JP2553069Y2 - Semiconductor laser stem - Google Patents
Semiconductor laser stemInfo
- Publication number
- JP2553069Y2 JP2553069Y2 JP2698591U JP2698591U JP2553069Y2 JP 2553069 Y2 JP2553069 Y2 JP 2553069Y2 JP 2698591 U JP2698591 U JP 2698591U JP 2698591 U JP2698591 U JP 2698591U JP 2553069 Y2 JP2553069 Y2 JP 2553069Y2
- Authority
- JP
- Japan
- Prior art keywords
- semiconductor laser
- stem
- fusing
- laser element
- projection
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Landscapes
- Semiconductor Lasers (AREA)
Description
【0001】[0001]
【産業上の利用分野】本考案は半導体レーザ素子を融着
させる金属製ステムの構造に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a structure of a metal stem for fusing a semiconductor laser device.
【0002】[0002]
【従来の技術】近年、半導体レーザ装置を使用したモジ
ュールの小型化,低価格化が要求されており、これに伴
い半導体レーザ装置も小型化,低価格化を要求されてい
る。この要求を満たすうえで半導体レーザ装置に使用す
るステムの小型化,低価格化が重要である。2. Description of the Related Art In recent years, there has been a demand for downsizing and cost reduction of a module using a semiconductor laser device, and accordingly, a downsizing and cost reduction of a semiconductor laser device have also been demanded. To satisfy this demand, it is important to reduce the size and cost of the stem used in the semiconductor laser device.
【0003】従来の半導体レーザ用ステムは、図3
(a),(b)に示すように、端子37を備えた9.0
mmΦの鉄製の円形部(32)上に、半導体レーザ素子
を融着させる銅製の突起(31)を融着させていた。突
起(31)を銅製にしているのは鉄より熱伝導率が良
く、半導体レーザ装置の熱抵抗を下げられるためであ
る。しかし、このステムでは突起を融着させているため
製造に工数がかかり、小型化,低価格にするのが難し
い。A conventional semiconductor laser stem is shown in FIG.
(A) As shown in FIG.
A copper projection (31) for fusing a semiconductor laser element was fused onto an iron circular portion (32) of mmΦ. The reason why the projection (31) is made of copper is that the thermal conductivity is better than that of iron and the thermal resistance of the semiconductor laser device can be reduced. However, in this stem, since the projections are fused, it takes a lot of man-hours to manufacture, and it is difficult to reduce the size and the cost.
【0004】一方、CD(コンパクト・ディスク)用半
導体レーザ装置では、その小型化,標準化を兼ねた図4
(a),(b)に示すような半導体レーザ用ステムがあ
る。このステムは、端子47を備えた5.6mmΦの円
形部(42)と、半導体レーザ素子を融着させる突起
(41)とが共に鉄製で一体成形していた。On the other hand, in a semiconductor laser device for a CD (compact disk), FIG.
There are stems for semiconductor lasers as shown in FIGS. In this stem, a circular portion (42) having a terminal 47 and having a diameter of 5.6 mm and a projection (41) for fusing the semiconductor laser element were both integrally formed of iron.
