JP2520092B2 - Measuring device - Google Patents

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to improvement of measurement accuracy of a measuring device for measuring temperature, pressure, etc., and particularly, it is possible to adjust absolute value accuracy when measuring by digital processing such as an electronic thermometer. It is what

[0002]

2. Description of the Related Art Conventionally, an electronic thermometer using a temperature sensitive resistance such as a thermistor has a reference resistance which shows a substantially constant resistance value without being affected by temperature change in a measurement temperature range,
Ratio of resistance value of reference resistance and resistance value of temperature sensitive resistance (resistance ratio)
Is obtained and converted (decoded) into temperature. That is, the conventional electronic thermometer has a thermistor, a reference resistance, and a variable resistor for initial adjustment, and switches the thermistor and the reference resistance to generate a pulse signal having a frequency based on each resistance value. A circuit, a frequency dividing circuit that divides the source oscillation clock to generate a window pulse having a predetermined pulse width, and counts a reference pulse signal based on the reference resistance for a counting time corresponding to the predetermined pulse width, and also after resetting. A counter that counts the detection pulse signal based on the temperature-sensitive resistance over the counting time, calculates a ratio (resistance ratio) between the count value of the reference pulse signal and the count value of the detection pulse signal, and then refers to the reference memory. Then, the resistance ratio is converted into temperature and the temperature is displayed.

The electronic thermometer having such a structure operates as follows. First, in the first phase, the resistance value-frequency conversion circuit selects the reference resistance and the initial adjustment variable resistor to generate the reference pulse signal having the series combined resistance value of both. The reference pulse signal is counted by the counter for a certain counting time determined by the frequency dividing circuit, and the count value (first count value) of the reference pulse signal is temporarily stored by the storage means. Then the counter is reset.
Next, in the second phase, the resistance value-frequency conversion circuit selects the thermistor (temperature sensitive resistance) and generates a temperature detection pulse signal having a frequency corresponding to the resistance value. This temperature detection pulse signal is also counted by the counter for a certain counting time determined by the frequency dividing circuit, and the count value (second count value) of the temperature detection pulse signal is obtained. Then, the ratio between the temporarily stored first count value and the second count value is calculated, and the temperature is displayed by temperature conversion.

In order to obtain the temperature display from the ratio between the resistance value of the reference resistance and the resistance value of the thermistor as described above, since the conversion table for each thermometer has constant conversion data, a certain constant temperature is obtained. At room temperature, the resistance ratio must be a constant value for all thermometers, but in reality, there are individual differences in resistance values (manufacturing variations in resistance values) between the reference resistance and thermistor. The ratio is not constant. Therefore, in order to keep the actual resistance ratio constant, the variable resistor for initial adjustment is moved in the inspection process at the manufacturing stage to increase or decrease the combined series resistance value with the reference resistance so that the resistance ratio becomes constant. It is complicated (absolute value precision adjustment).

[0005]

However, the electronic thermometer provided with the variable resistor for initial adjustment has the following problems.

In the inspection process, placing an electronic thermometer at a constant temperature and manually adjusting the variable resistance value so that the temperature display value becomes a constant temperature requires a complicated labor, and particularly, For thermometers that require strict accuracy, fine adjustment work requires skill. Therefore, the productivity remains low, which is an obstacle to cost reduction.

Further, in the above-mentioned electronic thermometer, the variable resistance value is inferior to the fixed resistance value in the environment resistance, is prone to change over time (change in resistance value), and the reliability of temperature display during use is poor.

Furthermore, since the variable resistor has a movable part, it is not suitable for semiconductor integration of the entire circuit system, and cannot be integrated into one chip together with the resistance value-frequency conversion circuit, frequency dividing circuit and counter. The variable resistor must be mounted on the board as an external discrete component. For this reason,
When it is applied to a thermometer or the like, it becomes an obstacle to miniaturization, and an increase in the number of parts leads to an increase in manufacturing cost.

Under the circumstances, as a technique for solving the above-mentioned problems, the applicant of the present application previously disclosed an electronic thermometer in Japanese Patent Application No. 59-17499 (Japanese Patent Laid-Open No. 60-161538). . The electronic thermometer disclosed in this application is a resistance value-frequency conversion that switchably generates a reference pulse signal having a frequency based on the resistance value of a reference resistance and a temperature detection pulse signal having a frequency based on the resistance value of a temperature-sensitive resistance. It has a circuit and a counting circuit that counts the reference pulse signal for a predetermined counting time and counts the temperature detection pulse signal for the predetermined counting time after reset, and counts the reference pulse signal and detects the temperature. In an electronic thermometer that displays the temperature based on the ratio to the count value of the pulse signal, the counting circuit is a counting circuit with a set, and the counting circuit with a set is set prior to the measurement of either the reference pulse signal or the temperature detection pulse signal. In contrast, an initial value setting circuit that sets resistance value variation correction data as an initial value is provided.

