JP2570489B2 - Jet plating equipment - Google Patents

Jet plating equipment

Info

Publication number
JP2570489B2
JP2570489B2 JP2274844A JP27484490A JP2570489B2 JP 2570489 B2 JP2570489 B2 JP 2570489B2 JP 2274844 A JP2274844 A JP 2274844A JP 27484490 A JP27484490 A JP 27484490A JP 2570489 B2 JP2570489 B2 JP 2570489B2
Authority
JP
Japan
Prior art keywords
jet
plating solution
plating
anode
chamber
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP2274844A
Other languages
Japanese (ja)
Other versions
JPH04154989A (en
Inventor
清 浅川
裕 杉浦
輝幸 堀田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
C.UYEMURA&CO.,LTD.
Original Assignee
C.UYEMURA&CO.,LTD.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by C.UYEMURA&CO.,LTD. filed Critical C.UYEMURA&CO.,LTD.
Priority to JP2274844A priority Critical patent/JP2570489B2/en
Publication of JPH04154989A publication Critical patent/JPH04154989A/en
Application granted granted Critical
Publication of JP2570489B2 publication Critical patent/JP2570489B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は、半導体ウエハー等の被めっき物に電気めっ
き液を噴き付けて被めっき物を電気めっきする噴流式め
っき装置に関する。
Description: TECHNICAL FIELD The present invention relates to a jet plating apparatus for spraying an electroplating solution onto an object such as a semiconductor wafer to electroplate the object.

〔従来の技術〕[Conventional technology]

従来より、半導体ウエハー等の被めっき物に電気めっ
きを行う場合、筒状セルの上端部に被めっき物を配置す
ると共に、該筒状セル内の下部に陽極を配設し、上記筒
状セル内に電気めっき液を噴き上げて、上記被めっき物
の下面にめっき液を噴き付けつつ該下面を電気めっきす
る噴流式めっき方法が知られており、この噴流式めっき
方法は特に半導体ウエハーにめっき膜を厚さ50μm程度
に盛り上げてバンプ電極を形成する場合に有効である。
Conventionally, when performing electroplating on an object to be plated such as a semiconductor wafer, the object to be plated is arranged at the upper end of the cylindrical cell, and an anode is arranged at a lower part in the cylindrical cell. There is known a jet plating method in which an electroplating solution is blown up into the inside, and the lower surface is electroplated while the plating solution is sprayed on the lower surface of the object to be plated. Is effective when the bump electrodes are formed by raising the thickness to about 50 μm.

かかる噴流式めっき装置としては、従来、第2図に示
すようなものが使用されている。即ち、第2図の噴流式
めっき装置aは、筒状カバーb内に筒状セルcを配設
し、該セルcの上端内周縁部に形成されたリング状段部
dに被めっき物eをセルcの上端開口部を閉塞するよう
に載置すると共に、セルc内下部に陽極fを配し、かつ
セルcの下端部にめっき液噴出パイプgを連結し、セル
cの側壁上部に上記段部dの下側近傍に存して複数個の
めっき液排出口hを形成してなるもので、めっき液貯槽
iのめっき液がポンプ(図示せず)の作動によりめっき
液を噴出パイプgからセルc内に噴き上げ、被めっき物
eの下面にめっき液を噴き付けつつめっきを行うもので
ある。この場合、被めっき物eに噴き付けられためっき
液はめっき液排出口hからカバーb内に流入し、このカ
バーb内と連通する集取パイプjを通ってめっき液貯槽
iに戻されるようになっている。
Conventionally, such a jet plating apparatus as shown in FIG. 2 has been used. That is, in the jet plating apparatus a shown in FIG. 2, a cylindrical cell c is disposed in a cylindrical cover b, and a plating step e is formed on a ring-shaped step d formed at an upper inner peripheral edge of the cell c. Is placed so as to close the upper end opening of the cell c, an anode f is arranged in the lower part of the cell c, and a plating solution jetting pipe g is connected to the lower end of the cell c. A plurality of plating solution discharge ports h are formed in the vicinity of the lower side of the step d, and the plating solution in the plating solution storage tank i ejects the plating solution by the operation of a pump (not shown). g is sprayed into the cell c from g, and plating is performed while spraying a plating solution on the lower surface of the workpiece e. In this case, the plating solution sprayed on the plating object e flows into the cover b from the plating solution discharge port h, and is returned to the plating solution storage tank i through the collecting pipe j communicating with the inside of the cover b. It has become.

