JP2564806Y2 - Visible light infrared light characteristic measuring instrument - Google Patents

Description

[Detailed description of the invention]

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a visible light / infrared light characteristic measuring device which irradiates a sample with light, detects reflected light and transmitted light thereof, and measures characteristics of the sample.

[0002]

2. Description of the Related Art By irradiating a material with visible light or near-infrared light, detecting reflected light or transmitted light, and analyzing the reflected light or transmitted light, the physical and chemical properties of the material are measured. Is used. As a detection element for detecting such reflected light or transmitted light, a Si element is used in a region mainly composed of visible light (400 to 1100 nm), and a PbS element is used in a near infrared region (1100 to 2500 nm). .

FIG. 6 shows a ratio detection ratio between a Si element and a PbS element with respect to wavelength. The ratio detection ratio shows characteristics at room temperature. S
The i element and the PbS element show the best characteristics in the respective wavelength regions. However, comparing the highest characteristic values, the Si element is one order of magnitude higher than the specific detection rate of the PbS element. In addition, the magnitude of the ratio detection ratio is reversed around 1100 nm.

As described above, since the characteristics of the detecting element differ depending on the wavelength, both the visible light region and the near-infrared light region (400 to 2500 nm) are used.
m) To perform the visible / near-infrared analysis, a Si device and PbS
Both detection elements of the element were arranged close to each other, and the reflected light or transmitted light from the sample was made into a horizontally long light by a slit, and this horizontally long light was simultaneously applied to both the Si element and the PbS element.

[0005] As described above, an apparatus for converting reflected light or transmitted light (hereinafter, referred to as sample information light) into oblong light through a slit is a type in which a sample is set in a sample setting unit integrated with a spectroscopic analyzer and measured. Has been adopted for
Therefore, the samples that can be set in the sample setting unit are limited. However, in recent years, objects that cannot be set in the sample setting section as they are, such as those flowing in pipes, living organisms, fruits, and the like, have been measured. For this reason, an optical fiber has come to be used for a path for irradiating the sample and a path for the sample information light. In the case of an optical fiber, the cross section is usually circular, and therefore, a method is used in which the sample information light is put into a slit and is not made into a horizontally long light, but is directly incident on the detection element. With this configuration, the sample information light in the visible light region is directly incident on the Si element, and the sample information light in the near infrared light region is directly incident on the PbS element, so that the connection position of the optical fiber corresponds to the measurement region. The connection was switched to the entrance of the detection element.

FIG. 4 shows a spectroscopic analyzer using such an optical fiber. (A) shows an apparatus using a transmitted light of a sample, and (b) shows an apparatus using a reflected light. A main body 1 of the spectroscopic analyzer emits light from a light source and processes an output of a detection unit 2 that detects sample information light. The detection unit 2 has both a Si element and a PbS element, converts the sample information light into an electric signal, and performs an amplification process. The sample 3 to be inspected is irradiated with light from the irradiation optical fiber 5, and in the case of (a), transmitted light is emitted, and in the case of (b), reflected light is emitted as sample information light. The sample information light optical fiber 6 inputs the sample information light directly from the sample 3 in (a), and outputs the sample information light from the splitter 7 in (b) to the detection unit 2. The input / output optical fiber 8 has a double structure that guides irradiation light at the periphery and guides sample information light from the sample 3 at the center. The splitter 7 splits the irradiation light fiber and the sample information light fiber. The personal computer 4 has a display screen, and analyzes and displays information of the sample information light.

FIG. 5 is a diagram showing the connection between the detection unit 2 and the optical fiber 6 for sample information light. An Si element and a PbS element are arranged close to each other in the detection element block 12, and the output is amplified by the amplifier 13. The joint block 9 has two joint openings 10 for engaging with the optical fiber 6 for sample information light, and the lower space 11 is fitted with the detection element block 12. The optical fiber 6 for sample information light is joined to the corresponding element inlet 10 depending on whether the measurement is mainly for visible light or near-infrared measurement.

[0008]

As described above, the optical fiber 6 for sample information light is connected to the joint 10 for the Si element in the case of visible light measurement, and to the joint 10 for the PbS element in the case of near infrared measurement. Must be inserted into the entire area (400 to 2500n
m) When taking in the spectrum of
An operation of exchanging the PbS element connection port 10 with the PbS element connection port 10 was required.

The present invention has been made in view of the above-mentioned problems, and it is possible to measure visible light and near-infrared light without replacing the optical fiber 6 for sample information light. It is an object to provide a characteristic measuring device.

[0010]

In order to achieve the above object, the sample is irradiated with light from a light source to obtain sample information light having information on the sample, and this sample information light is transmitted to a visible light sensor and an infrared light sensor through an optical fiber. In a visible light / infrared light characteristic measuring device for analyzing characteristics of a sample given to an optical sensor, a diffuser for diffusing and irradiating the sample information light to a sensor unit in which the visible light sensor and the infrared light sensor are arranged in close proximity. the part is provided, the Si element is used as the visible light sensor, with PbS element as the infrared sensor, often for irradiating the infrared light sensor than the visible light sensor the sample information light in the diffusion part Sun arranged as
A fiber inlet for pull information light is provided .