In this electronic thermometer, it is also necessary to make the ratio of the reference resistance count value and the temperature sensitive resistance count value constant at a specific temperature without variation among products as in the conventional case. , Unlike the conventional method, the resistance ratio itself between the reference resistance and the temperature-sensitive resistance is not set to a constant value by adjusting the variable resistance, but the unique resistance value correction data is set so that the counting ratio becomes a constant value. When temperature is measured, it is sent to the counting circuit with set and preset. Whereas the conventional correction method for eliminating the variation in the resistance value is to increase or decrease the resistance value itself in the inspection process (hard permanent correction), the electronic thermometer according to the above application matches the measured temperature with the display temperature in the inspection process. This is the selection of a specific resistance value variation correction data value and the initial value setting (software-based correction) of the counting circuit with a set based on the correction data at the time of temperature measurement. In order to achieve such soft correction at any time, change the conventional counting circuit to a counting circuit with a set, and at the time of temperature measurement, perform counting with a set prior to either the reference pulse signal or the temperature detection pulse signal. An initial value setting circuit for initializing resistance value variation correction data specific to the circuit is required. According to this, it is not necessary to use a variable resistor for initial adjustment, and even if a reference resistance and a temperature-sensitive resistance having variations in resistance value are used, their resistance ratio can be apparently made a constant value, It is possible to realize an electronic thermometer that is low in cost, has few adjustment steps, and does not change with time.

FIG. 6 is a circuit diagram showing a counting circuit with a set and an initial value setting circuit of the electronic thermometer according to the above application. The counting circuit 10 with a set includes a 1/2 frequency dividing circuit 10a to 10d with a set and a 1/2 frequency dividing circuit 10e with a reset.
And are connected in cascade to count the reference pulse signal or the temperature detection pulse signal input from the input line IN. A reset input line RL is connected to the reset terminal R of each of the frequency dividing circuits 10a to 10e, and a reset control signal RC is input at a timing matched with each temperature measurement to reset the frequency dividing circuits 10a to 10e. . 1/2 divider circuit with set 10a, 10b, 10
The outputs of NAND gates 24, 25, 26 and 27 are connected to the set inputs S (bars) of c and 10d. NA
The ND gates 24, 25, 26, 27 constitute a setting timing circuit 28 of an initial value setting circuit, and one input of them receives the initial setting control signal SC via the set control line SL and the other input. Are supplied with the outputs of the inverters INV1 to INV4 of the pull-up circuit 29. At the time of counting the temperature detection pulse signal, the set control signal SC is fixed at a low level, and each NAND gate 24
Since the outputs of .about.27 are maintained at the high level, the normal counting operation is performed without the setting function of the 1/2 frequency dividing circuits with a set 10a to 10d. The pull-up circuit 29 connects the data terminals D0 to D3 of the wiring open / short type storage means for storing the correction data to the power source potential V.
_It has P-channel type MOS transistors F1 to F4 which are pulled up to _DD .

When the electronic thermometer is turned on during measurement, M
Since the ground voltage V _ss is applied to the gates of the OS transistors F1 to F4 and is maintained for a predetermined period, the power supply voltage V _DD is applied to the data terminals D0 to D3. Since some of the data terminals D0 to D3 are grounded by a wiring short circuit, the terminals are at the ground voltage V _ss .
Therefore, the operation of the pull-up circuit 29 causes the data terminals D0 to D3 to read out the logical data signal corresponding to the correction data stored in the wiring open / short type storage means. When counting the reference pulse signal, the initialization control signal SC temporarily becomes high level before the counting is started, and the NAND gates 24 to 27 pass the correction data signals generated at the data terminals D0 to D3. Then, it is supplied to the set input S (bar) of the 1/2 frequency dividing circuit with each set, and each Q output is preset according to the correction data. After being set, since the reference pulse signal input to the input line IN is counted, it is added to the correction value set as the initial value.

By the way, in the pull-up circuit 29 of the electronic thermometer, there is no problem when the correction data is high level (open state) in all bits, but low level (short state) in any bit. At this time, the source-drain current continues to flow in any of the pull-up transistors F1 to F4 from the time when the power is introduced to the temperature measurement period. When the temperature is measured a plurality of times after the power is turned on, the pull-up transistors F1 to F4 are provided during that time.
This is because the preset data cannot be re-executed because the data signal disappears unless the operation is continued. Therefore, a large amount of power consumption is required and the battery life is shortened.

Among the 4-bit correction data, the electronic thermometer having a large number of low-level bits consumes more power than the electronic thermometer having a small number of low-level bits, and the power consumption depends on the correction data. Variation occurs, which is an obstacle to uniform quality among products.

In view of the above problems, an object of the present invention is to make apparent the resistance ratio between a reference resistor and a detection resistor having variable resistance values without using the variable resistor for initial adjustment. The power consumption is small and the power consumption varies depending on the correction data, assuming that the temperature measuring device can be set to a constant value at a low cost, has a small number of adjustment steps, and does not change with time. It is to realize a measuring device such as an electronic thermometer that does not exist.

[0016]

In order to solve the above-mentioned problems, in the first means of the present invention, a reference pulse signal having a frequency based on the resistance value of a reference resistor and a temperature, pressure, etc. are sensed. A resistance value-frequency conversion means for switchably generating a detection pulse signal having a frequency based on the resistance value of the detection resistance whose resistance value changes, and one of the reference pulse signal and the detection pulse signal as a first pulse signal. And a second type of second pulse signal, the first pulse signal is counted, and then the second pulse signal is counted for a time equal to the counting time of the first pulse signal; Correction data setting means for setting resistance value variation correction data as an initial value to the preset type counting means prior to counting the pulse signal of
In the measuring device for displaying the measurement result based on the ratio between the count value of the pulse signal and the count value of the second pulse signal, the correction data setting means stores the wiring open data for storing the resistance value variation correction data. Short-type storage means,
Pull-up or pull-down means for applying a read voltage to the data terminal of the non-volatile memory to generate a data signal corresponding to the resistance variation correction data at the data terminal, and latch means for latching the data signal,
Setting timing means for controlling the timing of initial setting input of the data signal from the latch means to the preset type counting means.