〔発明が解決しようとする課題〕[Problems to be solved by the invention]

しかし、上述した従来の噴流式めっき装置は次のよう
な問題が生じるものであった。即ち、上記めっき操作中
において陽極からガスやスライムが発生するが、これら
ガス或いはスライムがめっき液噴流に同伴して被めっき
物に付着する場合がしばしば生じ、このため部分的に無
めっき状態になったり、めっき膜厚が不均一になった
り、異物が付着し、ザラつきが生じたりするなどの不良
が発生した。また、このようなガスの付着を防止するた
め、半導体ウエハーにバンプ電極を形成する場合などに
おいては、陽極で発生するガスが被めっき物のめっき面
に滞留するのをふせぐため噴流量を多くすることが行わ
れているが、噴流量を多くするとバンプの形状が不良に
なるという問題がある上、噴流量を多くしても陽極スラ
イムの被めっき面への付着の問題は十分解消し得ない。
However, the conventional jet plating apparatus described above has the following problems. That is, during the plating operation, gas or slime is generated from the anode, and the gas or slime often accompanies the object to be plated accompanying the jet of the plating solution, and as a result, a partial plating state is caused. In addition, defects such as uneven plating, uneven plating film thickness, adhesion of foreign matter, and roughening occurred. Further, in order to prevent such a gas from adhering, for example, when forming a bump electrode on a semiconductor wafer, the jet flow rate is increased to prevent gas generated at the anode from staying on the plating surface of the object to be plated. However, there is a problem that the shape of the bump becomes poor when the jet flow rate is increased, and the problem of the anode slime adhering to the surface to be plated cannot be sufficiently solved even if the jet flow rate is increased. .

本発明は上記事情に鑑みなされたもので、陽極で発生
するガスやスライムが被めっき物に付着することによる
めっき不良が防止され、めっき液の噴流量を少なくして
も、発生するガスがワーク表面に滞留することが防止さ
れた噴流式めっき装置を提供することを目的とする。
The present invention has been made in view of the above circumstances, and prevents gas or slime generated at an anode from adhering to a plating object, thereby preventing plating defects. It is an object of the present invention to provide a jet plating apparatus that is prevented from staying on the surface.

〔課題を解決するための手段〕[Means for solving the problem]

本発明は上記目的を達成するため、有底筒状カバー内
に配設された筒状セルの上端部に被めっき物を配置する
と共に、該筒状セル内の下部に陽極を配設し、上記筒状
セル内に電気めっき液を噴き上げて、上記被めっき物の
下面にめっき液を噴き付けつつ該下面を電気めっきする
噴流式めっき装置において、上記筒状セル内に該セル内
を上下に仕切る如く多数の微細孔を有する隔膜を配設
し、該隔膜の微細孔を介して互いに連通する上側噴流室
と下側陽極室とを上記筒状セル内に形成し、上記噴流室
の上端部に被めっき物を配置すると共に、該噴流室にめ
っき液を噴出させる噴出パイプを設け、かつ上記筒状セ
ルに噴流室と上記カバー内とを連通するめっき液排出口
を形成する一方、上記陽極室に陽極を配設すると共に、
該陽極室に上記めっき液と同じめっき液を導入する導入
パイプを設け、かつ陽極室と上記カバー内とを連通する
めっき液流出口を形成し、上記カバーにはめっき液集取
パイプを連結したことを特徴とする噴流式めっき装置と
したものである。
In order to achieve the above object, the present invention arranges an object to be plated at an upper end portion of a cylindrical cell disposed in a bottomed cylindrical cover, and arranges an anode at a lower portion in the cylindrical cell, In a jet plating apparatus for spraying an electroplating solution into the cylindrical cell and electroplating the lower surface while spraying a plating solution on the lower surface of the object to be plated, the inside of the cell is vertically moved into the cylindrical cell. A diaphragm having a large number of micropores is provided so as to partition, and an upper jet chamber and a lower anode chamber communicating with each other through the micropores of the diaphragm are formed in the cylindrical cell, and an upper end of the jet chamber is formed. An object to be plated, a jet pipe for jetting a plating solution into the jet chamber, and a plating solution discharge port for communicating the jet chamber with the inside of the cover in the tubular cell, With the anode in the room,
An introduction pipe for introducing the same plating solution as the plating solution was provided in the anode chamber, and a plating solution outlet communicating the anode chamber and the inside of the cover was formed. A plating solution collection pipe was connected to the cover. This is a jet type plating apparatus characterized by the above.

