JP2547028Y2 - IC element distribution device - Google Patents

Description

[Detailed description of the invention]

[0001]

BACKGROUND OF THE INVENTION This invention is intended to distribute and supply IC elements to a plurality of measurement paths in an apparatus for testing IC elements, and to classify and supply IC elements after a test according to the test results. The present invention relates to an IC element distribution device used.

[0002]

2. Description of the Related Art FIG. 2 shows a conventional IC element distribution device.
This is a case where the IC elements are distributed to a plurality of measurement paths, and a plurality of, for example, eight fixed rails 1 are provided in the thermostat 11.
2 are provided in parallel. The movable rails 13a and 13b are movable outside the thermostatic chamber 11 along positions facing and approaching the entrances of the fixed rails 12. The distance between the centers of the movable rails 13a and 13b is equal to the distance between the centers of the adjacent fixed rails 12, and the movable rails 13a and 13b are fixed to each other, and the extension direction is parallel to the extension direction of the fixed rail 12. .

[0003] The movable rails 13a and 13b are attached to a timing belt 14, and the timing belt 14 is conveyed by a pulse motor 15, and is moved by the movable rails 13a and 13b.
Is moved. In a state where the movable rails 13a and 13b are located at the origin positions not opposed to the fixed rail 12, a supply rail 16 having an outlet opposed to an entrance of the movable rail 13a on the opposite side of the fixed rail 12 is provided. .

One IC element (not shown) is supplied from the supply rail 16 to one of the movable rails 13a at the origin position.
Is supplied, and then the movable rails 13a and 13b are moved toward the fixed rail 12 so that the other movable rail 13b faces the supply rail 16 and the movable rail 13b
Is supplied with one IC element. Next, the movable rail 12a,
12b is moved to oppose the two fixed rails 12, and the movable rails 13a, 13
b to simultaneously supply IC elements. Thereafter, the movable rails 13a and 13b are returned to the origin positions, and IC elements are supplied to the movable rails 13a and 13b in the same manner, and the movable rails 13a and 13b are opposed to the other two fixed rails 12, respectively. These are supplied with IC elements.
Thereafter, the same operation is performed to distribute and supply the IC elements to the respective fixed rails 12. Normally, each rail 12, 13a, 13
b and 16 are provided to be inclined in the same direction.
The IC element is conveyed by natural fall due to its own weight.

As described above, the movable rails 13a, 13b
In particular, the movable rails 13a and 13b are correctly positioned at the origin position, and the movable rails 13a and 13b are moved to a position facing the target fixed rail 12 with reference to the origin position. The position detection sensor 17 was rotated by the pulse motor 15. The position detection sensor 17 rotates the disk 18 while the disk 18 is fixed on the rotation axis of the pulse motor 15.
8, a pair of slits 19 are formed 180 ° apart from each other, and a slit detecting element 21 including a light emitting element and a light receiving element is provided with the disk 18 interposed therebetween.

When the movable rails 13a and 13b are located at the origin position, one slit 19 is connected to the slit detecting element 21.
When the movable rail 13b is opposed to the supply rail 16, the other slit 19 is opposed to the slit detecting element 21, and when the movable rails 13a and 13b are opposed to the two end fixed rails, The angular position of the slit 19 and the stop positions of the movable rails 13a and 13b are selected such that the slit 19 faces the slit detecting element 21. Since the center distance between the movable rails 13a and 13b and the center distance between the adjacent fixed rails 12 are equal, the number of times the slit is detected from the origin position,
Check that the rail 1 has been reached.
It is possible to know the position of the fixed rail where 3a and 13b have stopped.

Thus, the movable rail 1 is moved from the origin position.
Even if the pulse motor 15 is supplied with the required number of pulses to make the 3a and 13b face the target fixed rail 12, the so-called step-out occurs in which the pulse does not rotate by the given number of pulses for some reason. Movable rails 13a, 1
In the case where 3b is not moved to the target position of the fixed rail 12, the slit is not detected by the slit detecting element 21, so that the out-of-step can be detected. In this state, the IC element from the movable rails 13a, 13b to the fixed rail 12 can be detected. Is supplied, the IC element may be caught and may not be supplied. The position detection sensor 17 is used to prevent such a problem from occurring, that is, to move the movable rail 1 to the correct position.
The supply of the IC element is performed only when the stop of 3a, 13b is detected.

[0008]

The width of the slit 19 of the conventional position detecting sensor 17 is only the amount of movement of the slit 19 when the pulse motor 15 is driven by one pulse. Therefore, in order to conduct tests under various temperature conditions,
The temperature set in the thermostat 11 is greatly changed. When the fixed rail 12, the fixed rail holding part, and the like expand and contract due to the coefficient of thermal expansion in accordance with the temperature of the thermostatic chamber 11, and the movable rails 13a and 13b stop at the position detected by the position detection sensor 17, the movable rail In some cases, the center lines of the rails 13a and 13b and the center line of the fixed rail to which the IC element is to be supplied deviate from a straight line. In the related art, the fixing is performed so that the IC element can be supplied without being caught. The width of the entrance of the rail 12 was increased.
The use of such special rails has been expensive.

[0009]

A plurality of fixed rails are arranged in parallel.
And are located close to the entrance of these fixed rails.
A movable rail is provided movably along the
The IC element is supplied to the movable rail placed above,
Selectively oppose the rails to the fixed rails
The IC element on the movable rail is fixed to the fixed rail.
To supply the IC elements to the plurality of fixed rails.
Control of distributing and supplying the child and stopping the movement of the movable rail
Is performed by a pulse motor, and the rotation of the pulse motor
In conjunction with this, the origin and the fixed rails
A circuit for detecting the position at which the movable rail stops oppositely
For IC element distribution device equipped with rolled position detection sensor
In the above, the position detection sensor detects the origin
The movable rail is driven by one pulse of the pulse motor.
Each fixed rail is selected approximately equal to the travel distance.
The detection accuracy of the stop position of the movable rail
It is selected worse than the detection accuracy of the origin position.