In the second means of the present invention, a reference pulse signal having a frequency based on the resistance value of the reference resistor, a temperature,
One of the resistance value-frequency conversion means for generating a switchable detection pulse signal having a frequency based on the resistance value of the detection resistance whose resistance value changes in response to pressure, and one of the reference pulse signal and the detection pulse signal. Counting means for counting the first pulse signal using the first pulse signal and the other as the second pulse signal, and then counting the second pulse signal for a time equal to the counting time of the first pulse signal When,
The counting operation aborting means for controlling the counting operation of the counting means by aborting value and the aborting value setting means for setting the aborting value according to the resistance variation correction data are provided, and the counting value of the first pulse signal In the measuring device for displaying the measurement result based on the ratio between the count value of the second pulse signal and the count value of the second pulse signal, the cutoff value setting means is a wiring open / short type storage means for storing the resistance value variation correction data, Pull-up or pull-down means for applying a read voltage to the data terminal of the non-volatile memory to generate a data signal corresponding to the resistance variation correction data at the data terminal, and latch means for latching the data signal, Data conversion means for converting the data signal from the latch means into the censored value according to the data signal. To.

[0018]

In the first means, the first pulse signal is measured by the counting means in the first phase. Second
In the phase, the second pulse signal is counted by the counting means, but due to the presence of the preset type counting means and the correction data setting means, the counting time of the second pulse signal depends on the value of the correction data initialized. Since the length of the pulse signal can be adjusted, the count value of the first pulse signal and the second pulse signal
The ratio of the pulse signal to the count value can be increased or decreased. Even if you use a reference resistor or detection resistor with variable resistance without using a variable resistor for initial adjustment, the resistance ratio between them can be set to an apparently constant value, reducing the cost and the number of adjustment steps. A measuring device that does not change with time can be provided.

When the correction data is initially set in the preset type counting means, the pull-up or pull-down means is operated for a certain period of time when the power is turned on, the correction data is read out, and the latch control signal is supplied within this period. The correction data signal read by the latch means is latched. For this reason, after the latching, the pull-up or pull-down means is returned to the inoperative state, and the current is not supplied to the wiring open / short type storage means, whereby the power can be saved. After the correction data is latched by the latch means, the setting timing means can be operated by the initialization control signal any number of times at an appropriate time to initialize the data in the preset counting means.

Also in the second means, the first pulse signal is measured by the counting means in the first phase.
In the second phase, the second pulse signal is counted by the counting means. However, due to the presence of the counting operation termination means and the termination value setting means, the second pulse signal depends on the termination value obtained by converting the correction data. Since the length of the counting time can be adjusted, the ratio between the count value of the first pulse signal and the count value of the second pulse signal can be increased or decreased. Therefore, similarly to the first means, it is not necessary to use the variable resistor for initial adjustment, and it is possible to provide a measuring device that is low in cost, has few adjustment steps, and does not change with time.

When the cutoff value is set in the counting operation cutoff means from the correction data, the pullup or pulldown means is operated only for a certain fixed period when the power is turned on to read the correction data, and the latch control is performed within this period. The correction data signal read to the latch means by the signal is latched. After the correction data is latched in the latch means, the data conversion means can set the abort value in the counting operation abort means any number of times at an appropriate time. First
After the data signal is latched by the latch means, the pull-up or pull-down means is returned to the inoperative state and the current is not applied to the wiring open / short type storage means to save power. Can be planned.

[0022]

Embodiments of the present invention will be described with reference to the accompanying drawings.

FIG. 1 is a block diagram showing a circuit configuration of an electronic thermometer according to an embodiment of the present invention, FIG. 2 is a circuit diagram of a resistance value-frequency conversion circuit 1 in the block diagram of FIG. 1, and FIG. 1 is a circuit diagram showing a part of the initial logic adjusting circuit 9 and the frequency dividing circuit 10 in the block diagram shown in FIG. 1, and FIG. 4 is a time chart showing signals of respective parts of the electronic thermometer. The signal changes at points A to J are shown.

In the electronic thermometer of this embodiment, the frequency dividing circuit 10 counts the reference pulse signal generated in the resistance value-frequency conversion circuit 1 due to the charging and discharging of the circuit composed of the reference resistor 2 and the capacitor 4. The measurement time T0 is measured by the main counter 18. Further, the detection pulse signal generated in the resistance value-frequency conversion circuit 1 due to the charging / discharging of the circuit constituted by the temperature sensitive element (temperature sensitive resistor) 3 and the capacitor 4 is divided by the frequency dividing circuit for the already determined counting time T0. Count by 10. The electronic thermometer is a conversion display unit 72 that displays the temperature based on the count value (observation count value) of the frequency dividing circuit 10.
It has and.

Further, in the thermometer of this example, the frequency dividing circuit 10 is provided with an initial logic adjusting circuit (correction data setting circuit) 9 capable of setting an initial value.