〔作用〕[Action]

本発明の噴流式めっき装置によれば、有底筒状カバー
内に配設された筒状セル内に該セル内を上下に仕切る如
く多数の微細孔を有する隔膜を配設し、該隔膜の微細孔
を介して互いに連通する上側噴流室と下側陽極室とを上
記筒状セル内に形成し、上記噴流室の上端部に被めっき
物を配置すると共に、上記陽極室に陽極を配設したの
で、陽極から発生するガスやスライムは陽極の上方に存
する隔膜によって噴流室に流入することが遮断され、こ
のためガスやスライムが被めっき物に付着することがな
く、従って、ガスやスライムが被めっき物の付着するこ
とによるめっき不良が確実に防止され、しかもガスがワ
ークに付着することがないので噴流量を少なくし得、こ
れによりめっき膜の厚さ等の均一化が計られる。
According to the jet plating apparatus of the present invention, a diaphragm having a large number of micropores is disposed in a cylindrical cell disposed in a bottomed cylindrical cover so as to partition the cell up and down. An upper jet chamber and a lower anode chamber communicating with each other through the fine holes are formed in the cylindrical cell, and an object to be plated is arranged at an upper end of the jet chamber, and an anode is arranged in the anode chamber. As a result, the gas and slime generated from the anode are blocked from flowing into the jet chamber by the diaphragm located above the anode, so that the gas and slime do not adhere to the object to be plated. Insufficient plating due to the adherence of the object to be plated is reliably prevented, and since the gas does not adhere to the work, the jet flow rate can be reduced, thereby making the thickness of the plating film uniform and the like.

また、噴流室にはめっき液を噴出させる噴出パイプを
設け、この噴出パイプからめっき液を噴流室に噴出させ
るようにすると共に、噴流室に連通してめっき液排出口
を設けたので、噴流室のめっき液噴流の流通は良好なも
ので、このため被めっき物を良好に噴流めっきし得、し
かも陽極室には陽極椎にめっき液を導入する導入パイプ
を設けると共に陽極室に連通してめっき液流出口を設
け、上記噴流室におけるめっき液の流通とは別個にめっ
き液を流通させるようにしたので、陽極室内においてめ
っき液が滞留して陽極から発生したガスが隔膜に付着
し、被めっき物と陽極との間の導通が阻害されることも
少なく、ガスは陽極室からスムーズに逃げ出すので、こ
の点からも良好なめっきが保証されるものである。ま
た、有底筒状カバーにはめっき液集取パイプが連結さ
れ、めっき液貯槽に戻されるようになっており、循環使
用される。
In addition, the jet chamber is provided with an ejection pipe for ejecting the plating solution, and the plating solution is ejected from the ejection pipe to the jet chamber, and the plating solution discharge port is provided in communication with the jet chamber. The flow of the plating solution jet is good, so that the object to be plated can be satisfactorily spray-plated, and the anode chamber is provided with an introduction pipe for introducing the plating solution into the anode vertebrae and communicates with the anode chamber to perform plating. A liquid outlet is provided to allow the plating solution to flow separately from the flow of the plating solution in the jet chamber, so that the plating solution stays in the anode chamber and gas generated from the anode adheres to the diaphragm, and the plating target Since the conduction between the object and the anode is hardly hindered, and the gas escapes smoothly from the anode chamber, good plating is also guaranteed from this point. A plating solution collecting pipe is connected to the bottomed cylindrical cover, and is returned to the plating solution storage tank, so that it is circulated.