【0005】[0005]
【考案が解決しようとする課題】上述した従来のCD
(コンパクト・ディスク)用半導体レーザ装置に使用す
るステム(図4)は、9.0mmΦから5.6mmΦに
小型化された上に、半導体レーザ素子を融着する突起
(41)の材質も鉄でできている。このようなステムで
あると、ステム自体の熱容量が小さくなる上、材質の鉄
の熱伝導率も約80w/m・k(室温)と、銅の熱伝導
率(約400w/m・k(室温)より悪くなり、熱抵抗
が図3に示すステムよりも約30%上ってしまう。一
方、通信用のInP系半導体レーザ素子では、材料物性
からして温度特性がGaAs系の半導体レーザより悪
い。また、その使用温度範囲に対する要求も厳しく、更
に昨今85℃まで高温化してきている。このことから熱
抵抗の大きくなるステムには、半導体レーザ素子の発熱
を外部へ逃すことができず、高温で使用するには適さな
いという欠点がある。[Problems to be Solved by the Invention] The above-mentioned conventional CD
The stem (FIG. 4) used for the semiconductor laser device for (compact disk) is downsized from 9.0 mmΦ to 5.6 mmΦ, and the material of the projection (41) for fusing the semiconductor laser element is also iron. is made of. With such a stem, the heat capacity of the stem itself becomes small, and the thermal conductivity of iron, which is a material, is about 80 w / mk (room temperature) and the thermal conductivity of copper (about 400 w / mk (room temperature)). The thermal resistance is about 30% higher than that of the stem shown in Fig. 3. On the other hand, the temperature characteristics of the communication InP-based semiconductor laser device are worse than that of the GaAs-based semiconductor laser due to the material properties. In addition, the requirements for the operating temperature range are strict, and the temperature has recently been raised to 85 ° C. Therefore, the heat generated by the semiconductor laser element cannot be released to the outside of the stem having a large thermal resistance. There is a drawback that it is not suitable for use with.
【0006】[0006]
【課題を解決するための手段】本考案の半導体レーザ用
ステムは、 (1)ステムの形状は、円形のステムベースの上に、半
導体レーザ素子を融着させる突起があり、また、円形部
(ステムベース)には、モニター光検出用ホトダイオー
ドを融着させる溝がある。また、半導体レーザ素子を融
着させる突起の形状は、半導体レーザ素子を融着させる
面よりステム外縁部の方向に近づくと翼状に広がってい
る。The semiconductor laser stem of the present invention has the following features. (1) The stem has a circular stem base, a projection for fusing the semiconductor laser element, and a circular portion ( The stem base) has a groove for fusing the monitor light detection photodiode. Further, the shape of the projection for fusing the semiconductor laser element spreads in a wing-like manner as it approaches the outer edge of the stem from the surface on which the semiconductor laser element is fused.
【0007】(2)ステムの円形部及び半導体レーザ素
子を融着させる突起の材質は、銅を主成分とする合金
で、円形部のステムベームの半導体レーザ素子を融着さ
せる突起がある面の外縁部は材質が鉄になっている。な
る2つの特徴を同時に有している。(2) The material of the circular portion of the stem and the projection for fusing the semiconductor laser element is an alloy containing copper as a main component. The part is made of iron. Has the following two features at the same time.
【0008】[0008]
【実施例】次に、本考案について図面を参照して説明す
る。図1は本考案の一実施例の平面図(図1(a))及
びA−A′線断面図(図1(b))である。本実施例で
は端子7を備えた5.6mmΦの円形部(2)のステム
ベースに、半導体レーザ素子を融着させる突起(1)が
ステムベースと同一の銅・タングステン合金で一体成形
されている。また、半導体レーザ素子を融着させる突起
(1)の形状も、は導体レーザを融着させる面5よりス
テム外縁部に近ずくと翼状に広がっており、突起部の熱
容量を大きくしている。さらに、5.6mmΦの円形部
(2)のステムベースの半導体レーザ素子を融着させる
突起がある面の外縁部(3)はリング状の鉄を円形部に
融着している。これは、上述の外縁部まで銅・タングス
テン合金で一体成形すると、キャップとステムを抵抗加
熱方式で融着できなくなるためである。DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS Next, the present invention will be described with reference to the drawings. FIG. 1 is a plan view (FIG. 1A) and a cross-sectional view taken along line AA '(FIG. 1B) of one embodiment of the present invention. In the present embodiment, a projection (1) for fusing a semiconductor laser element is integrally formed of the same copper / tungsten alloy as the stem base on the stem base of a 5.6 mmφ circular portion (2) having the terminal 7. . Further, the shape of the projection (1) for fusing the semiconductor laser element spreads like a wing closer to the outer edge of the stem than the surface 5 for fusing the conductor laser, thereby increasing the heat capacity of the projection. Further, an outer edge portion (3) of a surface having a protrusion for fusing the stem-based semiconductor laser element of the circular portion (2) of 5.6 mmΦ has a ring-shaped iron fused to the circular portion. This is because if the outer edge is integrally formed with a copper-tungsten alloy, the cap and the stem cannot be fused by the resistance heating method.