The measurement principle of the thermometer of the present example is that the reference resistance 2 is calculated from the number of times of charging / discharging by the reference resistance 2 and the capacity 4 and the number of times of charging / discharging by the temperature sensing element (temperature sensitive resistance) 3 and the capacity 4 in a certain period.
The temperature is determined based on the ratio between the count value of 1 and the count value of the temperature sensitive element 3. Therefore, in this example, the predetermined counting time is not set in advance, but after setting the counting time to the main controller 17 by the main counter 18 from the target number of times of charging / discharging by the reference resistor 2 and the capacitor 4, the counting time is set. This time, the frequency of charge and discharge by the temperature sensitive element 3 and the capacitor 4 is counted by the frequency divider circuit 10, and the digital count value is latched by the latch 11,
The conversion table prepared in 12 converts the temperature digital value, and the display unit 15 displays the digital temperature.

More specifically, the oscillator O
The clock signal from the SC 19 is divided by the main counter 18 to enable time measurement. Then, various control signals shown in FIG. 4 are output from the main controller 17 based on the result measured by the main counter 18. Of these signals, φ1, φ2, and φ3 are gate signals of the MOS transistors Tr1, Tr2, and Tr3 that form the resistance value-frequency conversion circuit 1 shown in FIG. 2, and perform the above-described charging / discharging operation. .

Tr1 and Tr2 are P-channel transistors (hereinafter abbreviated as P-channel), and Tr3 is
N-channel transistor (hereinafter abbreviated as N-chan)
And

The operation of the resistance value-frequency conversion circuit 1 shown in FIG. 2 will be described below. The charging / discharging period by the reference resistor 2 and the capacitor 4 is called Phase I, and the charging / discharging period by the temperature sensitive element 3 and the capacitor 4 is called Phase II.

(1) Charge / Discharge Mode by Phase I As shown in FIG. 2, the resistance value-frequency conversion circuit 1 has a reference resistor 2 and a temperature sensitive device 3 connected in parallel, and a capacitor 4 commonly connected in series. It is connected to the. Further, the reference resistor 2 has a transistor Tr1 and the temperature sensitive element 3 has a transistor T1.
r2 are connected in series. Furthermore, capacity 4
Is connected to a bypass circuit formed by the transistor Tr3. Therefore, the transistor Tr1 turns on / off the circuit related to the reference resistor 2,
The circuit related to the temperature sensitive element 3 is turned on / off by r2. Further, the charge / discharge of the capacitor 4 is controlled by the transistor Tr3.

In phase I, when signals φ2 and φ3 and point B are at high level and signal φ1 is at low level, Tr
1, Tr2 is P Chan and Tr3 is N Chan,
Only the P channel Tr1 is turned on, and the circuit of the reference resistor 2 is turned on. And the gate of the transistor Tr3 is
Since the signal φ3 and the signal at the point B are input via the NAND gate 6, the transistor Tr3 is turned off. Therefore, the capacitor 4 is charged via the reference resistor 2. Capacity 4
Let C be the capacitance value of R and the value of reference resistor 2 be R1.
Is charged with a time constant C × R1.

The voltage at the point A charged in the capacitor 4 is supplied to the point B via the inverter 5. The inverter 5 is inverted when the level at the point A exceeds the logic level 1/2 V _DD , and the point B becomes a low level. Therefore, the output of the NAND6 applied to the gate of the transistor Tr3 becomes high level, and the point A is short-circuited to V _SS via the N channel Tr3, so that the capacitor 4 is discharged. As a result, the voltage at the point A decreases, and the output of the inverter 5 is inverted to the high level again.
Then, the transistor Tr3 is turned off, and the charging of the capacitor 4 starts. This waveform is shown as a signal at point A in FIG. 4 and is shown in phase I starting at time t1. Inverter 5
4 is also shown as a signal at point B in FIG. 4, and assuming that the period of Phase I from time t1 to time t2 is T1, the pulse number N1 of waveform B during this period T1 and Value C of capacitance 4 and resistance value R1 of reference resistor 2
The relation with is as follows.

T1 = (C × R1 × ln2) × N1 (1) (II) Charge / Discharge Mode by Phase II When the signal φ2 is at low level, the signals φ1 and φ3, and the point B are at high level, P Only Chan Tr2 is turned on. Therefore, if the circuit of the temperature sensitive element 3 and the capacitance 4 is connected and the resistance value of the temperature sensitive element 3 is Rs, the capacitance 4 is charged with a time constant C × Rs. Similar to the phase I described above, when the voltage at the point A reaches the logic level 1 / 2V _DD of the inverter 5, the N channel Tr3 is turned on. Therefore, point A is V
_Shorted to _SS , the waveform in Phase II at point A shown in Fig. 4 is obtained. Therefore, at the point B via the inverter 5, as shown in FIG.
When s fluctuates, a pulse whose period fluctuates is generated. Assuming that the period of Phase II is T2 and the number of pulses at the point B generated during this period T2 is N2, the value C of the capacitor 4 and the resistance value Rs have the following relationship.

T2 = (C × Rs × ln2) × N2 (2) During the period T1 of phase I, the time t1 is generated due to the rising of the signal φ4 from the set frequency division stage of the main counter 18.
start from. Subsequently, the output signals φ2 and φ3 of the main controller 17 rise, and charging / discharging of the reference resistor 2 and the capacitor 4 starts.