以下、本発明の一実施例につき第1図を参照して説明
する。
Hereinafter, an embodiment of the present invention will be described with reference to FIG.

〔実施例〕〔Example〕

図中1は本発明の一実施例に係る噴流式めっき装置を
示すもので、このめっき装置1は、有底筒状カバー2と
その内部に配設された有底の筒状セル3を具備する。こ
の筒状セル3内には、軸方向ほぼ中央部に径方向に沿っ
て該セル3内を上下に二分する如く円形状の隔膜支え板
4が配設されていると共に、この支え板4の下面には多
数微細孔を有する隔膜5が取り付けられており、上記セ
ル3内に上側噴流室6と下側陽極室7が形成されてい
る。なお、これら両室6,7は上記支え板4にその周方向
に沿って穿設された複数の連通孔8及び上記隔膜5の微
細孔を介して互いに連通している。
1 shows a jet plating apparatus according to one embodiment of the present invention. The plating apparatus 1 includes a bottomed cylindrical cover 2 and a bottomed cylindrical cell 3 disposed therein. I do. In this cylindrical cell 3, a circular diaphragm supporting plate 4 is disposed at a substantially central portion in the axial direction so as to vertically divide the inside of the cell 3 along the radial direction. A diaphragm 5 having a large number of fine holes is attached to the lower surface, and an upper jet chamber 6 and a lower anode chamber 7 are formed in the cell 3. The two chambers 6 and 7 communicate with each other through a plurality of communication holes 8 formed in the support plate 4 along the circumferential direction thereof and fine holes in the diaphragm 5.

上記噴流室6の上端部(上記セル3の上端内周縁)に
はリング状段部9が形成され、この段部9に被めっき物
10が載置されると共に、めっき液噴出パイプ11の先端部
が上記セル3の下端面中央部及び隔膜5、隔膜支え板4
の中央部をそれぞれ貫通して噴流室6内に突出し、めっ
き液貯槽12内のめっき液がポンプ13の作動により上記噴
出パイプ11内を通って噴流室6に噴き上げられ、上記被
めっき物10の下面に噴き付けられるようになっている。
また、上記セル3の側壁上部には上記段部9の下側にこ
れと近接して上記噴流室6の上部とカバー2内とを連通
するめっき液排出口14が形成されている。
A ring-shaped step 9 is formed at the upper end of the jet chamber 6 (the inner peripheral edge of the upper end of the cell 3).
10 is placed, and the tip of the plating solution jetting pipe 11 is positioned at the center of the lower end face of the cell 3 and the diaphragm 5 and the diaphragm support plate 4.
The plating solution in the plating solution storage tank 12 is blown up by the operation of the pump 13 into the jet flow chamber 6 by the operation of the pump 13, and the plating object 10 It can be sprayed on the lower surface.
In addition, a plating solution discharge port 14 is formed in the upper part of the side wall of the cell 3 below the stepped part 9 and in close proximity to the stepped part 9 to communicate the upper part of the jet chamber 6 with the inside of the cover 2.

上記陽極室7には、その下部に陽極15が配設されてい
ると共に、上記セル3の下端面周縁部に形成した透孔16
にめっき液導入パイプ17の一端が連結され、上記めっき
液貯槽12内のめっき液がポンプ18の作動により陽極室7
内にめっき液が導入されるようになっている。更に、セ
ル3の側壁には、上記隔膜5の下側に近接し、かつ上記
めっき液導入パイプとほぼ対向した位置においてめっき
液流出口19が形成されていると共に、この流出口19にめ
っき液流出パイプ20の一端が連結され、陽極室7内のめ
っき液はこの流出パイプ20内を通ってその他端からカバ
ー2内に流出するようになっている。
The anode chamber 7 is provided with an anode 15 at a lower portion thereof and a through hole 16 formed in a peripheral portion of a lower end surface of the cell 3.
One end of a plating solution introduction pipe 17 is connected to the anode chamber 7 by the operation of a pump 18.
A plating solution is introduced therein. Further, a plating solution outlet 19 is formed on the side wall of the cell 3 at a position close to the lower side of the diaphragm 5 and substantially opposite to the plating solution introduction pipe. One end of the outflow pipe 20 is connected, and the plating solution in the anode chamber 7 passes through the outflow pipe 20 and flows out of the other end into the cover 2.