【0009】この実施例のステムを使用した半導体レー
ザ装置の熱抵抗は、約75℃/wで、図4に示したよう
な従来のステムを使用した場合の熱抵抗約95℃/w
(いずれも同一種類の半導体レーザ素子、同一の組立方
法をとっと場合)に比べて、約20℃/wの低減を図る
ことができた。The thermal resistance of the semiconductor laser device using the stem of this embodiment is about 75 ° C./w, and the thermal resistance using the conventional stem as shown in FIG.
A reduction of about 20 ° C./w was achieved as compared with the case of using the same type of semiconductor laser device and the same assembling method.
【0010】図2は、本考案の実施例2の平面図(図2
(a))及びB−B′線断面図(図2(b))である。
この実施例2では、図1に示した実施例1と同様の構成
に加え、更に、半導体レーザ素子を融着させる突起(2
1)の形状を、半導体レーザ素子を融着させる面より奥
の方で両翼状に広げている。これは、突起(21)の容
積を大きくすることで、熱容量を大きくし、半導体レー
ザ素子の発熱を突起(21)に吸わせ易くしているため
で、片翼状に突起(1)を広げた実施例1よりも更に半
導体レーザ装置としての熱抵抗をより下げる利点があ
る。FIG. 2 is a plan view of a second embodiment of the present invention (FIG. 2).
(A)) and a sectional view along the line BB '(FIG. 2 (b)).
In the second embodiment, in addition to the configuration similar to that of the first embodiment shown in FIG.
The shape of 1) is extended in a double wing shape at a position deeper than the surface where the semiconductor laser element is fused. This is because the heat capacity of the semiconductor laser element is easily increased by increasing the volume of the projection (21) so that the heat generated by the semiconductor laser element is easily absorbed by the projection (21). There is an advantage that the thermal resistance of the semiconductor laser device is further reduced as compared with the first embodiment.
【0011】[0011]
【考案の効果】以上説明したように本考案は、円形のス
テムベース上の半導体レーザ素子を融着する突起で半導
体レーザ素子を融着する面より奥の方で翼状に広げ、そ
の容積を大きくすることにより熱容量を大きくし、半導
体レーザ素子からの発熱をステムに吸せ易くしている。
また、上述の突起と、その下方の円形部を銅系合金で作
る事より、鉄より熱伝導率を上げている。これにより、
小型化,標準化を兼ねたCD(コンパクト・ディスク)
用半導体レーザで使用するステムと同一の外形のステム
を使用しながら、熱抵抗も従来使用されてきた9.0m
mΦのステムと同様程度まで下げることを可能にした。As described above, according to the present invention, the protrusion for fusing the semiconductor laser element on the circular stem base is spread in a wing shape deeper than the surface for fusing the semiconductor laser element, thereby increasing the volume. By doing so, the heat capacity is increased, and the heat generated from the semiconductor laser element is easily absorbed by the stem.
Further, the thermal conductivity is higher than that of iron by forming the above-mentioned protrusion and the circular portion below the protrusion with a copper-based alloy. This allows
CD (compact disk) that has both miniaturization and standardization
While using a stem having the same outer shape as the stem used in the semiconductor laser for manufacturing, the thermal resistance has been conventionally used at 9.0 m.
It is possible to lower the same degree as that of the stem of mΦ.
【図1】本考案の半導体レーザ用ステムの実施例1の平
面図(a)及び(a)のA−A′線断面図(b)であ
る。FIG. 1 is a plan view of a first embodiment of a semiconductor laser stem according to the present invention, and FIG.