The waveform at point B (signal B) is inputted from the resistance value-frequency conversion circuit 1 to the frequency dividing circuit 10 via the NOR gate 7. Therefore, when the C signal that is also input to the NOR gate 7 falls, the pulse of the signal B is input to the frequency dividing circuit 10 as a clock signal. When the charge and discharge of the reference resistor 2 and the capacitor 4 progress, and at time t2, the measurement by the frequency dividing circuit 10 reaches the target pulse number N1 set as the above-mentioned phase I, a multi-input NAND gate (hereinafter referred to as a multi-input gate The output setting is 16 and the signal G is output. When the signal G is output, the signals φ2 and φ3 fall, the signal C rises, and the phase I ends. At this time, in the main controller 17, the time of the counting time T1 of the phase I from time t1 to time t2 is stored by using the frequency division output of the main counter 18. The signal H is at a high level during the period T1 of the phase I.

The period T2 of Phase II starts at time t3 due to the fall of the output φ4 of the frequency dividing stage set by the main counter 18. Then, the main controller 17
Output signals φ1 and φ3 rise, charging and discharging of the temperature sensitive element 3 and the capacitor 4 are started, and the pulse-shaped signal B is output from the resistance value-frequency conversion circuit 1. Then, when the signal C falls, the pulse of the signal B is applied as a clock to the frequency dividing circuit via the NOR gate 7. At the same time, when charging / discharging by the temperature sensitive element 3 is started from time t3, the count-up of the main counter 18 also proceeds. This time,
The main controller 17 compares the frequency-divided output data of the counting time T1 stored in the phase I with the count data of the main counter 18. At time t4, when they become equal to each other, the main controller 17 causes the signals φ1 and φ3 to fall and the signal C to rise.
The period T2 of II ends. During this period, the observed count value N2 obtained by counting the signal B by the frequency divider circuit 10 is latched, so at time t4, the main controller 17 outputs the latch signal U, and the latch 11 latches the count value N2. Then, the count value N2 is converted into a temperature digital value by the conversion table stored in the ROM 12,
It is displayed on the display unit 15 via the decoder 13 and the try bar 14.

As described above, in the thermometer of this example, as a result, the period T1 of the phase I in which the main controller 17 measures the number of pulses by the reference resistor 2 and the phase II in which the number of pulses by the temperature sensitive element 3 is measured. The period T2 of 1 is operated at the same time interval. Therefore, the equations (1) and (2) are equal and expressed as follows.

(C × R1 × ln2) × N1 = (C × Rs × ln2) × N2 (3) Therefore, it is understood that N1, N2, Rs, and R1 have the following relationship.

N2 = R1 / Rs × N1 (4) If a thermistor is used as the temperature sensitive element 3, the resistance Rs at the temperature W ° C. is given by the following equation.

Rs = R0 × exp (B (1 / W-1 / W0)) (5) where B is the thermistor constant, W0 is the reference temperature, and R0 is the resistance value of the thermistor at temperature W0. . Substituting this into the equation (4) gives the following equation.

N2 = R1 × N1 / (R0 × exp (B (1 / W-1 / W0))) (6) The relationship between the temperature W ° C. and the count number N2 is as shown in equation (6). Then, N2 measured in Phase II is transferred to the ROM 12 from the latch 16 and converted into the temperature digital value of ° C or ° F by the conversion table based on the equation (6). Further, the decoder 13 and the driver 14 The digital temperature is displayed on the display unit 15 through the display. In this way, the temperature display uses the count value N2 as the measured value, but as a result, N1 and N
It is determined based on the ratio of 2.

Unlike the thermometer of this example, the temperature sensing element and the capacitance are charged / discharged in the first charge / discharge phase I of the resistance value-frequency conversion circuit 1, and the reference resistance and the capacitance are charged / discharged in the phase II. Even if the conversion to the temperature digital value is performed by performing the same processing as above with charging and discharging of the reference resistance and the capacitance as N2, N1, N2, Rs, and R1 have the same relationship. It is possible to make measurements.

Next, the absolute value adjustment used in the thermometer of this example will be described. For the adjustment, the count value N2 of the pulse signal whose frequency fluctuates due to the change in the resistance value of the temperature sensing element 3 at the temperature at the adjustment point according to the temperature measurement principle may be matched with the set number in the conversion table stored in the ROM 12. . Therefore, it is only necessary to correct the deviation of the count value N2 due to the resistance values of the reference resistor 2 and the temperature sensitive element 3 being varied due to individual differences and deviating from the set value resistance ratio of the conversion table. It is a translation. When the deviation with respect to the set value resistance ratio due to such individual difference is K, the equation (4) becomes the following equation.

N2 = R1 / Rs × N1 × K (7) Therefore, if K can be corrected by some method, the count value N2 that matches the set value resistance ratio of the conversion table can be supplied to the latch 11. , It becomes possible to adjust the absolute value.

Therefore, the reference resistance 2 is used to change the count value N1 for determining the counting time of Phase II to N11.
Then, when the count value N11 is N11 = N1 / K, the equation (7) becomes the following equation.

N2 = R1 / Rs × N11 / K × K N2 = R1 / Rs × N11 (8) Thus, the deviation K with respect to the set resistance value ratio is N1 from N1.
It can be seen that if it can be variably set to 1, it can be corrected and absolute value adjustment can be performed. Therefore, in this example, the initial logic adjustment circuit variably sets the count value N1 to be the count value N11 in consideration of individual differences.

The method of adjusting the count value N1 is to preset the count value necessary for the adjustment in the frequency dividing circuit 10 for counting before starting the counting, and to raise the bottom, and the frequency dividing circuit 10. The count value N1 that is the target to be counted up (counted off) in
To N11.