なお、上記カバー2にはめっき液集取パイプ21が連結
され、上記噴流室6及び陽極室7から排出されためっき
液が集取パイプ21を通って上記めっき液貯槽12に戻され
るようになっている。
A plating solution collecting pipe 21 is connected to the cover 2 so that the plating solution discharged from the jet chamber 6 and the anode chamber 7 is returned to the plating solution storage tank 12 through the collecting pipe 21. ing.

ここで、上記隔膜5はポリプロピレン等の材質のもの
が使用でき、市販品としてはカネカロン5000(鐘淵化学
工業(株)製、商品名)などを用いることができる。な
お、厚さは0.1〜0.5mmのものが好適である。また、陽極
15は可溶性陽極であっても不溶性陽極であってもよい。
Here, the diaphragm 5 can be made of a material such as polypropylene, and a commercially available product such as Kanecaron 5000 (trade name, manufactured by Kaneka Chemical Industry Co., Ltd.) can be used. The thickness is preferably 0.1 to 0.5 mm. Also the anode
15 may be a soluble anode or an insoluble anode.

次に、上記噴流式めっき装置を用いて被めっき物10に
電気めっきを行う場合、被めっき物10を噴流室6の上端
部に配置した後、ポンプ13,18をそれぞれ作動させ、め
っき液を噴出パイプ11から噴流室6内の上方に噴き上
げ、被めっき物10下面に噴きつけると共に、めっき液を
めっき液導入パイプ17から陽極室7に導入する。この場
合、噴流室6を流れるめっき液の流速は一般に0.3〜0.6
m/min、陽極室7を流れるめっき液の流速は0.1〜0.3m/m
inとすることが好適である。被めっき物10下面に噴き付
けられためっき液は被めっき物10の下面の沿って側方に
流れ、めっき液排出口14からカバー2へ排出される。一
方、めっき液導入パイプ17から陽極室7へ導入されため
っき液は上方に流れ、次いで隔膜5の下面に沿って流れ
て流出パイプ20からカバー内に流出される。これらの噴
流室6及び陽極室7から排出及び流出されためっき液は
次いで集取パイプ21を通ってめっき液貯槽12に戻され、
再び噴出パイプ11及びめっき液導入パイプ17に送られ、
循環使用される。
Next, when electroplating the object to be plated 10 by using the above-mentioned jet plating apparatus, after the object to be plated 10 is arranged at the upper end of the jet chamber 6, the pumps 13 and 18 are respectively operated to supply the plating solution. The plating solution is blown upward from the ejection pipe 11 into the jet chamber 6 and sprayed on the lower surface of the plating object 10, and the plating solution is introduced into the anode chamber 7 from the plating solution introduction pipe 17. In this case, the flow rate of the plating solution flowing through the jet chamber 6 is generally 0.3 to 0.6.
m / min, the flow rate of the plating solution flowing through the anode chamber 7 is 0.1 to 0.3 m / m
It is preferable to be in. The plating solution sprayed on the lower surface of the plating object 10 flows laterally along the lower surface of the plating object 10 and is discharged from the plating solution discharge port 14 to the cover 2. On the other hand, the plating solution introduced into the anode chamber 7 from the plating solution introduction pipe 17 flows upward, then flows along the lower surface of the diaphragm 5, and flows out of the outflow pipe 20 into the cover. The plating solution discharged and discharged from the jet chamber 6 and the anode chamber 7 is then returned to the plating solution storage tank 12 through the collection pipe 21,
It is sent again to the ejection pipe 11 and the plating solution introduction pipe 17,
Used for circulation.