[0011]

[0012]

[0013]

In the sensor section, the visible light sensor and the infrared light sensor are arranged close to each other, and the sample information light is diffused and radiated from the diffusion section, so that both the visible light sensor and the infrared light sensor are radiated. . As a result, both sensors operate simultaneously, but when the sample information light is in the visible light (400 to 1100 nm) region, the visible light sensor mainly works, and the infrared light sensor hardly works. In the infrared light (1100 to 2500 nm) region, the infrared light sensor mainly works.

When a Si element is used as a visible light sensor mainly for measuring a visible light region and a PbS element is used as an infrared light sensor, as shown in FIG.
Since the ratio detection ratio is smaller than that of the element, the diffusing section causes the PbS element to be irradiated more with the sample information light. Thereby, the output of the PbS element is improved.

[0015]

[0016]

DESCRIPTION OF THE PREFERRED EMBODIMENTS Embodiments of the present invention will be described below with reference to the drawings. FIG. 1 is a diagram showing a configuration of an embodiment of the present invention. This figure is a diagram showing a joint between the detection unit 2 and the sample information light optical fiber 6 shown in FIG. 5 denote members having the same functions. The connection block 14 for connecting the sample information light fiber 6 and the detection element block 12 has one connection opening 10 for the sample information light fiber 6, which is inserted into the connection opening 10 during measurement. The inlet 10 is attached to the diffusion unit 15 at a position close to the PbS element, and a large amount of sample information light is incident on the PbS element. The diffusion unit 15 is hollow. Reference numeral 16 denotes a light guide, which is a rectangular parallelepiped made of a transparent material such as sapphire. The outer surface of the sample information light incident surface and the four outer surfaces other than the surface with respect to the detection element block 12 are mirror-finished by aluminum evaporation or the like. Then, it fits in the cavity of the diffusion portion 15. The shape of the light guide 16 may be a truncated pyramid in which the top of the pyramid is cut parallel to the bottom surface. At this time, the cavity of the diffusion portion 15 has the same shape.

FIG. 2 is a block diagram of the device shown in FIG. Irradiation light emitted from the light source 20 becomes a monochromatic light having a wavelength with a scanning diffraction grating (scanning grating) 21 is changed sequentially, is irradiated with an optical fiber indicated by a broken line as sample 3, the light reflected from the sample 3, the transmitted light The optical fiber indicated by the broken line is input to the detection unit 2 having the inspection element composed of the Si element and the PbS element, analyzed by the analysis unit 24, and the result is displayed on the display unit 25. The light source 20 and the scanning diffraction grating 21 are built in the main body 1,
The amplification unit 13 and the amplification unit 13 constitute the detection unit 2, and the analysis unit 24 and the display unit 25 are a computer and its display unit 4.

FIG. 3 shows details of the detector 2 and the analyzer 24 shown in FIG.
5 is a block diagram showing a display unit 25. FIG. The data having a wavelength of 400 to 1100 nm is converted into an electric signal by the Si
Amplified by Data having a wavelength of 1100 to 2500 nm is converted into an electric signal by the PbS element 32 and amplified by the amplifier 33. The input data from the amplifiers 31 and 33 are classified by the wavelength selector 34 into data of the entire region (400 to 2500), visible region (400 to 1100), and near infrared region (1100 to 2500 nm). This data is analyzed, and the result is displayed on the display unit 25.

[0019]

As is clear from the above description, the present invention introduces the sample information light from the optical fiber into the diffusion section and irradiates the visible light sensor and the infrared light sensor with the diffusion section, thereby detecting the optical fiber. There is no need to switch to

[Brief description of the drawings]

FIG. 1 is a diagram showing a configuration of an embodiment of the present invention.

FIG. 2 is a block diagram illustrating a configuration of a visible light / infrared light characteristic measuring device.

FIG. 3 is a block diagram from a sensor module to a display unit.

FIG. 4 is a diagram showing an external configuration of a visible light / infrared light characteristic measuring device using an optical fiber.

FIG. 5 is a diagram showing a conventional coupling portion between an optical fiber and a detection unit.

FIG. 6 is a diagram illustrating characteristics of a detection element.

[Explanation of symbols]

 6 Sample information optical fiber 10 Inlet 12 Detector block 14 Inlet block 15 Diffusion unit 16 Light guide

Claims (1)

(57) [Scope of request for utility model registration] A sample information light having sample information is obtained by irradiating a sample with light from a light source, and the sample information light is supplied to a visible light sensor and an infrared light sensor through an optical fiber to analyze the characteristics of the sample. In a light-infrared light characteristic measuring device, a diffusion unit for diffusing and irradiating the sample information light is provided in a sensor unit in which the visible light sensor and the infrared light sensor are arranged close to each other.
with i elements, using a PbS element as the infrared sensor, the said spreading unit arranged to illuminate many the infrared light sensors than the visible light sensor the sample information light
Fiber connection for sampled information light
Visible infrared light characteristic measuring apparatus, characterized in that there.