In the electronic thermometer of this example shown in FIG. 1, an initial logic adjusting circuit (correction data setting circuit) 9 is used to preset the correction data in the frequency dividing circuit 10 as an initial value, so that the count value is N1. To N11. That is, the difference between the output setting of the multi-input NAND gate 16 used for counting up in the frequency dividing circuit 10 and the setting of the initial data set of the initial logic adjusting circuit 9 is the count value N.
11 can be variably set. When this count value N11 is expressed by a mathematical expression, the multi-input NAND gate 16
If the output setting of M is M and the setting value of the initial data set of the initial logic adjusting circuit 9 is M0, then N11 = M−M0. Then, in order to variably set the count value N1 to N11, M is fixed and M0 is variably set.

FIG. 3 shows the configurations of the frequency dividing circuit 10 and the initial logic adjusting circuit (correction data setting circuit) 9. The frequency dividing circuit 10 is configured by cascading a set priority type 1/2 frequency dividing circuit with reset (hereinafter abbreviated as set 1/2 frequency dividing circuit) 28 to 31 and a 1/2 frequency dividing circuit with reset 32. It is sequentially counted up 2 ^{0-2 4.} Then, the result of each bit formed by the set 1/2 divider circuits 28 to 31 and the reset-equipped 1/2 divider circuit 32 is output to the latch circuit 11 and the multi-input NAND gate 16.

An initial logic adjusting circuit (correction data setting circuit) 9 for setting an initial data set in the frequency dividing circuit 10 is
2 ⁰ to 2 ³ sets of the frequency dividing circuit 10 1/2 frequency dividing circuit 28
.. 31 to half-bit flip-flop circuits (latch circuits) 20 to 23. The data input terminal D of each flip-flop circuit 20-23 is
It is connected to the data terminals D0 to D3 of the wiring open / short type storage means 100. Also, the data terminals D0 to D
3 includes pull-up MOS transistors Tr4 to Tr4.
7 is connected. Therefore, the wiring open / short type storage means 100 can store the data in a nonvolatile manner by cutting the wiring pattern connected to the data terminals D0 to D3, and as will be described later, in reading the data, the MOS transistor is used. Tr4 to Tr7 are turned on and pulled up so that the power supply voltage V _DD appears at the data terminal when the wiring is open (cut) and the ground voltage V _SS appears at the data terminal when the wiring is short (not cut). It has become.

The pull-up circuits of the MOS transistors Tr4 to Tr7 are turned on by a data read control signal which is a gate signal applied to the terminal 34.
The flip-flop circuits 20 to 23 of the latch circuit latch the data signals read to the data terminals D0 to D3 by the clock pulse (latch control signal) applied to the terminal 35. Output M of the flip-flop circuits 20 to 23
Is applied by applying a high-level initialization control signal J
The D gates 24 to 27 are opened and supplied to the set S (bar) terminals of the corresponding set 1/2 frequency dividing circuits 28 to 31, and the set values of the flip-flop circuits 20 to 23, that is, the setting of the initial logic adjusting circuit 9 are set. The value is set in the frequency dividing circuit 10.

For example, when the set value M0 of the initial data set is M0 = 1, the wiring pattern connected to the data terminal D0 is cut off, and when the pull-up transistor Tr4 is turned on, the data terminal D0 is V _SS line 3
Since 3 is open, the data terminal D0 is at the power supply voltage V _DD . Since the wiring patterns connected to the other data terminals D1 to D3 are in an uncut state, the data terminals D1 to D1
D3 is shorted to the ground voltage V _SS . Therefore, "1" is set in the flip-flop circuit 20 and "0" is set in the other flip-flop circuits 21 to 23. Then, at the timing of the initial setting control signal J, only the NAND gate 24 of the setting timing circuit is opened to set 1
The output of 2 ⁰ of the 1/2 frequency dividing circuit 28 is set to "1". As a result, the frequency dividing circuit 10 is set to the initial value M0 = 1. Further, when M0 = 5, the terminal D0 is V
Not only open from _SS line 33, but also connect terminal D2 to V _SS
Release from line 33. As a result, the set value of the prep-flop circuit 22 is also set to the 2 ² output of the set 1/2 frequency dividing circuit 30 via the NAND gate 26, and M0 = 5 is set to the frequency dividing circuit 10. The other terminals D1 and D3 which are not opened from the V _SS line 33 are connected to the corresponding set 1/2 frequency divider circuits 29 and 31 because the data input terminal D of the flip-flop circuits 21 and 23 remains at the low level. Is not set. In addition,
A pull-down circuit may be used instead of the pull-up circuit.

If the P channels Tr4 to Tr7 are always on, a current always flows between V _DD and V _SS , resulting in a large current consumption of the circuit. Therefore, in this embodiment, the P channels Tr4 to Tr7 are turned on by a low level signal to the gate terminal 34 in an appropriate initial data read cycle, and the latch control signal is also input to the clock terminal 35, and the half bit flip block is also supplied. The data is latched to the groups 20 to 23. Since the P channels Tr4 to Tr7 are not always on during the measurement period, power can be saved. Further, even if the data value differs between different products, the power consumption required for data setting can be made substantially the same.