上記噴流式めっき装置1によれば、陽極15で発生する
ガスやスライムは陽極15の上方に存する隔膜5により陽
極室7から噴流室6への移動が遮られ、被めっき物10に
これらが付着することを有効に防止でき、それ故ガスや
スライムが被めっき物に付着することから生じる不良の
発生が可及的に防止できる。また、隔膜5によって遮ら
れ、隔膜5の下面に到達したガスやスライムはめっき液
にともなって隔膜5の下面に沿って流れ、隔膜5の下面
に滞留することなく陽極室7から速やかに流出されるの
で、ガスが隔膜5に付着し、被めっき物10と陽極15との
間の導通を阻害することが防止される。またこの場合、
ガスが被めっき物に付着することが防止されるため、被
めっき物10に噴き付けるめっき液量を少なくすることが
でき、これによってバンプを形成する場合においてバン
プ形状を均一化することができる。
According to the jet plating apparatus 1, the gas and slime generated at the anode 15 are prevented from moving from the anode chamber 7 to the jet chamber 6 by the diaphragm 5 located above the anode 15, and these adhere to the object 10 to be plated. This can effectively prevent the occurrence of defects caused by the gas or slime adhering to the object to be plated. Further, the gas or slime that is blocked by the diaphragm 5 and reaches the lower surface of the diaphragm 5 flows along the lower surface of the diaphragm 5 with the plating solution, and quickly flows out of the anode chamber 7 without staying on the lower surface of the diaphragm 5. Therefore, the gas is prevented from adhering to the diaphragm 5 and hindering the conduction between the object 10 to be plated and the anode 15. Also in this case,
Since the gas is prevented from adhering to the object to be plated, the amount of the plating solution sprayed onto the object to be plated 10 can be reduced, whereby the bump shape can be made uniform when the bumps are formed.

実際、第1図に示す如き噴流式めっき装置1を用いて
ダイオード半導体ウエハーに50μm程度のバンプ電極の
形成を試みた。まず、ダイオード半導体ウエハーに下地
めっきとしてニッケルめっきを行い、次にその上に銀バ
ンプを形成したが、この場合、ニッケルめっきにおいて
は陽極15を可溶性のニッケル、銀めっきにおいては陽極
15を不溶性の白金としたが、いずれの場合もガスの付着
はなく、また前者においてはスライムの付着もなく、良
好な形状の銀バンプ電極をダイオード半導体ウエハーに
めっき不良を生じることなく形成することができた。
Actually, an attempt was made to form a bump electrode of about 50 μm on a diode semiconductor wafer by using a jet plating apparatus 1 as shown in FIG. First, the diode semiconductor wafer was nickel-plated as a base plating, and then a silver bump was formed thereon. In this case, the anode 15 was used for the nickel plating, and the anode 15 was used for the silver plating.
15 was insoluble platinum, but in each case, there was no gas adhesion, and in the former, there was no slime adhesion, and a good-shaped silver bump electrode was formed on the diode semiconductor wafer without plating failure. Was completed.

なお、本発明装置において、被めっき物、めっき液噴
出パイプ、めっき液排出口、めっき液導入パイプ、めっ
き液排出パイプ等の配設態様は上記実施例に限定される
ものではなく、本発明の要旨を逸脱しない範囲で種々変
更して差し支えない。
In the apparatus of the present invention, the arrangement of the object to be plated, the plating solution ejection pipe, the plating solution discharge port, the plating solution introduction pipe, the plating solution discharge pipe, and the like is not limited to the above-described embodiment, and the present invention is not limited thereto. Various changes may be made without departing from the gist.

〔発明の効果〕〔The invention's effect〕

以上説明したように、本発明の噴流式めっき装置は、
上述した構成としたことにより、ガスやスライムの付着
によるめっき不良を有効に防止し得るものである。
As explained above, the jet plating apparatus of the present invention is:
With the above-described configuration, it is possible to effectively prevent plating defects due to the attachment of gas and slime.