[0010]

FIG. 1 shows an embodiment of the present invention, in which parts corresponding to those in FIG. 2 are denoted by the same reference numerals. In this example, the auxiliary supply rails 22a and 22b are provided between the supply rail 16 and the movable rails 13a and 13b at the origin position, and the center distance between the auxiliary supply rails 22a and 22b is the movable rails 13a and 1b.
3b and the auxiliary supply rails 22a,
Each one of the IC elements in 22b can be simultaneously supplied to the movable rails 13a and 13b at the origin position.

In the case where an optical sensor is used as the position detecting sensor 23, the disk 18 is mounted on the rotating shaft of the pulse motor 15.
Is attached to the disk 18, and in this embodiment, a slit 24 for the origin and a slit 25 for the IC distribution are formed.
The width of the origin slit 24 is narrow, and is equal to the amount of movement of the slit 24 by the rotation of the pulse motor 15 by one pulse. On the other hand, the slit 25 for IC distribution is 2
The slits are formed at intervals of 180 °, and the slit width is made larger than the slit 24 for the origin, for example, two to three times.
Slit detecting element 2 for detecting slit of disk 18
1 is provided. Movable rails 13a, 13b at origin position
Is located, the slit 24 for the origin is detected by the slit detecting element 21, and the movable rail 13 is moved from this state.
When the a and 13b are moved to face the first two fixed rails 12, the slit 25 for IC distribution reaches the slit detection element 21 exactly an integer number of times, for example, twice. In this case, the center of the slit 25 for IC distribution corresponds to the detection of the slit detecting element 21 at the center of the shift of the center line of the fixed rail 12 due to the temperature change.

With such a configuration, when the movable rails 13a and 13b are at the origin position, the positions are detected with high accuracy by the origin slit 24 and the slit detecting element 21. In addition, the fixed rail 12 is expanded and contracted based on the thermal expansion coefficient of each part according to the set temperature of the thermostat 11.
Of the center position of the movable rails 13a and 13b can be known in advance, so that the pulse motor corresponds to the shift of the stop position for supplying the IC element to the fixed rail of each of the movable rails 13a and 13b. By correcting the number of pulses applied to the movable rails 13a, 1
3b can be stopped to the center of the intended fixed rail. In addition, at this time, the slit 25 for IC distribution
Of the movable rails 13a, 1 at this stop position, the stop position is detected from the slit detection element 21.
Assuming that 3b has stopped at the correct position, the IC element can be supplied to the fixed rail. Accordingly, the movable rails 13a and 13b can be accurately aligned with the target fixed rail 12 regardless of the displacement of the center position of the fixed rail 12 due to thermal expansion and contraction, and the entrance of the fixed rail 12 is particularly widened. Even if you do not leave, without getting caught,
IC elements can be supplied to the fixed rail 12. Therefore, it is not necessary to make the entrance of the fixed rail 12 particularly wide, so that the fixed rail 12 can be manufactured easily and inexpensively.

Since the width of the slit 25 for distributing ICs is large, a small step-out cannot be detected. However, each time the IC element is distributed, the position returns to the origin position. Is small and can be accurately detected, so that the step-out state can be immediately detected and corrected, and there is no possibility that a large deviation occurs.

In the above description, a light transmission type sensor is used as the position detection sensor 23. However, a light reflection type sensor may be used, and not only optical detection but also magnetic detection and other types may be used. . Also, the number of movable rails is not limited to two,
It may be one. In FIG. 1, the auxiliary supply rail 22
a and 22b may be omitted. Further, the present invention is not limited to the case where the IC element is distributed to a plurality of measurement paths,
The present invention may be applied to a so-called sorter that sorts and distributes elements. The detection accuracy of the IC distribution position may be such that the position can be detected irrespective of the displacement of the center position of the fixed rail based on the temperature change in the use state. The movement of the movable rail is not limited to the timing belt,
It may be a chain or other type, and is not limited to a pulse motor.
Other digitally controllable motors may be used.

[0015]

As described above, according to the present invention, the accuracy of detecting the distribution position of the movable rail is lower than the accuracy of detecting the distribution position of the IC. The stop position of the movable rail can be controlled, and there is no need to use an expensive fixed rail whose entrance is particularly widened, so that the fixed rail can be configured at low cost.

[Brief description of the drawings]

FIG. 1 is a diagram showing an embodiment of the present invention.

FIG. 2 is a diagram showing a conventional IC element distribution device.

Claims (1)

(57) [Scope of request for utility model registration] A plurality of fixed rails are arranged in parallel, a movable rail is movably provided along a position approaching and approaching an entrance of the fixed rail, and an IC element is supplied to the movable rail positioned at an origin. Then, the movable rail is selectively opposed to the plurality of fixed rails, and the IC elements on the movable rail are supplied to the fixed rail, thereby distributing and supplying the IC elements to the plurality of fixed rails. and performs movement stop control of the movable rail by a pulse motor, that in conjunction with rotation of the pulse motor, is detected and the origin, and a position where the movable rail and opposite thereto for each fixed rail stops in IC device dispensing device position sensor of the rotary is provided, the detection accuracy of the position detection sensor is the origin position is the path
The movable rail moves by one pulse of the loose motor.
Distance is substantially equal to the selection, the detection accuracy of the stop position of the movable rails for the fixed rail, IC elements dispensing apparatus characterized by being selected worse than the detection accuracy of the origin position.