In the thermometer of this example, the timing of reading the initial data set in the initial logic adjusting circuit 9 is as shown in FIG.
Before 1, the frequency dividing circuit 10 is reset by the reset signal I, and then the initial setting control signal J is used to read the initial data M0 into the frequency dividing circuit 10. And the initial data M
The frequency dividing circuit 10 set to 0 counts the pulse signal B based on the reference resistance of the phase I output from the resistance value-frequency conversion circuit 1, and the main counter 18 uses the reference value to determine the time to reach the count value N1. Set as. Next, in the phase II, the pulse signal B based on the temperature sensitive element 3 is counted. At this time, the initial setting control signal J does not become high level, and the frequency dividing circuit 10 is reset and then the initial data M0 is reset. The count starts from the state where is not set.

Thus, in this example, the data terminals D0 to D
In order to release 3 from the V _SS line, by inputting logic adjustment data indicating whether the substrate pattern is cut or not cut, the initial data initially set by the initial logic adjustment circuit 9 can be variably set. Of course, instead of cutting the pattern, a wiring open / short type storage means using an on / off switch may be used. As a result, in the phase I, the period T1 that determines the measurement period of the phase II can be set by counting from the number of times of charging and discharging by the reference resistor 2 and the capacitor 4 to the corrected count value. Therefore,
Variations due to individual differences between the reference resistance and the resistance value of the temperature sensitive element at the adjustment point, that is, the deviation of the resistance value ratio can be corrected, and the absolute value can be adjusted.

FIG. 5 is a block diagram showing a counting circuit, a counting operation termination circuit, and a termination value setting circuit in another embodiment of the present invention. In the configuration described with reference to FIG. 4, the initial data is preset in the frequency dividing circuit 10 and then the counting of the phase I is started, but in the configuration shown in FIG.
The frequency dividing circuit 10 does not preset the initial data, but a multi-input NAND gate (counting operation aborting circuit) 48 for judging the count value of the frequency dividing circuit 10 and controlling the aborting operation, and resistance value variation correction data. And a cutoff value setting circuit 130 for setting a cutoff value according to the above. The cutoff value setting circuit 130 has the same configuration as the initial logic adjustment circuit (correction data setting circuit) 9 described above.
20 and a data conversion circuit 110 including exclusive OR gates (EXOR) 44 to 47. Multi-input N
The count value is changed from N1 to N11 by adjusting the output set value determined by the AND gate 48.

The frequency dividing circuit 10 shown in FIG.
/ The two circuit 36-43 is countable counter until 2 ^{0-2 7,} 2 ^{0 ~} 2 output of resettable 1/2 frequency divider 36 to 39 for counting the exclusive OR gate ( It is input to the multi-input NAND gate 48 via EXOR) 44-4. The outputs of the other 1/2 divider circuits with reset 40 to 43 are the same as the multi-input multi-input NAN.
It is input to the D gate 48. A data signal of resistance value variation correction data from the data terminals D0 to D3 is input to one input of each of the EXORs 44 to 47. For example, when one input of the EXORs 44 and 46 is at a high level (when the correction data is (0101) ₂ = 5), the output of the 1/2 divider circuit 36 of the divider circuit 10 is “0”, 1 /
The output of the divide-by-2 circuit 37 is "1", the output of the 1/2 divider circuit 38 is "0", the output of the 1/2 divider circuit 39 is "1", 1
When the output of the 1/2 frequency dividing circuits 40 to 46 becomes "1",
That is, when the count value (1111010) ₂ = 122, the multi-input NAND gate 48 outputs the low level count abort control signal G. When the correction data is zero, the count abort control signal G is output with the count value (1111111) ₂ = 127, but when the correction data is 5, 12
The signal G is output with the count value 122 obtained by subtracting the correction data from 7, the counting operation of the frequency dividing circuit 10 is stopped, and the counting time T1 during that time is stored in the main controller 17 described above. By changing the correction data, it becomes possible to adjust the period T1 set by the phase I in this way. Further, the portion 120 of this example also has the same configuration as the initial value adjustment circuit (correction data setting circuit) 9 shown in FIG. 3, so that the pull-up transistor is not always turned on during the measurement period. , Can save electricity. Similarly, even if the data values are different, the power consumption required for data setting can be standardized.

Further, in this embodiment, as shown in FIG. 1, the signal φ2 and the signal supplied to the frequency dividing circuit 10 are input to the NAND 8 and the output thereof can be taken out as the signal E. . Therefore, if the timing of this signal E is adjusted and detected by an external measuring device, the value of N2, which is the count value related to the temperature measurement result, can be detected. When the N2 value can be detected, the deviation of the resistance ratio between the resistance of the temperature-sensitive element 3 before adjustment and the reference resistance can be measured in N2 conversion. Therefore, the initial data set in the initial logic setting circuit 9 also uses the N2 value of the signal E to store the corresponding correction amount in the external C.
It can be set using PU or the like. Thus, by setting the initial data using the signal E, the logic adjustment of the initial logic setting circuit 9 can be completed once.
Further, if this signal E is used, the accuracy inspection of the simple temperature measurement of the electronic thermometer can be performed.

The present invention can be applied not only to electronic thermometers but also to thermometers, pressure gauges, scales and the like.

[0060]

As described above, the first means of the present invention is characterized in that the preset counting means and the correction data setting means are provided. Further, the second means of the present invention is characterized in that the counting operation termination means and the termination value setting means are provided.

