閉空間に連ねて、前記閉空間内から外
部への排気のみを許容する排気弁を設けてあることを特
徴とする基板熱処理装置。
A heating plate provided with at least one of a heating unit and a cooling unit; and a substrate support pin provided in a through hole formed in the heating plate and mounting the substrate at a position above the heating plate. A substrate heat treatment apparatus comprising: a pin elevating means for elevating and lowering the substrate support pins to a position above and below the upper surface of the hot plate; a pin mounting provided with the lower surface of the heat plate and the substrate support pins. A member is provided with a telescopic member that forms a closed space connected to the through hole, and an exhaust valve connected to the closed space and allowing only exhaust from the inside of the closed space to the outside is provided. Substrate heat treatment apparatus.
JP1993023799U 1993-04-09 1993-04-09 Substrate heat treatment equipment Expired - Fee Related JP2594127Y2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1993023799U JP2594127Y2 (en) 1993-04-09 1993-04-09 Substrate heat treatment equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1993023799U JP2594127Y2 (en) 1993-04-09 1993-04-09 Substrate heat treatment equipment

Publications (2)

Publication Number Publication Date
JPH0679140U JPH0679140U (en) 1994-11-04
JP2594127Y2 true JP2594127Y2 (en) 1999-04-19

Family

ID=12120376

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1993023799U Expired - Fee Related JP2594127Y2 (en) 1993-04-09 1993-04-09 Substrate heat treatment equipment

Country Status (1)

Country Link
JP (1) JP2594127Y2 (en)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH11297789A (en) * 1998-04-09 1999-10-29 Tokyo Electron Ltd Treating device
KR100574058B1 (en) * 2004-08-20 2006-04-27 삼성전자주식회사 Wafer bake apparatus
JP5542743B2 (en) * 2010-10-07 2014-07-09 東京エレクトロン株式会社 Heat treatment apparatus and heat treatment method
KR102504269B1 (en) * 2021-11-11 2023-02-28 피에스케이 주식회사 Support unit, and apparatus for treating substrate with the same

Also Published As

Publication number Publication date
JPH0679140U (en) 1994-11-04

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