【図面の簡単な説明】[Brief description of the drawings]

第1図は本発明の噴流式めっき装置の一例を示す一部省
略断面図、第2図は従来の噴流式めっき装置を示す一部
省略断面図である。 1……噴流式めっき装置、3……セル、5……隔膜、6
……噴流室、7……陽極室、10……被めっき物、11……
噴出パイプ、14……めっき液排出口、15……陽極、17…
…めっき液導入パイプ、20……めっき液流出パイプ、21
……集取パイプ。
FIG. 1 is a partially omitted sectional view showing an example of a jet plating apparatus of the present invention, and FIG. 2 is a partially omitted sectional view showing a conventional jet plating apparatus. 1 ... jet type plating apparatus, 3 ... cell, 5 ... diaphragm, 6
… Jet chamber, 7… Anode chamber, 10… Plating object, 11…
Ejection pipe, 14… Plating solution outlet, 15… Anode, 17…
… Plating solution introduction pipe, 20 …… Plating solution outflow pipe, 21
...... Collecting pipe.

───────────────────────────────────────────────────── フロントページの続き (56)参考文献 特開 昭62−297495(JP,A) 特開 昭63−216998(JP,A) ──────────────────────────────────────────────────続 き Continuation of the front page (56) References JP-A-62-297495 (JP, A) JP-A-63-216998 (JP, A)

Claims (1)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】有底筒状カバー内に配設された筒状セルの
上端部に被めっき物を配置すると共に、該筒状セル内の
下部に陽極を配設し、上記筒状セル内に電気めっき液を
噴き上げて、上記被めっき物の下面にめっき液を噴き付
けつつ該下面を電気めっきする噴流式めっき装置におい
て、上記筒状セル内に該セル内を上下に仕切る如く多数
の微細孔を有する隔膜を配設し、該隔膜の微細孔を介し
て互いに連通する上側噴流室と下側陽極室とを上記筒状
セル内に形成し、上記噴流室の上端部に被めっき物を配
置すると共に、該噴流室にめっき液を噴出させる噴出パ
イプを設け、かつ上記筒状セルに噴流室と上記カバー内
とを連通するめっき液排出口を形成する一方、上記陽極
室に陽極を配設すると共に、該陽極室に上記めっき液と
同じめっき液を導入する導入パイプを設け、かつ陽極室
と上記カバー内とを連通するめっき液流出口を形成し、
上記カバーにはめっき液集取パイプを連結したことを特
徴とする噴流式めっき装置。
An object to be plated is disposed at an upper end of a cylindrical cell disposed in a bottomed cylindrical cover, and an anode is disposed at a lower part of the cylindrical cell. In a jet-type plating apparatus in which an electroplating solution is blown up and an electroplating solution is sprayed on the lower surface of the object to be plated while electroplating the lower surface, a large number of fine particles are formed in the cylindrical cell so as to partition the cell up and down. A diaphragm having holes is provided, and an upper jet chamber and a lower anode chamber communicating with each other through the fine holes of the diaphragm are formed in the cylindrical cell, and an object to be plated is formed at an upper end of the jet chamber. In addition, a jet pipe for jetting a plating solution is provided in the jet chamber, and a plating solution discharge port for communicating the jet chamber with the inside of the cover is formed in the cylindrical cell, and an anode is arranged in the anode chamber. And the same plating solution as the above plating solution was introduced into the anode chamber. Introducing pipes provided, and to form a plating liquid outlet port for communicating the anode chamber and in said cover,
A jet plating apparatus, wherein a plating solution collecting pipe is connected to the cover.
JP2274844A 1990-10-12 1990-10-12 Jet plating equipment Expired - Lifetime JP2570489B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2274844A JP2570489B2 (en) 1990-10-12 1990-10-12 Jet plating equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2274844A JP2570489B2 (en) 1990-10-12 1990-10-12 Jet plating equipment

Publications (2)

Publication Number Publication Date
JPH04154989A JPH04154989A (en) 1992-05-27
JP2570489B2 true JP2570489B2 (en) 1997-01-08

Family

ID=17547374

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2274844A Expired - Lifetime JP2570489B2 (en) 1990-10-12 1990-10-12 Jet plating equipment

Country Status (1)

Country Link
JP (1) JP2570489B2 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001316867A (en) * 2000-05-08 2001-11-16 Tokyo Electron Ltd Equipment and method for liquid treatment

Also Published As

Publication number Publication date
JPH04154989A (en) 1992-05-27

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