In the first means, the ratio between the count value of the first pulse signal and the count value of the second pulse signal can be increased or decreased by the value of the initially set correction data.
Further, in the second means, the ratio between the count value of the first pulse signal and the count value of the second pulse signal can be increased or decreased by the cutoff value obtained by converting the correction data. Therefore, in any means, even if a reference resistor or a detection resistor having a variation in resistance value is used without using a variable resistor for initial adjustment, it is possible to make the resistance ratio apparently constant. Thus, it is possible to provide a measuring device that is low in cost, has few adjustment steps, and does not change with time.

When the correction data is initially set in the preset type counting means in the first means, and when the cutoff value based on the correction data is set in the counting operation cutoff means in the second means, the power is turned on for only a certain period. The pull-up or pull-down means operates to read the correction data, and within this period, the correction data signal read by the latch means is latched by the latch control signal. For this reason, after the latching, the pull-up or pull-down means is returned to the inoperative state, and the current is not supplied to the wiring open / short type storage means, whereby the power can be saved. Also, the variation in power consumption due to the difference in correction data is eliminated.

[Brief description of drawings]

FIG. 1 is a block diagram showing a circuit configuration of an electronic thermometer according to an embodiment of the present invention.

FIG. 2 is a circuit diagram showing a resistance value-frequency conversion circuit in the block diagram of FIG.

3 is a circuit diagram showing a part of an initial logic adjusting circuit and a frequency dividing circuit in the block diagram shown in FIG.

FIG. 4 is a time chart showing signals of various parts of the electronic thermometer of the embodiment.

FIG. 5 is a block diagram showing a counting circuit, a counting operation termination circuit, and a termination value setting circuit according to another embodiment of the present invention.

FIG. 6 Japanese Patent Application No. Sho 59-17499 (Japanese Patent Laid-Open No. 60-161538)
FIG. 3 is a circuit diagram showing a counting circuit with a set and an initial value setting circuit of the electronic thermometer according to the present invention.

[Explanation of symbols]

DESCRIPTION OF SYMBOLS 1 ... Resistance value-frequency conversion circuit 2 ... Reference resistance 3 ... Temperature-sensitive resistance 4 ... Capacitance 5 ... Inverter 6,8, 24-27 ... NAND gate 7 ... NOR gate 9 ... Initial logic adjustment circuit (correction data setting circuit) 10 ... Dividing circuit 11,20-23 ... Latch circuit 12 ... ROM 13 ... Decoder 14 ... Driver 15 ... Display 16 ... Multi-input NAND gate 17 ... Main controller 18 ... Main counter 19 ... Oscillator 20 ~ 23 ... Half-bit flip-flop Circuit 24 to 27 ... NAND gates 28 to 31 ... Set-priority type 1/2 divider circuit with reset 32 ... 1/2 divider circuit with reset 33 ... V _SS power supply line 34 ... Gate terminal 35 ... Clock terminals 36-43 ... 1/2 divider circuit with reset 44 to 47 ... Exclusive OR gate 48 ... Multi-input NAND gate (total Operation cutoff circuit) 72 ... Conversion display section 100 ... Wiring open / short type storage means 110 ... Data conversion circuit 120 ... Wiring open / short type storage means, circuit portion of pull-up circuit and latch circuit 130 ... Count cutoff value setting circuit Tr1 ~ Tr7 ... MOS transistors D0 to D3 ... Data terminals.

Claims (2)

(57) [Claims] 1. A reference pulse signal having a frequency based on the resistance value of a reference resistor and a detection pulse signal having a frequency based on the resistance value of a detection resistor whose resistance value changes in response to temperature, pressure, etc. are switchably generated. The resistance value-frequency conversion means, and one of the reference pulse signal and the detection pulse signal as a first pulse signal and the other as a second pulse signal, and after counting the first pulse signal, the first pulse signal is counted. Preset counting means for counting the second pulse signal for a time equal to the counting time of the pulse signal, and resistance value variation correction data for the preset counting means prior to counting the first pulse signal. A measuring device having a correction data setting means for setting as an initial value and displaying a measurement result based on a ratio between the count value of the first pulse signal and the count value of the second pulse signal. In the correction data setting means, a wiring open / short type storage means for storing the resistance value variation correction data, and a read voltage is applied to a data terminal of the storage means to apply the resistance value variation to the data terminal. Controls pull-up or pull-down means for generating a data signal according to correction data, latch means for latching the data signal, and timing of initial setting input of the data signal from the latch means to the preset type counting means. And a setting timing unit for performing the setting. 2. A reference pulse signal having a frequency based on the resistance value of the reference resistor and a detection pulse signal having a frequency based on the resistance value of the detection resistor that changes its resistance value in response to temperature, pressure, etc. are switchably generated. The resistance value-frequency conversion means, and one of the reference pulse signal and the detection pulse signal as a first pulse signal and the other as a second pulse signal, and after counting the first pulse signal, the first pulse signal is counted. Counting means for counting the second pulse signal for a time equal to the counting time of the pulse signal, counting operation aborting means for controlling the counting operation of the counting means with an abort value, and resistance variation correction data A measuring device having a cutoff value setting means for setting the cutoff value, and displaying a measurement result based on a ratio between the count value of the first pulse signal and the count value of the second pulse signal. In the above arrangement, the cutoff value setting means is wiring open / short type storage means for storing the resistance value variation correction data,
Pull-up or pull-down means for applying a read voltage to the data terminal of the storage means to generate a data signal corresponding to the resistance value variation correction data at the data terminal, latch means for latching the data signal, and And a data conversion unit that converts the data signal from the latch unit into the censored value according to the data signal.