【図2】本考案の半導体レーザ用ステムの実施例2の平
面図(a)及び(a)のB−B′線断面図(b)であ
る。FIGS. 2A and 2B are a plan view and a cross-sectional view taken along line BB ′ of FIG. 2A of the second embodiment of the semiconductor laser stem of the present invention;
【図3】従来の半導体レーザ用ステムの平面図(a)及
び(a)のC−C′線断面図(b)である。3A is a plan view of a conventional semiconductor laser stem, and FIG. 3B is a cross-sectional view taken along line CC ′ of FIG. 3A.
【図4】従来の半導体レーザ用ステムの平面図(a)及
び(a)のD−D′線断面図(b)である。4A is a plan view of a conventional semiconductor laser stem, and FIG. 4B is a sectional view taken along line DD ′ of FIG.
1,21,31,41 半導体レーザ素子を融着させ
る突起 2,32,42 円形部 2 円形部の外縁部の上面部分 4 モニター光検出用ホトダイオードを融着させる溝 5 半導体レーザ素子を融着させる突起上の面 7,37,47 端子1, 21, 31, 41 Projection for fusing semiconductor laser element 2, 32, 42 Circular part 2 Upper surface part of outer edge of circular part 4 Groove for fusing monitor light detection photodiode 5 Fusing semiconductor laser element Surface on protrusion 7,37,47 Terminal
Claims (1)
出用ホトダイオードを搭載する半導体レーザ装置用金属
製ステムにおいて、下記の2項を同時に満す半導体レー
ザ用ステム。(1)前記ステムの形状は、円形部上に、
前記半導体レーザ素子を融着させる突起と、前記モニタ
ー光検出用ホトダイオードを融着させる溝を有し、かつ
前記突起の形状は、前記半導体レーザ素子を融着させる
面よりステム外縁部の方向に近ずくと翼状に広がってい
る。(2)前記ステムの前記円形部及び前記突起の材質
は銅を主成分とする合金で、かつ前記円形部の半導体レ
ーザ素子を融着させる突起がある面の外縁部は材質が鉄
でできている。1. A metal stem for a semiconductor laser device having a semiconductor laser element and a photodiode for detecting a monitor light thereof, wherein the stem for a semiconductor laser satisfies the following two conditions at the same time. (1) The shape of the stem is
A projection for fusing the semiconductor laser element; and a groove for fusing the monitor light detection photodiode, and the shape of the projection is closer to a stem outer edge than a surface to which the semiconductor laser element is fused. It spreads like wings. (2) The material of the circular portion and the protrusion of the stem is an alloy mainly composed of copper, and the outer edge portion of the circular portion on the surface where the protrusion for fusing the semiconductor laser element is made of iron. I have.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2698591U JP2553069Y2 (en) | 1991-04-20 | 1991-04-20 | Semiconductor laser stem |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2698591U JP2553069Y2 (en) | 1991-04-20 | 1991-04-20 | Semiconductor laser stem |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH04121769U JPH04121769U (en) | 1992-10-30 |
JP2553069Y2 true JP2553069Y2 (en) | 1997-11-05 |
Family
ID=31911372
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2698591U Expired - Lifetime JP2553069Y2 (en) | 1991-04-20 | 1991-04-20 | Semiconductor laser stem |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP2553069Y2 (en) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2006295223A (en) * | 2002-03-25 | 2006-10-26 | Sanyo Electric Co Ltd | Semiconductor device |
JP2007043211A (en) * | 2002-03-25 | 2007-02-15 | Sanyo Electric Co Ltd | Method of manufacturing semiconductor light-emitting device |
CN1327581C (en) * | 2002-03-25 | 2007-07-18 | 三洋电机株式会社 | Semiconductor laser beam device |
-
1991
- 1991-04-20 JP JP2698591U patent/JP2553069Y2/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
JPH04121769U (en) | 1992-10-30 |
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